TWM655975U - Electronic component testing equipment - Google Patents

Abstract

The invention provides an electronic component testing device, which comprises: a machine, on which a machine table is provided; a test plate, which is arranged on the machine table and can be driven to rotate intermittently in one direction, and a feeding unit, an inspection unit, a discharge unit and a collection mechanism are arranged outside the periphery of the test plate; wherein, the discharge unit is provided with a duct plate, on which a plurality of ducts are arranged, and each duct corresponds to one of the seat slots and a corresponding material box on the test plate; after an end duct at the end of each of the duct classification discharges on the duct plate, a sensor is arranged on the duct plate to determine whether the function of the electromagnetic valve for blowing control at the corresponding seat slot is abnormal; thereby, the electromagnetic valve function is found to be abnormal, so as to avoid problems in subsequent production classification.

Description

Electronic component testing equipment

This invention relates to a testing device, and more particularly to an electronic component testing device suitable for testing electronic components.

After manufacturing, general electronic components usually need to be tested to determine their physical properties. For example, the prior art provided by the patent application No. 411735 for testing capacitor-type electronic components provides a disc-shaped test plate on a vacuum suction plate, and on the test plate, one or more concentric ring seats of component slots can rotate relative to the ring center. The slots are uniformly rotated at angular intervals and in increments, and the rotation increment is the angular interval between adjacent slots. The ring seat is tilted at a certain angle, and when the ring seat rotates, the component flow path tilts the component toward the ring seat, and the fixed grid plate adjacent to the outer plate side of the slot seat restricts the unreturned components to randomly roll down the arc segment passing through the rotation path of the ring seat due to the dynamic force. The component is randomly rotated to return to the slot. In the path of the rotating ring seat are electronic contacts used to connect the component and the test machine. The tested component passes under a spray manifold. The spray manifold plate defines a number of spray holes. Each time the ring seat rotates an increment, the spray holes are aligned with a group of slots. The spray pipe is connected to the spray outlet. The component is selected. The air is blown from the seat by the air pressure valves that are activated. The blown air and gravity cause the ejected components to fall through the pipes and enter the classification storage box under the guidance of the pipeline plate. The component flow path can respond to the signal of the detector indicating that the grid plate lacks components and is selectively guided to the grid plate. The sensor can detect the components in the seat that have not been ejected by the ejection manifold.

The "sensor capable of detecting components in the seat slot that have not been ejected by the ejection manifold" in the prior art is mainly a U-shaped blocking sensor frame installed to straddle the vacuum suction plate, the test plate, and the loading frame. The blocking sensor frame has two legs each defining four openings, and the holes on the legs are also aligned with the four slot seats marked by the two legs of the sensor frame on each slot row; at the same time, the holes on the legs of the sensor frame are matched with four openings defined by the loading frame and a conical opening defined by the vacuum suction plate; each is placed on the vacuum suction plate. In the holes of the sensing bridge behind/below the air suction plate are four light emitting wires that project light into the conical openings, and in each hole of the sensing bridge are four optical fiber wires connected to the photo sensor, with their light receiving ends facing the holes defined by the loading rack; the conical opening is used to focus the emitted light to the center of the slot it is aligned with, so if the component is in the slot, the component will block the emitted light; if there is no component in the slot, the emitted light will reach the corresponding photo sensor. Therefore, any component that remains in the slot after passing through the ejection manifold plate can be detected by the component blocking the light beam of each blocking sensor.

The prior art sets up a blockage sensing frame and a sensor only to detect the components that remain in the slot after passing through the ejection manifold plate, so as to remove the components stuck in the slot in the subsequent flow path. However, if the electromagnetic valve that provides the ejection gas fails during the process of the component being ejected through the pipe, the equipment cannot detect it. In this case, the blockage sensing frame and the sensor will continuously detect the blockage and continuously remove it in the subsequent flow path, but the cause of the blockage is unknown, which wastes the detection efficiency of the equipment.

Therefore, the purpose of this invention is to provide an electronic component testing equipment that improves at least one shortcoming of the prior art.

