M251124 、創作說明（l) 別是有關於一種用 特 【創作所屬 < 技術領域】 认Α ί f作是有關於-種測試裝置 於基板之射頻訊號測試裝置。 【先前技術】 機的二ί革1後，二十世以後計算 蕾曰驊斗Μ類世界▼來深运的影響。從真工官計算機、 栌：的二Ϊ機！1具積體電路的微電腦，人們能利用計算機 二採 大里且繁複的資料處理與運算，並能以多工平 仃处a/方^在維持高度精準與可信度下執行之。 置必到多功能性使用•’使得現今電子裝 求，當舞首^主機广週邊設備以應付不同使用者之使用需 (如介面卡），==必須擴充以安置此些擴充之重要元件 接。而上述之週邊==邊設備可與主機板進行連 利用頻率之傳送，因tiir面與主機板之賢料傳輪其係 與週邊設備介面連週邊設備介面以及主機板 要。 堤接頻率訊號是否穩定，更顯得相對重 關素製作主機板或週邊㈣連接介面之電子t置相 關業者為偵測主機板或调、4 _ 裒置相 是將從生產線製作完成 2連接介面之頻率傳遞，皆 與-連接器進行電性或週邊元件連接介面藉由 該連接器與主機板或；試：當測試完畢後將 得每一待測試之主機板$ ^二面分離，但如此卻使 a週邊疋件連接介面皆必須與連接 w ^2) 緩慢浪費J J，J:插拔動#，無形中不僅使得 ，、主機二週i:::;;拔動作不當之使用以及增加製 接；丨面遭受破壞，影塑 接介面射Γ作成本’因此如何去進扞本撼把十曰 较"面射頻测試，友選仃主機板或週: 去研究開發者。 疋產该電子裝置之相關業： 5式流程 使連接 測結果 元件連 所極力 【創作内 本創 係猎由將 射頻裴置 射頻訊號 本創 係精由複 路板相耦 為達 1，其係 組、一匹 該待 訊號線相 該介 基板可與 該探 容】 作的主 複數個 之阻抗 之功效 作的次 數個探 合進行 上述之 包括有 配電子 測電路 耦合。 要目的 探針調 匹配測 要目的 針形成 測試之 目的， ·· 一待 元件以 板其係 疋提供一種射頻訊號測試菜 整設置以耦合一匹配電子天 試，以達到可精確測試待洞 j提供一種射頻訊號測試裝 一共平面，以達到可平穩與 功效。 t f作係提供一種射頻訊號 測電路板、一介面基板、一 及一處理單元 可與提供至少 測試訊號 面基板與該待 一檢測訊號線 針組與該介面 延伸一適當長度，該探 測電路板相距 相耗合。 基板相連接且朝該待泪| 針組具有複數個探針， 適當距 置，其 件進行 電路板 置，其 待測電 測試裝 探針 一發射 該介面 板方向 地，具 M251124 四、創作說明（3) 有一訊號探針以及至少二接地探針v 該匹配電子元件與該介面基板相 該接地探針進行電訊導通。 口 ’且可與至少二 其中，藉由該探針組與該待測電路 接，將進入該待測電路板之測試訊號以▲遵仃接觸對位連 介面基板，使該測試訊號可經由兮^ 為掩針組傳遞至該 〇配雷j -. 配電子元件相匹配進入該檢測訊號線中 卞凡件且與該匹 為達上述之目的，本創作射頻测試 施例，其係包括有··一待測電路板、一乂罝之另一較佳實 組、一印刷線路以及—處理單元。 介面基板、一探針 該待測電路板其係可與提供至少一 訊號線相耦合。 ^武訊號之一發射 該介面基板與該待測電路板相距一 基板可與一檢測訊號線相轉合。 田距離，該介面 該探針組與該介面基板相連接且朝該 延伸一適當長度，該探針組具有複數個+ d電路板方向 有其係具有一訊號探針以及至少二接地私，較佳地，具 該印刷線路設於該介面基板，可提供 探針進行電訊導通。 至少二該接地 其中，藉由該探針組與該待測電路板 接，將進人該待測電路板之測試訊號以=接觸對位連 介面基板，使該測試訊號可經由該印刷線$組傳遞至該 號線中。 岭進入該檢測訊M251124 、 Creation note (l) Especially about a kind of application [Creation belongs to the technical field] It is recognized that there is a kind of test device-based RF signal test device on the substrate. [Previous technique] After the second revolution of machine 1 and the twentieth century, the calculation of the impact of Lei Yue's M-type world ▼ on Shen Yun. From the real worker computer, 栌: Erji machine! A microcomputer with integrated circuits, people can use the computer to collect large and complex data processing and calculations, and can perform a / square ^ with multiple levels of operation while maintaining high accuracy and reliability. Must be used to multi-function use • 'Make the current electronic equipment requirements, when the dance first ^ host and peripheral equipment to meet the needs of different users (such as interface cards), == must be expanded to accommodate these important components of expansion . The peripheral device can be connected to the motherboard using the frequency transmission, because the tiir surface and the transmission wheel of the motherboard need to connect the peripheral device interface with the peripheral device interface and the motherboard. Whether the frequency signal of the bank connection is stable is more important. The electronics manufacturer of the main board or the peripheral interface is required to detect the main board or adjust the connection. 4 _ The main phase will be completed from the production line. Frequency transmission, electrical connection with the-connector or peripheral component interface through the connector and the motherboard; test: after the test is completed, each motherboard to be tested will be separated by two sides, but so The connection interface of peripheral files must be connected with w ^ 2) Slowly waste JJ, J: plug and pull #, not only makes it impossible, the host two weeks i ::: ;; improper use of pull action and increase the connection If the surface is damaged, the shadow plastic interface shoots 作 for the cost. Therefore, how to go to the top of this page and test the radio frequency test, choose the motherboard or the week: Go to the developer. Related industries that produce this electronic device: The 5-type process makes the connection of the test result components extremely