US10712668B2 - Shutter device used for exposure in lithography machine, and method for use thereof - Google Patents
Shutter device used for exposure in lithography machine, and method for use thereof Download PDFInfo
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- US10712668B2 US10712668B2 US16/090,055 US201716090055A US10712668B2 US 10712668 B2 US10712668 B2 US 10712668B2 US 201716090055 A US201716090055 A US 201716090055A US 10712668 B2 US10712668 B2 US 10712668B2
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- exposure
- shutter
- rotating motor
- shutter blade
- rotation center
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/70191—Optical correction elements, filters or phase plates for controlling intensity, wavelength, polarisation, phase or the like
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70358—Scanning exposure, i.e. relative movement of patterned beam and workpiece during imaging
- G03F7/70366—Rotary scanning
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/70758—Drive means, e.g. actuators, motors for long- or short-stroke modules or fine or coarse driving
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70483—Information management; Active and passive control; Testing; Wafer monitoring, e.g. pattern monitoring
- G03F7/7055—Exposure light control in all parts of the microlithographic apparatus, e.g. pulse length control or light interruption
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70483—Information management; Active and passive control; Testing; Wafer monitoring, e.g. pattern monitoring
- G03F7/7055—Exposure light control in all parts of the microlithographic apparatus, e.g. pulse length control or light interruption
- G03F7/70558—Dose control, i.e. achievement of a desired dose
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70808—Construction details, e.g. housing, load-lock, seals or windows for passing light in or out of apparatus
- G03F7/70825—Mounting of individual elements, e.g. mounts, holders or supports
-
- H10P95/00—
Definitions
- the present invention relates to the manufacturing of photolithography equipment and, more particular, to a shutter device for use in exposure by a photolithography machine and a method of using the shutter device.
- Photolithography is a technique for printing a pattern with features onto the surface of a substrate.
- a commonly-used substrate is a semiconductor wafer or a glass substrate having a surface coated with a light-sensitive material (e.g., photoresist).
- a wafer is placed on a wafer stage and the pattern is projected onto the surface of the wafer by means of an exposure device incorporated in the photolithography machine.
- exposure dosage One of the important metrics for assessing the performance of a photolithography machine is exposure dosage, because the development of the photoresist will be affected at excessively high or low exposure doses. For this reason, exposure dose control accuracy poses a direct impact on the etching accuracy of the photolithography machine.
- Exposure systems in existing medium-end and low-end photolithography machines employ high-pressure mercury lamps as their light sources.
- Such an exposure system utilizes a mechanical shutter disposed in the optical path to enable or disable exposure, and the exposure dose is determined by the exposure time.
- this operation may involve:
- a shutter device for use in an exposure sub-system of a photolithography machine, which can be quickly opened and closed under the action of high-power voice coil motors.
- the voice coil motors often have to operate at high power levels.
- the voice coil motors themselves fail to meet the practical needs in terms of reliability and stability. As a result, many problems may arise from the operation of the shutter, which may ultimately affect the stability and performance of the photolithography tool in which the shutter device is employed.
- a shutter device for use in exposure by a photolithography machine, including: a shutter blade; a rotating motor for driving the shutter blade to rotate; a controller in electric connection with the rotating motor; and a supporter for supporting the rotating motor, the shutter blade including a rotation center and, disposed in correspondence with the rotation center, at least one open portion and at least one shielding portion, the rotation center coupled to the rotating motor, the rotating motor driving the shutter blade to rotate so that the shutter device is opened and closed to enable and disable exposure.
- a coupling block may be disposed between the rotation center of the shutter blade and the rotating motor.
- a speed reducer may be disposed between the rotating motor and the coupling block.
- the supporter may be fixedly connected to the speed reducer.
- the shutter blade may include one open portion and one shielding portion, each of the open portion and the shielding portion having a central angle of 180 degrees.
- the shutter blade may include two open portions in symmetry with respect to the rotation center and two shielding portions also in symmetry with respect to the rotation center, wherein each of the open and shielding portions has a central angle of 90 degrees.
- the shutter blade may include three open portions and three shielding portions, which are staggered one another around the rotation center and each have a central angle of 60 degrees.
- the shielding portion may include an inner hollow portion and an outer shielding portion that is concentric with the inner hollow portion with respect to the rotation center.
- the hollow portion may be fan-shaped, with the shielding portion may be annular-shaped.
- the motor and/or the shutter blade rotate at a non-zero speed.
