WO1979000461A1 - Complementary mis-semiconductor integrated circuits - Google Patents

Complementary mis-semiconductor integrated circuits Download PDF

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Publication number
WO1979000461A1
WO1979000461A1 PCT/JP1978/000048 JP7800048W WO7900461A1 WO 1979000461 A1 WO1979000461 A1 WO 1979000461A1 JP 7800048 W JP7800048 W JP 7800048W WO 7900461 A1 WO7900461 A1 WO 7900461A1
Authority
WO
WIPO (PCT)
Prior art keywords
channel mis
cell arrays
single common
transistors
transistor
Prior art date
Application number
PCT/JP1978/000048
Other languages
French (fr)
Japanese (ja)
Inventor
N Matsumura
R Hoshikawa
H Ichikawa
Y Sugiura
S Sato
Original Assignee
Fujitsu Ltd
N Matsumura
R Hoshikawa
H Ichikawa
Y Sugiura
S Sato
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd, N Matsumura, R Hoshikawa, H Ichikawa, Y Sugiura, S Sato filed Critical Fujitsu Ltd
Priority to DE7878900309T priority Critical patent/DE2862337D1/en
Publication of WO1979000461A1 publication Critical patent/WO1979000461A1/en

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/04Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
    • H01L27/10Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a repetitive configuration
    • H01L27/118Masterslice integrated circuits
    • H01L27/11803Masterslice integrated circuits using field effect technology
    • H01L27/11807CMOS gate arrays
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/41Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger
    • G11C11/412Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger using field-effect transistors only
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/41Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger
    • G11C11/413Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction
    • G11C11/417Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction for memory cells of the field-effect type
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/41Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger
    • G11C11/413Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction
    • G11C11/417Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction for memory cells of the field-effect type
    • G11C11/418Address circuits
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C5/00Details of stores covered by group G11C11/00
    • G11C5/06Arrangements for interconnecting storage elements electrically, e.g. by wiring
    • G11C5/063Voltage and signal distribution in integrated semi-conductor memory access lines, e.g. word-line, bit-line, cross-over resistance, propagation delay
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K3/00Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/02Generators characterised by the type of circuit or by the means used for producing pulses
    • H03K3/353Generators characterised by the type of circuit or by the means used for producing pulses by the use, as active elements, of field-effect transistors with internal or external positive feedback
    • H03K3/356Bistable circuits
    • H03K3/356104Bistable circuits using complementary field-effect transistors
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S257/00Active solid-state devices, e.g. transistors, solid-state diodes
    • Y10S257/923Active solid-state devices, e.g. transistors, solid-state diodes with means to optimize electrical conductor current carrying capacity, e.g. particular conductor aspect ratio

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)

Abstract

A semiconductor device having a plurality of unit cells, wherein the unit cells arranged along the row direction of a semiconductor substrate define unit cell arrays which are arranged along a columnar direction of the semiconductor substrate, and include depletion regions formed between adjacent primitive cell arrays. The unit cells are each composed of first and second P-channel MIS-transistors and first and second N-channel MIS-transistors. The first P-channel MIS-transistor and first N-channel MIS-transistor each have a gate defining a first single common gate, and the second P-channel MIS-transistor and second N-channel MIS-transistor each have a gate defining a second single common gate. The sources or drains of the first and second P-channel MIS-transistors each form a first single common source or drain and, on the other hand, the sources or drains of the first and second N-channel MIS-transistors each form a second single common source or drain. The first and second single common gates are each provided at both terminals of the unit cell arrays with terminal electrodes and are further provided at the center of the unit cell arrays with central terminal electrodes. The unit cells include small depletion regions extending along both sides of the unit cell arrays. These small depletion regions may be used as regions for wiring along the columnar direction of the small depletion regions.
PCT/JP1978/000048 1977-12-30 1978-12-11 Complementary mis-semiconductor integrated circuits WO1979000461A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE7878900309T DE2862337D1 (en) 1977-12-30 1978-12-11 Complementary mis-semiconductor integrated circuits

