TWI776558B - Electronic component test device - Google Patents

Abstract

The invention provides an electronic component testing device, comprising: a machine table on which a machine table top is arranged; a bearing chassis set on the machine table top, a test board that can be driven to rotate is set on the bearing chassis, and is mounted on the bearing chassis. A feeding unit, an inspection unit, and a discharging unit are arranged outside the periphery of the carrying chassis; the carrying chassis is composed of a plurality of different blocks that are independent but can be connected to each other; The carrying chassis is easy to transport and process, and easy to maintain.

Description

Electronic component test device

The present invention relates to a testing device, especially an electronic component testing device suitable for testing electronic components.

Generally, electronic components usually need to be tested to determine their physical characteristics after manufacturing. Or the concentric ring seat of several element groove seats can be rotated relative to the ring center, the groove seat is evenly rotated at angular intervals and in an incremental manner, and the rotation increment is the angular interval between adjacent groove seats. It is inclined at a certain angle, and when the ring seat rotates, the component flow path dumps the components toward the ring seat, and the fixed grid adjacent to the side of the outer plate of the groove seat limits the components that are not in place due to the power and randomly roll down through the ring seat. The empty slot seat of the arc segment of the rotating path, the random rolling makes the component return to the slot seat, and there is an electronic contactor for connecting the component and the testing machine in the path of the rotating ring seat, and the tested component passes through an ejection manifold. Below the tubes, the spout manifold plate defines a number of spout holes that align with a set of pockets each time the ring seat is rotated one increment, the spout tubes are connected to the spout ports, and elements are selectively activated The air blowing of each air pressure valve is ejected from the slot seat. Due to the air blowing and gravity, the ejected components fall through the pipes and enter the sorting storage box according to the guidance of the pipe plate. The component flow path can respond to the indication. The grid is selectively directed to the grid lacking a signal from a component detector that detects components in the pocket that have not yet been ejected by the ejection manifold.

Although the prior art of the patent application No. 411735 provides testing and sorting collection of capacitive electronic components, the prior art consists of a row of four radially distributed slots The seat is composed of four concentric ring seats and is distributed on the circumference of a test plate. Below the test plate is a disc-shaped vacuum suction plate supporting the seating element, and the vacuum suction plate is a flat upper surface. The steel plate is chrome-plated to minimize friction between the fixed upper surface and the moving element and to minimize wear on the vacuum suction plate, the upper surface of which defines several Ring vacuum pipette. Each element ring seat has a vacuum suction pipe concentric and adjacent to it; the disc-shaped vacuum suction plate has a large area, which is not only difficult to process, but also has a terminal composition and an ejection manifold plate in addition to the test board. , Arc-shaped loading rack, it takes a lot of man-hours to assemble, calibrate and align, and there is still room for improvement!

Therefore, the purpose of the present invention is to provide an electronic component testing device which is convenient to process and assemble.

The electronic component testing device according to the object of the present invention includes: a machine table, on which a machine table top is arranged; a carrying chassis, set on the machine table top, a test board that can be driven to rotate is set on the carrying chassis, and A feeding unit, an inspection unit, and a discharging unit are arranged outside the periphery of the carrying chassis; the carrying chassis is composed of a plurality of different blocks which are independent but can be connected to each other.

In the electronic component testing device according to the embodiment of the present invention, since the carrying chassis is composed of a plurality of different blocks that are independent but can be connected to each other, the disk-shaped carrying chassis is composed of small-area It is composed of blocks, each block is not only easy to process, but also easy to maintain.

A: Machine

A1: Machine table

A2: Machine desktop

B: carrying chassis

B1: Incoming block

B11: Feeding Suction Ditch

B12: Suction hole

B13: Short arc edge

B14: Long arc edge

B15: Front edge

B16: rear edge

B17: Empty part

B171: The third suction ditch

B172: Suction hole

B2: Check Block

B21: First check block

B211: The first suction ditch

B212: Suction hole

B213: Ribs

B214: Collar

B215: Shaft hole

B216: Short arc edge

B217: Long arc edge

B218: Front edge

B219: rear edge

B22: Second check block

B221: The second suction ditch

B222: Suction hole

B223: Ribs

B224: Collar

B225: Shaft hole

B226: Short arc edge

B227: Long arc edge

B228: Front edge

B229: rear edge

B23: Second check block

B3: Drain block

B31: Discharge suction ditch

B32: Suction hole

B33: Short arc edge

B34: Long arc edge

B35: Front edge

B36: rear edge

C: Test board

C1: seat slot

C2: guide groove

C3: Cleaning tank

C31: Expanded convex interval

D: Feeding unit

E: Inspection unit

E1: The first inspection unit

E2: Second inspection unit

E3: Second inspection unit

F: Discharge unit

G: feeding unit

H: guide frame

K: Collection agency

L: radial axis

FIG. 1 is a schematic three-dimensional view of an electronic component testing apparatus, which is used to illustrate an embodiment of the present invention.

