TWM361634U - Testing circuit board - Google Patents
Testing circuit board Download PDFInfo
- Publication number
- TWM361634U TWM361634U TW098205849U TW98205849U TWM361634U TW M361634 U TWM361634 U TW M361634U TW 098205849 U TW098205849 U TW 098205849U TW 98205849 U TW98205849 U TW 98205849U TW M361634 U TWM361634 U TW M361634U
- Authority
- TW
- Taiwan
- Prior art keywords
- test
- circuit board
- component
- test circuit
- tested
- Prior art date
Links
- 238000012360 testing method Methods 0.000 title claims description 117
- 238000012546 transfer Methods 0.000 claims description 2
- 238000010586 diagram Methods 0.000 description 5
- 238000000034 method Methods 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 3
- 230000005540 biological transmission Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 230000008054 signal transmission Effects 0.000 description 2
- 238000013142 basic testing Methods 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000004353 relayed correlation spectroscopy Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
- G01R31/2889—Interfaces, e.g. between probe and tester
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61P—SPECIFIC THERAPEUTIC ACTIVITY OF CHEMICAL COMPOUNDS OR MEDICINAL PREPARATIONS
- A61P1/00—Drugs for disorders of the alimentary tract or the digestive system
- A61P1/14—Prodigestives, e.g. acids, enzymes, appetite stimulants, antidyspeptics, tonics, antiflatulents
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61P—SPECIFIC THERAPEUTIC ACTIVITY OF CHEMICAL COMPOUNDS OR MEDICINAL PREPARATIONS
- A61P21/00—Drugs for disorders of the muscular or neuromuscular system
- A61P21/02—Muscle relaxants, e.g. for tetanus or cramps
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61P—SPECIFIC THERAPEUTIC ACTIVITY OF CHEMICAL COMPOUNDS OR MEDICINAL PREPARATIONS
- A61P25/00—Drugs for disorders of the nervous system
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61P—SPECIFIC THERAPEUTIC ACTIVITY OF CHEMICAL COMPOUNDS OR MEDICINAL PREPARATIONS
- A61P25/00—Drugs for disorders of the nervous system
- A61P25/04—Centrally acting analgesics, e.g. opioids
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61P—SPECIFIC THERAPEUTIC ACTIVITY OF CHEMICAL COMPOUNDS OR MEDICINAL PREPARATIONS
- A61P25/00—Drugs for disorders of the nervous system
- A61P25/06—Antimigraine agents
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61P—SPECIFIC THERAPEUTIC ACTIVITY OF CHEMICAL COMPOUNDS OR MEDICINAL PREPARATIONS
- A61P25/00—Drugs for disorders of the nervous system
- A61P25/08—Antiepileptics; Anticonvulsants
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61P—SPECIFIC THERAPEUTIC ACTIVITY OF CHEMICAL COMPOUNDS OR MEDICINAL PREPARATIONS
