US6504617B2 - Method and measuring arrangement for measuring paper surface - Google Patents

Method and measuring arrangement for measuring paper surface Download PDF

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Publication number
US6504617B2
US6504617B2 US09/953,384 US95338401A US6504617B2 US 6504617 B2 US6504617 B2 US 6504617B2 US 95338401 A US95338401 A US 95338401A US 6504617 B2 US6504617 B2 US 6504617B2
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United States
Prior art keywords
paper
paperboard
measuring arrangement
camera
pixels
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Expired - Fee Related
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US09/953,384
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US20020114494A1 (en
Inventor
Hannu Komulainen
Jaana Hakkarainen
Keijo Lehmikangas
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Metso Paper Automation Oy
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Metso Paper Automation Oy
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Assigned to METSO PAPER AUTOMATION OY reassignment METSO PAPER AUTOMATION OY ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: HAKKARAINEN, JAANA, KOMULAINEN, HANNU, LEHMIKANGAS, KEIJO
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/57—Measuring gloss

Definitions

  • FIG. 2 illustrates a measuring arrangement for measuring gloss of the paper or paperboard surface
  • FIG. 4 illustrates a measuring arrangement for measuring roughness of the paper or paperboard surface

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
US09/953,384 1999-05-10 2001-09-14 Method and measuring arrangement for measuring paper surface Expired - Fee Related US6504617B2 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
FI991072 1999-05-10
FI991072A FI111757B (sv) 1999-05-10 1999-05-10 Förfarande och mätningsarrangemang för att mäta pappersyta
PCT/FI2000/000411 WO2000068666A1 (en) 1999-05-10 2000-05-09 Method and measuring arrangement for measuring paper surface

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
PCT/FI2000/000411 Continuation WO2000068666A1 (en) 1999-05-10 2000-05-09 Method and measuring arrangement for measuring paper surface

Publications (2)

Publication Number Publication Date
US20020114494A1 US20020114494A1 (en) 2002-08-22
US6504617B2 true US6504617B2 (en) 2003-01-07

Family

ID=8554637

Family Applications (1)

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US09/953,384 Expired - Fee Related US6504617B2 (en) 1999-05-10 2001-09-14 Method and measuring arrangement for measuring paper surface

Country Status (7)

Country Link
US (1) US6504617B2 (sv)
EP (1) EP1181533A1 (sv)
JP (1) JP2002544475A (sv)
AU (1) AU4408700A (sv)
CA (1) CA2373682C (sv)
FI (1) FI111757B (sv)
WO (1) WO2000068666A1 (sv)

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2004097383A1 (en) * 2003-04-29 2004-11-11 Surfoptic Limited Measuring a surface characteristic
US20060256341A1 (en) * 2005-03-10 2006-11-16 Fuji Xerox Co., Ltd Gloss measurement apparatus and gloss measurement method
US20090097033A1 (en) * 2007-10-11 2009-04-16 Honeywell International Inc. Microgloss measurment of paper and board
USRE44152E1 (en) * 2002-04-12 2013-04-16 Canon Kabushiki Kaisha Recording-material type determination apparatus and method and image forming apparatus
US20130216245A1 (en) * 2012-02-20 2013-08-22 Ricoh Company, Ltd. Optical sensor and image forming apparatus
EP3007133A3 (en) * 2014-10-08 2016-05-25 OCE-Technologies B.V. Apparatus and method for defect detection in a printing system
CN106289118A (zh) * 2016-09-06 2017-01-04 乐视控股（北京）有限公司 表面平整度的检测方法、装置及终端
US11231363B2 (en) * 2018-05-31 2022-01-25 Psm International, Inc. Quality measurement method and quality measurement device for long sheet material
US12052509B2 (en) 2021-10-01 2024-07-30 Sonoco Development, Inc. Surface topography imaging system

