TW202301965A - Electronic component testing device for achieving convenient processing and assembly - Google Patents

Abstract

The present invention provides an electronic component testing device, which comprises: a machine table, on which a table platform is disposed; a bearing tray disposed on the table platform. The bearing tray is configured with a testing board that may be driven for rotating and the outer periphery of the carrying bottom tray is configured with a feeding unit, an inspection unit, and a discharge unit. The bearing tray is composed of a plurality of different blocks that are individually independent but may be aligned to assembly with each other, so that the bearing tray is easy for conveying and processing and simple for maintenance.

Description

Electronic component testing device

The invention relates to a testing device, especially an electronic component testing device suitable for testing electronic components.

Generally, electronic components usually need to be tested to determine their physical characteristics after they are manufactured. For example, the equipment provided by the patent application No. 411735 "Circuit Component Loading and Unloading Device" used for testing electronic components of capacitors uses a Or the concentric ring base of several component slots can rotate relative to the ring center, and the slots are evenly spaced at angular intervals and rotated in increments, and the rotation increment is the angular interval between adjacent slots. It is tilted at a certain angle, and when the ring seat rotates, the component flow path pours the components to the ring seat, and the fixed grid plate adjacent to the side of the outer plate of the groove seat restricts the unreturned components due to power and randomly rolls down through the ring seat The empty slot seat in the arc section of the rotation path, the random rolling makes the component return to the slot seat, there is an electronic contactor used to connect the component and the testing machine in the path of the rotating ring seat, and the tested component passes through an ejection manifold Below the pipe, the ejection manifold plate defines a number of ejection holes, and each time the ring seat rotates an increment, the ejection holes are aligned with a set of slot seats, the ejection tubes are connected to the ejection ports, and the elements are selectively activated. The air blowing of each air pressure valve is ejected from the groove seat. Due to the air blowing and gravity, the ejected components fall through the pipe and enter the classification storage box according to the guidance of the pipeline board. The flow path of the components can respond to the indication The grid is selectively directed to the grid by a signal from a component-absent detector that detects components in the pocket that have not been ejected by the ejection manifold.

Although the prior art of the patent application No. 411735 provides the testing and sorting collection of capacitive electronic components, the prior art consists of a row of four radially distributed slots to form four concentric ring seats. , and distributed on the circumference of a test plate, under the test plate is a disc-shaped vacuum suction plate supporting the seated components, the vacuum suction plate is a steel plate with a flat upper surface, the surface is plated with chrome Minimize the friction between the fixed upper surface and the moving components, and minimize the wear on the vacuum suction plate, the upper surface of the vacuum suction plate defines several annular vacuum suction pipes. Each component ring seat has a vacuum suction tube concentric with it and adjacent to it; the disc-shaped vacuum suction plate has a large area, which is not only difficult to process, but also has a terminal composition and a discharge manifold plate in addition to the test board. , The arc-shaped loading frame takes a lot of man-hours for calibration and alignment during assembly, and there is still room for improvement!

Therefore, the object of the present invention is to provide an electronic component testing device which is easy to process and assemble.

According to the electronic component testing device of the object of the present invention, comprising: a machine platform, a machine table top is arranged on it; A feeding unit, an inspection unit, and a discharge unit are arranged outside the periphery of the carrying chassis; the carrying chassis is composed of a plurality of different blocks that are independent but can be docked and combined.

In the electronic component testing device of the embodiment of the present invention, since the carrying chassis is composed of a plurality of different blocks that are independent but can be docked and combined with each other, the disc-shaped carrying chassis is composed of small-area Composed of blocks, each block is not only easy to process, but also easy to maintain.

Please refer to Fig. 1, shown in 2, the embodiment of the present invention is described with the electronic component testing device that is used for the component under test of capacitance class to test, but is not limited to the implementation of capacitance type electronic component; A machine platform A1 inclined at about 60 degrees on platform A is provided with a disc-shaped metal bearing chassis B, and a test board C that can be driven to rotate intermittently in a clockwise direction is set on the bearing chassis B , and outside the periphery of the carrier chassis B, a feeding unit D for loading the component under test, an inspection unit E for testing the characteristics of the component under test, and the component under test for completing the test are arranged A discharge unit F for discharge and collection is provided with a feeding mechanism G for providing the component to be tested and a collection mechanism K for guiding the discharge unit F to a collection mechanism K on a machine table A2 at the level of the machine A. The material guide frame H is provided with the collection mechanism K for accommodating a plurality of magazines K1 on the front side of the machine A.

