TWI821694B - Electronic component testing device and testing method - Google Patents

Abstract

The present invention provides an electronic component testing device and a testing method. The electronic component testing device includes: a machine platform, on which a machine table is provided; and a load-bearing chassis, which is provided on the machine table. The load-bearing chassis is provided with a device that can be driven. A rotating test plate is provided with a feeding unit, an inspection unit, and a discharge unit outside the periphery of the load-bearing chassis; wherein, the inspection unit is provided with a first inspection unit, and the first inspection unit is provided with a first seat frame, a plurality of box-shaped first upper terminal boxes, and a plurality of box-shaped first lower terminal boxes; the first upper terminal box is provided with a plurality of first upper terminals; the first lower terminal box is provided with A plurality of first probes; thereby adapting to the needs of multiple terminal modules.

Description

Electronic component testing device and testing method

The present invention relates to a testing device and a testing method, in particular to an electronic component testing device and a testing method suitable for testing electronic components.

General electronic components usually need to be tested to determine their physical characteristics after they are manufactured. For example, the device provided in the "Circuit Component Loading and Unloading Device" patent application No. 411735 for testing capacitor-type electronic components uses a Or a concentric ring seat of several component sockets can rotate relative to the center of the ring. The sockets rotate evenly at angular intervals and in increments. The rotation increment is the angular interval between adjacent sockets. The ring seat is It is tilted at a certain angle, and when the ring seat rotates, the component flow path dumps the components toward the ring seat. The fixed grid adjacent to the side of the outer plate of the groove seat limits the unreturned components and randomly rolls down through the ring seat due to power. The empty slot in the arc section of the rotating path rolls randomly to return the component into the slot. In the path of the rotating ring seat, there is an electronic contactor used to connect the component and the testing machine. The tested component passes through an ejection manifold. Below the tube, the discharge manifold plate defines a plurality of discharge holes, and the discharge holes are aligned with a set of slots each time the ring seat is rotated by an increment. The discharge pipe is connected to the discharge port, and the element is selectively activated. The air blast from each pneumatic valve is ejected from the slot seat. Due to the air blast and gravity, the ejected components fall through the pipe and enter the classification storage box according to the guidance of the piping board. The component flow path can respond to the indication The grid is selectively directed to the grid by signals from component detectors that detect components in the slots that have not yet been ejected from the ejection manifold.

Although the prior art of the patent application No. 411735 provides testing and classification collection of capacitive electronic components, the terminal composition of the prior art is through a frame. Create five hollow slots, and then install a terminal module in each slot. Since each terminal module is fixed on one side of the slot with a mounting bracket, the other side is left vacant. , in order to provide the necessary space for the extension of the upper terminals and extension ends, so the space occupied by each terminal module is quite wide. Although the prior art also mentioned that the number of slots and terminal modules can be increased, but with The design of its terminal module mechanism creates a huge obstacle in the vacant space between each slot. If the number of slots and terminal modules increases, the frame will be quite large and affect the setting of other mechanisms. In view of this, there is room for improvement. .

Therefore, an object of the present invention is to provide an electronic component testing device that can meet the needs of multiple terminal modules.

Another object of the present invention is to provide an electronic component testing method that allows more specific consideration of inspection requirements for different detection characteristics.

An electronic component testing device according to the object of the present invention includes: a machine platform on which a machine table is provided; a load-bearing chassis located on the machine table; a test board that can be driven to rotate is provided on the load-carrying chassis, and A feeding unit, an inspection unit, and a discharge unit are provided outside the periphery of the load-bearing chassis; wherein, the inspection unit is provided with a first inspection unit, and the first inspection unit is provided with a first frame, arc-shaped at intervals. A plurality of box-shaped first upper terminal boxes are arranged in a parallel manner on the first base frame, and a plurality of box-shaped first terminal boxes are arranged in an arc-shaped parallel manner at intervals and corresponding to each other below each of the first upper terminal boxes. a first lower terminal box; the first upper terminal box is provided with a plurality of first upper terminals arranged in a straight line at intervals; the first lower terminal box is provided with a plurality of first probes arranged in a line at intervals and capable of micro-moving up and down; The inspection unit is further provided with a second inspection unit. The second inspection unit is provided with a second base frame, a box-shaped second upper terminal box located on the second base frame, and a second upper terminal box corresponding to the second upper terminal box. A box-shaped second lower terminal below the box The second upper terminal box is provided with a plurality of second upper terminals arranged in parallel and linearly spaced apart. The second lower terminal box is provided with a plurality of second probes arranged in parallel and linearly spaced apart and capable of micro-moving up and down.

An electronic component testing method according to another object of the present invention includes: using the electronic component testing device as described above, wherein the first inspection unit is used to inspect the insulation resistance of the capacitor, and the second inspection unit is used to inspect the capacitor's electrical resistance. For capacity, loss or quality factor inspection, when the component under test is placed in a slot on the test board and is transported by the intermittently rotating flow path in a clockwise direction, it first passes through the second upper terminal box and the second upper terminal box of the second inspection unit. The capacitance, loss or quality factor to be tested is measured between the second lower terminal box, and then the insulation resistance is tested between the first upper terminal box and the first lower terminal box of the first inspection unit.

