M320172 八、新型說明： 【新型所屬之技術領域】 本創作為提供一種測試治具，尤指治具座可依晶片之尺寸規 而予以更換有不同測試孔之板體，而治具座上方所設置之抵壓 板的壓塊亦可依測試孔位置，而更換有不同加壓部之壓塊，僅需 、、且測式治具就可以測試不同尺寸、規格之晶片，進而達到省力 、快速裝卸、操作簡單之效用。 【先前技術】 一知心著電子工業的進步及電子科技應用的快速發展，愈來 愈多的電子產品被頻繁的應日f生活巾，以提升作業的方僅 性與生活品質，在許多不_電子產品應用之中，皆須使用到气 多積體電路（integrated circuit ;簡稱j C)’來進行管理、分析、處理資料，特別是電腦、通訊以及消 費性電子產品等皆有曰益頻繁的應用。 "惟，在完成積體電路晶片之製造程序後，需經過—連串之電 氣測試’方能在數量繁多之晶片中剔除瑕苑不良品，通常積體: 路晶片於完錢，會直接在電路板上焊接複油積體 形成晶片模組’絲再插接至模組測試板之卡式插槽上 ’惟此種速度過慢，當峨該以廳發生錯辦，無法立:檢 視電路板上之频電路晶片有哪些_發生，而賴將 晶片--重新解焊後’再重新測試檢查，此種方式十分費時= ’無形中也增加生產成本，實是與追求效率的目標背道祕。、 M320172 在過去近四十年來半導體製造技術的研究與快速發展下，單 -晶片上的元件紐雜快的速度向上紐，隨著元件尺寸的縮 小下，其製程精密度要求愈來愈高’使得製程的良率亦受到極大 的挑戰’隨之㈣的，將料良品_雜之問題。M320172 VIII. New description: [New technical field] This creation is to provide a test fixture, especially the fixture seat can be replaced with different test holes according to the size gauge of the chip, and the upper part of the fixture seat The pressing block of the pressing plate can also be replaced with the pressing block with different pressing portions according to the position of the testing hole, and the wafer of different sizes and specifications can be tested only by the measuring tool, thereby achieving labor saving and fast loading and unloading. Simple operation. [Prior Art] With the advancement of the electronics industry and the rapid development of electronic technology applications, more and more electronic products have been frequently used to improve the quality of their work and quality of life. In the application of electronic products, it is necessary to use integrated circuits (j C) to manage, analyze, and process data, especially for computers, communications, and consumer electronics. application. "However, after completing the manufacturing process of the integrated circuit chip, it is necessary to go through a series of electrical tests to remove the defective products in a large number of wafers, usually the integrated body: the road chip will be directly Soldering the re-grinding body on the circuit board to form the wafer module 'wire and then plugging it into the card slot of the module test board'. However, this speed is too slow, and when the office is wrong, it cannot be set up: view What are the _ circuit chips on the board, and the wafers are re-desoldered and then re-tested, which is very time consuming = 'Invisible also increases production costs, it is the goal of pursuing efficiency Secret. M320172 In the past 40 years of research and rapid development of semiconductor manufacturing technology, the speed of the components on the single-chip is fast, and the process precision is getting higher as the component size is reduced. The process yield is also greatly challenged. [With the fourth (four), it will be a good problem.
故’便有許多種規格之測試治具對不同規格、尺寸之晶片進 行測試，然而’各家廢商所生產的測試治具規格、設計皆不曰相同 ’若要測試其钱格之晶片時，則必轉找適合㈤本身尺寸之 測試治具才可錢’如此，為因應各式各樣尺寸之晶片（如：記 憶體晶片、顯示卡晶片触機板晶料），__測廠商需 要庫雜多種_測試治具，柯軸於不同尺寸之晶壯，而 使得測試治具的庫魏餘以計算，且騎騎庫存所累積下來 的成本將是-雜大的_，是以，如何快速、省時、不經 過繁雜之職程序_試積_路晶片，以提升生麟生產製造 與測試之鱗，並應用於後射良品維修，㈣從事此行業之相 關廠商所亟欲研究改善之方向所在者。 【新型内容】 故^作人有鐘於上述缺失，乃搜集相料，經由多方 及考mx從事於此行#累積之純經驗，、軸不斷試作 4改，始設計出此種測試治具的新型專利誕生者。 更J乍之主要目的乃在於治具座可依晶片之尺寸規格而予 2有不酬觀之缝，崎具虹謂設置之抵雜的壓 置’岐換林_較舰，當測試孔定 M320172 有曰曰片時’可藉由缝板上方所設之㈣麟，讓抵壓板可向下 位移’亚使壓塊之加壓部彈性抵壓於受測之晶片上，以進行晶片 ’則口式動作’僅需蝴試料就可以測試不同尺寸、規格之晶片 ，進而達到省力、快速裝卸、操作簡單之效用。 【實施方式】 #為達成上述目的及功效，本創作所採狀技術手段及其構造Therefore, there are many kinds of test fixtures for testing different sizes and sizes of wafers. However, the specifications and designs of test fixtures produced by various wasters are not the same. , will be transferred to the appropriate (5) the size of the test fixture can be money 'so, in response to a variety of sizes of wafers (such as: memory chips, graphics card chip contact plate crystal), __ test manufacturers need There are a variety of _ test fixtures, Ke axis in different sizes of crystal, so that the test fixture Ku Weiyu to calculate, and the cost accumulated by riding inventory will be - miscellaneous _, yes, how Fast, time-saving, and not complicated procedures _ trial _ road chip to enhance the scale of production and testing of Shenglin, and applied to post-production repair, (4) related manufacturers in this industry want to study and improve The direction of the person. [New content] Therefore, there are people who have the above-mentioned missing, but collect the materials. Through the multi-party and test mx, they are engaged in this line of pure experience of accumulation, and the axis constantly tries to make 4 changes, and the design of such test fixtures is designed. The birth of a new patent. The main purpose of the J乍 is that the fixture seat can be adjusted according to the size of the wafer. 2, there is no compensation for the seams of the chip, and the setting of the rainbow is called the setting of the 岐 岐 林 _ _ _ _ _ _ _ _ _ _ _ When the M320172 has a cymbal, it can be moved downward by the (four) lining provided above the sewing plate, so that the pressing portion of the pressing piece can be elastically pressed against the wafer to be tested to perform the wafer. The mouth-operated action can test wafers of different sizes and specifications only by butterfly samples, thereby achieving labor-saving, fast loading and unloading, and simple operation. [Embodiment] #In order to achieve the above purpose and effect, the technical means and structure of the creation
，讀圖就本創作之較佳實施例詳域明其特徵與功能如下，俾 利完全瞭解。 '同％參閱第-、二、三圖所示，係為本創作較佳實施例3 立體外觀圖、立體分解圖及侧視剖面圖，由圖中可清楚看出，^ 創作之測試治具係包括有治具座1及抵驗2所組成，故就柄 之主要結構特徵詳述如后；其中： 該治具座1表面為開設有可供«1 1裝卸定位之容置空間 12 ’而板體1i表面則開設有複數測試孔工丄i，以供預設晶 片置入定位，並於板體η左、右二側設有階狀面工工2，、: 體11二側之階狀面112與容置空間12二側所形成之階梯槽 ^ 21相對應卡合定位，並透過鎖固元件丄2 2將板體丄】穩固 疋位於冶具座1之容置空間i 2内，並於板體i!與治具座工之 間形成有可供電路板推人之插射3，另於治具座U、右二側 向外延伸有導引部14。 >該抵驗2為對應設置於治具座！上方，且抵麵2底部亦 設有可供魏2 1裝卸絲之容置帥2 2，並透補固元件2 M320172 3可將壓塊21定位於容置空間2 2内，並於壓塊21下方設有 複數加壓部211 ’且各加壓部211與板體11表面所開設之 測試孔111相對應。 再者，本創作之治具座1與抵壓板2亦配合有一壓制機構3 ’使抵壓板2可對治具座1崎置放之⑼進行確實的抵壓測試 ’而賴制機構3為具有-把手3 1，且把手3 1 一側向外延伸 有連接部311 ’以供壓制元件3丨2樞接轉動，其壓制元件3 12可為凸輪’並於把手31左、右二側設有可供結合於側板3 2之軸部313，其二相對側板3 2内侧設有對應之嵌槽3 2工 及滑槽3 2 2 ’並使治具座1與滅板2皆設置於二側板3 2之 間，而嵌槽3 2 1則可供抵壓才反2二端嵌設，並於抵壓板2二端 底面與相«槽3 2 1之間設有彈性支撐元件3 2 3，而治具座 1二側之導引部14則定位於二側板3 2之對應滑槽3 2 2内。 是以，藉由上述構件於組構時，係先將治具座丄二侧之導引 部14結合定位於側板3 2之滑槽3 2 2内，而治具座i上方之 抵壓板2職人嵌槽3 21内，並使把手3之壓制元件3丄2抵 壓於抵壓板2表面’如此’即可使治具釘與減板2形成相對 之滑動位#，你、骨動對位時，便可使板體丄丄表面之測試孔工工 1正對於壓塊2 1之加㈣2 1 i底部，即可完成本創作之整體 組構。 請同時參閱第四、五圖所示，係為本創作較佳實施例於使用 時之示意圖及較佳實施例於使用後之示意圖，由圖中可清楚看出 M320172 ，本創作於使用時，係先將治具座1與抵壓板2形成錯位分離狀 ，使治具座1遠離抵壓板2下方，如此，即可將測試電路板4由 治具座1前端所形成之插槽13推入，並使測試電路板4上之預 定電路接點41露出板體11之測試孔111内，便可將欲測試 之晶片5定位於測試孔111内，且晶片5之接腳51可透過具 彈性端子4 21之針盤4 2與電路接點41形成確實接觸。 而後便可將治具座1對位於抵壓板2下方，並使測試孔丄工 1内之晶片5正對於壓塊21之加壓部2 i i處，以此結構設計 ’即可藉由壓制機構3之把手3 i扳動，使把手3 i藉由轴部3 13於-側之側板3 2處形成轉動，即可帶動壓制元件3工2朝 後滑動並向下抵壓，以壓制抵壓板2形成向下位移，同時使彈性 支撐70件3 2 3呈壓縮狀態’進而讓加壓部2丄丄彈性抵貼於晶 片5上，俾使晶片5之接腳5工緊密的與針盤4 2之彈性端子4 2 1接觸’並藉㈣性端子4 2 i讓晶片5與測試電路板4之電 路接點4 1形成_電性連接，同時使晶片5被抵㈣可盘測 試電路板4之電路接點4 i形成彈性緩衝，並具有確實接觸導通 之功效’以此可由聰電路板4進行測試，以判斷晶片5是否為 良品。 元件=晶Γ則試完畢後’即可扳動把手31來帶動_ 兀件3 1 2回设原位’即可將擠壓中之· ，並透過彈性支撐元件3 2 3 干d Z d釋放 Μ μ ^ 2 3之魏力來軸麵板 位私，如此，便可使壓塊2丨 以211遠離晶片5，而後 .M320172 更換下—批晶片5進行測試，以達到測試速度快、省力 作簡單及W翻定位之功效。 ^ 此外，本創作之墨制元件3工2可進一步為軸承、滾珠轴承 凸輪偏心輪或其他具細轉動且向下抵壓之元件所構成，為 僅使把手31轉動時可帶動壓制元件3丨2去壓制抵壓板2形成 向下位移即可’舉凡可達成前述效果之形式皆應受本創作所涵蓋 此種簡易修飾及等效結構變化，均應同理包含於本創作之專利 範圍内，合予陳明。 凊繼績茶閱第六圖所示，係為本創作較佳實施例於更換另一 板體及壓塊之立料_，_巾骑楚料，由上述較佳實施 例可知’當本創作之治具座丨欲峨不同尺寸之晶片5時，僅需 拆卸板體1 1上所定位之細元件i 2 2，即可將板體U更換 ，並依晶以之雜、財或規格，耐歧财不關試孔丄 1 1之板體11，相對地，抵壓板2之壓塊2 i亦可依板體丄工 之測試孔1 1 1位置，而更換有與其相對應加壓部2 i i之壓塊 2 1，亦雜拆卸抵壓板2上之細元件2 3，即可更換不同加 壓部211之壓塊21。 請參閱第七圖所示，係為本創作第二較佳實施例之側視剖面 圖，由圖中可清楚看出，上述較佳實施例之加壓部2 i i可與壓 塊21—體成型所構成（如第三圖所示），其加壓部2丄i亦可 透過固定元件212裝卸定位於壓塊21底部，僅使加壓部2工 1依板體11所收容之晶片5的尺寸、腳位或形狀不同，而予以 M320172 2卸更換，故，僅需-組測試治具便可適用於不同規格尺寸之 晶片5上，且受測之晶片5可為對稱腳位⑺t 封梦u =卜觀(T S ◦ P )峨球格陣列(B G A)封裝等晶片 裝型態，触可有效增加本創作測試治具之適用顧，故舉凡可 達成前述絲之形式皆應受糊作所贿，此糊易修飾及等效 結構變化’均制聰含於糊叙專·㈣，合予陳明。 請參閱第八圖所示，係為本創作第三較佳實施例之側視剖面 圖，由圖中可清楚如，本創作之板體工工亦可藉由鎖固元件工 2 2直歸卸定位於治具座！表面，並於治具座i表面與相鄰板 體1 1底面觸設有相對應之雜柱i 5及纽孔16辅以定位 ’使板體1 1可快速對位於治具座i表面，再以鎖件丄2 2 將板體1 1穩_粒於治具座！表面，即可依測試晶片5的尺 寸、聊位或形狀不同，而予以迅速拆卸更換板，此種結構 應用，亦可用於抵壓板2與壓塊2 i，而抵壓板2底面亦藉由鎖 固元件2 3直接裝卸定位有壓塊2 i，雜抵壓板2與壓塊2工 間設有相對應之定位柱2 4及粒孔2 5_定位，於組震時， 僅需將抵壓板2之定位柱2 4伸人壓塊21之定位孔2 5内呈― 定位，再以鎖固元件2 3將壓塊2工與抵壓板2緊密結合，即可 快速裝卸更換，故舉凡可達成前述效果之形式皆應受本創作所涵 息，此種簡易修部及等效結構變化，均應同理包含於本創作之專 利範圍内，合予陳明。 請爹閱第九圖所示，係為本創作第四較佳實施例之側視剖面 11 ,M320172 =中可清楚看出，本創作之板體⑴面所設之加_ H 所收容之晶片5的尺寸、腳蝴狀不同 勺A#太/卸更換’此種簡易修飾及等效結構變化，均應同理 已3於本創作之專利範圍内，合予陳明。， 板體:固^弟十圖所不，係為本創作第域佳實施例於治具座與 體11圖’由財可清楚看出，上述較佳實施例之板 =:::22r定位在治具座1表， 固於容置空間12之階由上而下鎖 治具座!左、右二側朝二2=’件12 2亦可由 空間12_不脫離即可。穩固定位於容置 例之2 ^閱第十―、十二騎示，係為本創作第六較佳實施 圖體外觀圖及第七較佳實施例之治具座之立體外觀 :Θ 看出，上述較佳實_之板H1 1 2 2%固的德在治具座i表面所職之容置空間1 2内 置空=“：分別設有鳩尾塊113，，相鄰容 . 〜'之魏槽1 2 3，使板體1 1透過鳩尾塊 =而沿著魏槽123推人容置空間12内直至定位，即可 _ ^2 =固定位於容置郎1 2内，其鳩尾塊1 1 3與鴻尾 ^9向可為水平或垂直方向，同樣的抵壓板2之 亦可利料尾塊1 1 3與贼槽i 2 3之結構設計來達The detailed description of the preferred embodiment of the present invention is as follows. The features and functions are as follows, and are fully understood. 'The same as shown in the first, second and third figures, is a three-dimensional appearance, an exploded view and a side cross-sectional view of the preferred embodiment 3 of the present invention. As can be clearly seen from the figure, the test fixture of the creation is The system consists of a fixture seat 1 and a test 2, so the main structural features of the handle are detailed as follows; wherein: the surface of the fixture seat 1 is provided with an accommodation space 12 for the loading and unloading position of the «1 1 The surface of the plate body 1i is provided with a plurality of test holes 丄i for the placement of the preset wafers, and the stepped surface workers 2 are provided on the left and right sides of the plate body η, and the two sides of the body 11 are The stepped surface 112 is correspondingly engaged with the stepped groove 21 formed on both sides of the accommodating space 12, and is stably positioned in the accommodating space i 2 of the slab holder 1 through the locking member 丄2 2 And a plate 3 is formed between the plate body i! and the fixture seat, and the guide portion 14 is extended outwardly from the fixture seat U and the right side. > The test 2 is set to correspond to the fixture seat! Above, and the bottom of the facing surface 2 is also provided for the Wei 2 1 loading and unloading wire to accommodate the handsome 2 2, and through the fixing component 2 M320172 3 can position the pressing block 21 in the accommodating space 2 2, and in the pressing block A plurality of pressurizing portions 211' are provided below the 21, and each of the pressurizing portions 211 corresponds to the test hole 111 opened on the surface of the plate body 11. Furthermore, the fixture 1 and the pressing plate 2 of the present invention are also equipped with a pressing mechanism 3' so that the pressing plate 2 can perform a positive pressing test on the jig 1 (9) and the biasing mechanism 3 has - a handle 3 1, and a handle portion 311 ' extends outwardly from the handle 3 1 for pivotal rotation of the pressing member 3 丨 2, and the pressing member 3 12 can be a cam ' and is provided on the left and right sides of the handle 31 The shaft portion 313 of the side plate 3 2 can be coupled to the inner side of the side plate 32, and the corresponding inner side of the side plate 3 2 is provided with a corresponding groove 3 2 and a sliding groove 3 2 2 ', and the fixture seat 1 and the extinguishing plate 2 are both disposed on the two side plates. Between 3 and 2, the groove 3 2 1 is available for pressing, and the second end is embedded, and an elastic supporting member 3 2 3 is disposed between the bottom surface of the two end plates of the pressing plate 2 and the phase groove 3 2 1 . The guiding portion 14 on the two sides of the fixture seat is positioned in the corresponding chute 32 2 of the two side plates 3 2 . Therefore, when the above-mentioned components are assembled, the guiding portions 14 on the two sides of the jig base are firstly combined and positioned in the sliding grooves 32 2 of the side plates 3 2 , and the pressing plate 2 above the jig seat i is The person inserts the groove 3 21 and presses the pressing member 3丄2 of the handle 3 against the surface of the pressing plate 2 so that the jig nail and the lowering plate 2 form a sliding position #, you and the bone are aligned When the test hole 1 of the surface of the plate body is added to the bottom of the block 2 1 (4) 2 1 i, the overall structure of the creation can be completed. Please also refer to the fourth and fifth figures, which are schematic diagrams of the preferred embodiment of the present invention and a schematic diagram of the preferred embodiment after use. The M320172 can be clearly seen from the figure. First, the jig 1 and the pressing plate 2 are formed in a dislocation shape, so that the jig 1 is away from the pressing plate 2, so that the test circuit board 4 can be pushed into the slot 13 formed by the front end of the jig 1 And the predetermined circuit contact 41 on the test circuit board 4 is exposed in the test hole 111 of the board body 11, the wafer 5 to be tested can be positioned in the test hole 111, and the pin 51 of the wafer 5 can be elasticized. The dial 4 2 of the terminal 4 21 forms a true contact with the circuit contact 41. Then, the pair of the tool holders 1 can be positioned under the pressing plate 2, and the wafer 5 in the test hole 1 can be placed on the pressing portion 2 ii of the pressing block 21, and the structure can be designed by the pressing mechanism. The handle 3 i of the 3 is pulled, so that the handle 3 i is rotated by the side portion 3 2 of the shaft portion 3 13 to drive the pressing member 3 to slide backward and press downward to press the pressing plate. 2, the downward displacement is formed, and at the same time, the elastic support 70 pieces 3 2 3 are in a compressed state', so that the pressing portion 2 is elastically abutted against the wafer 5, so that the pin 5 of the wafer 5 is tightly coupled with the dial 4 2, the elastic terminal 4 2 1 contacts 'and the (four) terminal 4 2 i makes the wafer 5 and the circuit contact 4 1 of the test circuit board 4 electrically connected, while the wafer 5 is abutted (four) the disk test circuit board 4 The circuit contacts 4 i form an elastic buffer and have the effect of a true contact conduction 'to be tested by the Cong circuit board 4 to determine whether the wafer 5 is good. Component = crystal Γ After the test is completed, 'the handle 31 can be pulled to