TWI831384B - 發光裝置 - Google Patents
發光裝置 Download PDFInfo
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- TWI831384B TWI831384B TW111135723A TW111135723A TWI831384B TW I831384 B TWI831384 B TW I831384B TW 111135723 A TW111135723 A TW 111135723A TW 111135723 A TW111135723 A TW 111135723A TW I831384 B TWI831384 B TW I831384B
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Abstract
一種發光裝置,包括基板、導光元件、多個光源以及多個反射膜。導光元件設置在基板上且具有多個貫孔。多個光源設置在基板上且分別設置在多個貫孔中。多個反射膜分別與多個光源重疊。
Description
本發明是有關於一種電子裝置,且特別是有關於一種發光裝置。
在發光裝置中,如何降低整體的厚度並維持所需的亮度或亮度均勻度,為研發人員當前欲解決的問題之一。
本發明提供一種發光裝置,其可降低整體的厚度並維持所需的亮度或亮度均勻度。
在本發明的一實施例中,發光裝置包括基板、導光元件、多個光源以及多個反射膜。導光元件設置在基板上且具有多個貫孔。多個光源設置在基板上且分別設置在多個貫孔中。多個反射膜分別與多個光源重疊。
為讓本發明的上述特徵和優點能更明顯易懂,下文特舉實施例,並配合所附圖式作詳細說明如下。
現將詳細地參考本發明的示範性實施例,示範性實施例的實例說明於附圖中。只要有可能,相同元件符號在圖式和描述中用來表示相同或相似部分。
本揭露通篇說明書與所附的申請專利範圍中會使用某些詞彙來指稱特定元件。所屬技術領域具有通常知識者應理解,電子裝置製造商可能會以不同的名稱來指稱相同的元件。本文並不意在區分那些功能相同但名稱不同的元件。在下文說明書與申請專利範圍中,“含有”與“包含”等詞為開放式詞語,因此其應被解釋為“含有但不限定為…”之意。
本文中所提到的方向用語,例如:“上”、“下”、“前”、“後”、“左”、“右”等,僅是參考附圖的方向。因此,使用的方向用語是用來說明,而並非用來限制本揭露。在附圖中,各圖式繪示的是特定實施例中所使用的方法、結構及/或材料的通常性特徵。然而,這些圖式不應被解釋為界定或限制由這些實施例所涵蓋的範圍或性質。舉例來說,為了清楚起見,各膜層、區域及/或結構的相對尺寸、厚度及位置可能縮小或放大。
本揭露中所敘述之一結構(或層別、元件、基材)位於另一結構(或層別、元件、基材)之上/上方,可以指二結構相鄰且直接連接,或是可以指二結構相鄰而非直接連接。非直接連接是指二結構之間具有至少一中介結構(或中介層別、中介元件、中介基材、中介間隔),一結構的下側表面相鄰或直接連接於中介結構的上側表面,另一結構的上側表面相鄰或直接連接於中介結構的下側表面。而中介結構可以是單層或多層的實體結構或非實體結構所組成,並無限制。在本揭露中,當某結構設置在其它結構“上”時,有可能是指某結構“直接”在其它結構上,或指某結構“間接”在其它結構上,即某結構和其它結構間還夾設有至少一結構。
術語“大約”、“等於”、“相等”或“相同”、“實質上”或“大致上”一般解釋為在所給定的值的20%以內,或解釋為在所給定的值的10%、5%、3%、2%、1%或0.5%以內的範圍。
說明書與申請專利範圍中所使用的序數例如“第一”、“第二”等之用詞用以修飾元件,其本身並不意含及代表該(或該些)元件有任何之前的序數,也不代表某一元件與另一元件的順序、或是製造方法上的順序,該些序數的使用僅用來使具有某命名的元件得以和另一具有相同命名的元件能作出清楚區分。申請專利範圍與說明書中可不使用相同用詞,據此,說明書中的第一構件在申請專利範圍中可能為第二構件。
