USD894025S1 - Electric characteristic measuring probe - Google Patents

Electric characteristic measuring probe Download PDF

Info

Publication number
USD894025S1
USD894025S1 US29/670,517 US201829670517F USD894025S US D894025 S1 USD894025 S1 US D894025S1 US 201829670517 F US201829670517 F US 201829670517F US D894025 S USD894025 S US D894025S
Authority
US
United States
Prior art keywords
measuring probe
characteristic measuring
electric characteristic
view
elevational view
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
US29/670,517
Other languages
English (en)
Inventor
Michio Kaida
Huei Che Yu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nidec Advance Technology Corp
SV Probe Technology Taiwan Co Ltd
Original Assignee
Nidec Read Corp
SV Probe Technology Taiwan Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nidec Read Corp, SV Probe Technology Taiwan Co Ltd filed Critical Nidec Read Corp
Assigned to SV PROBE TECHNOLOGY TAIWAN CO., LTD., NIDEC-READ CORPORATION reassignment SV PROBE TECHNOLOGY TAIWAN CO., LTD. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: YU, HUEI CHE, KAIDA, MICHIO
Application granted granted Critical
Publication of USD894025S1 publication Critical patent/USD894025S1/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

US29/670,517 2018-05-16 2018-11-16 Electric characteristic measuring probe Active USD894025S1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2018-010760 2018-01-25
JPD2018-10760F JP1624757S (cs) 2018-05-16 2018-05-16

Publications (1)

Publication Number Publication Date
USD894025S1 true USD894025S1 (en) 2020-08-25

Family

ID=65359084

Family Applications (1)

Application Number Title Priority Date Filing Date
US29/670,517 Active USD894025S1 (en) 2018-05-16 2018-11-16 Electric characteristic measuring probe

Country Status (3)

Country Link
US (1) USD894025S1 (cs)
JP (1) JP1624757S (cs)
TW (1) TWD198372S (cs)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD983681S1 (en) * 2020-12-03 2023-04-18 Mpi Corporation Probe for testing device under test
USD1030689S1 (en) * 2022-04-29 2024-06-11 Point Engineering Co., Ltd. Semiconductor probe pin
USD1051865S1 (en) * 2022-04-29 2024-11-19 Point Engineering Co., Ltd. Semiconductor probe pin

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP1716912S (ja) 2021-11-15 2022-06-08 電気的特性測定用プローブ

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD507198S1 (en) * 2003-06-11 2005-07-12 K&S Interconnect, Inc. Straight protruding probe beam contour surfaces
US7671610B2 (en) * 2007-10-19 2010-03-02 Microprobe, Inc. Vertical guided probe array providing sideways scrub motion
USD769748S1 (en) * 2014-12-15 2016-10-25 Omron Corporation Probe pin
USD769749S1 (en) * 2014-12-19 2016-10-25 Omron Corporation Probe pin
USD776552S1 (en) * 2014-12-15 2017-01-17 Omron Corporation Probe pin
USD776551S1 (en) * 2014-12-15 2017-01-17 Omron Corporation Probe pin
US10132833B2 (en) * 2013-07-09 2018-11-20 Formfactor, Inc. Multipath electrical probe and probe assemblies with signal paths through secondary paths between electrically conductive guide plates

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD507198S1 (en) * 2003-06-11 2005-07-12 K&S Interconnect, Inc. Straight protruding probe beam contour surfaces
USD510043S1 (en) * 2003-06-11 2005-09-27 K&S Interconnect, Inc. Continuously profiled probe beam
US7671610B2 (en) * 2007-10-19 2010-03-02 Microprobe, Inc. Vertical guided probe array providing sideways scrub motion
US10132833B2 (en) * 2013-07-09 2018-11-20 Formfactor, Inc. Multipath electrical probe and probe assemblies with signal paths through secondary paths between electrically conductive guide plates
USD769748S1 (en) * 2014-12-15 2016-10-25 Omron Corporation Probe pin
USD776552S1 (en) * 2014-12-15 2017-01-17 Omron Corporation Probe pin
USD776551S1 (en) * 2014-12-15 2017-01-17 Omron Corporation Probe pin
USD769749S1 (en) * 2014-12-19 2016-10-25 Omron Corporation Probe pin

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD983681S1 (en) * 2020-12-03 2023-04-18 Mpi Corporation Probe for testing device under test
USD1030689S1 (en) * 2022-04-29 2024-06-11 Point Engineering Co., Ltd. Semiconductor probe pin
USD1051865S1 (en) * 2022-04-29 2024-11-19 Point Engineering Co., Ltd. Semiconductor probe pin

Also Published As

Publication number Publication date
JP1624757S (cs) 2019-02-18
TWD198372S (zh) 2019-07-01

Similar Documents

Publication Publication Date Title
USD866356S1 (en) Enclosure for main unit of voltage, current, or temperature sensor
USD821640S1 (en) Electronic cigarette
USD846746S1 (en) Equipment for measuring human body information
USD816043S1 (en) Electrical connector
USD688464S1 (en) Electric toothbrush
USD894025S1 (en) Electric characteristic measuring probe
USD776051S1 (en) Electronic cigarette battery
USD850326S1 (en) Electric self-balancing vehicle
USD798445S1 (en) Electronic medical instrument
USD729405S1 (en) Sequencing instrument
USD717001S1 (en) Electric hair clipper
USD864860S1 (en) Combined electric cleaning instrument and wireless charger
USD702358S1 (en) Medical probe
USD773436S1 (en) Speaker
USD784162S1 (en) Tottle
USD808341S1 (en) Electrical connector
USD805937S1 (en) Carpet type body fat meter
USD735675S1 (en) Connector
USD820982S1 (en) Laryngoscope
USD746476S1 (en) Component analyzer
USD724900S1 (en) Egg holder
USD873823S1 (en) Article information indicator
USD757656S1 (en) Electrical bus bar
USD795197S1 (en) Electric connector
USD759153S1 (en) Electronic instrument

Legal Events

Date Code Title Description
FEPP Fee payment procedure

Free format text: ENTITY STATUS SET TO UNDISCOUNTED (ORIGINAL EVENT CODE: BIG.); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY