US3917950A - Fluoroscopic screen which is optically homogeneous - Google Patents

Fluoroscopic screen which is optically homogeneous Download PDF

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Publication number
US3917950A
US3917950A US458555A US45855574A US3917950A US 3917950 A US3917950 A US 3917950A US 458555 A US458555 A US 458555A US 45855574 A US45855574 A US 45855574A US 3917950 A US3917950 A US 3917950A
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United States
Prior art keywords
light
plate
fluoroscopic
screen
ray
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
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US458555A
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English (en)
Inventor
Roland W Carlson
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United States Steel Corp
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United States Steel Corp
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Filing date
Publication date
Application filed by United States Steel Corp filed Critical United States Steel Corp
Priority to US458555A priority Critical patent/US3917950A/en
Priority to GB1297275A priority patent/GB1458947A/en
Priority to CA223,236A priority patent/CA1031082A/en
Priority to NL7503894A priority patent/NL7503894A/xx
Priority to FR7510218A priority patent/FR2266901B1/fr
Priority to DE19752514942 priority patent/DE2514942A1/de
Priority to DK146775A priority patent/DK146775A/da
Priority to IT67886/75A priority patent/IT1036204B/it
Priority to JP50041939A priority patent/JPS50146385A/ja
Application granted granted Critical
Publication of US3917950A publication Critical patent/US3917950A/en
Priority to JP1983076122U priority patent/JPS5917879U/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K4/00—Conversion screens for the conversion of the spatial distribution of X-rays or particle radiation into visible images, e.g. fluoroscopic screens
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/043—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using fluoroscopic examination, with visual observation or video transmission of fluoroscopic images