本揭露中所敘述的電性連接或耦接,皆可以指直接連接或間接連接,於直接連接的情況下,兩電路上元件的端點直接連接或以一導體線段互相連接,而於間接連接的情況下,兩電路上元件的端點之間具有開關、二極體、電容、電感、電阻、其他適合的元件、或上述元件的組合,但不限於此。
在本揭露中,厚度、長度與寬度的量測方式可以是採用光學顯微鏡量測或電子顯微鏡中的剖面影像量測而得,但不以此為限。另外,任兩個用來比較的數值或方向,可存在著一定的誤差。此外,用語“給定範圍為第一數值至第二數值”、“給定範圍落在第一數值至第二數值的範圍內”表示所述給定範圍包括第一數值、第二數值以及它們之間的其它數值。例如若第一方向垂直於第二方向,則第一方向與第二方向之間的角度可介於80度至100度之間;若第一方向平行於第二方向,則第一方向與第二方向之間的角度可介於0度至10度之間。
須知悉的是,以下所舉實施例可以在不脫離本揭露的精神下,可將數個不同實施例中的特徵進行替換、重組、混合以完成其他實施例。各實施例間特徵只要不違背發明精神或相衝突,均可任意混合搭配使用。
除非另外定義,在此使用的全部用語(包含技術及科學用語)具有與本揭露所屬技術領域具有通常知識者通常理解的相同涵義。能理解的是,這些用語例如在通常使用的字典中定義用語,應被解讀成具有與相關技術及本揭露的背景或上下文一致的意思,而不應以一理想化或過度正式的方式解讀,除非在本揭露實施例有特別定義。
在本揭露中,電子裝置可包括顯示裝置、發光裝置、天線裝置、感測裝置或拼接裝置,但不以此為限。電子裝置可為可彎折或可撓式電子裝置。顯示裝置可為非自發光型顯示裝置或自發光型顯示裝置。天線裝置可為液晶型態的天線裝置或非液晶型態的天線裝置,感測裝置可為感測電容、光線、熱能或超聲波的感測裝置,但不以此為限。在本揭露中,電子元件可包括被動元件與主動元件,例如電容、電阻、電感、二極體、電晶體等。二極體可包括發光二極體或光電二極體。發光二極體可例如包括有機發光二極體(organic light emitting diode,OLED)、次毫米發光二極體(mini LED)、微發光二極體(micro LED)或量子點發光二極體(quantum dot LED),但不以此為限。拼接裝置可例如是顯示器拼接裝置或天線拼接裝置,但不以此為限。需注意的是,電子裝置可為前述之任意排列組合,但不以此為限。下文將以發光裝置做為電子裝置或拼接裝置以說明本揭露內容,但本揭露不以此為限。
圖1至圖4分別是根據本揭露的一些實施例的發光裝置的局部剖面示意圖。在圖1至圖4中,不同實施例所提供的技術方案可相互替換、組合或混合使用,以在未違反本揭露精神的情況下構成另一實施例。
請參照圖1,發光裝置1可包括基板10、導光元件11、多個光源12以及多個反射膜13。導光元件11設置在基板10上且具有多個貫孔TH。多個光源12設置在基板10上且分別設置在多個貫孔TH中。多個反射膜13分別與多個光源12重疊。須說明的是,本揭露雖以一個貫孔TH中僅設置一個光源12為例,但本揭露並不限於此,在一些實施例中,一個貫孔12可設置多個光源12。
詳細而言,基板10可包括電路板或其上形成有電路的載板,但不以此為限。電路板可包括印刷電路板(Printed Circuit Board,PCB)、可撓性印刷電路板(Flexible Printed Circuit board,FPC)等,但不以此為限。載板的材料可包括玻璃、塑膠、陶瓷、石英、藍寶石或上述材料的組合,但不以此為限。
導光元件11設置於基板10上。舉例來說,可透過黏著層(未繪示)將導光元件11貼附至基板10;或者,可透過其他機構件(未繪示)將導光元件11固定在基板10上,但不以此為限。黏著層可包括光學透明黏著劑(optically clear adhesive,OCA)或光學透明樹脂(optically clear resin,OCR),但不以此為限。
