WO1997029216A1 - Alloy c11004 - Google Patents
Alloy c11004 Download PDFInfo
- Publication number
- WO1997029216A1 WO1997029216A1 PCT/US1997/002030 US9702030W WO9729216A1 WO 1997029216 A1 WO1997029216 A1 WO 1997029216A1 US 9702030 W US9702030 W US 9702030W WO 9729216 A1 WO9729216 A1 WO 9729216A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- ppm
- generally less
- oxygen
- copper
- content generally
- Prior art date
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Classifications
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- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22C—ALLOYS
- C22C9/00—Alloys based on copper
Definitions
- the present invention relates generally to alloys and more particularly to a novel high performance alloy of copper having superior bonding characteristics.
- pure copper is notable for its superior electrical conductivity and its exceptional ability to conduct and dissipate heat. For these reasons, pure copper is often a material of choice in the construction of heat sinks for microelectronic packaging.
- sheeting of pure copper is often bonded to a non-metal such as a ceramic substrate. This is preferably done by a process known as direct bonding.
- Direct bonding requires that the bonding surface of the copper be oxidized so that covalent bonds can form with the ceramic during thermal bonding.
- both sides of the sheeting are coated with (or dipped in) a chemical solution that promotes oxidation. This forms a low melting temperature eutectic of copper oxide on each side of the sheeting which, upon heating, bonds the substrate to the sheeting, and the sheeting to adjacent copper layers.
- the copper may be impregnated with oxygen.
- Materials of this general description are found for example, in a co-pending patent application, S.N. 08/474,090, filed June 7, 1995, entitled MULTILAYER LAMINATE PRODUCT AND PROCESS, the disclosure of which is hereby incorporated by reference in its entirety.
- Another object of the present invention to provide a high performance alloy with superior heat transfer properties.
- Still another object of the present invention is to provide a material with enhanced bonding characteristics.
- Yet another object of the present invention is to provide a material which yields consistent bond integrity, durability, reliability and dimensional stability.
- a further object of the present invention is to provide a material that withstands high temperatures while rapidly
- Still another object of the present invention is to provide simple and efficient manufacture of high performance heat sinks using direct bonding technology.
- Yet another object of the present invention is to maximize the energy transfer properties of copper alloys.
- a further object of the present invention is to facilitate low cost production of high performance heat sink structures which have acceptable acoustics, cooling rates and pressure drop.
- Another object of the present invention is to facilitate rapid dissipation of heat from microelectronic packaging.
- an enhanced bonding copper alloy characterized by an oxygen content generally within a range of 350 ppm to 709 ppm and generally less than about 10 ppm of any one impurity, the balance copper.
- a higher order copper alloy containing controlled oxygen and impurity contents represented by the formula (350-709 ppm O 2 ) + (0-30 ppm Ni) + (0-19 ppm Fe) + (0-30 ppm Si) + (0-30 ppm Al) + (0-23 ppm Zn) + (0-9 ppm Co) + (0-9 ppm Sn) + (0-9 ppm Pb) + (0- 9 ppm Mg) + (0-9 ppm Mn) + (0-9 ppm Ca), the balance copper.
- an enhanced bonding copper alloy characterized by an oxygen content generally within a range of 350 ppm to 709 ppm, an iron content generally less than about 20 ppm, and a zinc content generally less than about 24 ppm, the balance copper.
- an enhanced bonding copper alloy characterized by an oxygen content generally within a range of 350 ppm to 709 ppm, an iron content generally less than about 20 ppm, a zinc content generally below about 24 ppm, a silicon content generally less than about 31 ppm, generally less than about 31 ppm aluminum, a tin content generally less than about 10 ppm, generally below about 10 ppm lead and about 10 ppm magnesium, a manganese content generally less than about 10 ppm, generally less than about 10 ppm cobalt, generally below about 31 ppm nickel, and a cadmium content of generally less than about 10 ppm, the balance copper.
