TWI828976B - Heat dissipation element for semiconductor power devices and circuit board having the same - Google Patents
Heat dissipation element for semiconductor power devices and circuit board having the same Download PDFInfo
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- 230000017525 heat dissipation Effects 0.000 title claims abstract description 79
- 239000004065 semiconductor Substances 0.000 title claims abstract description 45
- 239000000919 ceramic Substances 0.000 claims abstract description 58
- 229910052751 metal Inorganic materials 0.000 claims abstract description 36
- 239000002184 metal Substances 0.000 claims abstract description 36
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- 238000001816 cooling Methods 0.000 claims description 2
- 239000002918 waste heat Substances 0.000 abstract description 12
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- 229910052802 copper Inorganic materials 0.000 description 3
- 239000010949 copper Substances 0.000 description 3
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- 229910052742 iron Inorganic materials 0.000 description 3
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 3
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- 238000001746 injection moulding Methods 0.000 description 1
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Abstract
Description
本發明與電路板的散熱有關,特別是指一種用於半導體功率元件的洩熱元件及具有該元件的電路板。 The present invention relates to heat dissipation of circuit boards, and in particular, refers to a heat dissipation component for semiconductor power components and a circuit board having the component.
關於電路板,都會電性配置多數電子元件,這些電子元件依功率高低都會產生相應的熱,功率愈高所產生的熱也愈高,例如CPU(中央處理器)或GPU(圖形處理器)即為能產生高熱的高功率元件或驅動元件(以下簡稱高功率的半導體功率元件),所以現有電路板都會特別針對這些高功率的半導體功率元件配置散熱器。 Regarding circuit boards, most electronic components are electrically configured. These electronic components will generate corresponding heat depending on the power level. The higher the power, the higher the heat generated, such as a CPU (Central Processing Unit) or a GPU (Graphics Processing Unit). These are high-power components or drive components that can generate high heat (hereinafter referred to as high-power semiconductor power components), so existing circuit boards are equipped with heat sinks specifically for these high-power semiconductor power components.
然而,除了這些高功率的半導體功率元件,電路板上還有許多非屬高功率的一般功率的半導體功率元件(一般功率的半導體功率元件以下簡稱半導體功率元件),這些半導體功率元件所產生的熱雖然不如高功率的半導體功率元件,但仍會產生熱,特別是電路板都會被設置在機殼或機櫃內,導致機殼或機櫃內的環境溫度常常因此而升溫,現有電路板卻未對此設置相應的散熱,從而導致這些半導體功率元件的運作受到影響。 However, in addition to these high-power semiconductor power components, there are also many general-power semiconductor power components that are not high-power on the circuit board (general-power semiconductor power components are hereinafter referred to as semiconductor power components). The heat generated by these semiconductor power components Although it is not as good as high-power semiconductor power components, it still generates heat, especially when circuit boards are installed in a casing or cabinet, causing the ambient temperature in the casing or cabinet to often rise. However, existing circuit boards do not do this. Proper heat dissipation is provided, which affects the operation of these semiconductor power components.
本發明的目的在於提供一種用於半導體功率元件的洩熱元件及具有該元件的電路板。 The object of the present invention is to provide a heat dissipation component for semiconductor power components and a circuit board having the component.
為了達成上述目的,本發明提供一種用於半導體功率元件的洩熱元件,用於設有焊接部的電路板,該洩熱元件包括:一ATZ陶瓷體;以及一金屬層,鍍於該ATZ陶瓷體的一部位,該洩熱元件以該金屬層焊接於所述焊接部;其中,從所述焊接部傳來的熱經由該金屬層傳導給該ATZ陶瓷體,該ATZ陶瓷體的其它部位則為散熱用的散熱面。 In order to achieve the above object, the present invention provides a heat dissipation element for semiconductor power components, which is used for circuit boards with soldering parts. The heat dissipation element includes: an ATZ ceramic body; and a metal layer plated on the ATZ ceramic. A part of the body, the heat dissipation element is welded to the welding part with the metal layer; wherein, the heat transferred from the welding part is conducted to the ATZ ceramic body through the metal layer, and other parts of the ATZ ceramic body are A cooling surface for heat dissipation.