- the present invention also provides a method of using a shutter device for use in exposure by a photolithography machine, including the steps of:
- the shielding portion may include an inner hollow portion and an outer shielding portion that is concentric with the inner hollow portion with respect to the rotation center.
- the hollow portion may be fan-shaped, with the shielding portion may be annular-shaped.
- step S2 during forming an exposure-enabled region and an exposure-disabled region, and subsequent to the activation of the rotating motor under the control of the controller, the shutter blade may be caused to experience acceleration-constant speed-deceleration-stillness-acceleration cycles.
- acceleration and deceleration of the shutter blade are accomplished during a closing stage of the shutter device, while the shutter blade rotates at a constant speed during an opening stage of the shutter device.
- step S2 during forming an exposure-enabled region and an exposure-disabled region, and subsequent to the activation of the rotating motor under the control of the controller, the shutter blade may be caused to experience acceleration-constant speed-deceleration-constant speed-acceleration cycles.
- acceleration and deceleration of the shutter blade may be accomplished during a closing stage of the shutter device, while the shutter blade rotates at a constant speed during an opening stage of the shutter device.
- a constant speed at which the rotating motor rotates subsequent to the acceleration may be greater than or equal to 10 times a constant speed at which the rotating motor rotates subsequent to the deceleration.
- a shutter blade in the shutter device for use in exposure by photolithography machine and the method of using the shutter device, includes a rotation center and, disposed in correspondence with the rotation center, at least one open portion and at least one shielding portion, the rotation center coupled to a rotating motor which drives the shutter blade to rotate so that the shutter is opened and closed to enable and disable exposure.
- the shielding portion includes a hollow portion which significantly reduces the mass of the shutter blade, facilitating the control over the rotation of the shutter blade and improving the exposure dose control accuracy.
- the opening and closing of the shutter is accomplished during rotation of the shutter blade at a constant speed, while the acceleration and deceleration of the shutter blade take place in the period when the shutter is in a closed state, which is relatively long and allows a large stroke. This significantly reduces the required torque of the rotating motor.
- the constant speed of the rotating motor is relatively high, the shutter opening and closing time is effectively shortened, resulting in a further improvement in the exposure dose control accuracy and in the performance of the photolithography machine.
- FIG. 1 shows a structural schematic of a shutter device for use in exposure by a photolithography machine constructed in accordance with Embodiment 1 of the present invention.
- FIG. 2 shows a structural schematic of a shutter blade according to Embodiment 1 of the present invention.
- FIGS. 3 a to 3 b schematically depict a closed state of the shutter according to Embodiment 1 of the present invention.
- FIGS. 4 a to 4 b schematically depict a fully-open state of the shutter according to Embodiment 1 of the present invention.
- FIGS. 5 a to 5 b schematically depict a partially-open, partially-closed state of the shutter according to Embodiment 1 of the present invention.
- FIG. 6 schematically illustrates rotational speed variation of the shutter blade with a shift among the above shutter states according to Embodiment 1 of the present invention.
- FIG. 7 shows a theoretical exposure dose utilization rate profile in one shutter cycle according to Embodiment 1 of the present invention.
- FIG. 8 shows a structural schematic of a shutter blade according to Embodiment 2 of the present invention.
- FIG. 9 schematically illustrates rotational speed variation of a shutter blade with a shift among different shutter states according to Embodiment 4 of the present invention.
- 1 shutter blade
- 11 rotation center
- 12 open portion
- 13 shield portion
- 131 shield portion
- 132 scanning light shielding portion
- 2 rotating motor
- 3 supporter
- 4 coupling block
- 5 speed reducer
- 6 light beam.
- the present invention provides a shutter device for used in exposure by a photolithography machine, including: a shutter blade 1 ; a rotating motor 2 for driving the shutter blade 1 to rotate; a controller (not shown) in electric connection with the rotating motor 2 ; and a supporter 3 for holding the rotating motor 2 .
- the shutter blade 1 includes a rotation center 11 and at least one open portion 12 and at least one shielding portion 13 which are disposed in correspondence with the rotation center 11 .
- the rotation center 11 is coupled to the rotating motor 2 .
- the rotating motor 2 drives the shutter blade 1 to rotate so that the shutter is opened and closed to enable and disable exposure.
- the rotating motor 2 and/or shutter blade 1 rotate at a non-zero speed.
