TWM292742U - Memory card capable of protecting test points - Google Patents

Memory card capable of protecting test points

Info

Publication number
TWM292742U
TWM292742U TW094221120U TW94221120U TWM292742U TW M292742 U TWM292742 U TW M292742U TW 094221120 U TW094221120 U TW 094221120U TW 94221120 U TW94221120 U TW 94221120U TW M292742 U TWM292742 U TW M292742U
Authority
TW
Taiwan
Prior art keywords
memory card
test points
card capable
protecting test
protecting
Prior art date
Application number
TW094221120U
Other languages
English (en)
Inventor
Ping-Yang Chuang
Original Assignee
Ping-Yang Chuang
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ping-Yang Chuang filed Critical Ping-Yang Chuang
Priority to TW094221120U priority Critical patent/TWM292742U/zh
Priority to JP2005370009A priority patent/JP2007157091A/ja
Publication of TWM292742U publication Critical patent/TWM292742U/zh
Priority to DE202006013974U priority patent/DE202006013974U1/de
Priority to US11/603,148 priority patent/US20070125869A1/en
Priority to KR2020060030473U priority patent/KR200438337Y1/ko

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C5/00—Details of stores covered by group G11C11/00
    • G11C5/02—Disposition of storage elements, e.g. in the form of a matrix array
    • G11C5/04—Supports for storage elements, e.g. memory modules; Mounting or fixing of storage elements on such supports
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06K—GRAPHICAL DATA READING; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
    • G06K19/00—Record carriers for use with machines and with at least a part designed to carry digital markings
    • G06K19/06—Record carriers for use with machines and with at least a part designed to carry digital markings characterised by the kind of the digital marking, e.g. shape, nature, code
    • G06K19/067—Record carriers with conductive marks, printed circuits or semiconductor circuit elements, e.g. credit or identity cards also with resonating or responding marks without active components
    • G06K19/07—Record carriers with conductive marks, printed circuits or semiconductor circuit elements, e.g. credit or identity cards also with resonating or responding marks without active components with integrated circuit chips
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06K—GRAPHICAL DATA READING; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
    • G06K19/00—Record carriers for use with machines and with at least a part designed to carry digital markings
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/1201—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details comprising I/O circuitry

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Credit Cards Or The Like (AREA)
  • Tests Of Electronic Circuits (AREA)
TW094221120U 2005-12-05 2005-12-05 Memory card capable of protecting test points TWM292742U (en)

Priority Applications (5)

Application Number Priority Date Filing Date Title
TW094221120U TWM292742U (en) 2005-12-05 2005-12-05 Memory card capable of protecting test points
JP2005370009A JP2007157091A (ja) 2005-12-05 2005-12-22 試験接触部を保護するためのメモリカード
DE202006013974U DE202006013974U1 (de) 2005-12-05 2006-09-12 Speicherkarte mit der Möglichkeit zum Schutz eines Testkontakts
US11/603,148 US20070125869A1 (en) 2005-12-05 2006-11-22 Memory card with protected test contacts
KR2020060030473U KR200438337Y1 (ko) 2005-12-05 2006-11-27 보호 테스트 접점을 갖는 메모리 카드

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW094221120U TWM292742U (en) 2005-12-05 2005-12-05 Memory card capable of protecting test points

Publications (1)

Publication Number Publication Date
TWM292742U true TWM292742U (en) 2006-06-21

Family

ID=37563025

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094221120U TWM292742U (en) 2005-12-05 2005-12-05 Memory card capable of protecting test points

Country Status (5)

Country Link
US (1) US20070125869A1 (zh)
JP (1) JP2007157091A (zh)
KR (1) KR200438337Y1 (zh)
DE (1) DE202006013974U1 (zh)
TW (1) TWM292742U (zh)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN2909402Y (zh) * 2006-04-18 2007-06-06 富士康(昆山)电脑接插件有限公司 多功能电子卡
US8826086B2 (en) 2011-02-07 2014-09-02 Sandisk Technologies Inc. Memory card test interface

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2830159B2 (ja) * 1989-09-12 1998-12-02 カシオ計算機株式会社 時間管理装置及び時間管理方法
JP2739504B2 (ja) * 1989-09-25 1998-04-15 三井化学株式会社 シクロヘキサン―１，４―ジオンの製造方法
US20040199721A1 (en) * 2003-03-12 2004-10-07 Power Data Communication Co., Ltd. Multi-transmission interface memory card
US20050013106A1 (en) * 2003-07-17 2005-01-20 Takiar Hem P. Peripheral card with hidden test pins
US6890188B1 (en) * 2004-02-27 2005-05-10 Imation Corp. Memory card compatible with device connector and host connector standards
TWM264642U (en) * 2004-08-27 2005-05-11 Incomm Technologies Co Ltd Flash memory device having plural communication protocols

Also Published As

Publication number Publication date
JP2007157091A (ja) 2007-06-21
KR200438337Y1 (ko) 2008-02-11
KR20070000670U (ko) 2007-06-11
US20070125869A1 (en) 2007-06-07
DE202006013974U1 (de) 2006-12-07

Similar Documents

Publication Publication Date Title
HK1101211A1 (en) Memory card and card adapter
IL191896A0 (en) Probe card
EP1930734A4 (en) test card
IL191954A0 (en) Probe card
DE602006008084D1 (de) Speicherkartenadapter
EP1970715A4 (en) test card
EP1770601A4 (en) ADAPTER FOR MEMORY CARD
EP1850709A4 (en) READING RACK
GB0515405D0 (en) Memory leak detection
GB0500579D0 (en) Memory card handling
DE602006017938D1 (de) Speicherkartensockel
TWI370456B (en) Memory diagnosing device
EP1965341A4 (en) CARD WITH THE ABILITY TO AUTHENTICATE
GB0711155D0 (en) Flammability tester
TWI350455B (en) Memory micro-tiling
GB0617744D0 (en) Memory card assembly
IL189207A0 (en) Memory access
GB2439968B (en) Memory testing
EP2003652A4 (en) SEMICONDUCTOR MEMORY AND TEST SYSTEM
GB0504987D0 (en) Memory access
TWM301452U (en) Memory card and assembly thereof
TWI372879B (en) Test equipmetn and pin-electronic card
EP1943529A4 (en) MEMORY SCAN TEST
TWM292742U (en) Memory card capable of protecting test points
TWI299164B (en) Memory ic testing tool and probe structure