US10320039B2 - Semiconductor device, battery monitoring system, and method of monitoring battery - Google Patents
Semiconductor device, battery monitoring system, and method of monitoring battery Download PDFInfo
- Publication number
- US10320039B2 US10320039B2 US14/798,654 US201514798654A US10320039B2 US 10320039 B2 US10320039 B2 US 10320039B2 US 201514798654 A US201514798654 A US 201514798654A US 10320039 B2 US10320039 B2 US 10320039B2
- Authority
- US
- United States
- Prior art keywords
- voltage
- semiconductor device
- terminal
- temperature
- battery
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active, expires
Links
- 239000004065 semiconductor Substances 0.000 title claims abstract description 76
- 238000012544 monitoring process Methods 0.000 title claims description 115
- 238000000034 method Methods 0.000 title description 8
- 238000006243 chemical reaction Methods 0.000 claims abstract description 22
- 230000006870 function Effects 0.000 description 24
- 238000005259 measurement Methods 0.000 description 20
- 238000009529 body temperature measurement Methods 0.000 description 17
- 230000000052 comparative effect Effects 0.000 description 8
- 238000010586 diagram Methods 0.000 description 8
- 238000012545 processing Methods 0.000 description 5
- 101100409308 Neurospora crassa (strain ATCC 24698 / 74-OR23-1A / CBS 708.71 / DSM 1257 / FGSC 987) adv-1 gene Proteins 0.000 description 3
- 238000001514 detection method Methods 0.000 description 3
- 230000003247 decreasing effect Effects 0.000 description 2
- CIWBSHSKHKDKBQ-JLAZNSOCSA-N Ascorbic acid Chemical compound OC[C@H](O)[C@H]1OC(=O)C(O)=C1O CIWBSHSKHKDKBQ-JLAZNSOCSA-N 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000007599 discharging Methods 0.000 description 1
- 230000000153 supplemental effect Effects 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
- H01M10/00—Secondary cells; Manufacture thereof
- H01M10/42—Methods or arrangements for servicing or maintenance of secondary cells or secondary half-cells
- H01M10/48—Accumulators combined with arrangements for measuring, testing or indicating the condition of cells, e.g. the level or density of the electrolyte
- H01M10/486—Accumulators combined with arrangements for measuring, testing or indicating the condition of cells, e.g. the level or density of the electrolyte for measuring temperature
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
- H01M10/00—Secondary cells; Manufacture thereof
- H01M10/42—Methods or arrangements for servicing or maintenance of secondary cells or secondary half-cells
- H01M10/44—Methods for charging or discharging
- H01M10/443—Methods for charging or discharging in response to temperature
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
- H01M10/00—Secondary cells; Manufacture thereof
- H01M10/42—Methods or arrangements for servicing or maintenance of secondary cells or secondary half-cells
- H01M10/48—Accumulators combined with arrangements for measuring, testing or indicating the condition of cells, e.g. the level or density of the electrolyte
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/36—Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
- G01R31/382—Arrangements for monitoring battery or accumulator variables, e.g. SoC
- G01R31/3835—Arrangements for monitoring battery or accumulator variables, e.g. SoC involving only voltage measurements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
- H01M10/00—Secondary cells; Manufacture thereof
- H01M10/42—Methods or arrangements for servicing or maintenance of secondary cells or secondary half-cells
- H01M10/44—Methods for charging or discharging
- H01M10/441—Methods for charging or discharging for several batteries or cells simultaneously or sequentially
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02J—CIRCUIT ARRANGEMENTS OR SYSTEMS FOR SUPPLYING OR DISTRIBUTING ELECTRIC POWER; SYSTEMS FOR STORING ELECTRIC ENERGY
- H02J7/00—Circuit arrangements for charging or depolarising batteries or for supplying loads from batteries
- H02J7/0029—Circuit arrangements for charging or depolarising batteries or for supplying loads from batteries with safety or protection devices or circuits
- H02J7/0031—Circuit arrangements for charging or depolarising batteries or for supplying loads from batteries with safety or protection devices or circuits using battery or load disconnect circuits
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02J—CIRCUIT ARRANGEMENTS OR SYSTEMS FOR SUPPLYING OR DISTRIBUTING ELECTRIC POWER; SYSTEMS FOR STORING ELECTRIC ENERGY
- H02J7/00—Circuit arrangements for charging or depolarising batteries or for supplying loads from batteries
- H02J7/0047—Circuit arrangements for charging or depolarising batteries or for supplying loads from batteries with monitoring or indicating devices or circuits
-
- H02J7/0091—
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E60/00—Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
- Y02E60/10—Energy storage using batteries
Definitions
- the conventional semiconductor device is capable of performing a calculation as the primary function.
- the semiconductor device it is possible to easily perform a relatively complex calculation. Further, it is possible to easily store a table with a large capacity according to various conditions. As a result, it is possible to easily achieve the temperature measurement circuit capable of suppressing an influence of a variance in the power source voltage.
- the switches SW 1 , SW 2 , and SW 3 are provided for connecting the ADC 14 to a voltage to be a measurement subject one to one when the source voltage VG, the thermistor voltage VT, and the voltage VB of the battery Bat are measured.
- the MPU retrieves the source voltage VG and the thermistor voltage VT thus measured as described above from the resistor 20 , the MPU is capable of calculating a temperature TB of the battery Bat through inputting the source voltage VG and the thermistor voltage VT into the following equation (1):
- the battery monitoring IC 40 stores the divided voltage value VG′ as well as the thermistor voltage VT in the resistor 20 .
