US20040090671A1 - Comparison optical system - Google Patents

Comparison optical system Download PDF

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Publication number
US20040090671A1
US20040090671A1 US10/694,690 US69469003A US2004090671A1 US 20040090671 A1 US20040090671 A1 US 20040090671A1 US 69469003 A US69469003 A US 69469003A US 2004090671 A1 US2004090671 A1 US 2004090671A1
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United States
Prior art keywords
optical system
xyz
displacement
comparison optical
comparison
Prior art date
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Abandoned
Application number
US10/694,690
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English (en)
Inventor
Manfred Gilbert
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Leica Microsystems CMS GmbH
Original Assignee
Leica Microsystems Wetzlar GmbH
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Application filed by Leica Microsystems Wetzlar GmbH filed Critical Leica Microsystems Wetzlar GmbH
Assigned to LEICA MICROSYSTEMS WETZLAR GMBH reassignment LEICA MICROSYSTEMS WETZLAR GMBH ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: GILBERT, MANFRED
Publication of US20040090671A1 publication Critical patent/US20040090671A1/en
Assigned to LEICA MICROSYSTEMS CMS GMBH reassignment LEICA MICROSYSTEMS CMS GMBH CHANGE OF NAME (SEE DOCUMENT FOR DETAILS). Assignors: LEICA MICROSYSTEMS WETZLAR GMBH
Priority to US12/169,754 priority Critical patent/US8009353B2/en
Abandoned legal-status Critical Current

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    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/18Arrangements with more than one light path, e.g. for comparing two specimens
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956Inspecting patterns on the surface of objects
    • G01N21/95607Inspecting patterns on the surface of objects using a comparative method
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/24Base structure
    • G02B21/26Stages; Adjusting means therefor
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00Sampling; Preparing specimens for investigation
    • G01N2001/002Devices for supplying or distributing samples to an analysing apparatus
    • G01N2001/007Devices specially adapted for forensic samples, e.g. tamper-proofing, sample tracking

