TWI825749B - Manufacturing method of display device - Google Patents

Manufacturing method of display device Download PDF

Info

Publication number
TWI825749B
TWI825749B TW111119806A TW111119806A TWI825749B TW I825749 B TWI825749 B TW I825749B TW 111119806 A TW111119806 A TW 111119806A TW 111119806 A TW111119806 A TW 111119806A TW I825749 B TWI825749 B TW I825749B
Authority
TW
Taiwan
Prior art keywords
substrate
laser light
holding member
display device
light
Prior art date
Application number
TW111119806A
Other languages
Chinese (zh)
Other versions
TW202315110A (en
Inventor
山田一幸
浅田圭介
武政健一
磯野大樹
Original Assignee
日商日本顯示器股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日商日本顯示器股份有限公司 filed Critical 日商日本顯示器股份有限公司
Publication of TW202315110A publication Critical patent/TW202315110A/en
Application granted granted Critical
Publication of TWI825749B publication Critical patent/TWI825749B/en

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/005Processes
    • H01L33/0093Wafer bonding; Removal of the growth substrate
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00Working by laser beam, e.g. welding, cutting or boring
    • B23K26/20Bonding
    • B23K26/21Bonding by welding
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00Working by laser beam, e.g. welding, cutting or boring
    • B23K26/70Auxiliary operations or equipment
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/15Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components having potential barriers, specially adapted for light emission
    • H01L27/153Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components having potential barriers, specially adapted for light emission in a repetitive configuration, e.g. LED bars
    • H01L27/156Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components having potential barriers, specially adapted for light emission in a repetitive configuration, e.g. LED bars two-dimensional arrays
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/005Processes
    • H01L33/0095Post-treatment of devices, e.g. annealing, recrystallisation or short-circuit elimination

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Plasma & Fusion (AREA)
  • Manufacturing & Machinery (AREA)
  • Mechanical Engineering (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Led Device Packages (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Laser Beam Processing (AREA)

Abstract

本發明之目的在於,於包含使用遮光罩之雷射光之照射製程之顯示裝置的裝置方法中,防止雷射光之繞射。 顯示裝置之製造方法包含如下步驟:準備設置有複數個LED晶片之第1基板,以上述複數個LED晶片位於上述第1基板與第2基板之間之方式,將上述複數個LED晶片配置於上述第2基板之上,經由固定於保持上述第1基板之保持構件之遮光罩,對上述複數個LED晶片中之一部分照射雷射光。 An object of the present invention is to prevent diffraction of laser light in a display device installation method including an irradiation process of laser light using a light shield. The manufacturing method of the display device includes the following steps: preparing a first substrate provided with a plurality of LED chips, and arranging the plurality of LED chips on the above-mentioned substrate so that the plurality of LED chips are located between the first substrate and the second substrate. On the second substrate, a part of the plurality of LED chips is irradiated with laser light through a light shield fixed to the holding member holding the first substrate.

Description

顯示裝置之製造方法Manufacturing method of display device

本發明之一實施形態係關於一種顯示裝置之製造方法。尤其關於一種安裝LED(Light Emitting Diode:發光二極體)晶片之顯示裝置之製造方法。One embodiment of the present invention relates to a manufacturing method of a display device. In particular, it relates to a manufacturing method of a display device equipped with an LED (Light Emitting Diode) chip.

近年,作為下一代之顯示裝置,於各像素安裝微小之LED晶片之LED顯示器之開發有所進展。LED顯示器具有於構成像素陣列之電路基板上安裝複數個LED晶片之構造。電路基板於與各像素對應之位置具有用以使LED發光之驅動電路。該等之驅動電路分別與各LED晶片電性連接。In recent years, as the next generation of display devices, there has been progress in the development of LED displays in which tiny LED chips are installed in each pixel. An LED display has a structure in which a plurality of LED chips are mounted on a circuit substrate that forms a pixel array. The circuit board has a drive circuit for causing the LED to emit light at a position corresponding to each pixel. The driving circuits are electrically connected to each LED chip respectively.

於電路基板上安裝複數個LED晶片之方法有各種之方法。例如,已知一種將設置於支持基板之LED晶片與電路基板接著後,僅去除支持基板之方法。例如,於專利文獻1記載有一種藉由使用遮光罩,以較高處理量選擇性地對LED晶片照射雷射光之技術。 [先前技術文獻] [專利文獻] There are various methods for mounting multiple LED chips on a circuit substrate. For example, a method is known in which an LED chip and a circuit substrate provided on a supporting substrate are connected together, and then only the supporting substrate is removed. For example, Patent Document 1 describes a technology that uses a light shield to selectively irradiate laser light to an LED chip with a high throughput. [Prior technical literature] [Patent Document]

[專利文獻1]美國專利第10096740號說明書[Patent Document 1] U.S. Patent No. 10096740 Specification

[發明所欲解決之問題][Problem to be solved by the invention]

如上述先前技術,於遮光罩與照射雷射光之被對象物之間有間隙之情形時,有於遮光罩之開口部產生雷射光之繞射,亦對遮光罩之背側照射雷射光之虞。雷射光之波長越長,雷射光之繞射越顯著。As in the above-mentioned prior art, when there is a gap between the hood and the object irradiated with laser light, there is a risk that the laser light will be diffracted at the opening of the hood and the back side of the hood will be irradiated with laser light. . The longer the wavelength of laser light, the more significant the diffraction of laser light is.

本發明之課題之一在於,於包含使用遮光罩之雷射光之照射製程之顯示裝置之製造方法中,防止雷射光之繞射。 [解決問題之技術手段] One of the subjects of the present invention is to prevent the diffraction of laser light in a manufacturing method of a display device including an irradiation process of laser light using a light shield. [Technical means to solve problems]

本發明之一實施形態之顯示裝置之製造方法包含如下步驟:準備設置有複數個LED晶片之第1基板,以上述複數個LED晶片位於上述第1基板與第2基板之間之方式,將上述複數個LED晶片配置於上述第2基板上,經由固定於保持上述第1基板之保持構件之遮光罩,對上述複數個LED晶片中之一部分照射雷射光。A method for manufacturing a display device according to an embodiment of the present invention includes the following steps: preparing a first substrate provided with a plurality of LED chips, and placing the above-mentioned LED chips so that the plurality of LED chips are located between the first substrate and the second substrate. A plurality of LED chips are arranged on the second substrate, and a part of the plurality of LED chips is irradiated with laser light through a light shield fixed to a holding member that holds the first substrate.

以下,一面參照圖式等,一面對本發明之實施形態進行說明。但,本發明於不脫離其主旨之範圍內,可以各種態樣實施。本發明並非限定於以下例示之實施形態之記載內容而解釋者。圖式係為了使說明更明確,相較於實際態樣,有對各部之寬度、厚度及形狀等模式性表示之情形。然而,圖式僅為一例,並非限定本發明之解釋者。Hereinafter, embodiments of the present invention will be described with reference to the drawings and the like. However, the present invention can be implemented in various forms without departing from the scope of the invention. The present invention is not limited to the description of the embodiments illustrated below and shall not be construed. In order to make the explanation clearer, the drawings may show the width, thickness, shape, etc. of each part more schematically than the actual form. However, the drawings are only examples and do not limit the interpretation of the present invention.

於說明本發明之實施形態時,將自基板朝向LED晶片之方向設為「上」,將其相反方向設為「下」。其中,「上」或「下」之表現僅說明各要件之上下關係。例如,於基板之上配置LED晶片之表現亦包含於基板與LED晶片之間介置其他構件之情形。再者,「上」或「下」之表現並非僅為俯視時各要件重疊之情形,亦包含未重疊之情形。When describing the embodiment of the present invention, the direction from the substrate toward the LED chip is referred to as “upper” and the opposite direction is referred to as “lower”. Among them, the expression "upper" or "lower" only indicates the upper-lower relationship between each element. For example, arranging an LED chip on a substrate also includes interposing other components between the substrate and the LED chip. Furthermore, the expression "up" or "down" is not only the case where the elements overlap when viewed from above, but also includes the case where there is no overlap.

於說明本發明之實施形態時,有時對具備與已說明之要件同樣功能之要件,標註同一符號或於同一符號標註英文字母等之記號,且省略說明。又,對於某要件,於需要區別RGB之各色進行說明之情形時,於顯示其要件之符號之後標註R、G或B之記號加以區別。但,對於其要件,於無需區別為RGB之各色進行說明之情形時,僅使用顯示其要件之符號進行說明。When describing embodiments of the present invention, components having the same functions as those already described may be labeled with the same symbols or symbols such as English letters may be labeled with the same symbols, and descriptions thereof may be omitted. In addition, when it is necessary to explain a certain requirement by distinguishing between RGB colors, the symbol R, G, or B is added after the symbol showing the requirement to distinguish it. However, when the requirements do not need to be explained separately as RGB colors, only the symbols showing the requirements will be used for description.

<第1實施形態> [顯示裝置之製造方法] 圖1係顯示第1實施形態之顯示裝置10之製造方法之流程圖。具體而言,圖1係顯示將形成於元件基板200之複數個LED晶片202轉印於電路基板100之處理。圖2~圖5係顯示第1實施形態之顯示裝置10之製造方法之剖視圖。此處,使用圖1,對將RGB各色之LED晶片202轉印至電路基板100為止之製程進行說明。此時,使用圖2~圖5,對各製程之具體例進行說明。 <First Embodiment> [Manufacturing method of display device] FIG. 1 is a flowchart showing a method of manufacturing the display device 10 according to the first embodiment. Specifically, FIG. 1 shows the process of transferring a plurality of LED chips 202 formed on the device substrate 200 to the circuit substrate 100 . 2 to 5 are cross-sectional views showing the manufacturing method of the display device 10 of the first embodiment. Here, the process until the LED chip 202 of each RGB color is transferred to the circuit substrate 100 is explained using FIG. 1 . At this time, specific examples of each process will be described using Figures 2 to 5.

首先,於圖1之步驟S11中,準備具有複數個LED晶片202R之元件基板200(參照圖2)。複數個LED晶片202R係發出紅色光之LED晶片。LED晶片202R可於半導體基板201上使半導體層成長而形成。作為半導體基板201,例如可使用藍寶石基板。又,作為半導體層例如可使氮化鎵(GaN)成長。但,並未限於該例,例如亦可使用於砷化鎵(GaAs)基板等之其他半導體基板上成長之半導體層(例如,InGaAlP層)形成LED晶片202R。於該情形時,亦可將形成LED晶片202R之其他半導體基板與半導體基板201接著而使用。First, in step S11 of FIG. 1 , an element substrate 200 having a plurality of LED chips 202R is prepared (see FIG. 2 ). The plurality of LED chips 202R are LED chips that emit red light. The LED chip 202R can be formed by growing a semiconductor layer on the semiconductor substrate 201 . As the semiconductor substrate 201, for example, a sapphire substrate can be used. In addition, as the semiconductor layer, for example, gallium nitride (GaN) can be grown. However, the LED chip 202R is not limited to this example. For example, a semiconductor layer (for example, an InGaAlP layer) grown on another semiconductor substrate such as a gallium arsenide (GaAs) substrate may also be used to form the LED chip 202R. In this case, another semiconductor substrate on which the LED chip 202R is formed can also be used in conjunction with the semiconductor substrate 201 .

