TWM512210U - Chip implantation conductive platen structure - Google Patents
Chip implantation conductive platen structure Download PDFInfo
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- TWM512210U TWM512210U TW104207024U TW104207024U TWM512210U TW M512210 U TWM512210 U TW M512210U TW 104207024 U TW104207024 U TW 104207024U TW 104207024 U TW104207024 U TW 104207024U TW M512210 U TWM512210 U TW M512210U
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Description
本新型涉及一種半導體製程設備,尤指將晶片壓入膠板之技術範疇。 The present invention relates to a semiconductor process equipment, and more particularly to the technical field of pressing a wafer into a rubber sheet.
請參閱圖7及圖8所示,按一般被動元件須經過沾銀製程,通常係預先將晶片5經由晶片植入機植入於一膠板6上,然後再將該膠板6裝入於沾銀機上進行沾銀作業。 Referring to FIG. 7 and FIG. 8 , the general passive component is subjected to a silver plating process, and the wafer 5 is usually implanted on a rubber sheet 6 via a wafer implanter, and then the rubber sheet 6 is loaded into the passive sheet 6 . Dip the silver on the silver machine.
又進行晶片5植入於該膠板6作業時,通常係將一習用植入板7係裝置於機台的下方/上方、一習用壓盤8係裝置於機台的上方/下方,且該植入板7、壓盤8分別設有定位裝置72、容置孔71、81,且該植入板7的容置孔71經震動裝置後分別預先安置有晶片5,然後將空的膠板6置放在該植入板7上,經該植入板7、壓盤8藉由其定位裝置精準閉合夾持該空的膠板6後,機台的針床上的複數支沖針9得套入於該植入板7所對應的容置孔71內,進而將各晶片5沖推於該膠板6所設的夾制孔內61。 When the wafer 5 is implanted in the rubber sheet 6, the conventional implanting plate 7 is usually arranged below/above the machine table, and a conventional pressure plate 8 is mounted above/below the machine table, and The implanting plate 7 and the pressure plate 8 are respectively provided with a positioning device 72, a receiving hole 71, 81, and the receiving hole 71 of the implanting plate 7 is pre-positioned with the wafer 5 after the shaking device, and then the empty rubber plate is placed. 6 placed on the implant plate 7, through the implant plate 7, the platen 8 is accurately closed by the positioning device to clamp the empty rubber plate 6, the plurality of punch needles 9 on the needle bed of the machine table The accommodating holes 71 corresponding to the implanting plate 7 are inserted into the accommodating holes 71 corresponding to the implanting plate 7, and the wafers 5 are pushed into the pinning holes 61 provided in the rubber plate 6.
而上述植入板7、壓盤8的容置孔71、81通常係一體式板體70、80由機械式鑽孔加工而成,然鑑於被動元件於未來有越來越細小之趨勢,將不利於該一體式板體70、80上,以刀具作鑽孔加工。縱使可用刀具鑽孔加工,該刀具必定分常細小並為特殊材質所製成,且為達容置孔71、81所需的位置精度,亦得特別注意位置精度問題,導致該容置孔71、81的加工成本非常高昂。 The accommodating holes 71 and 81 of the above-mentioned implanted plate 7 and platen 8 are usually formed by mechanical drilling of the integrated plate bodies 70 and 80. However, in view of the increasingly small trend of passive components in the future, It is not conducive to the drilling of the tool on the integrated plate body 70, 80. Even if the tool can be drilled, the tool must be divided into small and special materials, and the positional accuracy required for the holes 71 and 81 is required. Special attention should be paid to the positional accuracy problem, resulting in the receiving hole 71. The processing cost of 81 is very high.
鑑於上述習用一體式植入板7、壓盤8的容置孔71、81的加工困難 的問題點,於是本新型創作人用心開發出一種晶片植入導壓盤結構,故本新型的主要目的在於提供加工容易、低製造成本、孔位準確致沖針不易折斷之晶片植入導壓盤結構,據以提供更細小、更多的晶片植入,以符合被動元件晶片微細化之趨勢。 In view of the above-mentioned conventional integrated implant plate 7, the processing holes 71, 81 of the platen 8 are difficult to process The problem is that the creator of the present invention has developed a wafer-embedded pressure-conducting disk structure. Therefore, the main purpose of the present invention is to provide a wafer implantation pressure guide which is easy to process, has a low manufacturing cost, and has an accurate hole position and is not easily broken. The disc structure is designed to provide a smaller, more wafer implant to conform to the trend of passive component wafer miniaturization.
