TWM583048U - Lens quality detecting device and system thereof - Google Patents

Abstract

A lens quality detecting device and a system thereof, comprising a loading platform and a lens quality detecting device, wherein the loading platform forms at least a consistent hole, and at least one lens to be tested is correspondingly disposed in the through hole, and the lens quality detecting device is correspondingly disposed. On the side of the stage, the lens quality detecting device includes a frame body, a pattern generating device and a lens module. The pattern generating device is disposed on the frame body and has a substrate and at least one light emitting unit. The unit is disposed on the substrate, and the pattern generating device is configured to provide a pattern light beam. The lens module is disposed on the frame body and disposed above the pattern generating device, and the lens module has one end and the light emitting unit. The unit corresponds to and receives the pattern beam and transmits it to the other end of the lens module and then to the lens to be tested.

Description

Lens quality detecting device and system thereof

The present invention relates to a lens quality detecting device and a system thereof, and more particularly to a lens quality detecting device and a system thereof which can greatly increase the convenience of detection and avoid damage caused by collision of a pattern generating device.

As the size of the lens module is shrinking, the traditional lens test machine will encounter a detection bottleneck when testing. Referring to FIG. 1 , which is a conventional lens quality detecting system 1 , the back focus of the wafer level lens module 10 is shorter than that of the conventional lens module, and the size is much smaller than that of the conventional lens module, so the conventional When the lens test machine 11 optically tests the wafer level lens module 10, the convex portion 120 of the pattern generating device 12 needs to enter the through hole 13 to project the pattern light beam 14, so that the pattern generating device 12 is easily collided. The left and right sides of the lens test machine 11 are caused to cause damage to the pattern generating device 12.

In addition, if it is necessary to detect the next lens module 10 to be tested, the lens testing machine 11 is first moved away from the pattern generating device 12, and then the head testing machine 11 is horizontally moved to the next lens module 10 to be tested. Therefore, two actions are generated during the detection process, so the detection time taken is relatively long and the detection process is also very inconvenient.

Therefore, how to solve the above problems and problems in the past, that is, the creators of the case and the relevant manufacturers engaged in this industry are eager to study the direction of improvement.

Therefore, in order to effectively solve the above problems, the main purpose of the present invention is to provide a lens quality detecting device which can greatly increase the convenience of detection.

The second objective of this creation is to provide a lens quality detecting device that can significantly shorten the detection time.

A secondary object of the present invention is to provide a lens quality detecting device that avoids damage caused by collision of a pattern generating device.

The second objective of this creation is to provide a lens quality detection system that can greatly increase the convenience of detection.

The second objective of this creation is to provide a lens quality detection system that can significantly reduce the detection time.

The second objective of the present invention is to provide a lens quality detecting system that avoids damage caused by collision of the pattern generating device.

In order to achieve the above object, the present invention provides a lens quality detecting device, which comprises a frame body and a pattern generating device and a lens module. The pattern generating device is correspondingly disposed on the frame body, and the pattern generating device has a substrate. And the at least one illuminating unit is disposed on the substrate, the pattern generating device is configured to provide a pattern light beam, and the lens module is disposed on the frame body and disposed above the pattern generating device. One end of the lens module corresponds to the light emitting unit and receives the pattern light beam and transmits the light beam to the other end of the lens module.

In order to achieve the above object, the present invention provides a lens quality detecting system, which comprises a loading stage and a lens quality detecting device, wherein the loading platform forms at least a consistent hole, and at least one lens to be tested is correspondingly received in the through hole. The lens quality detecting device is correspondingly disposed on the stage The lens quality detecting device includes a frame body and a pattern generating device and a lens module. The pattern generating device is disposed on the frame body and has a substrate and at least one light emitting unit. The light emitting unit is correspondingly disposed on the substrate. The pattern generating device is configured to provide a pattern beam, and the lens module is disposed on the frame body and disposed above the pattern generating device, and the lens module corresponds to the light emitting unit at one end and receives the image. The pattern beam is transmitted to the other end of the lens module and then transmitted to the lens to be tested.

Through the design of the structure of the present invention, when the lens to be tested is subjected to the MTF (Modulation Transfer Function) test, the lens module of the lens quality detecting device receives the pattern beam of the pattern generating device and transmits it to the image beam. After the other end of the lens module, the pattern beam is projected from the far end to the lens to be tested, and then projected onto a photosensitive device to complete the lens quality detecting operation, so that the lens module is passed through the lens module. The far-end projection method can avoid the problem that the conventional pattern generating device must protrude into the through-hole to project the pattern beam, thereby causing the pattern generating device to easily collide with the machine, and in addition, in the MTF test process In this case, there is no need to first move the stage away from the pattern generating device and then move the stage horizontally to the next lens to be tested for detection (two actions will occur), so the creation time can greatly reduce the detection time. And increase the convenience of detection.