- A61P25/00—Drugs for disorders of the nervous system
- A61P25/20—Hypnotics; Sedatives
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61P—SPECIFIC THERAPEUTIC ACTIVITY OF CHEMICAL COMPOUNDS OR MEDICINAL PREPARATIONS
- A61P25/00—Drugs for disorders of the nervous system
- A61P25/30—Drugs for disorders of the nervous system for treating abuse or dependence
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61P—SPECIFIC THERAPEUTIC ACTIVITY OF CHEMICAL COMPOUNDS OR MEDICINAL PREPARATIONS
- A61P25/00—Drugs for disorders of the nervous system
- A61P25/30—Drugs for disorders of the nervous system for treating abuse or dependence
- A61P25/32—Alcohol-abuse
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61P—SPECIFIC THERAPEUTIC ACTIVITY OF CHEMICAL COMPOUNDS OR MEDICINAL PREPARATIONS
- A61P3/00—Drugs for disorders of the metabolism
- A61P3/04—Anorexiants; Antiobesity agents
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61P—SPECIFIC THERAPEUTIC ACTIVITY OF CHEMICAL COMPOUNDS OR MEDICINAL PREPARATIONS
- A61P3/00—Drugs for disorders of the metabolism
- A61P3/08—Drugs for disorders of the metabolism for glucose homeostasis
- A61P3/10—Drugs for disorders of the metabolism for glucose homeostasis for hyperglycaemia, e.g. antidiabetics
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61P—SPECIFIC THERAPEUTIC ACTIVITY OF CHEMICAL COMPOUNDS OR MEDICINAL PREPARATIONS
- A61P43/00—Drugs for specific purposes, not provided for in groups A61P1/00-A61P41/00
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61P—SPECIFIC THERAPEUTIC ACTIVITY OF CHEMICAL COMPOUNDS OR MEDICINAL PREPARATIONS
- A61P9/00—Drugs for disorders of the cardiovascular system
- A61P9/10—Drugs for disorders of the cardiovascular system for treating ischaemic or atherosclerotic diseases, e.g. antianginal drugs, coronary vasodilators, drugs for myocardial infarction, retinopathy, cerebrovascula insufficiency, renal arteriosclerosis
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
- G01R31/31905—Interface with the device under test [DUT], e.g. arrangements between the test head and the DUT, mechanical aspects, fixture
Landscapes
- Health & Medical Sciences (AREA)
- Engineering & Computer Science (AREA)
- Bioinformatics & Cheminformatics (AREA)
- General Chemical & Material Sciences (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Veterinary Medicine (AREA)
- Public Health (AREA)
- General Health & Medical Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Animal Behavior & Ethology (AREA)
- Medicinal Chemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Organic Chemistry (AREA)
- Pharmacology & Pharmacy (AREA)
- Neurology (AREA)
