US3745046A - Method for producing bubble domains in magnetic film-substrate structures - Google Patents
Method for producing bubble domains in magnetic film-substrate structures Download PDFInfo
- Publication number
- US3745046A US3745046A US00101785A US3745046DA US3745046A US 3745046 A US3745046 A US 3745046A US 00101785 A US00101785 A US 00101785A US 3745046D A US3745046D A US 3745046DA US 3745046 A US3745046 A US 3745046A
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- film
- substrate
- garnet
- lattice constant
- room temperature
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- 239000000758 substrate Substances 0.000 title abstract description 51
- 238000004519 manufacturing process Methods 0.000 title abstract description 4
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 abstract description 53
- 239000002223 garnet Substances 0.000 abstract description 34
- 229910052742 iron Inorganic materials 0.000 abstract description 27
- 238000000034 method Methods 0.000 abstract description 21
- 230000008021 deposition Effects 0.000 abstract description 4
- 239000010408 film Substances 0.000 description 63
- 239000000463 material Substances 0.000 description 17
- 239000013078 crystal Substances 0.000 description 15
- 238000000151 deposition Methods 0.000 description 11
- 230000005415 magnetization Effects 0.000 description 9
- 229910052733 gallium Inorganic materials 0.000 description 8
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 description 7
- 238000007906 compression Methods 0.000 description 7
- 230000006835 compression Effects 0.000 description 7
- 239000000203 mixture Substances 0.000 description 7
- 229910052772 Samarium Inorganic materials 0.000 description 6
- 238000009472 formulation Methods 0.000 description 6
- KZUNJOHGWZRPMI-UHFFFAOYSA-N samarium atom Chemical compound [Sm] KZUNJOHGWZRPMI-UHFFFAOYSA-N 0.000 description 6
- 230000015572 biosynthetic process Effects 0.000 description 4
- 238000005229 chemical vapour deposition Methods 0.000 description 4
- 239000000470 constituent Substances 0.000 description 4
- 229910052771 Terbium Inorganic materials 0.000 description 3
- 229910052782 aluminium Inorganic materials 0.000 description 3
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 3
- ZPDRQAVGXHVGTB-UHFFFAOYSA-N gallium;gadolinium(3+);oxygen(2-) Chemical compound [O-2].[O-2].[O-2].[Ga+3].[Gd+3] ZPDRQAVGXHVGTB-UHFFFAOYSA-N 0.000 description 3
- JSUSQWYDLONJAX-UHFFFAOYSA-N iron terbium Chemical compound [Fe].[Tb] JSUSQWYDLONJAX-UHFFFAOYSA-N 0.000 description 3
- GZCRRIHWUXGPOV-UHFFFAOYSA-N terbium atom Chemical compound [Tb] GZCRRIHWUXGPOV-UHFFFAOYSA-N 0.000 description 3
- 229910052684 Cerium Inorganic materials 0.000 description 2
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 2
- 229910052691 Erbium Inorganic materials 0.000 description 2
- 229910052693 Europium Inorganic materials 0.000 description 2
- 229910052688 Gadolinium Inorganic materials 0.000 description 2
- 229910052779 Neodymium Inorganic materials 0.000 description 2
- 229910052777 Praseodymium Inorganic materials 0.000 description 2
- 229910052773 Promethium Inorganic materials 0.000 description 2
- 229910052775 Thulium Inorganic materials 0.000 description 2
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 2
- 229910052769 Ytterbium Inorganic materials 0.000 description 2
- GWXLDORMOJMVQZ-UHFFFAOYSA-N cerium Chemical compound [Ce] GWXLDORMOJMVQZ-UHFFFAOYSA-N 0.000 description 2
- 229910052804 chromium Inorganic materials 0.000 description 2
- 239000011651 chromium Substances 0.000 description 2
- 239000002131 composite material Substances 0.000 description 2
- UYAHIZSMUZPPFV-UHFFFAOYSA-N erbium Chemical compound [Er] UYAHIZSMUZPPFV-UHFFFAOYSA-N 0.000 description 2