為達上述目的,本新型運用如下技術手段:一種晶片植入導壓盤結構,係包含有:一種晶片植入導壓盤結構,係運用於數個晶片壓入於一膠板之用途,其特徵在於:該導壓盤係由複數層板體所構成,且該各層板體係更包含有複數個層貫通孔,又各層板體的層貫通孔互為相對應,且各層貫通孔係經由蝕刻加工而成,致該互為相對應的層貫通孔則形成一容置孔。進而使該導壓盤的各容置孔微細化,提供更細小、更多的晶片置入,以利後續的晶片沾銀作業。 In order to achieve the above object, the present invention utilizes the following technical means: a wafer-embedded pressure-conducting disk structure includes: a wafer-embedded pressure-conducting disk structure for use in pressing a plurality of wafers into a rubber sheet, The pressure guiding plate is composed of a plurality of layers, and the layer system further comprises a plurality of layer through holes, and the layer through holes of each layer correspond to each other, and the through holes of each layer are etched. The processing is formed such that the corresponding layer through holes form a receiving hole. Further, each of the receiving holes of the pressure guiding plate is made finer, thereby providing a finer and more wafer placement, so as to facilitate the subsequent wafer silvering operation.
上述該導壓盤的複數個容置孔係形成複數個容置區域,又該複數個容置區域之間形成有複數個第一非容置區域,又該導壓盤的各容置區域形成有複數個第二非容置區域,俾利於將複數個固定孔、結合孔第一定位裝置或/及第二定位裝置則可設於這些非容置區域上。 The plurality of accommodating holes of the pressure guiding disk form a plurality of accommodating regions, and a plurality of first non-accommodating regions are formed between the plurality of accommodating regions, and each accommodating region of the pressure guiding plate is formed. There are a plurality of second non-receiving regions, and the plurality of fixing holes, the coupling holes, the first positioning device or the second positioning device can be disposed on the non-receiving regions.
上述該導壓盤的容置孔設為直孔狀,據以俾供容納晶片,進而形成本新型的壓盤;而該壓盤的二側且位於該第一非容置區域係分別設有一第一定位裝置。 The accommodating hole of the pressure guiding plate is formed in a straight hole shape, and the lining is used to accommodate the wafer, thereby forming the pressure plate of the present invention; and the two sides of the pressure plate are respectively disposed in the first non-accommodating area. First positioning device.
上述該導壓盤的容置孔設為含一第一錐部、一第二錐部的階級狀,據以俾供容納且乘載晶片,而該容置孔的下方得供沖針插入,進而形成本新型的導引盤;而該導引盤的二側且位於該第一非容置區域係分別設有一第二定位裝置,俾利將該第二定位裝置對應上述壓盤的第一定位裝置,以利該壓盤的各容置孔對準該導引孔的容置孔。 The accommodating hole of the pressure guiding disc is formed in a shape including a first tapered portion and a second tapered portion. According to the cymbal, the accommodating hole is accommodated and the wafer is loaded, and the accommodating needle is inserted under the accommodating hole. Forming the guide disc of the present invention; and the second non-receiving area of the guide disc is respectively provided with a second positioning device, and the second positioning device is corresponding to the first of the platen The positioning device is configured to align the receiving holes of the pressure plate with the receiving holes of the guiding hole.
上述該導引盤的第二定位裝置係更包含有一上定位柱、一下定位 柱,且該上定位柱、下定位柱係呈一距離差之態樣,俾利將該導引盤定位置放於機台的針床上。 The second positioning device of the guiding disc further comprises an upper positioning post and a lower positioning The column, and the upper positioning column and the lower positioning column are in a distance difference manner, and the positioning position of the guiding plate is placed on the needle bed of the machine table.
