US20140251797A1 - Etching device for the electrolytic etching of copper - Google Patents

Etching device for the electrolytic etching of copper Download PDF

Info

Publication number
US20140251797A1
US20140251797A1 US14/350,515 US201114350515A US2014251797A1 US 20140251797 A1 US20140251797 A1 US 20140251797A1 US 201114350515 A US201114350515 A US 201114350515A US 2014251797 A1 US2014251797 A1 US 2014251797A1
Authority
US
United States
Prior art keywords
liquid
mixing device
vessel
etching
gas mixture
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
US14/350,515
Inventor
Christoph Herkle
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Publication of US20140251797A1 publication Critical patent/US20140251797A1/en
Abandoned legal-status Critical Current

Links

Images

Classifications

    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25FPROCESSES FOR THE ELECTROLYTIC REMOVAL OF MATERIALS FROM OBJECTS; APPARATUS THEREFOR
    • C25F3/00Electrolytic etching or polishing
    • C25F3/02Etching
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25FPROCESSES FOR THE ELECTROLYTIC REMOVAL OF MATERIALS FROM OBJECTS; APPARATUS THEREFOR
    • C25F7/00Constructional parts, or assemblies thereof, of cells for electrolytic removal of material from objects; Servicing or operating
    • C25F7/02Regeneration of process liquids
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B01PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01FMIXING, e.g. DISSOLVING, EMULSIFYING OR DISPERSING
    • B01F23/00Mixing according to the phases to be mixed, e.g. dispersing or emulsifying
    • B01F23/20Mixing gases with liquids
    • B01F23/23Mixing gases with liquids by introducing gases into liquid media, e.g. for producing aerated liquids
    • B01F23/232Mixing gases with liquids by introducing gases into liquid media, e.g. for producing aerated liquids using flow-mixing means for introducing the gases, e.g. baffles
    • B01F23/2323Mixing gases with liquids by introducing gases into liquid media, e.g. for producing aerated liquids using flow-mixing means for introducing the gases, e.g. baffles by circulating the flow in guiding constructions or conduits
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B01PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01FMIXING, e.g. DISSOLVING, EMULSIFYING OR DISPERSING
    • B01F23/00Mixing according to the phases to be mixed, e.g. dispersing or emulsifying
    • B01F23/20Mixing gases with liquids
    • B01F23/23Mixing gases with liquids by introducing gases into liquid media, e.g. for producing aerated liquids
    • B01F23/237Mixing gases with liquids by introducing gases into liquid media, e.g. for producing aerated liquids characterised by the physical or chemical properties of gases or vapours introduced in the liquid media
    • B01F23/2376Mixing gases with liquids by introducing gases into liquid media, e.g. for producing aerated liquids characterised by the physical or chemical properties of gases or vapours introduced in the liquid media characterised by the gas being introduced
    • B01F23/23761Aerating, i.e. introducing oxygen containing gas in liquids
    • B01F23/237613Ozone
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B01PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01FMIXING, e.g. DISSOLVING, EMULSIFYING OR DISPERSING
    • B01F23/00Mixing according to the phases to be mixed, e.g. dispersing or emulsifying
    • B01F23/40Mixing liquids with liquids; Emulsifying
    • B01F23/45Mixing liquids with liquids; Emulsifying using flow mixing
    • B01F23/454Mixing liquids with liquids; Emulsifying using flow mixing by injecting a mixture of liquid and gas
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B01PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01FMIXING, e.g. DISSOLVING, EMULSIFYING OR DISPERSING
    • B01F25/00Flow mixers; Mixers for falling materials, e.g. solid particles
    • B01F25/20Jet mixers, i.e. mixers using high-speed fluid streams
    • B01F25/21Jet mixers, i.e. mixers using high-speed fluid streams with submerged injectors, e.g. nozzles, for injecting high-pressure jets into a large volume or into mixing chambers
    • B01F25/211Jet mixers, i.e. mixers using high-speed fluid streams with submerged injectors, e.g. nozzles, for injecting high-pressure jets into a large volume or into mixing chambers the injectors being surrounded by guiding tubes
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B01PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01FMIXING, e.g. DISSOLVING, EMULSIFYING OR DISPERSING
    • B01F25/00Flow mixers; Mixers for falling materials, e.g. solid particles
    • B01F25/30Injector mixers
    • B01F25/31Injector mixers in conduits or tubes through which the main component flows
    • B01F25/312Injector mixers in conduits or tubes through which the main component flows with Venturi elements; Details thereof
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B01PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01FMIXING, e.g. DISSOLVING, EMULSIFYING OR DISPERSING
    • B01F25/00Flow mixers; Mixers for falling materials, e.g. solid particles
    • B01F25/50Circulation mixers, e.g. wherein at least part of the mixture is discharged from and reintroduced into a receptacle
    • B01F25/53Circulation mixers, e.g. wherein at least part of the mixture is discharged from and reintroduced into a receptacle in which the mixture is discharged from and reintroduced into a receptacle through a recirculation tube, into which an additional component is introduced
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B01PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01FMIXING, e.g. DISSOLVING, EMULSIFYING OR DISPERSING
    • B01F33/00Other mixers; Mixing plants; Combinations of mixers
    • B01F33/80Mixing plants; Combinations of mixers
    • B01F33/82Combinations of dissimilar mixers
    • B01F33/821Combinations of dissimilar mixers with consecutive receptacles
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/02Apparatus or processes for manufacturing printed circuits in which the conductive material is applied to the surface of the insulating support and is thereafter removed from such areas of the surface which are not intended for current conducting or shielding
    • H05K3/06Apparatus or processes for manufacturing printed circuits in which the conductive material is applied to the surface of the insulating support and is thereafter removed from such areas of the surface which are not intended for current conducting or shielding the conductive material being removed chemically or electrolytically, e.g. by photo-etch process
    • H05K3/068Apparatus for etching printed circuits
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/02Apparatus or processes for manufacturing printed circuits in which the conductive material is applied to the surface of the insulating support and is thereafter removed from such areas of the surface which are not intended for current conducting or shielding
    • H05K3/06Apparatus or processes for manufacturing printed circuits in which the conductive material is applied to the surface of the insulating support and is thereafter removed from such areas of the surface which are not intended for current conducting or shielding the conductive material being removed chemically or electrolytically, e.g. by photo-etch process
    • H05K3/07Apparatus or processes for manufacturing printed circuits in which the conductive material is applied to the surface of the insulating support and is thereafter removed from such areas of the surface which are not intended for current conducting or shielding the conductive material being removed chemically or electrolytically, e.g. by photo-etch process being removed electrolytically
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B01PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01FMIXING, e.g. DISSOLVING, EMULSIFYING OR DISPERSING
    • B01F23/00Mixing according to the phases to be mixed, e.g. dispersing or emulsifying
    • B01F23/20Mixing gases with liquids
    • B01F23/23Mixing gases with liquids by introducing gases into liquid media, e.g. for producing aerated liquids
    • B01F23/237Mixing gases with liquids by introducing gases into liquid media, e.g. for producing aerated liquids characterised by the physical or chemical properties of gases or vapours introduced in the liquid media
    • B01F23/2376Mixing gases with liquids by introducing gases into liquid media, e.g. for producing aerated liquids characterised by the physical or chemical properties of gases or vapours introduced in the liquid media characterised by the gas being introduced
    • B01F23/23761Aerating, i.e. introducing oxygen containing gas in liquids
    • B01F23/237612Oxygen

Definitions

  • the invention relates to an etching device for electrolytic etching of copper on an etching material, for example printed circuitry or circuit boards.
  • the etching fluid comprises, for example, copper(II) chloride, which is reduced in contact with the copper on the circuitry or circuit board to copper(I) chloride.
  • This reaction product hardly attacks the copper at all and has to be regenerated back to copper(II) chloride if the etching fluid is to be reused.
  • Such a regeneration can be achieved by means of hydrochloric acid and hydrogen peroxide, giving chlorine gas.
  • etching of copper can also be achieved on the basis of sulfuric acid electrolytes.
  • a copper(II) sulfate is dissolved in sulfuric acid and is reduced after a reaction with copper to be etched away to give copper(I) sulfate. After addition of hydrogen peroxide, it is possible to generate a copper(II) sulfate again, such that an etching fluid regenerated in this way can be supplied again to the etching material.
  • Another approach is to use not hydrogen peroxide but ozone gas as the oxidizing agent for copper(I) ions in the electrolyte.
  • Divalent copper reacts with the copper to be etched away in sulfuric acid electrolyte according to the following equation to give copper(I) sulfate:
  • the copper(I) sulfate obtained is then oxidized with sulfuric acid and ozone gas according to the following equation back to copper(II) sulfate:
  • Etching devices working by this method are known. With increasing demands on the miniaturization of the conductor tracks on printed circuitry or circuit boards, however, it has been found that it is difficult to achieve narrow and sharply bounded intermediate spaces between conductor tracks by etching continuously over a prolonged processing time.
  • the inventive etching device for electrolytic etching of copper on an etching material comprises:
  • a first mixing device set up to receive an acidic electrolyte containing copper ions and an oxygen gas or ozone gas, in order to form a first liquid/gas mixture which can be passed out of a first outlet of the first mixing device into a connecting line coupled thereto,
  • a second mixing device arranged within the vessel and surrounded by the vessel liquid, the second mixing device having a suction orifice in order to suck in the vessel liquid present in the region of the suction orifice, and the second mixing device being connected to the connecting line and set up to pass the first liquid/gas mixture and the vessel liquid sucked in into a constriction zone of the second mixing device, such that the vessel liquid sucked in can mix with the first liquid/gas mixture and thus form a second liquid/gas mixture, and the second mixing device having a second outlet through which the second liquid/gas mixture can flow out and mix with the vessel liquid present in the region of the second outlet, and
  • a vessel outlet line set up to supply the vessel liquid present therein to the etching material provided in an etching module.
  • the inventor has recognized that it is not sufficient simply to mix an acidic electrolyte containing copper(I) ions and copper(II) ions with oxygen gas, an ozone gas or an oxygen/ozone gas mixture. Although oxidation of copper(I) ions to copper(II) ions does take place theoretically, the amount of divalent copper in the existing etching devices decreases with increasing circulation of the electrolyte. Thereafter, the etching action of the electrolyte decreases to an ever greater degree, until the results of the etching operations are no longer satisfactory.
  • the mixing of the gas with the electrolyte is firstly achieved by means of a first mixing device set up to receive an acidic electrolyte containing copper ions and an oxygen gas or ozone gas, in order to form a first liquid/gas mixture. This results in a first contact between copper(I) ions and oxygen or ozone gas, such that a portion of the copper(I) ions can be oxidized at this early stage.
  • the first mixing device is connected by a connecting line to a second mixing device, to which the first liquid/gas mixture is supplied.
  • the second mixing device is arranged within a vessel and is surrounded by a liquid present in this vessel.
  • the second mixing device has a suction orifice in order to suck in the vessel liquid present in the region of the suction orifice.
  • the second mixing device is set up such that the first liquid/gas mixture and the vessel liquid sucked in are passed into a constriction zone, such that the vessel liquid sucked in comes into intensive contact with the first liquid/gas mixture and the two mix with one another, forming a second liquid/gas mixture.
  • the second liquid/gas mixture exits the second mixing device at an outlet envisaged therefor, and the second liquid/gas mixture, after passing through the constriction zone, is decompressed and exits at high velocity according to the Bernoulli equation. In doing so, it entrains a portion of the vessel liquid present in the region of the outlet, resulting in mixing between the second liquid/gas mixture and the vessel liquid present there.