接著,於圖1之步驟S12中,以複數個LED晶片202R位於元件基板200與電路基板100之間之方式,將複數個LED晶片202R配置於電路基板100之上(參照圖3)。具體而言,於電路基板100上,以連接電極103與各LED晶片202R相對之方式配置元件基板200。此時,以各LED晶片202R之端子電極203R與連接電極103連接之方式,使電路基板100與元件基板200對位。於端子電極203R與連接電極103之間,亦可設置具有接著性之物質。Next, in step S12 of FIG. 1 , the plurality of LED chips 202R are arranged on the circuit substrate 100 in such a manner that the plurality of LED chips 202R are located between the component substrate 200 and the circuit substrate 100 (see FIG. 3 ). Specifically, the element substrate 200 is arranged on the circuit substrate 100 so that the connection electrode 103 faces each LED chip 202R. At this time, the circuit substrate 100 and the element substrate 200 are aligned in such a manner that the terminal electrode 203R of each LED chip 202R is connected to the connection electrode 103 . An adhesive material may be provided between the terminal electrode 203R and the connection electrode 103 .

電路基板100具有相當於複數個像素之區域。如圖3所示,電路基板100於具有絕緣表面之基板101上,具有與各像素對應並驅動LED晶片之驅動電路102。作為基板101,例如可使用玻璃基板、樹脂基板、陶瓷基板或金屬基板。各驅動電路102由複數個薄膜電晶體(TFT:Thin Film Transistor)構成。電路基板100亦稱為陣列基板或TFT基板等。各連接電極103配置於各像素,且分別與驅動電路102連接。對電路基板100之詳細構造予以後述。The circuit board 100 has an area corresponding to a plurality of pixels. As shown in FIG. 3 , the circuit substrate 100 has a driving circuit 102 corresponding to each pixel and driving the LED chip on the substrate 101 with an insulating surface. As the substrate 101, for example, a glass substrate, a resin substrate, a ceramic substrate, or a metal substrate can be used. Each drive circuit 102 is composed of a plurality of thin film transistors (TFTs). The circuit substrate 100 is also called an array substrate, a TFT substrate, or the like. Each connection electrode 103 is arranged in each pixel and connected to the driving circuit 102 respectively. The detailed structure of the circuit board 100 will be described later.

於本實施形態中,顯示於基板101上使用薄膜形成技術形成各驅動電路102及各連接電極103之例,但並非限定於該例者。例如,亦可自第三方取得於基板101之上形成有驅動電路102之基板(所謂主動矩陣基板)作為現成品。於該情形時,只要於取得之基板上形成連接電極103即可。In this embodiment, an example is shown in which each drive circuit 102 and each connection electrode 103 are formed on the substrate 101 using thin film formation technology, but the invention is not limited to this example. For example, a substrate (so-called active matrix substrate) with the driving circuit 102 formed on the substrate 101 can also be obtained from a third party as a ready-made product. In this case, it is sufficient to form the connection electrode 103 on the obtained substrate.

又,於本實施形態中,雖例示覆晶型之LED晶片作為LED晶片202R進行說明,但並非限定於該例者。例如,LED晶片202R亦可為於靠近電路基板100側具有陽極電極(或陰極電極),於距電路基板100較遠側具有陰極電極(或陽極電極)之構造。即,LED晶片202R亦可為具有夾著陽極電極與陰極電極之發光層之構造的面朝上型LED晶片。於該情形時,連接電極103只要於每個像素設置1個即可。Furthermore, in this embodiment, a flip-chip LED chip is exemplified as the LED chip 202R for description, but the invention is not limited to this example. For example, the LED chip 202R may have a structure in which an anode electrode (or a cathode electrode) is provided on a side close to the circuit substrate 100 and a cathode electrode (or anode electrode) is provided on a side far away from the circuit substrate 100 . That is, the LED chip 202R may be a face-up LED chip having a structure in which a light-emitting layer sandwiched an anode electrode and a cathode electrode. In this case, only one connection electrode 103 is provided for each pixel.

連接電極103例如由具有導電性之金屬材料構成。於本實施形態中,作為金屬材料使用錫(Sn)。但,並未限於該例,可使用能夠與後述之LED晶片側之端子電極之間形成共晶合金之其他金屬材料。連接電極103之厚度只要於0.2 μm以上5 μm以下(較佳為1 μm以上3 μm以下)之範圍內決定即可。The connection electrode 103 is made of, for example, a conductive metal material. In this embodiment, tin (Sn) is used as the metal material. However, the present invention is not limited to this example, and other metal materials that can form a eutectic alloy with the terminal electrodes on the LED chip side described below may be used. The thickness of the connection electrode 103 may be determined within the range of 0.2 μm to 5 μm (preferably 1 μm to 3 μm).

接著,於圖1之步驟S13中,經由固定於保持元件基板200之保持構件30之遮光罩40,對複數個LED晶片202R中之一部分照射雷射光50(參照圖4)。如圖4所示,於本實施形態中,藉由經由遮光罩40之雷射光50之照射,將連接電極103與一部分之LED晶片202R一併接合。該製程係藉由雷射光50之照射,使連接電極103與LED晶片202R之端子電極203R熔融接合之製程。Next, in step S13 of FIG. 1 , a part of the plurality of LED chips 202R is irradiated with laser light 50 through the light shield 40 fixed to the holding member 30 of the holding element substrate 200 (see FIG. 4 ). As shown in FIG. 4 , in this embodiment, the connection electrode 103 and a part of the LED chip 202R are bonded together by irradiating the laser light 50 through the light shield 40 . This process is a process in which the connection electrode 103 and the terminal electrode 203R of the LED chip 202R are fused and bonded by irradiation of the laser light 50 .

作為雷射光50,選定不被半導體基板201及LED晶片202R吸收,而由連接電極103或端子電極203R吸收之雷射光。於本實施形態中,例如,作為雷射光50,可使用近紅外光。作為雷射光50之光源,亦可使用YAG雷射或YVO 4雷射等之固體雷射。即,雷射光50亦可為上述之固體雷射之基本波。但,雷射光50可根據構成LED晶片202R之材料,選擇適當波長之雷射光。例如,於使用吸收較近紅外光更短波長之雷射光之半導體材料之情形時,亦可使用上述之固體雷射之第2高諧波即綠光雷射(綠色光)。 As the laser light 50, a laser light that is not absorbed by the semiconductor substrate 201 and the LED chip 202R but is absorbed by the connection electrode 103 or the terminal electrode 203R is selected. In this embodiment, for example, near-infrared light can be used as the laser light 50 . As the light source of the laser light 50, solid lasers such as YAG laser or YVO 4 laser can also be used. That is, the laser light 50 may also be the fundamental wave of the above-mentioned solid laser. However, the laser light 50 can select an appropriate wavelength of laser light according to the material constituting the LED chip 202R. For example, when using a semiconductor material that absorbs laser light with a shorter wavelength than near-infrared light, the second higher harmonic wave of the above-mentioned solid laser, that is, green laser (green light), can also be used.

藉由雷射光50之照射,於連接電極103與端子電極203R之間形成由共晶合金構成之合金層(未圖示)。如上述,於本實施形態中,連接電極103由錫(Sn)構成。另一方面,端子電極203R由金(Au)構成。即,於本實施形態中,形成由Sn-Au共晶合金構成之層作為合金層。藉由於連接電極103與端子電極203R之間形成由共晶合金構成之合金層,連接電極103與端子電極203R經由合金層牢固地接合。By irradiating the laser light 50, an alloy layer (not shown) composed of a eutectic alloy is formed between the connection electrode 103 and the terminal electrode 203R. As described above, in this embodiment, the connection electrode 103 is made of tin (Sn). On the other hand, the terminal electrode 203R is made of gold (Au). That is, in this embodiment, a layer composed of Sn—Au eutectic alloy is formed as the alloy layer. By forming an alloy layer composed of a eutectic alloy between the connection electrode 103 and the terminal electrode 203R, the connection electrode 103 and the terminal electrode 203R are firmly joined through the alloy layer.

遮光罩40具有複數個開口部40a。複數個開口部40a例如與紅色所對應之像素、綠色所對應之像素或藍色所對應之像素之各間距(像素間之間隔)匹配而配置。於圖4所示之例中,各開口部40a分別與紅色所對應之像素之間距匹配而配置。即,各開口部40a之位置與配置LED晶片202R之位置對應。The light shield 40 has a plurality of openings 40a. The plurality of openings 40 a are arranged to match each pitch (inter-pixel pitch) of pixels corresponding to red, pixels corresponding to green, or pixels corresponding to blue, for example. In the example shown in FIG. 4 , each opening 40 a is arranged to match the pitch between pixels corresponding to red. That is, the position of each opening 40a corresponds to the position where the LED chip 202R is arranged.

如上所述,本實施形態之遮光罩40固定於保持元件基板200之保持構件30。具體而言,如圖4所示,遮光罩40對於保持構件30接著。因此,雷射光50經由保持構件30及遮光罩40,照射至元件基板200。因此,於本實施形態中,作為保持構件30之材料,使用令上述之固體雷射之基本波或第2高諧波透過之材料。例如,保持構件30亦可由玻璃、石英、或藍寶石構成。對保持構件30及遮光罩40,於以後述。As described above, the light shield 40 of this embodiment is fixed to the holding member 30 that holds the element substrate 200 . Specifically, as shown in FIG. 4 , the light shield 40 is connected to the holding member 30 . Therefore, the laser light 50 passes through the holding member 30 and the light shield 40 and is irradiated to the element substrate 200 . Therefore, in this embodiment, a material that transmits the fundamental wave or the second harmonic wave of the above-mentioned solid laser is used as the material of the holding member 30 . For example, the holding member 30 may be made of glass, quartz, or sapphire. The holding member 30 and the light shield 40 will be described later.

