WO1991014173A3 - Systeme d'inspection de bandes - Google Patents

Systeme d'inspection de bandes Download PDF

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Publication number
WO1991014173A3
WO1991014173A3 PCT/US1991/001666 US9101666W WO9114173A3 WO 1991014173 A3 WO1991014173 A3 WO 1991014173A3 US 9101666 W US9101666 W US 9101666W WO 9114173 A3 WO9114173 A3 WO 9114173A3
Authority
WO
WIPO (PCT)
Prior art keywords
web
data
processing unit
video processing
inspection system
Prior art date
Application number
PCT/US1991/001666
Other languages
English (en)
Other versions
WO1991014173A2 (fr
Inventor
Jean-Louis C Guay
Original Assignee
Du Pont
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Du Pont filed Critical Du Pont
Priority to EP91907338A priority Critical patent/EP0520034B1/fr
Priority to DE69116348T priority patent/DE69116348T2/de
Publication of WO1991014173A2 publication Critical patent/WO1991014173A2/fr
Publication of WO1991014173A3 publication Critical patent/WO1991014173A3/fr

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/0006—Industrial image inspection using a design-rule based approach
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G01N21/8903—Optical details; Scanning details using a multiple detector array
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G01N2021/8861—Determining coordinates of flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N2021/8909—Scan signal processing specially adapted for inspection of running sheets
    • G01N2021/8912—Processing using lane subdivision
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10016—Video; Image sequence
    • G06T2207/10021—Stereoscopic video; Stereoscopic image sequence
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30124—Fabrics; Textile; Paper

Landscapes

  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Textile Engineering (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Quality & Reliability (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

Système d'inspection de bandes comportant une pluralité de caméras retard-et-intégration espacées transversalement (104) et synchronisées par un codeur par impulsions (110) détectant les mouvements de la bande. Les données de sortie de chaque caméra sont numérisées et stockées dans une mémoire parallèle (548) d'une unité de traitement vidéo correspondante (218), où des processeurs de séries parallèles (590) déterminent les comptages blancs, les comptages noirs, et la valeur centrale des défauts. Pour chaque unité de traitement vidéo, un ordinateur de commande (592) lit les données de sortie des processeurs de séries et transmet les données de défauts et les informations de position à un ordinateur de système (202). L'ordinateur de système détermine un type de défaut et une position absolue sur la base des données transmises et des données d'un registre de position de la bande (340). Un support (126) comportant une pluralité d'ampoules d'éclairage (120, 122, 124) pivote quand le système détecte une ampoule grillée pour que l'ampoule suivante illumine la bande.
PCT/US1991/001666 1990-03-13 1991-03-13 Systeme d'inspection de bandes WO1991014173A2 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
EP91907338A EP0520034B1 (fr) 1990-03-13 1991-03-13 Systeme d'inspection de bandes
DE69116348T DE69116348T2 (de) 1990-03-13 1991-03-13 Gewebeband-inspektionssystem

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US49301190A 1990-03-13 1990-03-13
US493,011 1990-03-13

Publications (2)

Publication Number Publication Date
WO1991014173A2 WO1991014173A2 (fr) 1991-09-19
WO1991014173A3 true WO1991014173A3 (fr) 1992-01-09

Family

ID=23958528

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US1991/001666 WO1991014173A2 (fr) 1990-03-13 1991-03-13 Systeme d'inspection de bandes

Country Status (5)

Country Link
EP (1) EP0520034B1 (fr)
JP (1) JP3151449B2 (fr)
CA (1) CA2078114A1 (fr)
DE (1) DE69116348T2 (fr)
WO (1) WO1991014173A2 (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106525874A (zh) * 2016-11-01 2017-03-22 凌云光技术集团有限责任公司 一种大幅面工业品表面检测系统