The electronic component testing equipment according to the purpose of this invention is provided with: a machine, on which a machine table is provided; a test plate, which is arranged on the machine table and can be driven to rotate intermittently in one direction, and a feeding unit, an inspection unit, a discharge unit and a collection mechanism are arranged outside the periphery of the test plate; the inspection unit is provided with a first inspection unit that can be used to inspect the component to be tested, and the first inspection unit is provided with a plurality of measuring stations; the discharge unit is provided with a duct plate, and a plurality of ducts are provided on the duct plate, each duct has one end corresponding to one of the seat slots on the test plate, and the other end is led to the collection mechanism corresponding to a material box; behind an end duct at the end of each of the ducts on the duct plate for classified discharge, a sensor is provided on the duct plate to determine whether the function of the electromagnetic valve for blowing control at the corresponding seat slot is abnormal.

The electronic component testing equipment of the present invention embodiment has a sensor on the duct board for determining whether the function of the electromagnetic valve for air blowing control at the corresponding seat groove is abnormal after the end duct of each duct classification discharge duct on the duct board. The abnormal function of the electromagnetic valve can be discovered at the first time to avoid problems in subsequent production classification, resulting in the need to re-produce the entire batch of products, which consumes a lot of time.

Please refer to Figures 1 and 2. The present invention is described in detail with reference to an electronic component testing device for testing a capacitor-type component under test, but is not limited to the implementation of capacitor-type electronic components. The device is provided with a disk-shaped test board B that can be driven to rotate intermittently in a clockwise direction on the upper surface of a tilted machine table A1 on a machine A, and an inlet for loading the component under test is provided outside the periphery of the test board B. A material unit C, an inspection unit D for testing the characteristics of the device under test, and a discharge unit E for discharging and collecting the device under test after the test are provided. A feeding mechanism F for providing the device under test and a material guide rack G for guiding the discharge unit E to a collection mechanism H are provided on a machine table A2 at the same level as the machine A. The collection mechanism H is provided at the front side of the machine A with a plurality of material boxes H1 for accommodating the material boxes.

Please refer to FIG. 2 . The inspection unit D is provided with a first inspection unit D1 for performing withstand voltage and insulation impedance (commonly known as IR) inspection of the capacitor, and a second inspection unit D2 and a third inspection unit D3 for performing capacitance, loss or quality factor (commonly known as CD) inspection of the capacitor, which are respectively located before and after the first inspection unit D1 in the direction in which the test board B is intermittently rotated; wherein, the third inspection unit D3 located after the first inspection unit D1 in the direction in which the test board B is intermittently rotated can be omitted as needed.

The first inspection unit D1 is provided with a first frame D11 that can be lifted up and down, the second inspection unit D2 is provided with a second frame D21, and the third inspection unit D3 is provided with a third frame D31; the first frame D11, the second frame D21 and the third frame D31 are spaced apart from each other and are not interconnected.

The first mount D11 of the first inspection unit D1 is a frame D111 made of metal material and supports a plurality of terminal boxes D112 arranged in an arc shape for inspection.

A loose material unit K is provided between the first inspection unit D1 and the discharge unit E (if the third inspection unit D3 is provided, then between the third inspection unit D3 and the discharge unit E) which rotate intermittently in the clockwise direction of the test plate B.

Please refer to FIG. 3 . The test board B can be driven to rotate intermittently in a clockwise direction and is disposed on the disc-shaped supporting chassis B2. The supporting chassis B2 is composed of a plurality of fan-shaped blocks that are detachably assembled into a ring shape. The supporting chassis B2 corresponding to the lower portion of the discharge unit E is provided with a blowing hole B21 for providing positive pressure gas. The blowing holes B21 are each arranged in a plurality (two in this embodiment) as a group corresponding to a seat groove B1 of the upper test board B. The plurality of blowing holes B21 are arranged at intervals along the direction of the arc-shaped conveying flow path. In order to meet the requirements of the size and shape of the component to be tested, the plurality of blowing holes B21 can also be arranged at intervals along the direction of the vertical arc-shaped conveying flow path.

Please refer to Figure 4. The discharge unit E is provided with a duct plate E1, on which a plurality of ducts E2 made of flexible material are provided (only one is indicated by an imaginary line in the figure). Each duct E2 has one end corresponding to the top of a seat groove B1 on the test plate B, and the other end is guided through the guide frame G and correspondingly conducted to a material box H1 of the collection mechanism H.