於本實施形態中,作為雷射光50,使用具有包含複數個開口部40a之大小之照射區域之矩形狀之雷射光。另,於雷射光50之照射區域較遮光罩40窄之情形時,可藉由一面移動雷射光之照射區域一面複數次照射,而對遮光罩40之整體照射雷射光50。In this embodiment, a rectangular laser light having an irradiation area having a size including a plurality of openings 40 a is used as the laser light 50 . In addition, when the irradiation area of the laser light 50 is narrower than that of the light shield 40, the entire light shield 40 can be irradiated with the laser light 50 by moving the irradiation area of the laser light a plurality of times.

照射至遮光罩40之雷射光50僅通過開口部40a所在之部分。即,藉由使用遮光罩40,可一面使用照射區域廣闊之雷射光,一面進行選擇性之雷射照射。於本實施形態中,對配置LED晶片202R之位置選擇性地照射雷射光50。即,根據本實施形態,可一併進行複數個連接電極103與複數個LED晶片202R之接合。The laser light 50 irradiated to the light shield 40 only passes through the portion where the opening 40 a is located. That is, by using the light shield 40, selective laser irradiation can be performed while using laser light with a wide irradiation area. In this embodiment, the position where the LED chip 202R is arranged is selectively irradiated with the laser light 50 . That is, according to this embodiment, the plurality of connection electrodes 103 and the plurality of LED chips 202R can be bonded together.

開口部40a之大小(面積)於俯視時為使連接電極103與端子電極203R之接合確實進行之程度之大小即可。例如,於俯視時之開口部40a之大小亦可小於LED晶片202R之大小。又,開口部40a之大小亦可與LED晶片202R之大小相同(包含大致相同之情形)、或略微大於LED晶片202R之大小。The size (area) of the opening 40a may be a size that ensures the connection between the connection electrode 103 and the terminal electrode 203R when viewed from above. For example, the size of the opening 40a in plan view may be smaller than the size of the LED chip 202R. In addition, the size of the opening 40a may be the same as (including substantially the same) the size of the LED chip 202R, or may be slightly larger than the size of the LED chip 202R.

另,於本實施形態中,雖顯示使用照射區域為矩形狀之雷射光作為雷射光50之例,但並未限於此例,亦可使用照射區域為線狀(細長之形狀)之雷射光。於該情形時,藉由將線狀之雷射光對遮光罩40進行掃描,可對遮光罩40之整體照射雷射光。In addition, in this embodiment, although the example of using a laser light with a rectangular irradiation area as the laser light 50 is shown, the invention is not limited to this example, and a laser light with a linear (elongated shape) irradiation area may also be used. In this case, by scanning the light shielding cover 40 with linear laser light, the entire light shielding cover 40 can be irradiated with laser light.

於照射雷射光40後,如圖5所示,對被雷射光50照射之複數個LED晶片202R,選擇性地照射雷射光60。於本實施形態中,雖顯示直接利用上述保持構件30及遮光罩40之例,但並非限定於該例者,亦可使用其他遮光罩,亦可不使用遮光罩。After the laser light 40 is irradiated, as shown in FIG. 5 , the plurality of LED chips 202R irradiated by the laser light 50 are selectively irradiated with the laser light 60 . In this embodiment, an example is shown in which the above-described holding member 30 and light shielding cover 40 are directly used. However, the present embodiment is not limited to this example, and other light shielding covers may be used, or no light shielding cover may be used.

圖5所示之製程係藉由雷射光60之照射,分離半導體基板201與LED晶片202Ra之製程,稱為雷射剝離。作為雷射光60,選定不被半導體基板201吸收,且被LED晶片202Ra吸收之雷射光。於本實施形態中,作為雷射光60,使用紫外光。作為雷射光60之光源,使用YAG雷射或YVO 4雷射等之固體雷射、或準分子雷射即可。例如,於使用固體雷射之情形時,可使用第2高諧波或第3高諧波。但,雷射光60可根據構成半導體基板201及LED晶片202Ra之材料,選擇適當波長之雷射光。例如,於使用吸收較紫外光更長波長之雷射光之半導體材料之情形時,亦可使用藍光雷射(藍色光)或綠光雷射(綠色光)。 The process shown in FIG. 5 is a process of separating the semiconductor substrate 201 and the LED chip 202Ra by irradiating the laser light 60, which is called laser lift-off. As the laser light 60, a laser light that is not absorbed by the semiconductor substrate 201 and is absorbed by the LED chip 202Ra is selected. In this embodiment, ultraviolet light is used as the laser light 60 . As the light source of the laser light 60, a solid laser such as YAG laser or YVO 4 laser, or an excimer laser can be used. For example, when using a solid-state laser, the second harmonic or the third harmonic can be used. However, the laser light 60 can select an appropriate wavelength of laser light according to the materials constituting the semiconductor substrate 201 and the LED chip 202Ra. For example, when using a semiconductor material that absorbs laser light with a longer wavelength than ultraviolet light, a blue laser (blue light) or a green laser (green light) can also be used.

於本實施形態中,對照射雷射光50之LED晶片202R,選擇性地照射雷射光60。其結果,LED晶片202Ra之表層部分(與半導體基板201之邊界部分)改性,可物理性地分離半導體基板201與各LED晶片202Ra。In this embodiment, the LED chip 202R irradiated with the laser light 50 is selectively irradiated with the laser light 60 . As a result, the surface layer portion of the LED chip 202Ra (the boundary portion with the semiconductor substrate 201) is modified, and the semiconductor substrate 201 and each LED chip 202Ra can be physically separated.

於照射雷射光60後,如圖6所示,剝離元件基板200。元件基板200只要被物理性剝離即可。於該情形時,於圖5所示之製程中,未被照射雷射光60之LED晶片202R殘存於元件基板200。另一方面,於圖5所示之製程中,被照射雷射光60之LED晶片202R與電路基板100牢固地接合,因而殘存於電路基板100。After the laser light 60 is irradiated, as shown in FIG. 6 , the element substrate 200 is peeled off. The element substrate 200 only needs to be physically peeled off. In this case, in the process shown in FIG. 5 , the LED chip 202R that has not been irradiated with the laser light 60 remains on the device substrate 200 . On the other hand, in the process shown in FIG. 5 , the LED chip 202R irradiated with the laser light 60 is firmly bonded to the circuit substrate 100 and thus remains on the circuit substrate 100 .

如上所述,於電路基板100上安裝與紅色對應之LED晶片202R。關於綠色所對應之LED晶片202G及藍色所對應之LED晶片202B,可以與紅色所對應之LED晶片202R同樣之製造方法安裝於電路基板100上,故省略詳細說明。又,於本實施形態中,各色之LED晶片以相同間距排列。因此,上述之保持構件30及遮光罩40可藉由調整電路基板100之位置,對各色之LED晶片照射雷射光50時利用。As described above, the LED chip 202R corresponding to red is mounted on the circuit substrate 100 . The LED chip 202G corresponding to green and the LED chip 202B corresponding to blue can be mounted on the circuit substrate 100 using the same manufacturing method as the LED chip 202R corresponding to red, so detailed description is omitted. Furthermore, in this embodiment, LED chips of various colors are arranged at the same pitch. Therefore, the above-mentioned holding member 30 and light shield 40 can be used when irradiating laser light 50 to LED chips of various colors by adjusting the position of the circuit substrate 100 .

經過至此為止說明之製程,如圖7所示,紅色所對應之LED晶片202R、綠色所對應之LED晶片202G及藍色所對應之LED晶片202B分別與電路基板100上之驅動電路102連接。After the process described so far, as shown in FIG. 7 , the LED chip 202R corresponding to red, the LED chip 202G corresponding to green, and the LED chip 202B corresponding to blue are respectively connected to the driving circuit 102 on the circuit substrate 100 .

[雷射處理裝置之構成] 於本實施形態中,對於圖1之步驟S13使用之雷射處理裝置300之構成進行說明。 [Construction of laser processing device] In this embodiment, the structure of the laser processing device 300 used in step S13 of FIG. 1 will be described.

圖8係顯示於第1實施形態之顯示裝置10之製造方法中使用之雷射處理裝置300之構成之圖。如圖8所示,雷射處理裝置300包含雷射振盪器302、反射鏡304、擴束器306、第1工件單元308、及第2工件單元310。但,雷射處理裝置300之構成並非限定於該例者,亦可省略反射鏡304或擴束器306,又可追加其他要件。FIG. 8 is a diagram showing the structure of the laser processing device 300 used in the manufacturing method of the display device 10 according to the first embodiment. As shown in FIG. 8 , the laser processing apparatus 300 includes a laser oscillator 302, a mirror 304, a beam expander 306, a first workpiece unit 308, and a second workpiece unit 310. However, the structure of the laser processing device 300 is not limited to this example. The reflector 304 or the beam expander 306 may be omitted, and other requirements may be added.

本實施形態之雷射振盪器302係以將3價釹離子(Nd 3+)添加至YAG(Yttrium Aluminum Garnet:Y 3Al 5O 12)結晶之固體材料為介質之Nd:YAG雷射。雷射振盪器302輸出具有1064 nm之波長之基本波(近紅外光)。 The laser oscillator 302 of this embodiment is an Nd:YAG laser using a solid material in which trivalent neodymium ions (Nd 3+ ) are added to YAG (Yttrium Aluminum Garnet: Y 3 Al 5 O 12 ) crystal as a medium. The laser oscillator 302 outputs a fundamental wave (near-infrared light) with a wavelength of 1064 nm.

自雷射振盪器302輸出之雷射光320a由反射鏡304變更光路,朝向擴束器306。擴束器306由擴大輸入之準直光之光束徑之透鏡系統構成。藉由經由擴束器306,雷射光320a作為光束徑(即,照射範圍)擴大之雷射光320b輸出。雷射光320b與圖4所示之雷射光50對應。The optical path of the laser light 320a output from the laser oscillator 302 is changed by the reflecting mirror 304 and heads toward the beam expander 306. The beam expander 306 is composed of a lens system that expands the beam path of the input collimated light. By passing through the beam expander 306, the laser light 320a is output as the laser light 320b with an expanded beam diameter (ie, irradiation range). The laser light 320b corresponds to the laser light 50 shown in FIG. 4 .

於本實施形態中,對雷射光320b之照射範圍較第2工件單元310之面積窄之情形進行說明。於該情形時,藉由將雷射光320b之照射範圍相對於第2工件單元310相對地移動,可覆蓋被處理對象之處理所需之區域。為了使雷射光320b之照射範圍移動,例如亦可使由雷射振盪器302、反射鏡304及擴束器306構成之光學系統移動。相反,亦可藉由使第1工件單元308及第2工件單元310移動,而相對地移動雷射光320b之照射範圍。In this embodiment, the case where the irradiation range of the laser light 320b is narrower than the area of the second workpiece unit 310 will be explained. In this case, by relatively moving the irradiation range of the laser light 320b with respect to the second workpiece unit 310, the area required for processing the object to be processed can be covered. In order to move the irradiation range of the laser light 320b, for example, the optical system composed of the laser oscillator 302, the reflecting mirror 304 and the beam expander 306 may also be moved. On the contrary, by moving the first workpiece unit 308 and the second workpiece unit 310, the irradiation range of the laser light 320b can be relatively moved.