In the electronic component testing device and testing method according to the embodiment of the present invention, since each of the first upper terminals and each of the first probes are integrated in the box, the most appropriate installation plan can be made for the provided bracket. And arrangement, the spacing between the plurality of first upper terminal boxes or the plurality of first lower terminal boxes can be kept close without affecting the progress of the test, so that the corresponding first upper terminal boxes and the first lower terminal boxes The number of groups can be increased to accommodate the needs of multiple terminal modules and provide more tests; in addition, in the test method, by combining the second inspection unit for testing capacitance, loss or quality factor with the second inspection unit for testing insulation resistance The first inspection unit is separated by a distance to form two independent inspection units supported by different brackets, so that the first and second inspection units with different detection characteristics (such as power consumption, electrode loss, number of test terminal groups, etc.) The second inspection unit can make more exclusive considerations, so that the component under test can be tested more accurately and effectively.

A:Machine

A1:Machine table

A2:Machine desktop

A21: Positioning hole

B: Bearing chassis

B1: Feeding block

B11: Feed suction ditch

B12: Suction hole

B13: short arc edge

B14: long arc edge

B15: front edge

B16: Back end edge

B17: empty position

B171: Third suction groove

B172: Suction hole

B2: Check block

B21: First check block

B211: First suction ditch

B212: Suction hole

B213: ribs

B214:shaft collar

B215: Shaft hole

B216: short arc edge

B217: long arc edge

B218: Front edge

B219: rear edge

B22: Second check block

B221: Second suction groove

B222: Suction hole

B223: ribs

B224:shaft collar

B225: Shaft hole

B226: short arc edge

B227: long arc edge

B228: Front edge

B229: rear edge

B23: Second check block

B3: discharge block

B31: Discharge suction ditch

B32: Suction hole

B33: short arc edge

B34: long arc edge

B35: front edge

B36: rear edge

C:Test board

C1: Seat slot

C2:Guide ditch

C3: Cleaning tank

C31: Expanded convex interval

D: Feeding unit

E: Check unit

E1: First inspection unit

E11: The first pedestal

E111: Fixed seat

E1111: Fixed part

E1112:Sliding seat

E1113:Adjustment parts

E112: Support bracket

E1121: Rail base

E1122: Sliding part

E1123: Support part

E1124: Elastic parts

E1125:Adjustment parts

E1126: Rod

E1127: Pivot joint

E113: lift frame

E1131: Giveback interval

E1132: Support part

E1133: Screws

E1134: embedded hole

E1135: blocking hole

E1136: Pad

E12: First upper terminal box

E121: Box cover

E1211: fixed cover base

E1212: Movable cover base

E122: Upper box seat

E1221: Connector

E1222: Upper terminal block

E123: First upper terminal assembly

E1231: First upper terminal

E1232: Upper terminal block

E1233: Elastic parts

E1234: conductive sheet

E1235:Transfer part

E1236: Connector

E1237:Cable

E13: The first terminal box

E131: Probe holder

E132:Lower box seat

E133: First probe

E134:Cable

E135: first electrode

E2: Second inspection unit

E21: Second mount

E211: Base

E2111:Latch

E212: lift seat

E2121: Positioning hole

E2122: Grip

E2123:Screws

E2124:pedestal

E2125: The first fine adjustment seat

E2126: Second fine adjustment seat

E2127: Fixed bracket

E2128: The third fine adjustment seat

E2129: Fine adjustment knob

E22: Second upper terminal box

E221: base plate

E222:MOSFET circuit

E223:Terminal block

E224: Second upper terminal assembly

E2241: Second upper terminal

E2242: Upper terminal block

E2243: Stopper

E2244: Elastic parts

E2245: conductive sheet

E2246:Transfer part

E2247:Cable

E23: Second lower terminal box

E231: Base plate

E232:MOSFET circuit

E233: Probe holder

E234: Second probe

E235: Second electrode

E2351: Electrode part

E2352: Threaded part

E2353:Adjustment Department

E236:Electrode holder

E2361: Fine adjustment hole

E3: Second inspection unit

F: Discharge unit

G: Feeding unit

H: guide frame

K: collection agency

L: radial axis

FIG. 1 is a schematic three-dimensional view of an electronic component testing device to illustrate an embodiment of the present invention.

Figure 2 is a schematic diagram of the configuration of various mechanisms on the table of the electronic component testing device.

Figure 3 is a schematic diagram of the carrying chassis in the electronic component testing device.

Figure 4 is a schematic diagram of each block corresponding to each unit in the electronic component testing device.

Figure 5 is a schematic diagram of the upper surface of the test board in the electronic component testing device.

Figure 6 is a schematic diagram of the lower surface of the test board in the electronic component testing device.

Figure 7 is a schematic diagram of the positional relationship between the first inspection unit and the intermittent rotation flow path of the test board in the electronic component testing device.

Figure 8 is a schematic diagram of the corresponding relationship from one side of the first inspection unit in the electronic component testing device.

Figure 9 is a schematic view of the lifting frame in the first inspection unit of the electronic component testing device.

FIG. 10 is a schematic diagram of the arrangement relationship of a plurality of first upper terminal assemblies and a plurality of first probes in the first inspection unit of the electronic component testing device.

FIG. 11 is a partially enlarged schematic diagram of the arrangement relationship of a plurality of first upper terminal assemblies and a plurality of first probes in the first inspection unit of the electronic component testing device.