- Biomedical Technology (AREA)
- Neurosurgery (AREA)
- Pain & Pain Management (AREA)
- Diabetes (AREA)
- Addiction (AREA)
- Obesity (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- General Engineering & Computer Science (AREA)
- Psychiatry (AREA)
- Hematology (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Urology & Nephrology (AREA)
- Anesthesiology (AREA)
- Child & Adolescent Psychology (AREA)
- Nutrition Science (AREA)
- Heart & Thoracic Surgery (AREA)
- Cardiology (AREA)
- Vascular Medicine (AREA)
- Endocrinology (AREA)
- Emergency Medicine (AREA)
- Orthopedic Medicine & Surgery (AREA)
- Physical Education & Sports Medicine (AREA)
Description
.M361634 五、新型說明： 【新型所屬之技術領域】 本創作係為一種測試電路板，尤指一種用來測試待測 試元件之測試電路板。 【先前技術】 為了確保積體電路（integrated circuit，1C)出貨時的品 質，在完成製造過程之後，一般都會對每一顆IC:執行測 減’製造商會依據對1C執行測試的結果，來決定此顆ic 疋否合格，並據以判斷是否可將此顆1C供應給下游的廠 商0
請參閱第1圖，第1圖所示為習知技術用來執行IC量 產測試的測試_示意圖。在此—測試架構中，係利用測 試機（細⑽）10來作為測試待測試元件（Device Under Test, DUT) 22的工具。其巾，待測試元件22可為-待測的積 體電路(1〇,而為了職枝，制試元件22通常係設置 於一待測試元件電路板（DUT board) 20上。 =意圖。如第1圖以及第2圖所示，通常，測試機⑺、 來時，通常都搭配專屬的待剩試元件電路板⑼: 應之據不同的待測試元件(22)，.其相對 轉電路板⑽上的電路也有所不同，待測 .M361634 試元件電路板（20)上通常包含有一些基本的測試連接端 點（24)用以對待測試元件（22)進行測試，例如：電源 端（DPS)、繼電器控制端（RELAY CONTROL)、通道端 (CHANNEL)、CBIT端、萬用孔等等。
此外，亦有人為了解決利用人工接線所帶來的問題， 而採用了利一種方式，該種方式係利用將所須使用的測試 .電路另外洗在一印刷電路板上，並在印刷電路板上與待測 鲁試元件電路板（DUTb〇ard)上分別設置複數個排線接槽， 在利用排線連接印刷電路板與㈣試元件電路板（DUT 將測試訊號傳送至印刷電路板1 兀件進行測試。 【新型内容;] 過去在進行IC測試時往往都須要_人 元料路板’但此-方式相當麻煩且容易接 錯，不僅:費=^需浪費額外的時間進行除 的方犬. 費人力；如果利用連接-印刷電路 的方式進仃㈣，雖可避 待剛試_'須要高穩定電：:如: ==時，_線在 為創作試產生誤差;因此，本創主要目的 、4電路板，以解決上述之問題。 4 、M361634 本創作為一種測試電路板，安裝於一測試機上，用來 測試至少一待測試元件（device under test, DUT )’包括： 至少一測試電路’利用印刷電路的方式直接將所須之測試 電路洗在該測试電路板上，且該測試電路上設有至少一待 測試元件插槽’用以放置該待測試元件以進行測試；及複 數個訊號接送點’用來接收該測試機所傳送來的複數個測 試訊號’並透過該測試電路將該測試訊號傳送至該元件插 • 槽來對該待測試元件進行測試；同時亦傳送該測試元件根 據該測試訊號所對應產生之複數個輸出訊號至該測試機。 藉由本創作之測試電路板，不僅可解決利用人工接線 產生之費時易出錯的問題外，同時亦因只須用利用單一測 試電路板即可進行測’所以不會有因排線在進行訊號傳輸 時產生訊號干擾的問題；如此不僅可使測試的工作複雜度 大幅簡化效率提升外，同時所測得的數據資料亦相對較為 _ 準確。 【實施方式】 為使更了解本創作之目的、技術特徵和效果，列舉一 較佳實施例，並配合所附圖式作詳細說明。 請參閱第3〜7圖，本創作係一種測試電路板，安 ，裝於一測試機（4)上（本實施方式係舉由VLSI TEST TECHNOLOGY Inc.所生產之νττ v_〇的測試機做說 M361634 月）’可一次測試四顆待測試元件（device under test， 黯）；包括： ， 四組测試電路（31)，利用印刷電路的方式直接將所 須之測試電路洗在該測試電路板（3 )上，且該測試電路（31 ) 上设有四組待測試元件插槽（32)，用以放置該待測試元 件以進行測試； 複數個訊號接送點（33)，用來接收該測試機（4)之 排針（41)所傳送來的複數個測試訊號，並透過該測試電 路（31)將該測試訊號傳送至該待測試元件插槽來 對該待賴it件it行贼；$㈣料朗試树根據該 測試訊號所對應產生之複數個輸出訊號至該測試機（4); 及 ， 複數個栓鎖孔（34)(亦可為栓鎖柱，依不同測試機 不同的測試方式而改變），用以結合至該測試機（4)上對 應之栓鎖柱（42)上，再利用該測試機（4)上之鎖固盤（43) 將該測試電路板⑶制的架設於該測試機⑷上。 本創作之測試電路板（3)尤指利用於測試積體電路 (Integrated C】rcu】t，1C)或晶圓，且測試的環境須要高穩定電 屋及高頻率肅HZ以上時，與其他方式或測試電路板比 較所得到之效果所為顯著。 由上述各實施例·可知，藉由本創作之測試電路板，不 僅可解決湘m線產生之錯的醜外，同時 .M361634 亦因只須用利用單一測試電路板即可進行測，所以不會有 因排線在進行訊號傳輸時產生訊號干擾的問題；如此不僅 可使測試的工作複雜度大幅簡化效率提升外，同時所測得 的數據資料亦相對較為準確。 本創作雖以較佳實施例揭露如上，然其並非用以限定 本創作的範圍，任何熟習此項技藝者，在不脫離本創作之 ' 精神和範圍内，當可做些許的更動與潤飾，因此本創作之 • 保護範圍當視後附之申請專利範圍所界定。
