WO1982003038A1 - One-pass type automatic plane multi-head grinding polishing and cleaning machine - Google Patents

One-pass type automatic plane multi-head grinding polishing and cleaning machine Download PDF

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Publication number
WO1982003038A1
WO1982003038A1 PCT/JP1981/000054 JP8100054W WO8203038A1 WO 1982003038 A1 WO1982003038 A1 WO 1982003038A1 JP 8100054 W JP8100054 W JP 8100054W WO 8203038 A1 WO8203038 A1 WO 8203038A1
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WO
WIPO (PCT)
Prior art keywords
polishing
grinding
wafer
machine
cleaning
Prior art date
Application number
PCT/JP1981/000054
Other languages
French (fr)
Japanese (ja)
Inventor
Kikai Co Ltd Shibayama
Yoshio Ishimura
Original Assignee
Hatano Kouichi
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hatano Kouichi filed Critical Hatano Kouichi
Priority to PCT/JP1981/000054 priority Critical patent/WO1982003038A1/en
Publication of WO1982003038A1 publication Critical patent/WO1982003038A1/en

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Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B27/00Other grinding machines or devices
    • B24B27/0023Other grinding machines or devices grinding machines with a plurality of working posts
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B7/00Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor
    • B24B7/04Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor involving a rotary work-table

Definitions

  • the object of the present invention is to provide an apparatus for automatically grinding, polishing and cleaning the plane of the wafer.
  • An object of the present invention is to provide an apparatus for automating manual operations that have been conventionally performed manually, and performing high-speed, high-precision cutting, lapping, polishing, and washing at a time.
  • FIG. 1 shows an embodiment of the present invention.
  • FIG. 1 is a top view
  • FIG. 2 is a top view of a wafer high-speed polishing apparatus
  • FIG. 3 is a side view thereof.
  • a washing device 2 is an automatic loading device 3 is an auto loading device 4. 6. 8. 11. 1 5. 18. 19. 21 is 30 wafers 5.
  • 10 is a motor 7 is a rotary table 9 Second grinding shaft 12 Pulley 13 Wafer cleaning device 14 Polishing device 16 Jet washing device 17 Motor 20 Compressor 22
  • Fig. 1 is a top view of one-pass type multi-face grinding, polish and cleaning machine
  • 1 is a vacuum chuck cleaning device
  • 2 is a wafer
  • An automatic windowing device 3 from a cassette is a device for automatically loading a wafer to a vacuum chuck 4. The wafer 4 coming out of the vacuum tweezers is accurately supplied onto the vacuum chuck.
  • Reference numeral 7 denotes a sigma-tally table, which is rotated to add up to 4, 6, 8, 11, 15, 15, 18, 19, and 21 processed products.
  • the work 8 indicates the position of the work wafer to be machined by the second grinding 9, and 9 is a grinding shaft used for intermediate grinding.
  • Reference numeral 10 denotes a motor for transmitting rotation to grind the processing wafer 11 through belt and pulley 12 during the third grinding.
  • Reference numeral 13 denotes a wafer cleaning device, which is used to perform a jet cleaning and blow water and air at a high pressure to the fan.
  • Reference numeral 14 denotes a polishing apparatus for polishing the processed wafer 15 at high speed.
  • Reference numeral 16 denotes a jetting machine which is provided to wash the processed wafer 18 after polishing.
  • 1 9 is dried by air blow with the air supplied from the compressor 20.
  • V / IPO '' It is a processed wafer to be dried.
  • 2 1 is a processing wafer in the un ⁇ -deposition position, which is unloaded by air tweezers 22 for unloading.
  • reference numeral 25 denotes a polishing head
  • reference numeral 26 denotes a gear for rotating the polishing head 25 at high speed
  • reference numeral 27 denotes a sun gear for rotating the gear 26. It is provided to rotate the polishing head 25 by being rotated together with the head arm 30.
  • Reference numeral 2 9 denotes the trajectory of the movement of the polishing head, which is inside, and reference numeral 28 denotes the outside 1.
  • Reference numeral 31 denotes a workpiece to be polished by a polishing head 25.
  • Numeral 32 in FIG. 3 denotes a spindle for rotating the head arm 30.
  • the present invention is a one-pass multi-face polishing machine having the above configuration.
  • the polishing head 25i to rotate the sun gear 27 of the KIMY at 2 rpm or more. Since the orbit revolves around the sun gear 27 at high speed while rotating above 60 ⁇ ⁇ ⁇ m, the wafer of the work 31 can be polished in a short time.