本發明另提供一種具有洩熱元件的電路板,包括:一電路板主體,設有一電路,該電路包含至少一焊接部;以及,至少一洩熱元件,該洩熱元件包含:一ATZ陶瓷體;及,一金屬層,鍍於該ATZ陶瓷體的一部位,該洩熱元件以該金屬層焊接於該焊接部;其中,來自該電路的熱從該焊接部經由該金屬層傳導給該ATZ陶瓷體,該ATZ陶瓷體的其它部位則為散熱用的散熱面。 The present invention also provides a circuit board with a heat dissipation component, including: a circuit board main body provided with a circuit, the circuit including at least one welding portion; and at least one heat dissipation component, the heat dissipation component including: an ATZ ceramic body ; and, a metal layer is plated on a part of the ATZ ceramic body, and the heat dissipation element is welded to the welding part with the metal layer; wherein the heat from the circuit is conducted from the welding part to the ATZ through the metal layer Ceramic body, other parts of the ATZ ceramic body are heat dissipation surfaces for heat dissipation.
相較於先前技術,本發明具有以下功效:能利用ATZ陶瓷體來直接吸取廢熱並將廢熱有效發散,使半導體功率元件的運作不再受廢熱影響。 Compared with the prior art, the present invention has the following effects: it can use the ATZ ceramic body to directly absorb waste heat and effectively dissipate the waste heat, so that the operation of the semiconductor power components is no longer affected by the waste heat.
100:洩熱元件 100:Heat leakage element
1a,1b,1c:ATZ陶瓷體 1a,1b,1c:ATZ ceramic body
11:第一表面 11: First surface
12:第二表面 12: Second surface
14:避讓缺口 14: Avoid the gap
16:第二表面 16: Second surface
3:金屬層 3:Metal layer
700:電路板主體 700:Circuit board body
7:半導體功率元件 7: Semiconductor power components
71,72:接腳 71,72: Pin
81,82:電路線 81,82:Circuit line
圖1 為本發明洩熱元件之第一實施例的立體圖。 Figure 1 is a perspective view of the first embodiment of the heat dissipation element of the present invention.
圖2 為本發明依據圖1的剖視圖。 Figure 2 is a cross-sectional view of the present invention based on Figure 1.
圖3 為本發明電路板的局部俯視示意圖,顯示設有複數洩熱元件。 Figure 3 is a partial top view of the circuit board of the present invention, showing that it is provided with a plurality of heat dissipation components.
圖4 為本發明依據圖3的局部側視示意圖。 Figure 4 is a partial side view of the present invention based on Figure 3.
圖5 為本發明洩熱元件之第二實施例的剖視圖。 Figure 5 is a cross-sectional view of the second embodiment of the heat dissipation element of the present invention.
圖6 為本發明洩熱元件之第三實施例的側視圖。 Figure 6 is a side view of the third embodiment of the heat dissipation element of the present invention.
有關本發明的詳細說明和技術內容,配合圖式說明如下,然而所附圖式僅提供參考與說明用,非用以限制本發明。 The detailed description and technical content of the present invention are described below with reference to the drawings. However, the attached drawings are only for reference and illustration and are not intended to limit the present invention.
本發明提供一種用於半導體功率元件的洩熱元件及具有該元件的電路板,如圖3所示,用於有效發散廢熱,從而確保電路板上的功率元件或驅動元件(以下則以半導體功率元件7來統稱功率元件和驅動元件)的運作得以不受廢熱影響。如圖1至圖2所示為本發明的第一實施例,如圖5和圖6所示則分別為本發明的第二實施例和第三實施例。 The present invention provides a heat dissipation element for semiconductor power components and a circuit board with the component, as shown in Figure 3, which is used to effectively dissipate waste heat, thereby ensuring that the power components or driving components on the circuit board (hereinafter referred to as semiconductor power The operation of components 7 (generally referred to as power components and drive components) is not affected by waste heat. As shown in FIGS. 1 to 2 , the first embodiment of the present invention is shown, and as shown in FIGS. 5 and 6 , the second and third embodiments of the present invention are respectively shown.