Please refer to Fig. 2, the inspection unit E includes a first inspection unit E1 for checking the insulation resistance (commonly known as IR) of the capacitor, and for checking the capacitance, loss or quality factor (commonly known as CD) of the capacitor The two second inspection units E2 and E3 respectively located in front of and behind the first inspection unit E1 in the direction of intermittent rotation; the second inspection unit E3 located behind the first inspection unit E1 in the direction of intermittent rotation It can be omitted as needed.

Please refer to Figures 3 and 4, the load-carrying chassis B is composed of a plurality of sector-shaped blocks of different sizes that are independent but can be docked and combined with each other, including a set corresponding to the feeding unit D. Input block B1, an inspection block B2 corresponding to the inspection unit E, and a discharge block B3 corresponding to the discharge unit F, wherein the inspection block B2 is composed of independent but mutually dockable groups It is composed of a first inspection block B21 and two second inspection blocks B22, B23, wherein the first inspection block B21 is set corresponding to the first inspection unit E1, and the two second inspection blocks The inspection blocks B22, B23 are respectively set corresponding to the two second inspection units E2, E3; The feeding block B1 is provided with radially spaced plural rows (the present embodiment is provided with 8 rows) concentric ring-shaped recessed arc-shaped feeding suction grooves B11, each feeding suction groove B11 There are a plurality of hollow suction holes B12 arranged at intervals along the bottom of the feeding suction groove B11; the suction holes B12 can be connected to a negative pressure source to evacuate, so that a vacuum state of negative pressure is formed in the feeding suction groove B11; The feeding block B1 includes a short arc side B13 and a long arc side B14 parallel to each other, and a front end B15 and a rear end B16 forming an included angle; The first inspection block B21 is provided with radially spaced plural rows (eight rows in this embodiment) concentrically arranged with concave circular arc-shaped first suction grooves B211, each of the first suction grooves B211 There are a plurality of hollow suction holes B212 arranged at intervals along the bottom of the first suction groove B211, and a plurality of rows (this There are 16 rows in the embodiment) and a collar B214 made of insulating material is respectively provided on the fan-shaped radial axis at intervals, and each collar B214 is provided with a shaft hole B215; the suction hole B212 can be connected to a negative pressure source for pumping Vacuum, so that the vacuum state of negative pressure is formed in the first suction groove B211; the first inspection block B21 includes a short arc side B216 and a long arc side B217 parallel to each other, and a front end side B218 and a rear edge B219; The second inspection block B22 is provided with radially spaced plural rows (eight rows in this embodiment) and concentrically arranged concave annular arc-shaped second suction grooves B221, each of the second suction grooves B221 There are a plurality of hollow suction holes B222 arranged at intervals along the bottom of the second suction groove B221, and only one row is provided on the partition ribs B223 corresponding to each two of the second suction grooves B221 arranged radially in a straight line. There is a collar B224 made of insulating material, each collar B224 is provided with a shaft hole B225, and the collars B224 of each row are located on the radial axis L in the center of the sector; the suction hole B222 can be connected to a negative pressure source to draw Vacuum, so that the vacuum state of negative pressure is formed in the second suction groove B221; the second inspection block B22 includes a short arc side B226 and a long arc side B227 parallel to each other, and a front end side B228 and a rear edge B229; The structure of the second inspection block B23 is the same as that of the second inspection block B22, and it can be deduced in the same way, so it will not be repeated here; but when the second inspection unit E3 is omitted according to the foregoing, the second inspection block B23 As shown in FIG. 3, the collar B224 and the shaft hole B225 in the second inspection block B22 can be omitted; The discharge block B3 is provided with radially spaced plural rows (the present embodiment has 8 rows) and concentrically arranged concave circular arc-shaped discharge and suction grooves B31, and each discharge and suction groove B31 is provided with A plurality of hollow suction holes B32 arranged at intervals along the bottom of the discharge suction groove B31; the suction holes B32 can be connected to a negative pressure source to evacuate, so that a vacuum state of negative pressure is formed in the discharge suction groove B31; the discharge block B3 includes a short arc side B33 and a long arc side B34 parallel to each other, and a front end B35 and a rear end B36 forming an included angle; The first suction groove B211 on the first inspection block B21 is connected to the second suction groove B221 on the second inspection block B22, B23 when combined, but is connected to the feeding block B1. The feed suction groove B11 and the discharge suction groove B31 on the discharge block B3 are not connected to each other when combined; the feed suction groove B11 on the feed block B1 leaves a section of space at the rear end B17, the hollow part B17 is provided with a small section of the third suction groove B171 that is in parallel with the second suction groove B221 on the second inspection block B22, and a hollowed-out hole is set in the third suction groove B171. Suction hole B1 72 .