Abstract

A one-pass type automatic plane multi-head grinding, polishing and cleaning machine, which incorporates a vacuum chuck cleaning unit (1), an automatic wafer-from-cassette conveying unit (2), and a wafer-to-vacuum chuck automatic loading unit (3) and the like. This machine rotates a plane grinding stone by a motor (5) for grinding, and rotates a rotary table (7) for sequentially machining wafers (4), (6), (8), (11), (15), (18), (19) and (21). This machine sequentially grinds through second and third grinding shafts (9) and (10), and then jet cleans with a wafer cleaning unit (13). After the cleaning operation this machine polishes, at high speed with a polishing unit (14), cleans the wafers with a jet cleaning unit (16), and then automatically contains the wafers in respective cassettes. This machine can automatically execute all the operations at high speed.

Description

明 細 書  Specification
発明の名称  Title of invention
ワンパス方式の平面多頭研削、 ポリッシュ洗铮自動盤 エレクトロニクスの進歩に供い、 半導体の開発は進み I (: 、 L S I 、 L S I へと小型 精密化されつつある。  One-pass multi-face grinding, polishing and automatic lathes With the progress of electronics, the development of semiconductors is progressing, and miniaturization is progressing to I (:, LSI, LSI).
それにともないそれらのシリコン、 ガリウムヒ棻、 ガリウムリン、 G · G · G · 里結晶、 S O S ( シリコン 'オン 'サフアイャ ) 用サフアイャ、 アルミナセラミック、 ガラス等 の薄物ウェファ一の研削、 ラップ、 ポリヅシュ ΜΓの量産、 省力化が望まれている。  Along with that, mass production of thin wafers such as silicon, gallium, gallium phosphide, GGGG, sapphire for SOS (silicon 'on' sapphires), alumina ceramics, glass, etc., mass production of wraps and polishes There is a need for labor saving.
本発明のものはそれら'のウェファ一の平面を自動的に研削、 ポリッシュ、 洗淨を行う装 置を提供するにある。  The object of the present invention is to provide an apparatus for automatically grinding, polishing and cleaning the plane of the wafer.
背景技術  Background art
昔はもっぱら手作業で行なはれ、 ί¾Λの熟繚にたよつていたこれ等の 工が、 / ヲ / 年にアメリカで平面ラップ盤が発明されてから、 続いて各種の研削蠤、 ラップ盤、 ポリヅ シング盤、 洗淳装置が出現し、 現在ではどんどん接械化が進んでいる。  In the past, these processes, which were performed exclusively by hand and rely on the ripeness of ί¾Λ, were invented in the United States in ヲ / 年 / year, followed by various grinding and lapping machines. Boards, polishing machines, and washing machines have emerged, and are now being machined more and more.
発明の開示 Disclosure of the invention
本発明は従来の手作業で行なはれていた手動檨 を自動化し、 一度に 削、 ラッピ ング、 ポリツシング、 洗 を高速に高精度に行う装置を提侯するにある。  An object of the present invention is to provide an apparatus for automating manual operations that have been conventionally performed manually, and performing high-speed, high-precision cutting, lapping, polishing, and washing at a time.
図面の簡虽な説明 · Brief description of drawings ·
図は本発明の実施例を示すものであって、 第 1図はその上面図、 第 2図はウェファ高速 ポリッシング装置の上面図、 第 3図はその側面図である。  1 shows an embodiment of the present invention. FIG. 1 is a top view, FIG. 2 is a top view of a wafer high-speed polishing apparatus, and FIG. 3 is a side view thereof.