如圖3至圖4所示,本發明具有洩熱元件的電路板包括:至少一用於半導體功率元件的洩熱元件100以及一電路板主體700。
As shown in FIGS. 3 to 4 , the circuit board with a heat dissipation component of the present invention includes: at least one
電路板主體700可為一軟式電路板或一硬式電路板,本發明對此並未限定。電路板主體700設有一電路(未標示元件符號),此電路包含複數(即:至少兩個)半導體功率元件7和連接用的複數電路線81、82。
The circuit board
其中的半導體功率元件7係具有複數接腳71、72,這些金屬的接腳71、72可為直立連接的直立接腳(圖中未示),也可為如圖3所示呈橫向連接的橫向接腳,於本實施例中則以橫向接腳為例進行說明。
The
其中的這些金屬的電路線81、82於本發明並未限定係如何形成,以硬式電路板為例係以蝕刻等方式形成電路線81、82,但不以此為限。前述半導體功率元件7連接於電路線81、82。
The present invention is not limited to how the
如圖1至圖4所示,本發明洩熱元件100的第一實施例係包含一ATZ陶瓷體1a和一金屬層3。
As shown in FIGS. 1 to 4 , the first embodiment of the
ATZ陶瓷體1a係藉由射出成型和燒結等製程所製得,因此ATZ陶瓷體1a可射出成各種形狀,例如:球形體、柱形體、三角形體、梯形體或矩形體等,當然也可射出成任何自訂的形狀。如圖1所示者即為矩形體狀的ATZ陶瓷體1a,矩形體狀的ATZ陶瓷體1a具有六個表面,這六個表面包含:一個第一表面11以及五個第二表面12。另需說明的是,本發明中的ATZ陶瓷體1a所用的陶瓷材料係為高比熱、高密度的陶瓷材料,且其所製成的ATZ陶瓷體1a具有:絕緣、耐高溫、具EMI屏蔽功能、熱容量高、散熱性佳、剛性結構強以及化學性穩定等優點。
The ATZ
金屬層3則被鍍(例如電鍍,但不以此為限)於ATZ陶瓷體1a的某一部位,例如鍍於球形ATZ陶瓷體的局部外表面、鍍於柱形體的一端或鍍於三角形體的底面,於本實施例中則以鍍於矩形體狀ATZ陶瓷體1a的第一表面11為例進行說明。至於ATZ陶瓷體1a的其它部位則為矩形體狀ATZ陶瓷體1a的各第二表面12。金屬層3例如可為鎳錫,但不以此為限。
The
洩熱元件100以金屬層3藉由焊接劑(例如焊錫,但不以此為限)焊接於前述複數接腳71、72中的一接腳72(如圖3和圖4所示),使這接腳72被當成前述電路的焊接部;或焊接於前述複數電路線81、82中的一電路線82(如圖3所示),使這電路線82被當成前述電路的焊接部;又或也可將複數洩熱元件100分別焊接於接腳72和電路線82;其中,本發明被當成焊接部的接腳72,可以是一般功率的半導體功率元件的接腳72,也可以是高功率的半導體功率元件的接腳72。換言之,前述被當成焊接部的接腳72和電路線82係為原本即已設於電路板主體700上的既有構件,在圖式未繪示的其它實施例中,也可進一步在前述電路增設有專供洩熱元件100焊接的專用焊接部。
The
藉此,來自半導體功率元件7的熱會先傳導到各接腳71、72和各電路線81、82,接著經由金屬層3將熱直接傳導給ATZ陶瓷體1a吸熱(蓄熱),以利用ATZ陶瓷體1a所具有的各第二表面12來散熱,各第二表面12等同散熱面,因此能有效的讓半導體功率元件7所產生的廢熱經由各第二表面12洩出進而發散,使半導體功率元件7的運作不再受廢熱影響。簡言之,本發明洩熱元件100能直接吸出半導體功率元件7的廢熱並發散到環境中,使半導體功率元件7能因此而降溫。
In this way, the heat from the
需說明的是,前述用以當成焊接部的電路線82,可選擇位於半導體功率元件7旁邊的電路線82來焊接洩熱元件100,但不以此為限。
It should be noted that the
另需說明的是,由於本發明能直接吸取半導體功率元件7所產生的廢熱,並能直接將所吸取的廢熱給發散到環境中,使半導體功率元件7的溫度能與環境溫度產生均化,因此能有效降低半導體功率元件7的溫度,但大環境的環境溫度則沒什麼變化,如此達到均溫效果;換言之,本發明具有很強的均溫效果,能藉由均溫來提升半導體功率元件7的使用壽命。簡單來說,本發明因為均溫,所以在相同的工作溫度下,能夠提高半導體功率元件7的功率;反過來說,在相同的功率下,工作溫度較低,所以能夠延長半導體功率元件7的使用壽命。