  • the vessel liquid is an acidic electrolyte comprising copper ions.
  • the constriction zone in the second mixing device and the decompression in the region of the outlet of the second mixing device again result in significant mixing between electrolyte and gas, such that a large number of gas microbubbles can form.
  • the gas microbubbles achieve oxidation of a large amount of copper(I) ions with the acidic electrolyte to give copper(II) ions.
  • the liquid/gas mixture which has formed in this way and is enriched with copper(II) ions can then be tapped of at a vessel outlet line and be supplied to the material to be etched.
  • the first mixing device is a Venturi nozzle and more preferably a liquid jet gas compressor.
  • the electrolyte can be supplied as the motive stream and the oxygen gas or ozone gas as the suction stream.
  • the mixing is intensive without moving parts, such that a low-maintenance mixing device is possible.
  • a Venturi nozzle or a liquid jet gas compressor is additionally relatively inexpensive as a purchasable component.
  • the second mixing device is arranged in the lower half of the vessel and the vessel outlet line is arranged above the second mixing device. This achieves the effect that the mixture of second liquid/gas mixture with the vessel liquid present at the outlet of the second mixing device can be sucked in again by the suction orifice of the second mixing device and is mixed once again in the second mixing device.
  • there is very intensive and prolonged mixing of the fluids such that ever more gas microbubbles of oxygen gas or ozone gas are formed. Only a relatively small portion of the gas then ultimately arrives at the vessel outlet line, which can pass the mixture to a material to be etched.
  • the vessel outlet line and the second mixing device there is a distance of at least 1 meter between the vessel outlet line and the second mixing device. It is thus possible to reliably achieve multiple circulation of the vessel liquid through the second mixing device. More preferably, the vessel has a height of at least 1.5 meters with a volume of at least 400 liters of vessel liquid. The result of this is that the vessel liquid flows repeatedly through the second mixing device and circulates in the vessel for at least two minutes, such that a large number of gas microbubbles is produced.
  • the first mixing device is capable of accommodating at least 100 liters per minute of acidic electrolyte and at least 50 liters per minute of oxygen gas or ozone gas.
  • FIG. 1 a schematic diagram of one embodiment of the inventive etching device
  • FIG. 2 a schematic diagram of the flow conditions in a vessel of the etching device according to FIG. 1 .
  • FIG. 1 shows, in greatly simplified form and in schematic view, an etching device 100 according to a preferred embodiment of the invention.
  • the etching device 100 has a first mixing device 1 , which has a first inlet 2 to receive an acidic electrolyte 3 containing copper ions.
  • a gas 5 in the form of oxygen gas, ozone gas or oxygen/ozone gas mixture can be passed into the first mixing device 1 so as to effect mixing with the electrolyte 3 .
  • the result of this mixing operation is a first liquid/gas mixture 6 which can leave the first mixing device 1 at a first outlet 7 .
  • the first liquid/gas mixture 6 is then passed through a connecting line 8 to a second mixing device 10 arranged in a vessel 11 .
  • the vessel is filled with a vessel liquid 12 , which is an acidic electrolyte comprising copper ions.
  • the second mixing device 10 has at least one suction orifice 13 . Through this suction orifice 13 , it is possible to suck in a vessel liquid 14 present in the region of the suction orifice.
  • a zone 15 is provided, in which there is a constriction of the flow cross section, resulting in good mixing of the first liquid/gas mixture 6 and the vessel liquid 14 , such that a second liquid/gas mixture 16 is formed.
  • the second liquid/gas mixture 16 then exits at high velocity. In doing so, it entrains a vessel liquid 18 present in the region of the second outlet 17 and mixes with this liquid.
  • FIG. 2 shows, in a simplified and highly schematic view, a mixing operation of this kind between the second liquid/gas mixture 16 and the vessel liquid 18 present around the second outlet 17 .
  • the flow arrows indicate that a majority of the vessel liquid flows several times toward the suction orifice 13 of the second mixing device 10 , in order to mix there with the first liquid/gas mixture 6 flowing out of the connecting line 8 .
  • the vessel outlet line 19 then passes the liquid/gas mixture to an etching module 30 , where an etching material such as a circuit board 31 can be etched.
  • an etching material such as a circuit board 31 can be etched.
  • the liquid comprising copper(I) ions and copper(II) ions present in the etching module 30 then passes into a return line 32 in which the liquid, supported by a pump 33 , is supplied back to the first mixing device 1 , such that the mixing operation and the regeneration of the etching liquid can start again.