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0581408A (ja) * 1991-09-19 1993-04-02 Hiyuutec:Kk 欠点画像表示方法
US5440648A (en) * 1991-11-19 1995-08-08 Dalsa, Inc. High speed defect detection apparatus having defect detection circuits mounted in the camera housing
DE69330010T2 (de) * 1992-05-29 2001-09-13 Eastman Kodak Co Vorrichtung und Verfahren zur Beschichtungsdichteanalyse mittels Bildverarbeitung
DE19624905A1 (de) * 1996-06-21 1998-01-08 L & P Elektroautomatisations G Vorrichtung für die Qualitätskontrolle einer laufenden Warenbahn
US6273699B1 (en) 1998-05-19 2001-08-14 Udo Finke Device for manufacturing plastic film
DE19953130B4 (de) * 1999-04-30 2013-10-31 Pleva Gmbh Verfahren zur Bestimmung der Ausrichtung von Linienformationen in flächigen, insbesondere längsbewegten Bahnen eines Strukturgebildes
GB2358979B (en) * 2000-02-02 2004-05-19 Europ Electronic Syst Ltd Exposure control system
JP2001311693A (ja) * 2000-04-28 2001-11-09 Nitto Kogyo Co Ltd 検査装置
GB2384852A (en) * 2001-09-03 2003-08-06 Millennium Venture Holdings Lt Workpiece inspection apparatus
DE10208286A1 (de) * 2002-02-26 2003-09-18 Koenig & Bauer Ag Elektronische Bildauswerteeinrichtung und ein Verfahren zur Auswertung
EP1752291A1 (fr) * 2005-08-11 2007-02-14 DeCoSystem S.r.l. Méthode améliorée et son appareil pour le contrôle de la qualité des matériaux imprimés
KR101492941B1 (ko) * 2014-10-16 2015-02-13 주식회사 앤다스 종이 롤링 장치의 이상 여부 판단 시스템 및 방법
DE102015119444B4 (de) * 2015-11-11 2018-01-18 Protechna Herbst Gmbh & Co. Kg Vorrichtung und Verfahren zur Überwachung einer laufenden Warenbahn
CN110346378B (zh) * 2019-07-24 2024-05-14 浙江欧视电科技有限公司 一种全自动aoi检测设备

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4223346A (en) * 1979-04-05 1980-09-16 Armco Inc. Automatic defect detecting inspection apparatus
DE3636192C1 (de) * 1986-10-24 1988-02-18 Erhardt & Leimer Gmbh Vorrichtung zur Erfassung des Abbildes von Oberflaechenbereichen laufender Warenbahnen
DE3833752A1 (de) * 1987-10-05 1989-04-20 Zellweger Uster Ag Beleuchtungsanordnung fuer eine vorrichtung zur kontrolle von flaechengebilden, insbesondere gewebebahnen
EP0350680A2 (fr) * 1988-07-11 1990-01-17 Abb Process Automation Inc. Source lumineuse modulaire pour un système d'inspection de feuilles
EP0369585A1 (fr) * 1988-09-26 1990-05-23 Picker International, Inc. Moniteur à caméra vidéo
EP0366235B1 (fr) * 1988-09-26 1995-06-07 Picker International, Inc. Procédé et dispositif de surveillance

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4223346A (en) * 1979-04-05 1980-09-16 Armco Inc. Automatic defect detecting inspection apparatus
DE3636192C1 (de) * 1986-10-24 1988-02-18 Erhardt & Leimer Gmbh Vorrichtung zur Erfassung des Abbildes von Oberflaechenbereichen laufender Warenbahnen
DE3833752A1 (de) * 1987-10-05 1989-04-20 Zellweger Uster Ag Beleuchtungsanordnung fuer eine vorrichtung zur kontrolle von flaechengebilden, insbesondere gewebebahnen
EP0350680A2 (fr) * 1988-07-11 1990-01-17 Abb Process Automation Inc. Source lumineuse modulaire pour un système d'inspection de feuilles
EP0369585A1 (fr) * 1988-09-26 1990-05-23 Picker International, Inc. Moniteur à caméra vidéo
EP0366235B1 (fr) * 1988-09-26 1995-06-07 Picker International, Inc. Procédé et dispositif de surveillance

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106525874A (zh) * 2016-11-01 2017-03-22 凌云光技术集团有限责任公司 一种大幅面工业品表面检测系统

Also Published As

Publication number Publication date
CA2078114A1 (fr) 1991-09-14
DE69116348D1 (de) 1996-02-22
WO1991014173A2 (fr) 1991-09-19
JP3151449B2 (ja) 2001-04-03
JPH05505676A (ja) 1993-08-19
DE69116348T2 (de) 1996-06-13
EP0520034B1 (fr) 1996-01-10
EP0520034A1 (fr) 1992-12-30

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