It should be noted that since the present invention can directly absorb the waste heat generated by the
如圖5所示,為本發明洩熱元件100的第二實施例,第二實施例大致與前述第一實施例相同,差異僅在第二實施例中的ATZ陶瓷體1b進一步形成有至少一避讓缺口14。
As shown in Figure 5, it is the second embodiment of the
如此一來,在既有的有限空間裡,即使遭遇其它元件(圖中未示,可為電子元件,也可為機械元件)的干涉而無法設置原有的洩熱元件100,但在本第二實施例中卻能利用避讓缺口14來避開其它元件,因此本發明洩熱元件100的第二實施例特別適用於有限的空間。
As a result, in the existing limited space, even if the original
值得說明的是,藉由在ATZ陶瓷體1b的底面形成有如圖5所示的兩個避讓缺口14,以縮小第一表面11的面積,相對也就能以面積相應縮小的金屬層3來焊接於前述焊接部,因此特別適合在有限的空間使用而使金屬層3免於與其它圖中未示的金屬物件接觸短路。
It is worth noting that by forming two
如圖6所示,則為本發明洩熱元件100的第三實施例,第三實施例大致與前述第一實施例相同,差異僅在第三實施例中的ATZ陶瓷體1c的第二表面16不同於第一實施例的第二表面12。
As shown in Figure 6, it is the third embodiment of the
在第三實施例中,ATZ陶瓷體1c的第二表面16被進一步設計成波浪狀,使其第二表面16的面積大於第一實施例的第二表面12的面積而更有利於散熱。較佳而言,則是如圖6所示讓矩形體狀ATZ陶瓷體1c的五個第二表面16都形成波浪狀,只有第一表面11仍是平面而在鍍上金屬層3後得能具有利於焊接的效果。
In the third embodiment, the
以下針對本發明洩熱元件100的散熱進行說明:
The heat dissipation of the
〔1〕、散熱計算-熱傳導: [1], Heat dissipation calculation-heat conduction:
(1-1)、熱傳導:熱源傳出的熱量,持續傳出達到溫度平衡: (1-1) Heat conduction: The heat transferred from the heat source continues to transfer to achieve temperature balance:
q=-KA×△T△d q=-KA×△T△d
q:熱傳量(W) K:熱傳系數(W/m-°K) q: Heat transfer amount (W) K: Heat transfer coefficient (W/m-°K)
T:溫度(°K) d:距離(m) T: Temperature (°K) d: Distance (m)
A:垂直於熱傳方向的截面積(mˆ2) A: Cross-sectional area perpendicular to the heat transfer direction (mˆ2)
其中,熱傳系數(熱傳導率)K可不需特別計較,只要K值大於10的材料,即可以不用去計算。以下第(1-3)點所舉的6個例子所用的材料,其K值都大於10。 Among them, the heat transfer coefficient (thermal conductivity) K does not need to be specially calculated. As long as the K value is greater than 10 for materials, there is no need to calculate it. The materials used in the six examples listed in points (1-3) below all have K values greater than 10.