- OGPBJKLSAFTDLK-UHFFFAOYSA-N europium atom Chemical compound [Eu] OGPBJKLSAFTDLK-UHFFFAOYSA-N 0.000 description 2
- UIWYJDYFSGRHKR-UHFFFAOYSA-N gadolinium atom Chemical compound [Gd] UIWYJDYFSGRHKR-UHFFFAOYSA-N 0.000 description 2
- 229910052738 indium Inorganic materials 0.000 description 2
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 2
- 229910052746 lanthanum Inorganic materials 0.000 description 2
- FZLIPJUXYLNCLC-UHFFFAOYSA-N lanthanum atom Chemical compound [La] FZLIPJUXYLNCLC-UHFFFAOYSA-N 0.000 description 2
- QEFYFXOXNSNQGX-UHFFFAOYSA-N neodymium atom Chemical compound [Nd] QEFYFXOXNSNQGX-UHFFFAOYSA-N 0.000 description 2
- PUDIUYLPXJFUGB-UHFFFAOYSA-N praseodymium atom Chemical compound [Pr] PUDIUYLPXJFUGB-UHFFFAOYSA-N 0.000 description 2
- VQMWBBYLQSCNPO-UHFFFAOYSA-N promethium atom Chemical compound [Pm] VQMWBBYLQSCNPO-UHFFFAOYSA-N 0.000 description 2
- 229910052706 scandium Inorganic materials 0.000 description 2
- SIXSYDAISGFNSX-UHFFFAOYSA-N scandium atom Chemical compound [Sc] SIXSYDAISGFNSX-UHFFFAOYSA-N 0.000 description 2
- 239000010409 thin film Substances 0.000 description 2
- 229910052719 titanium Inorganic materials 0.000 description 2
- 239000010936 titanium Substances 0.000 description 2
- 229910052720 vanadium Inorganic materials 0.000 description 2
- LEONUFNNVUYDNQ-UHFFFAOYSA-N vanadium atom Chemical compound [V] LEONUFNNVUYDNQ-UHFFFAOYSA-N 0.000 description 2
- NAWDYIZEMPQZHO-UHFFFAOYSA-N ytterbium Chemical compound [Yb] NAWDYIZEMPQZHO-UHFFFAOYSA-N 0.000 description 2
- 229910052727 yttrium Inorganic materials 0.000 description 2
- VWQVUPCCIRVNHF-UHFFFAOYSA-N yttrium atom Chemical compound [Y] VWQVUPCCIRVNHF-UHFFFAOYSA-N 0.000 description 2
- OYPRJOBELJOOCE-UHFFFAOYSA-N Calcium Chemical compound [Ca] OYPRJOBELJOOCE-UHFFFAOYSA-N 0.000 description 1
- 229910052692 Dysprosium Inorganic materials 0.000 description 1
- 229910052689 Holmium Inorganic materials 0.000 description 1
- 229910052765 Lutetium Inorganic materials 0.000 description 1
- PWHULOQIROXLJO-UHFFFAOYSA-N Manganese Chemical compound [Mn] PWHULOQIROXLJO-UHFFFAOYSA-N 0.000 description 1
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 1
- QCWXUUIWCKQGHC-UHFFFAOYSA-N Zirconium Chemical compound [Zr] QCWXUUIWCKQGHC-UHFFFAOYSA-N 0.000 description 1
- MDPBAVVOGPXYKN-UHFFFAOYSA-N [Y].[Gd] Chemical compound [Y].[Gd] MDPBAVVOGPXYKN-UHFFFAOYSA-N 0.000 description 1
- 229910052787 antimony Inorganic materials 0.000 description 1
- WATWJIUSRGPENY-UHFFFAOYSA-N antimony atom Chemical compound [Sb] WATWJIUSRGPENY-UHFFFAOYSA-N 0.000 description 1
- 229910052785 arsenic Inorganic materials 0.000 description 1
- RQNWIZPPADIBDY-UHFFFAOYSA-N arsenic atom Chemical compound [As] RQNWIZPPADIBDY-UHFFFAOYSA-N 0.000 description 1
- 229910052797 bismuth Inorganic materials 0.000 description 1
- JCXGWMGPZLAOME-UHFFFAOYSA-N bismuth atom Chemical compound [Bi] JCXGWMGPZLAOME-UHFFFAOYSA-N 0.000 description 1
- 244000309464 bull Species 0.000 description 1
- 229910052791 calcium Inorganic materials 0.000 description 1
- 239000011575 calcium Substances 0.000 description 1
- 150000001768 cations Chemical class 0.000 description 1
- 238000005336 cracking Methods 0.000 description 1
- KBQHZAAAGSGFKK-UHFFFAOYSA-N dysprosium atom Chemical compound [Dy] KBQHZAAAGSGFKK-UHFFFAOYSA-N 0.000 description 1
- YPQJNRBYXDIMRN-UHFFFAOYSA-N dysprosium gallium Chemical compound [Ga].[Dy] YPQJNRBYXDIMRN-UHFFFAOYSA-N 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 229910052735 hafnium Inorganic materials 0.000 description 1
- VBJZVLUMGGDVMO-UHFFFAOYSA-N hafnium atom Chemical compound [Hf] VBJZVLUMGGDVMO-UHFFFAOYSA-N 0.000 description 1
- KJZYNXUDTRRSPN-UHFFFAOYSA-N holmium atom Chemical compound [Ho] KJZYNXUDTRRSPN-UHFFFAOYSA-N 0.000 description 1