〔本新型〕 [This new type]
A‧‧‧導引盤 A‧‧‧Guide
B‧‧‧壓盤 B‧‧‧ Platen
1‧‧‧盤體 1‧‧‧ dish
11‧‧‧容置區域 11‧‧‧Receiving area
12a、12b‧‧‧容置孔 12a, 12b‧‧‧ accommodating holes
121‧‧‧第一錐部 121‧‧‧First cone
122‧‧‧第二錐部 122‧‧‧Second cone
123‧‧‧階級部 123‧‧‧Class Department
13‧‧‧第一非容置區域 13‧‧‧First non-receiving area
131‧‧‧固定孔 131‧‧‧Fixed holes
132a、132b‧‧‧結合孔 132a, 132b‧‧‧ bonding holes
14‧‧‧第二非容置區域 14‧‧‧Second non-receiving area
2‧‧‧層板體 2‧‧‧layer
21‧‧‧層貫通孔 21‧‧‧layer through hole
22‧‧‧層結合孔 22‧‧‧layer bonding holes
23‧‧‧層固定孔 23‧‧‧layer fixing holes
3‧‧‧第一定位裝置 3‧‧‧First positioning device
4‧‧‧第二定位裝置 4‧‧‧Second positioning device
41‧‧‧上定位柱 41‧‧‧Upper positioning column
42‧‧‧下定位柱 42‧‧‧ positioning column
〔習知〕 [study]
5‧‧‧晶片 5‧‧‧chip
6‧‧‧膠板 6‧‧‧ Rubber board
61‧‧‧夾制孔內 61‧‧‧In the hole
7‧‧‧植入板 7‧‧‧ implanted board
70‧‧‧一體式板體 70‧‧‧Integrated board
71‧‧‧容置孔 71‧‧‧ accommodating holes
72‧‧‧定位裝置 72‧‧‧ Positioning device
8‧‧‧壓盤 8‧‧‧ Platen
80‧‧‧一體式板體 80‧‧‧Integrated board
81‧‧‧容置孔 81‧‧‧ accommodating holes
9‧‧‧沖針 9‧‧‧punching needle
圖1:係為本新型導引盤結構之立體外觀圖。 Figure 1 is a perspective view of the structure of the novel guide disk.
圖2:係為本新型導引盤結構之側視圖及其俯視、局部剖視圖。 Figure 2 is a side view of the novel guide disc structure and its top, partial cross-sectional view.
圖3:係為本新型導引盤結構的容置孔之組合剖面放大圖。 Figure 3 is an enlarged cross-sectional view showing the combination of the receiving holes of the novel guide disk structure.
圖4:係為本新型壓盤結構之側視圖及其俯視圖。 Figure 4: is a side view of the new platen structure and its top view.
圖5:係為本新型壓盤結構固定孔之組合剖面放大圖。 Fig. 5 is an enlarged sectional view showing a combination of fixing holes of the new platen structure.
圖6:係為本新型壓盤結構容置孔之組合剖面放大圖。 Figure 6 is an enlarged cross-sectional view showing the combination of the receiving holes of the new platen structure.
圖7:係為習知導引盤結構之立體外觀圖。 Figure 7 is a perspective view of a conventional guide disc structure.
圖8:係為習用導引盤結構將晶片植入於膠板內之示意圖。 Figure 8 is a schematic illustration of a conventional guide disk structure for implanting a wafer into a rubber sheet.
本新型係關於一種晶片植入導壓盤結構,基本上係可作為一導引盤A或一壓盤B之用途,如圖1至圖3所示者,係為一導引盤A,而圖4至圖7所示者,係為一壓盤B,且該導引盤A配合該壓盤B,如先前技術所揭露晶片植入作業模式,而將複數個晶片植入於膠板後,便可將該複數個晶片進行後續的沾銀作業。 The present invention relates to a wafer implantation pressure guiding disc structure, which can basically be used as a guiding disc A or a pressing disc B. As shown in FIG. 1 to FIG. 3, it is a guiding disc A, and 4 to FIG. 7 is a platen B, and the guide disk A is engaged with the platen B. As in the prior art, the wafer implantation operation mode is disclosed, and after the plurality of wafers are implanted in the rubber plate, The plurality of wafers can be subjected to subsequent silver staining operations.
其中該導引盤A,如圖2及圖3所示,係由複數個層板體2疊置而成,而該層板體2係預先蝕刻有複數個層貫通孔21、層結合孔22,而該複數個層貫通孔21數量較多,進而聚集成複數個容置區域,而未有蝕刻成孔的區域則為非容置區域,而每個層板體2基本上設有四個層結合孔22,再將該數個層板體2精準對位疊置結合而成該導引盤A。 The guide plate A, as shown in FIG. 2 and FIG. 3, is formed by stacking a plurality of laminated bodies 2, and the laminated body 2 is pre-etched with a plurality of layer through holes 21 and layer bonding holes 22 in advance. The plurality of layer through holes 21 are more in number, and then aggregate into a plurality of accommodating regions, and the regions not etched into holes are non-accommodating regions, and each of the layer plates 2 is basically provided with four The layer is combined with the hole 22, and the plurality of layer plates 2 are accurately aligned and stacked to form the guide disk A.