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Electrochemistry (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • ing And Chemical Polishing (AREA)
  • Manufacturing Of Printed Circuit Boards (AREA)
  • Weting (AREA)

Abstract

An etching device for the electrolytic etching of copper on an etching material, includes a first mixing device, which is designed to receive an acid electrolyte containing copper ions, and an oxygen gas or ozone gas in order to form a first liquid-gas mixture which can be channeled from a first outlet of the first mixing device into a connecting line coupled thereto; a container, which contains a container liquid, a second mixing device, which is arranged in the container and is surrounded by the container liquid, wherein the second mixing device includes a suction opening in order to suction in the container liquid present in the region of the suction opening, wherein the second mixing device is connected to the connecting line and is designed to channel the first liquid-gas mixture and the suctioned container liquid into a constricted zone of the second mixing device so that the suctioned container liquid mixes with the first liquid-gas mixture and is thus able to form a second liquid-gas mixture, wherein the second mixing device has a second outlet out of which the second liquid-gas mixture is able to flow and mix with the container liquid present in the region of the second outlet, and a container outlet line, which is designed to feed the container liquid present there to the etching material provided in an etching module.

Description

  • The invention relates to an etching device for electrolytic etching of copper on an etching material, for example printed circuitry or circuit boards.
  • In order to electrolytic etch copper on printed circuitry or a printed circuit board, it is possible to use a copper-containing etching fluid. In that case, the etching fluid comprises, for example, copper(II) chloride, which is reduced in contact with the copper on the circuitry or circuit board to copper(I) chloride. This reaction product hardly attacks the copper at all and has to be regenerated back to copper(II) chloride if the etching fluid is to be reused. Such a regeneration can be achieved by means of hydrochloric acid and hydrogen peroxide, giving chlorine gas. Alternatively, etching of copper can also be achieved on the basis of sulfuric acid electrolytes. For this purpose, a copper(II) sulfate is dissolved in sulfuric acid and is reduced after a reaction with copper to be etched away to give copper(I) sulfate. After addition of hydrogen peroxide, it is possible to generate a copper(II) sulfate again, such that an etching fluid regenerated in this way can be supplied again to the etching material.
  • It has been found that such etching methods are difficult to manage in practice, since copper acts catalytically on the hydrogen peroxide in the acidic solution and breaks it down, and so the consumption of the hydrogen peroxide is relatively high. In addition, high evolution of heat occurs, and so energy-intensive cooling is required.
  • Another approach is to use not hydrogen peroxide but ozone gas as the oxidizing agent for copper(I) ions in the electrolyte. Divalent copper reacts with the copper to be etched away in sulfuric acid electrolyte according to the following equation to give copper(I) sulfate:

  • Cu+CuSO4→Cu2SO4.  i.
  • The copper(I) sulfate obtained is then oxidized with sulfuric acid and ozone gas according to the following equation back to copper(II) sulfate:

