M258288M258288
【新型所屬之技術領域】 一種用以測試印刷 ^ 本創作係有關一種探針結構，尤指 %路板線路導通狀態的檢測探針結構。 【先前技術】 ' ° P届ll電5^才反（Ρτίπ十pH P. . +工4 一二 凡目光所及的各項電子產品，如小型的 電子計算機、行動電話（Μ〇μ 如& 的 (Personal DigUal Assist ^ h〇ne)、個人數位助理 傳真機、印表機、麥印機’乃至事務型商用機器： 能事務機Uultl Functl〇n = 一口上迹功此的多功 型資料處理設備：筆記型電 er’ MFP)，以及中大 帝日《< ^ 6 ^ ^ ^ (Notebook )、桌上刮翻， -¾ (Personal Computer ) 杲上产個人 於產品内部經常可見印刷帝 erve〇專等， 能強女帝工太 p席見路板的使用，其種類繁多曰 月匕強大。电子產品運作所需的電容、中曰 、I夕且功 微處理晶片等各式電子雯件，比壯 甩曰日體、通汛晶片、 上，具有裝配定位精確:易於二1己整合於印刷電路板 維修保養更換作業等優勢。 里生產製造，且便於日後 大體而言，印刷電路板上佈滿緣路笨雷U (trace )’並預留電子零件之4路寺電路走線 當處開設複數個孔位’以供電子&置區域，再於對應之適 板，然後以焊接方式固定電子=之針腳穿出印刷電 相接。 手’路走線而與其他電子零件達成:靶 為確保印刷電路板上 ^ ^ t忮 .、、果路V通狀態正常，通常[Technical field to which the new type belongs] A kind of probe structure for testing printing ^ This creation relates to a probe structure, especially a probe structure for detecting the conduction state of a circuit board. [Prior art] '° P Session ll Electricity 5 ^ 才 反 (Ρτίπ 十 pH P .. + 工 4) Every electronic product in sight, such as a small electronic computer, mobile phone (Μ〇μ Such as & (Personal DigUal Assist ^ h〇ne), personal digital assistant fax machines, printers, wheat printers, and even business-oriented business machines: Uultl Functl0n = multi-function data that can be used at the same time Processing equipment: notebook electric er 'MFP), as well as "<^ 6 ^ ^ ^ (Notebook), table scratching, -¾ (Personal Computer) 杲 杲 杲 个人 个人 个人 个人 personal personal products are often visible inside the product printing erve 〇 Specialist, can strengthen the female Emperor Workers to see the use of road boards, a wide variety of powerful tools. Capacitors, electronic components, electronic components and other electronic components required for the operation of electronic products, Compared with Zhuangjiao, it has the advantages of precise assembly positioning: easy to integrate into printed circuit board maintenance and replacement operations, etc. It is manufactured in the factory, and it is convenient for the general future. Manyuan Lubenlei U (trace) 'and reserved The four-way temple circuit of electronic parts is provided with a plurality of holes at the locations of the "electricity & placement area, and then the corresponding suitable board, and then the electronic = pin is fixed by soldering through the printed electrical connection." Route to reach other electronic parts: the target is to ensure that the printed circuit board ^ ^ t 忮., The fruit road V pass state is normal, usually
M258288 9、創作說明（2) 子零件組配於印刷電 探針的測試治具，並 試探針的生產製造亦 一套筒與第二套筒組 試治具的承載基板上 一套筒包含有彈簧與 動伸出或埋入第一套 可於本 號，第 關的技 設計來 雖具有 運作而 雜、裝 至 5虎為例 連設有 雖可提 而由於 結構向 與彈性 至脫離 造成成 之間的 國專利公報上 378757號，第 術。上述習知 解決使用上的 差兴之處但相 具有一 配不易 於結構 ，係將 探針頭 供緩衝 探針頭 印刷電 導體脫 ’致使 本上的 偏移走 定程度 ，且生 較為簡 彈性導 ，用以 效果， 是整體 路板方 離，或 產品耗 負擔， 位。 路板之 配合檢 是一門 合而成 ，再將 探針， 筒。前 尋得， 516633 技術針 各種問 去不遠 的效果 產成本 單者， 體嵌固 與印刷 使得探 外露於 向移動 彈性導 損率偏 且導板 Μ， 測儀 學問 ，其 第一 板針 述結 如中 號及 尉冽 題， 。換 ，值 頗高 以中 於複 電路 針顯 導板 時， 體於 高。 間所 會利用裝配 器加以測試 。一般的測 中第二套筒 套筒置放於 可藉由彈簧 構組成早已 華民國專利 第5 3 9 1 3 4號 試探針的結 但其裝配方 β之，上述 不難發現其 有複數 檢驗。 試探針 先行裝 第二套 的頂推 普遍應 公告第 等及揭 構，提 式與運 前案雖 組成元 個測試 關於測 是由第 配於測 筒。第 而可活 用，並 299834 露有相 出不同 作原理 可合理 件複 華民國專 數個導板 板相接處 不致傷害 ’因此在 反覆使用 外露導板 再者使用 留有的間 利公告第4 3 9 9 8 了 之間’且其一端 。然而彈性導體 印刷電路板，$ 治具座帶動探針 下將造成探針頭 一端產生彎折甚 ♦多的導板不僅 隙也將造成導才反M258288 9. Creation instructions (2) The sub-component set is equipped with a test fixture for printed electrical probes, and the production of the test probe is also a sleeve and a second sleeve set of test fixtures. A sleeve contains The first set with springs and movements can be inserted or embedded in this number. Although the technical design of the level is mixed with operation, it is installed to 5 tigers as an example. Although it can be installed, it can be caused by the structural direction and elasticity to