Definitions

  • ABSTRACT A high efficiency fluoroscopic screen for X-ray examination consists of an optically homogeneous crystal plate of fluorescent material such as activated cesium iodide, supported on a transparent protective plate, with the edges of the assembly beveled and optically coupled to a light absorbing compound.
  • the product 7 is dressed to the desired thickness and provided with an X'ray'transparent light-opaque cover.
  • the structure and arrangement of the fluorescent crystal plate according to this invention involves several special features in addition to the conventional X- ray-transparent but light-opaque backing on the blank face (that is, the face closest to the X-ray source) and light-transparent supporting and protective window on the opposite active face.
  • One such feature is optical coupling of the crystal plate and transparent window over their entire width, clear to the edge, and beveling of the edge of the assembly.
  • Another feature is a light-absorbent material of high refractive index surrounding and in contact with the beveled edge.
  • beveled edge The purpose of the beveled edge is to increase the absorption of the light totally internally reflected to the edges of the plate over absorption of light reaching a square edge.
  • a thorough ray trace analysis shows that the beveled edged directs this lateral light component to the light absorbent material with about twice the efficiency of a square edge. If the lateral light is not trapped at the edge, it will return by reflection into the crystal volume where it can encounter inevitable surface or volumeteric defects wherefrom the light can scatter into the image plane. Such scattered light will reduce the image contrast and thus decrease the sensitivity of the system.
  • the beveled edge and the margin of the plane face opposing the beveled edge With a light-absorbing material.
  • the refractive index of this material should be as high as possible.
  • the amount of light energy passing into the absorbing material will depend on the refractive index of the material relative to that of the plate. The closer the index match, the greater the energy transfer and, thus, the greater the chance for absorption of the light by lightabsorbing pigment, such as carbon black, in the edge coating material.
  • the beveled edge does not have to have any particular kind of finish, since very beneficial results are obtained with either polished or rough surfaces, but best results have been obtained with rough surfaced beveled edges. This eliminates the need for a special operation of polishing the edges.
  • Another special feature of this invention involves the internal structure of the plate of fluorescent material.
  • Such plates have previously been prepared by crystallizing a salt containing a small amount of an activating element, such as any alkali metal halide (sodium, potassium or cesium iodide) activated by a minor proportion of a different element (thallium, for example).
  • an activating element such as any alkali metal halide (sodium, potassium or cesium iodide) activated by a minor proportion of a different element (thallium, for example).
  • the activating material as well as deactivating impurities can segregate and appear in higher proportions in some locations than in others. The consequence can be non-uniform intensity of fluorescence, which obscures the desired image.
  • the impurities are of a kind causing afterglow or phosphorescence, non-uniform distribution causes still further spurious images.
  • fluorescent crystal plates can be prepared not only by direct crystallization but also by grinding and thoroughly mixing the fluorescent salt containing the desired activator followed by hot pressing, or by heating to a temperature of plasticity followed by plastic kneading and final pressing. The pressed slab is then finished to the desired size and shape and surface condition in the usual manner.
  • Such crystal plates formed by mixing followed by hot pressing have very uniform properties and are essentially free from spurious images.
  • the mounting for the crystal plate assembly will normally include conventional internal flanges or glare stops surfaced with black non-reflecting coatings, to absorb the light which emerges from the window in a direction other than that of the optical system.
  • FIG. 1 is a diagrammatic view on a small scale of a fluorescent screen arranged for X-ray inspection of a large object.
  • FIG. 2 is a diagrammatic section on a larger scale of a fluorescent screen
  • FIG. 3 is a similar section of one edge portion only on a much larger scale.
  • FIG. 4 is a partial diagrammatic section of a fluorescent screen arranged for X-ray inspection of a small object.
  • FIG. Si a diagrammatic section of a modification.
  • DETAILED DESCRIPTION preferred to use one of the combinations known to fluorescebrightly in X-rays, such as cesium iodide activated by thallium, for example, a mixture of 10,000 parts cesium iodide with 13 parts thallium iodide (about one-tenth mol percent).
  • cesium iodide activated by thallium for example, a mixture of 10,000 parts cesium iodide with 13 parts thallium iodide (about one-tenth mol percent).
  • This can be formed into a reasonably homogeneous crystal mass by crystallization from a melt in a cylindrical mold.
  • a slab can be cut from the mass by a wet string, polished on one side, cemented to a glass plate by a clear adhesive, such as an epoxy cement, and then be ground and polished to the desired thickness.
  • crystal plate 20 preferably has a diameter 20 to 50 times its thickness, or otherwise stated, is dressed and polished to a thickness 2 to 5% of its diameter.
  • the edge of the fluorescent plate assembly including the glass support is finished to a bevel of about 45, preferably facing toward the X-ray source, and can be left in a rough ground finish without polishing.
  • edge coating 26 covers the area facing the ring 25, it is convenient to make it of an adhesive material so that it will serve the dual function of absorbing light at the edge and of supporting the assembly of fluorescent plate 20 and glass plate 21 on the ring 25. Accordingly, it is preferred to make the edge coating 26 from an epoxy adhesive of high refractive index containing a light-absorbing pigment such as carbon black and to cement the glass plate 2 1 to the ring 25 by means of this adhesive.
  • an epoxy adhesive of high refractive index containing a light-absorbing pigment such as carbon black
  • other supporting means such as clamps may be used, particularly if the screen is large and heavy and is likely to be subjected to vibration or shocks.