自擴束器306輸出之雷射光320b經由第2工件單元310,照射至配置於第1工件單元308與第2工件單元310之間之被處理對象(未圖示)。於本實施形態中,LED晶片202(例如,圖4所示之LED晶片202R)係被處理對象。The laser light 320b output from the beam expander 306 passes through the second workpiece unit 310 and is irradiated to the object to be processed (not shown) arranged between the first workpiece unit 308 and the second workpiece unit 310. In this embodiment, the LED chip 202 (for example, the LED chip 202R shown in FIG. 4 ) is the object to be processed.

第1工件單元308包含保持構件70,且保持支持被處理對象之基板等。於本實施形態中,保持構件70具有藉由真空吸附保持基板等之功能。構成保持構件70之材料並未特別限制,例如可使用玻璃、石英、陶瓷等。The first workpiece unit 308 includes a holding member 70 and holds a substrate or the like that supports an object to be processed. In this embodiment, the holding member 70 has a function of holding the substrate and the like by vacuum suction. The material constituting the holding member 70 is not particularly limited, and for example, glass, quartz, ceramics, etc. may be used.

第2工件單元310包含保持構件30及遮光罩40,保持支持被處理對象之基板等。與保持構件70同樣,保持構件30具有藉由真空吸附保持基板等之功能。又,如上所述,遮光罩40相對於保持構件30接著。換言之,保持構件30與遮光罩40具有一體化之構造。The second workpiece unit 310 includes a holding member 30 and a light shield 40, and holds a substrate and the like supporting an object to be processed. Like the holding member 70 , the holding member 30 has a function of holding the substrate and the like by vacuum suction. Furthermore, as described above, the light shield 40 is connected to the holding member 30 . In other words, the holding member 30 and the light shield 40 have an integrated structure.

於本實施形態中,保持構件30由透過雷射光320b之材料構成。於本實施形態中,因使用近紅外光作為雷射光320b,故期望具有透過波長1.0 μm前後之光之功能。因此,作為構成保持構件30之材料,例如可使用玻璃、石英、或藍寶石等。但,並非限定於該例者,構成保持構件30之材料可根據使用之雷射光之波長適當選擇。In this embodiment, the holding member 30 is made of a material that transmits the laser light 320b. In this embodiment, since near-infrared light is used as the laser light 320b, it is desired to have the function of transmitting light with a wavelength of around 1.0 μm. Therefore, as a material constituting the holding member 30, for example, glass, quartz, sapphire, etc. can be used. However, it is not limited to this example, and the material constituting the holding member 30 can be appropriately selected according to the wavelength of the laser light used.

遮光罩40具有複數個開口部40a,可經由複數個開口部40a選擇性地透過雷射光320b。遮光罩40例如可由殷鋼等之金屬材料構成。於保持構件30為玻璃、石英或藍寶石等之絕緣材料之情形時,遮光罩40可經由接著層等與保持構件30接著。The light shield 40 has a plurality of openings 40a and can selectively transmit the laser light 320b through the plurality of openings 40a. The light shield 40 may be made of metal material such as Invar. When the holding member 30 is made of an insulating material such as glass, quartz or sapphire, the light shield 40 may be connected to the holding member 30 through an adhesive layer or the like.

圖9係顯示使用雷射處理裝置300進行雷射光320b之照射製程之情況之圖。圖9所示之照射製程相當於圖4所示之雷射光50之照射製程。FIG. 9 is a diagram showing how the laser processing device 300 is used to perform the irradiation process of the laser light 320b. The irradiation process shown in FIG. 9 is equivalent to the irradiation process of the laser light 50 shown in FIG. 4 .

如圖9所示,於第1工件單元308之保持構件70之上,藉由真空吸附保持電路基板100。於第2工件單元310之保持構件30之上,介隔遮光罩40藉由真空吸附保持元件基板200。因此,於遮光罩40與元件基板200之間,間隙消失,變為元件基板200相對於遮光罩40密接之狀態。As shown in FIG. 9 , the circuit board 100 is held by vacuum suction on the holding member 70 of the first workpiece unit 308 . On the holding member 30 of the second workpiece unit 310, the element substrate 200 is held by vacuum suction through the light shield 40. Therefore, the gap between the light shield 40 and the element substrate 200 disappears, and the element substrate 200 becomes in close contact with the light shield 40 .

以於保持構件70上保持電路基板100,於保持構件30(嚴格而言為遮光罩30)上保持元件基板200之狀態,進行電路基板100與元件基板200之對位。即,如圖3所示,以電路基板100之連接電極103與LED晶片202R之端子電極203R連接之方式,配置電路基板100與元件基板200。With the circuit board 100 held on the holding member 70 and the element substrate 200 held on the holding member 30 (strictly speaking, the light shield 30 ), the circuit board 100 and the element substrate 200 are aligned. That is, as shown in FIG. 3 , the circuit substrate 100 and the element substrate 200 are arranged so that the connection electrode 103 of the circuit substrate 100 is connected to the terminal electrode 203R of the LED chip 202R.

電路基板100與元件基板200之對位結束後,如圖9所示,進行雷射光320b之照射。此時,因遮光罩40與元件基板200密接,故通過複數個開口部40a之雷射光320b未繞射地入射至元件基板200。因此,根據本實施形態,可一面防止雷射光320b之繞射,一面選擇性地將雷射光320b照射至LED晶片202R。After the alignment of the circuit substrate 100 and the element substrate 200 is completed, as shown in FIG. 9 , laser light 320b is irradiated. At this time, since the light shield 40 is in close contact with the element substrate 200, the laser light 320b passing through the plurality of openings 40a is incident on the element substrate 200 without being diffracted. Therefore, according to this embodiment, it is possible to selectively irradiate the laser light 320b to the LED chip 202R while preventing the diffraction of the laser light 320b.

此處,對保持元件基板200之第2工件單元310之構造進行說明。具體而言,對構成第2工件單元310之保持構件30及遮光罩40之構造進行說明。Here, the structure of the second workpiece unit 310 holding the element substrate 200 will be described. Specifically, the structure of the holding member 30 and the light shield 40 which comprise the 2nd workpiece unit 310 is demonstrated.

圖10係顯示於第1實施形態之顯示裝置10之製造方法中使用之雷射處理裝置300中之第2工件單元310之構成之圖。具體而言,圖10與自保持被處理對象之側觀察第2工件單元310之圖對應。另,於圖10中,於第2工件單元310之最前面配置遮光罩40。因此,為了說明方便,省略遮光罩40之一部分之圖示。FIG. 10 is a diagram showing the structure of the second workpiece unit 310 in the laser processing apparatus 300 used in the manufacturing method of the display device 10 of the first embodiment. Specifically, FIG. 10 corresponds to a view of the second workpiece unit 310 as viewed from the side holding the object to be processed. In addition, in FIG. 10 , the light shield 40 is arranged at the front of the second workpiece unit 310 . Therefore, for convenience of explanation, illustration of a part of the light shield 40 is omitted.

如圖10所示,保持構件30之保持面30a具有處理區域31及吸附區域32。處理區域31係用以對被處理對象即元件基板200照射雷射光320b之區域。保持構件30藉由將元件基板200之半導體基板201真空吸附於保持面30a,而保持元件基板200。此時,設置於元件基板200之複數個LED晶片202皆以容納於處理區域31之內側之方式構成。即,於藉由保持構件30保持元件基板200時,複數個LED晶片202配置於與處理區域31重疊之位置。As shown in FIG. 10 , the holding surface 30 a of the holding member 30 has a processing area 31 and an adsorption area 32 . The processing area 31 is an area for irradiating the device substrate 200 , which is an object to be processed, with the laser light 320 b. The holding member 30 holds the element substrate 200 by vacuum-adsorbing the semiconductor substrate 201 of the element substrate 200 to the holding surface 30a. At this time, the plurality of LED chips 202 provided on the device substrate 200 are configured to be accommodated inside the processing area 31 . That is, when the element substrate 200 is held by the holding member 30 , the plurality of LED chips 202 are arranged in positions overlapping the processing area 31 .

吸附區域32係用以真空吸附元件基板200之區域。如圖10所示,保持構件30於吸附區域32具有複數個吸附孔32a。即,於吸附區域32中,使用複數個吸附孔32a吸附元件基板200。吸附區域32以包圍處理區域31之方式設置。換言之,於藉由保持構件30保持元件基板200時,複數個LED晶片202未與吸附區域32重疊。The adsorption area 32 is an area used for vacuum adsorption of the component substrate 200 . As shown in FIG. 10 , the holding member 30 has a plurality of adsorption holes 32 a in the adsorption area 32 . That is, in the adsorption area 32 , a plurality of adsorption holes 32 a are used to adsorb the element substrate 200 . The adsorption area 32 is provided to surround the processing area 31 . In other words, when the element substrate 200 is held by the holding member 30 , the plurality of LED chips 202 do not overlap with the adsorption area 32 .

遮光罩40如上所述,具有複數個開口部40a。如圖10所示,複數個開口部40a配置於處理區域31之內側。又,遮光罩40具有複數個吸附孔40b。複數個吸附孔40b以與吸附區域32重疊之方式設置。即,複數個吸附孔40b以包圍複數個開口部40a之方式設置。此時,設置於保持構件30之複數個吸附孔32a及設置於遮光罩40之複數個吸附孔40b至少一部分重疊。較佳為,各吸附孔32a及各吸附孔40b之位置彼此一致(包含大致一致之情形)。如此,藉由於遮光罩40亦設置吸附孔40b,保持構件30可介隔遮光罩40吸附元件基板200。As mentioned above, the light shield 40 has a plurality of openings 40a. As shown in FIG. 10 , a plurality of openings 40 a are arranged inside the treatment area 31 . In addition, the light shield 40 has a plurality of adsorption holes 40b. The plurality of adsorption holes 40b are provided to overlap the adsorption area 32. That is, the plurality of adsorption holes 40b are provided so as to surround the plurality of openings 40a. At this time, the plurality of adsorption holes 32a provided in the holding member 30 and the plurality of adsorption holes 40b provided in the light shield 40 at least partially overlap. Preferably, the positions of each adsorption hole 32a and each adsorption hole 40b are consistent with each other (including substantially consistent). In this way, since the light shielding cover 40 is also provided with the adsorption holes 40b, the holding member 30 can adsorb the component substrate 200 through the light shielding cover 40.