Definitions

  • the invention concerns a comparison optical system.
  • the invention concerns in particular a comparison optical system having several image-acquiring optical subsystems that are connected to one another via a bridge which mechanically and optically connects the several image-acquiring optical subsystems to one another.
  • German Patent DE 30 06 379 discloses a defect inspection system for comparative inspection of a standard specimen and a test item.
  • the test item and the standard specimen are on a common support, and both the standard specimen and the test item are imaged via optical means and combined so that a comparison is possible.
  • German Unexamined Application DE 41 03 457 describes a comparison microscope for viewing two similar specimens through two objectives, having a device which is configured for combining the two images for comparative viewing.
  • Each of the two objectives is part of an individual microscope, a video mixing apparatus, to which the video signals of two video cameras acquiring the images from the microscopes are conveyed, being provided as the device for combining the two images. Synchronous displacement of the microscope stages has not been acknowledged.
  • U.S. Pat. No. 4,403,839 describes a comparison optical device that is embodied for simultaneous observation of two specimens.
  • a bridge encompasses the optical means for combining the beam paths that are generated by the microscope or macroscope. Illuminating light is introduced into the system by means of the photo tube. The document does not mention how the individual specimens must be arranged on one or more stages.
  • These macroscopes or microscopes described above are used in corresponding systems, which are embodied as comparison microscopes or comparison macroscopes, for performing forensic comparative examinations.
  • two individual microscopes or individual macroscopes connected to one another by a bridge, are used.
  • the bridge contains an apparatus for combining the two individual images generated by the individual microscopes or macroscopes.
  • the operator of the comparison microscope or macroscope can view in superimposed fashion the images of specimens arranged on two different stages. Appropriate blocking of portions of the two samples corresponding to one another yields a composite image which makes possible a direct comparison, for example, of one sample half to the other sample half.
  • the specimens compared to one another are, for example, the impressions produced on cartridge cases by the firing pin of a weapon, in order to determine whether the same firearm was used in two or more crimes.
  • a further known application of optical comparison investigations consists in checking the authenticity of documents, especially banknotes, in order to determine whether they are counterfeit.
  • an XYZ stage movable in motorized fashion, is provided for each image-acquiring optical subsystem, and
  • an XYZ stage movable in motorized fashion, is provided for each macroscope.
  • a control unit for moving the XYZ stages in motorized fashion, synchronously in all three spatial directions.
  • an XYZ stage movable in motorized fashion, is provided for each microscope, and
  • each image-acquiring optical subsystem possesses a XYZ stage, movable in motorized fashion, on which a sample to be examined is placed. Also provided is a control unit that moves the XYZ stages ( 8 a , 8 b ), movable in motorized fashion, synchronously in all three spatial directions. If the comparison optical systems are embodied as macroscopes, the control unit is embodied as a control and adjustment apparatus on which is provided an on/off switch with which synchronous displacement of the XYZ stages can be switched on and off. Synchronous displacement has the advantage that upon actuation of an actuation element for a motion direction of an XYZ stage, both XYZ stages are displaced in exactly uniform synchronous fashion.
  • the macroscopes can likewise each have associated with them a remote control device that can be used for stage and focus control. It is also possible to activate the stage and focus control systems of the two remote control devices in such a way that a synchronous motion is possible.
  • the comparison optical system can likewise be constructed from microscopes. In this case a remote control device is connected to each microscope and can be activated so as to make possible, for example by actuation of an actuation element of the remote control device, synchronous displacement of the XYZ stages that are mounted on the microscope stand.
  • the structures present on the specimens to be examined are often larger in terms of dimension than the region which is visible in the eyepiece or with the attached camera.
  • both XYZ stages In order to allow the entire specimen to be compared, both XYZ stages must be shifted synchronously in the X direction, Y direction, and Z direction. With synchronous displacement it is possible to shift the two XYZ stages synchronously using only one X actuation element or Y actuation element or the Z fine displacement control for each of the X, Y, and Z axes respectively. This has the advantage that evaluation of the specimens to be examined is considerably improved.
  • a prerequisite for synchronization is that at least the three axes of the XYZ stages be motorized.
  • FIG. 1 is a perspective view of a first embodiment of the comparison optical system, the optical subsystems being embodied as macroscopes;
  • FIG. 2 is a perspective view of a second embodiment of the comparison optical system, the optical subsystems being embodied as microscopes;
  • FIG. 3 is a detail view of a control unit with which the XYZ stages of the comparison optical system are synchronously movable.
  • FIG. 1 shows a comparison optical system 1 .
  • comparison optical system 1 comprises a first and a second macroscope 2 a and 2 b that are configured as image-acquiring optical subsystems.
  • First and second macroscope 2 a and 2 b are mechanically and optically connected to one another via a bridge 3 .
  • Bridge 3 possesses a viewing port 4 for a user, and a tube 5 having a connection 6 for a camera (not depicted). Viewing port 4 for the user can be configured pivotably in order to maintain an ergonomic working position for the user.
  • Tube 5 can additionally possess a further connection 7 with which, for example, a second camera (not depicted) can be attached.
  • a first XYZ stage 8 a is associated with first macroscope 2 a .
  • a second XYZ stage 8 b is associated with second macroscope 2 b .
  • a specimen to be compared (not depicted) is placed respectively on first and on second XYZ stage 8 a and 8 b .
  • comparison macroscopy both bullets and tools are assessed as specimens, and the traces left thereby are optically compared to one another and evaluated. This is done, in most cases, by splitting the image in the middle so that the specimen positioned on first XYZ stage 8 a is visible in the left half, and the specimen positioned on second XYZ stage 8 b is visible in the right half.
  • Bridge 3 together with first and second XYZ stage 8 a and 8 b , is mounted on a column 10 via a dovetail guide 11 .
  • bridge 3 is displaceable in the Z direction, or vertically, relative to the surface of XYZ stages 8 a and 8 b .
  • the movement of bridge 3 allows coarse focusing of the specimens, present on the two stages 8 a and 8 b , whose structures are to be compared.
  • Column 10 itself is joined to a base 12 which is substantially wider than column 10 in order to achieve sufficient stability and steadiness for comparison optical system 1 .
  • Control and adjustment apparatus 14 Arranged between the first and on the second XYZ stage 8 a and 8 b is a control and adjustment apparatus 14 with which various functions of comparison optical system 1 can be adjusted or modified.
  • Control and adjustment apparatus 14 possesses several actuation elements (see FIG. 3 for description) with which various functions of comparison optical system 1 can be actuated. It is self-evident that control and adjustment apparatus 14 depicted in FIG. 1 can be variously embodied.
  • the two XYZ stages 8 a and 8 b are displaceable in the X direction, Y direction, and Z direction by way of several motors 16 .
  • a first and a second remote control device 18 a and 18 b can moreover also be associated with comparison optical system 1 .
  • the first and a second remote control device 18 a and 18 b are each connected to comparison optical system 1 via a cable 19 .
  • Remote control devices 18 a and 18 b each possess a plurality of actuation elements 24 that can be assigned for various motorized functions of comparison optical system 1 . It is self-evident that the connection can assume any technical configuration, for example radio, infrared, etc.
  • Comparison optical system 1 can additionally have associated with it a PC 20 that, via an RS232 cable or USB cable 21 , supplies control signals to comparison optical system 1 and receives image data or settings data from comparison optical system 1 .
  • the image data are displayed to the user on a monitor 22 that is connected to PC 20 .
  • the current settings data of comparison optical system 1 can also be displayed to the user on monitor 22 .
  • FIG. 2 is a perspective view of a second embodiment of comparison optical system 1 , the optical subsystems comprising, in this embodiment, a first and a second microscope 30 a and 30 b .
  • First and second microscope 30 a and 30 b are connected to one another via a bridge 3 .
  • Each microscope 30 a and 30 b comprises a stand that comprises a base 32 .
  • Base 32 is subdivided into three main segments, made up of a transverse main segment 34 , a stand column segment 36 , and a stand foot segment 35 .
  • An XYZ stage 8 a , 8 b is mounted on stand column segment 36 .
  • Each microscope 30 a and 30 b is equipped with a transmitted-light illumination system and an incident-light illumination system (both not depicted).
  • Stand foot segment 35 is convexly curved in the region facing toward stand column segment 36 , and possesses a display 40 in convexly curved region 37 .
  • Display 40 can also be embodied as a touch screen which allows the user to make parameter inputs and call certain measurement methods therewith. If display 40 is not embodied as a touch screen, current settings data of the respective microscope 30 a or 30 b are then visually presented via display 40 .
  • a respective drive knob 42 which, for example, displaces XYZ stage 8 a or 8 b associated with each microscope 30 a or 30 b vertically (in the Z direction). It is likewise conceivable additionally to assign other functions to drive knob 42 .
  • Multiple actuation elements 44 with which microscope functions can also be switched are provided in the region around drive knob 42 .
  • the microscope functions are, for example, filter changing, aperture selection, revolving turret movement, etc.
  • Bridge 3 is attached to connecting element 50 a and 50 b of each microscope 30 a and 30 b .
  • bridge 3 possesses a viewing port 4 for a user, and a tube 5 having a connection 6 for a camera (not depicted).
  • Viewing port 4 for the user can be configured pivotably in order to maintain an ergonomic working position for the user.
  • Both XYZ stages 8 a and 8 b are displaceable in the X direction, Y direction, and Z direction by way of several motors 16 .
  • first and second remote control device 18 a and 18 b are also associated with comparison optical system 1 . These are each connected via a cable 19 to comparison optical system 1 or to PC 20 . It is self-evident that the connection can assume any technical configuration, for example radio, infrared, etc.
  • a display 22 is additionally associated with PC 20 .
  • FIG. 3 is a detail view of control and adjustment apparatus 14 of FIG. 1, with which XYZ stages 8 a and 8 b of the comparison optical system are synchronously movable.
  • Control and adjustment apparatus 14 encompasses a plurality of adjusting elements for comparison optical system 1 .
  • a switch 60 Provided on a front side 14 a of control and adjustment apparatus 14 is a switch 60 , actuation of which causes a vertical displacement of column 10 (FIG. 1). This results in coarse focusing on the specimens that are present on XYZ stages 8 a and 8 b of comparison optical system 1 of FIG. 1.
  • switch 60 Directly above switch 60 is an on/off switch 61 for synchronous displacement of the two XYZ stages 8 a and 8 b .
  • X actuation element 62 a for displacing first XYZ stage 8 a in the X direction.
  • X actuation element 62 b for displacing second XYZ stage 8 b in the X direction.
  • X actuation element 62 a is an adjustment element 63 a for an illumination system, with which the light intensity of an external light source (not depicted) can be modified.
  • X actuation element 62 b is an adjustment element 63 b for an illumination system, with which the light intensity of an external light source (not depicted), whose light is directed onto second XYZ stage 8 b , can be modified.
  • first lateral surface 14 b of control and adjustment apparatus 14 is depicted visibly.
  • first lateral surface 14 b On first lateral surface 14 b is a Y actuation element 64 b for displacing second XYZ stage 8 b in the Y direction.
  • a Z fine displacement control 65 a for first XYZ stage 8 a is provided on second lateral surface 14 c.
  • Control and adjustment apparatus 14 furthermore possesses a top surface 14 d on which are mounted several actuation elements 70 , 71 , 72 , 73 , 74 , 75 , and 76 which are provided for modification of the image depiction.
  • Actuation element 70 serves to generate a superimposed image, the image of the specimen on first XYZ stage 8 a being overlaid on the specimen on second XYZ stage 8 b .
  • Actuation element 71 serves to generate a side-by-side depiction of the specimen on first XYZ stage 8 a next to the specimen on second XYZ stage 8 b .
  • Actuation element 72 serves to generate a depiction of the image of the specimen on first XYZ stage 8 a .
  • Actuation element 73 serves to generate a depiction of the image of the specimen on second XYZ stage 8 b .
  • Actuation element 74 is used for manual aperture matching.
  • Actuation element 75 is used for manual lateral shifting of the apertures.
  • Actuation element 76 is used for secondary magnification of the specimens to be depicted. In a particular embodiment, a 1.5 ⁇ magnification is provided.
  • An on/off switch 61 for synchronous displacement of the two XYZ stages 8 a and 8 b is configured in such a way that the functioning of the control elements is coupled, so that the previously independent X actuation elements 62 a and 62 b , Y actuation elements 64 a and 64 b , and Z fine displacement controls 65 a and 65 b for each individual XYZ stage 8 a and 8 b act synchronously on both XYZ stages 8 a and 8 b .
  • both XYZ stages 8 a and 8 b must be shifted synchronously in the X direction, Y direction, and Z direction. It is thereby possible, using only one X actuation element or Y actuation element or the Z fine displacement control for each of the X, Y, and Z axes respectively, to displace the two XYZ stages 8 a and 8 b synchronously in order thereby to improve the evaluation of the specimens being investigated. In addition, the ergonomics of the entire comparison optical system 1 is considerably improved.
  • a prerequisite for synchronization is motorization of the three axes of XYZ stages 8 a and 8 b . This applies both to macroscopes 2 a and 2 b or microscopes 30 a and 30 b that are connected by bridge 3 .
  • control and adjustment apparatus 14 for macroscopes 2 a and 2 b the latter also have associated with them a first remote control device and second remote control device 18 a and 18 b .
  • first remote control device and second remote control device 18 a and 18 b the functioning of the actuation elements is coupled, by way of a button or a command from the PC (via RS232, USB, etc.), in such a way that upon actuation of any actuation element or the Z fine displacement control for a direction, both XYZ stages are moved synchronously.

