US20170058398A1 - Film-forming apparatus and film-forming method - Google Patents
Film-forming apparatus and film-forming method Download PDFInfo
- Publication number
- US20170058398A1 US20170058398A1 US15/342,338 US201615342338A US2017058398A1 US 20170058398 A1 US20170058398 A1 US 20170058398A1 US 201615342338 A US201615342338 A US 201615342338A US 2017058398 A1 US2017058398 A1 US 2017058398A1
- Authority
- US
- United States
- Prior art keywords
- film
- roll
- tensile force
- forming target
- forming
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/02—Pretreatment of the material to be coated
- C23C16/0209—Pretreatment of the material to be coated by heating
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/56—Apparatus specially adapted for continuous coating; Arrangements for maintaining the vacuum, e.g. vacuum locks
- C23C14/562—Apparatus specially adapted for continuous coating; Arrangements for maintaining the vacuum, e.g. vacuum locks for coating elongated substrates
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
- B65H20/00—Advancing webs
- B65H20/02—Advancing webs by friction roller
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
- C23C14/0605—Carbon
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/24—Vacuum evaporation
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/54—Controlling or regulating the coating process
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/26—Deposition of carbon only
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/458—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/46—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for heating the substrate
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/52—Controlling or regulating the coating process
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/54—Apparatus specially adapted for continuous coating
- C23C16/545—Apparatus specially adapted for continuous coating for coating elongated substrates
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
- B65H2301/00—Handling processes for sheets or webs
- B65H2301/50—Auxiliary process performed during handling process
- B65H2301/51—Modifying a characteristic of handled material
- B65H2301/511—Processing surface of handled material upon transport or guiding thereof, e.g. cleaning
- B65H2301/5114—Processing surface of handled material upon transport or guiding thereof, e.g. cleaning coating
- B65H2301/51145—Processing surface of handled material upon transport or guiding thereof, e.g. cleaning coating by vapour deposition
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
- B65H2301/00—Handling processes for sheets or webs
- B65H2301/50—Auxiliary process performed during handling process
- B65H2301/51—Modifying a characteristic of handled material
- B65H2301/514—Modifying physical properties
- B65H2301/5143—Warming
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
- B65H2404/00—Parts for transporting or guiding the handled material
- B65H2404/10—Rollers
- B65H2404/14—Roller pairs
- B65H2404/143—Roller pairs driving roller and idler roller arrangement
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
- B65H2511/00—Dimensions; Position; Numbers; Identification; Occurrences
- B65H2511/10—Size; Dimensions
- B65H2511/11—Length
- B65H2511/112—Length of a loop, e.g. a free loop or a loop of dancer rollers
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
- B65H2513/00—Dynamic entities; Timing aspects
- B65H2513/10—Speed
- B65H2513/11—Speed angular
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
- B65H2515/00—Physical entities not provided for in groups B65H2511/00 or B65H2513/00
- B65H2515/30—Forces; Stresses
- B65H2515/31—Tensile forces
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
- B65H2553/00—Sensing or detecting means
- B65H2553/40—Sensing or detecting means using optical, e.g. photographic, elements
- B65H2553/41—Photoelectric detectors
- B65H2553/412—Photoelectric detectors in barrier arrangements, i.e. emitter facing a receptor element
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
- B65H2701/00—Handled material; Storage means
- B65H2701/10—Handled articles or webs
- B65H2701/17—Nature of material
- B65H2701/173—Metal
Definitions
- the present disclosure relates to a film-forming apparatus and a film-forming method that use a roll-to-roll system.
- a film-forming process using a roll-to-roll system is for transporting a film-forming target (metallic foil or the like) by winding the film-forming target from an unwinding roll to a winding roll and for forming a thin film on the film-forming target during the transport.
- the roll-to-roll system allows a large-sized film-forming target to be transported, which is suitable for mass production of thin films.
- Patent Literature 1 discloses “a graphene roll-to-roll coating apparatus” that transports a metallic member by a roll-to-roll system and forms a graphene film on the metallic member.
- a film-forming apparatus including a roll-to-roll mechanism and a heating unit.
- the roll-to-roll mechanism is configured to transport a film-forming target and includes a tensile force relaxation unit configured to relax a tensile force applied to the transported film-forming target.
- the heating unit is configured to heat the film-forming target transported by the roll-to-roll mechanism.
- the tensile force applied to the film-forming target is relaxed by the roll-to-roll mechanism. Therefore, it is possible to prevent a film quality from being deteriorated due to deformation (plastic deformation and twinning deformation) of the film-forming target by the tensile force.
- the tensile force relaxation unit may include a pinch roll configured to sandwich the film-forming target.
- the pinch roll may include a guide roll configured to guide transport of the film-forming target and an elastic roll having a roll surface made of an elastic material, and the elastic roll may be pushed by the guide roll such that the film-forming target is sandwiched between the elastic roll and the guide roll.
- the tensile force relaxation unit may include a multiple-stage roll including a plurality of rolls.
- the film-forming apparatus may further include a slack detection sensor configured to detect an amount of slack of the film-forming target.
- the tensile force relaxation unit may be configured to adjust the tensile force applied to the film-forming target in accordance with an output of the slack detection sensor.
- the slack detection sensor can detect an amount of slack of the film-forming target, the slack being caused by relaxation of the tensile force applied to the film-forming target.
- the tensile force relaxation unit can adjust the tensile force applied to the film-forming target in accordance with the amount of slack of the film-forming target so that the tensile force can fall within an appropriate range.
- the tensile force relaxation unit may be configured to relax the tensile force applied to the film-forming target to be equal to or smaller than a tensile force at which twinning deformation occurs in the film-forming target.
- a specific metal species causes twinning deformation when a tensile force is applied in a state of being heated.
- the orientation of crystal is partially changed in metal crystal.
- the inventors of the present disclosure have found that the twinning deformation also occurs at a tensile force smaller than that of plastic deformation and the twinning deformation also inversely affects a film quality. Therefore, the tensile force relaxation unit relaxes the tensile force applied to the film-forming target to be a tensile force or lower, at which twinning deformation occurs in the film-forming target. Thus, the film quality can be prevented from being deteriorated due to the twinning deformation.
- the film-forming target may include a metallic foil containing copper, and the tensile force relaxation unit may be configured to relax the tensile force applied to the film-forming target to be smaller than 1 MPa.
- Heated copper causes plastic deformation at a tensile force of about 8.3 MPa.
- the twinning deformation also occurs at a further lower tensile force of about 1 MPa. Therefore, in the case where the film-forming target is a metallic foil containing copper (including copper alloy), a tensile force applied to the film-forming target is relaxed to smaller than 1 MPa (more desirably, smaller than 0.1 MPa). Thus, the deterioration of the film quality due to the twinning deformation of copper can be suppressed.
- the film-forming apparatus may further include a film-forming material supply unit configured to supply a carbon source substance containing carbon to the film-forming target heated by the heating unit.
- a film-forming method including: setting a film-forming target in a roll-to-roll mechanism; transporting the film-forming target by the roll-to-roll mechanism; supplying a film-forming material to the film-forming target; and heating the film-forming target in a state in which a tensile force applied to the film-forming target is relaxed by the roll-to-roll mechanism.
- the film-formation is performed in a state where the tensile force applied to the film-forming target is relaxed by the transport of the film-forming target by the roll-to-roll mechanism. Therefore, the deterioration of a film quality due to deformation of the film-forming target can be prevented, and thus a high-quality thin film can be produced.
- the heating the film-forming target may be performed after transport of the film-forming target by the roll-to-roll mechanism is stopped and the tensile force is relaxed.
- FIG. 1 is a schematic diagram showing a configuration of a film-form ing apparatus according to a first embodiment of the present disclosure.
- FIG. 2 is an inverse pole figure showing a crystalline orientation distribution of a copper foil that is heated in a state of being applied with a low tensile force (0.1 MPa).
- FIG. 3 is an inverse pole figure showing a crystalline orientation distribution of a copper foil that is heated in a state of being applied with a high tensile force (1 MPa).
- FIG. 4 is an optical microscope image of a graphene film formed on the copper foil applied with the low tensile force (0.1 MPa).
- FIG. 5 is an optical microscope image of a graphene film formed on the copper foil applied with the high tensile force (1 MPa).
- FIG. 6 is a schematic diagram showing a configuration of a film-form ing apparatus according to a second embodiment of the present disclosure.
- FIG. 7 is a schematic diagram showing a configuration of a film-form ing apparatus according to Modified Example 1 of the present disclosure.
- FIG. 8 is a schematic diagram showing a configuration of a film-form ing apparatus according to Modified Example 2 of the present disclosure.
- FIG. 1 is a schematic diagram showing a film-form ing apparatus 100 according to the first embodiment of the present disclosure. It should be noted that the film-forming apparatus 100 according to this embodiment is assumed to be a film-forming apparatus to form a graphene film on a film-forming target.
- the film-forming apparatus 100 includes a chamber 101 , a unwinding roll 102 , a first guide roll 103 , a second guide roll 104 , an elastic roll 105 , a winding roll 106 , a current source 107 , a gas supply system 108 , and a vacuum evacuation system 109 .
- the unwinding roll 102 , the first guide roll 103 , the second guide roll 104 , the elastic roll 105 , and the winding roll 106 constitute a roll-to-roll mechanism.
- the roll-to-roll mechanism and the current source 107 are housed in the chamber 101 , and the gas supply system 108 and the vacuum evacuation system 109 are connected to the chamber 101 . Further, a film-forming target S is set in the roll-to-roll mechanism.
- the chamber 101 houses the roll-to-roll mechanism and the current source 107 and also provides a film-forming atmosphere.
- the chamber 101 can be a vacuum chamber that can maintain a vacuum state therein, for example. However, any chamber can be selected in accordance with film-forming conditions.
- the unwinding roll 102 is a roll from which the film-forming target S is unwound.
- the unwinding roll 102 adjusts a tensile force of the film-forming target S from a pinch roll 110 (to be described later) to the unwinding roll 102 .
- the unwinding roll 102 can be rotatably driven by a drive source (motor or the like) (not shown).
- the tensile force of the film-forming target S can be adjusted by the unwinding roll 102 through transmission of a drive force from the drive source by clutch control, or the like.
- the first guide roll 103 guides the transport of the film-forming target S and also applies a current supplied from the current source 107 to the film-forming target S.
- the first guide roll 103 can be connected to a drive source (not shown) and rotatably driven.
- the first guide roll 103 can be made of a material having conductivity, such as metal.
- the second guide roll 104 guides the transport of the film-forming target S and also applies a current supplied from the current source 107 to the film-forming target S.
- the second guide roll 104 can be connected to a drive source (not shown) and rotatably driven.
- the second guide roll 104 can be made of a material having conductivity, such as metal.
- the elastic roll 105 is pushed by the second guide roll 104 and sandwiches the film-forming target S together with the second guide roll 104 .
- the elastic roll 105 is made of an elastic material in which at least the surface thereof (roll surface) has elasticity. This elasticity prevents the film-forming target S from sliding with respect to the second guide roll 104 .
- the elastic material can be silicon, for example.
- the second guide roll 104 and the elastic roll 105 constitute the pinch roll 110 , with which the film-forming target S transported by the roll-to-roll mechanism is sandwiched.
- the winding roll 106 is a roll with which the film-forming target S is wound.
- the winding roll 106 adjusts a tensile force of the film-forming target S from the pinch roll 110 to the winding roll 106 .
- the winding roll 106 can be rotatably driven by a drive source (motor or the like) (not shown).
- the tensile force of the film-forming target S can be adjusted by the winding roll 106 through transmission of a drive force from the drive source by clutch control, or the like.
- the current source 107 is connected to the first guide roll 103 and the second guide roll 104 and applies a current between the first guide roll 103 and the second guide roll 104 .
- a current flows in an area of the film-forming target S between the first guide roll 103 and the second guide roll 104 (hereinafter, referred to as film-forming area) so that the film-forming target S is resistance-heated.
- the film-forming target S may be heated by a method different from resistance heating.
- the current source 107 may not be provided.
- Examples of a heating method different from the resistance heating include heating by a ceramic heater, a halogen lamp, and application of a laser or the like, heating by an induced current by application of a magnetic field, and heating by heat conduction.