FIG. 2 is a schematic diagram of the configuration of each mechanism on the machine table of the electronic component testing device.

FIG. 3 is a schematic diagram of a carrying chassis in the electronic component testing device.

FIG. 4 is a schematic diagram of each block corresponding to each unit in the electronic component testing device.

FIG. 5 is a schematic diagram of the upper surface of the test board in the electronic component test device.

FIG. 6 is a partial schematic diagram of the lower surface of the test board in the electronic component testing device.

Please refer to FIGS. 1 and 2 , the embodiment of the present invention is described with an electronic component testing device used for testing capacitive components to be tested, but is not limited to the implementation of capacitive electronic components; A machine table A1 inclined about 60 degrees on the table A is provided with a disc-shaped metal carrier chassis B, and a test board C that can be driven to rotate intermittently in a clockwise direction is set on the carrier chassis B , and a feeding unit D for loading the component to be tested, an inspection unit E for testing the characteristics of the component to be tested, and the component to be tested for completing the test are arranged outside the periphery of the carrying chassis B A discharge unit F for discharging and collecting, and a feeding unit G for providing the component to be tested and a feeding unit G for guiding the discharging unit F to a collecting mechanism K are arranged on a table top A2 of the machine A at the level of the machine A. The material guide frame H, on the front side of the machine table A, is provided with the collection mechanism K for accommodating a plurality of material boxes K1.

Please refer to FIG. 2 , the inspection unit E includes a first inspection unit E1 for inspecting the insulation resistance (commonly referred to as IR) of the capacitor, and for inspecting the capacitance, loss or quality factor (commonly referred to as CD) of the capacitor The two second inspection units E2 and E3 are respectively located in the direction of intermittent rotation before and after the first inspection unit E1; wherein, the second inspection unit E3 located behind the first inspection unit E1 in the direction of intermittent rotation It can be omitted if necessary.

Please refer to FIGS. 3 and 4 , the carrying chassis B is composed of a plurality of fan-shaped blocks of different sizes that are independent but can be connected to each other, including a set corresponding to the feeding unit D A feed block B1, an inspection block B2 corresponding to the inspection unit E, and a discharge block B3 corresponding to the discharge unit F, wherein the inspection block B2 is composed of independent but mutually dockable groups. The merged first check block B21 and the two second check blocks B22 and B23 are constituted, wherein, the first inspection block B21 is set corresponding to the first inspection unit E1, and the two second inspection blocks B22 and B23 are respectively set corresponding to the two second inspection units E2 and E3; The feeding block B1 is provided with a plurality of rows (8 rows in this embodiment) at radially spaced intervals, concentric annularly arranged concave annular arc-shaped feeding suction grooves B11, each feeding suction groove B11 There are a plurality of hollow suction holes B12 arranged at intervals along the bottom of the feeding suction groove B11; the suction holes B12 can be connected to a negative pressure source for vacuuming, so that a vacuum state of negative pressure is formed in the feeding suction groove B11; The feeding block B1 includes a short arc edge B13 and a long arc edge B14 that are parallel to each other, and a front edge B15 and a rear edge B16 that form an included angle with each other; the first inspection block B21 is provided with a diameter The concave annular arc-shaped first suction grooves B211 are arranged concentrically in a plurality of rows with an interval (8 rows in this embodiment), and each first suction groove B211 is provided with spaced rows along the bottom of the first suction groove B211 The plurality of hollowed-out suction holes B212, on the partition rib B213 at the corresponding position between every two of the first suction grooves B211 arranged in a radial line, there are multiple rows (16 rows in this embodiment) spaced apart at the fan-shaped diameter A shaft ring B214 made of insulating material is respectively provided on the axis, and each shaft ring B214 is provided with a shaft hole B215; the suction hole B212 can be connected to a negative pressure source for vacuuming, so that a negative pressure is formed in the first suction groove B211 the vacuum state; the first inspection block B21 includes a short arc edge B216 and a long arc edge B217 parallel to each other, and a front edge B218 and a rear edge B219 forming an angle with each other; the second inspection block B22 is provided with concave annular arc-shaped second suction grooves B221 concentrically arranged in a plurality of rows (8 rows in this embodiment) spaced apart in the radial direction. A plurality of hollow suction holes B222 are arranged at intervals at the bottom of the suction grooves B221, and there is only one row of the partition ribs B223 at the corresponding positions between the second suction grooves B221 arranged in a radial line. The collars B224, each collar B224 is provided with a shaft hole B225, the collars B224 of each row are located together on the radial axis L in the center of the fan shape; the suction hole B222 can be connected to a negative pressure source to vacuumize, so that the second suction A vacuum state of negative pressure is formed in the groove B221; the second inspection block B22 includes a short arc edge B226 and a long arc edge B227 that are parallel to each other, and a front edge B228 and a rear edge B229 that form an angle with each other; the second inspection block B23 and the second inspection block B22 are constructed The same, the same reason can be deduced, and will not be repeated here; but when the second check unit E3 is omitted because it is not necessary, the second check block B23 can be omitted as shown in FIG. 3, such as the second check block B22 The shaft ring B224 and the shaft hole B225 in the middle; the discharge block B3 is provided with a plurality of rows (8 rows in this embodiment) concentrically arranged at a radially spaced interval. Concave ring-shaped discharge suction grooves B31, Each discharge suction groove B31 is provided with a plurality of hollow suction holes B32 arranged at intervals along the bottom of the discharge suction groove B31; the suction holes B32 can be connected to a negative pressure source for vacuuming, so that the discharge suction groove B31 is formed. The vacuum state of negative pressure; the discharge block B3 includes a short arc edge B33 and a long arc edge B34 parallel to each other, and a front edge B35 and a rear edge B36 forming an included angle with each other; the first inspection block The first suction groove B211 on B21 is connected to the second suction groove B221 on the second inspection blocks B22 and B23 when combined, but is connected with the feeding suction groove B11 on the feeding block B1. , The discharge suction grooves B31 on the discharge block B3 are not connected to each other when they are combined; There is a third suction groove B171 connected to a small section of the second suction groove B221 on the second inspection block B22 when assembled and connected, and a hollow suction hole B172 is formed in the third suction groove B171.