導光元件11適於傳遞光束B。舉例來說,導光元件11的材料可包括塑膠,如聚對苯二甲酸乙二醇酯(polyethylene terephthalate,PET)、聚碳酸酯(polycarbonate,PC)或聚甲基丙烯酸甲酯(Polymethyl Methacrylate,PMMA),但不以此為限。在一些實施例中,導光元件11的表面ST11(即導光元件11之遠離基板10的表面)可為圖案化表面。舉例來說,導光元件11的表面ST11可形成有多個微結構110,且傳遞於導光元件11中的光束B可從多個微結構110射出導光元件11。在一些實施例中,導光元件11的厚度T12可為0.2mm至0.25mm,即0.2mm≦T12≦0.25mm,但不以此為限。導光元件11的厚度T12可定義為導光元件11的表面ST11至基板10的表面S10在基板10的法線方向(如方向D3)上的最短距離。
在一些實施例中,多個微結構110可包括多個三角錐狀結構或截面為三角形之溝槽。如圖1所示,多個微結構110可例如在方向D1上排列且在方向D2上延伸。方向D1與方向D2相交且皆與基板10的表面S10的法線(如方向D3)垂直。在一些實施例中,方向D1與方向D2可彼此垂直,但不以此為限。在其他實施例中,儘管未繪示,多個微結構110可包括其他形狀/種類的微結構,舉例來說,微結構110的俯視形狀及/或截面形狀可以是四邊形、六邊形或其他多邊形,但不以此為限。
導光元件11的多個貫孔TH可分別用以容納多個光源12。舉例來說,每一個貫孔TH可容納一個光源12,但不以此為限。在一些實施例中,多個貫孔TH的側壁面STH的延伸方向可垂直於基板10的表面S10,且多個貫孔TH可透過熱壓印的方式形成,以方便製造,但不以此為限。例如在一些實施例中,貫孔TH的側壁面STH的延伸方向可與基板10的表面S10形成一個非90度的夾角。而在一些實施例中,導光元件11的貫孔TH可以鑽孔方式形成。
貫孔TH的俯視形狀可為圓形、四邊形或其他多邊形,於此不多加限制。此外,貫孔TH的寬度WTH可大於導光元件11的寬度W12且小於貫孔TH的間距ITH(即W12<WTH<ITH)。貫孔TH的寬度WTH為貫孔TH在橫截面(或稱作剖面)中平行基板10表面S10的方向(如方向D1)上的最大寬度。貫孔TH的間距ITH為橫截面中相鄰兩個貫孔TH之間於平行基板10的表面S10的方向(如方向D1)上的最小距離。
至少一個光源12設置在對應的一個貫孔TH中。光源12可透過基板10上的電路(未繪示)而與外部電路(如電源)電性連接,藉此提供光束B。光束B可以是藍光、白光或其他顏色/種類的光。在一些實施例中,多個光源12可排列成陣列,以提供面光源。舉例來說,光源12可包括發光二極體,如有機發光二極體、次毫米發光二極體、微發光二極體或量子點發光二極體,但不以此為限。在一些實施例中,光源12可包括發光二極體晶粒(die)。在另一些實施例中,光源12可包括封裝好的發光二極體,即光源12可包括發光二極體晶粒和覆蓋發光二極體晶粒的保護材料,但不以此為限。
反射膜13設置在對應的光源12的上方且在與基板10的表面S10垂直的方向(如方向D3)上與對應的光源12重疊。在一些實施例中,反射膜13可全面覆蓋容納所述光源12的貫孔TH並覆蓋局部的導光元件11,但不以此為限。反射膜13可用以反射從光源12發出的光束B。舉例來說,反射膜13的材料可包括白漆、白色樹脂、金屬或其他合適的反光材料。
根據不同的需求,發光裝置1還可包括其他元件或膜層。舉例來說,發光裝置1還可包括封裝材料14。封裝材料14設置在貫孔TH中且位於光源12與多個反射膜13之間。舉例來說,封裝材料14可覆蓋對應的光源12並填滿貫孔TH,以提高發光效率。反射膜13可設置在封裝材料14上並覆蓋局部的導光元件11,但不以此為限。封裝材料14可不同於覆蓋發光二極體晶粒的保護材料。舉例來說,封裝材料14可包括紫外光固化膠,但不以此為限。保護材料可包括透明材料、阻水氧材料、其他合適的材料或上述組合,但不以此為限。舉例來說,保護材料可包括環氧樹脂(epoxy)、丙烯酸類樹脂(acylic-based resin)、矽膠(silicone)、聚醯亞胺聚合物(polyimide polymer)或上述組合,但不限於此。
在一些實施例中,發光裝置1還可包括光學膜15、光轉換層16、擴散片17、稜鏡片18以及霧化層(matt layer)19,但不以此為限。