  • the mirror 27 It is therefore often preferred to omit the mirror 27 and instead to continue the light-absorbent coating 26, in optical contact with crystal plate 20, clear across the back surface, as shown in FIG. 5.
  • the backing 28 can be omitted.
  • any particular point 30 in the crystal plate 20 when it receives X-rays will fluoresce with visible light radiated in every direction.
  • a light ray 31 perpendicular to the surface will emerge in the same direction.
  • a light ray 32 at a small angle of incidence will be refracted, as indicated by the dash lines showing previous direction and solid lines showing refracted direction, both in passing from the crystal plate 20 into theglass plate 21 and in passing from the glass plate 21 into the atmosphere. Because of the presence of quarter-wave coating 22, very little of the light at angles less than the critical angle of incidence will be internally reflected to appear at an undesired location.
  • a light ray 33 at the critical angle of incidence will not emerge but will be totally internally reflected.
  • a light ray 34 at considerably greater than the critical angle of incidence cannot emerge and will be totally reflected one or more times until it reaches the edge. There most of the light will be absorbed in edged coating 26, but some will be reflected. Because of the angle of the beveled edge, almost all reflected light will be directed toward the part of the opaque edge coating 26 which is on the plane face, and will pass through the quarter-wave coating 22 to be absorbed in the edge coating 26. 7
  • This invention can be used in large sizes for examining large objects or in small sizes for examining small objects.
  • the general arrangement will be the same in both cases, but some differences in details may be more convenient in one case or the other.
  • FIG. 4 shows an arrangement for using a crystal plate screen in X-ray inspection of small objects for which it may not be convenient to use a mirror to reflect the image to one side, out of the X-ray beam. In such cases, it will be necessary to use in the optical system types of glass which are not damaged by the X-ray frequencies used, and also video cameras and accessories which are not sensitive to X-rays, as is well understood.
  • the actual structure of the fluorescent screen is the same as in the description of FIG. 2 and FIG. 3, being only smaller in dimension, with a useful screen diameter in the range of one or two centimeters. It therefore contains the same crystal plate 20 cemented to a glass plate 21 with a quarter-wave coating 22 on its exposed surface, and a mirror 27 against the free surface of crystal plate 20, together with a light-opaque X-raytransparent backing sheet 28. It also has a beveled edge surrounded by a light-absorbing coating 26 and set in a supporting ring 25.
  • the ring together with the fluorescent screen assembly is suitably connected to a video camera 14 consisting of an optical lens 40 focused on the photocathode 41 of a video camera tube 43, such as an isocon or other conventional camera tube.
  • the light-tight housing connecting the fluorescent screen 12 to the video camera 14 preferably contains internal flanges 42 coated with light-absorbent material and functioning as light traps or glare shields to eliminate as far as possible the last traces of diffuse light which may have escaped from the edges of the fluorescent plate, along with all of the emerging light directed otherwise than into the aperture of the lens.
  • a combination of a reflective backing and an optically absorbent backing on the fluorescent crystal plate may be found useful.
  • a mirror may be located against the center of the fluorescent crystal plate where sharpest definition is obtained,
  • the mirror may be placed against the marginal portion, with a central hole, either small or large, filled with such a coating for centering the imaging system or for other purposes.
  • the fluorescent screens described above, with fluorescent crystal plates consisting mainly of alkali metal, halides, are best adapted for use with low voltage X- rays in examination of articles of low or medium den tion is preferred over electromagnetic radiation, for example in neutron fluoroscopy, a crystal material should be chosen which is suitably responsive to the particular radiation involved.
  • a crystal material should be chosen which is suitably responsive to the particular radiation involved.
  • the lithium isotope of atomic mass 6 in the form of lithium iodide activated with europium is suitable for use with thermal neutrons and is commercially available.
  • this invention produces fluoroscopic images of unparalleled brillance and contrast, depicting the internal structure of objects with a clarity previously considered to be unattainable. This is particularly important for automatic inspection without visual observation by operators, in which a machine interpretation of the image to detect irregularities in density or position is required.
  • the extremely good signal to noise ratio in electric signals produced from the fluorescent screens of this invention greatly facilitates mechanization of the X-ray inspection of manufactured articles, and the consequent elimination of operator errors as well as the labor cost of human operator inspection.
  • a fluoroscopic screen comprising an assembly of a light-transparent supporting plate optically coupled by a light-transparent bonding layer to an optically homogeneous plate of light-transparent X-ray fluorescent material, the said assembly having a beveled edge.
  • An X-ray fluoroscopic system including a source of X-rays on one side of a space for an object to be examined, a fluoroscopic screen on the other side of the space, and an image detector coupled to the screen by an optical lens, characterized in that the fluorescent screen comprises an assembly of a light-transparent supporting plate optically coupled by a lighttransparent bonding layer to an optically homogeneous plate of light-transparent X-ray fluorescent material, and in that the said assembly has a beveled edge.
  • An X-ray fluoroscopic system as in claim 15 in which the supporting plate is glass with a quarter-wave coating on its free face, the plate of fluorescent material is protected by an X-ray-transparent cover, and the beveled edge is surrounded by a coating of a lightabsorbent material.
  • An X-ray fluoroscopic system as in claim 16 including additionally glare shields to absorb light emerging from the fluoroscopic screen in direction other than directly toward the lens aperture.

