WO1999009391A3 - Ndir-fotometer zur mehrkomponentenmessung - Google Patents

Ndir-fotometer zur mehrkomponentenmessung Download PDF

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Publication number
WO1999009391A3
WO1999009391A3 PCT/DE1998/002412 DE9802412W WO9909391A3 WO 1999009391 A3 WO1999009391 A3 WO 1999009391A3 DE 9802412 W DE9802412 W DE 9802412W WO 9909391 A3 WO9909391 A3 WO 9909391A3
Authority
WO
WIPO (PCT)
Prior art keywords
sensor
photometer
measuring
gas
constituents
Prior art date
Application number
PCT/DE1998/002412
Other languages
English (en)
French (fr)
Other versions
WO1999009391A2 (de
Inventor
Michael Zoechbauer
Walter Fabinski
Thomas Liedike
Michael Moede
Siegfried Vogt
Original Assignee
Hartmann & Braun Gmbh & Co Kg
Michael Zoechbauer
Walter Fabinski
Thomas Liedike
Michael Moede
Siegfried Vogt
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from DE19752508A external-priority patent/DE19752508A1/de
Application filed by Hartmann & Braun Gmbh & Co Kg, Michael Zoechbauer, Walter Fabinski, Thomas Liedike, Michael Moede, Siegfried Vogt filed Critical Hartmann & Braun Gmbh & Co Kg
Priority to EP98951168A priority Critical patent/EP1005635A2/de
Priority to JP2000510007A priority patent/JP2001516016A/ja
Priority to US09/485,987 priority patent/US6452182B1/en
Publication of WO1999009391A2 publication Critical patent/WO1999009391A2/de
Publication of WO1999009391A3 publication Critical patent/WO1999009391A3/de

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3504Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/59Transmissivity
    • G01N21/61Non-dispersive gas analysers

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

Die Erfindung betrifft ein Fotometer zur Messung von Gaskomponenten, mit einem Infrarotstrahler mit Strahlermodulation und einer Meßküvette mit Meß- und Vergleichskammer, einem auf die Gaskomponente X optopneumatisch absorbierenden, also mit X gefüllten Detektor. Um bei einem Fotometer dieser Art eine Mehrkomponentenmessung mit hoher Genauigkeit und möglichst geringem apparativen Aufwand zu ermöglichen, ist erfindungsgemäß vorgeschlagen, daß zur Messung mehrerer Gaskomponenten mindestens ein weiterer Detektor hinter dem ersten Detektor angeordnet ist, daß der weitere Detektor zur Messung der Gaskomponente Y mit seinem Isotop Y* gefüllt ist, und daß der erste Detektor hinsichtlich der weiteren zu messenden Gaskomponente Y* bzw. deren charakteristischen Absorptionsbanden optisch transparent ist.
PCT/DE1998/002412 1997-08-18 1998-08-12 Ndir-fotometer zur mehrkomponentenmessung WO1999009391A2 (de)

Priority Applications (3)

Application Number Priority Date Filing Date Title
EP98951168A EP1005635A2 (de) 1997-08-18 1998-08-12 Ndir-fotometer zur mehrkomponentenmessung
JP2000510007A JP2001516016A (ja) 1997-08-18 1998-08-12 多成分を測定するためのndir光度計
US09/485,987 US6452182B1 (en) 1997-08-18 1998-08-12 Photometer with non-dispersive infraded absorption spectroscopy (NDIR) for measuring several constituents

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
DE19735719 1997-08-18
DE19752508A DE19752508A1 (de) 1997-08-18 1997-11-27 NDIR-Fotometer zur Mehrkomponentenmessung
DE19735719.9 1997-11-27
DE19752508.3 1997-11-27

Publications (2)

Publication Number Publication Date
WO1999009391A2 WO1999009391A2 (de) 1999-02-25
WO1999009391A3 true WO1999009391A3 (de) 1999-05-14

Family

ID=26039234

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/DE1998/002412 WO1999009391A2 (de) 1997-08-18 1998-08-12 Ndir-fotometer zur mehrkomponentenmessung

Country Status (4)