於本實施形態中,雖對吸附孔32a及吸附孔40b之外形為圓形之情形進行例示,但並非限定於該例者。吸附孔32a及吸附孔40b之外形亦可為多邊形,又可為橢圓形。又,吸附孔32a及吸附孔40b無需為孔狀,亦可為溝槽狀。例如,吸附孔32a及吸附孔40b亦可為沿著保持構件30之同心圓之溝槽。In this embodiment, although the case where the adsorption hole 32a and the adsorption hole 40b has a circular outer shape is exemplified, it is not limited to this example. The outer shapes of the adsorption holes 32a and 40b may also be polygonal or elliptical. In addition, the adsorption holes 32a and the adsorption holes 40b do not need to be hole-shaped, and may be groove-shaped. For example, the adsorption holes 32 a and 40 b may also be concentric grooves along the holding member 30 .

如以上說明,本實施形態之雷射處理裝置300具備保持構件30與遮光罩40一體構成之第2工件單元310,且具有經由保持構件30將雷射光320b照射至被處理對象之構成。於使用本實施形態之雷射處理裝置300之情形時,因於遮光罩40與被處理對象(於本實施形態中為元件基板200)之間未產生間隙,故可防止通過遮光罩40之開口部40a之雷射光之繞射。As described above, the laser processing apparatus 300 of this embodiment includes the second workpiece unit 310 in which the holding member 30 and the light shield 40 are integrated, and has a structure in which the laser light 320b is irradiated to the object to be processed through the holding member 30. When the laser processing apparatus 300 of this embodiment is used, since there is no gap between the light shield 40 and the object to be processed (the device substrate 200 in this embodiment), it is possible to prevent the light shield 40 from passing through the opening. Diffraction of laser light in part 40a.

又,於本實施形態中,因將自雷射振盪器302輸出之雷射光320a由擴束器306擴大並照射,故可進行一次大範圍之雷射光照射。因此,根據本實施形態,可一面防止雷射光之繞射,一面以較高處理量實施雷射光之照射製程。Furthermore, in this embodiment, since the laser light 320a output from the laser oscillator 302 is expanded and irradiated by the beam expander 306, a wide range of laser light irradiation can be performed at once. Therefore, according to this embodiment, the laser light irradiation process can be performed with a high throughput while preventing the diffraction of the laser light.

[顯示裝置之構成] 使用圖11~圖14,對本發明之第1實施形態之顯示裝置10之構成進行說明。 [Configuration of display device] The structure of the display device 10 according to the first embodiment of the present invention will be described using FIGS. 11 to 14 .

圖11係顯示第1實施形態之顯示裝置10之概略構成之俯視圖。如圖11所示,顯示裝置10具有電路基板100、可撓性印刷電路基板160(FPC160)、及IC晶片170。顯示裝置10區分為顯示區域112、周邊區域114、及端子區域116。FIG. 11 is a plan view showing the schematic structure of the display device 10 according to the first embodiment. As shown in FIG. 11 , the display device 10 includes a circuit board 100 , a flexible printed circuit board 160 (FPC 160 ), and an IC chip 170 . The display device 10 is divided into a display area 112, a peripheral area 114, and a terminal area 116.

顯示區域112係包含LED晶片202之複數個像素110配置於列方向(D1方向)及行方向(D2方向)之區域。具體而言,於本實施形態中,配置包含LED晶片202R之像素110R、包含LED晶片202G之像素110G、及包含LED晶片202B之像素110B。顯示區域112作為顯示與影像信號相應之圖像之區域發揮功能。The display area 112 is an area including a plurality of pixels 110 of the LED chip 202 arranged in the column direction (D1 direction) and the row direction (D2 direction). Specifically, in this embodiment, the pixel 110R including the LED chip 202R, the pixel 110G including the LED chip 202G, and the pixel 110B including the LED chip 202B are arranged. The display area 112 functions as an area for displaying an image corresponding to an image signal.

周邊區域114係顯示區域112之周圍之區域。周邊區域114為設置有用以控制設置於各像素110之像素電路(圖17所示之像素電路120)之驅動電路(圖16所示之資料驅動電路130及閘極驅動電路140)之區域。The peripheral area 114 is an area surrounding the display area 112 . The peripheral area 114 is an area provided with a driving circuit (the data driving circuit 130 and the gate driving circuit 140 shown in FIG. 16 ) for controlling the pixel circuit (the pixel circuit 120 shown in FIG. 17 ) provided in each pixel 110 .

端子區域116係匯集與上述驅動電路連接之複數條配線之區域。可撓性印刷電路基板160於端子區域116與複數條配線電性連接。自外部裝置(未圖示)輸出之影像信號(資料信號)或控制信號經由設置於可撓性印刷電路基板160之配線(未圖示),輸入至IC晶片170。IC晶片170對影像信號進行各種之信號處理或產生顯示控制所需之控制信號。自IC晶片170輸出之影像信號及控制信號經由可撓性印刷電路基板160,輸入至顯示裝置10。The terminal area 116 is an area where a plurality of wirings connected to the drive circuit are collected. The flexible printed circuit board 160 is electrically connected to a plurality of wirings in the terminal area 116 . Image signals (data signals) or control signals output from an external device (not shown) are input to the IC chip 170 through wiring (not shown) provided on the flexible printed circuit board 160 . The IC chip 170 performs various signal processing on the image signal or generates control signals required for display control. The image signals and control signals output from the IC chip 170 are input to the display device 10 through the flexible printed circuit substrate 160 .

[顯示裝置10之電路構成] 圖12係顯示第1實施形態之顯示裝置10之電路構成之方塊圖。如圖12所示,於顯示區域112與各像素110對應設置有像素電路120。於本實施形態中,與像素110R、像素110G及像素110B對應,分別設置有像素電路120R、像素電路120G及像素電路120B。即,於顯示區域112,複數個像素電路120配置於列方向(D1方向)及行方向(D2方向)。 [Circuit configuration of display device 10] FIG. 12 is a block diagram showing the circuit configuration of the display device 10 of the first embodiment. As shown in FIG. 12 , a pixel circuit 120 is provided in the display area 112 corresponding to each pixel 110 . In this embodiment, pixel circuits 120R, pixel circuits 120G and pixel circuits 120B are respectively provided corresponding to the pixels 110R, 110G and 110B. That is, in the display area 112, a plurality of pixel circuits 120 are arranged in the column direction (D1 direction) and the row direction (D2 direction).

圖13係顯示第1實施形態之顯示裝置10之像素電路120之構成之電路圖。像素電路120配置於由資料線121、閘極線122、陽極電源線123及陰極電源線124包圍之區域。本實施形態之像素電路120包含選擇電晶體126、驅動電晶體127、保持電容128及LED129。LED129與圖11所示之各LED晶片202對應。像素電路120中,LED129以外之電路要件相當於設置於電路基板100之驅動電路102。即,以對電路基板100安裝LED晶片202之狀態完成像素電路120。FIG. 13 is a circuit diagram showing the structure of the pixel circuit 120 of the display device 10 of the first embodiment. The pixel circuit 120 is arranged in an area surrounded by the data line 121, the gate line 122, the anode power line 123 and the cathode power line 124. The pixel circuit 120 of this embodiment includes a selection transistor 126, a driving transistor 127, a holding capacitor 128 and an LED 129. LED 129 corresponds to each LED chip 202 shown in FIG. 11 . In the pixel circuit 120, circuit elements other than the LED 129 correspond to the drive circuit 102 provided on the circuit board 100. That is, the pixel circuit 120 is completed with the LED chip 202 mounted on the circuit board 100 .

如圖13所示,選擇電晶體126之源極電極、閘極電極及汲極電極分別與資料線121、閘極線122及驅動電晶體127之閘極電極連接。驅動電晶體127之源極電極、閘極電極及汲極電極分別與陽極電源線123、選擇電晶體126之汲極電極及LED129連接。於驅動電晶體127之閘極電極與汲極電極之間連接有保持電容128。即,保持電容128與選擇電晶體126之汲極電極連接。LED129分別於驅動電晶體127之汲極電極及陰極電源線124連接陽極及陰極。As shown in FIG. 13 , the source electrode, gate electrode and drain electrode of the selection transistor 126 are respectively connected to the data line 121 , the gate line 122 and the gate electrode of the driving transistor 127 . The source electrode, gate electrode and drain electrode of the driving transistor 127 are respectively connected to the anode power line 123, the drain electrode of the selection transistor 126 and the LED 129. A holding capacitor 128 is connected between the gate electrode and the drain electrode of the driving transistor 127 . That is, the holding capacitor 128 is connected to the drain electrode of the selection transistor 126 . The LED 129 is connected to the anode and the cathode of the drain electrode and the cathode power line 124 of the driving transistor 127 respectively.

對資料線121供給決定LED129之發光強度之灰階信號。對閘極線122供給用以選擇寫入灰階信號之選擇電晶體126之閘極信號。若選擇電晶體126成為導通(ON)狀態,則灰階信號積蓄於保持電容128。其後,若驅動電晶體127成為導通狀態,則與灰階信號相應之驅動電流流動於驅動電晶體127。若自驅動電晶體127輸出之驅動電流輸入至LED129,則LED129以與灰階信號相應之發光強度發光。The data line 121 is supplied with a grayscale signal that determines the luminous intensity of the LED 129 . The gate line 122 is supplied with a gate signal for selecting the selection transistor 126 for writing the grayscale signal. When the selection transistor 126 is turned on, the grayscale signal is accumulated in the holding capacitor 128 . Thereafter, when the driving transistor 127 is turned on, a driving current corresponding to the grayscale signal flows through the driving transistor 127 . If the driving current output from the driving transistor 127 is input to the LED 129, the LED 129 emits light with a luminous intensity corresponding to the grayscale signal.

若再次參照圖12,則於對於顯示區域112於行方向(D2方向)相鄰之位置配置有資料驅動電路130。又,於對於顯示區域112於列方向(D1方向)相鄰之位置配置有閘極驅動電路140。於本實施形態中,於顯示區域112之左右兩側設置有閘極驅動電路140,亦可僅設置於任一側。Referring to FIG. 12 again, the data driving circuit 130 is disposed adjacent to the display area 112 in the row direction (D2 direction). In addition, the gate driving circuit 140 is arranged at a position adjacent to the display area 112 in the column direction (D1 direction). In this embodiment, the gate driving circuit 140 is provided on the left and right sides of the display area 112, or it may be provided only on either side.