Please refer to FIGS. 3 and 5 , the upper surface of the test board C is provided with a plurality of rows (8 rows in this embodiment) concentrically arranged in a radially spaced apart rectangular seat groove C1 . Each column of C1 is provided with a plurality of annularly spaced intervals, and the radially corresponding seat grooves C1 of each column are arranged in a straight line spaced in a plurality of rows; For example, for a capacitor-type electronic component, the component to be tested is placed in the seat groove C1 at the feeding unit D in FIG. 5 with the electrodes located at the upper and lower ends respectively.

Please refer to FIGS. 3 and 6 , the bottom of each seat groove C1 on the lower surface of the test board C has a concave guide groove C2 extending radially toward the outer circumference. The material suction ditch B11, the first suction ditch B211, the second suction ditch B221, and the discharge suction ditch B31 are connected when the test board C is intermittently rotated, so that the suction holes B12, B212, When the suction hole B222 and the suction hole B32 are introduced into negative pressure for vacuuming, the negative pressure can pass through the feeding suction groove B11, the first suction groove B211, the second suction groove B221, and the discharge suction groove B31. The object to be tested (in this embodiment, a capacitor-type electronic component) accommodated in C1 is adsorbed; a long concave interval-shaped cleaning groove C3 is formed between the two rows of the seat grooves C1 on the lower surface of the test board C. The cleaning groove C3 is adjacent to each seat groove C1 to form a convex area C31 which is close to the seat groove C1. The cleaning groove C3 is used to accommodate the friction between the lower surface of the test board C and the carrier chassis B under long-term operation. generated dust to avoid blocking the bottom hole of the seat groove C1.

In the electronic component testing device of the embodiment of the present invention, since the carrying chassis B is composed of a plurality of different blocks that are independent but can be connected to each other, the disc-shaped carrying chassis B is composed of small It is composed of blocks of area. Each block is not only easy to transport and process, but also any corresponding one such as the feeding unit D, the inspection unit E or the discharging unit F is assembled with the corresponding block. If the unit is disassembled, changed or modified, it is only necessary to disassemble, assemble, calibrate and align the corresponding block, without disassembling the entire carrier chassis B and the feeding unit D, inspection unit E or discharge unit F. , Assembly, calibration and alignment, it takes less man-hours and easy maintenance.

However, the above are only examples of the present invention, and should not limit the scope of the present invention. Any simple equivalent changes and modifications made according to the scope of the application for patent of the present invention and the content of the patent specification are still within the scope of the present invention. within the scope of the invention patent.