(1-2)、另種表示法:吸熱材料吸收熱量,達到溫度平衡: (1-2), another representation: the endothermic material absorbs heat and reaches temperature equilibrium:
:材料密度(g/cmˆ3) :Material density (g/cmˆ3)
Cp:比熱(jol/g.°K) △T:溫度差(°K) Cp: Specific heat (jol/g.°K) △T: Temperature difference (°K)
(註:Jol係為焦耳的英文的簡稱) (Note: Jol is the English abbreviation of Joule)
(1-3)、舉例說明(含單位換算): (1-3), examples (including unit conversion):
陽極後的純鋁(Al),比熱C為0.9,比重為2.7g/cmˆ3 Pure aluminum (Al) after anode has a specific heat C of 0.9 and a specific gravity of 2.7g/cmˆ3
氧化鋁(Al2O3),比熱C為0.875,比重為3.9g/cmˆ3 Aluminum oxide (Al2O3), specific heat C is 0.875, specific gravity is 3.9g/cmˆ3
受熱後兩者的溫度都由20℃上昇到75℃,則兩者的單位體積cmˆ3吸熱量各為: After being heated, the temperature of both of them rises from 20℃ to 75℃, then the heat absorption per unit volume cmˆ3 of the two is:
1.鋁Al:0.9×2.7×55=133.65jol(31.9卡或0.0371W) 1. Aluminum Al: 0.9×2.7×55=133.65jol (31.9 calories or 0.0371W)
2.氧化鋁Al2O3:0.875×3.9×55=188.1jol(44.9卡或0.0523W) 2. Alumina Al2O3: 0.875×3.9×55=188.1jol (44.9 calories or 0.0523W)
在相同條件下,通用的散熱或高熱導材料所吸收的熱量如下: Under the same conditions, the heat absorbed by general heat dissipation or high thermal conductivity materials is as follows:
3.銅Cu:Q=0.385×8.96×55=189.7jol(43.4卡或0.0527W) 3. Copper Cu: Q=0.385×8.96×55=189.7jol (43.4 calories or 0.0527W)
4.銀Ag:Q=0.234×10.49×55=134.9jol(32.3卡或0.0341W) 4. Silver Ag: Q=0.234×10.49×55=134.9jol (32.3 cards or 0.0341W)
5.鐵Fe:Q=0.461×7.87×55=199.5jol(47.7卡或0.0554W) 5. Iron Fe: Q=0.461×7.87×55=199.5jol (47.7 calories or 0.0554W)
6.ATZ(氧化鋁-氧化鋯複合材料,ATZ陶瓷):Q=0.89×4.05×55=198.2jol(47.4卡或0.0551W) 6.ATZ (alumina-zirconia composite material, ATZ ceramic): Q=0.89×4.05×55=198.2jol (47.4 calories or 0.0551W)
由上述第3、5、6點可知,ATZ陶瓷的吸熱量幾乎與鐵相同且又優於銅;再者,ATZ陶瓷係為絕緣體,鐵和銅則皆為導體。ATZ陶瓷具有吸熱量高且又是絕緣體的雙重優點。
From
需說明的是,若以實用性進行計算到體積mmˆ3,則上述第6點ATZ的吸熱量=0.0000551W。 It should be noted that if the volume is calculated based on practicality to mmˆ3, then the heat absorption of ATZ in point 6 above = 0.0000551W.
〔2〕、散熱計算-熱對流: [2], Heat dissipation calculation-thermal convection:
(2-1)、熱對流:熱源體與散熱體因空氣流動,對週圍環境釋出(或吸收)的熱,與物體表面積成正比。 (2-1) Thermal convection: The heat source body and heat sink body release (or absorb) heat to the surrounding environment due to air flow, which is proportional to the surface area of the object.