1は洗狰装置 2は自動^出装置 3はオートローデイング装置 4. 6. 8. 11. 1 5. 18. 19. 21は 30ェウェファ一 5. 10はモーター 7はロータリーテ一ブル 9は第二研削軸 12はプーリー 13はウェファ一クリーニング装置 14はポリッシ ング装置 16はジェット洗铮装置 17はモーター 20はコンプレッサー 22はェ  1 is a washing device 2 is an automatic loading device 3 is an auto loading device 4. 6. 8. 11. 1 5. 18. 19. 21 is 30 wafers 5. 10 is a motor 7 is a rotary table 9 Second grinding shaft 12 Pulley 13 Wafer cleaning device 14 Polishing device 16 Jet washing device 17 Motor 20 Compressor 22
ΟΜΡΙ アービンセット 2 3はバキュームチャッククリーニング 2 4は自動収鈉カセット 2 5はポリツシングヘッド 2 6はギヤ一 2 7は太陽ギヤ一 2 8はポリヅシングヘッド の外側 iflS 2 9はポリヅシングヘッド 側軌 £3; 3 0はへヅドアー厶 3 1はワーク 3 2はスピンドル。 ΟΜΡΙ Arbin set 2 3 Vacuum chuck cleaning 2 4 Automatic storage cassette 2 5 Polishing head 2 6 Gear 1 2 7 Sun gear 1 2 8 Outside polishing head iflS 2 9 Polishing head Side track £ 3; 30 is a head arm 31 is a work 32 2 is a spindle
発明を実 ®するための最良の形態 BEST MODE FOR CARRYING OUT THE INVENTION
次いで図によりその作用と効杲とを説 B9すれぱ、 第 1図はワンパス方式の平面多頭研削 、 ポリヅシュ、 洗淨 盤の上面図で、 1はパキュー厶チャック洗淳装置、 2はウェファ 一のカセヅ卜よりの自動窓出装置、 3はウェファ一のノ キュー厶チャック 4へのォー卜口 一ディング装置で、 パキュームピンセットから出たゥェファー 4をパキュー厶チャックの 上に正確に供給する。  Next, the action and effect are explained by the figure B9, Fig. 1 is a top view of one-pass type multi-face grinding, polish and cleaning machine, 1 is a vacuum chuck cleaning device, 2 is a wafer An automatic windowing device 3 from a cassette is a device for automatically loading a wafer to a vacuum chuck 4. The wafer 4 coming out of the vacuum tweezers is accurately supplied onto the vacuum chuck.
5は.第一軸研削装置 藍動モーターで、 バキュームチャック上のウェファ一 6の上面の平 面研削甩にと石に回転を伝える。  5: First axis grinding device The in-line motor transmits the rotation to the stone on the flat surface of the upper surface of the wafer 6 on the vacuum chuck.
7は σ—タリーテーブルで 4、 6、 8、 1 1、 1 5、 1 8、 1 9、 2 1までの加工品を加 ェする為に回 ¾するものである。  Reference numeral 7 denotes a sigma-tally table, which is rotated to add up to 4, 6, 8, 11, 15, 15, 18, 19, and 21 processed products.
加工品 8は第二研削 ¾ 9で硏削される加工ウェファ一の位置を示すもので、 9はこれの研 削軸で中間研削に用いられる。 The work 8 indicates the position of the work wafer to be machined by the second grinding 9, and 9 is a grinding shaft used for intermediate grinding.
1 0は第三研削翻に回転をベルト及びプーリー 1 2を通して 1 1の加工ウェファ一を研削 すべく回転を伝えるモーターである。  Reference numeral 10 denotes a motor for transmitting rotation to grind the processing wafer 11 through belt and pulley 12 during the third grinding.
1 3はウェファ一クリーニング装置で、 ジエツト洗 を行い水とエアーを高圧にてゥエフ ァ一に吹きつけるべくもうけられている。  Reference numeral 13 denotes a wafer cleaning device, which is used to perform a jet cleaning and blow water and air at a high pressure to the fan.
1 4はポリヅシング装置で 1 5の加工ウェファ一を高速にポリッシングするものである。  Reference numeral 14 denotes a polishing apparatus for polishing the processed wafer 15 at high speed.
1 6はジエツト谠 装置でポリッシング後の加工ウェファ一 1 8を洗^すべくもうけられ ている。  Reference numeral 16 denotes a jetting machine which is provided to wash the processed wafer 18 after polishing.
1 9はコンプレッサー 2 0より供給されたエアーにて、 エアープロ一 ·することによって乾  1 9 is dried by air blow with the air supplied from the compressor 20.
OMPI OMPI
V/IPO ' 燥される加工ウェファ一である。 V / IPO '' It is a processed wafer to be dried.
2 1はアン π—デイングポジションにある加工ウェファ一で、 アンローデイング用エアー ピンセット 2 2によりアンローデイングされる。  2 1 is a processing wafer in the unπ-deposition position, which is unloaded by air tweezers 22 for unloading.