光學膜15設置在導光元件11上方且例如位於導光元件11與光轉換層16之間。光學膜15例如可讓特定光束通過且將其餘光束反射。舉例來說,光學膜15可讓藍光通過且將其餘光束(如紅光或綠光等)反射。但光學膜15的功能可不以此為限。
光轉換層16設置在擴散片17與導光元件11之間。光轉換層16可包括波長轉換材料及/或光過濾材料。舉例來說,光轉換層16可包括螢光(fluorescence)、磷光(phosphor)、量子點(Quantum Dot,QD)、其他合適的材料或上述的組合,但不以此為限。
以光源12為藍光發光二極體為例,光轉換層16可包括用以將藍光轉換成紅光或綠光的波長轉換材料,但不以此為限。透過在導光元件11與光轉換層16之間設置光學膜15有助於提升光利用率或亮度。具體地,從光源12發出的光束B向上傳遞至反射膜13後被反射膜13反射。被反射膜13反射的光束B從貫孔TH的側壁面STH進入導光元件11中並且至少有一部分的光束B以全反射的方式在導光元件11中傳遞。而一部分在導光元件11中傳遞的光束B從微結構110射出導光元件11。設置在導光元件11與光轉換層16之間的光學膜15可讓從導光元件11射出的藍光通過,使得來自導光元件11的光束B(如藍光)能夠穿過光學膜15且傳遞至光轉換層16。光轉換層16將藍光轉換成紅光或綠光,且紅光或綠光可朝四面八方傳遞,其中朝導光元件11傳遞的紅光或綠光可再經由光學膜15的反射而有機會從發光裝置1輸出。
在另一些實施例中,光源12可採用白光發光二極體,且發光裝置1可省略光學膜15以及光轉換層16。
擴散片17設置在導光元件11與稜鏡片18之間且例如位於光轉換層16與稜鏡片18之間。擴散片17有助於提升亮度的均勻度。
稜鏡片18設置在導光元件11上方。稜鏡片18可用以匯聚光束,使亮度提升。在一些實施例中,稜鏡片18可為逆稜鏡片,即稜鏡片18中的圖案化結構180位於稜鏡片18的基材181靠近導光元件11的表面。在另一些實施例中,儘管未繪示,稜鏡片18可為正稜鏡片(稜鏡片18中的圖案化結構180位於稜鏡片18的基材181遠離導光元件11的表面)。
霧化層19設置在導光元件11上方,例如位於稜鏡片18的基材181上方。霧化層19可用以進一步提升亮度均勻度或降低其下方瑕疵或雜質的可視性。須說明的是,在本揭露中,霧化層19可通過將基材181圖案化而形成,或是於稜鏡片18的上方設置另一層具霧化表面的光學膜層。
在圖1的實施例中,透過將導光元件11設置在基板10上,並在導光元件11中形成容納多個光源12的多個貫孔TH,有助於降低發光裝置1整體的厚度。此外,透過在光源12上方的多個反射膜13以及導光元件11的圖案化的表面ST11(多個微結構110),可將來自光源12的光束B分散,提高亮度均勻度,或是有助於增加光源12的間距,進而可減少光源12的數量或降低成本。另外,透過在導光元件11上方設置光轉換層16有助於形成白光或提升色純度。透過在導光元件11與光轉換層16之間設置光學膜15有助於提升光利用率或亮度。透過在導光元件11上方設置擴散片17有助於提升亮度的均勻度。透過在導光元件11上方設置稜鏡片18可用以將散射的光集中向上而增加從發光裝置1射出的光的亮度。透過在導光元件11上方設置霧化層19可用以進一步提升亮度均勻度或降低其下方瑕疵或雜質的可視性。
請參照圖2,發光裝置1A與圖1的發光裝置1的主要差異說明如下。發光裝置1A還包括多個擋牆結構20。多個擋牆結構20設置在基板10上且在基板10的法線方向上有最大高度H。擋牆結構20的最大高度H可小於導光元件的厚度T12。其中導光元件11A具有從導光元件11A的底面SB11延伸至導光元件11A的內部的多個凹槽G,且多個擋牆結構20分別嵌入多個凹槽G。透過多個擋牆結構20以及多個的凹槽G的設計將導光元件11A固定在基板10上。
在一些實施例中,擋牆結構20的材料可包括吸光材料,如黑色樹脂,但不以此為限。如此,擋牆結構20還可用以遮蔽至少部分來自相鄰導光元件11A的光束B,而有助於實現區域點亮(local dimming)功能。