  • Cu2SO4+H2SO4+O3→2CuSO4+H2O+O2  i.
  • Relatively little heat of reaction arises here, and so the expenditure on cooling is considerably lower. Moreover, no chlorine gas is formed, but instead oxygen, which is associated with lower risks in an etching device.
  • Etching devices working by this method are known. With increasing demands on the miniaturization of the conductor tracks on printed circuitry or circuit boards, however, it has been found that it is difficult to achieve narrow and sharply bounded intermediate spaces between conductor tracks by etching continuously over a prolonged processing time.
  • It is therefore an object of the invention to provide an etching device with which it is possible to etch a large amount of copper continuously with a small amount of etching fluid, and it is also possible to achieve fine and sharp contours of conductor tracks with high flank steepness.
  • The object is achieved by the subject matter of independent claim 1. Advantageous developments of the invention are the subject of the dependent claims.
  • The inventive etching device for electrolytic etching of copper on an etching material comprises:
  • a first mixing device set up to receive an acidic electrolyte containing copper ions and an oxygen gas or ozone gas, in order to form a first liquid/gas mixture which can be passed out of a first outlet of the first mixing device into a connecting line coupled thereto,
  • a vessel containing a vessel liquid,
  • a second mixing device arranged within the vessel and surrounded by the vessel liquid, the second mixing device having a suction orifice in order to suck in the vessel liquid present in the region of the suction orifice, and the second mixing device being connected to the connecting line and set up to pass the first liquid/gas mixture and the vessel liquid sucked in into a constriction zone of the second mixing device, such that the vessel liquid sucked in can mix with the first liquid/gas mixture and thus form a second liquid/gas mixture, and the second mixing device having a second outlet through which the second liquid/gas mixture can flow out and mix with the vessel liquid present in the region of the second outlet, and
  • a vessel outlet line set up to supply the vessel liquid present therein to the etching material provided in an etching module.
  • The inventor has recognized that it is not sufficient simply to mix an acidic electrolyte containing copper(I) ions and copper(II) ions with oxygen gas, an ozone gas or an oxygen/ozone gas mixture. Although oxidation of copper(I) ions to copper(II) ions does take place theoretically, the amount of divalent copper in the existing etching devices decreases with increasing circulation of the electrolyte. Thereafter, the etching action of the electrolyte decreases to an ever greater degree, until the results of the etching operations are no longer satisfactory. This is the starting point of the invention: in the inventive etching device, there is very intensive mixing of the oxygen gas or ozone gas supplied with the acidic electrolyte, such that a high concentration of gas microbubbles of oxygen gas or ozone gas are formed. The effect of this is that a large amount of copper(I) ions can be oxidized back to copper(II) ions in the electrolyte, this being achieved after only a single run through the etching device. It is thus possible firstly to achieve a high efficiency in the regeneration of the electrolyte. Secondly, with such an etching device having a continuously high concentration of copper(II) ions, it is possible to achieve rapid and sharply contoured etching even in very narrow recesses between copper conductor tracks.
  • The mixing of the gas with the electrolyte is firstly achieved by means of a first mixing device set up to receive an acidic electrolyte containing copper ions and an oxygen gas or ozone gas, in order to form a first liquid/gas mixture. This results in a first contact between copper(I) ions and oxygen or ozone gas, such that a portion of the copper(I) ions can be oxidized at this early stage.
  • In order to oxidize a sufficient amount of monovalent copper, by means of the inventive etching device, the first mixing device is connected by a connecting line to a second mixing device, to which the first liquid/gas mixture is supplied. The second mixing device is arranged within a vessel and is surrounded by a liquid present in this vessel. The second mixing device has a suction orifice in order to suck in the vessel liquid present in the region of the suction orifice. The second mixing device, according to the invention, is set up such that the first liquid/gas mixture and the vessel liquid sucked in are passed into a constriction zone, such that the vessel liquid sucked in comes into intensive contact with the first liquid/gas mixture and the two mix with one another, forming a second liquid/gas mixture.
  • The second liquid/gas mixture exits the second mixing device at an outlet envisaged therefor, and the second liquid/gas mixture, after passing through the constriction zone, is decompressed and exits at high velocity according to the Bernoulli equation. In doing so, it entrains a portion of the vessel liquid present in the region of the outlet, resulting in mixing between the second liquid/gas mixture and the vessel liquid present there. The vessel liquid is an acidic electrolyte comprising copper ions. The constriction zone in the second mixing device and the decompression in the region of the outlet of the second mixing device again result in significant mixing between electrolyte and gas, such that a large number of gas microbubbles can form. The gas microbubbles achieve oxidation of a large amount of copper(I) ions with the acidic electrolyte to give copper(II) ions.
  • The liquid/gas mixture which has formed in this way and is enriched with copper(II) ions can then be tapped of at a vessel outlet line and be supplied to the material to be etched.