7 .M361634 【圖式簡單說明】 第1圖為習知技術用來執行ic量產測試的測試架構示 意圖。 第2圖所示為習知技術之測試電路板之示意圖。 第3圖所示為本創作之測試電路板之示意圖（正面）。 第4圖所示為本創作之測試電路板之示意圖（反面）。 第5圖所示為測試機之示意圖。 • 帛6圖所示為測試機之鎖固盤之示意圖。 第7圖所示林創作之顯電路減合於賴機上之 示意圖。 【主要元件符號說明】 〇〇)測試機 (20)待測試元件電路板 鲁 （22 )待測試元件 (24)連接端點 (28)連接線 (3 )測試電路板 (31)測試電路 (32 )待測試元件插槽 (33 )訊號接送點 (34)栓鎖孔 * M361634
(4)測試機 (41) 排針 (42) 栓鎖柱 (43) 鎖固盤 9
Claims (1)
- M361634 六、申請專利範圍： 1. 一種測試電路板，安裝於一測試機上，用來測試 至少一待測試元件（device under test, DUT )，該測試電路 板包括： 至少一測試電路’利用印刷電路的方式直接將所須之 測試電路洗在該測試電路板上’且該測試電路上設有至少 一待測試元件插槽’用以放置該待測試元件以進行測試； • 及 複數個訊號接送點，用來接收該測試機所傳送來的複 數個測試訊號，並透過該測試電路將該測試訊號傳送至該 元件插槽來對該待測試元件進行測試；同時亦傳送該測成 元件根據該測試訊號所對應產生之複數個輸出訊號至該測 試機。 2. 如申請專利範圍第1項所述之測試電路板，其中 至少一測試電路係指四組測試電路，使得該測試電路板可 一次測試四顆待測試元件。 3. 如申請專利範圍第1項所述之測試電路板，其中 該測試電路板上更可包括：複數個栓鎖柱或栓鎖孔，使該 測試電路板可穩固的架設於該測試機上。 _ 4·如申請專利範圍第1項所述之測試電路板，其中 該測試機係為—νττν_的測試機。· 10 • M361634 5· 如申請專利範圍第1項所述之測試電路板，其 中該至〉、一待測試元件係為一積體電路(Integrated Circuit, 1C)或晶圓。 6.如申請專利範圍第1項所述之測試電路板，其 中該待K x件尤指在進㈣試時須要高穩定電壓及高 頻率— HZ以上類型的待測元件。
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW098205849U TWM361634U (en) | 2009-04-10 | 2009-04-10 | Testing circuit board |
| US12/756,671 US20100259278A1 (en) | 2009-04-10 | 2010-04-08 | Testing circuit board |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW098205849U TWM361634U (en) | 2009-04-10 | 2009-04-10 | Testing circuit board |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TWM361634U true TWM361634U (en) | 2009-07-21 |
Family
ID=42933880
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW098205849U TWM361634U (en) | 2009-04-10 | 2009-04-10 | Testing circuit board |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US20100259278A1 (zh) |
| TW (1) | TWM361634U (zh) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8466705B1 (en) | 2012-09-27 | 2013-06-18 | Exatron, Inc. | System and method for analyzing electronic devices having a cab for holding electronic devices |
| TWI472769B (zh) * | 2013-03-06 | 2015-02-11 | 威剛科技股份有限公司 | 薄型加熱裝置 |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5101149A (en) * | 1989-07-18 | 1992-03-31 | National Semiconductor Corporation | Modifiable IC board |
| US5552701A (en) * | 1995-05-15 | 1996-09-03 | Hewlett-Packard Company | Docking system for an electronic circuit tester |
| US5945837A (en) * | 1995-10-10 | 1999-08-31 | Xilinx, Inc. | Interface structure for an integrated circuit device tester |
| US5614838A (en) * | 1995-11-03 | 1997-03-25 | International Business Machines Corporation | Reduced power apparatus and method for testing high speed components |
| US6316954B1 (en) * | 1998-07-13 | 2001-11-13 | Ohio Associated Enterprises, Inc. | High performance test interface |