故將該導引盤A的複數個容置孔12a係形成複數個容置區域11,又該複數個容置區域11之間形成有複數個第一非容置區域13,又該導引盤A的各容置區域11範圍內形成有複數個第二非容置區域14,俾利於將複數個固定孔131、第二定位裝置4則可設於這些非容置區域上。 Therefore, the plurality of accommodating holes 12a of the guide disk A are formed into a plurality of accommodating regions 11, and a plurality of first non-receiving regions 13 are formed between the plurality of accommodating regions 11, and the guiding disk is further formed. A plurality of second non-receiving regions 14 are formed in each of the accommodating regions 11 of the A, so that the plurality of fixing holes 131 and the second positioning device 4 can be disposed on the non-receiving regions.
因此,各層板體2的層貫通孔21則形成該導引盤A的容置孔12a,而各層板體2的層結合孔22則形成各導引盤A的結合孔132a,其中該四個結合孔132a均為直孔俾供分別套入於一第二定位裝置4的二上定位柱41、二下定位柱42(如圖2所示),且該上定位柱41、下定位柱42係呈一距離差之態樣,俾利將該導引盤定位置放於機台的針床上。特別一提,該各層板體2的層結合孔22大小不一致,如圖3所示者,乃至有些係為錐孔,進而使該容置孔12a形成一第一錐部121、一第二錐部122及一階級部123,其中該第一錐部121俾利於晶片震入於該階級部123內,而該第二錐部122則係配合針床的沖針形狀,以利沖針致動晶片於該膠板內。 Therefore, the layer through holes 21 of the respective plate bodies 2 form the receiving holes 12a of the guide disk A, and the layer bonding holes 22 of the respective plate bodies 2 form the coupling holes 132a of the respective guide disks A, wherein the four The coupling holes 132a are straight holes for respectively inserting into the two upper positioning posts 41 and the two lower positioning posts 42 of the second positioning device 4 (as shown in FIG. 2 ), and the upper positioning posts 41 and the lower positioning posts 42 . In the case of a distance difference, the guide plate is placed on the needle bed of the machine. In particular, the layer bonding holes 22 of the respective layer bodies 2 are inconsistent in size, as shown in FIG. 3, and some are tapered holes, so that the receiving holes 12a form a first tapered portion 121 and a second tapered portion. The portion 122 and the first portion 123, wherein the first tapered portion 121 facilitates the shaking of the wafer into the step portion 123, and the second tapered portion 122 is matched with the shape of the needle of the needle bed to facilitate the needle actuation. The wafer is inside the rubber sheet.
其中該壓盤B,如圖4至圖6所示者,係由複數個層板體2疊置而成,而該層板體2係預先蝕刻有複數個層貫通孔21、層結合孔22、層固定孔23,而該複數個層貫通孔21數量較多,進而聚集成複數個容置區域,而未有蝕刻成孔的區域則為非容置區域,而每個層板體2基本上設有二個層結合孔22,再將該數個層板體2精準對位疊置結合而成該壓盤B。 The platen B, as shown in FIG. 4 to FIG. 6, is formed by stacking a plurality of laminated bodies 2, and the laminated body 2 is pre-etched with a plurality of layer through holes 21 and layer bonding holes 22 in advance. The layer fixing hole 23, and the plurality of layer through holes 21 are more in number, and then aggregated into a plurality of accommodating areas, and the area not etched into holes is a non-accommodating area, and each layer board 2 is basically Two layers of bonding holes 22 are disposed thereon, and the plurality of layer plates 2 are accurately aligned and stacked to form the platen B.
故將該壓盤B的複數個容置孔12b係形成複數個容置區域11,又該複數個容置區域11之間形成有複數個第一非容置區域13,又該壓盤B的各容置區域11內形成有複數個第二非容置區域14,俾利於將複數個固定孔131、第一定位裝置3則可設於這些非容置區域上。 Therefore, the plurality of accommodating holes 12b of the platen B are formed into a plurality of accommodating regions 11, and a plurality of first non-receiving regions 13 are formed between the plurality of accommodating regions 11, and the platen B is further A plurality of second non-receiving regions 14 are formed in each of the accommodating regions 11, so that the plurality of fixing holes 131 and the first positioning device 3 can be disposed on the non-receiving regions.