資料驅動電路130及閘極驅動電路140皆配置於周邊區域114。但,配置資料驅動電路130之區域未限定於周邊區域114。例如,資料驅動電路130亦可配置於可撓性印刷電路基板160。The data driving circuit 130 and the gate driving circuit 140 are both arranged in the peripheral area 114 . However, the area where the data driving circuit 130 is arranged is not limited to the peripheral area 114 . For example, the data driving circuit 130 can also be configured on the flexible printed circuit substrate 160 .

圖13所示之資料線121自資料驅動電路130於D2方向(參照圖12)延伸,與各像素電路120中之選擇電晶體126之源極電極連接。閘極線122自閘極驅動電路140於D1方向(參照圖12)延伸,與各像素電路120中之選擇電晶體126之閘極電極連接。The data line 121 shown in FIG. 13 extends from the data driving circuit 130 in the D2 direction (refer to FIG. 12 ) and is connected to the source electrode of the selection transistor 126 in each pixel circuit 120 . The gate line 122 extends from the gate driving circuit 140 in the D1 direction (refer to FIG. 12 ) and is connected to the gate electrode of the selection transistor 126 in each pixel circuit 120 .

於端子區域116之端面配置有端子部150。端子部150經由連接配線151與資料驅動電路130連接。同樣,端子部150經由連接配線152與閘極驅動電路140連接。再者,端子部150與可撓性印刷電路基板160連接。A terminal portion 150 is arranged on the end surface of the terminal area 116 . The terminal portion 150 is connected to the data driving circuit 130 via the connection wiring 151 . Similarly, the terminal portion 150 is connected to the gate drive circuit 140 via the connection wiring 152 . Furthermore, the terminal portion 150 is connected to the flexible printed circuit board 160 .

[顯示裝置10之剖面構造] 圖14係顯示第1實施形態之顯示裝置10之像素110之構成之剖視圖。像素110具有設置於絕緣基板11之上之驅動電晶體127。作為絕緣基板11,可使用將絕緣層設置於玻璃基板或樹脂基板之上之基板。 [Cross-sectional structure of display device 10] FIG. 14 is a cross-sectional view showing the structure of the pixel 110 of the display device 10 according to the first embodiment. The pixel 110 has a driving transistor 127 disposed on the insulating substrate 11 . As the insulating substrate 11, a substrate in which an insulating layer is provided on a glass substrate or a resin substrate can be used.

驅動電晶體127包含半導體層12、閘極絕緣層13及閘極電極14。於半導體層12經由絕緣層15連接有源極電極16及汲極電極17。雖省略圖示,但閘極電極14與圖13所示之選擇電晶體126之汲極電極連接。The driving transistor 127 includes a semiconductor layer 12 , a gate insulating layer 13 and a gate electrode 14 . The source electrode 16 and the drain electrode 17 are connected to the semiconductor layer 12 via the insulating layer 15 . Although illustration is omitted, the gate electrode 14 is connected to the drain electrode of the selection transistor 126 shown in FIG. 13 .

於與源極電極16及汲極電極17同一層設置有配線18。配線18作為圖13所示之陽極電源線123發揮功能。因此,源極電極16及配線18藉由設置於平坦化層19之上之連接配線20電性連接。平坦化層19係使用聚醯亞胺、丙烯酸等之樹脂材料之透明樹脂層。連接配線20係使用ITO(Indium Tin Oxide:氧化銦錫)等之金屬氧化物材料之透明導電層。但,並未限定於該例,作為連接配線20,亦可使用其他金屬材料。The wiring 18 is provided on the same layer as the source electrode 16 and the drain electrode 17 . The wiring 18 functions as the anode power supply line 123 shown in FIG. 13 . Therefore, the source electrode 16 and the wiring 18 are electrically connected through the connecting wiring 20 provided on the planarization layer 19 . The planarization layer 19 is a transparent resin layer using a resin material such as polyimide or acrylic. The connection wiring 20 is a transparent conductive layer using a metal oxide material such as ITO (Indium Tin Oxide). However, the present invention is not limited to this example, and other metal materials may be used as the connecting wire 20 .

於連接配線20之上設置有由氮化矽等構成之絕緣層21。於絕緣層21上設置有陽極電極22及陰極電極23。於本實施形態中,陽極電極22及陰極電極23係使用ITO等之金屬氧化物材料之透明導電層。陽極電極22經由設置於平坦化層19及絕緣層21之開口與汲極電極17連接。An insulating layer 21 made of silicon nitride or the like is provided on the connection wiring 20 . An anode electrode 22 and a cathode electrode 23 are provided on the insulating layer 21 . In this embodiment, the anode electrode 22 and the cathode electrode 23 are transparent conductive layers made of metal oxide materials such as ITO. The anode electrode 22 is connected to the drain electrode 17 through openings provided in the planarization layer 19 and the insulating layer 21 .

陽極電極22及陰極電極23分別經由平坦化層24與安裝墊25a及25b連接。安裝墊25a及25b例如由鉭、鎢等之金屬材料構成。於安裝墊25a及25b之上分別設置有連接電極103a及103b。連接電極103a及103b分別與圖3所示之連接電極103對應。即,於本實施形態中,作為連接電極103a及103b,配置由錫(Sn)構成之電極。The anode electrode 22 and the cathode electrode 23 are respectively connected to the mounting pads 25a and 25b via the planarization layer 24. The mounting pads 25a and 25b are made of metal materials such as tantalum and tungsten, for example. Connection electrodes 103a and 103b are respectively provided on the mounting pads 25a and 25b. The connection electrodes 103a and 103b respectively correspond to the connection electrode 103 shown in FIG. 3 . That is, in this embodiment, electrodes made of tin (Sn) are arranged as the connection electrodes 103a and 103b.

於連接電極103a及103b分別接合有LED晶片202之端子電極203a及203b。如上所述,於本實施形態中,端子電極203a及203b係由金(Au)構成之電極。The terminal electrodes 203a and 203b of the LED chip 202 are bonded to the connection electrodes 103a and 103b respectively. As described above, in this embodiment, the terminal electrodes 203a and 203b are electrodes made of gold (Au).

LED晶片202於圖13所示之電路圖中,相當於LED129。即,LED晶片202之端子電極230a與驅動電晶體127之汲極電極17所連接之陽極電極22連接。LED晶片202之端子電極203b與陰極電極23連接。陰極電極23與圖13所示之陰極電源線124電性連接。The LED chip 202 is equivalent to the LED 129 in the circuit diagram shown in FIG. 13 . That is, the terminal electrode 230a of the LED chip 202 is connected to the anode electrode 22 to which the drain electrode 17 of the driving transistor 127 is connected. The terminal electrode 203b of the LED chip 202 is connected to the cathode electrode 23. The cathode electrode 23 is electrically connected to the cathode power supply line 124 shown in FIG. 13 .

具有以上構造之本實施形態之顯示裝置10因LED晶片202藉由雷射照射之熔融接合牢固地安裝,故具有對衝擊等之耐性較高之優點。The display device 10 of this embodiment having the above structure has the advantage of having high resistance to impact because the LED chip 202 is firmly mounted by fusion bonding by laser irradiation.

<第2實施形態> 於本實施形態中,對使用與第1實施形態不同之構造之雷射處理裝置300之例進行說明。具體而言,本實施形態之雷射處理裝置300具備藉由靜電吸附保持元件基板200之第2工件單元320。另,於圖式中,對與第1實施形態相同之要件標註相同符號並省略重複之說明。 <Second Embodiment> In this embodiment, an example using a laser processing device 300 having a structure different from that of the first embodiment will be described. Specifically, the laser processing apparatus 300 of this embodiment includes the second workpiece unit 320 that holds the element substrate 200 by electrostatic adsorption. In addition, in the drawings, the same elements as those in the first embodiment are denoted by the same symbols, and repeated explanations are omitted.

圖15係顯示於第2實施形態之顯示裝置10之製造方法中使用之雷射處理裝置300中之第2工件單元320之構成之圖。具體而言,圖15與自保持被處理對象之側觀察第2工件單元320之圖對應。另,於圖10中,於第2工件單元320之最前面配置遮光罩42。因此,為了說明方便,省略遮光罩42之一部分之圖示。FIG. 15 is a diagram showing the structure of the second workpiece unit 320 in the laser processing apparatus 300 used in the manufacturing method of the display device 10 of the second embodiment. Specifically, FIG. 15 corresponds to a view of the second workpiece unit 320 as viewed from the side holding the object to be processed. In addition, in FIG. 10 , the light shield 42 is arranged at the front of the second workpiece unit 320 . Therefore, for convenience of explanation, illustration of a part of the light shield 42 is omitted.

如圖15所示,保持構件35具有處理區域36及吸附區域37。處理區域36係用以對被處理對象即元件基板200照射雷射光320b(參照圖8)之區域。保持構件35藉由將元件基板200之半導體基板201靜電吸附於保持面35a,保持元件基板200。此時,與第1實施形態同樣,設置於元件基板200之複數個LED晶片202皆以容納於處理區域36之內側之方式構成。又,與第1實施形態同樣,保持構件35例如由玻璃、石英、或藍寶石等構成。As shown in FIG. 15 , the holding member 35 has a treatment area 36 and an adsorption area 37 . The processing area 36 is an area for irradiating the device substrate 200, which is the object to be processed, with the laser light 320b (see FIG. 8). The holding member 35 holds the element substrate 200 by electrostatically adsorbing the semiconductor substrate 201 of the element substrate 200 to the holding surface 35a. At this time, similarly to the first embodiment, the plurality of LED chips 202 provided on the element substrate 200 are configured to be accommodated inside the processing area 36 . In addition, like the first embodiment, the holding member 35 is made of, for example, glass, quartz, sapphire, or the like.

吸附區域37係用以靜電吸附元件基板200之區域。如圖15所示,於保持構件35之內部設置內部電極37a及37b。即,於俯視時,保持面35a中,與內部電極37a及37b重疊之區域與吸附區域37對應。吸附區域37以包圍處理區域36之方式設置。即,於藉由保持構件35保持元件基板200之時,因複數個LED晶片202未與內部電極37a及37b重疊,故內部電極37a及37b未封塞雷射光320b之光路。The adsorption area 37 is an area used to electrostatically adsorb the component substrate 200 . As shown in FIG. 15 , internal electrodes 37 a and 37 b are provided inside the holding member 35 . That is, in a plan view, the area of the holding surface 35 a that overlaps the internal electrodes 37 a and 37 b corresponds to the adsorption area 37 . The adsorption area 37 is provided to surround the processing area 36 . That is, when the element substrate 200 is held by the holding member 35, since the plurality of LED chips 202 do not overlap the internal electrodes 37a and 37b, the internal electrodes 37a and 37b do not block the optical path of the laser light 320b.