- the first guide roll 103 and the second guide roll 104 are not necessarily made of a material having conductivity and can be made of plastic, ceramic, or the like.
- the gas supply system 108 supplies a carbon source gas serving as a film-forming material into the chamber 101 .
- the gas supply system 108 includes a gas source (gas cylinder or the like) (not shown) and is configured to supply gas into the chamber 101 .
- the gas supply system 108 can supply methane as the carbon source gas, for example.
- a substance including a carbon source substance may be supplied into the chamber 101 by another method.
- liquid (ethanol or the like) containing a carbon source substance may be housed in the chamber 101 , and vapor of such liquid may be supplied into the chamber 101 .
- a solid (PMMA (Poly(methyl methacrylate) or the like) containing a carbon source substance may be supported on the film-forming target S in advance and then heated together with the film-forming target S.
- a solid may be housed in the chamber 101 and then vaporized.
- the vacuum evacuation system 109 evacuates the chamber 101 .
- the vacuum evacuation system 109 includes a vacuum pump and the like (not shown) and is configured to evacuate the chamber 101 .
- the film-forming apparatus 100 has the configuration as described above.
- the film-forming target S is set in the roll-to-roll mechanism of the film-forming apparatus 100 .
- the film-forming target S can be made of a metallic foil and appropriately selected depending on catalytic activity, film-forming conditions, and the like.
- a material containing copper (including copper alloy) is suitable for the film-forming target S. This is because copper has catalytic activity with respect to the film-formation of graphene and has properties that carbon does not blend thereinto.
- copper can be removed by an etchant (iron chloride or the like) and is suitable when generated graphene is transferred to another substance (copper is eliminated). Additionally, copper is relatively inexpensive.
- the film-forming target S can be a foil made of pure metal such as platinum (Pt), nickel (Ni), and cobalt (Co) or of an alloy such as a copper-nickel alloy.
- platinum platinum
- Ni nickel
- Co cobalt
- an alloy such as a copper-nickel alloy.
- an alloy in which platinum having a high catalytic function is added to copper an alloy in which zirconium (Zr) of 0.02 weight percent is added to copper in order to make it hard to cause plastic deformation, an alloy in which chromium (Cr), tin (Sn), and zinc (Zn) of 0.25 weight percent each are added to copper, and the like can be used for the film-forming target S.
- Cr chromium
- Sn tin
- Zn zinc
- twinning deformation occurs in copper at a temperature at which graphene is produced (for example, 950 degrees) (hereinafter, referred to as graphene production temperature).
- the twinning deformation is deformation that occurs due to a partial change of a crystalline orientation in metallic crystal and that occurs at a tensile force lower than that of plastic deformation.
- the plastic deformation occurs at an applied tensile force of about 8.3 Pa (950 degrees), but the twinning deformation can occur even at an applied tensile force of about 1 MPa.
- the inventors of the present disclosure have found that in the case where a graphene film is formed on the film-forming target S made of a material containing copper, the quality of graphene (electric characteristics or the like) is lowered due to the twinning deformation of copper.
- a tensile force applied to the film-forming target S by the roll-to-roll mechanism is relaxed, and the plastic deformation and twinning deformation of the film-forming target S are prevented from occurring, which can prevent the quality of a thin film from being deteriorated due to the deformation of the film-forming target.
- the thickness of the metallic foil used as the film-forming target S is not particularly limited, and can be desirably set to 1 to 100 um, and more desirably 10 to 50 um.
- the width and the length of the metallic foil are also not particularly limited.
- the width and the length can be set to 10 to 10000 mm. More desirably, the width can be set to 50 to 2000 mm and the length to 100 to 2000 mm.
- a transport direction of the film-forming target S is also not particularly limited and can be set to a vertical direction, a horizontal direction, or an oblique direction.
- film-forming method 1 Description will be given on a film-forming method (film-forming method 1) using the film-forming apparatus 100 .
- the film-forming target S is set in the roll-to-roll mechanism. Specifically, the rolled film-forming target S is attached to the unwinding roll 102 , and an end of the film-forming target S is connected to the winding roll 106 via the first guide roll 103 and the pinch roll 110 (second guide roll 104 and elastic roll 105 ). The film-forming target S is sandwiched by the pinch roll 110 .
- the chamber 101 can be evacuated by the vacuum evacuation system 109 .
- a carbon source gas is introduced into the chamber 101 from the gas supply system 108 .
- the carbon source gas can be methane gas and hydrogen gas, for example.
- a flow rate of the carbon source gas can be 400 sccm of methane gas and 50 sccm of hydrogen gas, for example.
- the carbon source gas can be adjusted such that the pressure in the chamber 101 is set to 0.001 to 120 kPa, for example.
- the current source 107 applies a current to the film-forming target S via the first guide roll 103 and the second guide roll 104 so that the film-forming area of the film-forming target S is resistance-heated.
- the heating temperature is not particularly limited and may be the graphene production temperature or higher (for example, 950 degrees). By the heating, the carbon source gas supplied to the film-form ing target S is discomposed, and a graphene film is formed on the film-forming target S at the same time.
- the film-forming target S is transported by the roll-to-roll mechanism. Specifically, the unwinding roll 102 and the winding roll 106 are rotated, and the film-forming target S is unwound from the unwinding roll 102 and wound by the winding roll 106 . Further, the first guide roll 103 and the pinch roll 110 are rotated, and the film-forming target S is transported from the first guide roll 103 to the pinch roll 110 .
- the film-forming target S is sequentially supplied to the film-forming area so that a thin graphene film is formed.
- a current of 8 kA/cm 2 is applied to the film-forming area of the copper foil by the current source 107 , the copper foil having the width of 230 mm and being transported by the roll-to-roll mechanism at 0.1 m/min, about 200 mm of the film-forming area having the length of 400 mm is heated to 1000 degrees.
- methane gas comes into contact with the copper surface having this temperature, methane is discomposed by a catalytic action of copper, and thus graphene is produced.
- the coverage of the copper foil by graphene is not particularly limited, and grains (crystal fragments) may not be connected to one another.
- the copper foil is held by the pinch roll 110 so that a larger tensile force can be applied to the winding roll 106 side of the film-forming target S than the pinch roll 110 side of the film-forming target S and the film-forming target S can be wound without loose (firmly).
- a tensile force is reduced on the unwinding roll 102 side of the film-forming target S than the pinch roll 110 side of the film-forming target S so that the tensile force in the film-forming area can be reduced.
- the tensile force applied to the film-forming target S is suitably set to be smaller than 1 MPa, and particularly, set to 0.1 MPa or smaller.
- the tensile force in this case is considerably smaller than the tensile force at which the plastic deformation described above occurs (in the case of copper, 8.3 Pa at 950 degrees).
- the relaxation of the tensile force applied to the film-forming target S is allowed when the tensile force for winding by the winding roll 106 and the tensile force in the film-forming area are separated from each other by the pinch roll 110 sandwiching the film-forming target S.
- the tensile force applied to the film-forming target S is relaxed, which makes it possible to prevent deformation (plastic deformation and twinning deformation) of the film-forming target S and provide high-quality graphene to be formed on the film-form ing target S.
- film-forming method 2 using the film-forming apparatus 100 .
- a film-forming target S is set in the roll-to-roll mechanism (see FIG. 1 ). After the film-forming target S is set, an adjustment is made such that the inside of the chamber 101 is suited for a film-formation environment as described above. Then, a carbon source gas is introduced from the gas supply system 108 .
- the roll-to-roll mechanism After the film-forming target S is transported by the roll-to-roll mechanism, the roll-to-roll mechanism is stopped. Thus, a tensile force applied to the film-forming target S is relaxed. Further, after the roll-to-roll mechanism is stopped, it is also possible to slightly rotate the pinch roll 110 (second guide roll 104 and elastic roll 105 ) in the opposite direction to relax the tensile force applied to the film-forming target S.
- the film-forming area of the film-forming target S is heated to a predetermined temperature.
- the carbon source gas is discomposed in the film-forming area by the heat of the film-forming target S, and a graphene film is formed on the film-form ing target S at the same time.
- the heating of the film-forming target S is stopped and the production of graphene is stopped.
- the film-forming target S is transported by the roll-to-roll mechanism such that a new area of the film-forming target S is set as the film-forming area. Then, the tensile force is relaxed as described above. After the new area is heated and graphene is produced, the heating is stopped. After that, the transport of the film-forming target S by the roll-to-roll mechanism, the relaxation of the tensile force, and the production of graphene are repeated in the stated order.
- the tensile force applied to the film-forming target S is relaxed, which makes it possible to prevent the deformation (plastic deformation and twinning deformation) of the film-forming target S and provide high-quality graphene to be formed on the film-forming target S.
- FIG. 2 and FIG. 3 each show measured results of a crystalline orientation distribution of a copper foil by EBSD (electron backscatter diffraction).
- FIG. 2 shows measured results of a copper foil that is heated in a state of being applied with a low tensile force (0.1 MPa).
- FIG. 3 shows measured results of a copper foil that is heated in a state of being applied with a high tensile force (1 MPa).
- the crystal structure of copper has the orientation in the ⁇ 001> direction, which is the same as that before heating, in each of X, Y, and Z directions.
- twin boundaries are found in the crystal structure of the copper, and therefore it is found that twinning deformation occurs. It is found that the orientation in the [101] direction is maintained and the crystal is rotated with the ⁇ 101> direction as a rotation axis. In other words, it is found from FIG. 2 and FIG.
- the relaxation of the tensile force applied to the copper foil leads to prevention of the twinning deformation. It should be noted that the twinning deformation occurs at a tensile force sufficiently lower than that of plastic deformation. Therefore, the plastic deformation is not problematic at a low tensile force at which the twinning deformation does not occur.
- FIG. 4 and FIG. 5 each show an optical microscope image of graphene formed on the copper foil.
- FIG. 4 shows a graphene film formed on the copper foil applied with a low tensile force (0.1 MPa).
- FIG. 5 shows a graphene film formed on the copper foil applied with a high tensile force (1 MPa). It is found that in FIG. 4 , a graphene film is uniformly formed, and in FIG. 5 , however, cracks are generated on the graphene film. In other words, it can be said that the relaxation of the tensile force applied to the film-forming target S makes it possible to produce high-quality graphene.
- FIG. 6 is a schematic diagram showing a film-forming apparatus 200 according to the second embodiment of the present disclosure. It should be noted that the film-forming apparatus 200 according to this embodiment is a film-forming apparatus that forms a graphene film on a film-forming target.
- the film-forming apparatus 200 includes a chamber 201 , an unwinding roll 202 , a first guide roll 203 , a first elastic roll 204 , a second guide roll 205 , a second elastic roll 206 , a third elastic roll 207 , a fourth elastic roll 208 , a winding roll 209 , a current source 210 , a slack detection sensor 211 , a gas supply system 212 , and a vacuum evacuation system 213 .
- the unwinding roll 202 , the first guide roll 203 , the first elastic roll 204 , the second guide roll 205 , the second elastic roll 206 , the third elastic roll 207 , the fourth elastic roll 208 , and the winding roll 209 constitute a roll-to-roll mechanism.
- the roll-to-roll mechanism, the current source 210 , and the slack detection sensor 211 are housed in the chamber 201 , and the gas supply system 212 and the vacuum evacuation system 213 are connected to the chamber 201 . Further, a film-forming target S is set in the roll-to-roll mechanism.
- the chamber 201 houses the roll-to-roll mechanism and the current source 210 and also provides a film-forming atmosphere.
- the chamber 201 can be a vacuum chamber that can maintain a vacuum state therein, for example. However, any chamber can be selected in accordance with film-forming conditions.
- the unwinding roll 202 is a roll from which the film-forming target S is unwound.
- the unwinding roll 102 adjusts a tensile force of the film-forming target S from a first pinch roll 214 (to be described later) to the unwinding roll 202 .
- the unwinding roll 202 can be rotatably driven by a drive source (motor or the like) (not shown).
- the tensile force of the film-forming target S can be adjusted by the unwinding roll 202 through transmission of a drive force from the drive source by clutch control, or the like.
- the first guide roll 203 guides the transport of the film-forming target S and also applies a current supplied from the current source 210 to the film-forming target S.