drive _ 3 3 3 1 2 back to the original position' can be squeezed in the middle, and through the elastic support element 3 2 3 dry d Z d release Μ μ ^ 2 3 Wei Lilai axis panel is private, so that the clamp 2 can be moved away from the wafer 5 by 211, and then the M320172 is replaced with the next batch of wafers 5 for testing, to achieve fast test speed and labor saving. W flip positioning effect. ^ In addition, the ink component 3 of the present invention can further be composed of a bearing, a ball bearing cam eccentric or other components with a fine rotation and a downward pressing force, so that the pressing member can be driven only when the handle 31 is rotated. 2 to press the pressing plate 2 to form a downward displacement, the form that can achieve the aforementioned effects should be subject to the simple modification and equivalent structural changes covered by the creation, and should be included in the scope of the patent of the creation. Combined with Chen Ming. As shown in the sixth figure, it is the preferred embodiment of the present invention to replace the other board and the briquettes. When the fixture is to be used for the wafer 5 of different sizes, only the fine component i 2 2 positioned on the board body 1 1 needs to be disassembled, and the board body U can be replaced, and according to the crystal, the money or the specification, The deficiencies are not related to the plate 11 of the hole 丄1 1 , and the pressing block 2 i of the pressing plate 2 can also be pressed according to the position of the test hole 1 1 1 of the plate body, and the pressing portion corresponding thereto is replaced. The press block 21 of 2 ii can also be replaced by the thin element 2 3 on the pressing plate 2, so that the press block 21 of the different pressurizing portions 211 can be replaced. Referring to the seventh embodiment, which is a side sectional view of the second preferred embodiment of the present invention, it can be clearly seen from the figure that the pressing portion 2 ii of the above preferred embodiment can be combined with the pressing block 21 The molding portion (as shown in the third figure), the pressing portion 2丄i can also be detachably positioned and fixed to the bottom of the pressing block 21 through the fixing member 212, and only the pressing portion 2 is placed on the wafer 5 accommodated by the plate body 11. The size, position or shape is different, and the M320172 2 is unloaded and replaced. Therefore, only the test kit can be applied to the wafer 5 of different specifications, and the tested wafer 5 can be a symmetric foot (7) t seal. Dream u = 观 (TS ◦ P ) 峨 格 阵列 阵列 B B B B , , , , , , , , , , , , , , , , , , , , , , 晶片 , 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片The bribe, the paste is easy to modify and the equivalent structural changes 'average system Cong is included in the essays (4), and is combined with Chen Ming. Please refer to the eighth embodiment, which is a side cross-sectional view of the third preferred embodiment of the present invention. It can be clearly seen from the figure that the board worker of the present invention can also be returned by the locking component 2 2 Unloading and positioning in the fixture seat! a surface, and a corresponding column i 5 and a buttonhole 16 are provided on the surface of the fixture seat i and the bottom surface of the adjacent plate body 1 1 to be positioned to enable the plate body 1 1 to be quickly positioned on the surface of the fixture seat i. Then use the lock 丄2 2 to stabilize the plate 1 1 in the fixture seat! The