1‧‧‧Lens quality inspection system

10‧‧‧Lens module

11‧‧‧ machine

12‧‧‧ pattern generating device

13‧‧‧Tongkong

14‧‧‧ pattern beam

2‧‧‧Lens quality inspection device

20‧‧‧ ‧ body

200‧‧‧Base

201‧‧‧ Backplane

202‧‧‧ fixed table

203‧‧‧ hole

21‧‧‧Support

210‧‧‧ Housing

22‧‧‧ protective cover

220‧‧‧ hole

23‧‧‧Loading board

24‧‧‧Adjustment

3‧‧‧ pattern generating device

30‧‧‧Substrate

31‧‧‧Lighting unit

32‧‧‧ pattern beam

4‧‧‧Lens module

40‧‧‧ first end

41‧‧‧ second end

5‧‧‧Lens quality inspection system

50‧‧‧ stage

51‧‧‧through holes

6‧‧‧Densor to be tested

7‧‧‧Photosensitive device

1 is a partial cross-sectional view of a conventional lens quality detecting device; FIG. 2 is an exploded perspective view of the creative lens quality detecting device; and FIG. 3 is a three-dimensional combined view of the creative lens quality detecting device; Is a top view of the creative lens quality inspection system; Figure 5 is a schematic diagram of the implementation of the creative lens quality detection system.

The above object of the present invention, as well as its structural and functional features, will be described in accordance with the preferred embodiments of the drawings.

Please refer to the second and third figures, which are an exploded perspective view and a three-dimensional combination diagram of the creative lens quality detecting device. As shown in the figure, a lens quality detecting device 2 includes a frame body 20 and a pattern generating device 3 and A lens module 4, the frame body 20 has a base 200 and a back plate 201 and a fixed base 202. One end of the back plate 201 is correspondingly disposed on the base 200, and the other end of the back plate 201 is fixed. The stage 202 has a hole 203 formed in the center of the fixing base 202 for arranging the lens module 4.

A support member 21 is further disposed on the base 200. The top of the support member 21 is correspondingly disposed with a receiving portion 210. The pattern generating device 3 is disposed at the receiving portion 210. The protective cover 22 is disposed on the back plate 201. Correspondingly, the pattern generating device 3 has a substrate 30 and at least one light emitting unit 31. The light emitting unit 31 is correspondingly disposed on the substrate 30. The pattern generating device 3 is configured to provide a pattern beam. 32 (refer to FIG. 5), the lens module 4 is mounted on the fixing base 202 after being installed in the hole 203, and is disposed corresponding to the pattern generating device 3. In the embodiment, the protection is provided. The cover 22 also defines a hole 220 (as shown in FIG. 3), so that the pattern beam 32 of the pattern generating device 3 is transmitted through the hole 220 to one end of the lens module 4 and then transmitted to the cover. The other end of the lens module 4.

Further, the lens module 4 has a first end 40 and a second end 41. The pattern beam 32 of the pattern generating device 3 passes through the hole 220 of the protective cover 22 and enters through the first end 40. Passed to the position of the second end 41. In the present creation, it should be noted that the mirror The head module 4 may be formed by two docking lenses facing each other, or may be composed of a relay lens. More specifically, whether it is a two-piece lens or a relay lens, the lens module The light projected by the lens in group 4 is designed as parallel light. Therefore, any parallel light projected in the lens module 4 can be included in the scope of the creation, and the frame is first described; The support member 21 is further disposed on the carrier plate 23, and the adjusting member 24 is used to adjust the carrier plate 23 to further drive and adjust the support member 21. The vertical distance of the upper pattern generating device 3 relative to the lens module 4.

Continuing to refer to Figures 4 and 5, which are top views and implementation diagrams of the inventive lens quality inspection system 5, the lens quality detection system 5 includes a stage 50 and the lens quality detecting device 2 described above, the stage The at least one lens 16 to be tested is correspondingly received in the through hole 51 and supported by the stage 50. In more detail, the lens 6 to be tested is the lens to be detected.

The carrier 50 can be selected as a metal plate or a plastic plate or a semiconductor plate or a glass plate. The through hole 51 can be formed by using lathe technology, laser processing, stamping technology, semiconductor etching or other processing. The technique of forming the through hole 51 depends on which material is selected for the machine, and is not limited to the above technology. Moreover, the width of the through hole 51 is not fixed, and this will be tested as it is to be tested. The width of the lens 6 depends on the width.