B: carrying chassis

B1: Incoming block

B11: Feeding Suction Ditch

B12: Suction hole

B13: Short arc edge

B14: Long arc edge

B15: Front edge

B16: rear edge

B17: Empty part

B171: The third suction ditch

B172: Suction hole

B2: Check Block

B21: First check block

B211: The first suction ditch

B212: Suction hole

B213: Ribs

B214: Collar

B215: Shaft hole

B216: Short arc edge

B217: Long arc edge

B218: Front edge

B219: rear edge

B22: Second check block

B221: The second suction ditch

B222: Suction hole

B223: Ribs

B224: Collar

B225: Shaft hole

B226: Short arc edge

B227: Long arc edge

B228: Front edge

B229: rear edge

B23: Second check block

B3: Drain block

B31: Discharge suction ditch

B32: Suction hole

B33: Short arc edge

B34: Long arc edge

B35: Front edge

B36: rear edge

C: Test board

C1: seat slot

L: radial axis

Claims (13)

An electronic component testing device, comprising: a machine table on which a machine table top is arranged; a bearing chassis set on the machine table table, a test board that can be driven to rotate is set on the bearing chassis, and a test board that can be driven to rotate is arranged on the bearing chassis A feeding unit, an inspection unit and a discharging unit are arranged outside the periphery; the carrying chassis is composed of a plurality of different blocks which are independent but can be connected to each other. The electronic component testing device of claim 1, wherein the different blocks of the carrying chassis include a feeding block corresponding to the feeding unit, an inspection block corresponding to the inspection unit, and A discharge block corresponding to the discharge unit. The electronic component testing device of claim 2, wherein the inspection unit includes a first inspection unit for inspecting insulation resistance of capacitors, and a second inspection unit for inspecting capacitance, loss or quality factor of capacitors unit; the inspection block is composed of a first inspection block and a second inspection block, which are independent but can be combined with each other, wherein the first inspection block and the first inspection unit Correspondingly set, the second check block is set corresponding to the second check unit. The electronic component testing device according to claim 3, wherein a first suction groove is formed on the first inspection block, a second suction groove is formed on the second inspection block, and the first suction groove is connected to the second suction groove. The suction grooves are turned on when the group is paralleled. The electronic component testing device according to claim 3, wherein the feeding block is provided with a feeding suction groove, the discharging block is provided with a discharging suction groove, and the feeding suction groove and the discharging suction groove are located in the same position. The groups do not conduct each other when they are paralleled. The electronic component testing device according to claim 5, wherein the feeding suction groove on the feeding block has a space at the rear end, and the empty position is provided with a small section and a space on the second inspection block. The second suction groove is connected to the third suction groove when the second suction groove is combined, and a hollow suction hole is arranged in the third suction groove. The electronic component testing device of claim 1, wherein the inspection unit includes a first inspection unit for inspecting insulation resistance of capacitors, and a second inspection unit for inspecting capacitance, loss or quality factor of capacitors unit. The electronic component testing device according to claim 7, wherein there are two second inspection units, which are respectively located in front of and behind the first inspection unit in the direction of intermittent rotation. The electronic component testing device of claim 8, wherein the inspection block is composed of a first inspection block and two second inspection blocks that are independent but can be combined with each other, wherein, The first inspection block is corresponding to the first inspection unit, and the two second inspection blocks are corresponding to the two second inspection units. The electronic component testing device according to claim 9, wherein the second inspection block is provided with concave annular arc-shaped suction grooves arranged concentrically in a plurality of rows of radially spaced intervals, and each suction groove is provided with a groove along the A plurality of hollow suction holes are arranged at intervals at the bottom of the suction grooves, and there is only one row on the partition ribs at the corresponding positions between the two suction grooves arranged in a radial line. A shaft hole is arranged on it, and the shaft rings of each row are located together on the radial axis of the center of the sector. The electronic component testing device according to claim 1, wherein the upper surface of the test board is provided with a plurality of concentric annularly arranged recesses in a plurality of radially spaced apart rows, and each row of the seat slots is provided with a plurality of annularly spaced apart intervals. The seat grooves corresponding to the radial directions of each row are arranged in a plurality of rows in a straight line. The electronic component testing device according to claim 11, wherein a long concave interval-shaped cleaning groove is formed between the two rows of the seat grooves on the lower surface of the test board. The electronic component testing device according to claim 12, wherein the cleaning groove is adjacent to each seat groove to form a protruding area close to the seat groove.

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