surface can be quickly disassembled and replaced according to the size, the bit position or the shape of the test wafer 5. This structural application can also be used to press the plate 2 and the pressing block 2 i, and the bottom surface of the pressing plate 2 is also locked. The solid component 2 3 is directly loaded and unloaded and positioned with the pressing block 2 i, and the corresponding pressing plate 2 and the pressing block 2 are provided with the corresponding positioning column 24 and the granular hole 2 5_ positioning, and only need to be pressed when the group is shaken. The positioning post 2 of the 2 is extended by the positioning hole 2 5 of the human pressing block 21, and then the clamping member 2 is used to tightly combine the pressing block 2 with the pressing plate 2, so that the loading and unloading can be quickly replaced, so that the achievable The form of the aforementioned effects shall be subject to the content of this creation. Such simple repairs and equivalent structural changes shall be included in the scope of the patent of this creation and shall be combined with Chen Ming. Please refer to the ninth figure, which is a side view section 11 of the fourth preferred embodiment of the present invention. It can be clearly seen from the M320172=, the wafer contained in the surface of the board (1) of the present invention is contained. The size of 5, the different shape of the foot and the spoon A# too / unloading replacement 'this simple modification and equivalent structural changes, should be similarly within the scope of this creation patent, combined with Chen Ming. , plate body: solid ^ brother ten map is not, is the creation of the first domain of the best example of the governance of the seat and the body 11 picture 'clearly clear, the above preferred embodiment of the board =::: 22r positioning In the table of the fixture seat 1, the stage of the housing space 12 is fixed from the top to the bottom of the fixture; the left and right sides are facing two 2 = 'piece 12 2 can also be separated from the space 12_. The stable and fixed example is located in the second example of the accommodating example, which is the appearance of the sixth preferred embodiment of the present invention and the three-dimensional appearance of the fixture seat of the seventh preferred embodiment: Θ , the above-mentioned better _ plate H1 1 2 2% solid deer in the surface of the fixture seat i seated space 1 2 built-in empty = ": respectively set up the tail piece 113, adjacent capacity. ~ ' Wei trough 1 2 3, the plate body 1 1 through the dovetail block = and along the Wei trough 123 pushed into the accommodation space 12 until the positioning, then _ ^ 2 = fixed in the Rong Lang 1 2, its tail block 1 1 3 and Hongwei ^9 direction can be horizontal or vertical direction, the same pressure plate 2 can also be used to facilitate the design of the tail block 1 1 3 and the thief slot i 2 3
S 12 到上双果S 12 to the double fruit
底面，此種簡易修飾及等效結構變化，均應同理包含於本創作之 專利範圍内，合予陳明。 是以，本創作之測試治具於使用時，可解決習用之缺失如下 M320172 J又俠附汉瓶丄丄興壓塊21可依 使用者的需核設計的抑，野峨計林同蚊位結構’僅 需使板體1 1雛塊2 1可鱗騎更_可m述較佳實 施例之板體11與壓塊2丨的定位方式僅是本創作之較佳實施^ 而已’自不能以此而偈限本創作之專利範目，因此，舉凡運用本 創作之專利範圍所做之均等變化與修飾，仍應包含於本創作所涵 蓋之專利範圍内。 ~ 請繼續參閱第十三騎示，係為本創作第人較佳實施例之立 體分解圖’由W中可清楚看出，該治具座Μ面與相鄰板體U 底面為分別設有對應之4尾塊i i 3及鳩尾槽i 2 3，於使用時 ’僅需使板體1 1透過鳩尾塊1 i 3而沿著治具座i表面之填尾 槽1 2 3水平推至雜，並以鎖固元件i 2 2將板體丄丄定位於 治具座1表面，同樣的抵壓板2之壓塊2 i亦可贼塊與填 尾槽之結構設計來達到上述之效果，僅需使板體i i與壓塊2丄 I快速裝卸更換即可’故舉凡運財_之專概騎做之均等 k化與修飾，仍應包含於本創作所涵蓋之專利範圍内。 