- the first guide roll 203 can be connected to a drive source (not shown) and rotatably driven.
- the first guide roll 203 can be made of a material having conductivity, such as metal.
- the first elastic roll 204 is pushed by the first guide roll 203 and sandwiches the film-forming target S together with the first guide roll 203 .
- the first elastic roll 204 is made of an elastic material in which at least the surface thereof (roll surface) has elasticity. This elasticity prevents the film-forming target S from sliding with respect to the first guide roll 203 .
- the elastic material can be silicon, for example.
- the first guide roll 203 and the first elastic roll 204 constitute the first pinch roll 214 , with which the film-forming target S transported by the roll-to-roll mechanism is sandwiched.
- the second guide roll 205 guides the transport of the film-forming target S and also applies a current supplied from the current source 210 to the film-forming target S.
- the second guide roll 205 can be connected to a drive source (not shown) and rotatably driven.
- the second guide roll 205 can be made of a material having conductivity, such as metal.
- the second elastic roll 206 is pushed by the second guide roll 205 and sandwiches the film-forming target S together with the second guide roll 205 .
- the second elastic roll 206 is made of an elastic material in which at least the surface thereof (roll surface) has elasticity. This elasticity prevents the film-forming target S from sliding with respect to the second guide roll 205 .
- the elastic material can be silicon, for example.
- the second guide roll 205 and the second elastic roll 206 constitute a second pinch roll 215 , with which the film-forming target S transported by the roll-to-roll mechanism is sandwiched.
- the third elastic roll 207 and the fourth elastic roll 208 are disposed between the second pinch roll 215 and the winding roll 209 to guide the film-forming target S from the second pinch roll 215 to the winding roll 209 .
- the third elastic roll 207 and the fourth elastic roll 208 are each made of an elastic material in which at least the surface thereof (roll surface) has elasticity.
- the elastic material can be silicon, for example.
- Members whose rotational torque is adjustable by a clutch mechanism or the like are suitable for the third elastic roll 207 and the fourth elastic roll 208 .
- the winding roll 209 is a roll with which the film-forming target S is wound.
- the winding roll 209 adjusts a tensile force of the film-forming target S from the second pinch roll 215 to the winding roll 209 .
- the winding roll 209 can be rotatably driven by a drive source (motor or the like) (not shown).
- the tensile force of the film-forming target S can be adjusted by the winding roll 209 through transmission of a drive force from the drive source by clutch control, or the like
- the current source 210 is connected to the first guide roll 203 and the second guide roll 205 and applies a current between the first guide roll 203 and the second guide roll 205 .
- a current flows in an area of the film-forming target S between the first guide roll 203 and the second guide roll 205 so that the film-forming target S is resistance-heated.
- the film-forming target S can be heated by a heating method different from the resistance heating.
- various types of heating sources can be provided instead of the current source 210 .
- the slack detection sensor 211 detects slack of the film-forming target S transported by the roll-to-roll mechanism.
- the slack detection sensor 211 can be provided with a first photosensor 216 and a second photosensor 217 .
- the first photosensor 216 and the second photosensor 217 are each disposed such that emitted light (detected light) thereof is substantially parallel to the film-forming target S.
- the first photosensor 216 can be provided at a position close to the film-forming target S than the second photosensor 217 .
- the first photosensor 216 includes a light-emitting section 216 a and a light-receiving section 216 b .
- Light (laser light or the like) emitted from the light-emitting section 216 a can be received by the light-receiving section 216 b .
- the light emitted from the light-emitting section 216 a is received by the light-receiving section 216 b .
- the light emitted from the light-emitting section 216 a is not received by the light-receiving section 216 b , it can be determined that the emitted light is blocked by the film-forming target S, that is, slack is caused in the film-forming target S.
- the second photosensor 217 includes a light-emitting section 217 a and a light-receiving section 217 b .
- Light (laser light or the like) emitted from the light-emitting section 217 a can be received by the light-receiving section 217 b .
- the light emitted from the light-emitting section 217 a is received by the light-receiving section 217 b , it can be determined that slack is not excessively caused in the film-forming target S.
- the slack detection sensor 211 based on the output of the slack detection sensor 211 (first photosensor 216 and second photosensor 217 ), whether the slack of the film-forming target S falls within an appropriate range (for example, 10 mm or smaller) can be acquired.
- an appropriate range for example, 10 mm or smaller
- the slack detection sensor 211 is not limited to a sensor using a photosensor as described herein, and any sensor may be used as long as it can detect slack of the film-forming target S.
- the slack detection sensor 211 may be a sensor that measures a resistance value of the film-forming area (area of the film-forming target S between the first pinch roll 214 and the second pinch roll 215 ) during the resistance heating. The resistance value depends on the length of the film-forming area.
- the slack detection sensor 211 may be a sensor that includes an electrical contact point disposed at an allowable limit position of the slack of the film-forming target S and detects contact of this contact point with the film-forming target S in the case where slack is excessively caused in the film-forming target S.
- the slack detection sensor 211 may be a sensor that captures an image of the film-forming area with use of an image sensor and detects slack of the film-forming target S by image recognition.
- the gas supply system 212 supplies gas serving as a film-forming material into the chamber 201 .
- the gas supply system 212 includes a gas source (gas cylinder or the like) (not shown) and is configured to supply a carbon source gas into the chamber 201 .
- a gas source gas cylinder or the like
- liquid or a solid containing the film-forming material can be housed in the chamber 201 .
- the vacuum evacuation system 213 evacuates the chamber 201 .
- the vacuum evacuation system 213 includes a vacuum pump and the like (not shown) and is configured to evacuate the chamber 201 .
- the film-forming apparatus 200 has the configuration as described above. It should be noted that the film-forming target S can be a metallic foil made of copper or the like, as in the case of the first embodiment.
- the film-forming target S is set in the roll-to-roll mechanism. Specifically, the rolled film-forming target S is attached to the unwinding roll 202 , and an end of the film-forming target S is connected to the winding roll 209 via the first pinch roll 214 , the second pinch roll 215 , the third elastic roll 207 , and the fourth elastic roll 208 .
- the film-forming target S is sandwiched by the first pinch roll 214 and by the second pinch roll 215 .
- the chamber 201 can be evacuated by the vacuum evacuation system 213 .
- a carbon source gas is introduced into the chamber 201 from the gas supply system 212 .
- the carbon source gas can be methane gas and hydrogen gas, for example.
- a flow rate of the carbon source gas can be 400 sccm of methane gas and 50 sccm of hydrogen gas, for example.
- the carbon source gas can be adjusted such that the pressure in the chamber 201 is set to 0.001 to 120 kPa, for example.
- the current source 210 applies a current to the film-forming target S via the first guide roll 203 and the second guide roll 205 so that the film-forming target S is resistance-heated.
- the heated area of the film-forming target S is located between the first guide roll 203 and the second guide roll 205 (film-forming area).
- the heating temperature is not particularly limited and may be a graphene production temperature or higher (for example, 950 degrees).
- the carbon source gas is discomposed by the heat of the film-form ing target S in the film-forming area, and a graphene film is formed on the film-form ing target S at the same time.
- the film-forming target S is transported by the roll-to-roll mechanism. Specifically, the unwinding roll 202 and the winding roll 209 are rotated, and the film-forming target S is unwound from the unwinding roll 202 and wound by the winding roll 209 . Further, the first pinch roll 214 and the second pinch roll 215 are rotated, and the film-forming target S is transported from the first pinch roll 214 to the second pinch roll 215 . In addition, the third elastic roll 207 and the fourth elastic roll 208 are also rotated, and the film-forming target S is guided to the winding roll 209 .
- the rotational speed of the first pinch roll 214 or the second pinch roll 215 is adjusted, and thus a tensile force applied to the film-forming target S in the film-forming area can be relaxed. Specifically, based on the output from the slack detection sensor 211 , the rotational speed of the first pinch roll 214 or the second pinch roll 215 can be adjusted such that slack of the film-forming target S falls within an appropriate rage.
- the third elastic roll 207 and the fourth elastic roll 208 can relax a high tensile force applied to firmly wind the film-forming target S by the winding roll 209 .
- a large gradient of the tensile force is generated at one spot of the second pinch roll 215 , there arises a problem that sliding is caused between the film-forming target S and the second pinch roll 215 , and the like.
- the tensile force is gradually relaxed between the winding roll 209 and the film-forming area by the third elastic roll 207 and the fourth elastic roll 208 , and accordingly such a problem can be eliminated.
- the tensile force applied to the film-forming target S is suitably set to be smaller than 1 MPa, and particularly, set to 0.1 MPa or smaller.
- the tensile force in this case is considerably smaller than the tensile force at which the plastic deformation described above occurs (in the case of copper, 8.3 Pa at 950 degrees).
- the tensile force applied to the film-forming target S is relaxed, which makes it possible to prevent deformation (plastic deformation and twinning deformation) of the film-forming target S and provide high-quality graphene to be formed on the film-forming target S.
- FIG. 7 is a schematic diagram showing a film-forming apparatus 300 according to Modified Example 1.
- the film-forming apparatus 300 includes a chamber 301 , an unwinding roll 302 , a first guide roll 303 , a first elastic roll 304 , a second guide roll 305 , a third guide roll 306 , a fourth guide roll 307 , a second elastic roll 308 , a winding roll 309 , and a transport belt 310 .
- a gas supply system, a vacuum evacuation system, and a heating source for a film-form ing target are the same as those in the first and second embodiments, and description thereof will be omitted.
- the unwinding roll 302 , the first guide roll 303 , the first elastic roll 304 , the second guide roll 305 , the third guide roll 306 , the fourth guide roll 307 , the second elastic roll 308 , and the winding roll 309 constitute a roll-to-roll mechanism.
- a film-forming target S is set in the roll-to-roll mechanism.
- the first guide roll 303 and the first elastic roll 304 constitute a first pinch roll 311
- the fourth guide roll 307 and the second elastic roll 308 constitute a second pinch roll 312 .
- the film-forming target S unwound from the unwinding roll 302 is wound by the winding roll 309 via the first pinch roll 311 , the second guide roll 305 , the third guide roll 306 , and the second pinch roll 312 .
- the film-forming target S is sandwiched by the first pinch roll 311 and by the second pinch roll 312 .
- the transport belt 310 is disposed downward, in the vertical direction, of the film-forming target S between the first pinch roll 311 and the second pinch roll 312 , and the film-forming target S comes into contact with the transport belt 310 by gravity.
- the transport belt 310 transports the film-forming target S by the rotation of the belt.
- Film-formation onto the film-forming target S is performed in the film-form ing area between the first pinch roll 311 and the second pinch roll 312 . Since the film-forming target S is transported by the transport belt 310 , a tensile force by the roll-to-roll mechanism is not applied. Therefore, deformation (plastic deformation and twinning deformation) of the film-forming target S due to a tensile force does not occur, and the film quality can be prevented from being deteriorated due to the deformation of the film-forming target S.
- FIG. 8 is a schematic diagram showing a film-forming apparatus 400 according to Modified Example 2.
- the film-forming apparatus 400 includes a chamber 401 , an unwinding roll 402 , a first guide roll 403 , a first elastic roll 404 , a second guide roll 405 , a third guide roll 406 , a fourth guide roll 407 , a second elastic roll 408 , a winding roll 409 , and a transfer roll 410 .
- a gas supply system, a vacuum evacuation system, and a heating source for a film-forming target are the same as those in the first and second embodiments, and description thereof will be omitted.
- the unwinding roll 402 , the first guide roll 403 , the first elastic roll 404 , the second guide roll 405 , the third guide roll 406 , the fourth guide roll 407 , the second elastic roll 408 , and the winding roll 409 constitute a roll-to-roll mechanism.
- a film-form ing target S is set in the roll-to-roll mechanism.
- the first guide roll 403 and the first elastic roll 404 constitute a first pinch roll 411
- the fourth guide roll 407 and the second elastic roll 408 constitute a second pinch roll 412 .
- the film-forming target S unwound from the unwinding roll 402 is wound by the winding roll 409 via the first pinch roll 411 , the second guide roll 405 , the third guide roll 406 , and the second pinch roll 412 .
- the film-forming target S is sandwiched by the first pinch roll 411 and by the second pinch roll 412 .