- the source voltage VG can be obtained through the equation (3) that is modified from the equation (2):
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- General Chemical & Material Sciences (AREA)
- Secondary Cells (AREA)
- Measuring Temperature Or Quantity Of Heat (AREA)
- Measurement Of Current Or Voltage (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2014-145250 | 2014-07-15 | ||
JP2014145250A JP6313150B2 (ja) | 2014-07-15 | 2014-07-15 | 半導体装置、電池監視システムおよび電池監視方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
US20160018474A1 US20160018474A1 (en) | 2016-01-21 |
US10320039B2 true US10320039B2 (en) | 2019-06-11 |
Family
ID=55074411
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US14/798,654 Active 2036-09-19 US10320039B2 (en) | 2014-07-15 | 2015-07-14 | Semiconductor device, battery monitoring system, and method of monitoring battery |
Country Status (3)
Country | Link |
---|---|
US (1) | US10320039B2 (zh) |
JP (1) | JP6313150B2 (zh) |
CN (1) | CN105280971B (zh) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI491858B (zh) * | 2013-03-15 | 2015-07-11 | Richtek Technology Corp | 溫度偵測電路及其方法 |
JP6637374B2 (ja) * | 2016-04-27 | 2020-01-29 | ルネサスエレクトロニクス株式会社 | 半導体装置及び温度センサ |
JP7190323B2 (ja) * | 2018-10-19 | 2022-12-15 | 日立Astemo株式会社 | 電池監視装置 |
Citations (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005274372A (ja) | 2004-03-25 | 2005-10-06 | Chofu Seisakusho Co Ltd | 温度検出装置 |
US7173429B2 (en) * | 2003-12-12 | 2007-02-06 | Power Designers, Llc | Activity-based battery monitor with a universal current measuring apparatus |
US20080036425A1 (en) * | 2006-08-10 | 2008-02-14 | Sony Corporation | Battery device |
JP2008111761A (ja) | 2006-10-31 | 2008-05-15 | Sanyo Electric Co Ltd | 温度検出装置 |
US20080122400A1 (en) * | 2006-11-27 | 2008-05-29 | Matsushita Electric Works Ltd. | Charger |
US20080238356A1 (en) * | 2007-03-26 | 2008-10-02 | Batson David C | Portable energy storage and charging device |
US20100188050A1 (en) * | 2007-06-11 | 2010-07-29 | Jun Asakura | Battery internal short-circuit detection apparatus and method, and battery pack |
US20100188048A1 (en) * | 2007-06-22 | 2010-07-29 | Hajime Nishino | Nonaqueous secondary battery, battery pack, power supply system, and electrical device |
US20130175994A1 (en) * | 2012-01-11 | 2013-07-11 | Lapis Semiconductor Co., Ltd. | Battery residual amount measurement system, computer-readable medium storing battery residual amount measurement program, and battery residual amount measurement method |
US20130234658A1 (en) * | 2012-03-12 | 2013-09-12 | Renesas Electronics Corporation | Wireless charging circuit, wireless charging system and semiconductor device |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2530950B2 (ja) * | 1991-07-20 | 1996-09-04 | 株式会社ピーエフユー | Adコンバ―タを用いたサ―ミスタ温度検出装置 |
JP4722475B2 (ja) * | 2004-12-28 | 2011-07-13 | ルネサスエレクトロニクス株式会社 | バッテリ認証回路、バッテリパック、および携帯型電子機器 |
CN202395505U (zh) * | 2011-12-12 | 2012-08-22 | 宁波汉浦工具有限公司 | 电池充电电路 |
CN103178305B (zh) * | 2011-12-21 | 2016-07-13 | 北京科易动力科技有限公司 | 智能电池 |
-
2014
- 2014-07-15 JP JP2014145250A patent/JP6313150B2/ja active Active
-
2015
- 2015-07-14 US US14/798,654 patent/US10320039B2/en active Active
- 2015-07-15 CN CN201510416861.2A patent/CN105280971B/zh active Active
Patent Citations (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7173429B2 (en) * | 2003-12-12 | 2007-02-06 | Power Designers, Llc | Activity-based battery monitor with a universal current measuring apparatus |
JP2005274372A (ja) | 2004-03-25 | 2005-10-06 | Chofu Seisakusho Co Ltd | 温度検出装置 |
US20080036425A1 (en) * | 2006-08-10 | 2008-02-14 | Sony Corporation | Battery device |
JP2008111761A (ja) | 2006-10-31 | 2008-05-15 | Sanyo Electric Co Ltd | 温度検出装置 |
US20080122400A1 (en) * | 2006-11-27 | 2008-05-29 | Matsushita Electric Works Ltd. | Charger |
US20080238356A1 (en) * | 2007-03-26 | 2008-10-02 | Batson David C | Portable energy storage and charging device |
US20100188050A1 (en) * | 2007-06-11 | 2010-07-29 | Jun Asakura | Battery internal short-circuit detection apparatus and method, and battery pack |
US20100188048A1 (en) * | 2007-06-22 | 2010-07-29 | Hajime Nishino | Nonaqueous secondary battery, battery pack, power supply system, and electrical device |
US20130175994A1 (en) * | 2012-01-11 | 2013-07-11 | Lapis Semiconductor Co., Ltd. | Battery residual amount measurement system, computer-readable medium storing battery residual amount measurement program, and battery residual amount measurement method |
US20130234658A1 (en) * | 2012-03-12 | 2013-09-12 | Renesas Electronics Corporation | Wireless charging circuit, wireless charging system and semiconductor device |
Also Published As
Publication number | Publication date |
---|---|
JP6313150B2 (ja) | 2018-04-18 |
CN105280971B (zh) | 2019-08-13 |
JP2016020870A (ja) | 2016-02-04 |
US20160018474A1 (en) | 2016-01-21 |
CN105280971A (zh) | 2016-01-27 |
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