- a coupling block 4 configured to effectively fix the rotation center 11 of the shutter blade 1 to an output shaft of the rotating motor 2 to prevent any relative movement between them. In this manner, better control can be achieved over the rotation of the shutter blade 1 .
- a speed reducer 5 may be further disposed between the rotating motor 2 and the coupling block 4 .
- the speed reducer 5 may have a gear ratio of 4:1.
- the speed reducer 5 may be coupled to the output shaft of the rotating motor 2 so that the speed reducer 5 can provide a trade-off between speed limit and torque limit of the rotating motor 2 .
- the rotating motor 2 is capable of outputting a greater torque without an increase in its power.
- the supporter 3 is fixedly connected to the speed reducer 5 .
- the supporter 3 is disposed under the speed reducer 5 so as to support the whole structure of the shutter device.
- the shutter blade 1 may have two open portions 12 in symmetry with respect to the rotation center 11 and two shielding portions 13 also in symmetry with respect to the rotation center 11 .
- Each of the open portions 12 and the shielding portions 13 may have a central angle of 90 degrees.
- each of the shielding portions 13 may have an inner hollow portion 131 and an outer scanning light shielding portion 132 that is concentric with the inner hollow portion with respect to the rotation center 11 .
- the hollow portions 131 may be fan-shaped and can effectively reduce the mass of the shutter blade, which facilitates the control over the rotation of the shutter blade and hence improves the exposure dose control accuracy.
- the scanning light shielding portions 132 may be annular-shaped which can block the light beam 6 during the rotation of the shutter blade 1 and thus disable exposure.
- FIGS. 3 a and 3 b when the shielding portion 132 shields the light beam 6 , exposure is disabled, which is equivalent to a closed state of the shutter.
- FIGS. 4 a and 4 b when the light beam 6 is not blocked by the shielding portions 132 , i.e., the light beam 6 passes through one of the open portions 12 , exposure is allowed, which is equivalent to a fully-open state of the shutter.
- FIGS. 5 a and 5 b when the light beam 6 partially passes through an open portion 12 and is partially blocked by the shielding portion 132 , the shutter is in a partially-open, partially-closed state.
- the present invention also provides a method of using a shutter device for use in exposure by a photolithography machine, which include the steps as detailed below.
- a shutter blade 1 In S1, a shutter blade 1 , a rotating motor 2 , a controller and a supporter 3 are assembled.
- the shutter blade 1 includes a rotation center 11 and, disposed in correspondence with the rotation center 11 , at least one open portion 12 and at least one shielding portion 13 .
- the shielding portion 13 may have an inner hollow portion 131 and an outer scanning light shielding portion 132 that is concentric with the inner hollow portion with respect to the rotation center 11 .
- the hollow portion 131 may be fan-shaped and can effectively reduce the mass of the shutter blade, which facilitates the control over the rotation of the shutter blade and hence improves the exposure dose control accuracy.
- the rotating motor 2 is activated under the control of the controller, causing the shutter blade 1 to rotate, thereby enabling and disabling exposure.
- the shutter blade 1 is caused to experience acceleration-constant speed-deceleration-stillness-acceleration cycles.
- FIG. 6 shows that during a closed stage of the shutter, which stage corresponds to an exposure-disabled region in the figure, the acceleration and deceleration of the shutter blade 1 are both accomplished.
- the shutter blade 1 rotates at a constant speed.
- the opening stage of the shutter includes partially-open, partially-closed and fully-open states as shown in FIGS. 3 a -5 b .
- the open and closed states of the shutter are configured within the periods during which the shutter blade 1 rotates at a constant speed, while the acceleration and deceleration of the shutter blade 1 take place in the a closing stage of the shutter, which is relatively long and allows a large stroke. This significantly reduces the required torque of the rotating motor 2 .
- the shutter opening and closing time is effectively shortened, resulting in a further improvement in the exposure dose control accuracy and in the performance of the photolithography machine.
- the shutter blade 1 according to this Embodiment has a theoretical exposure dose utilization rate of 58.75%.
- the exposure time t is:
- the speed reducer 5 Since the speed reducer 5 has a gear ratio of 4:1 and each exposure-disabled period accounts for 1 ⁇ 4 of the shutter cycle, the speed P of the rotating motor 2 is:
- the rotating motor 2 within each exposure-disabled period that accounts for 1 ⁇ 4 of the shutter cycle, the rotating motor 2 has to decrease its speed to zero and subsequently increase the speed to 7661 rpm at an angular acceleration of:
- V represents the linear speed of the rotating motor 2 .