- an enhanced bonding copper alloy characterized by an oxygen content generally within a range of 350 ppm to 709 ppm, an iron content generally less than about 20 ppm, a zinc content below about 24 ppm, a silicon content generally less than about 31 ppm, generally less than about 31 ppm aluminum, a tin content generally less than about 10 ppm, generally below about 10 ppm lead and about 10 ppm magnesium, a manganese content generally less than about 10 ppm, generally less than about 10 ppm cobalt, generally below about 31 ppm nickel, a cadmium content generally less than about 10 ppm, less than about 10 ppm calcium, below about 10 ppm beryllium, less than approximately 10 ppm chromium, and generally less than about 10 ppm phosphorus, the balance copper.
- FIG. 1 is a micrograph of an enhanced bonding copper alloy strip at 120 x magnification containing about 700 ppm oxygen, in accordance with one aspect of the present invention
- FIG. 2 is a micrograph of an enhanced bonding copper alloy strip at 120 x magnification containing about 380 ppm oxygen, in accordance with another aspect of the present invention
- FIG. 3 is a graph for Alloy C11004 showing impurities as a function of oxygen content for cobalt, tin, lead, magnesium, manganese and calcium;
- FIG. 4 is a graph for Alloy C11004 showing impurities as a function of oxygen content for zinc
- FIG. 5 is a graph for Alloy C11004 showing impurities as a function of oxygen content for nickel
- FIG. 6 is a graph for Alloy C11004 showing impurities as a function of oxygen content for silicon
- FIG. 7 is a graph for Alloy C11004 showing impurities as a function of oxygen content for iron.
- FIG. 8 is a graph for Alloy C11004 showing impurities as a function of oxygen content for aluminum.
- the present invention relates to a discovery of the extraordinary bonding characteristics of Alloy C11000 at relatively high oxygen contents and minimal impurity levels.
- a higher order copper alloy containing a controlled balance of oxygen and various impurities the alloy being represented generally by the formula (350-709 ppm O 2 ) + (0-30 ppm Ni) + (0-19 ppm Fe) + (0-30 ppm Si) + (0-30 ppm Al) + (0-23 ppm Zn) + (0-9 ppm Co) + (0-9 ppm Sn) + (0-9 ppm Pb) + (0-9 ppm Mg) + (0-9 ppm Mn) + (0-9 ppm Ca), the balance copper.
- a higher order copper alloy containing a controlled balance of oxygen and various impurities the alloy being represented by the formula (350-709 ppm O 2 ) + (0-30 ppm Ni) + (0-19 ppm Fe) + (0-30 ppm Si) + (0-30 ppm Al) + (0-23 ppm Zn) + (0-9 ppm Co) + (0-9 ppm Sn) + (0-9 ppm Pb) + (0-9 ppm Mg) + (0-9 ppm Mn) + (0-9 ppm Ca) + (0-9 ppm Be) + (0-9 ppm Cr) + (0-9 ppm P), the balance copper.
- the alloy being represented by the formula (350-709 ppm O 2 ) + (0-30 ppm Ni) + (0-19 ppm Fe) + (0-30 ppm Si) + (0-30 ppm Al) + (0-23 ppm Zn) + (0-9 ppm Co) + (0-9 ppm Sn) + (0-9 ppm Pb) + (0-9 ppm M
- An exemplary definition of a successful bond is one which gives a minimum of 15 lbs./in. peel strength for a 0.015 in. thick copper sheet direct bonded to a 0.025 in. thick ceramic, e.g., beryllium oxide, using a 90 degree peel strength test.
- the oxygen content be controlled to remain within a selected envelope, e.g., generally within a range of 380 ppm and 700 ppm oxygen.
- the concentration of oxygen is about 700 ppm, as shown in FIG. 1.
- the oxygen concentration is about 380 ppm.
- Oxygen appears as heavy black spots at the grain boundaries, as is the case when the material is in the as-cast state. Upon hot working, the oxygen becomes randomly distributed m a new microstructure.