請參照圖3,發光裝置1B與圖1的發光裝置1的主要差異說明如下。在發光裝置1B中,光轉換層16設置在擴散片17與稜鏡片18B之間,使傳遞至光轉換層16的光束分佈更為均勻。此外,發光裝置1B包括堆疊在導光元件11上的一個或多個(如兩個)稜鏡片18B。稜鏡片18B可例如為正稜鏡片,即稜鏡片18B中的圖案化結構180位於稜鏡片18B的基材181遠離導光元件11的表面。
在一些實施例中,發光裝置1B還可包括堆疊在導光元件11上的一個或多個(如兩個至五個)光學膜21。多個光學膜21可例如位於光轉換層16與稜鏡片18B之間。光學膜21例如可用以降低多個光源12的可視性。舉例來說,光學膜21的基材212的表面ST21上可形成有多個聚光微結構210,且光學膜21的基材212的底面SB21上可形成有多個散光微結構211。多個聚光微結構210例如為在方向D1上排列且在方向D2上延伸的多個三角錐狀微結構,但不以此為限。多個散光微結構211例如為在方向D1上排列且在方向D2上延伸的多個半圓球狀微結構,但不以此為限。多個散光微結構211也可為多個巨蛋(dome)狀微結構。
在另一些實施例中,儘管未繪示,發光裝置1B還可包括圖2的光學膜15、多個擋牆結構20或上述的組合。在另一些實施例中,儘管未繪示,發光裝置1B可省略光轉換層16。在另一些實施例中,儘管未繪示,可以一個或多個逆稜鏡片(參照圖2的稜鏡片18)取代圖3中的多個稜鏡片18B。
請參照圖4,發光裝置1C與圖1的發光裝置1的主要差異說明如下。在發光裝置1C中,以多個光學膜21取代擴散片17。
在另一些實施例中,儘管未繪示,發光裝置1C還可包括圖2的多個擋牆結構20。在另一些實施例中,儘管未繪示,發光裝置1C可省略光轉換層16以及光學膜15。在另一些實施例中,儘管未繪示,可以圖3中的一個或多個稜鏡片18B取代圖4中的逆稜鏡片(稜鏡片18)。
綜上所述,在本揭露的實施例中,透過將導光元件設置在基板上,並在導光元件中形成容納多個光源的多個貫孔,有助於降低發光裝置整體的厚度。此外,透過在光源上方的多個反射膜13以及導光元件的圖案化表面,可將來自光源的光束分散,而有助於增加光源的間距,進而可減少光源的數量或降低成本。在一些實施例中,可透過在導光元件上方設置多種光學膜片來達到亮度均勻度或提升亮度。
另外,本揭露實施例的發光裝置可應用於任何具有面板的電子裝置中,如行動裝置、平板、擴增實境裝置、虛擬實境裝置、穿戴式裝置等,但不以此為限。再者,可通過光學顯微鏡(Optical Microscope,OM)觀察等方式來觀察發光裝置中的結構特徵或架構。
以上各實施例僅用以說明本揭露的技術方案,而非對其限制;儘管參照前述各實施例對本揭露進行了詳細的說明,所屬技術領域具有通常知識者應當理解:其依然可以對前述各實施例所記載的技術方案進行修改,或者對其中部分或者全部技術特徵進行等同替換;而這些修改或者替換,並不使相應技術方案的本質脫離本揭露各實施例技術方案的範圍。
雖然本揭露的實施例及其優點已揭露如上,但應該瞭解的是,所屬技術領域具有通常知識者在不脫離本揭露的精神和範圍內,當可作更動、替代與潤飾,且各實施例間的特徵可任意互相混合替換而成其他新實施例。此外,本揭露的保護範圍並未局限於說明書內所述特定實施例中的製程、機器、製造、物質組成、裝置、方法及步驟,所屬技術領域具有通常知識者可從本揭露揭示內容中理解現行或未來所發展出的製程、機器、製造、物質組成、裝置、方法及步驟,只要可以在此處所述實施例中實施大抵相同功能或獲得大抵相同結果皆可根據本揭露使用。因此,本揭露的保護範圍包括上述製程、機器、製造、物質組成、裝置、方法及步驟。另外,每一請求項構成個別的實施例,且本揭露的保護範圍也包括各個請求項及實施例的組合。本揭露的保護範圍當視隨附之申請專利範圍所界定者為准。
1、1A、1B、1C:發光裝置
10:基板
11、11A:導光元件
12:光源
13:反射膜
14:封裝材料
15、21:光學膜
16:光轉換層
17:擴散片
18、18B:稜鏡片
19:霧化層
20:擋牆結構
110:微結構
180:圖案化結構
181、212:基材
210:聚光微結構
