WO1994007148A1 - Abtastverfahren für verjitterte signale - Google Patents
Abtastverfahren für verjitterte signale Download PDFInfo
- Publication number
- WO1994007148A1 WO1994007148A1 PCT/DE1993/000845 DE9300845W WO9407148A1 WO 1994007148 A1 WO1994007148 A1 WO 1994007148A1 DE 9300845 W DE9300845 W DE 9300845W WO 9407148 A1 WO9407148 A1 WO 9407148A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- recorded
- measurement
- signal
- measuring
- time
- Prior art date
Links
- 238000000034 method Methods 0.000 title claims abstract description 10
- 238000005259 measurement Methods 0.000 claims abstract description 65
- 230000003111 delayed effect Effects 0.000 claims abstract description 4
- 230000000737 periodic effect Effects 0.000 claims description 5
- 238000005070 sampling Methods 0.000 claims description 5
- 208000033766 Prolymphocytic Leukemia Diseases 0.000 description 5
- 238000010586 diagram Methods 0.000 description 2
- 238000012935 Averaging Methods 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000001208 nuclear magnetic resonance pulse sequence Methods 0.000 description 1
- 230000001960 triggered effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R13/00—Arrangements for displaying electric variables or waveforms
- G01R13/20—Cathode-ray oscilloscopes
- G01R13/22—Circuits therefor
- G01R13/34—Circuits for representing a single waveform by sampling, e.g. for very high frequencies
- G01R13/342—Circuits for representing a single waveform by sampling, e.g. for very high frequencies for displaying periodic H.F. signals
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04Q—SELECTING
- H04Q2213/00—Indexing scheme relating to selecting arrangements in general and for multiplex systems
- H04Q2213/1316—Service observation, testing
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04Q—SELECTING
- H04Q2213/00—Indexing scheme relating to selecting arrangements in general and for multiplex systems
- H04Q2213/13209—ISDN
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04Q—SELECTING
- H04Q2213/00—Indexing scheme relating to selecting arrangements in general and for multiplex systems
- H04Q2213/1332—Logic circuits
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04Q—SELECTING
- H04Q2213/00—Indexing scheme relating to selecting arrangements in general and for multiplex systems
- H04Q2213/13322—Integrated circuits
Definitions
- the invention relates to a method for sampling an analog, periodic measurement signal with a pre-event.
- these impulses have to be recorded analogously.
- the pulses are sampled using a conventional sampling method.
- One measurement value per individual signal is taken from the periodically occurring measurement signal (pulse sequence).
- the measured value recording of the first measuring point takes place by triggering on the beginning of the measuring signal.
- the time for the subsequent recording of the measured value is delayed by a time unit corresponding to the resolution. As a result, the entire measurement signal is gradually acquired.
- This delay is implemented in a manner known per se with a delay counter which loads the number of previously recorded measuring points from a measuring point counter as the starting value after each measurement value recording.
- the continuously increasing delay results from the countdown from the start value and the triggering of an AD converter each time the counter reading reaches zero in the delay counter.
- the entire measurement signal is sampled and digitized by the successive sampling of the periodic measurement signal at chronologically successive measurement points.
- the delay counter is controlled by a clock generator, the pulse rate of which is determined by the resolution, for example 128 measuring points, within the 5 ⁇ s long measuring signal.
- the measuring point counter and the delay counter are controlled by a sequence control.
- the measurement signal should be recorded with a pre-event of 2.5 ⁇ s and an equally large lag. As a result, direct triggering on the measurement signal to be recorded is no longer possible.
- the measurement signal is generated digitally in a so-called ISDN terminal and is subject to a phase jitter which is substantially greater in magnitude than the measurement resolution required.
- the invention has for its object to provide a method for recording measured values with a pre-event for a jittered measurement signal.
- Fig. 1 is a block diagram of a circuit arrangement for performing the inventive method
- Fig. 2 is a timing diagram for explanation.
- an interface device 1 which gives a measurement signal via a line 14 to a comparator 3 and a digitizing module 8 with a sample and hold stage and a downstream AD converter.