- Oxygen content is determined, e.g., by inert gas fusion using a LECO analyzer, LECO TC-436. Utilizing a 0.5 gram sample of C11004, concentrations of oxygen which may be detected fall generally within a range of 0.001% and 0.200%. Testing is conducted according to usual industry standards and procedures, though it may be modified according to common practice.
- Oxygen impregnated copper provides oxygen to the copper-ceramic or copper-copper interface more uniformly than does chemically coated copper. This improves substantially bond integrity and part reliability. Moreover, by eliminating the three chemical baths required to chemically coat copper, there is significant reduction in cost, chemical waste, and health risks alleged to be associated with hauling the waste. The dimensional stability and durability of oxygen impregnated copper is also superior.
- FIG. 3 Set forth in FIG. 3 is a graph for Alloy C11004 showing maximum acceptable impurity levels for cobalt, tin, lead, magnesium, manganese and calcium as a function of oxygen.
- FIG. 4 shows maximum acceptable impurity levels of zinc as a function of oxygen. Acceptable ranges are shown by the shaded region below the line. As this demonstrates, the correlation between high oxygen levels and zinc are generally nonlinear and erratic.
- Aluminum on the other hand, shows nonlinearities at the low end of oxygen content, but becomes linear from about the mid range to higher oxygen levels.
- impurities which may be present in the alloy include, but are limited to, chromium, beryllium, and phosphorus.
- the level of each additional impurity is preferably well below 10 ppm.
- the balance of the alloy contents are desirably copper.
- the embodiments illustrated herein have been shown and described in connection with oxygen-rich copper alloys, e.g., 99.50% Cu (Mill Standard C11000), it is understood that an analogous process could be practiced on other materials, giving consideration to the purpose for which the present invention is intended.
- the present invention may be adapted for improving bonding characteristics of other materials such as those containing precious metals, aluminum, titanium, nickel, iron, and their alloys.
- O 2 effective total O 2 - (atomic weight O 2 ) ⁇ [((Fe/(atomic
- FeO, PbO, ZnO and SnO are oxides typically present in the copper matrix. Excluded from the equation are those elements and their oxides usually at or beyond detection limits. If other constituents are present in detectable quantities, however, it is considered prudent to include them in the equation. Such materials and their oxides include Be, BeO, Si,
- cuprous oxide (Cu 2 O) in the matrix material. These oxides appear as black spherical particles under normal lighting conditions (or cherry red particles under polarized light).
- the present invention is beneficial in permitting the use of pure copper which has a substantially higher thermal
- BeO substrate has similar benefits in having a thermal conductivity substantially higher than that of AIN.
- Alloy C11004 and BeO provide superior thermal resistance performance over AIN-Cu, AI203-Cu, or high oxygen content copper clad laminates.
- a substantially higher maximum conductor current is also provided without the need for an intermediate bonding layer.
- Heat exchangers of this general type are shown, for example, in a co-pending continuation-in-part of application Serial No.