FIG. 12 is a partially exploded perspective view of the first inspection area and a row of first electrodes of the carrier chassis in the electronic component testing device.

Figure 13 is a schematic diagram of the positional relationship between the second inspection unit and the intermittent rotation flow path of the test board in the electronic component testing device.

FIG. 14 is a schematic diagram of the arrangement relationship of a plurality of second upper terminal assemblies and a plurality of second probes in the second inspection unit of the electronic component testing device.

FIG. 15 is a partially enlarged schematic diagram of the arrangement relationship of a plurality of second upper terminal assemblies and a plurality of second probes in the second inspection unit of the electronic component testing device.

Figure 16 is a three-dimensional exploded schematic view of the second inspection block and the second electrode of the carrying chassis in the electronic component testing device.

Figure 17 is a schematic bottom view of the second inspection block of the carrying chassis in the electronic component testing device.

Please refer to Figures 1 and 2. The embodiment of the present invention is explained with an electronic component testing device used for testing capacitive components under test, but it is not limited to the implementation of capacitive electronic components; A machine table A1 tilted about 60 degrees on the table A is provided with a disk-shaped metal bearing chassis B. The bearing chassis B is provided with a test plate C that can be driven to rotate intermittently in a clockwise direction. , and are provided outside the periphery of the carrier chassis B with a feeding unit D for loading the components under test, an inspection unit E for testing the characteristics of the components under test, and the components under test that have been tested. A discharge unit F that discharges and collects is provided with a feeding unit G for providing the component to be tested and a feeding unit G for guiding the discharge unit F to a collection mechanism K on a machine desktop A2 at the level of the machine A. The material guide frame H is provided with the collection mechanism K on the front side of the machine A to accommodate a plurality of material boxes K1.

Please refer to Figure 2. The inspection unit E is provided with a first inspection unit E1 for inspecting the insulation resistance of the capacitor (commonly known as IR), and for inspecting the capacitance, loss or quality factor (commonly known as CD) of the capacitor. There are two second inspection units E2 and E3 respectively located in front and behind the first inspection unit E1 in the direction in which the test board C rotates intermittently; among them, the second inspection unit E1 located in the direction intermittently rotates behind the first inspection unit E1 The second inspection unit E3 can be omitted as needed.

Please refer to Figures 3 and 4. The load-bearing chassis B is composed of a plurality of sector-shaped blocks of different sizes that are independent but can be connected and combined with each other, including a set corresponding to the feeding unit D. The feeding block B1, an inspection block B2 corresponding to the inspection unit E, and a discharge block B3 corresponding to the discharge unit F, wherein the inspection block B2 is composed of independent but mutually docking groups. It is composed of a first inspection block B21 and two second inspection blocks B22 and B23, wherein the first inspection block B21 is provided correspondingly to the first inspection unit E1, and the two second inspection blocks B22 and B23 are arranged correspondingly. Inspection blocks B22 and B23 are respectively provided corresponding to the two second inspection units E2 and E3; the feed block B1 is provided with a plurality of concentric annular columns (8 columns in this embodiment) spaced apart in the radial direction. A concave circular arc-shaped feeding suction groove B11 is provided, and each feeding suction groove B11 is provided with a groove along the entrance. A plurality of hollow suction holes B12 are arranged at intervals at the bottom of the material suction trench B11; the suction holes B12 can be connected to a negative pressure source for vacuuming, so that a negative pressure vacuum state is formed in the material suction trench B11; the material feeding block B1 includes A short arc side B13 and a long arc side B14 that are parallel to each other, and a front end side B15 and a rear end side B16 that form an angle with each other; the first inspection block B21 is provided with a plurality of rows spaced apart in the radial direction. (This embodiment has 8 rows) concentrically arranged concave annular arc-shaped first suction grooves B211. Each first suction groove B211 is provided with a plurality of hollow suction grooves arranged at intervals along the bottom of the first suction groove B211. Hole B212, on the rib B213 at the corresponding position between every two first suction grooves B211 arranged in a radial straight line, is provided with multiple rows (this embodiment has 16 rows) spaced apart on the sector-shaped radial axis, respectively. There is a collar B214 made of insulating material, and each collar B214 is provided with an axis hole B215; the suction hole B212 can be connected to a negative pressure source for vacuuming, so that a negative pressure vacuum state is formed in the first suction groove B211; An inspection block B21 includes a short arc side B216 and a long arc side B217 that are parallel to each other, and a front end side B218 and a rear end side B219 that form an angle with each other; the second inspection block B22 is provided with a diameter Concentrically arranged concave circular arc-shaped second suction trenches B221 are arranged in a plurality of spaced rows (8 rows in this embodiment). Each second suction trench B221 is provided with a spaced arrangement along the bottom of the second suction trench B221. There are a plurality of hollow suction holes B222, and there is only one row of ribs B223 at the corresponding parts between every two second suction grooves B221 arranged in a radial straight line. Each shaft is provided with a collar B224 made of insulating material. The ring B224 is provided with a shaft hole B225, and the shaft rings B224 of each row are jointly located on the radial axis L in the center of the sector; the suction hole B222 can be connected to the negative pressure source for vacuuming, so that a negative pressure is formed in the second suction groove B221 The vacuum state; the second inspection block B22 includes a short arc side B226 and a long arc side B227 that are parallel to each other, and a front end side B228 and a rear end side B229 that form an angle with each other; The second inspection block B23 has the same structure as the second inspection block B22 and can be deduced from the same structure, so we will not go into details here. However, when the second inspection unit E3 is omitted as it is not necessary as mentioned above, the second inspection block B23 The collar B224 and the shaft hole B225 in the second inspection block B22 can be omitted as shown in Figure 3; the discharge block B3 is provided with a plurality of rows spaced apart in the radial direction (this embodiment is provided with 8 rows). ) Concentrically arranged concave circular arc-shaped discharge suction grooves B31, each discharge suction groove B31 is provided with a plurality of hollow suction holes B32 arranged at intervals along the bottom of the discharge suction groove B31; the suction holes B32 The negative pressure source can be connected to evacuate, so that a negative pressure vacuum state is formed in the discharge suction groove B31; the discharge block B3 includes a short arc edge B33 and a long arc edge B34 that are parallel to each other, and an angle formed with each other. The front end side B35 and the rear end side B36; the first suction groove B211 on the first inspection block B21 and the second suction groove B221 on the second inspection blocks B22 and B23 are connected during assembly, However, the feeding suction groove B11 on the feeding block B1 and the discharge suction groove B31 on the discharge block B3 are not connected to each other when combined; the feeding suction groove B11 on the feeding block B1 The groove B11 leaves a section of empty space B17 at the rear end. The empty space B17 is provided with a small section of the third suction groove B171 that is connected to the second suction groove B221 on the second inspection block B22 when combined, and is connected to the second suction groove B171 in the second inspection block B22. A hollow suction hole B172 is provided in the third suction groove B171.