、 請繼續參閱第十四圖所示，係為本創作第九較佳實施例之立 體分解圖，由圖中可清楚看出，該抵壓板2與壓塊21可為一體 成型所構成，且下方之加壓部211可以固定元件2 i 2定位於The bottom surface, such simple modifications and equivalent structural changes shall be included in the scope of this creation patent and shall be combined with Chen Ming. Therefore, when the test fixture of this creation is used, it can solve the problem of the following use. M320172 J and Xia Han bottle 丄丄 压 压 21 can be designed according to the user's needs, the wild 峨 峨 林The structure 'only needs to make the plate body 1 1 the spring block 2 1 can be scaled and more _ can be described as the preferred embodiment of the plate body 11 and the pressure block 2 较佳 of the preferred embodiment ^ is only a good implementation of the present ^ In this way, the patents of this creation are limited, and therefore, the equivalent changes and modifications made by the scope of the patents of this creation should still be included in the scope of patents covered by this creation. ~ Please continue to refer to the thirteenth riding show, which is a perspective exploded view of the preferred embodiment of the present invention. It can be clearly seen from W that the jig face of the jig and the bottom surface of the adjacent plate U are respectively provided. Corresponding 4 tail block ii 3 and tail groove i 2 3, in use, 'only need to make the plate body 1 1 through the tail piece 1 i 3 and push the tail groove 1 2 3 along the surface of the fixture seat i horizontally to the miscellaneous And the plate body 丄丄 is positioned on the surface of the fixture seat 1 by the locking component i 2 2 , and the same pressing block 2 of the pressing plate 2 can also be designed by the structure of the thief block and the tailing groove to achieve the above effect, only It is necessary to quickly load and replace the plate body ii and the pressure block 2丄I. The equalization and modification of the special vehicle for the purpose of the operation is still included in the patent scope covered by this creation. Please refer to FIG. 14 for an exploded perspective view of the ninth preferred embodiment of the present invention. As can be clearly seen from the figure, the pressing plate 2 and the pressing block 21 can be integrally formed, and The lower pressing portion 211 can be fixed to the component 2 i 2
13 M320172 本創作之/則„式治具主要是強調可依所測試之晶片5的尺寸、 腳位或^/狀不同’而予以快速更換板體1 1及所對應之壓塊2 1 ’僅需一組測試治具就可以測試不同尺寸、規格之晶片5，進而 _省力、快速騎、操作簡單之效用；是以，當受測之晶片5 定位於測試孔！ i i㈣，即可扳祕麵構3之把m，讓 ^壓部211彈性抵壓於受測之晶片5上，使晶片5可確實與測 j電路板4形成電性接觸，以此進行晶片5測試動作，進而找出 早-有瑕疲不良之晶片5，即可解決制須重新解焊之缺失，以 達到測試速度快、省力省時、操作簡單之功效。 惟，上述較佳實施例並非肋限定本創作之申請專利範圍， 舉凡其它未脫離摘作所揭社㈣婦下所完狀均等變化盘 修飾變更，均應包含於本創作所涵蓋之專利細巾。 ” 綜上所述’本創作之測試治具於使用時具有顯著之功效增進 ’誠符合新穎性、創作性及進步性之專利要件，爰依法提出申曰請 ’盼審委早曰賜准本案，以保障創作人之辛苦創作，倘若= 局有任何稽疑，請;F絲函封，創作人定#竭力配合，實感德13 M320172 The creation of this type of fixture is mainly based on the fact that the size, position or shape of the wafer 5 to be tested is different, and the plate body 1 1 and the corresponding pressure block 2 1 ' are only quickly replaced. A set of test fixtures is required to test the wafers of different sizes and specifications 5, and further, the utility model has the advantages of labor saving, fast riding and simple operation; therefore, when the tested wafer 5 is located in the test hole! i i (four), the keyboard can be used. In the surface structure 3, the pressing portion 211 is elastically pressed against the wafer 5 to be tested, so that the wafer 5 can be electrically contacted with the j-circuit board 4, thereby performing the test operation of the wafer 5, thereby finding out Early-there is a chip 5 with poor fatigue, which can solve the problem of re-de-soldering, so as to achieve the test speed, labor-saving, time-saving