- One or a plurality of transfer rolls 410 are disposed downward, in the vertical direction, of the film-forming target S between the first pinch roll 411 and the second pinch roll 412 , and the film-forming target S comes into contact with the transfer roll 410 by gravity.
- the transfer roll 410 transports the film-forming target S by the rotation of the belt.
- Film-formation onto the film-forming target S is performed in the film-form ing area between the first pinch roll 411 and the second pinch roll 412 . Since the film-forming target S is transported by the transfer roll 410 , a tensile force by the roll-to-roll mechanism is not applied. Therefore, deformation (plastic deformation and twinning deformation) of the film-forming target S due to a tensile force does not occur, and the film quality can be prevented from being deteriorated due to the deformation of the film-form ing target S.
- the film-forming apparatus is not limited to a film-forming apparatus used for forming a graphene film and can be a film-forming apparatus used for forming various thin films.
- the film-form ing method therefor is also not limited to CVD (Chemical Vapor Deposition) and can be PVD (Physical Vapor Deposition) or other film-forming methods in which a film formation can be performed using the roll-to-roll mechanism.
- a film-forming apparatus including:
- a roll-to-roll mechanism configured to transport a film-forming target and including a tensile force relaxation unit configured to relax a tensile force applied to the transported film-forming target;
- a heating unit configured to heat the film-forming target transported by the roll-to-roll mechanism.
- the tensile force relaxation unit includes a pinch roll configured to sandwich the film-forming target.
- the pinch roll includes
- a guide roll configured to guide transport of the film-forming target, and an elastic roll having a roll surface made of an elastic material
- the elastic roll is pushed by the guide roll such that the film-forming target is sandwiched between the elastic roll and the guide roll.
- the tensile force relaxation unit includes a multiple-stage roll including a plurality of rolls.
- the tensile force relaxation unit is configured to adjust the tensile force applied to the film-forming target in accordance with an output of the slack detection sensor.
- the tensile force relaxation unit is configured to relax the tensile force applied to the film-forming target to be equal to or smaller than a tensile force at which twinning deformation occurs in the film-forming target.
- the film-forming target includes a metallic foil containing copper
- the tensile force relaxation unit is configured to relax the tensile force applied to the film-forming target to be smaller than 1 MPa.
- the film-forming apparatus according to any one of (1) to (7), further including a film-forming material supply unit configured to supply a carbon source substance containing carbon to the film-forming target heated by the heating unit.
- a film-forming method including:
- the heating the film-forming target is performed after transport of the film-forming target by the roll-to-roll mechanism is stopped and the tensile force is relaxed.
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- General Chemical & Material Sciences (AREA)
- Inorganic Chemistry (AREA)
- Carbon And Carbon Compounds (AREA)
- Physical Vapour Deposition (AREA)
- Chemical Vapour Deposition (AREA)
Abstract
There is provided a film-forming apparatus including a roll-to-roll mechanism and a heating unit. The roll-to-roll mechanism is configured to transport a film-forming target and includes a tensile force relaxation unit configured to relax a tensile force applied to the transported film-forming target. The heating unit is configured to heat the film-forming target transported by the roll-to-roll mechanism.
Description
- The present application is a continuation application of U.S. patent application Ser. No. 14/402,244, filed Nov. 19, 2014, which is a National Stage of PCT/JP2013/002772, filed Apr. 24, 2013, and claims priority to Japanese Patent Application No. 2012-124321 filed on May 31, 2012, the entire content of which is hereby incorporated by reference.
- The present disclosure relates to a film-forming apparatus and a film-forming method that use a roll-to-roll system.
- A film-forming process using a roll-to-roll system is for transporting a film-forming target (metallic foil or the like) by winding the film-forming target from an unwinding roll to a winding roll and for forming a thin film on the film-forming target during the transport. The roll-to-roll system allows a large-sized film-forming target to be transported, which is suitable for mass production of thin films.
- For example, Patent Literature 1 discloses “a graphene roll-to-roll coating apparatus” that transports a metallic member by a roll-to-roll system and forms a graphene film on the metallic member.
- [PTL 1]
- Japanese Patent Application Laid-open No. 2011-162877
- However, in the film-forming process using the roll-to-roll system as described in Patent Literature 1, there may be a case where a film quality is deteriorated due to a tensile force applied to a film-forming target by the roll-to-roll system, as compared to a film-forming process in which the roll-to-roll system is not used.
- In view of the circumstances as described above, it is desirable to provide a film-forming apparatus and a film-forming method that are capable of producing a high-quality thin film by using a roll-to-roll system.
- According to an embodiment of the present disclosure, there is provided a film-forming apparatus including a roll-to-roll mechanism and a heating unit.
- The roll-to-roll mechanism is configured to transport a film-forming target and includes a tensile force relaxation unit configured to relax a tensile force applied to the transported film-forming target.
- The heating unit is configured to heat the film-forming target transported by the roll-to-roll mechanism.
- With this configuration, the tensile force applied to the film-forming target is relaxed by the roll-to-roll mechanism. Therefore, it is possible to prevent a film quality from being deteriorated due to deformation (plastic deformation and twinning deformation) of the film-forming target by the tensile force.
- The tensile force relaxation unit may include a pinch roll configured to sandwich the film-forming target.
- With this configuration, it is possible to prevent the tensile force associated with winding and unwinding of the film-forming target by the roll-to-roll mechanism from being directly applied to the film-forming target by the pinch roll sandwiching the film-forming target, that is, to relax the tensile force applied to the film-forming target.
- The pinch roll may include a guide roll configured to guide transport of the film-forming target and an elastic roll having a roll surface made of an elastic material, and the elastic roll may be pushed by the guide roll such that the film-forming target is sandwiched between the elastic roll and the guide roll.
- With this configuration, by a frictional force of the elastic roll that rotates in conjunction with the guide roll, sliding of the film-forming target with respect to the guide roll is prevented, and the tensile force associated with winding and unwinding of the film-forming target by the roll-to-roll mechanism can be prevented from being directly applied to the film-forming target.
- The tensile force relaxation unit may include a multiple-stage roll including a plurality of rolls.
- With this configuration, it is possible to gradually relax the tensile force applied to the film-forming target by the multiple-stage roll. In the case where the tensile force of the film-forming target is relaxed at one spot, there is a fear that a large gradient of the tensile force is caused at that spot and the film-forming target slides, for example. According to this configuration, such a large gradient of the tensile force can be prevented.
- The film-forming apparatus may further include a slack detection sensor configured to detect an amount of slack of the film-forming target. The tensile force relaxation unit may be configured to adjust the tensile force applied to the film-forming target in accordance with an output of the slack detection sensor.
- With this configuration, the slack detection sensor can detect an amount of slack of the film-forming target, the slack being caused by relaxation of the tensile force applied to the film-forming target. The tensile force relaxation unit can adjust the tensile force applied to the film-forming target in accordance with the amount of slack of the film-forming target so that the tensile force can fall within an appropriate range.
- The tensile force relaxation unit may be configured to relax the tensile force applied to the film-forming target to be equal to or smaller than a tensile force at which twinning deformation occurs in the film-forming target.
- A specific metal species (copper or the like) causes twinning deformation when a tensile force is applied in a state of being heated. In the twinning deformation, the orientation of crystal is partially changed in metal crystal. The inventors of the present disclosure have found that the twinning deformation also occurs at a tensile force smaller than that of plastic deformation and the twinning deformation also inversely affects a film quality. Therefore, the tensile force relaxation unit relaxes the tensile force applied to the film-forming target to be a tensile force or lower, at which twinning deformation occurs in the film-forming target. Thus, the film quality can be prevented from being deteriorated due to the twinning deformation.
- The film-forming target may include a metallic foil containing copper, and the tensile force relaxation unit may be configured to relax the tensile force applied to the film-forming target to be smaller than 1 MPa.
- Heated copper (for example, 950 degrees) causes plastic deformation at a tensile force of about 8.3 MPa. However, the twinning deformation also occurs at a further lower tensile force of about 1 MPa. Therefore, in the case where the film-forming target is a metallic foil containing copper (including copper alloy), a tensile force applied to the film-forming target is relaxed to smaller than 1 MPa (more desirably, smaller than 0.1 MPa). Thus, the deterioration of the film quality due to the twinning deformation of copper can be suppressed.
- The film-forming apparatus may further include a film-forming material supply unit configured to supply a carbon source substance containing carbon to the film-forming target heated by the heating unit.
- When a carbon source substance (methane or the like) is supplied to a heated film-forming target (metallic foil containing copper), the carbon source substance is discomposed and a graphene film is formed on the film-forming target. It has been found that twinning deformation of copper may occur as described above at a graphene production temperature (for example, 950 degrees) and when the twinning deformation occurs, the quality of a graphene film (electric characteristics or the like) is lowered. In the present disclosure, as described above, the tensile force applied to the film-forming target is relaxed so that the twinning deformation of copper is prevented from occurring. Therefore, the deterioration of the quality of a graphene film due to the twinning deformation of copper can be prevented, and thus high-quality graphene can be produced.
- According to another embodiment of the present disclosure, there is provided a film-forming method including: setting a film-forming target in a roll-to-roll mechanism; transporting the film-forming target by the roll-to-roll mechanism; supplying a film-forming material to the film-forming target; and heating the film-forming target in a state in which a tensile force applied to the film-forming target is relaxed by the roll-to-roll mechanism.
- According to the film-forming method, the film-formation is performed in a state where the tensile force applied to the film-forming target is relaxed by the transport of the film-forming target by the roll-to-roll mechanism. Therefore, the deterioration of a film quality due to deformation of the film-forming target can be prevented, and thus a high-quality thin film can be produced.
- The heating the film-forming target may be performed after transport of the film-forming target by the roll-to-roll mechanism is stopped and the tensile force is relaxed.
- With this configuration, the transport of the film-forming target by the roll-to-roll mechanism is stopped, and thus a tensile force applied to the film-forming target by the transport can be relaxed.
- As described above, according to the present disclosure, it is possible to provide a film-forming apparatus and a film-forming method that are capable of producing a high-quality thin film by using a roll-to-roll system.
-
FIG. 1 is a schematic diagram showing a configuration of a film-form ing apparatus according to a first embodiment of the present disclosure. -
FIG. 2 is an inverse pole figure showing a crystalline orientation distribution of a copper foil that is heated in a state of being applied with a low tensile force (0.1 MPa). -
FIG. 3 is an inverse pole figure showing a crystalline orientation distribution of a copper foil that is heated in a state of being applied with a high tensile force (1 MPa). -
FIG. 4 is an optical microscope image of a graphene film formed on the copper foil applied with the low tensile force (0.1 MPa). -
FIG. 5 is an optical microscope image of a graphene film formed on the copper foil applied with the high tensile force (1 MPa). -
FIG. 6 is a schematic diagram showing a configuration of a film-form ing apparatus according to a second embodiment of the present disclosure. -
FIG. 7 is a schematic diagram showing a configuration of a film-form ing apparatus according to Modified Example 1 of the present disclosure. -
FIG. 8 is a schematic diagram showing a configuration of a film-form ing apparatus according to Modified Example 2 of the present disclosure. - Description will be given on a film-forming apparatus according to a first embodiment of the present disclosure.