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
ATE492786T1 (de) 2003-09-16 2011-01-15 Paper Australia Pty Ltd Blattoberflächen-analysator und verfahren zum analysieren einer blattoberfläche
SE0601860L (sv) * 2006-09-11 2008-02-26 Stora Enso Ab Förfarande för att förutsäga tryckbarheten hos en pappers-, kartong- eller pappyta
US9459206B2 (en) * 2012-05-02 2016-10-04 Datacolor Holding Ag System and apparatus for measurement of light scattering from a sample
FI20126126L (sv) * 2012-10-30 2014-05-01 Metso Automation Oy Förfarande och anordning för att mäta glans
JP6667429B2 (ja) * 2016-12-26 2020-03-18 株式会社ＰＳＭ Ｉｎｔｅｒｎａｔｉｏｎａｌ 長尺シート材の品質計測方法および品質計測装置
JP2018140469A (ja) * 2017-02-28 2018-09-13 株式会社ディスコ 被加工物の検査方法、被加工物の検査装置及び加工装置
JP6620827B2 (ja) * 2017-04-14 2019-12-18 Ｊｆｅスチール株式会社 放射温度測定装置及び放射温度測定方法
CN110987551A (zh) * 2019-11-11 2020-04-10 陕西师范大学 一种上光液的制取及其效果测试方法

Citations (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3922093A (en) 1972-11-24 1975-11-25 Bbc Brown Boveri & Cie Device for measuring the roughness of a surface
DE2905727A1 (de) 1978-05-02 1979-11-15 Vianova Kunstharz Ag Anordnung zur messung der das glanzvermoegen von oberflaechen bestimmenden eigenschaften
GB2037978A (en) 1978-10-24 1980-07-16 Fiat Ricerche Method and apparatus for testing surface roughness
DE3020044A1 (de) 1980-05-24 1981-12-10 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V., 8000 München Geraet und verfahren zur beruehrungslosen pruefung der oberflaechenguete und zur messung der oberflaechenrauheit
US4806018A (en) 1987-07-06 1989-02-21 The Boeing Company Angular reflectance sensor
US4878114A (en) * 1988-05-10 1989-10-31 University Of Windsor Method and apparatus for assessing surface roughness
US5162660A (en) * 1991-06-27 1992-11-10 Macmillan Bloedel Limited Paper roughness or glass sensor using polarized light reflection
US5686731A (en) 1996-04-30 1997-11-11 Ati Systems, Inc. Multi-parameter scanning system with moveable field mask
US5689757A (en) * 1994-07-18 1997-11-18 Xerox Corporation Method and apparatus for detecting substrate roughness and controlling print quality
DE19733775A1 (de) 1997-08-05 1999-02-18 Honeywell Ag Verfahren zur Messung von Eigenschaften einer Materialoberfläche
WO1999010730A1 (en) 1997-08-22 1999-03-04 Spectra-Physics Visiontech Oy Method and apparatus for automatic inspection of moving surfaces

Patent Citations (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3922093A (en) 1972-11-24 1975-11-25 Bbc Brown Boveri & Cie Device for measuring the roughness of a surface
DE2905727A1 (de) 1978-05-02 1979-11-15 Vianova Kunstharz Ag Anordnung zur messung der das glanzvermoegen von oberflaechen bestimmenden eigenschaften
GB2037978A (en) 1978-10-24 1980-07-16 Fiat Ricerche Method and apparatus for testing surface roughness
DE3020044A1 (de) 1980-05-24 1981-12-10 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V., 8000 München Geraet und verfahren zur beruehrungslosen pruefung der oberflaechenguete und zur messung der oberflaechenrauheit
US4806018A (en) 1987-07-06 1989-02-21 The Boeing Company Angular reflectance sensor
US4878114A (en) * 1988-05-10 1989-10-31 University Of Windsor Method and apparatus for assessing surface roughness
US5162660A (en) * 1991-06-27 1992-11-10 Macmillan Bloedel Limited Paper roughness or glass sensor using polarized light reflection
US5689757A (en) * 1994-07-18 1997-11-18 Xerox Corporation Method and apparatus for detecting substrate roughness and controlling print quality
US5686731A (en) 1996-04-30 1997-11-11 Ati Systems, Inc. Multi-parameter scanning system with moveable field mask
DE19733775A1 (de) 1997-08-05 1999-02-18 Honeywell Ag Verfahren zur Messung von Eigenschaften einer Materialoberfläche
WO1999010730A1 (en) 1997-08-22 1999-03-04 Spectra-Physics Visiontech Oy Method and apparatus for automatic inspection of moving surfaces