- UCNNJGDEJXIUCC-UHFFFAOYSA-L hydroxy(oxo)iron;iron Chemical compound [Fe].O[Fe]=O.O[Fe]=O UCNNJGDEJXIUCC-UHFFFAOYSA-L 0.000 description 1
- -1 iron ions Chemical class 0.000 description 1
- 239000007791 liquid phase Substances 0.000 description 1
- OHSVLFRHMCKCQY-UHFFFAOYSA-N lutetium atom Chemical compound [Lu] OHSVLFRHMCKCQY-UHFFFAOYSA-N 0.000 description 1
- 239000000696 magnetic material Substances 0.000 description 1
- 229910052748 manganese Inorganic materials 0.000 description 1
- 239000011572 manganese Substances 0.000 description 1
- WPBNNNQJVZRUHP-UHFFFAOYSA-L manganese(2+);methyl n-[[2-(methoxycarbonylcarbamothioylamino)phenyl]carbamothioyl]carbamate;n-[2-(sulfidocarbothioylamino)ethyl]carbamodithioate Chemical compound [Mn+2].[S-]C(=S)NCCNC([S-])=S.COC(=O)NC(=S)NC1=CC=CC=C1NC(=S)NC(=O)OC WPBNNNQJVZRUHP-UHFFFAOYSA-L 0.000 description 1
- 229910052758 niobium Inorganic materials 0.000 description 1
- 239000010955 niobium Substances 0.000 description 1
- GUCVJGMIXFAOAE-UHFFFAOYSA-N niobium atom Chemical compound [Nb] GUCVJGMIXFAOAE-UHFFFAOYSA-N 0.000 description 1
- 238000009304 pastoral farming Methods 0.000 description 1
- 229910052698 phosphorus Inorganic materials 0.000 description 1
- 239000011574 phosphorus Substances 0.000 description 1
- 229910052703 rhodium Inorganic materials 0.000 description 1
- 239000010948 rhodium Substances 0.000 description 1
- MHOVAHRLVXNVSD-UHFFFAOYSA-N rhodium atom Chemical compound [Rh] MHOVAHRLVXNVSD-UHFFFAOYSA-N 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 229910052715 tantalum Inorganic materials 0.000 description 1
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 1
- 229910052726 zirconium Inorganic materials 0.000 description 1
Images
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F10/00—Thin magnetic films, e.g. of one-domain structure
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F10/00—Thin magnetic films, e.g. of one-domain structure
- H01F10/08—Thin magnetic films, e.g. of one-domain structure characterised by magnetic layers
- H01F10/10—Thin magnetic films, e.g. of one-domain structure characterised by magnetic layers characterised by the composition
- H01F10/18—Thin magnetic films, e.g. of one-domain structure characterised by magnetic layers characterised by the composition being compounds
- H01F10/20—Ferrites
- H01F10/24—Garnets
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F41/00—Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties
- H01F41/14—Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties for applying magnetic films to substrates
- H01F41/20—Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties for applying magnetic films to substrates by evaporation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F41/00—Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties
- H01F41/14—Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties for applying magnetic films to substrates
- H01F41/24—Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties for applying magnetic films to substrates from liquids
- H01F41/28—Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties for applying magnetic films to substrates from liquids by liquid phase epitaxy
Definitions
- a method for producing a bubble domain in a magnetic single crystal garnet film-substrate structure involves the epitaxial deposition of an iron garnet film of the proper crystallographic orientation and having a positive magnetostriction constant on a garnet substrate in which the room temperature lattice constant of the film is larger than the room temperature lattice constant of the substrate, preferably by an amount less than 0.035 angstrom.