2 3はウェファ一 οーデイング前のよごれたハ*キュー厶チャックをクリ一二ングする為に もうけられており、 ジエツ卜クリーニング及びプラッシュによりチャックの目づまりを取 り、 4のローデイングポジションへ行く前の重要な装置である。  2 3 is used to clean the dirty vacuum chuck before wafer loading, before removing the chuck by jet cleaning and splashing, and before going to the loading position 4 Is an important device.
2 4は加工をすベて終えた後自動的に収納されるカセヅトである。  24 is a cassette which is automatically stored after finishing all the processing.
本発明のこの装置を使用することにより現在まで固別に行なわれて来た^削、 ラップ、 ポリッシュ、 洗铮が自動でかつ高速、 髙密度で行なえるものである。 次いでポリヅシ ング装置について説明する。 第 2図の 2 5はポリヅシングヘッドで、 2 6はポリヅシ ングへヅド 2 5を高速に自転公転させる為めギヤ一で、 2 7はギヤ一 2 6を回転させるた めの太陽ギヤ一であり、 ヘッドアーム 3 0と共に回転されてポリッシングへッド 2 5を回 転させるためにもうけられている。  By using this apparatus of the present invention, cutting, lapping, polishing, and washing, which have been performed separately until now, can be performed automatically, at high speed, and with high density. Next, the polishing apparatus will be described. In FIG. 2, reference numeral 25 denotes a polishing head, reference numeral 26 denotes a gear for rotating the polishing head 25 at high speed, and reference numeral 27 denotes a sun gear for rotating the gear 26. It is provided to rotate the polishing head 25 by being rotated together with the head arm 30.
2 9はポリッシングヘッドの動きの軌跡で内 のものであり 2 8はその外^の 1 である。  Reference numeral 2 9 denotes the trajectory of the movement of the polishing head, which is inside, and reference numeral 28 denotes the outside 1.
3 1はポリヅシングへッド 2 5にてポリッシングされるワークである。  Reference numeral 31 denotes a workpiece to be polished by a polishing head 25.
第 3図の 3 2はへヅドアー厶 3 0に回転を与えるスピンドルである。 Numeral 32 in FIG. 3 denotes a spindle for rotating the head arm 30.
本発明は以上の構成をもったワンパス方式の^面多 ¾ポリッシュ洗狰盤である。 待 にポリヅシング装置は従来は り〜/りり rpm にて行なわれて来たものを、 : 癸明の太陽 ギヤ一 2 7を 2りりり rpm 以上で回転させる為に、 ポリッシングへヅド 2 5 i 6 0 Ο Ο τν m 以上で自転しながら高速にて太陽ギヤ一 2 7のまわりを公転するので、 ワーク 3 1のゥ ェファーを短時間にてポリッシング出来るものである。  The present invention is a one-pass multi-face polishing machine having the above configuration. In the meantime, the polishing machine used to be a conventional one that has been operated at a speed of 1 to 1 rpm: The polishing head 25i to rotate the sun gear 27 of the KIMY at 2 rpm or more. Since the orbit revolves around the sun gear 27 at high speed while rotating above 60 以上 Ο τνm, the wafer of the work 31 can be polished in a short time.
この装置を使甩することによって従来個別に行なってきた研削、 ラップ、 ポリヅシュ、 洗 狰が自動でかつ高速高精度で行なえるものである。 By using this device, grinding, lapping, polishing, and washing, which have been conventionally performed individually, can be performed automatically, at high speed, and with high accuracy.
産業上の利用 ¾能性 Industrial use
OMPIOMPI
,.„ ·Ι?0 電子工学等の進歩にともない、 ますます超高精度の極超小型電子き S品の作れる高度のェ 作機械の 要性が増すもので、 その 発は目下の急務であり、 本癸明のものはシリコンを ¾めとする^体の軍面 501、 特に L S I 等のパックラッピング、 ポリ、ソシング装置とし て使用すれば量産化省力化に大きく寄与するものである。 ,. „· Ι? 0 With the advancement of electronics, etc., the necessity of advanced machining machines capable of producing ultra-high-precision, ultra-small and ultra-compact electronic products is increasing, and its development is urgently urgent. If it is used as a package 501, especially for pack wrapping, poly, and sourcing equipment for LSIs, it will greatly contribute to mass production and labor saving.
.·' WIPO . · 'WIPO