The lens quality detecting device 2 has been described in detail above, and will not be further described herein. However, the difference between the projection paths of the pattern light beams 32 and the first end 40 of the lens module 4 corresponds to After the pattern generating device 3 is opposite to the pattern light beam 32 emitted by the light emitting unit 31 of the pattern generating device 3, the pattern light beam 32 is transmitted to the lens module 4 At the second end 41, finally, it is projected to the lens 6 to be tested.

Referring to FIG. 5 again, in the MTF (Modulation Transfer Function) test, a photosensitive device 7 is disposed, and the photosensitive device 7 is located on the other side of the stage 50 for receiving and passing. The pattern beam 32 of the lens 6 to be tested is further illustrated. The first end 40 of the lens module 4 of the lens quality detecting device 2 receives the pattern beam 32 of the pattern generating device 3 and transmits the pattern beam 32 to the lens module 4. The second end 41 is then projected from the distal end onto the lens 6 to be tested. Finally, the pattern beam 32 is transmitted to the photosensitive device 7 through the lens 6 to be tested. The image quality of the lens 6 to be tested is determined by analyzing the pattern light beam 32 projected onto the photosensitive device 7. Thus, the far-end projection mode of the lens module 4 can prevent the conventional pattern generating device 3 from reaching. When the through hole 51 is projected by the pattern light beam 32, the pattern generating device 3 easily collides with the damage caused by the machine table. In addition, during the MTF test, the stage 50 does not need to be moved away from the pattern. After generating device 3, re-water Mobile stage 50 as well as the next test shot 6 for testing (two actions will produce) and spent time caused problems, so this creation can significantly reduce the detection time and increase the detection convenience.

As described above, the present invention has the following advantages as compared with the conventional ones: 1. greatly increasing the convenience of detection; 2. greatly shortening the detection time; 3. avoiding the damage caused by the collision of the pattern generating device.

The above description has been made in detail, but the above is only a preferred embodiment of the present invention. When it is not possible to limit the scope of the creation of the creation, that is, the equivalent change and modification according to the scope of the present application. Etc., should still be covered by the patents of this creation.

Claims (9)

A lens quality detecting device includes: a frame body; a pattern generating device correspondingly disposed on the frame body, the pattern generating device having a substrate and at least one light emitting unit, wherein the light emitting unit is correspondingly disposed on the substrate The pattern generating device is configured to provide a pattern beam; and a lens module correspondingly disposed on the frame body and disposed above the pattern generating device, the lens module having one end corresponding to the light emitting unit and Receiving the pattern beam and transmitting it to the other end of the lens module. The lens quality detecting device of claim 1, wherein the lens module is formed by two opposite objective lenses or a relay lens. The lens quality detecting device of claim 1, wherein the lens module further has a first end and a second end, and the pattern beam enters from the first end and is transmitted to the second end. The lens quality detecting device of claim 1, wherein the frame body has a base, a back plate and a fixed table, and one end of the back plate is disposed on the base, and the fixed end is disposed at the other end of the back plate. The fixing base is formed with a hole, and the lens module is disposed in the hole. The lens quality detecting device of claim 4, wherein the frame body further has a support member and a protective cover, the support member is disposed on the base and correspondingly has a receiving portion at a top thereof, and the pattern generating device corresponds to The protective cover is disposed on the backing plate and correspondingly covers the top of the support member. The lens quality detecting device of claim 5, wherein the frame body further has at least one carrier plate and at least one adjusting member, the supporting member is correspondingly disposed on the carrier plate, and the adjusting member is used for adjusting the bearing board. A lens quality detecting system includes: a carrier that forms at least a consistent hole, at least one lens to be tested is correspondingly received in the through hole; and a lens quality detecting device correspondingly disposed on the stage On one side, the lens quality detecting device includes: a frame body; a pattern generating device correspondingly disposed on the frame body, the pattern generating device having a substrate and at least one light emitting unit, wherein the light emitting unit is correspondingly disposed on the frame On the substrate, the pattern generating device is configured to provide a pattern beam; and a lens module is disposed on the frame body and disposed above the pattern generating device, and one end of the lens module is opposite to the light emitting unit Corresponding and receiving the pattern beam is transmitted to the other end of the lens module and then transmitted to the lens to be tested. The lens quality detecting system of claim 7, wherein the lens module is formed by two objects connected opposite to each other or a relay lens. The lens quality detecting system of claim 7, wherein the lens module further has a first end and a second end, wherein the pattern beam enters from the first end and is transmitted to the second end. Passed to the lens to be tested.