- the comparator 3 outputs a trigger signal via a line 13 to a PLL stage 4, to a latch module 2 and to a microprocessor 9.
- the PLL stage sets a measurement signal repetition clock via a line 15 to a sequence control 10.
- the sequence controller 10 controls a measuring point counter 5 via a control line 16 and a delay counter 7 via a control line 17, the counting rate of which is determined by a switched-on clock generator 6.
- the output for the counter reading of the measuring point counter 5 is present at the input of the delay counter 7 via a data bus 11.
- the corresponding outputs of the latch module 2, of the digitizing module 8, and the data bus connections of the microprocessor 9 are also connected to the data bus 11.
- the outputs for the counter state of the delay counter 7 are connected to the inputs of the latch module 2 via a data line 12.
- the delay counter 7 outputs a trigger pulse via a line 18 to the digitizing module 8. 2 shows an amplitude A of a measurement signal SI against a time grid.
- the time grid is formed by measurement times Z with the values from 0 to 256, the number and the time interval between the measurement times Z being determined by the duration of the measurement signal SI, including the pre-event and lag, and the predetermined resolution.
- Jittered measurement signals S2 and S3 are also shown, the measurement signal S2 lagging in its phase compared to the measurement signal SI, and the measurement signal S3 leading in its phase compared to the measurement signal SI.
- the measurement signal SI has three measurement points AI, B1, Cl and the measurement signals S2 and S3 each have a measurement point B2 or B3.
- FIGS. 1 and 2 In the following description of the invention, reference is made to FIGS. 1 and 2.
- the measurement signals SI to S3 are sampled by a so-called sampling method.
- the measurement signals SI to S3 are given by the interface device 1 on the line 14 to the digitizing module 8.
- This digitizing module 8 contains a sample and hold stage and a downstream AD converter (neither of which is shown in detail) for digitizing the signals present.
- the measurement signals SI to S3 are present at the comparator 3, which, when the trigger level TP is exceeded by the signals, generates a trigger signal on line 13 delivers.
- the line 13 is connected to the PLL stage 4, which forms a measurement signal repetition clock from the trigger signal on the basis of the periodic measurement signals SI to S3 and transmits it to the sequence controller 10 via the line 15.
- the phase of the measurement signal repetition cycle leads the measurement signals SI to S3 to be detected by the duration of the desired previous event.
- the method according to the invention also works without PLL stage 4 if the basic system clock is known. Then the correct phase position of this basic cycle must be ensured so that the required pre-event can also be recorded. A phase shifter can be used for this.
- the measurement signal SI which occurs periodically, is taken from one measurement value per individual signal. After each measured value recorded, the recording of the following measured value is delayed by a time unit corresponding to the resolution. As a result, the entire measurement signal SI is sampled gradually.
- the measured value is to be understood here as the digital value of a measuring point on one of the measuring signals SI to S3 at one of the measuring times Z of the time grid.
- the required delay is realized by the delay counter 7, which loads the number of previously recorded measuring points from the measuring point counter 5 after each measuring point recorded.
- the count of the measuring point counter 5 is increased by the value 1 after the recording of each measuring point.
- the constantly increasing delay and thus the recording of the subsequent measuring point results by counting down the delay counter 7.
- the delay counter 7 sends a trigger pulse to the digitizing module 8 via the line 18, which digitizes the measuring signal SI present at this measuring time Z and outputs the associated value to the data bus 11.
- the start of the delay counter 7 is always triggered by the phase-locked measuring signal emitted by the PLL stage 4 on the line 15 via the sequence control 10.
- the recording of the subsequent measurement point (in the subsequent period of the measurement signal SI) is thereby increased by the delay time, for example 42 ns.
- the delay counter 7 is clocked by the clock generator 6 with the time unit of, for example, 42 ns.
- the resolution of the measurement curves is recorded by the clock generator 6, i.e. determines the time intervals between the successive measuring points.