| US6759842B2 (en) * | 2002-04-17 | 2004-07-06 | Eagle Test Systems, Inc. | Interface adapter for automatic test systems |
| US6791317B1 (en) * | 2002-12-02 | 2004-09-14 | Cisco Technology, Inc. | Load board for testing of RF chips |
| KR100505677B1 (ko) * | 2003-03-15 | 2005-08-03 | 삼성전자주식회사 | 디.유.티(ｄｕｔ) 보드의 소요를 줄일 수 있는 반도체테스터 및 이를 이용한 반도체 소자의 전기적 검사방법. |
| JP4625387B2 (ja) * | 2005-09-16 | 2011-02-02 | 東京エレクトロン株式会社 | プローブカードのクランプ機構及びプローブ装置 |
| JP2007121180A (ja) * | 2005-10-31 | 2007-05-17 | Fujitsu Ltd | 半導体装置の試験装置及び半導体装置の試験方法 |
| US8461855B2 (en) * | 2009-10-02 | 2013-06-11 | Teradyne, Inc. | Device interface board with cavity back for very high frequency applications |
-
2009
- 2009-04-10 TW TW098205849U patent/TWM361634U/zh not_active IP Right Cessation
-
2010
- 2010-04-08 US US12/756,671 patent/US20100259278A1/en not_active Abandoned
Also Published As
| Publication number | Publication date |
|---|---|
| US20100259278A1 (en) | 2010-10-14 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| TWI345638B (en) | Compensation for voltage drop in automatic test equipment | |
| TW591238B (en) | Timing calibration and timing calibration verification of electronic circuit testers | |
| TW200949275A (en) | Circuit board testing system and testing method | |
| CN105116317B (zh) | 集成电路测试系统与方法 | |
| CN102279357B (zh) | 一种基于边界扫描技术的分解式电路互连测试方法 | |
| CN1500246A (zh) | 串行器件的改进型环回检测 | |
| CN107807323A (zh) | 电路板健康状况监测方法，检测装置以及检测系统 | |
| JP2010237099A (ja) | ノイズ評価方法及びノイズ評価システム | |
| TWI342953B (en) | Calibration device | |
| WO2008022504A1 (en) | A boundary scan method, system and device | |
| CN112968810A (zh) | 车载以太网物理层测试装置和方法 | |
| TWM331666U (en) | Testing circuit board | |
| TW540125B (en) | External test auxiliary device to be used for testing semiconductor device | |
| CN111708661A (zh) | 一种适用于中央网关的压力测试系统及方法 | |
| TW523603B (en) | Apparatus and method for testing semiconductor integrated circuit | |
| TWM577498U (zh) | 電子裝置 | |
| TWI227787B (en) | Ancillary equipment for testing semiconductor integrated circuit | |
| CN114925652B (zh) | 一种动力电池bms电磁辐射抗扰度分析方法及系统 | |
| TW200931034A (en) | Method and apparatus for analog validation of high speed buses using electromagnetic couplers | |
| CN1952673A (zh) | 电压调整电路效能量测系统及方法 | |
| CN214591478U (zh) | 一种车载以太网物理层测试装置 | |
| WO2008106826A1 (fr) | Procédé d'essai d'un dispositif numérique de balayage sans frontière | |
| CN201107386Y (zh) | 测试电路板 | |
| CN104280639B (zh) | 一种高速视频总线连接器的测试装置及测试方法 | |
| TWM343163U (en) | Testing circuit board |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MM4K | Annulment or lapse of a utility model due to non-payment of fees |