Claims

請求の範囲 The scope of the claims
ワンパス方式で自動的に平面研削、 ポリ ヅシング、 高圧ジエツト洗铮、 エアーブロー及 びバキュームチャック诜铮を行うものであり、 高速ポリヅシング装置により高速ポリヅシ ングされる為に可能となる、 全面ウェファ一研削、 ポリッシュをする鴛 、的、 化学的加工 方法を含む、 自動ローデイングアンローデイング付のワンパス方 ¾の ^ 多 研削、 ポリ シング洗铮自動盤である。  A one-pass system that automatically performs surface grinding, polishing, high-pressure jet washing, air blowing, and vacuum chucking. It is possible to perform high-speed polishing with a high-speed polishing device. It is an automatic lathe with automatic loading and unloading, including multi-grinding, polishing and washing, including polished ox, target and chemical processing methods.
Ο ΡΙ Ο ΡΙ
八 WIPO  Eight WIPO
PCT/JP1981/000054 1981-03-10 1981-03-10 One-pass type automatic plane multi-head grinding polishing and cleaning machine WO1982003038A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
PCT/JP1981/000054 WO1982003038A1 (en) 1981-03-10 1981-03-10 One-pass type automatic plane multi-head grinding polishing and cleaning machine

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Application Number Priority Date Filing Date Title
PCT/JP1981/000054 WO1982003038A1 (en) 1981-03-10 1981-03-10 One-pass type automatic plane multi-head grinding polishing and cleaning machine
WOJP81/00054810310 1981-03-10

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Cited By (12)