211:散光微結構
B:光束
D1、D2、D3:方向
G:凹槽
H:最大高度
ITH:間距
S10、ST11、ST21:表面
SB11、SB21:底面
STH:側壁面
T12:厚度
TH:貫孔
W12、WTH:寬度
圖1至圖4分別是根據本揭露的一些實施例的發光裝置的局部剖面示意圖。
1:發光裝置
10:基板
11:導光元件
12:光源
13:反射膜
14:封裝材料
15:光學膜
16:光轉換層
17:擴散片
18:稜鏡片
19:霧化層
110:微結構
180:圖案化結構
181:基材
B:光束
D1、D2、D3:方向
ITH:間距
S10、ST11:表面
STH:側壁面
T12:厚度
TH:貫孔
W12、WTH:寬度
Claims (9)
- 一種發光裝置,包括:基板;導光元件,設置在所述基板上且具有多個貫孔;多個光源,設置在所述基板上且分別設置在所述多個貫孔中;多個反射膜,分別與所述多個光源重疊;以及封裝材料,設置在所述多個貫孔中且位於所述多個光源與所述多個反射膜之間。
- 如請求項1所述的發光裝置,其中所述封裝材料為紫外光固化膠。
- 如請求項1所述的發光裝置,其中所述導光元件的表面為圖案化表面。
- 如請求項1所述的發光裝置,還包括:稜鏡片,設置在所述導光元件上方。
- 如請求項4所述的發光裝置,其中所述稜鏡片為逆稜鏡片。
- 如請求項4所述的發光裝置,還包括:擴散片,設置在所述導光元件與所述稜鏡片之間。
- 如請求項6所述的發光裝置,還包括:光轉換層,設置在所述擴散片與所述稜鏡片之間。
- 如請求項6所述的發光裝置,還包括:光轉換層,設置在所述擴散片與所述導光元件之間。
- 如請求項1所述的發光裝置,還包括:多個擋牆結構,設置在所述基板上,其中所述導光元件具有從所述導光元件的底面延伸至所述導光元件的內部的多個凹槽,且所述多個擋牆結構分別嵌入所述多個凹槽。
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US20090014732A1 (en) * | 2004-09-07 | 2009-01-15 | Takanori Nishida | Chip-type light emitting device and wiring substrate for the same |
TW201247058A (en) * | 2011-01-17 | 2012-11-16 | Ibiden Co Ltd | LED wiring board, light emitting module, method for manufacturing LED wiring board and method for manufacturing light emitting module |
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- 2022-09-21 TW TW111135723A patent/TWI831384B/zh active
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US20090014732A1 (en) * | 2004-09-07 | 2009-01-15 | Takanori Nishida | Chip-type light emitting device and wiring substrate for the same |
TW201247058A (en) * | 2011-01-17 | 2012-11-16 | Ibiden Co Ltd | LED wiring board, light emitting module, method for manufacturing LED wiring board and method for manufacturing light emitting module |
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