因此,各層板體2的層貫通孔21則形成該壓盤B的容置孔12b,而各層板體2的層結合孔22則形成各壓盤B的結合孔132b,其中該二個結合 孔132b均為直孔俾供分別套入於一第一定位裝置3(如圖4所示),以及各層板體2的層固定孔23係設為大、小等二種尺寸,待疊置各層板體2後進而形成該固定孔131,且該固定孔131可供螺絲頭套入(如圖5所示),而將該壓盤B裝設於機台上。特別一提,該各層板體2的層結合孔22大小一致,進而使該容置孔12b形成直孔狀(如圖6所示),以利沖針致動晶片於該膠板內。 Therefore, the layer through hole 21 of each layer 2 forms the receiving hole 12b of the platen B, and the layer bonding hole 22 of each layer 2 forms the bonding hole 132b of each platen B, wherein the two combinations The holes 132b are straight holes for being respectively inserted into a first positioning device 3 (as shown in FIG. 4), and the layer fixing holes 23 of each layer 2 are set to be large and small, and are to be stacked. The fixing hole 131 is further formed after each layer body 2, and the fixing hole 131 can be inserted into the screw head (as shown in FIG. 5), and the pressure plate B is mounted on the machine table. In particular, the layer bonding holes 22 of the respective layer bodies 2 are uniform in size, so that the receiving holes 12b are formed in a straight hole shape (as shown in FIG. 6), so that the punching needles actuate the wafer in the rubber sheet.
綜上所述,本新型晶片植入導壓盤結構,最主要該導壓盤結構係包含一導引盤A或一壓盤B,且該導引盤A或壓盤B係由複數個層板體所構成,且各層板體以蝕刻方式有複數個層貫通孔、複數個層結合孔/層固定孔,待將各層板體組裝結合成導引盤A或壓盤B時,各層板體的層貫通孔、層結合孔/層固定孔則會分別形成複數個容置孔、結合孔/固定孔,進而可達到製造成本降低、加工容易、沖針不易折斷及孔位準確之效果,據以提供更細小、更多的晶片植入,以符合被動元件晶片微細化之趨,且其構成結構未曾見於諸書刊或公開使用,誠符合新型專利申請要件,懇請 鈞局明鑑,早日准予專利,至為感禱;需陳明者,以上所述乃是本新型之具體實施例及所運用之技術原理,若依本新型之構想所作之改變,其所產生之功能作用仍未超出說明書及圖式所涵蓋之精神時,均應在本新型之範圍內,合予陳明。 In summary, the novel wafer is embedded in the pressure guiding disc structure, and the main guiding disc structure comprises a guiding disc A or a pressing disc B, and the guiding disc A or the pressing disc B is composed of a plurality of layers. The plate body is formed, and each layer plate body has a plurality of layer through holes and a plurality of layer bonding holes/layer fixing holes in an etching manner. When the plate bodies of the respective layers are assembled and combined into the guide plate A or the platen B, each layer plate body The layer through hole and the layer bonding hole/layer fixing hole respectively form a plurality of receiving holes, bonding holes/fixing holes, thereby achieving the effects of reduction in manufacturing cost, easy processing, difficulty in breaking the needle, and accurate hole position. In order to provide a smaller and more wafer implant, in order to meet the trend of miniaturization of passive component wafers, and its structure has not been seen in various books or public use, it is in line with the requirements of new patent applications, please ask the Bureau to identify, and grant patents as soon as possible. As for the praying; the need to be clear, the above is the specific embodiment of the new model and the technical principles applied, if the changes made according to the concept of the new model, the functional role produced by it does not exceed the specification and Mental time covered by , should be within the scope of this new type, combined with Chen Ming.
A‧‧‧植入導引盤 A‧‧‧ implanted guide disk
1‧‧‧盤體 1‧‧‧ dish
11‧‧‧容置區域 11‧‧‧Receiving area
13‧‧‧第一非容置區域 13‧‧‧First non-receiving area
14‧‧‧第二非容置區域 14‧‧‧Second non-receiving area
4‧‧‧第二定位裝置 4‧‧‧Second positioning device
Claims (10)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW104207024U TWM512210U (en) | 2015-05-07 | 2015-05-07 | Chip implantation conductive platen structure |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW104207024U TWM512210U (en) | 2015-05-07 | 2015-05-07 | Chip implantation conductive platen structure |
Publications (1)
Publication Number | Publication Date |
---|---|
TWM512210U true TWM512210U (en) | 2015-11-11 |
Family
ID=55219409
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW104207024U TWM512210U (en) | 2015-05-07 | 2015-05-07 | Chip implantation conductive platen structure |
Country Status (1)
Country | Link |
---|---|
TW (1) | TWM512210U (en) |
-
2015
- 2015-05-07 TW TW104207024U patent/TWM512210U/en unknown
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