Please refer to Figures 3 and 5. The upper surface of the test plate C is provided with a plurality of radially spaced rows (8 rows in this embodiment) of concentrically arranged rectangular grooves C1. Each column of C1 is provided with a plurality of annular spacers at intervals, and the radially corresponding slots C1 of each column are arranged in multiple rows at linear intervals; each slot C1 can accommodate a component to be tested with electrodes respectively provided on the top and bottom. For example, capacitor-type electronic components, the component to be tested is placed in the slot C1 at the feeding unit D in FIG. 5 with the electrodes located at the upper and lower ends respectively.

Please refer to Figures 3 and 6. A section of concave guide grooves C2 is provided at the bottom of each seat groove C1 on the lower surface of the test plate C, extending radially toward the outer circumference. Each of the guide grooves C2 is connected to the inlet of the load-bearing chassis B. The material suction trench B11, the first suction trench B211, the second suction trench B221, and the discharge suction trench B31 are on this test board. C is turned on during intermittent rotation, so that negative pressure is introduced from the suction holes B12, B212, B222, and B32 in the bearing chassis B. When vacuuming, the negative pressure can pass through the inlet suction groove B11, The first suction groove B211, the second suction groove B221, and the discharge suction groove B31 adsorb the object to be tested (in this embodiment, a capacitor-type electronic component) accommodated in the seat groove C1; the test board A long concave interval-shaped cleaning groove C3 is formed between the two rows of seat grooves C1 on the lower surface of C. The cleaning groove C3 forms an expanded convex interval C31 close to each seat groove C1 near each seat groove C1. The cleaning tank C3 is used to accommodate the dust generated by the friction between the lower surface of the test plate C and the bearing chassis B during long-term operation, so as to avoid blocking the bottom aperture of the seat slot C1.

Please refer to Figures 7 to 9. The first inspection unit E1 is provided with a first base frame E11, and a plurality of box-shaped first upper terminal boxes arranged in an arc-shaped parallel manner on the first base frame E11 at intervals. E12, and a plurality of box-shaped first lower terminal boxes E13 respectively arranged below each first upper terminal box E12 in an arc-shaped and spaced apart manner; wherein, the first frame E11 is provided with a fixed seat E111, a support frame E112 that can move up and down relative to the fixed base E111, and a lifting frame E113 that can be lifted up, down, or placed; the fixed base E111 is provided with a structure in an angle with the machine table A1 There is a fixed part E1111 arranged horizontally and a sliding seat E1112 arranged vertically with the machine table A1. Two adjusting parts E1113 composed of bolts are provided on one side of the fixed part E1111. The two adjusting parts E1113 are arranged on the left and right at intervals. The fine-tuning fixing part A11 provided on the tabletop A1 of the machine in Figure 1 can be used to finely adjust the left and right tilt positioning of the first base frame E11; the support E112 is provided with a slider arranged parallel to the sliding seat E1112. Rail base E1121. The rail base E1121 is provided with a sliding part E1122 so that the rail base E1121 can move up and down relative to the sliding base E1112. The support frame E112 is above the rail base E1121 relative to the other side of the fixed part E1111. A support portion E1123 extends on one side parallel to the machine table A1. The lower end of the sliding portion E1122 is supported by an elastic member E1124 composed of a spring, so that the support portion E1123 maintains a predetermined height position; the support frame E112 There is a rail base E1121 on the same side of the fixed part E1111. Knob-type adjusting piece E1125. The adjusting piece E1125 uses a threaded rod E1126 to be screwed to the fixed base E111. By rotating and adjusting the adjusting piece E1125, the supporting frame E112 can be moved up and down; the lifting frame E113 and the supporting frame A pivot portion E1127 is pivoted on the frame E112 and can be opened or placed on the support portion E1123. The support portion E1123 is provided with a return interval E1131 that is arc-shaped and concave from one side to the side of the fixed seat E11. , and a left and right supporting portion E1132 is respectively formed on both sides of the return section E1131. Each supporting portion E1132 is provided with a screw E1133, which can screw the lifting frame E113 and the supporting portion E1123 into position.