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GB2324750A (en) * 1997-04-28 1998-11-04 Nec Corp Automatic wafer polishing apparatus
US6340326B1 (en) 2000-01-28 2002-01-22 Lam Research Corporation System and method for controlled polishing and planarization of semiconductor wafers
US6343978B1 (en) 1997-05-16 2002-02-05 Ebara Corporation Method and apparatus for polishing workpiece
US6354922B1 (en) 1999-08-20 2002-03-12 Ebara Corporation Polishing apparatus
US6443815B1 (en) 2000-09-22 2002-09-03 Lam Research Corporation Apparatus and methods for controlling pad conditioning head tilt for chemical mechanical polishing
US6640155B2 (en) 2000-08-22 2003-10-28 Lam Research Corporation Chemical mechanical polishing apparatus and methods with central control of polishing pressure applied by polishing head
US6682408B2 (en) 1999-03-05 2004-01-27 Ebara Corporation Polishing apparatus
US6705930B2 (en) 2000-01-28 2004-03-16 Lam Research Corporation System and method for polishing and planarizing semiconductor wafers using reduced surface area polishing pads and variable partial pad-wafer overlapping techniques
US7011569B2 (en) 1996-05-16 2006-03-14 Ebara Corporation Method and apparatus for polishing workpiece
CN104068785A (en) * 2014-06-27 2014-10-01 涂兴家 Cleaning device for multi-head brushing stain cleaning machine
CN109333337A (en) * 2018-11-19 2019-02-15 深圳市华星光电技术有限公司 Grinding device and grinding method
CN109822419A (en) * 2019-03-04 2019-05-31 天通日进精密技术有限公司 Wafer transfer device and wafer transfer method

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US3863394A (en) * 1974-02-04 1975-02-04 Speedfam Corp Apparatus for machining work pieces
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Cited By (18)

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Publication number Priority date Publication date Assignee Title
US7011569B2 (en) 1996-05-16 2006-03-14 Ebara Corporation Method and apparatus for polishing workpiece
US6379230B1 (en) 1997-04-28 2002-04-30 Nec Corporation Automatic polishing apparatus capable of polishing a substrate with a high planarization
GB2324750A (en) * 1997-04-28 1998-11-04 Nec Corp Automatic wafer polishing apparatus
GB2324750B (en) * 1997-04-28 2002-04-10 Nec Corp Automatic polishing apparatus for polishing a substrate
US6343978B1 (en) 1997-05-16 2002-02-05 Ebara Corporation Method and apparatus for polishing workpiece
US6682408B2 (en) 1999-03-05 2004-01-27 Ebara Corporation Polishing apparatus
US6878044B2 (en) 1999-03-05 2005-04-12 Ebara Corporation Polishing apparatus
US7632378B2 (en) 1999-03-05 2009-12-15 Ebara Corporation Polishing apparatus
US6354922B1 (en) 1999-08-20 2002-03-12 Ebara Corporation Polishing apparatus
US6705930B2 (en) 2000-01-28 2004-03-16 Lam Research Corporation System and method for polishing and planarizing semiconductor wafers using reduced surface area polishing pads and variable partial pad-wafer overlapping techniques
US6729943B2 (en) 2000-01-28 2004-05-04 Lam Research Corporation System and method for controlled polishing and planarization of semiconductor wafers
US6869337B2 (en) 2000-01-28 2005-03-22 Lam Research Corporation System and method for polishing and planarizing semiconductor wafers using reduced surface area polishing pads and variable partial pad-wafer overlapping techniques
US6340326B1 (en) 2000-01-28 2002-01-22 Lam Research Corporation System and method for controlled polishing and planarization of semiconductor wafers
US6640155B2 (en) 2000-08-22 2003-10-28 Lam Research Corporation Chemical mechanical polishing apparatus and methods with central control of polishing pressure applied by polishing head
US6443815B1 (en) 2000-09-22 2002-09-03 Lam Research Corporation Apparatus and methods for controlling pad conditioning head tilt for chemical mechanical polishing
CN104068785A (en) * 2014-06-27 2014-10-01 涂兴家 Cleaning device for multi-head brushing stain cleaning machine
CN109333337A (en) * 2018-11-19 2019-02-15 深圳市华星光电技术有限公司 Grinding device and grinding method
CN109822419A (en) * 2019-03-04 2019-05-31 天通日进精密技术有限公司 Wafer transfer device and wafer transfer method

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