FIG. 1 is a schematic diagram showing a film-form ing apparatus 100 according to the first embodiment of the present disclosure. It should be noted that the film-formingapparatus 100 according to this embodiment is assumed to be a film-forming apparatus to form a graphene film on a film-forming target. - As shown in
FIG. 1 , the film-formingapparatus 100 includes achamber 101, a unwindingroll 102, afirst guide roll 103, asecond guide roll 104, anelastic roll 105, a windingroll 106, acurrent source 107, agas supply system 108, and avacuum evacuation system 109. The unwindingroll 102, thefirst guide roll 103, thesecond guide roll 104, theelastic roll 105, and the windingroll 106 constitute a roll-to-roll mechanism. The roll-to-roll mechanism and thecurrent source 107 are housed in thechamber 101, and thegas supply system 108 and thevacuum evacuation system 109 are connected to thechamber 101. Further, a film-forming target S is set in the roll-to-roll mechanism. - The
chamber 101 houses the roll-to-roll mechanism and thecurrent source 107 and also provides a film-forming atmosphere. Thechamber 101 can be a vacuum chamber that can maintain a vacuum state therein, for example. However, any chamber can be selected in accordance with film-forming conditions. - The unwinding
roll 102 is a roll from which the film-forming target S is unwound. The unwindingroll 102 adjusts a tensile force of the film-forming target S from a pinch roll 110 (to be described later) to theunwinding roll 102. The unwindingroll 102 can be rotatably driven by a drive source (motor or the like) (not shown). The tensile force of the film-forming target S can be adjusted by the unwindingroll 102 through transmission of a drive force from the drive source by clutch control, or the like. - The
first guide roll 103 guides the transport of the film-forming target S and also applies a current supplied from thecurrent source 107 to the film-forming target S. Thefirst guide roll 103 can be connected to a drive source (not shown) and rotatably driven. Thefirst guide roll 103 can be made of a material having conductivity, such as metal. - The
second guide roll 104 guides the transport of the film-forming target S and also applies a current supplied from thecurrent source 107 to the film-forming target S. Thesecond guide roll 104 can be connected to a drive source (not shown) and rotatably driven. Thesecond guide roll 104 can be made of a material having conductivity, such as metal. - The
elastic roll 105 is pushed by thesecond guide roll 104 and sandwiches the film-forming target S together with thesecond guide roll 104. Theelastic roll 105 is made of an elastic material in which at least the surface thereof (roll surface) has elasticity. This elasticity prevents the film-forming target S from sliding with respect to thesecond guide roll 104. The elastic material can be silicon, for example. - The
second guide roll 104 and theelastic roll 105 constitute thepinch roll 110, with which the film-forming target S transported by the roll-to-roll mechanism is sandwiched. - The winding
roll 106 is a roll with which the film-forming target S is wound. The windingroll 106 adjusts a tensile force of the film-forming target S from thepinch roll 110 to the windingroll 106. The windingroll 106 can be rotatably driven by a drive source (motor or the like) (not shown). The tensile force of the film-forming target S can be adjusted by the windingroll 106 through transmission of a drive force from the drive source by clutch control, or the like. - The
current source 107 is connected to thefirst guide roll 103 and thesecond guide roll 104 and applies a current between thefirst guide roll 103 and thesecond guide roll 104. Thus, a current flows in an area of the film-forming target S between thefirst guide roll 103 and the second guide roll 104 (hereinafter, referred to as film-forming area) so that the film-forming target S is resistance-heated. - It should be noted that the film-forming target S may be heated by a method different from resistance heating. In this case, the
current source 107 may not be provided. Examples of a heating method different from the resistance heating include heating by a ceramic heater, a halogen lamp, and application of a laser or the like, heating by an induced current by application of a magnetic field, and heating by heat conduction. - In the case where the film-forming target S is heated by a heating method different from the resistance heating, the
first guide roll 103 and thesecond guide roll 104 are not necessarily made of a material having conductivity and can be made of plastic, ceramic, or the like. - The
gas supply system 108 supplies a carbon source gas serving as a film-forming material into thechamber 101. Thegas supply system 108 includes a gas source (gas cylinder or the like) (not shown) and is configured to supply gas into thechamber 101. Thegas supply system 108 can supply methane as the carbon source gas, for example. - It should be noted that instead of supplying the carbon source gas from the
gas supply system 108, a substance including a carbon source substance may be supplied into thechamber 101 by another method. For example, liquid (ethanol or the like) containing a carbon source substance may be housed in thechamber 101, and vapor of such liquid may be supplied into thechamber 101. Alternatively, a solid (PMMA (Poly(methyl methacrylate) or the like) containing a carbon source substance may be supported on the film-forming target S in advance and then heated together with the film-forming target S. Alternatively, in the case where thechamber 101 is heated, such a solid may be housed in thechamber 101 and then vaporized. - The
vacuum evacuation system 109 evacuates thechamber 101. Thevacuum evacuation system 109 includes a vacuum pump and the like (not shown) and is configured to evacuate thechamber 101. - The film-forming
apparatus 100 has the configuration as described above. - As described above, the film-forming target S is set in the roll-to-roll mechanism of the film-forming
apparatus 100. The film-forming target S can be made of a metallic foil and appropriately selected depending on catalytic activity, film-forming conditions, and the like. However, a material containing copper (including copper alloy) is suitable for the film-forming target S. This is because copper has catalytic activity with respect to the film-formation of graphene and has properties that carbon does not blend thereinto. Further, copper can be removed by an etchant (iron chloride or the like) and is suitable when generated graphene is transferred to another substance (copper is eliminated). Additionally, copper is relatively inexpensive. - In addition, the film-forming target S can be a foil made of pure metal such as platinum (Pt), nickel (Ni), and cobalt (Co) or of an alloy such as a copper-nickel alloy. For example, an alloy in which platinum having a high catalytic function is added to copper, an alloy in which zirconium (Zr) of 0.02 weight percent is added to copper in order to make it hard to cause plastic deformation, an alloy in which chromium (Cr), tin (Sn), and zinc (Zn) of 0.25 weight percent each are added to copper, and the like can be used for the film-forming target S. Further, as described above, in the case where the film-forming target S is heated by the resistance heating, its electric resistance is also taken into consideration.
- Various types of metal including copper cause plastic deformation when a tensile force is applied thereto in a heated state. When the film-forming target S is deformed, the quality of a thin film to be formed on the film-forming target S may be deteriorated. Therefore, it is necessary to prevent the film-forming target S from being deformed. In particular, in the roll-to-roll mechanism, a tensile force is applied to the film-forming target along with the transport, and therefore it is necessary to relax the tensile force.
- Further, in the case where a material containing copper is used as the film-forming target S, there is a fear that “twinning deformation” occurs in copper at a temperature at which graphene is produced (for example, 950 degrees) (hereinafter, referred to as graphene production temperature). The twinning deformation is deformation that occurs due to a partial change of a crystalline orientation in metallic crystal and that occurs at a tensile force lower than that of plastic deformation. For example, in the case of copper, the plastic deformation occurs at an applied tensile force of about 8.3 Pa (950 degrees), but the twinning deformation can occur even at an applied tensile force of about 1 MPa.
- The inventors of the present disclosure have found that in the case where a graphene film is formed on the film-forming target S made of a material containing copper, the quality of graphene (electric characteristics or the like) is lowered due to the twinning deformation of copper. In this embodiment, a tensile force applied to the film-forming target S by the roll-to-roll mechanism is relaxed, and the plastic deformation and twinning deformation of the film-forming target S are prevented from occurring, which can prevent the quality of a thin film from being deteriorated due to the deformation of the film-forming target.
- The thickness of the metallic foil used as the film-forming target S is not particularly limited, and can be desirably set to 1 to 100 um, and more desirably 10 to 50 um. The width and the length of the metallic foil (length of film-forming area (to be described later)) are also not particularly limited. For example, the width and the length can be set to 10 to 10000 mm. More desirably, the width can be set to 50 to 2000 mm and the length to 100 to 2000 mm. A transport direction of the film-forming target S (extension direction of film-forming area (to be descried later)) is also not particularly limited and can be set to a vertical direction, a horizontal direction, or an oblique direction.
- Description will be given on a film-forming method (film-forming method 1) using the film-forming
apparatus 100. As shown inFIG. 1 , the film-forming target S is set in the roll-to-roll mechanism. Specifically, the rolled film-forming target S is attached to theunwinding roll 102, and an end of the film-forming target S is connected to the windingroll 106 via thefirst guide roll 103 and the pinch roll 110 (second guide roll 104 and elastic roll 105). The film-forming target S is sandwiched by thepinch roll 110. - After the film-forming target S is set, an adjustment is made such that the inside of the
chamber 101 is suited for a film-formation environment. Specifically, thechamber 101 can be evacuated by thevacuum evacuation system 109. - Subsequently, a carbon source gas is introduced into the
chamber 101 from thegas supply system 108. The carbon source gas can be methane gas and hydrogen gas, for example. A flow rate of the carbon source gas can be 400 sccm of methane gas and 50 sccm of hydrogen gas, for example. The carbon source gas can be adjusted such that the pressure in thechamber 101 is set to 0.001 to 120 kPa, for example. - Subsequently, the
current source 107 applies a current to the film-forming target S via thefirst guide roll 103 and thesecond guide roll 104 so that the film-forming area of the film-forming target S is resistance-heated. The heating temperature is not particularly limited and may be the graphene production temperature or higher (for example, 950 degrees). By the heating, the carbon source gas supplied to the film-form ing target S is discomposed, and a graphene film is formed on the film-forming target S at the same time. - Along with the formation of the graphene film, the film-forming target S is transported by the roll-to-roll mechanism. Specifically, the unwinding
roll 102 and the windingroll 106 are rotated, and the film-forming target S is unwound from the unwindingroll 102 and wound by the windingroll 106. Further, thefirst guide roll 103 and thepinch roll 110 are rotated, and the film-forming target S is transported from thefirst guide roll 103 to thepinch roll 110. - Along with the transport of the film-forming target S, the film-forming target S is sequentially supplied to the film-forming area so that a thin graphene film is formed. For example, when a current of 8 kA/cm2 is applied to the film-forming area of the copper foil by the
current source 107, the copper foil having the width of 230 mm and being transported by the roll-to-roll mechanism at 0.1 m/min, about 200 mm of the film-forming area having the length of 400 mm is heated to 1000 degrees. When methane gas comes into contact with the copper surface having this temperature, methane is discomposed by a catalytic action of copper, and thus graphene is produced. It should be noted that the coverage of the copper foil by graphene is not particularly limited, and grains (crystal fragments) may not be connected to one another. - During the film-formation, the copper foil is held by the
pinch roll 110 so that a larger tensile force can be applied to the windingroll 106 side of the film-forming target S than thepinch roll 110 side of the film-forming target S and the film-forming target S can be wound without loose (firmly). On the other hand, a tensile force is reduced on the unwindingroll 102 side of the film-forming target S than thepinch roll 110 side of the film-forming target S so that the tensile force in the film-forming area can be reduced. - In order to prevent the twinning deformation from occurring, the tensile force applied to the film-forming target S is suitably set to be smaller than 1 MPa, and particularly, set to 0.1 MPa or smaller. The tensile force in this case is considerably smaller than the tensile force at which the plastic deformation described above occurs (in the case of copper, 8.3 Pa at 950 degrees).
- The relaxation of the tensile force applied to the film-forming target S is allowed when the tensile force for winding by the winding
roll 106 and the tensile force in the film-forming area are separated from each other by thepinch roll 110 sandwiching the film-forming target S. - The tensile force applied to the film-forming target S is relaxed, which makes it possible to prevent deformation (plastic deformation and twinning deformation) of the film-forming target S and provide high-quality graphene to be formed on the film-form ing target S.
- Description will be given on a film-forming method (film-forming method 2) using the film-forming
apparatus 100. As in the case of the film-forming method 1 described above, a film-forming target S is set in the roll-to-roll mechanism (seeFIG. 1 ). After the film-forming target S is set, an adjustment is made such that the inside of thechamber 101 is suited for a film-formation environment as described above. Then, a carbon source gas is introduced from thegas supply system 108. - After the film-forming target S is transported by the roll-to-roll mechanism, the roll-to-roll mechanism is stopped. Thus, a tensile force applied to the film-forming target S is relaxed. Further, after the roll-to-roll mechanism is stopped, it is also possible to slightly rotate the pinch roll 110 (
second guide roll 104 and elastic roll 105) in the opposite direction to relax the tensile force applied to the film-forming target S. - After that, the film-forming area of the film-forming target S is heated to a predetermined temperature. The carbon source gas is discomposed in the film-forming area by the heat of the film-forming target S, and a graphene film is formed on the film-form ing target S at the same time. After the elapse of a predetermined period of time, the heating of the film-forming target S is stopped and the production of graphene is stopped.
- After the production of graphene is stopped, the film-forming target S is transported by the roll-to-roll mechanism such that a new area of the film-forming target S is set as the film-forming area. Then, the tensile force is relaxed as described above. After the new area is heated and graphene is produced, the heating is stopped. After that, the transport of the film-forming target S by the roll-to-roll mechanism, the relaxation of the tensile force, and the production of graphene are repeated in the stated order.