- This invention relates to bubble domains and more particularly to a method of forming a craze-free film having bubble domains therein.
- bubble domain composite single crystal film-substrate structures reported in the prior art have had crazing, that is cracking, of the film, making them unsuitable for certain types of bubble domain device applications.
- Other iron garnet film-substrate structures were observed to have domains whose magnetization directions are in the plane of the film in contrast to the desired bubble domains whose magnetization directions are perpendicular to the plane of the film.
- a specific step in the method involves depositing a single crystal iron garnet film of the proper crystallo graphic orientation and having a positive magnetostriction constant on a substrate in which the room temperature lattice constant of the film is larger than the room temperature lattice constant of the substrate preferably by an amount less than 0.035 angstrom.
- This invention involves a process in which a single crystal iron garnet material is chemically vapor deposited to form a film on a substrate. It is necessary that the single crystal material have the proper crystallographic orientation to take advantage of the positive magnetostriction. In addition the room lattice constant of the deposited film is larger than the room lattice constant of the substrate by an amount less than 0.035 angstrom. The resultant film-substrate structure has a craze-free film with bubble domains therein.
- the normal source of uniaxial anisotropy observed in magnetic materials is the crystal structure of the material
- a A 0 positive magnetostriction constants
- the magnetostriction contribution tends to make the normal to the plane of the platelet an easy axis of magnetization if the platelet is in compression (6 O), and a hard axis if the platelet is intension (6 0)
- a and A are the saturation values of the linear magnetostriction constants along the 100 and ll1 directions, respectively, and 0' is the stress in the plane of the material.
- the room temperature magnetostriction constants of selected iron garnets are listed in the following table.
- Magnetostriet-ion constant Iron garnet Amoun M1100 S1113F05012 +21 8 5 EmFeSOm +21 +1. 8 GdaFeson. O 3. 1 Tb3Fe50r2 -3. 3 +12 Dy3Fe O z -12. 5 -5. 9 HOJF85012. -3. 4 -4. U El3Fe50lZ- +2. 0 4. 9 TrnaFesoiz +1. 4 5. 2 Yb3F650i2- +1. 4 4 5 YaFesOm -1. 4 -2 4 Y3Gao.a4Fei.3uO z- 1. 4 -1 7 LugFesom 1. 4 -2 4 Some of these iron garnet materials, for example,
- Tb F65O12 and Yb Fe O have both a negative and a positive magnetostriction constant.
- the crystallographic orientation of the garnet film must be chosen to take advantage of the positive magnetostriction constant. In the case with Tb -R 0 material, the orientation would be ⁇ 111 ⁇ . With the Yb Fe O material, the orientation would be ⁇ 100 ⁇ .
- the values of the magnetostriction constants of the iron garnet material, as well as its magnetization, can be varied by depositing a film containing a mixture of two or more pure iron garnets and/or by substituting other cations for iron ions.
- the dominant source of uniaxial anisotropy is the magnetostrictive effect resulting from the stress existing in the film. This stress is due to the difference between the lattice constants and the thermal expansion coefficients of the film and substrate and may be in the form of tension or compression.
- This invention specifically covers a method of forming a bubble domain structure by depositing a magnetic single crystal garnet film of the proper orientation and having a positive magnetostriction constant on a substrate in which the film is in compression.
- a co-pending application to Mee et al., Ser. No. 101,- 786, filed Dec. 28, 1970 covers a method of forming a bubble domain structure by depositing a magnetic single crystal garnet film of the proper orientation and having a negative magnetostriction constant on a substrate in which the film is in tension.
- a co-pending application to Mee et al., Ser. No. 101,- 787, filing date Dec. 28, 1970 covers a second method of forming a bubble domain structure "by depositing a magnetic single crystal garnet film of the proper orientation and having a negative magnetostriction constant on a substrate in which the film is in tension.
- an oxide substrate' 10 is preferably subjected to a chemical vapor deposition step to provide a thin film of magnetic bubble domain material, film 12.
- the deposition step is carried out in accordance with the co-pending application, Ser. No. 833,- 268 filed June 16, 1969 and now abandoned, and assigned to the assignee of the present invention.
- This pending patent application is incorporated herewith by reference hereto.
