KR890005498A - 분광 광도계 - Google Patents

분광 광도계 Download PDF

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Publication number
KR890005498A
KR890005498A KR1019880011373A KR880011373A KR890005498A KR 890005498 A KR890005498 A KR 890005498A KR 1019880011373 A KR1019880011373 A KR 1019880011373A KR 880011373 A KR880011373 A KR 880011373A KR 890005498 A KR890005498 A KR 890005498A
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KR
South Korea
Prior art keywords
light source
light
intensity
integrating sphere
reflected light
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KR1019880011373A
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English (en)
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KR970005587B1 (ko
Inventor
타이지 고히가시
미키 고야마
Original Assignee
후지다 아츠시
구라시키보세키 가부시키가이샤
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Publication of KR890005498A publication Critical patent/KR890005498A/ko
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Publication of KR970005587B1 publication Critical patent/KR970005587B1/ko

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/10—Arrangements of light sources specially adapted for spectrometry or colorimetry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G01N21/474—Details of optical heads therefor, e.g. using optical fibres
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
    • G01J1/20—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle
    • G01J1/34—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using separate light paths used alternately or sequentially, e.g. flicker
    • G01J1/36—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using separate light paths used alternately or sequentially, e.g. flicker using electric radiation detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
    • G01J1/16—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void using electric radiation detectors
    • G01J1/1626—Arrangements with two photodetectors, the signals of which are compared
    • G01J2001/1636—Arrangements with two photodetectors, the signals of which are compared one detector directly monitoring the source, e.g. also impulse time controlling
    • G01J2001/1642—Arrangements with two photodetectors, the signals of which are compared one detector directly monitoring the source, e.g. also impulse time controlling and acting on the detecting circuit
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
    • G01J2003/425—Reflectance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/065—Integrating spheres
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/069—Supply of sources
    • G01N2201/0696—Pulsed

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Health & Medical Sciences (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

내용 없음

Description

분광 광도계
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제1도는 본 발명의 일실시예에 따른 분광광도계의 개략구성도.
제2도는 본 발명에 따른 분광광도계의 실시예에 의해 파장별로 반사율의 재현성에 대해 시험측정을 행한 결과를 나타내는 그래프.
제3도는 종래기술에따른 분광광도계에 의해 같은 시험측정을 행한 결과를 나타내는 그래프이다.

Claims (6)

  1. 광원(1)이 펄스점등형 크세논방전관으로 구성된 분광광도계에 있어서, 상기 광원의 입력에너지가 0.03주울 이상 1.0주울이하로 된 것을 특징으로 하는 분광광도계.
  2. 제1항에 있어서, 상기 광원(1)이 그 발광회수가 1초 동안 10~36회인 것을 특징으로 하는 분광광도계.
  3. 제1항에 있어서, 펄스점등형 크세논방전관으로 구성된 상기 광원(1)과, 상기 광원(1)의 발광광속을 확산시키는 적분구(3), 상기 적분구(3)의 내주면으로부터의 반사광강도 및 이 내주면에 설치된 샘플(2)로부터의 반사광강도를 파장별로 검출하는 분광기(8) 및, 상기 광원(1)의 발광강도를 검출하는 센서(10)를 구비한 것을 특징으로 하는 분광광도체.
  4. 제1항에 있어서, 펄스점등형 크세논방전관으로 이루어진 광원(1)과, 이 광원(1)의 발광광속을 확산시키는 적분구(3), 이 적분구(3)의 내주면으로부터의 반사광 및 이 내주면상에 설치된 샘플(2)로부터의 반사광의 광로를 교대로 절환시켜 주는 절환장치(4), 상기 광로가 교대로 절환시켜지는 반사광을 각각 분광기(8)로 인도하는 광학계(6,7), 상기 절환장치(4)의 절환타이밍을 검지하는 동기용센서(5) 및, 상기 광원(1)의 발광강도를 검출하는 센서(10)가 더 구비된 것을 특징으로 하는 분광광도계.
  5. 제4항에 있어서, 상기 적분구(3) 내주면에서의 반사광 및 상기 샘플(2)로부터의 반사광의 각 강도를 상기 광원(1)이 발광될 때마다 그 광원(1)의 발광강도에 대한 비율로 환산해서 이 광원(1)의 발광강도오차를 보상해 주는 보상수단이 구비된 것을 특징으로 하는 분광광도계.
  6. 제4항에 있어서, 상기 적분구(3)의 내주면으로부터의 반사광 및 상기 샘플(2)로부터의 반사광의 각강도의 적산치를 상기 광원 여러차례 발광될 때마다 그 광원(1)의 발광강도적산치에 대한 비율로 환산해서이 광원(1)의 발광강도오차를 보상해주는 보상수단(12)이 더 구비된 것을 특징으로 하는 분광광도계.
    ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
KR1019880011373A 1987-09-04 1988-09-03 분광광도계 KR970005587B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP62-222454 1987-09-04
JP62222454A JP2604754B2 (ja) 1987-09-04 1987-09-04 分光光度計

