M362407 五、新型說明： 【新型所屬之技術領域】 本創作係有關一種電路板檢測探針結構改良，尤指_種藉由 將探針頂端與電路板待測線路相接觸部份製成一字或十字形接觸 部以增加兩者間之接觸性及穩定性，而可提升探針檢測時之精確 度者。 【先前技術】 一般的印刷電路板測試，通常係藉由一專用治具予以檢測 以確認該電路板上之線路是否異常。對於此種習知且已廣泛應用 之測試方法而言，由於探針係直接與欲測試之電路板線路接觸之 轉’因此探針的結構通常是決定電路板測試經破度之癥結所在 尤其面對製造日益精密之電路板，測試探針也相對需製造得更為 細小。-般傳統使用的檢聰針如第—騎示，其頂養製成爪形 尖刺狀’當其與·板上制祕接_，制雜_端之爪 形尖刺與電路板之待猶路域狀_，其接雜較差，將影響 測試之精確度，此外，電職祕上之賴紐銅層與檢測探頂 端接觸時，可能會有部份脫落喊生賴屑，並積聚於該探 針爪形尖綱試 r:::r者，其雖可解決探針頂端積聚錫:或= …’路板上之線路接觸時，亦為點狀接觸，喊接觸性 且谷易偏離而影響測試之精密度者 M362407 緣此，本創作人、贷 /木感傳統習用之電路板檢測探針結構，仍存 有許多缺失有触進，领乡年練事⑽項產綠計製造上^ ^驗’「細研思料岐進，終於輯卜種_合使用者需 求之電路板檢測探針結構改良」者。 【新型内容】 ° 本創作t路板檢測探針結構改良」之主要設計目的係在提 供種藉由將探針頂端與電路板待測線路相接觸部份製造成一字 或十子形細部叫㈣相之翻性及敎性，錄電路板線 路上所脫落之則_射由嫌麻狀—字斜字形接觸部 接觸部側邊所形成之弧科贿iH，而可概提制試精確度之 結構者。 【實施方式】 請參閱第二圖，本創作係有關一種電路板檢測探針結構改良， 該檢測探針(1)係裝餅電路板制治具巾，職檢測電路板線路 是否異常者。以第三圖為例，該電路板檢測治具係由針座〇、探 針定位板(3)、導線固定板(4)、彈簧（5)及導線(6)所組成。針座 (2)、探針定位板(3)及導線固定板(4)上設有與電路板(7)上待測 點相對應之針孔(21)、定位孔(31)及線孔(41)，其中線孔(41)直 徑小於彈簧⑸直徑並可供導線⑹穿過者。彈簧⑸係分別裝設於 針孔(21)内，導線(6)—端與彈簧（5)底部連接，另一端由導線固 定板(4)之線孔(41)穿出而連接至測試設備，檢測探針（丨）則置於 M362407 彈簧（5)頂端，其穿過探針定位板⑶之定位孔⑽後，與電路板 (7)上之待測點接觸而可將測試訊號經由導線傳送至測試設備，以 檢測電路板上之線路是否異常者。 本創作之制騎(1)猶與電路板⑺上之制點相接觸部 份係製成-字雜卿⑴），該—字形接觸部⑴）兩_形成向 下連接至探針周緣之弧形導槽（⑴），當檢聰針⑴藉由彈菁⑸ 之彈力上頂而與電雜⑺上之制點接觸時，其猶之―字形接 馨觸部（11)與電路板⑺上之制點兩者間為線狀鋪因此具有較 佳之細性及穩定性，可有效提升該探針檢測時之精確度。又檢測 探針(1)與電路板(7)上之待測點接觸時，t路板⑺待測點線路上 之鑛錫層或_層可齡有部份贿，顧落之闕或銅屑係可 沿檢測探針(1)之—字形接卿（⑴兩侧之_導槽（丨⑴滑落， 不致積聚於該檢測探針(1)頂端而影響測試結果者。 • 第四_示係補狀另—實_，該檢_針⑴頂端係可 製成-十字形接觸部⑽，該十字形接觸部⑽婦則形成向下 之導槽（121)，使該檢測探針⑴與電路板⑺上之待測點接觸時， 可提供更佳的接觸性及穩定性，同時可使電路板線路上所脫落之 錫屑或銅屑沿該導槽（121)滑落以增加測試之精確度者 上述僅為本創作之較佳實施例’並非用以限制本創作，任何 依據本創叙構想顺之改變，在賴離摘作之精神範圍内， 對於各種變化、修飾與應用所產生的等效作用，均包含於本案的 M362407 專利範圍内，合予陳明^ 【圖式簡單說明】 第一圖係傳統電路板檢測探針之立體圖 第二圖係本麟電路板檢測探針結構改良之立體圖。 第三圖係本創狀探針顧於電路板檢測治具之立體示意圖。 第四圖係本創作之另一實施例之立體圖 【主要元件符號說明】M362407 V. New Description: [New Technology Field] This is a kind of circuit board detection probe structure improvement, especially by making the word tip contact with the circuit board to be tested. Or a cross-shaped contact to increase the contact and stability between the two, and improve the accuracy of the probe detection. [Prior Art] A general printed circuit board test is usually detected by a special jig to confirm whether the circuit on the circuit board is abnormal. For such a well-known and widely used test method, since the probe is directly in contact with the circuit board to be tested, the structure of the probe is usually the most important factor in determining the breakage of the board test. For the manufacture of increasingly sophisticated boards, test probes are also relatively thinner to manufacture. - The traditionally used Detective Needle, such as the first-riding display, is raised in a claw-shaped spike shape, and when it is connected with the on-board system, the claw-shaped spike and the circuit board are prepared. Judah domain _, its poor connection, will affect the accuracy of the test, in addition, the contact of the electric copper on the top of the electric contact with the top of the detection probe, there may be part of the shattered and smashed, and accumulated in The probe claw-shaped tip test r:::r, although it can solve the problem that the tip of the probe accumulates tin: or the line on the road surface is contacted, it is also a point contact, shouting contact and valley deviation However, the M362407, which affects the precision of the test, is the result of the circuit board detection probe structure of the creator, the loan/woody tradition, and there are still many missing and touched, and the hometown practice (10) is produced on the green meter. ^ "Testing" "Thinking and thinking, and finally improving the structure of the board detection probe for user needs." [New content] ° The main purpose of the design of the t-plate detection probe is to provide a word or a ten-shaped detail by connecting the tip of the probe to the circuit to be tested. The volatility and ambiguity of the phase, the detachment of the recording circuit board _ shooting by the side of the contact area of the contact part of the slanted slant-shaped contact part of the arc bribe iH, and can improve the accuracy of the test Structure. [Embodiment] Please refer to the second figure. This author