  • Preferably, the first mixing device is a Venturi nozzle and more preferably a liquid jet gas compressor. In the case of such a nozzle or such a compressor, the electrolyte can be supplied as the motive stream and the oxygen gas or ozone gas as the suction stream. The mixing is intensive without moving parts, such that a low-maintenance mixing device is possible. A Venturi nozzle or a liquid jet gas compressor is additionally relatively inexpensive as a purchasable component.
  • In one embodiment of the invention, the second mixing device is arranged in the lower half of the vessel and the vessel outlet line is arranged above the second mixing device. This achieves the effect that the mixture of second liquid/gas mixture with the vessel liquid present at the outlet of the second mixing device can be sucked in again by the suction orifice of the second mixing device and is mixed once again in the second mixing device. In the case of multiple repetition of this operation, there is very intensive and prolonged mixing of the fluids, such that ever more gas microbubbles of oxygen gas or ozone gas are formed. Only a relatively small portion of the gas then ultimately arrives at the vessel outlet line, which can pass the mixture to a material to be etched.
  • Preferably, there is a distance of at least 1 meter between the vessel outlet line and the second mixing device. It is thus possible to reliably achieve multiple circulation of the vessel liquid through the second mixing device. More preferably, the vessel has a height of at least 1.5 meters with a volume of at least 400 liters of vessel liquid. The result of this is that the vessel liquid flows repeatedly through the second mixing device and circulates in the vessel for at least two minutes, such that a large number of gas microbubbles is produced.
  • In a further embodiment, the first mixing device is capable of accommodating at least 100 liters per minute of acidic electrolyte and at least 50 liters per minute of oxygen gas or ozone gas. Thus, given the customary sizes of a circuit board and an etching module, a sufficient amount of copper(I) ions formed therein can be oxidized in a single cycle back to copper(II) ions.
  • Further advantages and features of the invention are explained with reference to the following figures, which show:
  • FIG. 1 a schematic diagram of one embodiment of the inventive etching device; and
  • FIG. 2 a schematic diagram of the flow conditions in a vessel of the etching device according to FIG. 1.
  • FIG. 1 shows, in greatly simplified form and in schematic view, an etching device 100 according to a preferred embodiment of the invention. The etching device 100 has a first mixing device 1, which has a first inlet 2 to receive an acidic electrolyte 3 containing copper ions. By means of a second inlet 4, a gas 5 in the form of oxygen gas, ozone gas or oxygen/ozone gas mixture can be passed into the first mixing device 1 so as to effect mixing with the electrolyte 3. The result of this mixing operation is a first liquid/gas mixture 6 which can leave the first mixing device 1 at a first outlet 7.
  • The first liquid/gas mixture 6 is then passed through a connecting line 8 to a second mixing device 10 arranged in a vessel 11. The vessel is filled with a vessel liquid 12, which is an acidic electrolyte comprising copper ions. The second mixing device 10 has at least one suction orifice 13. Through this suction orifice 13, it is possible to suck in a vessel liquid 14 present in the region of the suction orifice. In the second mixing device 10, a zone 15 is provided, in which there is a constriction of the flow cross section, resulting in good mixing of the first liquid/gas mixture 6 and the vessel liquid 14, such that a second liquid/gas mixture 16 is formed. At a second outlet 17 of the second mixing device 10, the second liquid/gas mixture 16 then exits at high velocity. In doing so, it entrains a vessel liquid 18 present in the region of the second outlet 17 and mixes with this liquid.
  • FIG. 2 shows, in a simplified and highly schematic view, a mixing operation of this kind between the second liquid/gas mixture 16 and the vessel liquid 18 present around the second outlet 17. The flow arrows indicate that a majority of the vessel liquid flows several times toward the suction orifice 13 of the second mixing device 10, in order to mix there with the first liquid/gas mixture 6 flowing out of the connecting line 8. This leads to a large amount of gas microbubbles distributed in the vessel liquid 12. Only a relatively small portion of the vessel liquid 12 mixed intensively and provided with gas microbubbles in this way flows upward at the edge of the vessel to a vessel outlet line 19 arranged above the second mixing device 10.
  • As apparent from FIG. 1, the vessel outlet line 19 then passes the liquid/gas mixture to an etching module 30, where an etching material such as a circuit board 31 can be etched. This involves reduction of copper(II) ions to copper(I) ions. The liquid comprising copper(I) ions and copper(II) ions present in the etching module 30 then passes into a return line 32 in which the liquid, supported by a pump 33, is supplied back to the first mixing device 1, such that the mixing operation and the regeneration of the etching liquid can start again.
  • LIST OF REFERENCE NUMERALS
  • 1 first mixing device
  • 2 first inlet
  • 3 electrolyte
  • 4 second inlet
  • 5 oxygen gas or ozone gas
  • 6 first liquid/gas mixture
  • 7 first outlet
  • 8 connecting line
  • 10 second mixing device
  • 11 vessel
  • 12 vessel liquid
  • 13 suction orifice
  • 14 vessel liquid in the region of the suction orifice
  • 15 constriction zone
  • 16 second liquid/gas mixture
  • 17 second outlet
  • 18 vessel liquid in the region of the outlet
  • 19 vessel outlet line
  • 30 etching module
  • 31 circuit board
  • 32 return line
  • 33 pump
  • 100 etching device