Please refer to Figures 7, 10, and 11. Each of the first upper terminal boxes E12 is respectively disposed on the lift E113 of the first base frame E11 and is located above the test board C; The terminal box E12 is provided with a box cover E121 located above the flipping frame E113 and an upper box base E122 located below the flipping frame E113; the upper end of the upper box base E122 is embedded in an embedded hole E1134 of the flipping frame E113. The top of the flip frame E113 is covered with a plurality of pads E1136 that are respectively corresponding to the blocking holes E1135 of the embedded hole E1134. The aperture of the blocking hole E1135 is smaller than the aperture of the embedded hole E1134, so that the upper end of the upper box seat E122 can be Obtain stop positioning; the box cover E121 includes a fixed cover seat E1211 on one side and fixed on the pad E1136 and a movable cover seat on the other side that is detachably provided on the side of the fixed cover seat E1211 E1212; The upper box seat E122 includes a connecting seat E1221 located above and an upper terminal seat E1222 located below, and the connecting seat E1221 is embedded in the embedded hole E1134; the upper box seat E122 is provided with a plurality of First upper terminal assemblies E123 are arranged in straight lines at intervals (eight in this embodiment). Each first upper terminal assembly E123 is composed of a rolling wheel body located above the test board C in order from bottom to top. A first upper terminal E1231 is located in a recessed hole E1222 on the upper box seat E122 for installing the first upper terminal E1231. An upper terminal block E1232 is provided above the upper terminal block E1232 in the hole E1222. An elastic member E1233 composed of a spring that drives the first upper terminal E1231 up and down, and an elongated sheet-shaped conductive piece E1234 with one end connected to the first upper terminal E1231 and electrically connected to the first upper terminal E1231. The other end of the conductive piece E1234 is electrically connected to an adapter portion E1235 that is fixed at one end of the connection base E1221 and the adapter portion E1235, and the other end of the conductive piece E1234 protrudes into the box cover E121. A connector E1236, a cable E1237 that is welded and connected to the connector E1236 in the box cover E121 and extends to the outside of the first upper terminal box E12 through a cable hole E1213 on the box cover E121; each of the The first lower terminal boxes E13 are respectively provided below the carrying chassis B. The first lower terminal boxes E13 include a probe seat E131 located above and a lower box seat E132 located below the probe seat E131. The probe The base E131 is provided with a plurality of first probes E133 (eight probes in this embodiment) spaced apart in straight lines and subject to elastic action (a spring is provided in the probe, not shown in the figure) that can move up and down slightly. Each first probe E133 The lower end of the probe E133 is welded in the lower box seat E132 and extends through a cable hole E1321 on the lower box seat E132 to a cable E134 outside the lower box seat E132; please refer to Figures 11 to 12, each The upper end of a first probe E133 respectively presses against the bottom end of a first electrode E135. The first electrode E135 is rod-shaped and is connected to the shaft corresponding to the first inspection block B21 of the carrier chassis B. The hole B215 is welded firmly and cannot be displaced, and the upper end surface of the first electrode E135 is against the bottom of the seat groove C1 on the test plate C in Figure 6.