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Multimedia (AREA)
  • General Physics & Mathematics (AREA)
  • Radiology & Medical Imaging (AREA)
  • Pathology (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Measurement Of Radiation (AREA)
  • Image-Pickup Tubes, Image-Amplification Tubes, And Storage Tubes (AREA)
  • Cathode-Ray Tubes And Fluorescent Screens For Display (AREA)
US458555A 1974-04-08 1974-04-08 Fluoroscopic screen which is optically homogeneous Expired - Lifetime US3917950A (en)

Priority Applications (10)

Application Number Priority Date Filing Date Title
US458555A US3917950A (en) 1974-04-08 1974-04-08 Fluoroscopic screen which is optically homogeneous
CA223,236A CA1031082A (en) 1974-04-08 1975-03-27 Fluoroscopic screen which is optically homogeneous
GB1297275A GB1458947A (en) 1974-04-08 1975-03-27 Fluoroscopic systems
FR7510218A FR2266901B1 (enrdf_load_stackoverflow) 1974-04-08 1975-04-02
NL7503894A NL7503894A (nl) 1974-04-08 1975-04-02 Optisch homogeen uitgevoerd roentgenscherm.
DE19752514942 DE2514942A1 (de) 1974-04-08 1975-04-05 Fluoroskopischer schirm
DK146775A DK146775A (enrdf_load_stackoverflow) 1974-04-08 1975-04-07
IT67886/75A IT1036204B (it) 1974-04-08 1975-04-08 Schermo fluoroscopico otticamente omogeneo
JP50041939A JPS50146385A (enrdf_load_stackoverflow) 1974-04-08 1975-04-08
JP1983076122U JPS5917879U (ja) 1974-04-08 1983-05-23 螢光鏡板

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US458555A US3917950A (en) 1974-04-08 1974-04-08 Fluoroscopic screen which is optically homogeneous

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US3917950A true US3917950A (en) 1975-11-04

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US (1) US3917950A (enrdf_load_stackoverflow)
JP (2) JPS50146385A (enrdf_load_stackoverflow)
CA (1) CA1031082A (enrdf_load_stackoverflow)
DE (1) DE2514942A1 (enrdf_load_stackoverflow)
DK (1) DK146775A (enrdf_load_stackoverflow)
FR (1) FR2266901B1 (enrdf_load_stackoverflow)
GB (1) GB1458947A (enrdf_load_stackoverflow)
IT (1) IT1036204B (enrdf_load_stackoverflow)
NL (1) NL7503894A (enrdf_load_stackoverflow)