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP77/158445 1977-12-30
JP52158445A JPS5925381B2 (en) 1977-12-30 1977-12-30 Semiconductor integrated circuit device

Publications (1)

Publication Number Publication Date
WO1979000461A1 true WO1979000461A1 (en) 1979-07-26

Family

ID=15671910

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP1978/000048 WO1979000461A1 (en) 1977-12-30 1978-12-11 Complementary mis-semiconductor integrated circuits

Country Status (5)

Country Link
US (1) US4412237A (en)
EP (1) EP0006958B1 (en)
JP (1) JPS5925381B2 (en)
DE (1) DE2862337D1 (en)
WO (1) WO1979000461A1 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0058504A2 (en) * 1981-02-12 1982-08-25 Fujitsu Limited Method of constructing a delay circuit in a master slice IC
WO1985000468A1 (en) * 1983-07-14 1985-01-31 Advanced Micro Devices, Inc. A semiconductor die having undedicated input/output cells

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JPS55150189A (en) * 1979-05-10 1980-11-21 Nec Corp Memory circuit
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JPS5636166A (en) * 1979-08-31 1981-04-09 Toshiba Corp Nonvolatile semiconductor memory
JPS56125854A (en) * 1980-03-10 1981-10-02 Nec Corp Integrated circuit
JPS5745259A (en) * 1980-09-01 1982-03-15 Hitachi Ltd Resin sealing type semiconductor device
US5552639A (en) * 1980-09-01 1996-09-03 Hitachi, Ltd. Resin molded type semiconductor device having a conductor film
US5371411A (en) * 1980-09-01 1994-12-06 Hitachi, Ltd. Resin molded type semiconductor device having a conductor film
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JPS57211248A (en) * 1981-06-22 1982-12-25 Hitachi Ltd Semiconductor integrated circuit device
EP0074805B2 (en) * 1981-09-10 1992-03-11 Fujitsu Limited Semiconductor integrated circuit comprising a semiconductor substrate and interconnecting layers
JPS5864046A (en) * 1981-10-13 1983-04-16 Nec Corp Master slice semiconductor integrated circuit device
JPS5866342A (en) * 1981-10-16 1983-04-20 Hitachi Ltd Semiconductor integrated circuit device
JPS5890758A (en) * 1981-11-25 1983-05-30 Mitsubishi Electric Corp Complementary type integrated circuit device
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JPS58112343A (en) * 1981-12-26 1983-07-04 Olympus Optical Co Ltd Semiconductor and manufacture thereof
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JPS6035532A (en) * 1983-07-29 1985-02-23 Fujitsu Ltd Master slice integrated circuit device
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US4679219A (en) * 1984-06-15 1987-07-07 Kabushiki Kaisha Toshiba X-ray tube
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US5679967A (en) * 1985-01-20 1997-10-21 Chip Express (Israel) Ltd. Customizable three metal layer gate array devices
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Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0058504A2 (en) * 1981-02-12 1982-08-25 Fujitsu Limited Method of constructing a delay circuit in a master slice IC
EP0058504A3 (en) * 1981-02-12 1983-08-31 Fujitsu Limited Method of constructing a delay circuit in a master slice ic
US4516312A (en) * 1981-02-12 1985-05-14 Fujitsu Limited Method for constructing delay circuits in a master slice IC
WO1985000468A1 (en) * 1983-07-14 1985-01-31 Advanced Micro Devices, Inc. A semiconductor die having undedicated input/output cells

Also Published As

Publication number Publication date
JPS5493375A (en) 1979-07-24
DE2862337D1 (en) 1983-11-17
EP0006958B1 (en) 1983-10-12
EP0006958A4 (en) 1980-05-06
EP0006958A1 (en) 1980-01-23
US4412237A (en) 1983-10-25
JPS5925381B2 (en) 1984-06-16

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