Please refer to Figs. 3 and 5, the upper surface of the test board C is provided with a plurality of rows (the present embodiment is provided with 8 rows) concentrically and annularly with hollowed-out rectangular seat grooves C1 at intervals in the radial direction. Each column of C1 is provided with a plurality of circular intervals, and the seat grooves C1 corresponding to each column are arranged in a plurality of rows in a straight line; each seat groove C1 can accommodate a component to be measured with electrodes respectively arranged on the upper and lower sides. For example, electronic components such as capacitors, the component to be tested is placed in the seat groove C1 at the feeding unit D in FIG.

Please refer to Figures 3 and 6, the bottom of each seat groove C1 on the lower surface of the test board C is provided with a section of recessed guide groove C2 extending radially toward the outer circumference, and each guide groove C2 is connected to the entry of the load-bearing chassis B respectively. The material suction groove B11, the first suction groove B211, the second suction groove B221, and the discharge suction groove B31 are conducted when the test board C is intermittently rotated, so that the suction hole B12, the suction hole B1213, the suction hole B1213, When the suction hole B1223 and the suction hole B32 are introduced into negative pressure and vacuumed, the negative pressure can pass through the feeding suction groove B11, the first suction groove B211, the second suction groove B221, and the discharge suction groove B31, to each seat groove The object to be tested (in this embodiment, a capacitance electronic component) accommodated in C1 is adsorbed; between the two rows of the seat grooves C1 on the lower surface of the test board C, a strip-shaped cleaning groove C3 is formed between the seat grooves C1. The cleaning groove C3 is adjacent to each of the seat grooves C1 to form a convex expansion area C31 close to the seat groove C1, and the cleaning groove C3 is used to accommodate the friction between the lower surface of the test board C and the carrier chassis B under long-term operation. Generated dust to avoid blocking the bottom aperture of the seat groove C1.

In the electronic component testing device according to the embodiment of the present invention, since the carrying chassis B is composed of a plurality of different blocks that are independent but can be docked and combined with each other, the disc-shaped carrying chassis B is composed of small Each block is not only easy to transport and process, but also any of the corresponding input unit D, inspection unit E or discharge unit F is assembled with the corresponding block, once any If the unit is disassembled, changed or modified, it only needs to be disassembled, assembled, calibrated and aligned for the corresponding block, without the need to disassemble the entire loading chassis B and the feeding unit D, inspection unit E or discharge unit F , Assembly, calibration and alignment, it takes very little man-hours and is easy to maintain.

But what is described above is only an embodiment of the present invention, and should not limit the scope of the present invention. All simple equivalent changes and modifications made according to the patent scope of the present invention and the content of the patent specification are still within the scope of the present invention. Within the scope covered by the patent of the present invention.

A: machine A1: Machine table A2: Machine desktop B: Carrying chassis B1: Feeding block B11: Feeding suction groove B12: suction hole B13: short arc edge B14: long arc edge B15: front edge B16: rear edge B17: Empty position B171: The third suction groove B172: suction hole B2: check block B21: first check block B211: The first suction groove B212: suction hole B213: Partition rib B214: Collar B215: shaft hole B216: short arc edge B217: long arc edge B218: front edge B219: rear edge B22: Second check block B221: Second suction groove B222: suction hole B223: Partition rib B224: Collar B225: shaft hole B226: short arc edge B227: long arc edge B228: front edge B229: Rear edge B23: Second inspection block B3: Eject block B31: discharge nozzle B32: suction hole B33: short arc edge B34: long arc edge B35: front edge B36: rear edge C: test board C1: seat groove C2: guide ditch C3: cleaning tank C31: Convex expansion interval D: Feeding unit E: check unit E1: First inspection unit E2: Second inspection unit E3: The third inspection unit F: discharge unit G: Feeding unit H: guide frame K: collection agency L: radial axis

FIG. 1 is a three-dimensional schematic diagram of an electronic component testing device for illustrating an embodiment of the present invention. Fig. 2 is a schematic diagram of the arrangement of various mechanisms on the machine table of the electronic component testing device. Fig. 3 is a schematic diagram of the carrying chassis in the electronic component testing device. FIG. 4 is a schematic diagram of each block corresponding to each unit in the electronic component testing device. Fig. 5 is a schematic diagram of the upper surface of the test board in the electronic component testing device. Fig. 6 is a partial schematic diagram of the lower surface of the test board in the electronic component testing device.