Please refer to Figures 13 to 15. The second inspection unit E2 has the same mechanism as E3. The same can be said. The second inspection unit E2 is used as an explanation below. The second inspection unit E2 is provided with a second bracket E21. , a box-shaped second upper terminal box E22 provided on the second base frame E21, and a box-shaped second lower terminal box E23 correspondingly provided below the second upper terminal box E22; wherein, the The second frame E21 is provided on the machine table A1 with a base E211. The base E211 is provided with a latch E2111 on one side that can perform pull-out displacement in the X-axis direction. It is located on the upper surface and is opposite to the second upper terminal box. The other side of E22 is pivotally connected to the base E211. The lift base E212 is provided with a positioning hole E2121 on one side for the plug E2111 to be inserted when it is lifted. The positioning hole E2121 is located on the upper surface of the lift base E212 in the Z-axis direction. A handle E2122 for holding the lift seat E212 to lift it to one side is located at The upper surface of the flip base E212 can lock the flip base E212 to a screw E2123 of the base E211, and an upright pedestal E2124 located on the upper surface of the flip base E212. There is a bottom between the pedestal E2124 and the flip base E212. A first fine-tuning seat E2125 for fine-tuning the axial displacement of the pedestal E2124X and a second fine-tuning seat E2126 for fine-tuning the axial displacement of the pedestal E2124Y. A fixing frame for fixing the second upper terminal box E22 is provided on one side of the pedestal E2124. E2127, a third fine-tuning seat E2128 is provided between one side of the pedestal E2124 and the fixed frame E2127 for fine-tuning the Y-axial displacement of the fixed frame E2127. The third fine-tuning seat E2125 is also provided with a fine-tuning knob E2129 with a scale for fine-tuning. The height of the distance between the second upper terminal box E22 and the upper surface of the test board C; the second upper terminal box E22 is provided with a bottom plate E221 for fixing with the fixing bracket E2127, and the bottom plate E221 is provided with a A set of MOSFET circuits E222 composed of circuits on a plurality of printed circuit boards and a terminal base E223 located below. The terminal base E223 is provided with a plurality (eight in this embodiment) of second linearly spaced parallel circuits. Upper terminal assembly E224, each second upper terminal assembly E224 is provided with a second upper terminal E2241 composed of a rolling wheel body located above the test board C in sequence from bottom to top, and is recessed on the terminal base E223. There is an upper terminal base E2242 in a hole E2231 for installing the second upper terminal E2241. One end is fixed on the upper terminal base E2242 and the other end maintains a distance from the inner upper edge of the hole E2231 to limit the second upper terminal. A stopper E2243 at the top dead center of E2241, an elastic member E2244 composed of a spring located above the upper terminal seat E2242 in the hole E2231 to provide the up and down elastic driving force of the second upper terminal E2241, and one end of which is connected to the second upper terminal E2241 An elongated sheet-shaped conductive piece E2245 is connected and electrically conductive, an adapter portion E2246 is fixed at the other end of the conductive piece E2245, and an adapter portion E2246 is welded and integrated with the MOSFET circuit E222. Cable line E2247; the second lower terminal box E23 is provided below the carrying chassis B. The second lower terminal box E23 is provided with a bottom plate E231. The bottom plate E231 is provided with circuits on a plurality of printed circuit boards located below. A set of MOSFET circuits E232 and a probe holder E233 located above the probe holder E233 is provided with a plurality of (eight in this embodiment) second probes E234 spaced apart in straight lines and subject to elastic action (a spring is provided in the probe, not shown in the figure) that can move up and down slightly, please refer to Figure 15 ~17, the upper end of each second probe E234 is pressed against the bottom end of a second electrode E235. The second electrode E235 is rod-shaped and is respectively provided with an electrode portion E2351 from top to bottom, and an outer portion. A threaded portion E2352 of the thread, and an adjustment portion E2353 with a hexagonal cross-section (or hexagonal recess) that can be turned by a tool for fine adjustment up and down; the corresponding shaft hole on the second inspection block B22 of the carrier chassis B An electrode holder E236 is provided below B215. The electrode holder E236 is provided with a fine-tuning hole E2361 corresponding to the shaft hole B225 on the second inspection block B22 of the bearing chassis B and with an internal thread inside. The second electrode E235 uses the threaded portion E2352 to be screwed into the fine-tuning hole E2361 of the electrode base E236, and uses the electrode portion E2351 to extend through the corresponding shaft hole B225 on the second inspection block B22 of the bearing chassis B, and The upper end surface of the electrode part E2351 is pressed against the bottom of the seat groove C1 on the test board C in FIG. 6 .

Taking the capacitive component under test as an example, when the component under test is located in the seat groove C1 on the test board C and is transported by the clockwise intermittently rotating flow path, it first passes through the second inspection unit E2. Between the two upper terminals E2241 and the second electrode E235, the capacitance, loss or quality factor (commonly known as CD) of the capacitor under test is passed through the first upper terminal E1231 and the first electrode E135 of the first inspection unit E1 time, based on the insulation resistance (commonly known as IR) of the capacitor under test, and then the capacitance, loss or quality factor test of the capacitor can be carried out again through the second inspection unit E3 as necessary; among which, the first inspection unit E1 is due to There are multiple sets of the corresponding first upper terminal box E12 and the first lower terminal box E13. Therefore, when performing the insulation resistance test of the capacitor, each four groups can be charged, charged, tested, and discharged in multiple stages. test.

Since the first inspection unit E1 is used to check the insulation resistance of the test capacitor, the amount of electricity it tests is low, and the first electrode E135 has less loss, so it is welded and fixed by the shaft hole B215 corresponding to the bearing chassis B. cannot be moved, but the second inspection unit E3 is used as the capacitance of the capacitor, The test power of the loss or quality factor test is relatively high, so the design allows the second electrode E235 to be fine-tuned up and down to make relative displacement with the shaft hole B225 on the second inspection block B22 of the load-bearing chassis B. , to adapt to the higher loss that the second electrode E235 needs to deal with!

In the electronic component testing device according to the embodiment of the present invention, since each of the first upper terminals E1231 and each of the first probes E133 are integrated in the box, the most appropriate installation plan can be made for the provided bracket E11 And arrange, the spacing between the plurality of first upper terminal boxes E12 or the plurality of first lower terminal boxes E13 can be kept close without affecting the progress of the test, so that the corresponding first upper terminal boxes E12 and the first The number of lower terminal boxes E13 can be increased to accommodate the needs of multiple terminal modules and provide more tests; in addition, in terms of test methods, by combining the second inspection unit E2 for testing capacitance, loss or quality factor with The first inspection unit E1 for testing insulation resistance is separated by a distance to form two independent inspection units supported by different brackets E21 and E11, so that two different inspection characteristics (such as power consumption, electrode loss, number of test terminal groups - ---etc.)'s first and second inspection units E1 and E2 can make more exclusive considerations, so that the component under test can be tested more accurately and effectively.