- By such a film-forming method, the tensile force applied to the film-forming target S is relaxed, which makes it possible to prevent the deformation (plastic deformation and twinning deformation) of the film-forming target S and provide high-quality graphene to be formed on the film-forming target S.
- As described above, since the tensile force applied to the film-forming target S is relaxed in this embodiment, the twinning deformation of the film-forming target S is prevented.
FIG. 2 andFIG. 3 each show measured results of a crystalline orientation distribution of a copper foil by EBSD (electron backscatter diffraction).FIG. 2 shows measured results of a copper foil that is heated in a state of being applied with a low tensile force (0.1 MPa).FIG. 3 shows measured results of a copper foil that is heated in a state of being applied with a high tensile force (1 MPa). - As shown in
FIG. 2 , it is found that in the case where the copper foil is heated in a state of being applied with a low tensile force, the crystal structure of copper has the orientation in the <001> direction, which is the same as that before heating, in each of X, Y, and Z directions. On the other hand, as shown inFIG. 3 , in the case where the copper foil is heated in a state of being applied with a high tensile force, twin boundaries are found in the crystal structure of the copper, and therefore it is found that twinning deformation occurs. It is found that the orientation in the [101] direction is maintained and the crystal is rotated with the <101> direction as a rotation axis. In other words, it is found fromFIG. 2 andFIG. 3 that the relaxation of the tensile force applied to the copper foil leads to prevention of the twinning deformation. It should be noted that the twinning deformation occurs at a tensile force sufficiently lower than that of plastic deformation. Therefore, the plastic deformation is not problematic at a low tensile force at which the twinning deformation does not occur. -
FIG. 4 andFIG. 5 each show an optical microscope image of graphene formed on the copper foil.FIG. 4 shows a graphene film formed on the copper foil applied with a low tensile force (0.1 MPa).FIG. 5 shows a graphene film formed on the copper foil applied with a high tensile force (1 MPa). It is found that inFIG. 4 , a graphene film is uniformly formed, and inFIG. 5 , however, cracks are generated on the graphene film. In other words, it can be said that the relaxation of the tensile force applied to the film-forming target S makes it possible to produce high-quality graphene. - Description will be given on a film-forming apparatus according to a second embodiment of the present disclosure.
FIG. 6 is a schematic diagram showing a film-formingapparatus 200 according to the second embodiment of the present disclosure. It should be noted that the film-formingapparatus 200 according to this embodiment is a film-forming apparatus that forms a graphene film on a film-forming target. - As shown in
FIG. 6 , the film-formingapparatus 200 includes achamber 201, an unwindingroll 202, afirst guide roll 203, a firstelastic roll 204, asecond guide roll 205, a secondelastic roll 206, a thirdelastic roll 207, a fourthelastic roll 208, a windingroll 209, acurrent source 210, aslack detection sensor 211, agas supply system 212, and avacuum evacuation system 213. - The unwinding
roll 202, thefirst guide roll 203, the firstelastic roll 204, thesecond guide roll 205, the secondelastic roll 206, the thirdelastic roll 207, the fourthelastic roll 208, and the windingroll 209 constitute a roll-to-roll mechanism. The roll-to-roll mechanism, thecurrent source 210, and theslack detection sensor 211 are housed in thechamber 201, and thegas supply system 212 and thevacuum evacuation system 213 are connected to thechamber 201. Further, a film-forming target S is set in the roll-to-roll mechanism. - The
chamber 201 houses the roll-to-roll mechanism and thecurrent source 210 and also provides a film-forming atmosphere. Thechamber 201 can be a vacuum chamber that can maintain a vacuum state therein, for example. However, any chamber can be selected in accordance with film-forming conditions. - The unwinding
roll 202 is a roll from which the film-forming target S is unwound. The unwindingroll 102 adjusts a tensile force of the film-forming target S from a first pinch roll 214 (to be described later) to theunwinding roll 202. The unwindingroll 202 can be rotatably driven by a drive source (motor or the like) (not shown). The tensile force of the film-forming target S can be adjusted by the unwindingroll 202 through transmission of a drive force from the drive source by clutch control, or the like. - The
first guide roll 203 guides the transport of the film-forming target S and also applies a current supplied from thecurrent source 210 to the film-forming target S. Thefirst guide roll 203 can be connected to a drive source (not shown) and rotatably driven. Thefirst guide roll 203 can be made of a material having conductivity, such as metal. - The first
elastic roll 204 is pushed by thefirst guide roll 203 and sandwiches the film-forming target S together with thefirst guide roll 203. The firstelastic roll 204 is made of an elastic material in which at least the surface thereof (roll surface) has elasticity. This elasticity prevents the film-forming target S from sliding with respect to thefirst guide roll 203. The elastic material can be silicon, for example. - The
first guide roll 203 and the firstelastic roll 204 constitute thefirst pinch roll 214, with which the film-forming target S transported by the roll-to-roll mechanism is sandwiched. - The
second guide roll 205 guides the transport of the film-forming target S and also applies a current supplied from thecurrent source 210 to the film-forming target S. Thesecond guide roll 205 can be connected to a drive source (not shown) and rotatably driven. Thesecond guide roll 205 can be made of a material having conductivity, such as metal. - The second
elastic roll 206 is pushed by thesecond guide roll 205 and sandwiches the film-forming target S together with thesecond guide roll 205. The secondelastic roll 206 is made of an elastic material in which at least the surface thereof (roll surface) has elasticity. This elasticity prevents the film-forming target S from sliding with respect to thesecond guide roll 205. The elastic material can be silicon, for example. - The
second guide roll 205 and the secondelastic roll 206 constitute asecond pinch roll 215, with which the film-forming target S transported by the roll-to-roll mechanism is sandwiched. - The third
elastic roll 207 and the fourthelastic roll 208 are disposed between thesecond pinch roll 215 and the windingroll 209 to guide the film-forming target S from thesecond pinch roll 215 to the windingroll 209. The thirdelastic roll 207 and the fourthelastic roll 208 are each made of an elastic material in which at least the surface thereof (roll surface) has elasticity. The elastic material can be silicon, for example. Members whose rotational torque is adjustable by a clutch mechanism or the like are suitable for the thirdelastic roll 207 and the fourthelastic roll 208. - The winding
roll 209 is a roll with which the film-forming target S is wound. The windingroll 209 adjusts a tensile force of the film-forming target S from thesecond pinch roll 215 to the windingroll 209. The windingroll 209 can be rotatably driven by a drive source (motor or the like) (not shown). The tensile force of the film-forming target S can be adjusted by the windingroll 209 through transmission of a drive force from the drive source by clutch control, or the like - The
current source 210 is connected to thefirst guide roll 203 and thesecond guide roll 205 and applies a current between thefirst guide roll 203 and thesecond guide roll 205. Thus, a current flows in an area of the film-forming target S between thefirst guide roll 203 and thesecond guide roll 205 so that the film-forming target S is resistance-heated. As in the case of the first embodiment, the film-forming target S can be heated by a heating method different from the resistance heating. In such a case, various types of heating sources can be provided instead of thecurrent source 210. - The
slack detection sensor 211 detects slack of the film-forming target S transported by the roll-to-roll mechanism. Theslack detection sensor 211 can be provided with afirst photosensor 216 and asecond photosensor 217. Thefirst photosensor 216 and thesecond photosensor 217 are each disposed such that emitted light (detected light) thereof is substantially parallel to the film-forming target S. Thefirst photosensor 216 can be provided at a position close to the film-forming target S than thesecond photosensor 217. - The
first photosensor 216 includes a light-emittingsection 216 a and a light-receivingsection 216 b. Light (laser light or the like) emitted from the light-emittingsection 216 a can be received by the light-receivingsection 216 b. In this embodiment, in the case where the light emitted from the light-emittingsection 216 a is received by the light-receivingsection 216 b, it can be determined that slack is not caused in the film-form ing target S, that is, the tensile force of the film-forming target S is not relaxed. Further, in the case where the light emitted from the light-emittingsection 216 a is not received by the light-receivingsection 216 b, it can be determined that the emitted light is blocked by the film-forming target S, that is, slack is caused in the film-forming target S. - The
second photosensor 217 includes a light-emittingsection 217 a and a light-receivingsection 217 b. Light (laser light or the like) emitted from the light-emittingsection 217 a can be received by the light-receivingsection 217 b. In this embodiment, in the case where the light emitted from the light-emittingsection 217 a is not received by the light-receivingsection 217 b, it can be determined that slack is excessively caused in the film-forming target S. Further, in the case where the light emitted from the light-emittingsection 217 a is received by the light-receivingsection 217 b, it can be determined that slack is not excessively caused in the film-forming target S. - In other words, based on the output of the slack detection sensor 211 (
first photosensor 216 and second photosensor 217), whether the slack of the film-forming target S falls within an appropriate range (for example, 10 mm or smaller) can be acquired. It should be noted that theslack detection sensor 211 is not limited to a sensor using a photosensor as described herein, and any sensor may be used as long as it can detect slack of the film-forming target S. - For example, the
slack detection sensor 211 may be a sensor that measures a resistance value of the film-forming area (area of the film-forming target S between thefirst pinch roll 214 and the second pinch roll 215) during the resistance heating. The resistance value depends on the length of the film-forming area. Further, theslack detection sensor 211 may be a sensor that includes an electrical contact point disposed at an allowable limit position of the slack of the film-forming target S and detects contact of this contact point with the film-forming target S in the case where slack is excessively caused in the film-forming target S. Further, theslack detection sensor 211 may be a sensor that captures an image of the film-forming area with use of an image sensor and detects slack of the film-forming target S by image recognition. - The
gas supply system 212 supplies gas serving as a film-forming material into thechamber 201. Thegas supply system 212 includes a gas source (gas cylinder or the like) (not shown) and is configured to supply a carbon source gas into thechamber 201. As in the case of the first embodiment, instead of thegas supply system 212, liquid or a solid containing the film-forming material can be housed in thechamber 201. - The
vacuum evacuation system 213 evacuates thechamber 201. Thevacuum evacuation system 213 includes a vacuum pump and the like (not shown) and is configured to evacuate thechamber 201. - The film-forming
apparatus 200 has the configuration as described above. It should be noted that the film-forming target S can be a metallic foil made of copper or the like, as in the case of the first embodiment. - Description will be given on a film-forming method using the film-forming
apparatus 200. As shown inFIG. 6 , the film-forming target S is set in the roll-to-roll mechanism. Specifically, the rolled film-forming target S is attached to theunwinding roll 202, and an end of the film-forming target S is connected to the windingroll 209 via thefirst pinch roll 214, thesecond pinch roll 215, the thirdelastic roll 207, and the fourthelastic roll 208. The film-forming target S is sandwiched by thefirst pinch roll 214 and by thesecond pinch roll 215. - After the film-forming target S is set, an adjustment is made such that the inside of the
chamber 201 is suited for a film-formation environment. Specifically, thechamber 201 can be evacuated by thevacuum evacuation system 213. - Subsequently, a carbon source gas is introduced into the
chamber 201 from thegas supply system 212. The carbon source gas can be methane gas and hydrogen gas, for example. A flow rate of the carbon source gas can be 400 sccm of methane gas and 50 sccm of hydrogen gas, for example. The carbon source gas can be adjusted such that the pressure in thechamber 201 is set to 0.001 to 120 kPa, for example. - Subsequently, the
current source 210 applies a current to the film-forming target S via thefirst guide roll 203 and thesecond guide roll 205 so that the film-forming target S is resistance-heated. Here, the heated area of the film-forming target S is located between thefirst guide roll 203 and the second guide roll 205 (film-forming area). The heating temperature is not particularly limited and may be a graphene production temperature or higher (for example, 950 degrees). - When the film-forming target S is heated to the graphene production temperature or higher, the carbon source gas is discomposed by the heat of the film-form ing target S in the film-forming area, and a graphene film is formed on the film-form ing target S at the same time.