disengage. National Patent Bulletin No. 378757, Chengdu. The above-mentioned conventional solutions solve the inconveniences in use, but the phase has a structure that is not easy to match. The probe head is used for buffering the probe head and the printed electrical conductor is disengaged, which causes a certain degree of offset deviation and is relatively simple and flexible. The guide, for the effect, is the overall board departure, or the product consumption burden. The board inspection is a combination of the door, and then the probe and tube. It was previously found that 516633 technical needles have various effects that are not far away, and the cost of production is simple. The body embedding and printing make the probe exposed to the mobile elasticity loss rate and the guide plate M. Results such as the medium and Wei Yu questions,. Change, the value is quite high, which is higher than that when the pin circuit of the complex circuit is displayed. It will be tested by the assembler. In general tests, the second sleeve is placed on a knot that can be formed by a spring structure. It has already been a test probe of the Republic of China Patent No. 5 3 9 1 3 4 but its assembly method β is not difficult to find above. test. The test probe should be installed first, and the second set of jacking should generally be announced with the ranking and disclosure, although the prototype and the pre-shipment case are composed of each test. It can be used flexibly, and 299834 reveals that different working principles can be reasonably used to restore the joints of several guide plates of the Republic of China without causing harm. Therefore, the exposed guide plates are used repeatedly, and the remaining profit announcement is used. 4 3 9 9 8 了 between 'and its one end. However, the flexible conductor printed circuit board, the $ jig seat will drive the probe, which will cause the probe head to bend at one end. ♦ Many guide plates will not only cause gaps, but also cause the guide to react.
M258288 M258288 四、創作說明（4) 依據本創作之檢測探針結構’其主 種裝：迅速，且成本低廉的創新產品。的在於棱供- 請參考「S1圖」來說明本創作之組成，. Γι°ο ； ；^ ^4130 ° #20 - ^ 針10彳木針ίο與设位元件20之相接處形成有檔持緣丨卜 以限制，位元件2。套置的範圍。探針1G之末端12具 曰 角，係藉以避免損傷印刷電路板5〇 (第2 、 =末端12可視需求而有不同的設計，另外的::為伞\ 又计。至於末端12有多種類型，請留意圖示中僅為示 :，本創作並未侷限其可實施的態樣。復位元 連：於導線30’ 一般而言是利用焊錫，以焊接方 ： 兀件20與導線30彼此銲固。 續請配合參考「第2圖」與「第3圖」來說明本創作之 檢測探針結構之裝配情形，於此對測試治具做個簡單的說 明，測試治具主要包含承載基板4〇，以供待測試的印刷電 路板50置放。印刷電路板5〇佈滿導線（或稱走線），業界 即利用―此類測試治具，·來對印刷電路板5〇上的走線進行測 f，藉以確認走線的導通狀態。承載基板40具有對應印刷 電路板50走線的微孔41，完成組合後的探針丨〇、復位元件 2〇與導線30，自承載基板40下方穿出微孔41，而使探針1〇 局部外露於微孔41，復位元件2〇將提供一定的壓縮回復彈 力’使得探針1 0受到印刷電路板5 〇置放而埋入微孔4丨内一 疋距離，當印刷電路板5 〇移開後，探針1 〇將回復到伸出微 孔41的態樣。導線30相對於銲固復位元件2〇之另一端，則M258288 M258288 IV. Creation Instructions (4) The main structure of the detection probe structure based on this creation: rapid and low-cost innovative products. What lies in the edge supply-please refer to the "S1 picture" to explain the composition of this creation. Γι ° ο; ^ ^ 4130 ° # 20-^ Needle 10 彳 Wooden needle ο There is a file at the junction with the setting element 20. Hold edge 丨 bu to limit, bit element 2. Nesting range. The 12 ends of the probe 1G have angles, to avoid damage to the printed circuit board 50 (the 2nd, = the end 12 can be designed differently according to requirements, and the other ::: Umbrella \ count. As for the end 12 there are many types Please note that the illustration is only for illustration: This creation is not limited to what it can be implemented. The reset element is connected to the wire 30 '. Generally speaking, the solder is used to weld: The element 20 and the wire 30 are soldered to each other. Please continue to refer to "Figure 2" and "Figure 3" to explain the assembly of the test probe structure of this creation, here