Publications (2)

Publication Number Publication Date
KR890005498A true KR890005498A (ko) 1989-05-15
KR970005587B1 KR970005587B1 (ko) 1997-04-18

Family

ID=16782665

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019880011373A KR970005587B1 (ko) 1987-09-04 1988-09-03 분광광도계

Country Status (5)

Country Link
US (1) US4921351A (ko)
EP (1) EP0306337B1 (ko)
JP (1) JP2604754B2 (ko)
KR (1) KR970005587B1 (ko)
DE (1) DE3886308T2 (ko)

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AU730982B2 (en) * 1996-09-16 2001-03-22 Agilent Technologies Australia (M) Pty Ltd Improved spectrophotometer
JP2000500875A (ja) * 1996-09-16 2000-01-25 バリアン・オーストラリア・ピーテイワイ・リミテツド 改良された分光光度計
US6424413B1 (en) * 1998-06-12 2002-07-23 Gretagmacbeth Llc Multi-channel integrating sphere
US6444971B1 (en) * 1999-12-31 2002-09-03 Leica Microsystems Heidelberg Gmbh Method and system for compensating intensity fluctuations of an illumination system in a confocal microscope
JP4852762B2 (ja) * 2007-03-13 2012-01-11 国立大学法人島根大学 光ファイバ照明装置
JP5296723B2 (ja) * 2010-02-18 2013-09-25 株式会社日立ハイテクノロジーズ 分光光度計、及びその性能測定方法
WO2012020440A1 (en) * 2010-08-12 2012-02-16 Consiglio Nazionale Delle Ricerche Device for diffuse light spectroscopy
ES2366290B1 (es) 2010-10-20 2012-08-27 Abengoa Solar New Technologies S.A. Espectrofotómetro para caracterización óptica automatizada de tubos colectores solares y método de funcionamiento.
US8711335B2 (en) * 2011-06-28 2014-04-29 Nikon Corporation Stroboscopic light source for a transmitter of a large scale metrology system
US8848202B2 (en) * 2011-11-11 2014-09-30 Intersil Americas LLC Optical proximity sensors with offset compensation
US8994926B2 (en) 2012-02-14 2015-03-31 Intersil Americas LLC Optical proximity sensors using echo cancellation techniques to detect one or more objects
US9200958B2 (en) * 2012-11-15 2015-12-01 Corning Incorporated Hyperspectral imaging systems and methods for imaging a remote object
US10371628B2 (en) * 2017-08-07 2019-08-06 The Boeing Company Apparatus for measuring spectral hemispherical reflectance of samples at grazing angles

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DE3332986A1 (de) * 1983-09-10 1985-04-04 Optronik Gmbh, 1000 Berlin Reflexionsmessgeraet fuer die messung des spektralen strahldichtefaktors fuer die 45/0-messgeometrie
EP0195339B1 (en) * 1985-03-21 1992-07-29 Abbott Laboratories Spectrophotometer

Also Published As

Publication number Publication date
DE3886308T2 (de) 1994-03-31
DE3886308D1 (de) 1994-01-27
EP0306337A3 (en) 1990-09-19
JPS6465424A (en) 1989-03-10
JP2604754B2 (ja) 1997-04-30
US4921351A (en) 1990-05-01
EP0306337A2 (en) 1989-03-08
KR970005587B1 (ko) 1997-04-18
EP0306337B1 (en) 1993-12-15

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