Claims (7)

What is claimed:
1-6. (canceled)
7. An etching device for electrolytic etching of copper on an etching material, comprising:
a first mixing device for receiving an acidic electrolyte containing copper ions and an oxygen gas or ozone gas, to thereby form a first liquid/gas mixture conductible out of a first outlet of the first mixing device into a connecting line coupled to the first mixing device;
a vessel containing a vessel liquid;
a second mixing device arranged within the vessel and surrounded by the vessel liquid, the second mixing device having a suction orifice for sucking in the vessel liquid present in a region of the suction orifice, the second mixing device being connected to the connecting line and configured to pass the first liquid/gas mixture and the sucked in vessel liquid into a constriction zone of the second mixing device, such that the vessel liquid mixes with the first liquid/gas mixture thereby forming a second liquid/gas mixture, the second mixing device having a second outlet for discharging the second liquid/gas mixture so as to be mixed with the vessel liquid present in a region of the second outlet, and
a vessel outlet line for supplying the vessel liquid to the etching material provided in an etching module.
8. The etching device as claimed in claim 7, wherein the first mixing device is constructed as a Venturi nozzle or a liquid jet gas compressor.
9. The etching device as claimed in claim 7, wherein the second mixing device is arranged in the lower half of the vessel and the vessel outlet line is arranged above the second mixing device.
10. The etching device as claimed in claim 7, wherein there is a distance of at least one meter between the vessel outlet line and the second mixing device.
11. The etching device as claimed in claim 7, wherein the vessel has a height of at least 1.5 meters with a volume of at least 400 liters of vessel liquid.
12. The etching device as claimed in claim 7, wherein the first mixing device is capable of accommodating at least 100 liters per minute of acidic electrolyte and at least 50 liters per minute of oxygen gas or ozone gas.
US14/350,515 2011-10-08 2011-10-08 Etching device for the electrolytic etching of copper Abandoned US20140251797A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/DE2011/001810 WO2013050008A1 (en) 2011-10-08 2011-10-08 Etching device for the electrolytic etching of copper

Publications (1)

Publication Number Publication Date
US20140251797A1 true US20140251797A1 (en) 2014-09-11

Family

ID=45952807

Family Applications (1)

Application Number Title Priority Date Filing Date
US14/350,515 Abandoned US20140251797A1 (en) 2011-10-08 2011-10-08 Etching device for the electrolytic etching of copper

Country Status (8)

Country Link
US (1) US20140251797A1 (en)
EP (1) EP2764138B1 (en)
JP (1) JP5711856B2 (en)
KR (1) KR101587245B1 (en)
CN (1) CN103975096B (en)
DE (1) DE112011105722A5 (en)
SG (1) SG11201401219WA (en)
WO (1) WO2013050008A1 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20160068988A1 (en) * 2014-09-10 2016-03-10 Invensas Corporation Paddle for Materials Processing
WO2020074541A1 (en) * 2018-10-08 2020-04-16 Degrémont Technologies Ag Using ozone for manganese* oxidation in etching application
US12070727B2 (en) * 2016-09-14 2024-08-27 Gea Brewery Systems Gmbh Device and method for mixing the contents of a tank

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5719468B1 (en) * 2014-06-20 2015-05-20 日本ガス開発株式会社 Heat exchanger
CN104947111B (en) * 2015-07-02 2017-09-22 深圳市洁驰科技有限公司 A kind of printed circuit board acidic etching solution cuprous ion oxidation unit
CN107215140A (en) * 2017-07-27 2017-09-29 安徽省九华山法器有限公司 A kind of Zijin etch process

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5350511A (en) * 1990-01-29 1994-09-27 Yasuyuki Sakurada Sewage purification apparatus
US20030056841A1 (en) * 2001-09-25 2003-03-27 Hydro Systems Company Multiple flow rate eductive dispenser
US20050109636A1 (en) * 2003-10-24 2005-05-26 Jens Birkner Process for producing a ready-to-use electrolyte
US20090286333A1 (en) * 2008-05-15 2009-11-19 Sumco Techxiv Corporation Etching method and etching apparatus of semiconductor wafer