- Along with the formation of the graphene film, the film-forming target S is transported by the roll-to-roll mechanism. Specifically, the unwinding
roll 202 and the windingroll 209 are rotated, and the film-forming target S is unwound from the unwindingroll 202 and wound by the windingroll 209. Further, thefirst pinch roll 214 and thesecond pinch roll 215 are rotated, and the film-forming target S is transported from thefirst pinch roll 214 to thesecond pinch roll 215. In addition, the thirdelastic roll 207 and the fourthelastic roll 208 are also rotated, and the film-forming target S is guided to the windingroll 209. - Here, the rotational speed of the
first pinch roll 214 or thesecond pinch roll 215 is adjusted, and thus a tensile force applied to the film-forming target S in the film-forming area can be relaxed. Specifically, based on the output from theslack detection sensor 211, the rotational speed of thefirst pinch roll 214 or thesecond pinch roll 215 can be adjusted such that slack of the film-forming target S falls within an appropriate rage. - Further, the third
elastic roll 207 and the fourthelastic roll 208 can relax a high tensile force applied to firmly wind the film-forming target S by the windingroll 209. When a large gradient of the tensile force is generated at one spot of thesecond pinch roll 215, there arises a problem that sliding is caused between the film-forming target S and thesecond pinch roll 215, and the like. However, the tensile force is gradually relaxed between the windingroll 209 and the film-forming area by the thirdelastic roll 207 and the fourthelastic roll 208, and accordingly such a problem can be eliminated. - In order to prevent twinning deformation from occurring, the tensile force applied to the film-forming target S is suitably set to be smaller than 1 MPa, and particularly, set to 0.1 MPa or smaller. The tensile force in this case is considerably smaller than the tensile force at which the plastic deformation described above occurs (in the case of copper, 8.3 Pa at 950 degrees).
- As described above, also in this embodiment, the tensile force applied to the film-forming target S is relaxed, which makes it possible to prevent deformation (plastic deformation and twinning deformation) of the film-forming target S and provide high-quality graphene to be formed on the film-forming target S.
- The present disclosure is not limited to the embodiments described above and can be variously modified without departing from the gist of the present disclosure.
- Description will be given on Modified Examples of the present disclosure.
-
FIG. 7 is a schematic diagram showing a film-formingapparatus 300 according to Modified Example 1. As shown inFIG. 7 , the film-formingapparatus 300 includes achamber 301, an unwindingroll 302, afirst guide roll 303, a firstelastic roll 304, asecond guide roll 305, athird guide roll 306, afourth guide roll 307, a secondelastic roll 308, a windingroll 309, and atransport belt 310. It should be noted that a gas supply system, a vacuum evacuation system, and a heating source for a film-form ing target are the same as those in the first and second embodiments, and description thereof will be omitted. - The unwinding
roll 302, thefirst guide roll 303, the firstelastic roll 304, thesecond guide roll 305, thethird guide roll 306, thefourth guide roll 307, the secondelastic roll 308, and the windingroll 309 constitute a roll-to-roll mechanism. A film-forming target S is set in the roll-to-roll mechanism. Thefirst guide roll 303 and the firstelastic roll 304 constitute afirst pinch roll 311, and thefourth guide roll 307 and the secondelastic roll 308 constitute asecond pinch roll 312. - In the film-forming
apparatus 300, the film-forming target S unwound from the unwindingroll 302 is wound by the windingroll 309 via thefirst pinch roll 311, thesecond guide roll 305, thethird guide roll 306, and thesecond pinch roll 312. The film-forming target S is sandwiched by thefirst pinch roll 311 and by thesecond pinch roll 312. - The
transport belt 310 is disposed downward, in the vertical direction, of the film-forming target S between thefirst pinch roll 311 and thesecond pinch roll 312, and the film-forming target S comes into contact with thetransport belt 310 by gravity. Thetransport belt 310 transports the film-forming target S by the rotation of the belt. - Film-formation onto the film-forming target S is performed in the film-form ing area between the
first pinch roll 311 and thesecond pinch roll 312. Since the film-forming target S is transported by thetransport belt 310, a tensile force by the roll-to-roll mechanism is not applied. Therefore, deformation (plastic deformation and twinning deformation) of the film-forming target S due to a tensile force does not occur, and the film quality can be prevented from being deteriorated due to the deformation of the film-forming target S. -
FIG. 8 is a schematic diagram showing a film-formingapparatus 400 according to Modified Example 2. As shown inFIG. 8 , the film-formingapparatus 400 includes achamber 401, an unwindingroll 402, afirst guide roll 403, a firstelastic roll 404, asecond guide roll 405, athird guide roll 406, afourth guide roll 407, a secondelastic roll 408, a windingroll 409, and atransfer roll 410. It should be noted that a gas supply system, a vacuum evacuation system, and a heating source for a film-forming target are the same as those in the first and second embodiments, and description thereof will be omitted. - The unwinding
roll 402, thefirst guide roll 403, the firstelastic roll 404, thesecond guide roll 405, thethird guide roll 406, thefourth guide roll 407, the secondelastic roll 408, and the windingroll 409 constitute a roll-to-roll mechanism. A film-form ing target S is set in the roll-to-roll mechanism. Thefirst guide roll 403 and the firstelastic roll 404 constitute afirst pinch roll 411, and thefourth guide roll 407 and the secondelastic roll 408 constitute asecond pinch roll 412. - In the film-forming
apparatus 400, the film-forming target S unwound from the unwindingroll 402 is wound by the windingroll 409 via thefirst pinch roll 411, thesecond guide roll 405, thethird guide roll 406, and thesecond pinch roll 412. The film-forming target S is sandwiched by thefirst pinch roll 411 and by thesecond pinch roll 412. - One or a plurality of transfer rolls 410 are disposed downward, in the vertical direction, of the film-forming target S between the
first pinch roll 411 and thesecond pinch roll 412, and the film-forming target S comes into contact with thetransfer roll 410 by gravity. Thetransfer roll 410 transports the film-forming target S by the rotation of the belt. - Film-formation onto the film-forming target S is performed in the film-form ing area between the
first pinch roll 411 and thesecond pinch roll 412. Since the film-forming target S is transported by thetransfer roll 410, a tensile force by the roll-to-roll mechanism is not applied. Therefore, deformation (plastic deformation and twinning deformation) of the film-forming target S due to a tensile force does not occur, and the film quality can be prevented from being deteriorated due to the deformation of the film-form ing target S. - The film-forming apparatus according to each of the embodiments of the present disclosure is not limited to a film-forming apparatus used for forming a graphene film and can be a film-forming apparatus used for forming various thin films. The film-form ing method therefor is also not limited to CVD (Chemical Vapor Deposition) and can be PVD (Physical Vapor Deposition) or other film-forming methods in which a film formation can be performed using the roll-to-roll mechanism.
- It should be noted that the present disclosure can take the following configurations.
- (1) A film-forming apparatus, including:
- a roll-to-roll mechanism configured to transport a film-forming target and including a tensile force relaxation unit configured to relax a tensile force applied to the transported film-forming target; and
- a heating unit configured to heat the film-forming target transported by the roll-to-roll mechanism.
- (2) The film-forming apparatus according to (1), in which
- the tensile force relaxation unit includes a pinch roll configured to sandwich the film-forming target.
- (3) The film-forming apparatus according to (1) or (2), in which
- the pinch roll includes
- a guide roll configured to guide transport of the film-forming target, and
an elastic roll having a roll surface made of an elastic material, and - the elastic roll is pushed by the guide roll such that the film-forming target is sandwiched between the elastic roll and the guide roll.
- (4) The film-forming apparatus according to any one of (1) to (3), in which
- the tensile force relaxation unit includes a multiple-stage roll including a plurality of rolls.
- (5) The film-forming apparatus according to any one of (1) to (4), further including a slack detection sensor configured to detect an amount of slack of the film-form ing target, wherein
- the tensile force relaxation unit is configured to adjust the tensile force applied to the film-forming target in accordance with an output of the slack detection sensor.
- (6) The film-forming apparatus according to any one of (1) to (5), in which
- the tensile force relaxation unit is configured to relax the tensile force applied to the film-forming target to be equal to or smaller than a tensile force at which twinning deformation occurs in the film-forming target.
- (7) The film-forming apparatus according to any one of (1) to (6), in which
- the film-forming target includes a metallic foil containing copper, and
- the tensile force relaxation unit is configured to relax the tensile force applied to the film-forming target to be smaller than 1 MPa.
- (8) The film-forming apparatus according to any one of (1) to (7), further including a film-forming material supply unit configured to supply a carbon source substance containing carbon to the film-forming target heated by the heating unit.
- (9) A film-forming method, including:
- setting a film-forming target in a roll-to-roll mechanism;
- transporting the film-forming target by the roll-to-roll mechanism;
- supplying a film-forming material to the film-forming target; and
- heating the film-forming target in a state in which a tensile force applied to the film-forming target is relaxed by the roll-to-roll mechanism.
- (10) The film-forming method according to (9), in which
- the heating the film-forming target is performed after transport of the film-forming target by the roll-to-roll mechanism is stopped and the tensile force is relaxed.
- The present application contains subject matter related to that disclosed in Japanese Priority Patent Application JP 2012-124321 filed in the Japan Patent Office on May 31, 2012, the entire content of which is hereby incorporated by reference.
It should be understood by those skilled in the art that various modifications, combinations, sub-combinations and alterations may occur depending on design requirements and other factors insofar as they are within the scope of the appended claims or the equivalents thereof. -
-
- 100, 200, 300, 400 Film-forming apparatus
- 102, 202, 302, 402 Unwinding roll
- 103, 104, 203, 205, 303, 307, 403, 407 Guide roll
- 105, 204, 206, 303, 304, 308, 404, 408 Elastic roll
- 110, 214, 215, 311, 312, 411, 412 Pinch roll
- 106, 209, 309, 409 Winding roll
- 107, 210 Current source
- 211 Slack detection sensor
Claims (13)
1. An apparatus, comprising:
a roll-to-roll mechanism configured to transport a film target made of copper, and that includes a tensile force relaxation unit configured to relax a tensile force applied to the transported film target to be equal to or smaller than a tensile force at which twinning deformation occurs in the copper; and
a heating unit configured to heat the film target transported by the roll-to-roll mechanism.
2. The apparatus according to claim 1 , wherein the tensile force relaxation unit includes a pinch roll configured to sandwich the film target.
3. The apparatus according to claim 2 , wherein
the pinch roll includes
a guide roll configured to guide transport of the film target, and
an elastic roll that has a roll surface made of an elastic material, and the elastic roll is pushed by the guide roll such that the film target is sandwiched between the elastic roll and the guide roll.
4. The apparatus according to claim 1 , wherein the tensile force relaxation unit includes a multiple-stage roll that includes a plurality of rolls.
5. The apparatus according to claim 1 , further comprising a slack detection sensor configured to detect an amount of slack of the film target, wherein
the tensile force relaxation unit is further configured to adjust the tensile force applied to the film target in accordance with an output of the slack detection sensor.
6. The apparatus according to claim 1 , wherein the tensile force relaxation unit is further configured to relax the tensile force applied to the film target to be smaller than 1 MPa.
7. The apparatus according to claim 1 , further comprising a film material supply unit configured to supply a carbon source substance that contains carbon to the film target heated by the heating unit.
8. A method, comprising:
setting a film target made of copper in a roll-to-roll mechanism;
transporting the film target by the roll-to-roll mechanism;
supplying a film material to the film target; and
heating the film target in a state in which a tensile force applied to the film target by the roll-to-roll mechanism is relaxed to be equal to or smaller than a tensile force at which twinning deformation occurs in the copper.
9. A method according to claim 8 , wherein the film target is heated after transport of the film target by the roll-to-roll mechanism is stopped and the tensile force is relaxed.
10. The method according to claim 8 , further comprising sandwiching the film target.
11. The method according to claim 8 , further comprising:
detecting an amount of slack of the film target; and
adjusting the tensile force applied to the film target in accordance with the amount of the slack of the film target.
12. The method according to claim 8 , further comprising relaxing the tensile force applied to the film target to be smaller than 1 MPa.