- the triggering by the actual measurement signal is used to record the counter reading of the delay counter 7 at this point in time, and thus the position of the measurement sample over time.
- the time of the trigger point T1 (or T2 and T3) of the measurement signal SI (or S2 and S3) is recorded within the time grid.
- the counter reading is transmitted, for example, via the data bus 11.
- An additional connection can also be provided.
- the count of the delay counter 7 is decreased by the value 1 at each of the measuring times Z until the digitization takes place by the digitizing module 8 at the value zero.
- the signal start of the measurement signal SI is detected. This is determined by the trigger point T1, i.e. the amplitude A of the measurement signal SI exceeds the trigger level TP, determined in the comparator 3.
- the comparator 3 outputs the trigger signal via the line 13, as a result of which the count (in this case the value 1) of the delay counter 7 is transferred to the latch module 2 at this point in time.
- the trigger signal is also present at the microprocessor 9, so that this counter reading, which corresponds to the time of the signal start in the time pattern of the measuring times Z, can be stored together with the subsequently recorded measured value of the measuring point AI.
- value 2 is transferred to latch block 2.
- the numerical value 8 is loaded into the delay counter 7.
- the measured value is recorded by the digitizing module 8.
- the value 3 is transferred to the latch module 2.
- the measuring points A1, B1 and Cl lie on the measuring signal SI assumed to be jitter-free.
- the measuring points B2 and B3 lie on the measuring signals S2 and S3 which have phase jitter.
- the measurement signal 2 has the trigger point T2, at which the value 1 is transferred to the latch module 2.
- the numerical value 7 is loaded into the delay counter 7, as with the measuring point B1. If the value in the delay counter 7 is zero, the measured value is recorded again.
- the measurement signal S3 has the trigger point T3, at which the value 4 is transferred to the latch module 2.
- the measuring point B2 of the measuring signal S2 corresponds to the time of its measurement value acquisition after the measuring point Cl of the measuring signal SI. Through the "time value" for the associated signal start, i.e. the trigger point Tl or T2, a subsequent re-sorting of the measured values is possible. The same applies to measuring point B3 of measuring signal S3.
Abstract
Description
Claims
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP93918982A EP0612410B1 (de) | 1992-09-15 | 1993-09-09 | Abtastverfahren für verjitterte signale |
US08/244,072 US5506635A (en) | 1992-09-15 | 1993-09-09 | Scanning method for jittered signals |
DK93918982T DK0612410T3 (da) | 1992-09-15 | 1993-09-09 | Fremgangsmåde til aftastning af et jitterbehæftet signal |
JP50767094A JP3303098B2 (ja) | 1992-09-15 | 1993-09-09 | ジッタを伴う信号のサンプリング方法 |
DE59309484T DE59309484D1 (de) | 1992-09-15 | 1993-09-09 | Abtastverfahren für verjitterte signale |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DEP4230853.4 | 1992-09-15 | ||
DE4230853A DE4230853C2 (de) | 1992-09-15 | 1992-09-15 | Abtastverfahren für verjitterte Signale |
Publications (1)
Publication Number | Publication Date |
---|---|
WO1994007148A1 true WO1994007148A1 (de) | 1994-03-31 |
Family
ID=6468008
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/DE1993/000845 WO1994007148A1 (de) | 1992-09-15 | 1993-09-09 | Abtastverfahren für verjitterte signale |