However, the above are only examples of the present invention, and should not be used to limit the scope of the present invention. All simple equivalent changes and modifications made based on the patent scope of the present invention and the content of the patent specification are still within the scope of the present invention. Within the scope covered by the patent of this invention.

E1: First inspection unit

E11: The first pedestal

E1111: Fixed part

E1113:Adjustment parts

E1123: Support part

E1125:Adjustment parts

E1127: Pivot joint

E113: lift frame

E1131: Giveback interval

E1132: Support part

E1133: Screws

E12: First upper terminal box

E1211: fixed cover base

E1212: Movable cover base

Claims (23)

An electronic component testing device, including: a machine platform with a machine tabletop; a load-bearing chassis located on the machine table; a test board that can be driven to rotate is provided on the load-carrying chassis, and is mounted on the load-carrying chassis A feeding unit, an inspection unit, and a discharge unit are provided outside the periphery; wherein, the inspection unit is provided with a first inspection unit, and the first inspection unit is provided with: a first frame, arranged in an arc-shaped manner at intervals. A plurality of box-shaped first upper terminal boxes provided on the first base, and a plurality of box-shaped first box-shaped first terminal boxes respectively arranged in an arc-shaped parallel manner at intervals and corresponding to each other below the first upper terminal boxes. a lower terminal box; the first upper terminal box is provided with a plurality of first upper terminals arranged in a straight line at intervals; the first lower terminal box is provided with a plurality of first probes arranged in a line at intervals and capable of micro-moving up and down; the inspection unit A second inspection unit is further provided. The second inspection unit is provided with a second base frame, a box-shaped second upper terminal box located on the second base frame, and a corresponding lower part of the second upper terminal box. A box-shaped second lower terminal box; the second upper terminal box is provided with a plurality of second upper terminals spaced in a straight line and juxtaposed; the second lower terminal box is provided with a plurality of spaced line in a juxtaposition and can move up and down Second probe. The electronic component testing device according to claim 1, wherein the first base is provided with a fixed base, a support frame that can move up and down relative to the fixed base, and a support frame that can be opened up or down or placed. lift frame. The electronic component testing device of claim 2, wherein the fixed base is provided with a fixed portion arranged horizontally with the machine table and a sliding seat arranged vertically with the machine table, and the support frame is provided with the A rail base with sliding seats arranged in parallel. The rail base is provided with a sliding part so that the rail base can The sliding base is relatively slid up and down, and the supporting frame is extended above the rail base to the other side of the fixed part and has a supporting part parallel to the table surface of the machine. The electronic component testing device according to claim 3, wherein the lower end of the sliding part is supported by an elastic member to maintain the supporting part at a predetermined height position; the supporting frame and the rail base are on the same side relative to the fixed part An adjusting piece is provided. The adjusting piece is screwed onto the fixing base with a threaded rod. By rotating and adjusting the adjusting piece, the support frame can be moved up and down. The electronic component testing device according to claim 2, wherein the fixing part is provided with two adjusting parts composed of bolts on one side, and the two adjusting parts are spaced apart on the left and right and are fixed by a fine-tuning screw on the table of the machine. parts, the left and right tilt positioning of the entire first base frame can be finely adjusted to each other. As claimed in claim 2, the electronic component testing device is characterized in that the lift frame is pivotally connected to a pivot portion on the support frame so that it can be opened or placed on the support portion, and the support portion is provided with a side direction from one side to the other. There is a recessed arc-shaped recessed section on the side of the fixed seat. A left and right support portion is formed on both sides of the recessed section. Each support portion is provided with a screw to connect the lift frame to the support. Set the screw position. The electronic component testing device according to claim 2, wherein the first upper terminal box is provided with a box cover located above the flipping frame and an upper box base located below the flipping frame, and the upper end of the upper box base is embedded in the In an embedded hole of the flip frame, the flip frame is covered with a pad provided with a plurality of blocking holes respectively corresponding to the embedded hole. The aperture of the blocking hole is smaller than the aperture of the embedded hole, so that the upper box base The upper end is used to obtain stop positioning. The electronic component testing device according to claim 7, wherein the box cover includes a fixed cover seat on one side and fixed on the pad and a removable cover seat on the other side of the fixed cover seat. A movable cover base. The electronic component testing device of claim 7, wherein the upper box base includes a connecting base located above and an upper terminal base located below, and the connecting base is embedded in the embedding hole. The electronic component testing device of claim 7, wherein the upper box base is provided with a plurality of first upper terminal assemblies spaced apart from each other in straight lines, and the first upper terminal assemblies are provided in sequence from bottom to top on the test The first upper terminal above the board is located in a recessed hole on the upper box base for installing the first upper terminal. The first upper terminal block is provided above the upper terminal base in the hole. An elastic member for the up and down elastic driving force of the terminal, a conductive piece with one end connected to the first upper terminal and electrically conductive, an adapter portion for fixing the other end of the conductive piece, and one end located in the connection base and the The other end of the conductive piece at the transfer part is electrically connected and the other end protrudes from a connecting piece in the box cover. The connecting piece is welded and connected in the box cover and extends through a cable hole on the box cover. to a cable outside the first upper terminal box. The electronic component testing device of claim 1, wherein the upper ends of the first probes respectively abut the bottom end of a first electrode, and the upper end of the