q ' =h×(Tw-Ta);Q=h×A×(Tw-Ta) q ' =h×(Tw-Ta); Q=h×A×(Tw-Ta)
q ' :熱流密度(W/mˆ2) Q:面積A上的傳熱熱量 q ' : Heat flux density (W/mˆ2) Q: Heat transfer amount on area A
Tw:固體表面溫度(°K) A:接觸流體的壁面面積(mˆ2) Tw: Solid surface temperature (°K) A: Wall surface area in contact with fluid (mˆ2)
Ta:流體溫度(°K) h:表面對流熱傳系數(W/mˆ2*K) Ta: fluid temperature (°K) h: surface convection heat transfer coefficient (W/mˆ2 * K)
(2-2)、實際應用單位: (2-2), Practical application units:
1.h(表面對流熱傳系數):靜態=0~5;一般=8~10;強制:>15 1.h (surface convection heat transfer coefficient): static=0~5; general=8~10; mandatory: >15
2.面積:mmˆ2=0.000001mˆ2 2. Area: mmˆ2=0.000001mˆ2
3.1jol=0.239卡;1卡=0.00116W(或1W=860卡) 3.1jol=0.239 cards; 1 card=0.00116W (or 1W=860 cards)
(2-3)、熱對流舉例說明: (2-3) Examples of thermal convection:
一物體接觸流體的總壁面為1mˆ2,其熱流產生的熱對流(熱導率)為8W/mˆ2×K;熱源溫度恆定在75℃(348°K),而環境溫度為20℃(293°K),則其所散掉的熱為:Q=h×A×(Tw-Ta)=8×1×(348-293)=440W The total wall surface of an object in contact with fluid is 1mˆ2, and the heat convection (thermal conductivity) generated by its heat flow is 8W/mˆ2×K; the heat source temperature is constant at 75°C (348°K), and the ambient temperature is 20°C (293°K ), then the heat dissipated is: Q=h×A×(Tw-Ta)=8×1×(348-293)=440W
以實際的電子元件與電路環境來看,表面積為mmˆ2,因此熱對流的散熱是0.00044W/mmˆ2。 Judging from the actual electronic components and circuit environment, the surface area is mmˆ2, so the heat dissipation by thermal convection is 0.00044W/mmˆ2.
3〕、散熱計算-熱輻射: 3〕, heat dissipation calculation-thermal radiation:
(3-1)、熱輻射:物源體與散熱體的表面溫度與周圍環境的差異,產生熱輻射,與絕對溫度差(°K)的四次方相關;也與物體表面積(A)相關。 (3-1) Thermal radiation: The difference between the surface temperature of the source body and the heat sink and the surrounding environment produces thermal radiation, which is related to the fourth power of the absolute temperature difference (°K); it is also related to the surface area (A) of the object .
q"=єσ(Tsˆ4) Q=єσA(Twˆ4-Taˆ4) q " =єσ(Tsˆ4) Q=єσA(Twˆ4-Taˆ4)
q":熱輻射通量 Q:輻射熱總量(W) q " : Thermal radiation flux Q: The total amount of radiant heat (W)
є:輻射放射率(0~1) A:材料外露壁面面積(mˆ2) є: Radiation emissivity (0 ~ 1) A: Material exposed wall area (mˆ2)
σ:Stph-Bog Const.(5.67x10ˆ-8W-mˆ2×°Kˆ4) σ:Stph-Bog Const.(5.67x10ˆ-8W-mˆ2×°Kˆ4)
Tw:物體表面溫度(°K) Ta:環境溫度(°K) Tw: Object surface temperature (°K) Ta: Ambient temperature (°K)
(3-2)、常見物體表面放射率: (3-2). Surface emissivity of common objects:
一般鋁:0.1;陽極鋁:0.9;拋光銅:0.04 General aluminum: 0.1; anode aluminum: 0.9; polished copper: 0.04
氧化銅:0.8;紅磚:0.85;水泥:0.9 Copper oxide: 0.8; red brick: 0.85; cement: 0.9
漆:0.9;ATZ:0.9 Paint: 0.9; ATZ: 0.9
(3-3)、熱輻射舉例說明: (3-3) Examples of thermal radiation:
一物體接觸空氣的總壁面為1mˆ2,該材料的表面放射率為0.9;熱源溫度恆定在75℃(348°K),而環境溫度為20℃(293°K),則其散掉的熱為:Q=єσA(Twˆ4-Taˆ4)=0.9×5.67×10ˆ-8×1×(348ˆ4-293ˆ4)=0.9×5.67×10ˆ-8×1×73×10ˆ8=372.5W The total wall surface of an object in contact with the air is 1mˆ2, and the surface emissivity of the material is 0.9; the heat source temperature is constant at 75°C (348°K), and the ambient temperature is 20°C (293°K), then the heat dissipated is : Q=єσA(Twˆ4-Taˆ4)=0.9×5.67×10ˆ-8×1×(348ˆ4-293ˆ4)=0.9×5.67×10ˆ-8×1×73×10ˆ8=372.5W
以實際的電子元件與電路環境來看,表面積為mmˆ2,而材料放射率為0.9,因此熱輻射的散熱是0.000373W/mmˆ2。 Judging from the actual electronic components and circuit environment, the surface area is mmˆ2, and the material emissivity is 0.9, so the heat dissipation of thermal radiation is 0.000373W/mmˆ2.