Non-Patent Citations (4)

* Cited by examiner, † Cited by third party
Title
Copy of Finnich Office Action for Patent Appl. No. 991072, dated Apr. 26, 2000.
Copy of International Search Report for PCT/FI00/00411, completed Aug. 28, 2000.
J. Steurer, H. Giebel, and W. Altner, Ein lichtmikroskopisches Verfahren zur zweieinhalbdimensionalen Auswertung von Oberflächen, In Proc. 8. DAGM-Symp. Mustererkennung, 1986, Informatik Fachberichte 125, edited by G. Hartmann, pp. 66-70, Springer, Berlin.
Standard T 480 om-92; Specular Gloss Of Paper And Paperboard at 75 Degrees; TAPPI.

Cited By (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USRE44152E1 (en) * 2002-04-12 2013-04-16 Canon Kabushiki Kaisha Recording-material type determination apparatus and method and image forming apparatus
US7742168B2 (en) 2003-04-29 2010-06-22 Surfoptic Limited Measuring a surface characteristic
US20070153285A1 (en) * 2003-04-29 2007-07-05 Nick Elton Measuring a surface characteristic
WO2004097383A1 (en) * 2003-04-29 2004-11-11 Surfoptic Limited Measuring a surface characteristic
US20060256341A1 (en) * 2005-03-10 2006-11-16 Fuji Xerox Co., Ltd Gloss measurement apparatus and gloss measurement method
US7679747B2 (en) * 2005-03-10 2010-03-16 Fuji Xerox Co., Ltd. Gloss measurement apparatus and gloss measurement method
US20090097033A1 (en) * 2007-10-11 2009-04-16 Honeywell International Inc. Microgloss measurment of paper and board
US7619740B2 (en) * 2007-10-11 2009-11-17 Honeywell International Inc. Microgloss measurement of paper and board
US20130216245A1 (en) * 2012-02-20 2013-08-22 Ricoh Company, Ltd. Optical sensor and image forming apparatus
US8942583B2 (en) * 2012-02-20 2015-01-27 Ricoh Company, Ltd. Optical sensor and image forming apparatus
EP3007133A3 (en) * 2014-10-08 2016-05-25 OCE-Technologies B.V. Apparatus and method for defect detection in a printing system
US9710203B2 (en) 2014-10-08 2017-07-18 Oce-Technologies B.V. Apparatus and method for defect detection in a printing system
CN106289118A (zh) * 2016-09-06 2017-01-04 乐视控股（北京）有限公司 表面平整度的检测方法、装置及终端
US11231363B2 (en) * 2018-05-31 2022-01-25 Psm International, Inc. Quality measurement method and quality measurement device for long sheet material
US12052509B2 (en) 2021-10-01 2024-07-30 Sonoco Development, Inc. Surface topography imaging system

Also Published As

Publication number Publication date
FI991072A (sv) 2000-11-11
CA2373682A1 (en) 2000-11-16
JP2002544475A (ja) 2002-12-24
FI991072A0 (sv) 1999-05-10
CA2373682C (en) 2006-12-19
WO2000068666A1 (en) 2000-11-16
FI111757B (sv) 2003-09-15
EP1181533A1 (en) 2002-02-27
US20020114494A1 (en) 2002-08-22
AU4408700A (en) 2000-11-21

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