is related to the improvement of the structure of a circuit board detection probe. The detection probe (1) is equipped with a cake circuit board to make a fixture towel, and the line for detecting the circuit board is abnormal. Taking the third figure as an example, the circuit board detecting fixture is composed of a needle holder 探, a probe positioning plate (3), a wire fixing plate (4), a spring (5) and a wire (6). The needle holder (2), the probe positioning plate (3) and the wire fixing plate (4) are provided with pinholes (21), positioning holes (31) and wire holes corresponding to the points to be measured on the circuit board (7). (41), wherein the wire hole (41) has a diameter smaller than the diameter of the spring (5) and is available for the wire (6) to pass through. The springs (5) are respectively installed in the pinholes (21), the wires (6) are connected to the bottom of the spring (5), and the other end is pierced by the wire holes (41) of the wire fixing plate (4) to be connected to the test equipment. The detection probe (丨) is placed on the top of the M362407 spring (5). After passing through the positioning hole (10) of the probe positioning plate (3), it can contact the point to be tested on the circuit board (7) to pass the test signal through the wire. Transfer to the test equipment to detect if the line on the board is abnormal. The creation of this creation (1) is still made with the contact point on the circuit board (7) - the word-shaped contact (1)), and the two-shaped contact portion (1) forms an arc that is connected downward to the periphery of the probe. The guide groove ((1)), when the Detector needle (1) is in contact with the point on the electric hybrid (7) by the elastic force of the elastic phthalocyanine (5), it is still on the "shaped contact" (11) and the circuit board (7) The line between the two is linear and therefore has better fineness and stability, which can effectively improve the accuracy of the probe detection. When the detecting probe (1) is in contact with the point to be tested on the circuit board (7), the tin layer or the layer of the tin plate (7) on the line to be measured may be partially bribed, and the copper or copper may be used. The chip system can be along the detection probe (1)-shaped contact ((1) on both sides of the guide groove (丨(1) slips, does not accumulate on the top of the detection probe (1) and affects the test result. The complementary shape of the _ needle (1) can be made into a cross-shaped contact portion (10), and the cross-shaped contact portion (10) forms a downward guiding groove (121), so that the detecting probe (1) and When the points to be tested on the circuit board (7) are in contact, it can provide better contact and stability, and at the same time, the tin or copper chips falling off the circuit board can be slipped along the guide groove (121) to increase the accuracy of the test. The above is only the preferred embodiment of the present invention' is not intended to limit the creation of this creation, any change according to the concept of this creation, in the spirit of the abstract, for various changes, modifications and applications The equivalent effect is included in the scope of the M362407 patent in this case, and is combined with Chen Ming ^ [Simple description of the figure] The first picture is traditional electricity The second picture of the road board detection probe is a three-dimensional diagram of the improved structure of the detection board of the Benlin circuit board. The third picture is a three-dimensional diagram of the detection probe of the circuit board. The fourth picture is the creation of the tool. Stereoscopic view of another embodiment [main component symbol description]
(1)檢測探針 (12)十字形接觸部 (21)針孔 (4)導線定位板 (6)導線 (11) 一字形接觸部 (121)導槽 (3)探針定位板 (41)定位孔 (7)電路板 (111)弧形導槽 (2)針座 (31)定位孔 (5)彈簧(1) Detection probe (12) Cross contact (21) Pinhole (4) Wire positioning plate (6) Wire (11) Inline contact (121) Guide groove (3) Probe positioning plate (41) Positioning hole (7) circuit board (111) arcuate guide groove (2) needle seat (31) positioning hole (5) spring