TWM433634U - Semiconductor substrate - Google Patents

Semiconductor substrate

Info

Publication number
TWM433634U
TWM433634U TW101205295U TW101205295U TWM433634U TW M433634 U TWM433634 U TW M433634U TW 101205295 U TW101205295 U TW 101205295U TW 101205295 U TW101205295 U TW 101205295U TW M433634 U TWM433634 U TW M433634U
Authority
TW
Taiwan
Prior art keywords
semiconductor substrate
external connecting
conductive
slanting
overcoming
Prior art date
Application number
TW101205295U
Other languages
English (en)
Inventor
Dyi-Chung Hu
Ying-Chih Chan
Jiun-Ting Lin
Original Assignee
Unimicron Technology Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Unimicron Technology Corp filed Critical Unimicron Technology Corp
Priority to TW101205295U priority Critical patent/TWM433634U/zh
Publication of TWM433634U publication Critical patent/TWM433634U/zh
Priority to US13/753,906 priority patent/US20130249083A1/en

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
    • H01L23/498—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
    • H01L23/49811—Additional leads joined to the metallisation on the insulating substrate, e.g. pins, bumps, wires, flat leads
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10—Bump connectors; Manufacturing methods related thereto
    • H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
    • H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
    • H01L2224/161—Disposition
    • H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/16225—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
    • H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
    • H01L2224/321—Disposition
    • H01L2224/32151—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/32221—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/32225—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732—Location after the connecting process
    • H01L2224/73201—Location after the connecting process on the same surface
    • H01L2224/73203—Bump and layer connectors
    • H01L2224/73204—Bump and layer connectors the bump connector being embedded into the layer connector
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
    • H01L23/498—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
    • H01L23/49811—Additional leads joined to the metallisation on the insulating substrate, e.g. pins, bumps, wires, flat leads
    • H01L23/49816—Spherical bumps on the substrate for external connection, e.g. ball grid arrays [BGA]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
    • H01L23/498—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
    • H01L23/49822—Multilayer substrates
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
    • H01L23/498—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
    • H01L23/49827—Via connections through the substrates, e.g. pins going through the substrate, coaxial cables
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151—Die mounting substrate
    • H01L2924/153—Connection portion
    • H01L2924/1531—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
    • H01L2924/15311—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a ball array, e.g. BGA

Landscapes

  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Production Of Multi-Layered Print Wiring Board (AREA)
  • Photovoltaic Devices (AREA)
TW101205295U 2012-03-23 2012-03-23 Semiconductor substrate TWM433634U (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
TW101205295U TWM433634U (en) 2012-03-23 2012-03-23 Semiconductor substrate
US13/753,906 US20130249083A1 (en) 2012-03-23 2013-01-30 Packaging substrate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW101205295U TWM433634U (en) 2012-03-23 2012-03-23 Semiconductor substrate

Publications (1)

Publication Number Publication Date
TWM433634U true TWM433634U (en) 2012-07-11

Family

ID=49211036

Family Applications (1)

Application Number Title Priority Date Filing Date
TW101205295U TWM433634U (en) 2012-03-23 2012-03-23 Semiconductor substrate

Country Status (2)

Country Link
US (1) US20130249083A1 (zh)
TW (1) TWM433634U (zh)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI483365B (zh) * 2012-09-26 2015-05-01 財團法人工業技術研究院 封裝基板及其製法
TWI487436B (zh) * 2013-05-10 2015-06-01 欣興電子股份有限公司 承載基板及其製作方法
TWI552290B (zh) * 2014-04-22 2016-10-01 矽品精密工業股份有限公司 封裝基板及其製法
TWI569365B (zh) * 2014-09-30 2017-02-01 欣興電子股份有限公司 封裝基板與其製造方法
US9780022B2 (en) 2015-07-15 2017-10-03 Phoenix Pioneer Technology Co., Ltd. Substrate structure
TWI616981B (zh) * 2015-07-15 2018-03-01 恆勁科技股份有限公司 基板結構
TWI620274B (zh) * 2015-07-15 2018-04-01 恆勁科技股份有限公司 基板結構之製作方法
US10354969B2 (en) 2017-07-31 2019-07-16 Advanced Semiconductor Engineering, Inc. Substrate structure, semiconductor package including the same, and method for manufacturing the same

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015162660A (ja) * 2014-02-28 2015-09-07 イビデン株式会社 プリント配線板、プリント配線板の製造方法、パッケージ−オン−パッケージ
US10332757B2 (en) * 2017-11-28 2019-06-25 Advanced Semiconductor Engineering, Inc. Semiconductor device package having a multi-portion connection element
CN112885806B (zh) * 2019-11-29 2022-03-08 长鑫存储技术有限公司 基板及其制备方法、芯片封装结构及其封装方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100861619B1 (ko) * 2007-05-07 2008-10-07 삼성전기주식회사 방열 인쇄회로기판 및 그 제조방법
SG148054A1 (en) * 2007-05-17 2008-12-31 Micron Technology Inc Semiconductor packages and method for fabricating semiconductor packages with discrete components
JP5134899B2 (ja) * 2007-09-26 2013-01-30 三洋電機株式会社 半導体モジュール、半導体モジュールの製造方法および携帯機器
US9018758B2 (en) * 2010-06-02 2015-04-28 Taiwan Semiconductor Manufacturing Company, Ltd. Cu pillar bump with non-metal sidewall spacer and metal top cap
US8653658B2 (en) * 2011-11-30 2014-02-18 Taiwan Semiconductor Manufacturing Company, Ltd. Planarized bumps for underfill control

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI483365B (zh) * 2012-09-26 2015-05-01 財團法人工業技術研究院 封裝基板及其製法
TWI487436B (zh) * 2013-05-10 2015-06-01 欣興電子股份有限公司 承載基板及其製作方法
US9661761B2 (en) 2013-05-10 2017-05-23 Unimicron Technology Corp. Carrier substrate and manufacturing method thereof
TWI552290B (zh) * 2014-04-22 2016-10-01 矽品精密工業股份有限公司 封裝基板及其製法
TWI569365B (zh) * 2014-09-30 2017-02-01 欣興電子股份有限公司 封裝基板與其製造方法
US9780022B2 (en) 2015-07-15 2017-10-03 Phoenix Pioneer Technology Co., Ltd. Substrate structure
TWI616981B (zh) * 2015-07-15 2018-03-01 恆勁科技股份有限公司 基板結構
TWI620274B (zh) * 2015-07-15 2018-04-01 恆勁科技股份有限公司 基板結構之製作方法
US10354969B2 (en) 2017-07-31 2019-07-16 Advanced Semiconductor Engineering, Inc. Substrate structure, semiconductor package including the same, and method for manufacturing the same

Also Published As

Publication number Publication date
US20130249083A1 (en) 2013-09-26

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Legal Events

Date Code Title Description
MM4K Annulment or lapse of a utility model due to non-payment of fees