DE3886308D1 - Spektralphotometer. - Google Patents
Spektralphotometer.Info
- Publication number
- DE3886308D1 DE3886308D1 DE88308163T DE3886308T DE3886308D1 DE 3886308 D1 DE3886308 D1 DE 3886308D1 DE 88308163 T DE88308163 T DE 88308163T DE 3886308 T DE3886308 T DE 3886308T DE 3886308 D1 DE3886308 D1 DE 3886308D1
- Authority
- DE
- Germany
- Prior art keywords
- spectrophotometer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/10—Arrangements of light sources specially adapted for spectrometry or colorimetry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
- G01N21/474—Details of optical heads therefor, e.g. using optical fibres
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
- G01J1/20—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle
- G01J1/34—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using separate light paths used alternately or sequentially, e.g. flicker
- G01J1/36—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using separate light paths used alternately or sequentially, e.g. flicker using electric radiation detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
- G01J1/16—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void using electric radiation detectors
- G01J1/1626—Arrangements with two photodetectors, the signals of which are compared
- G01J2001/1636—Arrangements with two photodetectors, the signals of which are compared one detector directly monitoring the source, e.g. also impulse time controlling
- G01J2001/1642—Arrangements with two photodetectors, the signals of which are compared one detector directly monitoring the source, e.g. also impulse time controlling and acting on the detecting circuit
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
- G01J2003/425—Reflectance
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/065—Integrating spheres
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/069—Supply of sources
- G01N2201/0696—Pulsed
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Spectrometry And Color Measurement (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62222454A JP2604754B2 (ja) | 1987-09-04 | 1987-09-04 | 分光光度計 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE3886308D1 true DE3886308D1 (de) | 1994-01-27 |
DE3886308T2 DE3886308T2 (de) | 1994-03-31 |
Family
ID=16782665
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE88308163T Expired - Fee Related DE3886308T2 (de) | 1987-09-04 | 1988-09-02 | Spektralphotometer. |
Country Status (5)
Country | Link |
---|---|
US (1) | US4921351A (de) |
EP (1) | EP0306337B1 (de) |
JP (1) | JP2604754B2 (de) |
KR (1) | KR970005587B1 (de) |
DE (1) | DE3886308T2 (de) |
Families Citing this family (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5369481A (en) * | 1992-05-08 | 1994-11-29 | X-Rite, Incorporated | Portable spectrophotometer |
US5422726A (en) * | 1993-02-16 | 1995-06-06 | Tyler; Jonathan M. | Solid state spectrofluorimeter and method of using the same |
US5381010A (en) * | 1993-12-03 | 1995-01-10 | Sleepair Corporation | Periodically alternating path and alternating wavelength bridges for quantitative and ultrasensitive measurement of vapor concentration |
WO1998012541A1 (en) * | 1996-09-16 | 1998-03-26 | Varian Australia Pty. Ltd. | Improved spectrophotometer |
AU730982B2 (en) * | 1996-09-16 | 2001-03-22 | Agilent Technologies Australia (M) Pty Ltd | Improved spectrophotometer |
US6424413B1 (en) * | 1998-06-12 | 2002-07-23 | Gretagmacbeth Llc | Multi-channel integrating sphere |
US6444971B1 (en) * | 1999-12-31 | 2002-09-03 | Leica Microsystems Heidelberg Gmbh | Method and system for compensating intensity fluctuations of an illumination system in a confocal microscope |
JP4852762B2 (ja) * | 2007-03-13 | 2012-01-11 | 国立大学法人島根大学 | 光ファイバ照明装置 |
JP5296723B2 (ja) * | 2010-02-18 | 2013-09-25 | 株式会社日立ハイテクノロジーズ | 分光光度計、及びその性能測定方法 |
WO2012020440A1 (en) * | 2010-08-12 | 2012-02-16 | Consiglio Nazionale Delle Ricerche | Device for diffuse light spectroscopy |
ES2366290B1 (es) | 2010-10-20 | 2012-08-27 | Abengoa Solar New Technologies S.A. | Espectrofotómetro para caracterización óptica automatizada de tubos colectores solares y método de funcionamiento. |
US8711335B2 (en) * | 2011-06-28 | 2014-04-29 | Nikon Corporation | Stroboscopic light source for a transmitter of a large scale metrology system |
US8848202B2 (en) * | 2011-11-11 | 2014-09-30 | Intersil Americas LLC | Optical proximity sensors with offset compensation |
US8994926B2 (en) | 2012-02-14 | 2015-03-31 | Intersil Americas LLC | Optical proximity sensors using echo cancellation techniques to detect one or more objects |
US9341514B2 (en) * | 2012-11-15 | 2016-05-17 | Corning Incorporated | Hyperspectral imaging systems and methods for imaging a remote object |
US10371628B2 (en) * | 2017-08-07 | 2019-08-06 | The Boeing Company | Apparatus for measuring spectral hemispherical reflectance of samples at grazing angles |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3458261A (en) * | 1964-09-25 | 1969-07-29 | Kollmorgen Corp | Pulsed light photometric apparatus for measuring light characteristics of moving materials |
US3446972A (en) * | 1966-07-18 | 1969-05-27 | Kollmorgen Corp | Automatic gain control for photomultiplier tubes employing a monitoring photocell |
US3810696A (en) * | 1973-02-20 | 1974-05-14 | Waters Associates Inc | Improved analytical apparatus for measuring light absorbance of fluids |
GB1560482A (en) * | 1975-07-30 | 1980-02-06 | Unilever Ltd | Portable reflectometer |
US4022534A (en) * | 1976-03-23 | 1977-05-10 | Kollmorgen Corporation | Reflectometer optical system |
JPS56122936A (en) * | 1980-02-29 | 1981-09-26 | Shimadzu Corp | Reflection factor measuring device |
ATE23752T1 (de) * | 1980-08-21 | 1986-12-15 | Oriel Scient Ltd | Optische analyseeinrichtung. |
DE3332986A1 (de) * | 1983-09-10 | 1985-04-04 | Optronik Gmbh, 1000 Berlin | Reflexionsmessgeraet fuer die messung des spektralen strahldichtefaktors fuer die 45/0-messgeometrie |
EP0195339B1 (de) * | 1985-03-21 | 1992-07-29 | Abbott Laboratories | Spektralfotometer |
-
1987
- 1987-09-04 JP JP62222454A patent/JP2604754B2/ja not_active Expired - Fee Related
-
1988
- 1988-09-02 DE DE88308163T patent/DE3886308T2/de not_active Expired - Fee Related
- 1988-09-02 EP EP88308163A patent/EP0306337B1/de not_active Expired - Lifetime
- 1988-09-03 KR KR1019880011373A patent/KR970005587B1/ko not_active IP Right Cessation
- 1988-09-06 US US07/240,617 patent/US4921351A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
US4921351A (en) | 1990-05-01 |
JP2604754B2 (ja) | 1997-04-30 |
KR970005587B1 (ko) | 1997-04-18 |
EP0306337A3 (en) | 1990-09-19 |
KR890005498A (ko) | 1989-05-15 |
DE3886308T2 (de) | 1994-03-31 |
EP0306337A2 (de) | 1989-03-08 |
EP0306337B1 (de) | 1993-12-15 |
JPS6465424A (en) | 1989-03-10 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |