US3885232A - Apparatus for the treatment of yarn thickness variation signals - Google Patents

Apparatus for the treatment of yarn thickness variation signals Download PDF

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Publication number
US3885232A
US3885232A US343980A US34398073A US3885232A US 3885232 A US3885232 A US 3885232A US 343980 A US343980 A US 343980A US 34398073 A US34398073 A US 34398073A US 3885232 A US3885232 A US 3885232A
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Prior art keywords
yarn
thyristor
signals
memory
sensor
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US343980A
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English (en)
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Tsugio Goto
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Asahi Kasei Corp
Asahi Chemical Industry Co Ltd
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Asahi Chemical Industry Co Ltd
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Priority to US05/521,189 priority Critical patent/US4030082A/en
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    • D—TEXTILES; PAPER
    • D03—WEAVING
    • D03J—AUXILIARY WEAVING APPARATUS; WEAVERS' TOOLS; SHUTTLES
    • D03J1/00—Auxiliary apparatus combined with or associated with looms
    • D—TEXTILES; PAPER
    • D03—WEAVING
    • D03J—AUXILIARY WEAVING APPARATUS; WEAVERS' TOOLS; SHUTTLES
    • D03J2700/00—Auxiliary apparatus associated with looms; Weavening combined with other operations; Shuttles
    • D03J2700/06—Auxiliary devices for inspecting, counting or measuring

Definitions

  • ABSTRACT This invention relates to a method and apparatus for processing yarn defect signals of a plurality of yarns on the on-line base.
  • a large number of yarn defect signals are processed through a scanning device for signal sampling, means is provided for placing possible drop-out signals into respective provisional memories, and preferably in the form of a binary 1" from a binary 0" and for reading out the contents from the memories at the beginning the next succeeding sampling period and for further processing these read-out yarn defects signals, together with regular yarn defects signals under processing through regular samplings.
  • This invention relates to a method and apparatus for processing yarn defects signals of a plurality of yarns on the on-line base for the overall evaluation of the yarn quality, said yarn defects signals being in the form of yarn thickness variation signals sensed through respective capacitor type sensors provided in a one-to-one relationship with said yarns.
  • These yarn defects information signals delivered from a large number of the capacitance type sensors are passed through and processed by a conventional electronic scanner for conveying these signals in succession from yarn to yarn into a common information processing apparatus, preferably an electronic computer, for evaluation of the general quality of the yarns under manufacture in a spinning plant.
  • signal drop-outs may occur at interscanning periods and result in a fatal and adverse effect upon the generalized yarn quality determination being carried out for the yarn manufacturing plant.
  • means are provided for placing otherwise possible drop-out signals into a provisional memory, preferably in the form of a binary l from a binary O and for reading out these memory contents from the memory at the beginning of the next succeeding sampling period and for further processing these read-out yarn defects signals, together with regular yarn defects signal under processing through regular samplings.
  • FIG. 1 is a schematic diagram of a yarn defects signal processor adapted for carrying out the method according of this invention.
  • FIG. 2 is a chart for illustration of the operating modes of the signal processing system for n-yarns.
  • FIG. 3 is an additional chart to FIG. 2 adopted for the same illustrating purpose.
  • numeral representing a yarn supplied from a spinning unit in its broadest sense comprising at least, a spinneret, a stretcher and a scouring and the like after-treating unit, not shown.
  • the yarn 100 is passed through a sensing gap formed between a pair of stationary condenser electrodes contained in a yarn defects sensor 4-1 of the capacitance type, shown only schematically in a block.
  • the thus sensed yarn defects signal is supplied through an output lead No. 1 to input terminal 22-1 ofa temporary memory circuit 5-1 which includes a silicon-controlled rectifier element 6-1 acting as memory element, condensers 9-1; 12-1 and semiconductor diodes 10-1; 11-1, resistors 7-1; 8-1, these circuit elements being electrically connected with each other as shown.
  • yarns 101; 102 100+ n are passed through respective yarn defects sensors 4-2; 4-3 4-n, each of which has similar structure as the first mentioned sensor 4-1, and the capacitively sensed yarn defects signals are fed therefrom through respective output leads Nos. 2; 3 n to temporary memories S-2', 5-3 5-n, respectively, each of which has similar structure as the first mentioned memory circuit 5-1.
  • Input terminals 22-2; 22-3 22-n correspond to that shown at 22-1.
  • Silicon-controlled rectifier elements 6-2; 6-3 6-n are same with that shown at 6-1.
  • Resistors 7-2; 7-3 7-n and 8-2; 8-3 8-n correspond to those 7-1 and 8-1, respectively.
  • Condensers 9-2; 9-3 9-n and 12-2; 12-3 12-n correspond to those denoted 9-1 and 12-1, respectively.
  • Semiconductor diodes 10-2; 10-3 10-n and 11-2; 11-3 11-n correspond to those denoted 10-1 and 11-1, respectively.
  • the respective yarn defects signals delivered from the sensors 4-1, 4-2, 4-3 4-n are shown in FIG. 2 at 1b, 2b, 3b nb, representatively and by way of exam-- ple.
  • These yarn defects signals 1b, 2b, 3b rib are conveyed through scanning contacts 14a-1, -2, 1411-3 l4a-n of scanners 14, 15 to a first information processor 19, shown only schematically by a block, as its successive inputs.
  • the memory signals in the temporary memories 5-1, 5-2, 5-3 S-n are taken out and conveyed through respective scanning contacts 14b-1, 14b-2, 14b-3 14b-n of scanners 14, 15 to a read-out circuit 20 in succession, said circuit 20 being shown only schematically by a block.
  • the operational sequence of the said first and second scanning contact series may be in the order of 140-1; 14b-1', 14a-2; 14b-2; 14a-3, 14b-3 14a-n; 14b-n.
  • Numeral 21 represents a final and overall information processor shown only schematically by a block and connected at its respective inputs 21a and 21b with the first and second information processors 19 and 20, and adapted for processing the signal outputs therefrom.
  • the final processor 21 may be a digital type electronic computer.
  • the final information processor 21 may be a digital printer or terminal recorder.
  • the part denoted of the scanning circuit 14 is a control section thereof and is connected in series with a solid state timer 16 and a relay 17 which are shown only schematically by respective blocks. ln synchronism with the scanning operations shown at lal; 2al and 3al in FIG. 2 or 3, the control section 15 delivers successively signals 22a of the signal series 22 to timer 16 which, when thus energized, initiates its operation for a predetermined time period when one of signal 230 belonging to signal series comes. At this time, relay 17 energized so as to close its contact 18 connected between the input to the processor 20 and ground. Timer 16 is reset when the signal 22b arrives in the signal series 22, thereby the operation of relay 17 is terminated so as to release its relay contact 18 from its closed position. The contact 18 is thus opened again.
  • (1) represents a group of signal series representing in turn those necessary for the operation of the first sensor 4-1 and its following electronic parts.
  • (2) represents a similar group of signal series representing in turn those necessary for operation of the second sensor 4-2 and its following electronic parts.
  • (3) (n) are related to sensors 4-3 4-n and their following electronic parts. Arrows T" appearing in FIGS. 2 and 3 demonstrate the progress of time.
  • Wave series la; 20; 3a na represents respective signal sampling modes.
  • the operational sequence can be more clearly understood by reference to FIG. 3.
  • the sampling is carried out for each of the time periods of lal; 1a2 in connection with the first yarn defects signal lb.
  • 2a2 sampling is carried out in connection with the second yarn defects signal 212.
  • sampling will be carried out at each of the time periods nal; n02 of the wave series 110.
  • the second irregular signal pulse 1b-2 is developed during the sampling period 102 and exceed over the upper established level ldl] of both limiting levels ldO; 1e0, thus it is treated as a yarn defect in the information processing.
  • the yarn defect pulse 3bl appearing in the third yarn defects signal series 3b exceeds the established level 3d; 3e and thus, the temporary memory circuit 5-3 is energized upon reception of this yarn defeet pulse.
  • the energized memory state thereof is continued until the next sampling time period 302 arrives and terminates, as shown at 3C] in the wave series 30.
  • the memorized information is read out as a yarn defect signal which will be processed. Upon this read-out, the memory is reset and cleared for the next memory operation.
  • the same will be applied to the yarn defect pulse nbl appearing in the n-th yarn defects signal series ab and, outside of the two successive sampling periods nal and n02 of wave series rm and exceeding the both established limiting levels nd; ne.
  • the memorized signal is shown at ncl of the signal series nc.
  • the pulse nbl represents, in this case also, a random and large yarn defect such as a defective broken monofilament ball in a multifilament.
  • the sensors 4-1, 4-2, 4-3 4-n are attached one by one to all the stretching twister units contained in the factory, and each being provided directly upstream of the related pirn winding stage.
  • all the manufacturing multifilaments are sensed and the sensed yarn strength variation information signals are fed out from the respective sensors to conveying leads Nos. 1, 2, 3 n, as was exaplined hereinbefore.
  • These signals are subjected to sampling once every ten seconds per yarn, through the on-off operation of relay contacts l4a-1', 14a-2,' 14a-3 l4a-n.
  • These successively sampled signals are conveyed to the first primary processor 19, as was referred to hereinbefore.
  • a random and larger yarn defect pulse 3bl representing mostly a pill, appearing outside of sampling periods such as 3a1 and 302 and exceeding the limiting levels 3d and 32, will be conveyed from lead No. 3 and through input terminal 22-3; condenser 12-3; semiconductor diodes 10-3; 11-3, condenser 9-3 and resistor 7-3 to the control grid of silicon-controlled rectifier element 6-3 which is thus energized.
  • the potential at the anode side of the element 6-3 which continue to operate even if the large yarn defect signal decreases to those lying within its regular and allowable range defined by and between the limiting both levels.
  • both sampling contacts l4a-3 and 14b-3 are closed simultaneously, the large yarn defect signal 3bl will thus be conveyed through the now-closed first relay contact 14a-3 to first primary processor 19 and the read-out binary signal 1 from the memory 5-3 through the anode of siliconcontrolled element 6-3 and the now closed relay second contact 1412-15 to second primary processor 20 acting as large yarn defect read-out circuit which is thus brought into actuation.
  • final and overall processor 21 which may preferably a digital type electronic computer, as was referred to hereinbefore.
  • the first primary processor 19 may treat simultaneously those yarn defect signals which represent the mean wave height characteristics of the yarn defect signals displaying in advance color strips to appear in the dyed and woven fabric; the mean wave area characteristics of the yarn defect signals indicating in advance dyed specks to appear later; the degree or sizes of the developed monofilament pills; the developed extraordinary monofilament conditions and yarn breakage information, if any.
  • Outputs from the final processor 21 may be used pri marily providing an indication of the overall yarn quality of the products from the factory.
  • the processed overall yarn information can be utilized for control of the quality of the spinning material and/or the overall spinning conditions of the factory plant.
  • the relay contact 18, in FIG. I is closed and the anode of the now operating silicon-controlled element 6-3 is grounded through the closed relay contacts l4b-3 and said contact 18. Therefore, the element in is reset for sensing and preserving again the large yarn defect signal.
  • the scanning apparatus has a signal sampling period of 10 seconds per one spinning unit, not shown, from which one of the multifilament yarn 100; 101', I02 or 100 n is delivered.
  • the yarn stretching and winding plant in the factory is assumed to have 156 such spinning units. Therefore, in this case, the sampling period will be 26 minutes. In other words, the sampling for one spinning unit is carried out for 10 seconds per 26 minutes.
  • a continuous yarn defect signal as shown at 2b in FIG. 2 may be frequently encountered during manufacture of synthetic multifilaments with which the invention is concerned.
  • the aforemen' tioned kind of the sampling mode is sufficiently for the desired purpose.
  • the resulted pirn could be discarded exclusively from this reason.
  • such large yarn defects as large filament pills can be practically continuously sensed and processed with an economical sampling system as shown and described.
  • the randomly developed large yarn defects are stored in the provisional memory wherein in each reception of the corresponding yarn defects signals the binary O is changed in its state into the binary 1, thus the memory means is simple and inexpensive.
  • the read-out operation for taking out the memorized yarn defects signal from the memory can be made simple and inexpensive in comparison with comparative conventional means.
  • FIG. 2 at (3) different effective signal ranges 3:10; 3e0 and 3d; 3e are shown in an overlapped manner for showing possible alteration of the range depending upon the kind and nature of the yarn and the scope and purpose of the yarn quality evaluation.
  • FIG. 2 at (n) the same is applied to different and overlapped effective yarn signal ranges defined by nd0; ne0 and nd; ne, respectively.
  • each said memory means includes a thyristor, the anode thereof being coupled to said scanner means;
  • diode means coupled between the other electrode of said capacitor and the gate electrode of said thyristor, wherein said sensor means applies a pulse to the gate of said thyristor through said capacitor and diode means, turning said thyristor on and thereby changing the potential on the anode thereof when a defect signal is sensed by said sensor means; wherein said thyristor remains on until reset by said reset means.
  • said scanner means includes normally open switch means associated with each memory means coupled to the anode of said thyristor wherein each said switch means is closed during the sampling of the corresponding memory means thereby coupling the anode of said thyristor to said processer means.
  • said reset means comprises means for grounding the anode of said thyristor thereby turning said thyristor off.

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  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Filamentary Materials, Packages, And Safety Devices Therefor (AREA)
  • Treatment Of Fiber Materials (AREA)
  • Spinning Or Twisting Of Yarns (AREA)
US343980A 1972-03-24 1973-03-22 Apparatus for the treatment of yarn thickness variation signals Expired - Lifetime US3885232A (en)

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JP2989372A JPS544221B2 (US07413550-20080819-C00001.png) 1972-03-24 1972-03-24

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US (1) US3885232A (US07413550-20080819-C00001.png)
JP (1) JPS544221B2 (US07413550-20080819-C00001.png)
CH (1) CH551923A (US07413550-20080819-C00001.png)
DE (1) DE2315328C3 (US07413550-20080819-C00001.png)
FR (1) FR2178652A5 (US07413550-20080819-C00001.png)
GB (1) GB1431675A (US07413550-20080819-C00001.png)

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3945181A (en) * 1973-08-11 1976-03-23 Toray Industries, Inc. Process and apparatus for measuring uniformity of physical properties of yarn
US4030082A (en) * 1972-03-24 1977-06-14 Asahi Kasei Kogyo Kabushiki Kaisha Apparatus for the treatment of yarn thickness variation signals
US4045659A (en) * 1975-04-07 1977-08-30 Asahi Kasei Kogyo Kabushiki Kaisha Apparatus for the evaluation of yarn qualities
US4351030A (en) * 1980-09-08 1982-09-21 Western Electric Company, Inc. Automatic repair apparatus and method for insulated wire
US4591995A (en) * 1982-05-18 1986-05-27 Zellweger Uster Ltd. Process and device for monitoring single strands in stranding processes
US5452626A (en) * 1993-03-12 1995-09-26 Rieter Ingolstadt Spinnereimaschinenbau Ag Process and device for the automatic adjustment of rotational speed ratios between operating elements of a draw frame
US5463556A (en) * 1992-06-17 1995-10-31 Rieter Ingolstadt Spinnereimaschinenbau Ag Process and device for control of an autoleveling draw frame
US5583781A (en) * 1991-06-04 1996-12-10 Rieter Ingolstadt Spinnereimaschinenbau Ag Process and device to correct the regulation onset point and the intensity of regulation
US5592849A (en) * 1992-10-16 1997-01-14 Murata Kikai Kabushiki Kaisha Yarn uneveness information analyzing apparatus
US5619773A (en) * 1993-01-25 1997-04-15 Rieter Ingolstadt Spinnereimaschinenbau Ag Draw frame

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2525560C2 (de) * 1975-06-07 1991-04-18 Fritz 7347 Bad Überkingen Stahlecker Wartungseinrichtung die längs einer eine Vielzahl von nebeneinander angeordneten Spinnstellen aufweisenden Offenend-Spinnmaschine verfahrbar ist
DE2934325A1 (de) * 1979-08-24 1981-09-10 Barmag Barmer Maschinenfabrik Ag, 5630 Remscheid Texturiermaschine mit einer luft- oder damfbeschickten texturierdruese
CH655917A5 (de) * 1982-03-11 1986-05-30 Loepfe Ag Geb Elektronische abfrageschaltung zur ueberwachung einer vielzahl von fadenlaufstellen an einer textilmaschine.
JPS5976616A (ja) * 1982-10-26 1984-05-01 Hayao Kabayama デスケ−リング法およびその装置
GB8326929D0 (en) * 1983-10-07 1983-11-09 Wool Dev Int Measuring length of textile fibres

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US3303698A (en) * 1962-12-22 1967-02-14 Loepfe Ag Geb Apparatus for sensing yarn irregularities and producing a control signal
US3456116A (en) * 1964-06-16 1969-07-15 Leesona Corp Apparatus for detecting slowly changing characteristics of moving yarn
US3461457A (en) * 1964-11-20 1969-08-12 Koreichi Kawamura Device for recording signals for controlling water fountains
US3477021A (en) * 1965-07-23 1969-11-04 Heberlein & Co Ag Volume measurement of thread defects by directly integrating signals representing variations in thread thickness
US3551981A (en) * 1967-10-19 1971-01-05 Gulf Research Development Co Method of sealingly seating an elongated object in an opening
US3582621A (en) * 1968-05-20 1971-06-01 Foxboro Co Industrial process control apparatus
US3584294A (en) * 1967-07-17 1971-06-08 Fenwal Inc A system for measuring low levels of electrical energy
US3639738A (en) * 1968-11-02 1972-02-01 Gunther R Laukien Method and device for recording spectra
US3648026A (en) * 1969-11-18 1972-03-07 Burlington Industries Inc Data monitoring system
US3660972A (en) * 1970-01-09 1972-05-09 Burlington Industries Inc Operation monitoring system
US3680299A (en) * 1970-08-10 1972-08-01 Parks Cramer Co Textile yarn production control apparatus and method
US3689898A (en) * 1971-04-29 1972-09-05 Servo Corp Of America Information processing system
US3704362A (en) * 1971-06-03 1972-11-28 Bio Medical Sciences Inc Quality control system
US3705391A (en) * 1971-10-22 1972-12-05 Massachusetts Inst Technology Memory system employing capacitance storage means
US3714623A (en) * 1971-06-08 1973-01-30 Schlumberger Technology Corp Memorizer
US3727033A (en) * 1971-02-12 1973-04-10 Travis Mills Corp Yarn measuring apparatus for use with warp knitting machines
US3731069A (en) * 1970-08-29 1973-05-01 Asahi Chemical Ind Apparatus for detecting yarn quality information
US3790887A (en) * 1969-07-10 1974-02-05 Environment One Corp Amplifying and holding measurement circuit
US3795906A (en) * 1972-05-19 1974-03-05 Leesona Corp Electronic system distinguishing between good knots and defects in a moving strand
US3798624A (en) * 1971-10-16 1974-03-19 Fielden Electronics Ltd Textile yarn treatment machines

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US3597736A (en) * 1968-07-23 1971-08-03 Burlington Industries Inc Plural station loom data collection system
US3588832A (en) * 1968-08-26 1971-06-28 Burlington Industries Inc Loom stop data collection system

Patent Citations (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3303698A (en) * 1962-12-22 1967-02-14 Loepfe Ag Geb Apparatus for sensing yarn irregularities and producing a control signal
US3456116A (en) * 1964-06-16 1969-07-15 Leesona Corp Apparatus for detecting slowly changing characteristics of moving yarn
US3461457A (en) * 1964-11-20 1969-08-12 Koreichi Kawamura Device for recording signals for controlling water fountains
US3477021A (en) * 1965-07-23 1969-11-04 Heberlein & Co Ag Volume measurement of thread defects by directly integrating signals representing variations in thread thickness
US3584294A (en) * 1967-07-17 1971-06-08 Fenwal Inc A system for measuring low levels of electrical energy
US3551981A (en) * 1967-10-19 1971-01-05 Gulf Research Development Co Method of sealingly seating an elongated object in an opening
US3582621A (en) * 1968-05-20 1971-06-01 Foxboro Co Industrial process control apparatus
US3639738A (en) * 1968-11-02 1972-02-01 Gunther R Laukien Method and device for recording spectra
US3790887A (en) * 1969-07-10 1974-02-05 Environment One Corp Amplifying and holding measurement circuit
US3648026A (en) * 1969-11-18 1972-03-07 Burlington Industries Inc Data monitoring system
US3660972A (en) * 1970-01-09 1972-05-09 Burlington Industries Inc Operation monitoring system
US3680299A (en) * 1970-08-10 1972-08-01 Parks Cramer Co Textile yarn production control apparatus and method
US3731069A (en) * 1970-08-29 1973-05-01 Asahi Chemical Ind Apparatus for detecting yarn quality information
US3727033A (en) * 1971-02-12 1973-04-10 Travis Mills Corp Yarn measuring apparatus for use with warp knitting machines
US3689898A (en) * 1971-04-29 1972-09-05 Servo Corp Of America Information processing system
US3704362A (en) * 1971-06-03 1972-11-28 Bio Medical Sciences Inc Quality control system
US3714623A (en) * 1971-06-08 1973-01-30 Schlumberger Technology Corp Memorizer
US3798624A (en) * 1971-10-16 1974-03-19 Fielden Electronics Ltd Textile yarn treatment machines
US3705391A (en) * 1971-10-22 1972-12-05 Massachusetts Inst Technology Memory system employing capacitance storage means
US3795906A (en) * 1972-05-19 1974-03-05 Leesona Corp Electronic system distinguishing between good knots and defects in a moving strand

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4030082A (en) * 1972-03-24 1977-06-14 Asahi Kasei Kogyo Kabushiki Kaisha Apparatus for the treatment of yarn thickness variation signals
US3945181A (en) * 1973-08-11 1976-03-23 Toray Industries, Inc. Process and apparatus for measuring uniformity of physical properties of yarn
US4045659A (en) * 1975-04-07 1977-08-30 Asahi Kasei Kogyo Kabushiki Kaisha Apparatus for the evaluation of yarn qualities
US4351030A (en) * 1980-09-08 1982-09-21 Western Electric Company, Inc. Automatic repair apparatus and method for insulated wire
US4591995A (en) * 1982-05-18 1986-05-27 Zellweger Uster Ltd. Process and device for monitoring single strands in stranding processes
US5583781A (en) * 1991-06-04 1996-12-10 Rieter Ingolstadt Spinnereimaschinenbau Ag Process and device to correct the regulation onset point and the intensity of regulation
US5463556A (en) * 1992-06-17 1995-10-31 Rieter Ingolstadt Spinnereimaschinenbau Ag Process and device for control of an autoleveling draw frame
US5592849A (en) * 1992-10-16 1997-01-14 Murata Kikai Kabushiki Kaisha Yarn uneveness information analyzing apparatus
US5619773A (en) * 1993-01-25 1997-04-15 Rieter Ingolstadt Spinnereimaschinenbau Ag Draw frame
US5452626A (en) * 1993-03-12 1995-09-26 Rieter Ingolstadt Spinnereimaschinenbau Ag Process and device for the automatic adjustment of rotational speed ratios between operating elements of a draw frame

Also Published As

Publication number Publication date
JPS4896262A (US07413550-20080819-C00001.png) 1973-12-08
CH551923A (de) 1974-07-31
DE2315328A1 (de) 1973-10-04
GB1431675A (en) 1976-04-14
DE2315328B2 (de) 1978-04-13
DE2315328C3 (de) 1978-11-30
JPS544221B2 (US07413550-20080819-C00001.png) 1979-03-03
FR2178652A5 (US07413550-20080819-C00001.png) 1973-11-09

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