The collecting mechanism H is provided with a rectangular frame-shaped seat H2, in which the material box H1 is arranged, and the machine table A2 is formed above the seat H2 for setting the material guide frame G; the material guide frame G is provided with a plurality of rows of long strip-shaped embedding seats G1, and the embedding seat G1 is provided with a plurality of embedding holes G2 arranged in straight lines with intervals and respectively provided for the guide tube E2 to be embedded, and the embedding seat G1 is composed of two detachable and assembled side seats G11 and G12 on the left and right sides respectively.

Please refer to Figure 5. One side of the duct plate E1 of the discharge unit E is provided on a lifting frame E3, wherein the lifting frame E3 is connected and linked to the duct plate E1 by a connecting member E4. The lifting frame E3 is pivoted at one end to a pivoting seat H21 above the base frame H2 of the collecting mechanism H. The base frame H2 is provided with a fixing frame H3. The fixing frame H3 is pivoted to a driving member H4 composed of a pneumatic cylinder. The driving member H4 is pivoted at one end of a driving rod H41 on both sides of the inside of a slotted hole E31 on the lifting frame E3. The driving member H4 drives the driving rod H41 to extend and retract, thereby linking the lifting frame E3 to drive the duct plate E1 to be lifted or covered against the test plate B.

Please refer to Figures 5 and 6. In the present invention, the test plate B rotates intermittently in a clockwise direction and transports the test element with the seat groove B1. According to the direction of the intermittent rotation transport flow path of the test element, a sensor E21 is provided on the tube plate E1 at the front end of the rotation transport flow path corresponding to the adjacent rotation transport flow path within the range of the tube plate E1. The sensor E21 is used to determine whether the function of the electromagnetic valve for air blowing control corresponding to the seat groove B1 is abnormal. The sensor E21 is located behind an end tube E22 at the end of each tube E2 classified discharge on the tube plate E1, and is located in front of a forced discharge tube E23 and an electrostatic eliminator E24. The sensor E 21 has a plurality of seat grooves B1 arranged radially in a row corresponding to the test plate B. The sensor E21 may include an upper sensing element E211 located on the duct plate E1, and a lower sensing element E212 located on the supporting chassis B2 corresponding to below the upper sensing element E211. One of the seat grooves B1 on the test plate B may correspond to between the upper sensing element E211 and the lower sensing element E212 during intermittent rotation and transportation. The upper sensing element E211 in the sensor E21 may be lifted up by the lifting frame E3 as the duct plate E1 is linked to move away from the lower sensing element E212 and release the corresponding relationship.

When the invention is implemented, when the component to be tested is transported by the intermittently rotating transport flow path for testing and then arrives at the discharge unit E to be classified and discharged, the seat groove B1 on the test plate B passes through the terminal conduit E22 and the classification is completed and arrives at the sensor E21. At this time, the sensor E21 will detect whether there are still components to be tested in the seat groove B1. The processing system of the equipment can be set to judge that if the components to be tested of the same classification are detected to be not discharged for more than two consecutive times, the processing system of the equipment will judge that The electromagnetic valve for air blowing control corresponding to the seat groove B1 is abnormal and sends a signal to notify the operator; regardless of whether there is still a component to be tested in the seat groove B1, when the seat groove B1 reaches the forced discharge conduit E23, it will be forced to be discharged, and then the surface of the test board B and the seat groove B1 on it will be statically eliminated by the static eliminator E24, so that the surface of the test board B and the seat groove B1 on it can avoid the static electricity generated by the long-term friction of the component to be tested from adhering to the component to be tested in the next cycle.

The electronic component testing equipment of the present invention embodiment has a sensor E21 on the duct board E1 for determining whether the function of the electromagnetic valve for blowing control at the corresponding seat groove B1 is abnormal, after an end duct E22 at the end of each duct classification discharge on the duct board E1. The sensor E21 can be found in the first place if the electromagnetic valve function is abnormal, so as to avoid problems in subsequent production classification, resulting in the need to re-produce the entire batch of products, which consumes a lot of time.