Cited By (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4078180A (en) * 1976-03-17 1978-03-07 United States Steel Corporation X-ray inspection of welds
US4107534A (en) * 1977-06-13 1978-08-15 Piltingsrud Harley V Plutonium-americium detection probe with frontal light-guide-diffuser
US4204125A (en) * 1978-03-27 1980-05-20 Minnesota Mining And Manufacturing Company High resolution X-ray intensifying screen with antireflecting substrate
US4263061A (en) * 1978-03-27 1981-04-21 Minnesota Mining And Manufacturing Company Process for forming a high resolution X-ray intensifying screen with antireflecting substrate
US4360733A (en) * 1980-09-08 1982-11-23 Bicron Corporation Window assembly for a deep well scintillation detector
EP0095188A1 (en) * 1982-05-24 1983-11-30 Fuji Photo Film Co., Ltd. Radiation image storage panel
US4636644A (en) * 1984-05-01 1987-01-13 Irt Corporation Anti-parallax scintillator system for use with penetrating ionizing radiation
US5206514A (en) * 1991-02-13 1993-04-27 Siemens Aktiengesellschaft Luminescent storage screen having a stimulable phosphor
US5498923A (en) * 1994-01-05 1996-03-12 At&T Corp. Fluoresence imaging
US6573506B2 (en) * 1998-06-18 2003-06-03 Hamamatsu Photonics K.K. Scintillator panel and radiation image sensor
US20030146698A1 (en) * 2000-07-31 2003-08-07 Akihiko Ohtomo Photocathode and electron tube
US6740897B2 (en) * 2000-12-14 2004-05-25 Fuji Photo Film Co., Ltd. Radiation image storage panel and process for reading radiation image information
US20050035294A1 (en) * 2003-07-31 2005-02-17 Juergen Leppert Luminescent body for an X-ray detector and method for producing it
WO2004095136A3 (de) * 2003-04-24 2005-03-03 Zeiss Carl Sms Gmbh Anordnung zur inspektion von objekten, insbesondere von masken in der mikrolithographie
US20060192129A1 (en) * 2003-11-07 2006-08-31 Xradia, Inc. Lens Bonded X-Ray Scintillator System and Manufacturing Method Therefor
US20110121187A1 (en) * 2009-11-16 2011-05-26 Saint-Gobain Ceramics & Plastics, Inc. Scintillation article
US20180074216A1 (en) * 2015-04-20 2018-03-15 Hamamatsu Photonics K.K. Radiation detector and method for producing same
US10490397B1 (en) * 2018-07-18 2019-11-26 Thermo Finnigan Llc Methods and systems for detection of ion spatial distribution
CN111133534A (zh) * 2017-09-27 2020-05-08 浜松光子学株式会社 闪烁器面板及放射线检测器

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5578942U (enrdf_load_stackoverflow) * 1978-11-22 1980-05-30
JPS56126750A (en) * 1980-03-11 1981-10-05 Mitsubishi Electric Corp Inspecting device for transmission of radiant ray
JPS5863559U (ja) * 1981-10-24 1983-04-28 株式会社島津製作所 Ｘ線透視装置
EP0285702B1 (en) * 1984-04-06 1993-11-03 Fuji Photo Film Co., Ltd. Stimulable phosphor sheet
JPS61228399A (ja) * 1985-04-03 1986-10-11 富士写真フイルム株式会社 放射線像変換パネルおよびその製法
GB2199443B (en) * 1986-12-04 1990-10-03 Rank Cintel Ltd Improvements in cathode ray tubes
JP4813294B2 (ja) * 2006-08-29 2011-11-09 浜松ホトニクス株式会社 光学式検査装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3745359A (en) * 1971-03-22 1973-07-10 Picker Corp Scintillation crystal with reflection inhibiting material and scintillation device embodying the crystal

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3745359A (en) * 1971-03-22 1973-07-10 Picker Corp Scintillation crystal with reflection inhibiting material and scintillation device embodying the crystal

Cited By (33)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4078180A (en) * 1976-03-17 1978-03-07 United States Steel Corporation X-ray inspection of welds
US4107534A (en) * 1977-06-13 1978-08-15 Piltingsrud Harley V Plutonium-americium detection probe with frontal light-guide-diffuser
US4204125A (en) * 1978-03-27 1980-05-20 Minnesota Mining And Manufacturing Company High resolution X-ray intensifying screen with antireflecting substrate
US4263061A (en) * 1978-03-27 1981-04-21 Minnesota Mining And Manufacturing Company Process for forming a high resolution X-ray intensifying screen with antireflecting substrate
US4360733A (en) * 1980-09-08 1982-11-23 Bicron Corporation Window assembly for a deep well scintillation detector
EP0095188A1 (en) * 1982-05-24 1983-11-30 Fuji Photo Film Co., Ltd. Radiation image storage panel
US4511802A (en) * 1982-05-24 1985-04-16 Fuji Photo Film Co., Ltd. Radiation image storage panel
US4636644A (en) * 1984-05-01 1987-01-13 Irt Corporation Anti-parallax scintillator system for use with penetrating ionizing radiation
US5206514A (en) * 1991-02-13 1993-04-27 Siemens Aktiengesellschaft Luminescent storage screen having a stimulable phosphor
US5498923A (en) * 1994-01-05 1996-03-12 At&T Corp. Fluoresence imaging
US6573506B2 (en) * 1998-06-18 2003-06-03 Hamamatsu Photonics K.K. Scintillator panel and radiation image sensor
US20030205674A1 (en) * 1998-06-18 2003-11-06 Hamamatsu Photonics K.K. Scintillator panel and radiation image sensor
US7132665B2 (en) 1998-06-18 2006-11-07 Hamamatsu Photonics K.K. Scintillator panel and radiation image sensor
US20030146698A1 (en) * 2000-07-31 2003-08-07 Akihiko Ohtomo Photocathode and electron tube
US6765352B2 (en) * 2000-07-31 2004-07-20 Hamamatsu Photonics K.K. Photocathode and electron tube
US6740897B2 (en) * 2000-12-14 2004-05-25 Fuji Photo Film Co., Ltd. Radiation image storage panel and process for reading radiation image information
WO2004095136A3 (de) * 2003-04-24 2005-03-03 Zeiss Carl Sms Gmbh Anordnung zur inspektion von objekten, insbesondere von masken in der mikrolithographie
US20060262306A1 (en) * 2003-04-24 2006-11-23 Hans-Juergen Dobschal Arrangement for inspecting objects, especially masks in microlithography
US7525115B2 (en) 2003-04-24 2009-04-28 Carl Zeiss Sms Gmbh Arrangement for inspecting objects, especially masks in microlithography
US20050035294A1 (en) * 2003-07-31 2005-02-17 Juergen Leppert Luminescent body for an X-ray detector and method for producing it
US7276705B2 (en) * 2003-07-31 2007-10-02 Siemens Aktiengesellschaft Luminescent body for an X-ray detector and method for producing it
US20060192129A1 (en) * 2003-11-07 2006-08-31 Xradia, Inc. Lens Bonded X-Ray Scintillator System and Manufacturing Method Therefor
US7297959B2 (en) * 2003-11-07 2007-11-20 Xradia, Inc. Lens bonded X-ray scintillator system and manufacturing method therefor
US20110121187A1 (en) * 2009-11-16 2011-05-26 Saint-Gobain Ceramics & Plastics, Inc. Scintillation article
US8530847B2 (en) 2009-11-16 2013-09-10 Saint-Gobain Ceramics & Plastics, Inc. Scintillation article
US20180074216A1 (en) * 2015-04-20 2018-03-15 Hamamatsu Photonics K.K. Radiation detector and method for producing same
US10379229B2 (en) * 2015-04-20 2019-08-13 Hamamatsu Photonics K.K. Radiation detector and method for producing same
CN111133534A (zh) * 2017-09-27 2020-05-08 浜松光子学株式会社 闪烁器面板及放射线检测器
EP3690897A4 (en) * 2017-09-27 2021-06-16 Hamamatsu Photonics K.K. SPARKLING PANEL AND RADIATION DETECTOR
US11099283B2 (en) * 2017-09-27 2021-08-24 Hamamatsu Photonics K.K. Scintillator panel and radiation detector
US11598889B2 (en) 2017-09-27 2023-03-07 Hamamatsu Photonics K.K. Scintillator panel and radiation detector
US10490397B1 (en) * 2018-07-18 2019-11-26 Thermo Finnigan Llc Methods and systems for detection of ion spatial distribution
US10903064B2 (en) * 2018-07-18 2021-01-26 Thermo Finnigan Llc Methods for detection of ion spatial distribution

Also Published As

Publication number Publication date
JPS50146385A (enrdf_load_stackoverflow) 1975-11-25
NL7503894A (nl) 1975-10-10
CA1031082A (en) 1978-05-09
FR2266901A1 (enrdf_load_stackoverflow) 1975-10-31
GB1458947A (en) 1976-12-15
DK146775A (enrdf_load_stackoverflow) 1975-10-09
IT1036204B (it) 1979-10-30
FR2266901B1 (enrdf_load_stackoverflow) 1978-10-20
DE2514942A1 (de) 1975-10-16
JPS5917879U (ja) 1984-02-03

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