and simple operation. However, the above preferred embodiment is not limited to the application of this creation. The scope of patents, all other changes that have not been removed from the excerpts of the Society (4), and the changes to the discs, shall be included in the patented fines covered by this creation. "In summary, the test fixtures of this creation are Significant effect enhancement when used Sexual, creative and progressive patent elements, 提出 提出 提出 ' ' 盼 盼 盼 盼 盼 盼 盼 盼 盼 盼 盼 盼 盼 盼 盼 盼 盼 盼 盼 盼 盼 盼 盼 盼 盼 盼 盼 盼 盼 盼 盼 盼 盼 盼 盼 盼 盼 盼 盼 盼 盼 盼 盼 盼 盼The creator is determined to cooperate with him.
14 M320172 J 明 說 單 簡 式 圖 η 第一圖係為本創作較佳實施例之立體外觀圖。 第二圖係為本創作較佳實施例之立體分解圖。 第三圖係為本創作較佳實施例之側視剖面圖。 第四圖係為本創作較佳實施例於使用時之示意圖。 第五圖係為本創作較佳實施例於使用後之示意圖。 第六圖係為本創作較佳實施例於更換另一板體及壓塊之立體 外觀圖。 第七圖係為本創作第二較佳實施例之側視剖面圖。 第八圖係為本創作第三較佳實施例之側視剖面圖。 第九圖係為本創作第四較佳實施例之側視剖面圖。 第十圖係為本創作第五較佳實施例於治具座與板體鎖固時之 示意圖。 第十一圖係為本創作第六較佳實施例之治具座之立體外觀圖。 第十二圖係為本創作第七較佳實施例之治具座之立體外觀圖。 第十三圖係為本創作第八較佳實施例之立體分解圖。 第十四圖係為本創作第九較佳實施例之立體分解圖。 【主要元件符號說明】 1、治具座 1 1、板體 12 2、鎖固元件 1 1 1、測試孔 12 3、鳩尾槽 < s M320172 112、階狀面 1 13、鳩尾塊 12、容置空間 1 21、階梯槽 2、 抵壓板 2 1、壓塊 211、 加壓部 212、 固定元件 2 2、容置空間 3、 壓制機構 3 1、把手 311、 連接部 312、 壓制元件 313、 軸部 4、 測試電路板 41、電路接點 4 2、針盤 1 3、插槽 14、 導引部 15、 定位柱 16、 定位孔 2 3、鎖固元件 2 4、定位柱 2 5、定位孔 3 2、側板 3 21、後槽 3 2 2、滑槽 3 2 3、彈性支撐元件 4 21、彈性端子 5 1、接腳 < S ) 1614 M320172 J 明 单 单 单 图 图 The first figure is a three-dimensional appearance of the preferred embodiment of the present invention. The second drawing is an exploded perspective view of a preferred embodiment of the present invention. The third drawing is a side cross-sectional view of a preferred embodiment of the present invention. The fourth figure is a schematic diagram of the preferred embodiment of the present invention in use. The fifth drawing is a schematic diagram of the preferred embodiment of the present invention after use. Figure 6 is a perspective view of the preferred embodiment of the present invention for replacing another panel and a compact. Figure 7 is a side cross-sectional view of the second preferred embodiment of the present invention. Figure 8 is a side cross-sectional view of a third preferred embodiment of the present invention. The ninth drawing is a side cross-sectional view of the fourth preferred embodiment of the present invention. The tenth figure is a schematic view of the fifth preferred embodiment of the present invention when the fixture seat and the plate body are locked. The eleventh figure is a three-dimensional appearance of the jig of the sixth preferred embodiment of the present invention. Figure 12 is a perspective view of the jig of the seventh preferred embodiment of the present invention. The thirteenth drawing is an exploded perspective view of the eighth preferred embodiment of the present invention. Figure 14 is a perspective exploded view of the ninth preferred embodiment of the present invention. [Description of main components] 1. Fixture seat 1 1. Plate body 12 2. Locking element 1 1 1. Test hole 12 3. Tail groove < s M320172 112, step surface 1 13, Iris block 12, capacity Space 1 21, stepped groove 2, pressing plate 2 1, pressing block 211, pressing portion 212, fixing member 2, accommodating space 3, pressing mechanism 3 1, handle 311, connecting portion 312, pressing member 313, shaft Portion 4, test circuit board 41, circuit contact 4, dial 13 3, slot 14, guide portion 15, positioning post 16, positioning hole 23, locking member 24, positioning post 25, positioning hole 3, side plate 3 21, rear groove 3 2 2, chute 3 2 3, elastic support member 4 21, elastic terminal 5 1 , pin < S ) 16