However, what is described above is only an example of the implementation of this creation, and it cannot be used to limit the scope of the implementation of this creation. All simple equivalent changes and modifications made according to the scope of the patent application of this creation and the content of the patent specification are still within the scope of the patent of this creation.

A: Machine A1: Machine table A2: Machine table B: Test board B1: Seat B2: Carrying chassis B21: Blowing hole C: Feeding unit D: Inspection unit D1: First inspection unit D11: First seat D111: Frame D112: Terminal box D2: Second inspection unit D21: Second seat D3: Third inspection unit D31: Third seat E: Discharge unit E1: Duct plate E2: Duct E21: Sensor E211: Upper sensor element E212: Lower sensor element E22: End duct E23: Forced discharge duct E24: Static eliminator E3: Lifting frame E31: Slot E4: Connector F: Feeding mechanism G: Guide frame G1: Insert seat G11: Side seat G12: Side seat G2: Embedded hole H: Collection mechanism H1: Material box H2: Seat H21: Pivot seat H3: Fixed frame H4: Drive element H41: Drive rod K: Loose material unit

Figure 1 is a three-dimensional schematic diagram of an electronic component testing equipment, used to illustrate an embodiment of the present invention; Figure 2 is a schematic diagram of the configuration of various mechanisms on the table of the electronic component testing equipment; Figure 3 is a three-dimensional exploded schematic diagram of the test board and the supporting chassis in the electronic component testing equipment; Figure 4 is a schematic diagram of the configuration relationship between the discharge unit, the collection mechanism, and the guide rack and the test board in the electronic component testing equipment; Figure 5 is a schematic diagram of the mechanism of the discharge unit in the electronic component testing equipment; Figure 6 is a cross-sectional schematic diagram of the sensor setting in the electronic component testing equipment;

E: Exhaust unit

E1: Guide tube plate

E2: Catheter

E21: Sensor

E22: terminal catheter

E23: Forced discharge catheter

E24: Static eliminator

E3: Lifting frame

E31: Guillotine

E4: Connectors

H21: Transposition

H3: Fixed bracket

H4: Drive parts

H41:Drive rod

Claims (8)

An electronic component testing device is provided, comprising: a machine having a machine table disposed thereon; a test board disposed on the machine table and being driven to rotate intermittently in one direction, and a feeding unit, an inspection unit, a discharge unit and a collection mechanism are disposed outside the periphery of the test board; the inspection unit is provided with a first inspection unit for inspecting the component to be tested, and the first inspection unit is provided with a plurality of measuring stations; the discharge unit is provided with a guide tube plate, and a plurality of guide tubes are disposed on the guide tube plate, and each guide tube has one end corresponding to a seat groove on the test board, and the other end is led to the collection mechanism corresponding to a material box; After the end of each of the tubes on the tube board is discharged, a sensor is provided on the tube board to determine whether the electromagnetic valve function for the air blowing control at the corresponding seat groove is abnormal. The electronic component testing equipment as described in claim 1, wherein the sensor detects whether there is still a component to be tested in the seat slot, thereby determining whether the function of the electromagnetic valve for air blowing control at the seat slot is abnormal. The electronic component testing equipment as described in claim 2, wherein the processing system of the equipment is set to determine that the solenoid valve for air blowing control at the corresponding slot is malfunctioning if it is detected that the components to be tested of the same category have not been discharged for more than two consecutive times. The electronic component testing equipment as described in claim 1, wherein the sensor may include an upper sensing element located on the duct plate, and a lower sensing element located on a supporting chassis corresponding to below the upper sensing element, and a slot on the test plate may correspond to between the upper sensing element and the lower sensing element during intermittent rotational transport. As described in claim 4, the upper sensing element in the sensor can be lifted up by a lifting frame when the duct plate is lifted up, thereby being separated from the lower sensing element and releasing the corresponding relationship. An electronic component testing device as described in claim 1, wherein the sensor is located in front of a forced discharge duct of the rotating transport flow path on the duct plate. An electronic component testing device as described in claim 1, wherein the sensor is located in front of an electrostatic eliminator in the direction of the rotating conveying flow path. An electronic component testing device as described in claim 1, wherein the sensors are arranged in a row in plurality corresponding to a row of slots radially arranged on the test board.

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