strong. [The creation of the original creative system is based on the RF signal. The original creative system is coupled to the circuit board to reach 1. Group, one pair of the signal line to be processed, the dielectric substrate can be combined with the main and multiple impedances, and the number of probes can be combined to perform the above-mentioned including the electronic test circuit coupling. The purpose of the probe is to adjust the test to the purpose of the pin formation test. ··· A standby component is provided with a system to provide a radio frequency signal test setup to couple a matching electronic day test to achieve accurate testing. An RF signal test device is coplanar to achieve smoothness and efficiency. The tf operation system provides a radio frequency signal test circuit board, an interface substrate, and a processing unit, and can provide at least a test signal surface substrate and the test signal pin group and the interface to extend an appropriate length, and the detection circuit board is spaced apart. Phase consumption together. The substrate is connected and towards the tear | The needle set has a plurality of probes, placed at a proper distance, and the components are placed on the circuit board. The probe for the electrical test device to be tested emits the direction of the interface panel, with M251124. 4. Creation instructions (3) There is a signal probe and at least two ground probes. V The matching electronic component is in electrical communication with the interface substrate and the ground probe. And can be connected to at least two of them, through the probe set and the circuit under test, the test signal entering the circuit board under test is contacted with the alignment interface substrate by ▲, so that the test signal can pass through ^ In order to pass the pinning group to the 〇 配 雷 j-. The electronic components are matched into the detection signal line and all pieces are matched with the horse to achieve the above purpose. This creative RF test example includes: ·· A circuit board to be tested, another preferred real group, a printed circuit, and a processing unit. Interface substrate, a probe The circuit board under test can be coupled to provide at least one signal line. ^ One of the Wu signals is transmitted. The interface substrate is separated from the circuit board under test. The substrate can be combined with a detection signal line. Field distance, the interface, the probe set is connected to the interface substrate and extends an appropriate length toward the interface, the probe set has a plurality of + d circuit board directions, and the system has a signal probe and at least two ground pins. Preferably, the printed circuit is provided on the interface substrate, and a probe can be provided for electrical conduction. At least two of the grounds are connected to the circuit board under test through the probe set, and the test signal entering the circuit board under test is contacted with the alignment interface substrate so that the test signal can pass through the printed wire. The group is passed to the line. Ridge enters the test message
第9頁 M25J124 勾、創作說明（4) 【實施方式】 為使貴審查委員能對本創作之特徵、目的及 更進一步的認知與瞭解，茲配合圖式詳細說明如月b ^參閱第la圖所示，其係為本創作射頻 第一較佳實施例系統配置示意圖。本創 j j凌置 =包括，：-待測電路板i、一介面]基作板 二綠匹配電子70件6。本創作之待測電路板1可盥-發射 Γίί2導相Γ合而二提供：待測電路板1與該發射 之^ Λ導通，而該介面基板3與該待測電路板 =，，面基板3可與一檢測訊號線5相搞合，以提適· 忒"面基板3與該檢測訊號線2之電訊導通，因此 ，、 =4裝置能更方便進行檢測且更精確獲得檢測結果，兮 I射訊號線2與該檢測訊號線5之阻抗其係為相互匹配，= 即該發射訊號線2與該檢測訊號線5之阻抗為相等亦 待測電路板1可以為週邊元件連接介面匯流排 ”中’ (Peripheral Comp0nent Interc〇nnect ;pci)或他 頻訊號電路板，合先敘明。 種射 1該探針組4係與該介面基板3相連接且朝該 1方向延伸-適當長奶，丨中該距離d係大於該長度:路： 此忒探針組4之底端與該待測電路板丨可以具有些許空 :本f作較佳實施例中，該探針組4係可藉由該介面工基曰板3 進灯:線性位移運動91與該待測電路板丨作接觸對位連 接，當然亦可以是由該待測電路板丨進行 該探針組4作接觸對位連接’諸如元件相對運動之=係 M251124 創作說明（5) 2ί 2 ί 2藝者所能依據上述揭露而加以變化實施，仍 義所在’亦不脫離本創作之精神和範 若使該探針组4夕，'且〜4與該待測電路板1進行接觸對位連接’ 針合同時接觸4稷數個探針皆是為等長，則該複數個探 觸二待=板卜以共平面均勻施力於該待 的1叶而阶w /， 數個探針亦可以配合待測電路板1 的°又计而配置為不等常的狀態。 -&，^於"亥發射訊號線2係藉由一射頻產生器（圖中未 =少一測試訊號，”該測試訊號係為射 電路板ϋι /，5^試訊號經由該發射訊號線2傳送至該待測 板1而传/Γ兮、°丨以藉由该楝針組4之各探針接觸該待測電路 面基板t r μ試訊號可平穩且確切傳遞電訊訊號至該介 較佳：施：：2圖所不，其係為本創作射頻測試裝置第二 二:統配置示意圖。以下所述之本創作另-較佳 ^::同之因2部份的元件係相同或類似於前述實施例， 似之-2 件將直接Ή相同之名稱及編號，且對於類 似=π件則給予相同名稱但在原編號後另增加一 以資區別且不予贅诚人券 4τ Λ ] ^ 、 裝置降H、f夕：本創作之射頻訊號測試 ^置除上述之早兀外更包括有一處理單元7，該 f可該据發：訊號線2卩及該檢測訊號線5相連#，該處理單元 一,測試訊號經由該發射訊號線2至該待測電路 可以A、中式訊號其係為—射頻訊號，而該處理單元7 了以為一網路分析儀或頻譜分析儀等，而該處理單元7可Page 25 M25J124 Tick, Creation Instructions (4) [Implementation] In order to allow your review committee to understand the characteristics, purpose, and further understanding of this creation, we will explain the details in conjunction with the drawings as shown in Figure b ^ See Figure la It is a schematic diagram of the system configuration of the first preferred embodiment of the RF creation. The original j j 凌 置 = includes:-the circuit board to be tested i, an interface] the base board two green matching electronics 70 pieces 6. The circuit board 1 to be tested in this creation can be launched-transmitting Γίί 2 phase Γ combined and two provided: the circuit board 1 to be tested is in communication with the emission ^ Λ, and the interface substrate 3 and the circuit board under test are =, the surface substrate 3 can be combined with a detection signal line 5 to improve the communication between the surface substrate 3 and the detection signal line 2. Therefore, the device = 4 can more easily perform the detection and obtain the detection result more accurately. The impedance of the radio signal line 2 and the test signal line 5 are matched with each other, that is, the impedance of the transmit signal line 2 and the test signal line 5 are equal. The circuit board 1 to be tested can also be a peripheral interface connection bus. Row "(Peripheral Comp0nent Interc〇nnect; pci) or other frequency signal circuit board, first described. Seed 1 The probe set 4 is connected to the interface substrate 3 and extends in the direction of 1-appropriate length The distance d in the milk is greater than the length: Road: The bottom end of the probe set 4 and the circuit board under test may have some empty space: In the preferred embodiment of this f, the probe set 4 is This interface can be used for the board 3 to enter the light: linear displacement movement 91 to interface with the circuit board under test Alignment connection, of course, it is also possible to connect the probe set 4 to the contact alignment connection by the circuit board under test, such as the relative movement of components = M251124 Creation instructions (5) 2ί 2 ί 2 Artists can follow the above Reveal it and implement it in a different way, still in the right place, without departing from the spirit of this creation, and if the probe set is to be used overnight, 'and ~ 4 is in contact with the circuit board 1 to be tested, and the connection is made during the pin contact. 4 合同The probes are all the same length, then the plurality of probes are equal to each other, and the plate is applied uniformly to the 1-leaf and step w / of the same by several planes. The probes can also cooperate with the circuit board 1 to be tested. ° is counted and configured in an inconsistent state.-&Amp;, ^ 于 " Hai transmission signal line 2 is through a radio frequency generator (not shown in the figure = one less test signal, "The test signal is a radio The circuit board ϋι /, 5 ^ test signals are transmitted to the board under test 1 through the transmitting signal line 2 and / Γxi, ° 丨 to contact the circuit board under test tr through the probes of the pin set 4 The μ test signal can smoothly and accurately pass the signal to the media: Shi :: 2 Picture is not, it is based on the creation of radio frequency Test device No. 22: Schematic diagram of system