first electrode abuts below a seat groove on the test board, and the The first electrode is in the shape of a rod and is welded to an axis hole corresponding to the bearing chassis and cannot be displaced. The electronic component testing device of claim 1, wherein there are two second inspection units, one located in front of and one behind the first inspection unit in the direction in which the test board rotates intermittently. The electronic component testing device according to claim 1, wherein the carrying chassis is composed of a plurality of sector-shaped blocks of different sizes that are independent but can be connected and combined with each other, including a section corresponding to the inspection unit. Inspection block, wherein the inspection block is composed of a first inspection block and a second inspection block that are independent but can be combined with each other, wherein the first inspection block and the The first inspection unit is provided correspondingly, and the second inspection block is provided correspondingly to the second inspection unit. The electronic component testing device according to claim 1, wherein the second frame is provided on the machine table with a base, and the base is provided with a latch on one side that can perform pull-out displacement in the X-axis direction, and is located on the upper surface. and a flip base pivoted to the base on the other side of the second upper terminal box; The lift base is provided with a positioning hole on one side for inserting the latch when it is lifted, a handle on the upper surface of the lift base in the Z-axis direction for holding the lift base to lift it to one side, and a handle on the upper surface of the lift base to lift it to one side. The upper surface of the base can lock the flip base to a screw on the base, and an upright pedestal is located on the upper surface of the flip base. A first device for fine-tuning the X-axis displacement of the pedestal is disposed between the bottom of the pedestal and the flip base. A fine-tuning seat and a second fine-tuning seat for fine-tuning the Y-axis displacement of the pedestal. A fixing bracket for fixing the second upper terminal box is provided on one side of the pedestal. There is a fine-tuning fixing bracket between one side of the pedestal and the fixing bracket. A third fine-tuning seat is provided for Y-axis displacement. The third fine-tuning seat is also provided with a fine-tuning knob with a scale for fine-tuning the height of the distance between the second upper terminal box and the upper surface of the test board. The electronic component testing device of claim 1, wherein the second upper terminal box is provided with a bottom plate, the bottom plate is provided with a set of MOSFET circuits located above and a terminal block located below, and the terminal block is provided with a plurality of and two second upper terminal assemblies arranged linearly and spaced apart. The electronic component testing device of claim 15, wherein the second upper terminal assembly is provided with the second upper terminal located above the test board and a recessed hole located on the terminal base from bottom to top. An upper terminal base for installing the second upper terminal, an elastic member located above the upper terminal base in the cavity to provide the upper and lower elastic driving force of the second upper terminal, one end is fixed on the upper terminal base and the other end A stopper that maintains a distance from the upper edge of the hole to limit the top dead center of the second upper terminal, a conductive piece with one end connected to the second upper terminal and electrically conductive, so that the other end of the conductive piece is fixed An adapter part, and a cable that is soldered integrally to the adapter part and connected to the MOSFET circuit. The electronic component testing device of claim 1, wherein the second lower terminal box is provided with a bottom plate, the bottom plate is provided with a set of MOSFET circuits located below and a probe holder located above, and the probe holder is provided with There are a plurality of second probes spaced apart from each other in straight lines and capable of micro-moving up and down due to elastic effects. The electronic component testing device according to claim 17, wherein the upper ends of the second probes respectively bear against the bottom ends of a second electrode, and the second electrodes are rod-shaped and are respectively provided with a section of electrode parts from top to bottom. , a threaded part with a section of external thread, and an adjusting part that can be turned by the tool for fine adjustment up and down. The electronic component testing device according to claim 1, wherein an electrode holder is provided below an axis hole of the load-bearing chassis, and the electrode holder is provided with a fine-tuning hole corresponding to an axis hole of the load-bearing chassis and having an internal thread inside, A second electrode is screwed into the fine-tuning hole of the electrode holder with a threaded part, and extends through the axis hole corresponding to the bearing chassis with an electrode part, and the upper end surface of the electrode part is pressed against the test plate underneath a trough. An electronic component testing method using the electronic component testing device as described in claim 1, wherein the first inspection unit is used to inspect the insulation resistance of the capacitor, and the second inspection unit is used to inspect the capacitance, loss or quality of the capacitor. Factor inspection, when the component under test is placed in a slot on the test board and is transported by the clockwise intermittently rotating flow path, it first passes through the second upper terminal box and the second lower terminal box of the second inspection unit. time, to test the capacitance, loss or quality factor, and then pass between the first upper terminal box and the first lower terminal box of the first inspection unit to test the insulation resistance. The electronic component testing method of claim 20, wherein after the first inspection unit inspects, the second inspection unit performs another capacitance, loss or quality factor test. The electronic component testing method according to claim 20, wherein the first inspection unit has a plurality of corresponding groups of the first upper terminal box and the first lower terminal box. When performing the insulation resistance test, each of the four groups is used. Perform multi-stage testing by charging, charging, testing and discharging. The electronic component testing method according to claim 20, wherein a first electrode of the first inspection unit and an axis hole corresponding to the bearing chassis are welded and cannot be displaced, and a second electrode of the second inspection unit can be Up and down fine adjustment enables relative displacement with an axis hole of the bearing chassis.

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