總結前述三種散熱計算:在同一材料且相同條件的比較之下,前述〔1〕、熱傳導(吸熱):ATZ=0.0000551W,前述〔2〕、熱對流(散熱):ATZ=0.00044W,前述〔3〕、熱輻射(散熱):ATZ=0.000373W。因此,比較這三種散熱計算可知,ATZ陶瓷的散熱能力(第〔2〕種的熱對流的散熱+第〔3〕種的熱輻射的散熱)遠高於ATZ陶瓷的吸熱能力(第〔1〕種的吸熱量),從而證明ATZ陶瓷確實可以進行散熱,也就是,本發明洩熱元件100確具有能將廢熱有效發散的散熱效果。
To summarize the above three heat dissipation calculations: under the comparison of the same material and the same conditions, the above [1], heat conduction (heat absorption): ATZ = 0.0000551W, the above [2], thermal convection (heat dissipation): ATZ = 0.00044W, the above [ 3], Thermal radiation (heat dissipation): ATZ=0.000373W. Therefore, comparing these three heat dissipation calculations, it can be seen that the heat dissipation capacity of ATZ ceramics (heat dissipation of type [2] thermal convection + heat dissipation of type [3] thermal radiation) is much higher than the heat absorption capacity of ATZ ceramics (type [1] kind of heat absorption), thereby proving that ATZ ceramics can indeed dissipate heat, that is, the
綜上所述,本發明用於半導體功率元件的洩熱元件及具有該元件的電路板,確可達到預期的使用目的,並解決現有技術的缺失,完全符合發明專利申請要件,爰依專利法提出申請,敬請詳查並賜准本案專利,以保障發明人之權利。 To sum up, the heat dissipation element for semiconductor power components of the present invention and the circuit board with the element can indeed achieve the expected purpose of use and solve the deficiencies of the existing technology. It fully meets the requirements for invention patent application and complies with the patent law. If you submit an application, please review it carefully and grant the patent in this case to protect the rights of the inventor.
以上所述者,僅為本發明之較佳可行實施例而已,非因此即侷限本發明之專利範圍,舉凡運用本發明說明書及圖式內容所為之等效結構變化,均理同包含於本發明之權利範圍內,合予陳明。 The above are only the best possible embodiments of the present invention, which do not limit the patent scope of the present invention. All equivalent structural changes made by using the description and drawings of the present invention are also included in the present invention. Within the scope of rights, it shall be stated clearly.
100:洩熱元件 100:Heat leakage element
1a:ATZ陶瓷體 1a:ATZ ceramic body
11:第一表面 11: First surface
12:第二表面 12: Second surface
3:金屬層 3:Metal layer
700:電路板主體 700:Circuit board body
7:半導體功率元件 7: Semiconductor power components
72:接腳 72: Pin
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TW201620342A (en) * | 2014-11-17 | 2016-06-01 | 三菱電機股份有限公司 | Printed circuit board |
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TW201620342A (en) * | 2014-11-17 | 2016-06-01 | 三菱電機股份有限公司 | Printed circuit board |
US20170309983A1 (en) * | 2016-04-26 | 2017-10-26 | Anaren, Inc. | High powered rf part for improved manufacturability |
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