configuration. The original creation described below is another-better ^ :: The same as the 2 parts of the components are the same or similar to the previous embodiment, similar-2 pieces will be directly the same Name and number, and for similar = π pieces, the same name will be given, but another one will be added after the original number to distinguish it from others and will not be superfluous coupons 4τ Λ] ^, device H, f Xi: RF signal test of this creation ^ In addition to the above-mentioned early stage, a processing unit 7 is included, which can be issued according to: the signal line 2 and the detection signal line 5 are connected #, the processing unit 1, the test signal passes the transmission signal line 2 to the standby The test circuit can be A, Chinese signals, which are radio frequency signals, and the processing unit 7 is considered to be a network analyzer or a spectrum analyzer, and the processing unit 7 can be
第11頁 M251124 創作說明（6) 以模擬方式或是由待測電路板1之一精選樣本（g〇 i d sample )直接產生出該射頻訊號，藉由該處理單元7當進 入該待測電路板1之測試訊號藉由電訊導通，使得測試訊 號可由該探針組4及該介面基板3以該檢測訊號線5傳遞至 該處理單元7，而該處理單元將獲得之結果與測試訊號比 對測試以計算出損耗，以判定出該製造出之該待測電路板 1是否合格可使用。 請參閱第2a圖及第2b圖所示，係為本創作射頻訊號測 試裝置之介面基板3之電路配置數個較佳實施例示意圖。Page 11 M251124 Creation Instructions (6) The RF signal is directly generated in analog mode or by a selected sample (goid sample) of the circuit board 1 under test, and the processing unit 7 enters the circuit board under test through The test signal of 1 is conducted by telecommunication, so that the test signal can be transmitted from the probe set 4 and the interface substrate 3 to the processing unit 7 by the detection signal line 5, and the processing unit compares the obtained result with the test signal. The loss is calculated to determine whether the manufactured circuit board 1 to be tested is qualified for use. Please refer to FIG. 2a and FIG. 2b, which are schematic diagrams of several preferred embodiments of the circuit configuration of the interface substrate 3 of the test device for creating a radio frequency signal.
該探針組4具有複數個探針，較佳地，具有一訊號探針4 1 以及至少二接地探針4 2，且較佳地，接地探針4 2分別設置 於該訊號探針4 1之二側，因此該探針組4形成為一三角幾 何形狀，於本創作較佳實施例中，該接地探針42係設置左 右對稱各有一個，然接地探針42之數目並不限於此，可視 實際狀況而增減。而如圖2 a中，該介面基板3更設有一印 刷線路8連接至少二該接地探針42，該印刷線路8可以直接 以銲接方式耦合該匹配電子元件6，該匹配電子元件6於本 創作中可以為一電感，當然亦可因不同之測試需求進行連 接不同電子元件，以上可將射頻訊號測試裝置之阻抗匹配 達到最佳，以精確測試出該待測電路板1之射頻訊號之效 能。以下所述之本創作另一較佳實施例中，因大部份的元 件係相同或類似於前述實施例，因此相同之元件將直接心 予相同之名稱及編號且不予贅述，合先敘明。如圖2 b中， 該介面基板3上僅設有一印刷線路8連接至少二該接地探針The probe set 4 has a plurality of probes, preferably, a signal probe 4 1 and at least two ground probes 4 2, and preferably, the ground probes 4 2 are respectively disposed on the signal probe 4 1. On the other side, the probe set 4 is formed into a triangular geometry. In the preferred embodiment of the present invention, the grounding probes 42 are provided symmetrically, but the number of the grounding probes 42 is not limited to this. , Increase or decrease depending on the actual situation. As shown in FIG. 2a, the interface substrate 3 is further provided with a printed circuit 8 connected to at least two of the ground probes 42. The printed circuit 8 can be directly coupled to the matching electronic component 6 by soldering. It can be an inductor, and of course, different electronic components can be connected for different test needs. The above can optimize the impedance matching of the RF signal test device to accurately test the efficiency of the RF signal of the circuit board 1 under test. In another preferred embodiment of the present invention described below, since most of the components are the same or similar to the foregoing embodiment, the same components will be given the same name and number directly and will not be described in detail. Bright. As shown in FIG. 2b, the interface substrate 3 is provided with only one printed circuit 8 connected to at least two of the ground probes.