Country Status (6)
Country | Link |
---|---|
US (1) | US5506635A (de) |
EP (1) | EP0612410B1 (de) |
JP (1) | JP3303098B2 (de) |
DE (2) | DE4230853C2 (de) |
DK (1) | DK0612410T3 (de) |
WO (1) | WO1994007148A1 (de) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE19540218A1 (de) * | 1995-10-18 | 1997-04-24 | Hartmann & Braun Ag | Einbau-Mehrkanalschreiber |
DE19650833C1 (de) * | 1996-11-29 | 1998-03-26 | Siemens Communications Test Eq | Meßeinrichtung für die Schnittstelle einer Übertragungsstrecke mit einer Vollduplex-Übertragung im Zweidrahtgleichlageverfahren |
JP4445114B2 (ja) * | 2000-01-31 | 2010-04-07 | 株式会社アドバンテスト | ジッタ測定装置及びその方法 |
US8147472B2 (en) * | 2003-11-24 | 2012-04-03 | Kimberly-Clark Worldwide, Inc. | Folded absorbent product |
DE102006037221B4 (de) | 2006-08-09 | 2018-07-19 | Rohde & Schwarz Gmbh & Co. Kg | Vorrichtung und Verfahren zur Verarbeitung und Darstellung eines abgetasteten Signals |
EP2651034B1 (de) * | 2012-04-12 | 2014-08-06 | Siemens Aktiengesellschaft | Verfahren zur Bestimmung eines Auslösepegels |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2126857A (en) * | 1982-09-14 | 1984-03-28 | Analogic Corp | Multi-mode sampling oscilloscope trigger with trigger delay compensation |
GB2128858A (en) * | 1982-10-21 | 1984-05-02 | Tektronix Inc | Digital storage oscilloscope |
EP0234883A2 (de) * | 1986-02-21 | 1987-09-02 | Hewlett-Packard Company | Apparatur und Methode für wiederholendes Zufallssampling |
-
1992
- 1992-09-15 DE DE4230853A patent/DE4230853C2/de not_active Expired - Fee Related
-
1993
- 1993-09-09 WO PCT/DE1993/000845 patent/WO1994007148A1/de active IP Right Grant
- 1993-09-09 DK DK93918982T patent/DK0612410T3/da active
- 1993-09-09 EP EP93918982A patent/EP0612410B1/de not_active Expired - Lifetime
- 1993-09-09 DE DE59309484T patent/DE59309484D1/de not_active Expired - Fee Related
- 1993-09-09 JP JP50767094A patent/JP3303098B2/ja not_active Expired - Fee Related
- 1993-09-09 US US08/244,072 patent/US5506635A/en not_active Expired - Fee Related
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2126857A (en) * | 1982-09-14 | 1984-03-28 | Analogic Corp | Multi-mode sampling oscilloscope trigger with trigger delay compensation |
GB2128858A (en) * | 1982-10-21 | 1984-05-02 | Tektronix Inc | Digital storage oscilloscope |
EP0234883A2 (de) * | 1986-02-21 | 1987-09-02 | Hewlett-Packard Company | Apparatur und Methode für wiederholendes Zufallssampling |
Non-Patent Citations (3)
Title |
---|
BLAIR ET AL.: "GLOSSARY TAKES THE MYSRERY OUT OF DSO TERMINOLOGY", EDN ELECTRICAL DESIGN NEWS, vol. 34, no. 1, 5 January 1989 (1989-01-05), NEWTON, MASSACHUSETTS US, pages 175 - 182, XP000049991 * |
KRAMER: "DER "MIXED SIGNAL"-TEST FÜHRT ZUM ZIEL", ELEKTRONIK, vol. 36, no. 5, 6 March 1987 (1987-03-06), MUNCHEN DE, pages 130 - 132 * |
LAMAY ET AL.: "A TELECOMMUNICATIONS LINE INTERFACE TEST SYSTEM ARCHITECTURE", INTERNATIONAL TEST CONFERENCE 1989 PROCEEDINGS; MEETING THE TESTS OF TIME, 31 August 1989 (1989-08-31), WASHINGTON, DC, USA, pages 216 - 221, XP010086408 * |
Also Published As
Publication number | Publication date |
---|---|
DK0612410T3 (da) | 1999-10-11 |
EP0612410A1 (de) | 1994-08-31 |
JP3303098B2 (ja) | 2002-07-15 |
EP0612410B1 (de) | 1999-03-31 |
JPH07501405A (ja) | 1995-02-09 |
DE59309484D1 (de) | 1999-05-06 |
DE4230853C2 (de) | 1999-07-01 |
US5506635A (en) | 1996-04-09 |
DE4230853A1 (de) | 1994-03-17 |
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