- the film 12 may be deposited by sputtering techniques or by a liquid phase epitaxial process.
- the substrate 10 is monocrystalline garnet having a J Q O formulation wherein the J constituent of the wafer formulation is at least one element selected from the group consisting of cerium, praseodymium, neodymium, promethium, samarium, europium, gadolinium, terbium, dysprosium, holmium, erbium, thulium, ytterbium, lutetium, lanthanum, yttrium, calcium, and bismuth; and the Q constituent of the wafer formulation is at least one element selected from the group consisting of indium, gallium, scandium, titanium, vanadium, chromium, manganese, rhodium, zirconium, hafnium, niobium, tantalum, aluminum, phosphorus, arsenic and antimony.
- the J constituent of the wafer formulation is at least one element selected from the group consisting of cerium, praseodymium, neodymium, prom
- substrate materials are mixed yttrium gadolinium gallium garnet, gadolinium gallium garnet, aluminum substituted gadolinium gallium garnet, terbium gallium garnet, samarium gallium garnet, and dysprosium gallium garnet.
- the film of the bubble domain material is a single crystal garnet film having a J Q O formulation wherein the I constituent of the film formulation has at least one element selected from the group of cerium, praseodymium, neodymium, promethium, samarium, europium, gadolinium, terbium, erbium, thulium, ytterbium, and lanthanum; the Q constituent of the film formulation is taken iron and gallium, iron and indium, iron and scandium, iron and titanium, iron and vanadium, iron and chromium, and iron and manganese.
- a preferred substrate material is samarium gallium garnet when the film material is terbium iron garnet.
- an iron garnet film of the proper orientation and having a positive magnetostriction constant is deposited on a garnet substrate in which the room temperature lattice constant of the film is larger than the room temperature lattice constant of the substrate, preferably by an amount less than 0.035 angstrom.
- the preferred difference between the lattice constants is of the order of 0.010 to 0.025 angstrom.
- the lattice constant difference is about 0.035 angstrom or more, the compressive stress is so great that the compression relieves itself and the film is in tension due to the thermal expansion mismatch.
- the film lattice constant is smaller than the substrate lattice constant, the film is in tension and there are no bubble domains since the normal to plane of the film is the hard magnetization axis and the domain magnetizations lie in the plane.
- the difference in the coefiicients of thermal expansion between the film and the substrate contributes to the total stress present in the film.
- the thermal expansion stress contribution is within acceptable limits as long as the coeflicient of thermal expansion of the substrate does not differ from that of the film by more than 1X10 C. between 25 C. and 1200 C.
- a certain amount of mismatch between film-substrate room temperature lattice constants and/or thermal ex pansion characteristics is required in order to provide the stress which produces the uniaxial anisotropy necessary for bubble domain formation. If film and substrate are too closely matched in both lattice constant and thermal expansion, the proper stress necessary for bubble domain formation will not be achieved.
- Example I A [111] film of terbium iron garnet, T-b Fe O having a lattice constant of 12.441 angstroms was deposited on a samarium gallium garnet, Sm Ga O by chemical vapor deposition techniques.
- the lattice constant of the samarium gallium garnet was 12.436, which was smaller than that of the film by 0.005 angstrom.
- the resultant structure had a craze-free film which had bubble domains therein.
- Example II a [111] terbium iron garnet film was deposited in accordance with this invention on a gadolinium gallium garnet in which the film lattice constant exceeded the substrate lattice constant at room temperature by 0.065 A. The compressive stress due to the large lattice mismatch was relieved at the deposition temperature and the film is in tension due to the thermal expansion mismatch between film and substrate. This structure had no bubble domains in the film and also Had crazing on the film surface. In Example III, the film is again in tension leading to domains whose magnetization lies in the film plane.
- Example IV shows a film in compression but having negative magnetostriction and again there were no bubble domains, only domains whose magnetization lies from the group consisting of iron, iron and aluminum, in the plane.
- a method of producing a bubble domain containing film-substrate structure comprising the step of depositing a magnetic film of a single crystal material of the proper crystallographic orientation and having a positive magnetostriction constant on a substrate in which the magnetic film has a room temperature lattice constant which exceeds the room temperature lattice constant of the substrate at room temperature by an amount less than about 0.035 angstrom.