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  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Microscoopes, Condenser (AREA)
US10/694,690 2002-10-31 2003-10-28 Comparison optical system Abandoned US20040090671A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US12/169,754 US8009353B2 (en) 2002-10-31 2008-07-09 Comparison optical system

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP02102514A EP1416308B1 (fr) 2002-10-31 2002-10-31 Système optique de comparaison
EPEP02102514.3 2002-10-31

Related Child Applications (1)

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US12/169,754 Expired - Lifetime US8009353B2 (en) 2002-10-31 2008-07-09 Comparison optical system

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US (2) US20040090671A1 (fr)
EP (1) EP1416308B1 (fr)
JP (1) JP2004151732A (fr)
CN (1) CN100370305C (fr)
DE (1) DE50209087D1 (fr)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050191015A1 (en) * 2004-02-26 2005-09-01 Fox John S. Controlled-intensity multiple-frequency multiple-axis illumination of macroscopic specimens from a single light source using special bifurcated cables
US20070035850A1 (en) * 2005-08-09 2007-02-15 Leica Microsystems Cms Gmbh Method and device for reducing systematic measuring errors in the examination of objects
US20080145040A1 (en) * 2006-12-19 2008-06-19 Cytyc Corporation Simultaneous imaging of multiple specimen slides on a single slide stage
US20100053719A1 (en) * 2008-09-04 2010-03-04 Leica Microsystems Cms Gmbh Optical system for merging a first and a second partial image beam, each proceeding from a specimen, into a resultant image beam
US20110038041A1 (en) * 2007-09-25 2011-02-17 Carl Zeiss Microimaging Gmbh Operating device for the focusing operation of a microscope
WO2011137518A1 (fr) * 2010-05-03 2011-11-10 Forensic Technology Wai, Inc. Liaison de microscopes pour analyse d'objets comprenant des marques d'outils
US20160018631A1 (en) * 2014-07-18 2016-01-21 Lumos Technology Co., Ltd. High versatile combinable microscope base and microscope having the same
US9772482B2 (en) 2012-10-22 2017-09-26 Leica Microsystems Cms Gmbh Illumination device