於本實施形態中,例如,對內部電極37a施加正電壓,對內部電極37b施加負電壓。藉此,被處理對象之內部電荷分極,被吸附於保持構件35。即,本實施形態之第2工件單元320藉由於保持構件35與被處理對象之間產生之靜電力保持被處理對象(例如,元件基板200)。In this embodiment, for example, a positive voltage is applied to the internal electrode 37a and a negative voltage is applied to the internal electrode 37b. Thereby, the internal charge of the object to be processed is polarized and attracted to the holding member 35 . That is, the second workpiece unit 320 of this embodiment holds the object to be processed (for example, the element substrate 200) by the electrostatic force generated between the holding member 35 and the object to be processed.

如圖15所示,遮光罩42之複數個開口部42a配置於處理區域36之內側。即,遮光罩42中之作為光罩實際使用之部分位於處理區域36之內側。於本實施形態中,由金屬膜構成遮光罩42。此時,若遮光罩42之膜厚足夠薄,則幾乎不對保持構件35與被處理對象之間產生之靜電力造成影響。於本實施形態中,藉由將遮光罩42之膜厚設為數微米左右,可經由遮光罩42靜電吸附。As shown in FIG. 15 , the plurality of openings 42 a of the light shield 42 are arranged inside the processing area 36 . That is, the portion of the light shield 42 that is actually used as a photomask is located inside the processing area 36 . In this embodiment, the light shield 42 is made of a metal film. At this time, if the film thickness of the light shield 42 is sufficiently thin, it will hardly affect the electrostatic force generated between the holding member 35 and the object to be processed. In this embodiment, by setting the film thickness of the light shield 42 to about several microns, electrostatic adsorption through the light shield 42 is possible.

於本實施形態中,對將內部電極37a及37b之形狀設為俯視時半圓形狀之情形進行例示,但並非限定於該例者。亦可將內部電極37a及37b之形狀設為俯視時多邊形狀,亦可設為橢圓形狀。又,設置於保持構件35之內部之電極之數量未限於2個,亦可為3個以上。In this embodiment, the case where the shape of the internal electrodes 37a and 37b is a semicircular shape in plan view is exemplified, but the invention is not limited to this example. The shape of the internal electrodes 37a and 37b may be a polygonal shape in plan view or an elliptical shape. In addition, the number of electrodes provided inside the holding member 35 is not limited to two, and may be three or more.

如以上說明,本實施形態之雷射處理裝置300具備保持構件35與遮光罩42一體構成之第2工件單元320,且具有經由保持構件35將雷射光320b照射至被處理對象之構成。於使用本實施形態之雷射處理裝置300之情形時,因於遮光罩42與被處理對象(於本實施形態中為元件基板200)之間未產生間隙,故可防止通過遮光罩42之開口部42a之雷射光之繞射。As described above, the laser processing apparatus 300 of this embodiment includes the second workpiece unit 320 in which the holding member 35 and the light shield 42 are integrated, and has a structure in which the laser light 320b is irradiated to the object to be processed through the holding member 35. When the laser processing apparatus 300 of this embodiment is used, since there is no gap between the light shield 42 and the object to be processed (the device substrate 200 in this embodiment), it is possible to prevent the light shield 42 from passing through the opening. Diffraction of laser light in part 42a.

<第3實施形態> 於第1實施形態及第2實施形態中,顯示直接地將LED晶片202自元件基板200向電路基板100轉印之例,但並非限定於該例者。具體而言,亦可暫時將元件基板200具有之LED晶片202轉印至載具基板,其後,自載具基板向電路基板100轉印。於該情形時,於熔融接合各LED晶片202之端子電極203與電路基板100之連接電極103時,亦可使用第1實施形態及第2實施形態說明之雷射處理裝置300。 <Third Embodiment> In the first embodiment and the second embodiment, the example in which the LED chip 202 is directly transferred from the element substrate 200 to the circuit substrate 100 is shown, but the invention is not limited to this example. Specifically, the LED chip 202 included in the element substrate 200 may be temporarily transferred to the carrier substrate, and then transferred from the carrier substrate to the circuit substrate 100 . In this case, when the terminal electrodes 203 of each LED chip 202 and the connection electrodes 103 of the circuit board 100 are fusion-joined, the laser processing apparatus 300 described in the first embodiment and the second embodiment can also be used.

<第4實施形態> 於第1實施形態及第2實施形態中,顯示使用保持構件之吸附力保持被處理對象(元件基板200)之例,但並非限定於該例者。例如,替代吸附,亦可使用藉由爪等機械性保持被處理對象之方法、或藉由使用粘著劑或粘著片等接著而保持被處理對象之方法。即,保持構件只要未成為雷射光之照射製程之阻礙,亦可以任意方法保持被處理對象。 <Fourth Embodiment> In the first embodiment and the second embodiment, the example in which the object to be processed (element substrate 200) is held using the adsorption force of the holding member is shown, but the invention is not limited to this example. For example, instead of adsorption, a method of mechanically holding the object to be processed with claws or the like, or a method of holding the object to be processed by adhesion using an adhesive or an adhesive sheet may be used. That is, as long as the holding member does not hinder the laser irradiation process, the object to be processed can be held in any way.

<第5實施形態> 於第1實施形態及第2實施形態中,顯示將保持構件與遮光罩作為不同構件之例,但並非限於此例者。例如,作為第2工件單元,亦可使用將保持構件與遮光罩一體形成之構造體。例如,亦可藉由於由玻璃、石英、或藍寶石等構成之保持構件之保持面添加黑色顏料或碳黑等之黑色物質,形成作為遮光罩發揮功能之區域。 <Fifth Embodiment> In the first embodiment and the second embodiment, the holding member and the light shielding cover are shown as different members, but the invention is not limited to this example. For example, as the second workpiece unit, a structure in which the holding member and the light shield are integrally formed may be used. For example, a region that functions as a light shield may be formed by adding a black substance such as black pigment or carbon black to the holding surface of the holding member made of glass, quartz, sapphire, or the like.

作為本發明實施形態之上述各實施形態可於彼此不矛盾之範圍內,適當組合而實施。基於各實施形態,熟知本技藝者適當進行構成要件追加、刪除或設計變更者、或進行步驟追加、省略或條件變更者,只要具備本發明之主旨,則均包含於本發明之範圍內。The above-described embodiments as embodiments of the present invention can be appropriately combined and implemented within the scope of not contradicting each other. Based on each embodiment, those skilled in the art may appropriately add, delete, or change structural elements, or add, omit, or change conditions, as long as the gist of the present invention is maintained, they are all included in the scope of the present invention.

又,凡與藉由上述各實施形態之態樣所獲得之作用效果不同之其他作用效果者,若係自本說明書記載所明瞭者或熟知本技藝者可容易預測者,當然應解釋為可藉由本發明而獲得者。In addition, any other effects that are different from those obtained by the above-described embodiments, if they are clear from the description of this specification or can be easily predicted by those familiar with the art, should of course be interpreted as being predictable. obtained by this invention.

10:顯示裝置 11:絕緣基板 12:半導體層 13:閘極絕緣層 14:閘極電極 15:絕緣層 16:源極電極 17:汲極電極 18:配線 19:平坦化層 20:連接配線 21:絕緣層 22:陽極電極 23:陰極電極 24:平坦化層 25a:安裝墊 25b:安裝墊 30:保持構件 30a:保持面 31:處理區域 32:吸附區域 32a:吸附孔 35:保持構件 35a:保持面 36:處理區域 37:吸附區域 37a:內部電極 37b:內部電極 40:遮光罩 40a:開口部 40b:吸附孔 42:遮光罩 42a:開口部 50:雷射光 60:雷射光 70:保持構件 100:電路基板 101:基板 102:驅動電路 103:連接電極 103a:連接電極 103b:連接電極 110:像素 110B:像素 110G:像素 110R:像素 112:顯示區域 114:周邊區域 116:端子區域 120:像素電路 120B:像素電路 120G:像素電路 120R:像素電路 121:資料線 122:閘極線 123:陽極電源線 124:陰極電源線 126:選擇電晶體 127:驅動電晶體 128:保持電容 129:LED 130:資料驅動電路 140:閘極驅動電路 150:端子部 151:連接配線 152:連接配線 160:可撓性印刷電路基板 170:IC晶片 200:基板 201:半導體基板 202:LED晶片 202B:LED晶片 202G:LED晶片 202R:LED晶片 203a:端子電極 203b:端子電極 203R:端子電極 300:雷射處理裝置 302:雷射振盪器 304:反射鏡 306:擴束器 308:第1工件單元 310:第2工件單元 320:第2工件單元 320a:雷射光 320b:雷射光 D1:方向 D2:方向 S11:步驟 S12:步驟 S13:步驟 10:Display device 11:Insulating substrate 12: Semiconductor layer 13: Gate insulation layer 14: Gate electrode 15:Insulation layer 16: Source electrode 17: Drain electrode 18:Wiring 19: Planarization layer 20:Connect wiring 21:Insulation layer 22:Anode electrode 23:Cathode electrode 24: Planarization layer 25a:Mounting pad 25b:Mounting pad 30:Keep components 30a:Maintenance surface 31: Processing area 32: Adsorption area 32a: Adsorption hole 35: Maintain components 35a:Maintenance surface 36: Processing area 37: Adsorption area 37a: Internal electrode 37b: Internal electrode 40: Lens hood 40a: opening 40b: Adsorption hole 42: Lens hood 42a: opening 50:Laser light 60:Laser light 70:Keep components 100:Circuit substrate 101:Substrate 102:Drive circuit 103: Connect the electrode 103a: Connect electrode 103b: Connect electrode 110: pixels 110B: pixel 110G:pixel 110R:pixel 112:Display area 114: Surrounding area 116:Terminal area 120:Pixel circuit 120B: Pixel circuit 120G: Pixel circuit 120R: Pixel circuit 121:Data line 122: Gate line 123:Anode power cord 124:Cathode power cord 126: Select transistor 127: Driving transistor 128: Holding capacitor 129:LED 130: Data drive circuit 140: Gate drive circuit 150:Terminal part 151:Connect wiring 152:Connect wiring 160: Flexible printed circuit substrate 170:IC chip 200:Substrate 201:Semiconductor substrate 202:LED chip 202B:LED chip 202G:LED chip 202R:LED chip 203a:Terminal electrode 203b:Terminal electrode 203R:Terminal electrode 300:Laser processing device 302:Laser oscillator 304:Reflector 306: Beam expander 308: 1st workpiece unit 310: 2nd workpiece unit 320: 2nd workpiece unit 320a:Laser light 320b:Laser light D1: direction D2: direction S11: Steps S12: Steps S13: Steps