- a method of producing a bubble domain containing single crystal iron garnet film-substrate structure comprising the step of depositing an iron garnet film of the proper orientation and having a positive magnetostriction constant on a substrate in which the iron garnet film has a room temperature lattice constant which exceeds the room :temperature lattice constant of the substrate by an amount less than about 0.035 angstrom.
- a method of producing a bubble domain containing film-substrate structure comprising the step of depositing References Cited UNITED STATES PATENTS 3,617,381 11/1971 Hanak 117-235 3,525,638 8/1970 Archey 117-107.1 X 3,486,937 12/1969 Linares 117-235 X 3,429,740 2/1969 Mee 117-235 X 3,131,082 4/1964 Gambino 117-235 3,573,099 3/1971 Moore et a1 117-235 X 3,645,787 2/1972 Mee et a1.
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- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Chemical & Material Sciences (AREA)
- Materials Engineering (AREA)
- Thin Magnetic Films (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10178570A | 1970-12-28 | 1970-12-28 |
Publications (1)
Publication Number | Publication Date |
---|---|
US3745046A true US3745046A (en) | 1973-07-10 |
Family
ID=22286400
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US00101785A Expired - Lifetime US3745046A (en) | 1970-12-28 | 1970-12-28 | Method for producing bubble domains in magnetic film-substrate structures |
Country Status (7)
Country | Link |
---|---|
US (1) | US3745046A (enrdf_load_stackoverflow) |
JP (1) | JPS5115594B1 (enrdf_load_stackoverflow) |
CA (1) | CA953619A (enrdf_load_stackoverflow) |
DE (2) | DE2165298C3 (enrdf_load_stackoverflow) |
FR (1) | FR2121044A5 (enrdf_load_stackoverflow) |
GB (1) | GB1367122A (enrdf_load_stackoverflow) |
NL (1) | NL7115118A (enrdf_load_stackoverflow) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3946372A (en) * | 1974-04-15 | 1976-03-23 | Rockwell International Corporation | Characteristic temperature-derived hard bubble suppression |
US4435484A (en) | 1980-07-22 | 1984-03-06 | U.S. Philips Corporation | Device for propagating magnetic domains |
US4657782A (en) * | 1985-03-27 | 1987-04-14 | Nippon Sheet Glass Co., Ltd. | Method of forming a rare earth-iron-garnet vertically magnetized film |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57922U (enrdf_load_stackoverflow) * | 1980-05-30 | 1982-01-06 | ||
JPS5932289A (ja) * | 1982-08-17 | 1984-02-21 | Kyowa Seisakusho:Kk | 圧電素子を発信器とした遠隔制御装置 |
-
1970
- 1970-12-28 US US00101785A patent/US3745046A/en not_active Expired - Lifetime
-
1971
- 1971-10-04 CA CA124,646A patent/CA953619A/en not_active Expired
- 1971-11-03 NL NL7115118A patent/NL7115118A/xx active Search and Examination
- 1971-12-04 JP JP46098205A patent/JPS5115594B1/ja active Pending
- 1971-12-21 GB GB5945571A patent/GB1367122A/en not_active Expired
- 1971-12-23 DE DE2165298A patent/DE2165298C3/de not_active Expired
- 1971-12-23 DE DE19712165298 patent/DE2165298A1/de active Granted
- 1971-12-28 FR FR7147178A patent/FR2121044A5/fr not_active Expired
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3946372A (en) * | 1974-04-15 | 1976-03-23 | Rockwell International Corporation | Characteristic temperature-derived hard bubble suppression |
US4435484A (en) | 1980-07-22 | 1984-03-06 | U.S. Philips Corporation | Device for propagating magnetic domains |
US4657782A (en) * | 1985-03-27 | 1987-04-14 | Nippon Sheet Glass Co., Ltd. | Method of forming a rare earth-iron-garnet vertically magnetized film |
Also Published As
Publication number | Publication date |
---|---|
JPS5115594B1 (enrdf_load_stackoverflow) | 1976-05-18 |
DE2165298C3 (de) | 1975-04-17 |
FR2121044A5 (enrdf_load_stackoverflow) | 1972-08-18 |
GB1367122A (en) | 1974-09-18 |
NL7115118A (enrdf_load_stackoverflow) | 1972-06-30 |
DE2165298B2 (de) | 1974-08-15 |
DE2165298A1 (de) | 1972-07-06 |
CA953619A (en) | 1974-08-27 |
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