M251124M251124
此雖可以省 而使得射頻 仍不影響判 果。 42，如 不相等 此，但 格之結 綜 可精確 相耦合 業界之 唯 之限制 之均等 離本創 狀況。 合上述，本 别试待测電 進行測試， 需求並提高 以上所述者 本創作的範 變化及修飾 作之精神和 略該匹配電子元件6，但卻因阻抗匹配 損耗或反射損耗會有所差異，即使如 定出該製造出之該待測電路板1是否合 創作提出一種射頻訊號測試裝置，確實 路板之射頻訊號及可平穩與待測電路板 的確可以克服習用技術之缺失，滿足產 產業競爭力。 ，僅為本創作之較佳實施例，當不能以 圍。即大凡依本創作申請專利範圍所做 將不失本創作之要義所在，亦不脫 乾圍，故都應視為本創作#進—步 M251124 圖式簡單說明 " 【圖式簡單說明】 第1 a圖係為本創作射頻訊號測試裝置第一較佳實施例 系統配置示意圖。 第1 b圖係為本創作射頻訊號測試裝置第二較佳實施例 系統配置示意圖。 第2a圖係為本創作射頻訊號測試裝置之介面基板之電 路配置第一較佳實施例示意圖。 第2b圖係為本創作射頻訊號測試裝置之介面基板之電 路配置第二較佳實施例示音 圖號說明： 1〜待測電路板 3〜介面基板 41〜訊號探針 5〜檢測訊號線 7〜處理單元 9 1〜線性位移運動 h〜長度 2〜發射訊號線 4〜探針組 4 2〜接地探針 6〜匹配電子元件 8〜印刷線路 d〜距離Although this can be saved, the radio frequency still does not affect the judgment. 42, if it is not equal to this, but the synthesis of the grid can be precisely coupled with the industry's only limit of equality and the original situation. Based on the above, this test does not test the electricity to be tested. It requires and improves the spirit of the above-mentioned creative changes and modifications of the work and should be used to match the electronic components. However, due to impedance matching loss or reflection loss, there will be differences. Even if it is determined whether the manufactured circuit board 1 to be tested is compatible with the RF signal test device, the radio frequency signal of the circuit board and the circuit board that can be stabilized and tested can indeed overcome the lack of conventional technology and satisfy the production industry. Competitiveness. It is only a preferred embodiment of this creation, and should not be covered. That is to say, what everyone does in accordance with the scope of the patent application for this creation will not lose the essence of this creation, nor will he break away from it. Therefore, it should be regarded as this creation # 进 — 步 M251124 Simple Explanation of the Schema "[Schematic Illustration of the Schematic] 1a is a schematic diagram of the system configuration of the first preferred embodiment of the RF signal testing device. Figure 1b is a schematic diagram of the system configuration of the second preferred embodiment of the RF signal test device. Fig. 2a is a schematic diagram of a first preferred embodiment of a circuit configuration of an interface substrate for creating a radio frequency signal test device. Figure 2b shows the circuit configuration of the interface board of the RF signal test device. The second preferred embodiment is illustrated in the following figure: 1 ~ circuit board to be tested 3 ~ interface board 41 ~ signal probe 5 ~ detection signal line 7 ~ Processing unit 9 1 ~ Linear displacement movement h ~ Length 2 ~ Transmit signal line 4 ~ Probe set 4 2 ~ Ground probe 6 ~ Matching electronic component 8 ~ Printed line d ~ Distance
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