- Alloy C11004 advantageously permits cost-effective mass production of high performance heat sink structures, extending the superior cooling characteristics of Alloy Cl1000 to leading edge microelectronic applications. C11004, through its
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- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Conductive Materials (AREA)
Abstract
Description
Claims
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP97905859A EP0866883A4 (en) | 1996-02-09 | 1997-02-07 | Alloy c11004 |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US59961296A | 1996-02-09 | 1996-02-09 | |
US08/599,612 | 1996-02-09 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO1997029216A1 true WO1997029216A1 (en) | 1997-08-14 |
Family
ID=24400340
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US1997/002030 WO1997029216A1 (en) | 1996-02-09 | 1997-02-07 | Alloy c11004 |
Country Status (2)
Country | Link |
---|---|
EP (1) | EP0866883A4 (en) |
WO (1) | WO1997029216A1 (en) |
Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2183592A (en) * | 1939-12-19 | Electrical conductor | ||
JPS52131925A (en) * | 1976-04-27 | 1977-11-05 | Sumitomo Electric Ind Ltd | Heat resisting tough pitch copper for electric wire |
JPS5831051A (en) * | 1981-08-18 | 1983-02-23 | Sumitomo Electric Ind Ltd | Tough pitch copper for electric wire with softening resistance |
JPS6057913A (en) * | 1983-09-09 | 1985-04-03 | 玉川機械金属株式会社 | Cu alloy for electrode of porcelain condenser |
JPH01283333A (en) * | 1987-12-25 | 1989-11-14 | Hiroshi Sasaki | High electric conductive metallic material |
JPH02232326A (en) * | 1989-03-07 | 1990-09-14 | Kobe Steel Ltd | Copper material having good joinability with ceramic |
JPH0429390A (en) * | 1990-05-25 | 1992-01-31 | Toshiba Corp | Manufacture of ceramic circuit board |
JPH0529736A (en) * | 1991-07-19 | 1993-02-05 | Tatsuta Electric Wire & Cable Co Ltd | Flexible printed circuit board |
JPH0547231A (en) * | 1991-08-12 | 1993-02-26 | Tatsuta Electric Wire & Cable Co Ltd | Heat-resisting, bending-resisting, and wear-resisting insulated cable |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4233067A (en) * | 1978-01-19 | 1980-11-11 | Sumitomo Electric Industries, Ltd. | Soft copper alloy conductors |
JPS6033176B2 (en) * | 1980-11-21 | 1985-08-01 | タツタ電線株式会社 | Conductive copper alloy |
JPS61169191A (en) * | 1985-01-21 | 1986-07-30 | Sumitomo Electric Ind Ltd | Copper wire for welding electrode wire for can making |
JPS60243238A (en) * | 1985-03-19 | 1985-12-03 | Nippon Mining Co Ltd | Manufacture of fine copper wire |
JPS62282797A (en) * | 1986-05-29 | 1987-12-08 | Dowa Mining Co Ltd | Copper material for direct joining of ceramics-copper |
CA2140311A1 (en) * | 1994-01-14 | 1995-07-15 | Joseph P. Mennucci | Multilayer laminate product and process |
-
1997
- 1997-02-07 WO PCT/US1997/002030 patent/WO1997029216A1/en not_active Application Discontinuation
- 1997-02-07 EP EP97905859A patent/EP0866883A4/en not_active Withdrawn
Patent Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2183592A (en) * | 1939-12-19 | Electrical conductor | ||
JPS52131925A (en) * | 1976-04-27 | 1977-11-05 | Sumitomo Electric Ind Ltd | Heat resisting tough pitch copper for electric wire |
JPS5831051A (en) * | 1981-08-18 | 1983-02-23 | Sumitomo Electric Ind Ltd | Tough pitch copper for electric wire with softening resistance |
JPS6057913A (en) * | 1983-09-09 | 1985-04-03 | 玉川機械金属株式会社 | Cu alloy for electrode of porcelain condenser |
JPH01283333A (en) * | 1987-12-25 | 1989-11-14 | Hiroshi Sasaki | High electric conductive metallic material |
JPH02232326A (en) * | 1989-03-07 | 1990-09-14 | Kobe Steel Ltd | Copper material having good joinability with ceramic |
JPH0429390A (en) * | 1990-05-25 | 1992-01-31 | Toshiba Corp | Manufacture of ceramic circuit board |
JPH0529736A (en) * | 1991-07-19 | 1993-02-05 | Tatsuta Electric Wire & Cable Co Ltd | Flexible printed circuit board |
JPH0547231A (en) * | 1991-08-12 | 1993-02-26 | Tatsuta Electric Wire & Cable Co Ltd | Heat-resisting, bending-resisting, and wear-resisting insulated cable |
Non-Patent Citations (1)
Title |
---|
See also references of EP0866883A4 * |
Also Published As
Publication number | Publication date |
---|---|
EP0866883A4 (en) | 1998-12-23 |
EP0866883A1 (en) | 1998-09-30 |
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