- the rotating motor 2 needs to operate for 31.3 ms. Based on a required length of the exposure-disabled period, the duration in which the shutter blade 1 does not rotate and stays still can be determined.
- this Embodiment differs from Embodiment 1 in that the shutter blade 1 has one open portion 12 and one shielding portion 13 .
- Each of the open portion 12 and the shielding portion 13 has a central angle of 180 degrees.
- the speed reducer 5 is omitted, and the shutter blade 1 is directly driven by the rotating motor 2 instead.
- the shielding portion 13 includes an inner hollow portion 131 and an outer scanning light shielding portion 132 that is concentric with the inner hollow portion with respect to the rotation center 11 .
- the hollow portion 131 may be fan-shaped and can effectively reduce the mass of the shutter blade, which facilitates the control over the rotation of the shutter blade and hence improves the exposure dose control accuracy.
- the scanning light shielding portion 132 may be annular-shaped which can block light during the rotation of the shutter blade 1 and thus disable exposure.
- the shutter blade 1 has only one open portion 11 and only one shielding portion 12 , the fraction of the period in which the shutter blade 1 is partially-open or partially-closed in the shutter cycle is reduced, improving the exposure dose utilization rate.
- the shutter blade 1 During a constant-speed rotation cycle experiencing the partially-open fully-open and partially-closed states, the shutter blade 1 according to this Embodiment has a theoretical exposure dose utilization rate of 86.11%.
- the exposure time t is:
- the speed P of the rotating motor 2 is:
- the rotating motor 2 has to decrease its speed to zero and subsequently increase the speed to 4491 rpm at an angular acceleration of:
- V represents the linear speed of the rotating motor 2 .
- the rotating motor 2 needs to operate for 26.7 ms. Based on a required length of the exposure-disabled period, the duration in which the shutter blade 1 does not rotate and stays still can be determined.
- Embodiment differs from Embodiment 1 in that the shutter blade 1 has three open portions 12 and three shielding portions 13 , which are staggered one another around the rotation center 11 and each of the open portions 12 and the shielding portions 13 has a central angle of 60 degrees.
- each of the shielding portions 13 includes an inner hollow portion 131 and an outer scanning light shielding portion 132 that is concentric with the inner hollow portion with respect to the rotation center 11 .
- the hollow portion 131 may be fan-shaped and can effectively reduce the mass of the shutter blade, which facilitates the control over the rotation of the shutter blade and hence improves the exposure dose control accuracy.
- the scanning light shielding portion 132 may be annular-shaped which can block light during the rotation of the shutter blade 1 and thus disable exposure.
- the shutter blade 1 During a constant-speed rotation cycle experiencing the partially-open fully-open and partially-closed states, the shutter blade 1 according to this Embodiment has a theoretical exposure dose utilization rate of 50%.
- the exposure time t is:
- the speed reducer 5 Since the speed reducer 5 has a gear ratio of 4:1 and the exposure-disabled period accounts for 1 ⁇ 6 of the shutter cycle, the speed P of the rotating motor 2 is:
- the rotating motor has to decrease its speed to zero and subsequently increase the speed to 5217 rpm at an angular acceleration of:
- the rotating motor 2 needs to operate for 30 ms. Based on a required length of the exposure-disabled period, the duration in which the shutter blade 1 does not rotate and stays still can be determined.
- a method of using a shutter device for use in exposure by a photolithography machine in accordance with this Embodiment includes the steps as detailed below.
- a shutter blade 1 In S1, a shutter blade 1 , a rotating motor 2 , a controller and a supporter 3 are assembled.
- the shutter blade 1 includes a rotation center 11 and, disposed in correspondence with the rotation center 11 , at least one open portion 12 and at least one shielding portion 13 .
- the shielding portion 13 may have an inner hollow portion 131 and an outer scanning light shielding portion 132 that is concentric with the inner hollow portion with respect to the rotation center 11 .
- the hollow portion 131 may be fan-shaped and can effectively reduce the mass of the shutter blade 1 , which facilitates the control over the rotation of the shutter blade 1 and hence improves the exposure dose control accuracy.
- the rotating motor 2 is activated under the control of the controller, causing the shutter blade 1 to rotate, thereby enabling and disabling exposure.
- the shutter blade 1 is caused to experience acceleration-constant speed-deceleration-constant speed-acceleration cycles, as shown in FIG. 9 .