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3376853D1 (en) * 1983-04-13 1988-07-07 Kernforschungsanlage Juelich Apparatus for regenerating an ammoniacal etching solution
JPS6388026A (en) * 1986-10-01 1988-04-19 Mitsubishi Rayon Eng Co Ltd Gas liquid mixing apparatus
JP2701444B2 (en) * 1989-04-07 1998-01-21 富士電機株式会社 Etchant regeneration equipment
DE4208582A1 (en) * 1992-03-18 1993-09-23 Hoellmueller Maschbau H Regeneration process and appts. for copper chloride etching and pickling solns. - utilising dissolved oxygen@ content as re-oxidant, making process economical
JPH07243062A (en) * 1994-03-03 1995-09-19 Hitachi Chem Co Ltd Etching method and device therefor
JPH08302487A (en) * 1995-05-08 1996-11-19 Fuji Electric Co Ltd Liquid etchant regenerating device
FR2762232B1 (en) 1997-04-17 1999-05-28 Degremont PROCESS AND DEVICE FOR CONTACT WITH OZONE IN TREATMENT FLUIDS, ESPECIALLY WATER
JP2000017462A (en) 1998-07-03 2000-01-18 Kenshin Ka Copper etching method and device therefor
DE10002000A1 (en) * 2000-01-19 2001-08-09 Bosch Gmbh Robert Atomization arrangement
JP3555557B2 (en) 2000-06-16 2004-08-18 栗田工業株式会社 Aeration device
JP4559289B2 (en) 2005-04-28 2010-10-06 株式会社荏原製作所 Oxygen dissolving apparatus and oxygen dissolving method

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5350511A (en) * 1990-01-29 1994-09-27 Yasuyuki Sakurada Sewage purification apparatus
US20030056841A1 (en) * 2001-09-25 2003-03-27 Hydro Systems Company Multiple flow rate eductive dispenser
US20050109636A1 (en) * 2003-10-24 2005-05-26 Jens Birkner Process for producing a ready-to-use electrolyte
US20090286333A1 (en) * 2008-05-15 2009-11-19 Sumco Techxiv Corporation Etching method and etching apparatus of semiconductor wafer

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
Machine Generated English Translation of JP2002-001386 published January 8, 2002. *
Machine Generated English Translation of JP2006-305494 published November 9, 2006. *

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20160068988A1 (en) * 2014-09-10 2016-03-10 Invensas Corporation Paddle for Materials Processing
US9551083B2 (en) * 2014-09-10 2017-01-24 Invensas Corporation Paddle for materials processing
US12070727B2 (en) * 2016-09-14 2024-08-27 Gea Brewery Systems Gmbh Device and method for mixing the contents of a tank
WO2020074541A1 (en) * 2018-10-08 2020-04-16 Degrémont Technologies Ag Using ozone for manganese* oxidation in etching application

Also Published As

Publication number Publication date
SG11201401219WA (en) 2014-07-30
CN103975096B (en) 2016-08-17
JP5711856B2 (en) 2015-05-07
KR20140092817A (en) 2014-07-24
EP2764138A1 (en) 2014-08-13
DE112011105722A5 (en) 2014-06-26
KR101587245B1 (en) 2016-01-20
JP2014528516A (en) 2014-10-27
EP2764138B1 (en) 2015-04-29
WO2013050008A1 (en) 2013-04-11
CN103975096A (en) 2014-08-06

Similar Documents

Publication Publication Date Title
US20140251797A1 (en) Etching device for the electrolytic etching of copper
US9550156B2 (en) Generation apparatus for dissolving gas in liquid and fluid nozzle
KR101209463B1 (en) Micro-bubble solution generating device using turbine pump
US9920434B2 (en) Oxidation of copper in a copper etching solution by the use of oxygen and/or air as an oxidizing agent
JP3555557B2 (en) Aeration device
KR20110102149A (en) Substrate processing appartus, substrate processing method and storage medium storing therein a program for executing substrate processing method
TWI758294B (en) Method and device for treating wastewater containing organic matter
KR920000537B1 (en) Dissoluing gas in liquid
JP6884443B1 (en) Nozzle device for ozone water production, ozone water cleaning device using this device
JP2015077570A (en) Structure of nozzle to be used in gas dissolution liquid manufacturing system
JP2009178702A (en) Gas-liquid mixing equipment
KR100445301B1 (en) Ozone Sterilization Method and Device for Water Supply Drainage
JP5972805B2 (en) Nitrogen deoxygenation equipment
CN216584245U (en) Gas-liquid reaction equipment
JP2011092893A (en) Gas-dissolved liquid manufacturing system
TWI544084B (en) Dissolution method and equipment of metal
JP2021511963A (en) Bubble water production equipment that can adjust the size of fine bubbles and a method for generating fine bubbles in bubble water using this
JP2002273457A (en) High-speed agitating reducing system
JP2005087845A (en) Ozone diffuser
JP2010017692A (en) Portable bubble generator
JP2000153286A (en) Ozonized water producing device
JP2004337678A (en) Aerobic treatment method for organic waste liqud, and device therefor
JP2004267924A (en) Deoxidation equipment and deoxidation method
JPH06154569A (en) Method for dissolving gas into liquid rapidly

Legal Events

Date Code Title Description
STCB Information on status: application discontinuation

Free format text: ABANDONED -- FAILURE TO RESPOND TO AN OFFICE ACTION