13. The method according to claim 8 , further comprising supplying a carbon source substance that contains carbon to the heated film target.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US15/342,338 US20170058398A1 (en) | 2012-05-31 | 2016-11-03 | Film-forming apparatus and film-forming method |
Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2012124321A JP5958092B2 (en) | 2012-05-31 | 2012-05-31 | Film forming apparatus and film forming method |
JP2012-124321 | 2012-05-31 | ||
PCT/JP2013/002772 WO2013179561A1 (en) | 2012-05-31 | 2013-04-24 | Film-forming apparatus and film-forming method |
US201414402244A | 2014-11-19 | 2014-11-19 | |
US15/342,338 US20170058398A1 (en) | 2012-05-31 | 2016-11-03 | Film-forming apparatus and film-forming method |
Related Parent Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2013/002772 Continuation WO2013179561A1 (en) | 2012-05-31 | 2013-04-24 | Film-forming apparatus and film-forming method |
US14/402,244 Continuation US9738969B2 (en) | 2012-05-31 | 2013-04-24 | Film-forming apparatus and film-forming method |
Publications (1)
Publication Number | Publication Date |
---|---|
US20170058398A1 true US20170058398A1 (en) | 2017-03-02 |
Family
ID=48446570
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US14/402,244 Active US9738969B2 (en) | 2012-05-31 | 2013-04-24 | Film-forming apparatus and film-forming method |
US15/342,338 Abandoned US20170058398A1 (en) | 2012-05-31 | 2016-11-03 | Film-forming apparatus and film-forming method |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US14/402,244 Active US9738969B2 (en) | 2012-05-31 | 2013-04-24 | Film-forming apparatus and film-forming method |
Country Status (5)
Country | Link |
---|---|
US (2) | US9738969B2 (en) |
JP (1) | JP5958092B2 (en) |
KR (1) | KR102204795B1 (en) |
CN (1) | CN104603326B (en) |
WO (1) | WO2013179561A1 (en) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101760653B1 (en) | 2015-05-28 | 2017-07-25 | 세종대학교산학협력단 | Apparatus for manufacturing graphene and method of manufacturing graphene |
WO2017135136A1 (en) * | 2016-02-01 | 2017-08-10 | 国立大学法人北海道大学 | Structure in which single atoms are dispersed on support, method for manufacturing structure in which single atoms are dispersed on support, and sputtering device |
US10273574B2 (en) | 2016-03-18 | 2019-04-30 | Honda Motor Co., Ltd. | Method for continuous production of high quality graphene |
US11396696B2 (en) | 2016-03-18 | 2022-07-26 | Honda Motor Co., Ltd. | Method for continuous coating of metal foils and wires by high-quality graphene |
TWI720181B (en) * | 2016-05-30 | 2021-03-01 | 日商新力股份有限公司 | Thin film manufacturing method, thin film manufacturing device, manufacturing method of photoelectric conversion element, manufacturing method of logic circuit, manufacturing method of light-emitting element, and manufacturing method of dimming element |
CN107902486A (en) * | 2017-11-14 | 2018-04-13 | 东莞市联洲知识产权运营管理有限公司 | A kind of detection device on color steel printing production line |
JP2019112656A (en) * | 2017-12-21 | 2019-07-11 | 株式会社アルバック | Cvd apparatus for carbon nanostructure growth and method for manufacturing carbon nanostructure |
CN114347427A (en) * | 2021-12-09 | 2022-04-15 | 惠州市广麟材耀科技有限公司 | Aluminum plastic film production process |
CN117403202A (en) * | 2023-10-25 | 2024-01-16 | 甚磁科技(上海)有限公司 | Roll-to-roll transmission heating structure of vacuum coating system |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5130170A (en) * | 1989-06-28 | 1992-07-14 | Canon Kabushiki Kaisha | Microwave pcvd method for continuously forming a large area functional deposited film using a curved moving substrate web with microwave energy with a directivity in one direction perpendicular to the direction of microwave propagation |
US20030079837A1 (en) * | 2001-10-29 | 2003-05-01 | Etsuro Hirai | Semiconductor processing apparatus for continuously forming semiconductor film on flexible substrate |
US6602347B1 (en) * | 1998-11-11 | 2003-08-05 | Canon Kabushiki Kaisha | Apparatus and method for processing a substrate |
US20070261638A1 (en) * | 2006-05-10 | 2007-11-15 | Sumitomo Electric Industries, Ltd. | Coating layer thickness measurement mechanism and coating layer forming apparatus using the same |
US20140318452A1 (en) * | 2011-11-29 | 2014-10-30 | Itn Energy Systems, Inc. | Multi-zone modular coater |
Family Cites Families (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2691007B2 (en) * | 1989-03-20 | 1997-12-17 | 株式会社日立製作所 | Vacuum continuous processing equipment |
US5273911A (en) * | 1991-03-07 | 1993-12-28 | Mitsubishi Denki Kabushiki Kaisha | Method of producing a thin-film solar cell |
JP3787410B2 (en) * | 1997-05-13 | 2006-06-21 | キヤノン株式会社 | Deposited film manufacturing method and photovoltaic device manufacturing method |
JPH11292264A (en) * | 1998-04-03 | 1999-10-26 | Nec Corp | Surface treatment apparatus |
US6054018A (en) * | 1998-08-28 | 2000-04-25 | Wisconsin Alumni Research Foundation | Outside chamber sealing roller system for surface treatment gas reactors |
US6206973B1 (en) * | 1999-04-23 | 2001-03-27 | Silicon Valley Group Thermal System Llc | Chemical vapor deposition system and method |
EP1149932A3 (en) * | 2000-01-26 | 2003-09-10 | Iljin Nanotech Co., Ltd. | Thermal chemical vapor deposition apparatus and method of synthesizing carbon nanotubes using the same |
CH696013A5 (en) * | 2002-10-03 | 2006-11-15 | Tetra Laval Holdings & Finance | An apparatus for treating a strip-like material in a plasma-assisted process. |
JP2005000958A (en) * | 2003-06-12 | 2005-01-06 | Kobe Steel Ltd | Manufacturing method of metallic plate and straightening device used therefor |
CN1276123C (en) * | 2004-04-14 | 2006-09-20 | 李毅 | Equipment for fabricating nesa of stannic oxide |
TWI328050B (en) * | 2005-05-10 | 2010-08-01 | Ulvac Inc | Reeling type plasma cvd device |
JP4954014B2 (en) * | 2006-10-23 | 2012-06-13 | キヤノン株式会社 | Method for forming deposited film and method for forming photovoltaic element |
DE602007005973D1 (en) * | 2007-02-28 | 2010-06-02 | Applied Materials Inc | Network control, network processing device and operating method therefor |
JP2010077508A (en) * | 2008-09-26 | 2010-04-08 | Tokyo Electron Ltd | Film deposition apparatus and substrate processing apparatus |
JP2011037587A (en) * | 2009-08-11 | 2011-02-24 | Fuji Electric Holdings Co Ltd | Substrate carrying position control device |
CN101705477B (en) * | 2009-12-09 | 2012-08-22 | 新奥光伏能源有限公司 | System and method for detecting and repairing crystallization rate of film product on line |
US20110195207A1 (en) * | 2010-02-08 | 2011-08-11 | Sungkyunkwan University Foundation For Corporate Collaboration | Graphene roll-to-roll coating apparatus and graphene roll-to-roll coating method using the same |
JP2011184738A (en) * | 2010-03-09 | 2011-09-22 | Fujifilm Corp | Method for producing gas barrier film |
JP5692794B2 (en) | 2010-03-17 | 2015-04-01 | 独立行政法人産業技術総合研究所 | Method for producing transparent conductive carbon film |
-
2012
- 2012-05-31 JP JP2012124321A patent/JP5958092B2/en active Active
-
2013
- 2013-04-24 KR KR1020147032168A patent/KR102204795B1/en active IP Right Grant
- 2013-04-24 US US14/402,244 patent/US9738969B2/en active Active
- 2013-04-24 WO PCT/JP2013/002772 patent/WO2013179561A1/en active Application Filing
- 2013-04-24 CN CN201380026913.4A patent/CN104603326B/en active Active
-
2016
- 2016-11-03 US US15/342,338 patent/US20170058398A1/en not_active Abandoned
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5130170A (en) * | 1989-06-28 | 1992-07-14 | Canon Kabushiki Kaisha | Microwave pcvd method for continuously forming a large area functional deposited film using a curved moving substrate web with microwave energy with a directivity in one direction perpendicular to the direction of microwave propagation |
US6602347B1 (en) * | 1998-11-11 | 2003-08-05 | Canon Kabushiki Kaisha | Apparatus and method for processing a substrate |
US20030079837A1 (en) * | 2001-10-29 | 2003-05-01 | Etsuro Hirai | Semiconductor processing apparatus for continuously forming semiconductor film on flexible substrate |
US20070261638A1 (en) * | 2006-05-10 | 2007-11-15 | Sumitomo Electric Industries, Ltd. | Coating layer thickness measurement mechanism and coating layer forming apparatus using the same |
US20140318452A1 (en) * | 2011-11-29 | 2014-10-30 | Itn Energy Systems, Inc. | Multi-zone modular coater |
Also Published As
Publication number | Publication date |
---|---|
KR102204795B1 (en) | 2021-01-18 |
WO2013179561A1 (en) | 2013-12-05 |
CN104603326B (en) | 2017-07-18 |
JP2013249505A (en) | 2013-12-12 |
US9738969B2 (en) | 2017-08-22 |
CN104603326A (en) | 2015-05-06 |
US20150140212A1 (en) | 2015-05-21 |
KR20150022767A (en) | 2015-03-04 |
JP5958092B2 (en) | 2016-07-27 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US9738969B2 (en) | Film-forming apparatus and film-forming method | |
TWI249471B (en) | Transparent conductive laminate and process of producing the same | |
JP6158839B2 (en) | System for forming photovoltaic cells on a flexible substrate | |
JP6385960B2 (en) | Common deposition platform, processing station, and method of operation thereof | |
JP5840055B2 (en) | Vapor deposition equipment | |
JP2016519213A (en) | Deposition platform for flexible substrates and method of operation thereof | |
Kavitha et al. | The effect of annealing on the structural, optical and electrical properties of Titanium Nitride (TiN) thin films prepared by DC magnetron sputtering with supported discharge | |
TWI630658B (en) | Transparent conductive film and method of manufacturing same | |
JP2011202248A (en) | Film deposition apparatus and film deposition method | |
US20180037981A1 (en) | Temperature-controlled chalcogen vapor distribution apparatus and method for uniform cigs deposition | |
JP6132055B2 (en) | Method for producing graphene film | |
JP2009293097A (en) | Sputtering composite target, method for producing transparent conductive film using the same and transparent conductive film-fitted base material | |
TWI496919B (en) | Film manufacturing method and film manufacturing apparatus | |
JP2006152322A (en) | Ito transparent conductive film deposition method, and substrate with ito conductive film | |
JP6057450B2 (en) | Substrate with ITO transparent conductive film and method for producing the same | |
CN110835740A (en) | Preparation method of high-transmission composite Ag film | |
JP2014181350A (en) | Aluminum foil with metal layer and production method thereof | |
WO2021072360A1 (en) | Thin film deposition systems and deposition methods for forming photovoltaic cells | |
JP2011195850A (en) | Film-forming method and gas barrier film | |
US20100258180A1 (en) | Method of forming an indium-containing transparent conductive oxide film, metal targets used in the method and photovoltaic devices utilizing said films | |
US10793952B2 (en) | Method for forming sealing film, and sealing film | |
Dong et al. | Achieving High-Quality ZrB 2 Film by Ti-Gettering Assisted DC Sputtering at Ambient Temperature | |
JP6544249B2 (en) | CAN ROLL, VACUUM FILM FORMING APPARATUS, AND FILM FORMING METHOD OF LONG BODY | |
JP6481486B2 (en) | Deposition equipment | |
JP2010255045A (en) | Thin-film-forming apparatus and thin-film-forming method |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
STPP | Information on status: patent application and granting procedure in general |
Free format text: NON FINAL ACTION MAILED |
|
STPP | Information on status: patent application and granting procedure in general |
Free format text: RESPONSE TO NON-FINAL OFFICE ACTION ENTERED AND FORWARDED TO EXAMINER |
|
STPP | Information on status: patent application and granting procedure in general |
Free format text: FINAL REJECTION MAILED |
|
STPP | Information on status: patent application and granting procedure in general |
Free format text: ADVISORY ACTION MAILED |
|
STCB | Information on status: application discontinuation |
Free format text: ABANDONED -- FAILURE TO RESPOND TO AN OFFICE ACTION |