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102008041822B4 (de) * 2008-09-04 2011-06-22 Leica Microsystems CMS GmbH, 35578 Optisches System zum Zusammenführen eines ersten und eines zweiten jeweils von einem Objekt ausgehenden Teilbildstrahls zu einem Ergebnisbildstrahl
DE202009017670U1 (de) * 2009-12-27 2010-04-29 Märzhäuser Wetzlar GmbH & Co. KG Mikroskop-Steuereinheit
WO2011123944A1 (fr) 2010-04-08 2011-10-13 Forensic Technology Wai, Inc. Génération d'une image 3d modifiée d'un objet comprenant des marques d'outil
DE102012012276B4 (de) 2012-06-21 2023-01-05 Carl Zeiss Microscopy Gmbh Mikroskopiervorrichtung und Verfahren zum Betreiben einer Mikroskopiervorrichtung
CN103091827B (zh) * 2013-02-01 2015-09-09 沈阳博兴亚达科技有限公司 高清自动识别比对显微镜及痕迹自动识别比对方法
JP5971763B2 (ja) * 2013-04-17 2016-08-17 株式会社リガク X線光学部品装置及びx線分析装置
WO2015079268A1 (fr) * 2013-11-28 2015-06-04 Femtonics Kft. Système de microscope optique permettant une observation simultanée de régions d'intérêt distinctes spatialement

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US4277802A (en) * 1979-02-20 1981-07-07 Hajime Industries, Ltd. Defect inspection system
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US4680627A (en) * 1985-03-19 1987-07-14 Hitachi, Ltd. Apparatus for checking patterns on printed circuit boards
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Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050191015A1 (en) * 2004-02-26 2005-09-01 Fox John S. Controlled-intensity multiple-frequency multiple-axis illumination of macroscopic specimens from a single light source using special bifurcated cables
US7280726B2 (en) * 2004-02-26 2007-10-09 Fox John S Controlled-intensity multiple-frequency multiple-axis illumination of macroscopic specimens from a single light source using special bifurcated cables
US20070035850A1 (en) * 2005-08-09 2007-02-15 Leica Microsystems Cms Gmbh Method and device for reducing systematic measuring errors in the examination of objects
US20080145040A1 (en) * 2006-12-19 2008-06-19 Cytyc Corporation Simultaneous imaging of multiple specimen slides on a single slide stage
US8482852B2 (en) 2007-09-25 2013-07-09 Harald Schadwinkel Operating device for the focusing operation of a microscope
US20110038041A1 (en) * 2007-09-25 2011-02-17 Carl Zeiss Microimaging Gmbh Operating device for the focusing operation of a microscope
US8331018B2 (en) 2008-09-04 2012-12-11 Leica Microsystems Cms Gmbh Optical system for merging a first and a second partial image beam, each proceeding from a specimen, into a resultant image beam
US20100053719A1 (en) * 2008-09-04 2010-03-04 Leica Microsystems Cms Gmbh Optical system for merging a first and a second partial image beam, each proceeding from a specimen, into a resultant image beam
WO2011137518A1 (fr) * 2010-05-03 2011-11-10 Forensic Technology Wai, Inc. Liaison de microscopes pour analyse d'objets comprenant des marques d'outils
US20110286090A1 (en) * 2010-05-03 2011-11-24 Forensic Technology Wai Inc. Linking of microscopes for analysis of objects comprising tool marks
US9080844B2 (en) * 2010-05-03 2015-07-14 Ultra Electronics Forensic Technology Inc. Linking of microscopes for analysis of objects comprising tool marks
US9772482B2 (en) 2012-10-22 2017-09-26 Leica Microsystems Cms Gmbh Illumination device
US20160018631A1 (en) * 2014-07-18 2016-01-21 Lumos Technology Co., Ltd. High versatile combinable microscope base and microscope having the same

Also Published As

Publication number Publication date
US20090180177A1 (en) 2009-07-16
JP2004151732A (ja) 2004-05-27
DE50209087D1 (de) 2007-02-08
EP1416308B1 (fr) 2006-12-27
CN100370305C (zh) 2008-02-20
EP1416308A1 (fr) 2004-05-06
CN1499237A (zh) 2004-05-26
US8009353B2 (en) 2011-08-30

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