- the constant speed at which the rotating motor 2 rotates subsequent to the acceleration is greater than or equal to 10 times the constant speed at which the rotating motor 2 rotates subsequent to the deceleration. This rotation speed variation arrangement is suitable for applications in which long exposure periods and short shutter closure periods are required.
- a shutter blade 1 in the shutter device for use in exposure by photolithography machine and the method of using the shutter device, includes a rotation center 11 and, disposed in correspondence with the rotation center, at least one open portion 12 and at least one shielding portion 13 , the rotation center 11 coupled to a rotating motor 2 .
- the rotating motor 2 drives the shutter blade 1 to rotate so that the shutter is opened and closed to enable and disable exposure.
- the shielding portion 13 includes a hollow portion 131 which significantly reduces the mass of the shutter blade 1 , facilitating the control over the rotation of the shutter blade 1 and improving the exposure dose control accuracy.
- the opening and closing of the shutter is accomplished during rotation of the shutter blade 1 at a constant speed, while the acceleration and deceleration of the shutter blade 1 take place in the period when the shutter is in a closed state, which is relatively long and allows a large stroke.
- the shutter opening and closing time is effectively shortened, resulting in a further improvement in the exposure dose control accuracy and in the performance of the photolithography machine.
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Engineering & Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
- Epidemiology (AREA)
- Public Health (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Shutters For Cameras (AREA)
Abstract
Description
T=J×ε×1000=256 mNm (10)
Claims (14)
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610200735 | 2016-03-31 | ||
| CN201610200735.8A CN107290938B (en) | 2016-03-31 | 2016-03-31 | A shutter device for exposure of a lithography machine and a method of using the same |
| CN201610200735.8 | 2016-03-31 | ||
| PCT/CN2017/078936 WO2017167259A1 (en) | 2016-03-31 | 2017-03-31 | Shutter device used for exposure in lithography machine, and method for use thereof |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| US20190369501A1 US20190369501A1 (en) | 2019-12-05 |
| US10712668B2 true US10712668B2 (en) | 2020-07-14 |
Family
ID=59963550
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US16/090,055 Active US10712668B2 (en) | 2016-03-31 | 2017-03-31 | Shutter device used for exposure in lithography machine, and method for use thereof |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US10712668B2 (en) |
| JP (1) | JP6649505B2 (en) |
| KR (1) | KR102173216B1 (en) |
| CN (1) | CN107290938B (en) |
| SG (1) | SG11201808160PA (en) |
| TW (1) | TWI630466B (en) |
| WO (1) | WO2017167259A1 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11275310B2 (en) * | 2020-03-03 | 2022-03-15 | Kioxia Corporation | Semiconductor manufacturing apparatus and method of manufacturing semiconductor device |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110196532B (en) * | 2018-02-27 | 2021-03-16 | 上海微电子装备(集团)股份有限公司 | Safety shutter device of photoetching machine |
| JP7352332B2 (en) * | 2018-05-14 | 2023-09-28 | キヤノン株式会社 | exposure equipment |
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| US20170255106A1 (en) * | 2016-03-03 | 2017-09-07 | Canon Kabushiki Kaisha | Shutter unit, lithography apparatus, and method of manufacturing article |
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| JPH03114824U (en) * | 1990-05-31 | 1991-11-26 |
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- 2017-03-31 US US16/090,055 patent/US10712668B2/en active Active
- 2017-03-31 SG SG11201808160PA patent/SG11201808160PA/en unknown
- 2017-03-31 KR KR1020187030522A patent/KR102173216B1/en active Active
- 2017-03-31 JP JP2018550513A patent/JP6649505B2/en active Active
- 2017-03-31 TW TW106111132A patent/TWI630466B/en active
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Also Published As
| Publication number | Publication date |
|---|---|
| KR20180124968A (en) | 2018-11-21 |
| WO2017167259A1 (en) | 2017-10-05 |
| TWI630466B (en) | 2018-07-21 |
| KR102173216B1 (en) | 2020-11-03 |
| TW201736983A (en) | 2017-10-16 |
| US20190369501A1 (en) | 2019-12-05 |
| CN107290938B (en) | 2019-05-31 |
| SG11201808160PA (en) | 2018-10-30 |
| JP2019516125A (en) | 2019-06-13 |
| CN107290938A (en) | 2017-10-24 |
| JP6649505B2 (en) | 2020-02-19 |
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