Country Link
US (1) US6452182B1 (de)
EP (1) EP1005635A2 (de)
JP (1) JP2001516016A (de)
WO (1) WO1999009391A2 (de)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19752508A1 (de) * 1997-08-18 1999-03-11 Hartmann & Braun Gmbh & Co Kg NDIR-Fotometer zur Mehrkomponentenmessung
GB2411318B (en) * 2004-02-23 2009-07-01 Ford Global Tech Llc Driver assistance system
US7797983B2 (en) * 2004-03-29 2010-09-21 Gasera Ltd. Method and system for detecting one or more gases or gas mixtures and/or for measuring the concentration of one or more gases or gas mixtures
DE102004031643A1 (de) * 2004-06-30 2006-02-02 Abb Patent Gmbh Nichtdispersiver Infrarot-Gasanalysator
JP4411599B2 (ja) * 2004-10-26 2010-02-10 横河電機株式会社 赤外線ガス分析計および赤外線ガス分析方法
EP2000792B1 (de) * 2007-06-06 2011-08-03 Siemens Aktiengesellschaft Verfahren zur Messung der Konzentration einer Gaskomponente in einem Messgas
DE102009021829A1 (de) * 2009-05-19 2010-11-25 Siemens Aktiengesellschaft NDIR-Zweistrahl-Gasanalysator und Verfahren zur Bestimmung der Konzentration einer Messgaskomponente in einem Gasgemisch mittels eines solchen Gasanalysators
JP2012068164A (ja) * 2010-09-24 2012-04-05 Horiba Ltd 赤外線ガス分析計
CN104198426A (zh) * 2014-09-22 2014-12-10 合肥工业大学 非色散红外传感器系统中漫反射光气体吸收计算模型
CN108458750B (zh) * 2018-03-09 2020-05-05 上海理工大学 纯水液滴沸腾过程中气液两相多参数同步测量方法

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3446436A1 (de) * 1984-12-20 1986-07-03 Hartmann & Braun Ag, 6000 Frankfurt Nichtdispersives fotometer
DE3522949A1 (de) * 1985-06-27 1987-01-08 Hartmann & Braun Ag Verfahren zum nachjustieren von infrarot-gasanalysatoren
EP0427037A2 (de) * 1989-11-08 1991-05-15 Hartmann & Braun Aktiengesellschaft Nichtdispersiver Infrarot-Gasanalysator zur gleichzeitigen Messung der Konzentration mehrerer Komponenten einer Gasprobe
DE4419458A1 (de) * 1994-06-03 1995-12-07 Fisher Rosemount Gmbh & Co Ges Verfahren zur Messung der Reinheit von Kohlendioxid
US5479019A (en) * 1993-07-13 1995-12-26 Mic Medical Instrument Corporation Apparatus for determining the 13 CO2 /12 CO2 ratio of concentrations in a gas sample

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5945939B2 (ja) * 1979-11-17 1984-11-09 株式会社 堀場製作所 金属中の炭素分析装置
JPS63308541A (ja) * 1987-06-10 1988-12-15 Horiba Ltd 赤外線ガス分析計
DE4115425C1 (de) * 1991-05-10 1992-08-27 Hartmann & Braun Ag, 6000 Frankfurt, De
JPH07167784A (ja) * 1993-12-16 1995-07-04 Fuji Electric Co Ltd 赤外線ガス分析計
JP3291890B2 (ja) * 1994-01-31 2002-06-17 株式会社島津製作所 赤外線ガス分析計

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3446436A1 (de) * 1984-12-20 1986-07-03 Hartmann & Braun Ag, 6000 Frankfurt Nichtdispersives fotometer
DE3522949A1 (de) * 1985-06-27 1987-01-08 Hartmann & Braun Ag Verfahren zum nachjustieren von infrarot-gasanalysatoren
EP0427037A2 (de) * 1989-11-08 1991-05-15 Hartmann & Braun Aktiengesellschaft Nichtdispersiver Infrarot-Gasanalysator zur gleichzeitigen Messung der Konzentration mehrerer Komponenten einer Gasprobe
US5479019A (en) * 1993-07-13 1995-12-26 Mic Medical Instrument Corporation Apparatus for determining the 13 CO2 /12 CO2 ratio of concentrations in a gas sample
DE4419458A1 (de) * 1994-06-03 1995-12-07 Fisher Rosemount Gmbh & Co Ges Verfahren zur Messung der Reinheit von Kohlendioxid

Also Published As

Publication number Publication date
WO1999009391A2 (de) 1999-02-25
JP2001516016A (ja) 2001-09-25
EP1005635A2 (de) 2000-06-07
US6452182B1 (en) 2002-09-17

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