圖1係顯示第1實施形態之顯示裝置之製造方法的流程圖。 圖2係顯示第1實施形態之顯示裝置之製造方法之剖視圖。 圖3係顯示第1實施形態之顯示裝置之製造方法之剖視圖。 圖4係顯示第1實施形態之顯示裝置之製造方法之剖視圖。 圖5係顯示第1實施形態之顯示裝置之製造方法之剖視圖。 圖6係顯示第1實施形態之顯示裝置之製造方法之剖視圖。 圖7係顯示第1實施形態之顯示裝置之製造方法之剖視圖。 圖8係顯示於第1實施形態之顯示裝置之製造方法中使用之雷射處理裝置之構成之圖。 圖9係顯示使用雷射處理裝置進行雷射光之照射製程之情況之圖。 圖10係顯示於第1實施形態之顯示裝置之製造方法中使用之雷射處理裝置之第2工件單元之構成之圖。 圖11係顯示第1實施形態之顯示裝置之概略構成之俯視圖。 圖12係顯示第1實施形態之顯示裝置之電路構成之方塊圖。 圖13係顯示第1實施形態之顯示裝置之像素電路之構成之電路圖。 圖14係顯示第1實施形態之顯示裝置之像素構成之剖視圖。 圖15係顯示於第2實施形態之製造方法中使用之雷射處理裝置之第2工件單元之構成之圖。 FIG. 1 is a flowchart showing the manufacturing method of the display device according to the first embodiment. FIG. 2 is a cross-sectional view showing the manufacturing method of the display device according to the first embodiment. FIG. 3 is a cross-sectional view showing the manufacturing method of the display device according to the first embodiment. FIG. 4 is a cross-sectional view showing the manufacturing method of the display device according to the first embodiment. FIG. 5 is a cross-sectional view showing the manufacturing method of the display device according to the first embodiment. FIG. 6 is a cross-sectional view showing the manufacturing method of the display device according to the first embodiment. FIG. 7 is a cross-sectional view showing the manufacturing method of the display device according to the first embodiment. FIG. 8 is a diagram showing the structure of a laser processing device used in the manufacturing method of a display device according to the first embodiment. FIG. 9 is a diagram showing the use of a laser processing device to perform a laser light irradiation process. FIG. 10 is a diagram showing the structure of the second workpiece unit of the laser processing apparatus used in the manufacturing method of the display device according to the first embodiment. FIG. 11 is a plan view showing the schematic structure of the display device according to the first embodiment. FIG. 12 is a block diagram showing the circuit configuration of the display device according to the first embodiment. FIG. 13 is a circuit diagram showing the structure of the pixel circuit of the display device according to the first embodiment. FIG. 14 is a cross-sectional view showing the pixel structure of the display device according to the first embodiment. FIG. 15 is a diagram showing the structure of the second workpiece unit of the laser processing apparatus used in the manufacturing method of the second embodiment.

S11:步驟 S11: Steps

S12:步驟 S12: Steps

S13:步驟 S13: Steps

Claims (7)

一種顯示裝置之製造方法,其包含如下步驟:準備設置有複數個LED晶片之第1基板;以上述複數個LED晶片位於上述第1基板與第2基板之間之方式,將上述複數個LED晶片配置於上述第2基板之上;經由固定於保持上述第1基板之保持構件之遮光罩,對上述複數個LED晶片中之一部分照射雷射光;且上述遮光罩係配置於上述保持構件之靠近上述第1基板之一側,且與上述第1基板密接;上述保持構件與上述遮光罩各自具有吸附孔,上述保持構件經由設置於上述保持構件與上述遮光罩之吸附孔而藉由真空吸附保持上述第1基板;上述雷射光係通過上述保持構件與形成於上述遮光罩之開口部。 A method of manufacturing a display device, which includes the following steps: preparing a first substrate provided with a plurality of LED chips; and placing the plurality of LED chips so that the plurality of LED chips are located between the first substrate and the second substrate. is disposed on the second substrate; a part of the plurality of LED chips is irradiated with laser light through a light shield fixed to the holding member holding the first substrate; and the light shield is disposed close to the holding member. One side of the first substrate is in close contact with the first substrate; the holding member and the light shield each have an adsorption hole, and the holding member holds the above by vacuum suction through the adsorption holes provided in the holding member and the light shield. The first substrate; the laser light passes through the holding member and the opening formed in the light shield. 如請求項1之顯示裝置之製造方法,其中上述雷射光經由上述保持構件對上述複數個LED晶片中之一部分照射。 The manufacturing method of a display device according to claim 1, wherein the laser light irradiates a part of the plurality of LED chips through the holding member. 如請求項1之顯示裝置之製造方法,其中上述第1基板保持於上述保持構件時,於俯視時,上述複數個LED晶片未與設置於上述保持構件之吸附孔重疊。 The method for manufacturing a display device according to claim 1, wherein when the first substrate is held on the holding member, in a plan view, the plurality of LED chips do not overlap with the adsorption holes provided on the holding member. 如請求項1或2之顯示裝置之製造方法,其中上述雷射光之照射包含 對上述遮光罩掃描線狀之雷射光。 The manufacturing method of the display device of claim 1 or 2, wherein the irradiation of the laser light includes Scan the linear laser light on the above-mentioned light shield. 如請求項1或2之顯示裝置之製造方法,其中上述雷射光係固體雷射之基本波或第2高諧波。 The manufacturing method of a display device according to claim 1 or 2, wherein the laser light is a fundamental wave or a second higher harmonic wave of a solid-state laser. 如請求項1或2之顯示裝置之製造方法,其中上述雷射光係近紅外光;上述保持構件由玻璃、石英、或藍寶石構成。 The manufacturing method of a display device according to claim 1 or 2, wherein the laser light is near-infrared light; and the holding member is made of glass, quartz, or sapphire. 如請求項6之顯示裝置之製造方法,其中藉由上述雷射光之照射,使上述第2基板之上之連接電極、與上述複數個LED晶片中之一部分中之端子電極接合。 The manufacturing method of a display device according to claim 6, wherein the connection electrode on the second substrate is bonded to the terminal electrode in a part of the plurality of LED chips by irradiation with the laser light.
TW111119806A 2021-06-07 2022-05-27 Manufacturing method of display device TWI825749B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2021095387A JP2022187380A (en) 2021-06-07 2021-06-07 Method for manufacturing display device
JP2021-095387 2021-06-07

Publications (2)

Publication Number Publication Date
TW202315110A TW202315110A (en) 2023-04-01
TWI825749B true TWI825749B (en) 2023-12-11

Family

ID=84500684

Family Applications (1)

Application Number Title Priority Date Filing Date
TW111119806A TWI825749B (en) 2021-06-07 2022-05-27 Manufacturing method of display device

Country Status (3)

Country Link
JP (1) JP2022187380A (en)
CN (1) CN115513341A (en)
TW (1) TWI825749B (en)

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108538878A (en) * 2018-07-11 2018-09-14 大连德豪光电科技有限公司 Micro- light emitting diode base plate and preparation method thereof, display device
TW201915566A (en) * 2017-09-29 2019-04-16 台虹科技股份有限公司 Method of transferring micro device
CN111128843A (en) * 2019-12-27 2020-05-08 深圳市华星光电半导体显示技术有限公司 Transfer method of Micro LED
CN111243999A (en) * 2018-11-29 2020-06-05 昆山工研院新型平板显示技术中心有限公司 Transfer device and transfer method for micro-component
TW202036927A (en) * 2019-03-19 2020-10-01 日商鷹野股份有限公司 Laser transfer device and laser transfer method
US20200335659A1 (en) * 2019-04-16 2020-10-22 Samsung Electronics Co., Ltd. Led transferring method and display module manufactured by the same

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW201915566A (en) * 2017-09-29 2019-04-16 台虹科技股份有限公司 Method of transferring micro device
CN108538878A (en) * 2018-07-11 2018-09-14 大连德豪光电科技有限公司 Micro- light emitting diode base plate and preparation method thereof, display device
CN111243999A (en) * 2018-11-29 2020-06-05 昆山工研院新型平板显示技术中心有限公司 Transfer device and transfer method for micro-component
TW202036927A (en) * 2019-03-19 2020-10-01 日商鷹野股份有限公司 Laser transfer device and laser transfer method
US20200335659A1 (en) * 2019-04-16 2020-10-22 Samsung Electronics Co., Ltd. Led transferring method and display module manufactured by the same
CN111128843A (en) * 2019-12-27 2020-05-08 深圳市华星光电半导体显示技术有限公司 Transfer method of Micro LED

Also Published As

Publication number Publication date
CN115513341A (en) 2022-12-23
JP2022187380A (en) 2022-12-19
TW202315110A (en) 2023-04-01

Similar Documents

Publication Publication Date Title
CN109830584B (en) Light emitting device and display apparatus using the same
CN212136471U (en) Unit pixel, pixel module and display device
WO2021005902A1 (en) Led module and display device including led module
WO2021010079A1 (en) Electronic component mounting structure, electronic component mounting method, and led display panel
TWI836205B (en) Installation method of light-emitting components and display device
JP2002343944A (en) Transferring method of electronic part, arraying method of element, and manufacturing method of image display device
TWI825749B (en) Manufacturing method of display device
WO2020262034A1 (en) Electronic component mounting structure, method for mounting same, and method for mounting led chip
EP3857602B1 (en) Display module and repairing method of the same
CN113851388A (en) Method for manufacturing display device
CN114122224B (en) Method for manufacturing display device
CN113924662A (en) Light emitting element with cantilever electrode, display panel with light emitting element and display device
KR101895600B1 (en) Display device and manufacturing method of the same
US20220320041A1 (en) Method of mounting electronic component, display device and circuit board
JP2022177487A (en) Method for manufacturing display
JP2023072906A (en) Manufacturing method for display device, and inorganic light-emitting element holding substrate
KR102671897B1 (en) Display device and manufacturing method thereof
JP7520030B2 (en) Unit pixel having light-emitting element, pixel module and display device
US11894335B2 (en) Display device and method for manufacturing the same
US20220336250A1 (en) Wafer for electronic components
WO2023063085A1 (en) Display device
JP2022013195A (en) Electronic device and manufacturing method for electronic device
CN115483320A (en) Pressing jig and transfer device
JP2022001911A (en) Display device
JP2024010383A (en) Manufacturing method for display device