is a brief description of the test fixture, which mainly contains the carrier substrate 4 〇, for the printed circuit board 50 to be tested. The printed circuit board 50 is covered with wires (or traces), and the industry uses such test fixtures to move the printed circuit board 50. Measure the line f to confirm the continuity of the trace. The carrier substrate 40 has micro-holes 41 corresponding to the wiring of the printed circuit board 50. After the combination of the probe, the reset element 20 and the wire 30, the carrier substrate 40 The micro-hole 41 is penetrated below, and the probe 10 is partially exposed on the The hole 41, the reset element 20 will provide a certain compression and recovery spring force, so that the probe 10 is placed by the printed circuit board 50 and buried in the micro-hole 4 a distance. When the printed circuit board 50 is removed, the probe The needle 10 will return to the state of protruding the micro-hole 41. The other end of the lead 30 relative to the soldering reset element 20, then
M258288 、創作說明（5) 連接到外部的檢測儀器（圖中未 、 板5 0之線路導通测試作業。另㊉ ，即可進行印刷電路 法’導線30相對於銲固復位元件u的是’業界-般的作 埠60，#使用|測儀器來進行 =端是先搭接於連接 為方便取出探針10或控制其外露的;^。另需補充的是，’ 載基板40的頂側增設壓板7〇以制^ ，亦可選擇地於承 將探針1G保持於承載基板40以避的槽持緣Η，而 本創作所揭露之檢測探針处構^ 組裝’而具有生產成本低廉，：=，其組成元件少，易於 現今產業界大量生產，⑯生產己迅速等優2，完全符合 與實用之優良設計。— 之诉求，實乃兼顧創意 表 Τ、上所述，本創作實一 新穎性、進步性與產掌利 "夕付之創新產品，極具 請要件，•依專利法^以二符Ϊ新型專利之申 案專利，以保障創作者之權益。明貝杳查委貝賜准本 以上所述者，僅為太 非用來限定本新型的實施^其中的較佳實施例而已，並 圍所作的均等變化*修飾1^ ’即凡依本創作中請專利範 艾化/、G飾，皆為本創作專利範圍所涵罢。 M258288 圖式簡單說明 第1圖為本創作檢測探針結構之分解示意圖。 第2圖為本創作檢測探針結構之裝配示意圖。 第3圖為本創作檢測探針結構之裝配剖示圖。 【圖示符號說明】M258288 、 Creation instructions (5) Connected to an external testing instrument (not shown in the figure, the circuit continuity test of board 50). In addition, the printed circuit method can be carried out 'the wire 30 is relative to the soldering reset element u' Industry-like working port 60, #Use | Measurement instrument to perform = end is first connected to the connection to facilitate the removal of the probe 10 or control its exposure; ^. It is also necessary to add that, 'the top side of the substrate 40 The pressure plate 70 is added to make the ^, and it is also possible to choose to hold the probe 1G on the carrier substrate 40 to avoid the groove. The detection probe disclosed in this creation is `` assembled '' and has low production costs. : =, It has few components and is easy to mass-produce in the industry today. The production has been rapidly optimized. It is fully in line with the excellent design of practicality. The demand is to take into account the creative table T and the above. A novelty, progressiveness and profitability of the product " Xifu's innovative products are highly demanding, in accordance with the Patent Law ^ a new application patent application patent to protect the rights and interests of the creator. Mingbei check Venezuela grants the above only for too non-use Limit the implementation of the new model ^ Among the preferred embodiments, and make equal changes around * Modification 1 ^ 'Every application for patent Fan Aihua / G decoration according to this creation is covered by the scope of the creation patent M258288 Brief description of the diagram. Figure 1 is an exploded schematic diagram of the structure of the creative detection probe. Figure 2 is a schematic diagram of the structure of the creative detection probe structure. Figure 3 is an assembly sectional view of the structure of the creative detection probe. [Illustration of Symbols]
第10頁 10 探針 11 才當持緣 12 末端 13 傘部 20 復位元件 30 導線 40 承載基板 41 微孔 50 印刷電路板 60 連接埠 70 壓板Page 10 10 Probes 11 Only when holding the edge 12 End 13 Umbrella 20 Reset element 30 Wire 40 Carrier substrate 41 Micro-hole 50 Printed circuit board 60 Port 70 Press plate