B: Carrying chassis

B1: Feeding block

B11: Feeding suction groove

B12: suction hole

B13: short arc edge

B14: long arc edge

B15: front edge

B16: rear edge

B17: Empty position

B171: The third suction groove

B172: suction hole

B2: check block

B21: first check block

B211: The first suction groove

B212: suction hole

B213: Partition rib

B214: Collar

B215: shaft hole

B216: short arc edge

B217: long arc edge

B218: front edge

B219: rear edge

B22: Second check block

B221: Second suction groove

B222: suction hole

B223: Partition rib

B224: Collar

B225: shaft hole

B226: short arc edge

B227: long arc edge

B228: front edge

B229: Rear edge

B23: Second inspection block

B3: Eject block

B31: discharge nozzle

B32: suction hole

B33: short arc edge

B34: long arc edge

B35: front edge

B36: rear edge

C: test board

C1: seat groove

L: radial axis

Claims (13)

An electronic component testing device, comprising: A machine platform, on which a machine table is arranged; A loading chassis is arranged on the machine table, a test plate that can be driven to rotate is set on the loading chassis, and a feeding unit, an inspection unit, and a discharging unit are arranged outside the periphery of the loading chassis; The load-carrying chassis is composed of a plurality of different blocks which are independent but can be docked and combined with each other. The electronic component testing device as described in claim 1, wherein, the blocks of different sizes of the carrier chassis include a feeding block corresponding to the feeding unit, and an inspection block corresponding to the inspection unit E , and a discharge block corresponding to the discharge unit. The electronic component testing device as described in claim 2, wherein the inspection unit includes a first inspection unit for inspecting the insulation resistance of the capacitor, and a second inspection unit for inspecting the capacitance, loss or quality factor of the capacitor unit; the inspection block is composed of a first inspection block and a second inspection block that are independent but can be combined with each other, wherein the first inspection block and the first inspection unit Correspondingly set, the second inspection block is set correspondingly to the second inspection unit. The electronic component testing device as described in claim 3, wherein, the first inspection block is provided with a first suction groove, and the second inspection block is provided with a second suction groove, and the first suction groove and the second suction groove are The suction groove is connected in phase when the group is combined. The electronic component testing device as described in claim 3, wherein, the feeding block is provided with a feeding suction groove, and the discharge block is provided with a discharge suction groove, and the feeding suction groove and the discharge suction groove are in the Groups are not connected to each other in parallel. The electronic component testing device as described in claim 5, wherein, the feed suction groove on the feed block has a space at the rear end, and the space is provided with a small section that is connected to a section on the second inspection block. The second suction groove is connected with the third suction groove when combined, and a hollow suction hole is arranged in the third suction groove. The electronic component testing device as claimed in claim 1, wherein the inspection unit includes a first inspection unit for inspecting the insulation resistance of the capacitor, and a second inspection unit for inspecting the capacitance, loss or quality factor of the capacitor unit. The electronic component testing device as claimed in item 7, wherein there are two second inspection units, which are respectively located in front of and behind the first inspection unit in the direction of intermittent rotation. The electronic component testing device as described in claim 8, wherein the inspection block is composed of a first inspection block and two second inspection blocks that are independent but can be combined with each other, wherein, The first inspection block is set corresponding to the first inspection unit, and the two second inspection blocks are set corresponding to the two second inspection units. The electronic component testing device as described in claim 8, wherein, the second inspection block is provided with a plurality of columns spaced apart in the radial direction and concentrically arranged in a circular arc-shaped suction groove, and each suction groove is provided with a suction groove along the There are a plurality of hollow suction holes arranged at intervals at the bottom of the suction groove, and there is only one row of collars made of insulating material on the ribs of every two corresponding parts of the suction grooves arranged in a radial line. A shaft hole is arranged on the top, and the collars of each row are jointly located on the radial axis in the center of the sector. The electronic component testing device as described in claim 1, wherein, the upper surface of the test board is provided with a plurality of rows of concentric ring-shaped grooves spaced apart in the radial direction, and each row of the seat grooves is provided with a plurality of ring-shaped grooves spaced apart from each other. The seat grooves corresponding to each row radially are arranged in a plurality of rows at intervals in a straight line; the bearing chassis is provided with suction grooves arranged concentrically in a plurality of rows spaced apart in the radial direction, and hollow suction holes are arranged in each suction groove. The electronic component testing device as claimed in claim 11, wherein, between the two rows of seating grooves on the lower surface of the test board, a long strip of recessed interval-shaped cleaning grooves is formed. The electronic component testing device as claimed in claim 12, wherein the cleaning tank is adjacent to each of the seat grooves to form a convex expansion area close to the seat grooves.

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