TWM648235U - Electronic component inspection equipment - Google Patents

Abstract

This invention provides an electronic component inspection equipment, including: a machine platform with a machine table; a load-bearing chassis located on the machine table; a test board that can be driven to rotate is provided on the load-bearing chassis. The test A seat is provided on the board for carrying the component under test. The component under test is provided with an upper electrode located at the upper end and a lower electrode located at the lower end. The upper electrode is exposed at the upper end opening of the seat and is higher than the surface of the test board; An upper terminal can be lifted up to avoid the component under test before the component under test is transported by the test board adjacent to the upper terminal; the upper terminal can be moved below the upper terminal when the component under test is transported by the test board. , move down the upper electrode that contacts the upper end of the component under test, and disengage from the component under test being transported by the test board after the inspection is completed; thereby avoiding collision damage to the component under test during inspection.

Description

Electronic component inspection equipment

The present invention relates to an inspection device, in particular to an electronic component inspection device suitable for testing electronic components.

General electronic components usually need to be tested to determine their physical characteristics after they are manufactured. For example, the device provided in the "Circuit Component Loading and Unloading Device" patent application No. 411735 for testing capacitor-type electronic components uses a Or a concentric ring seat of several component sockets can rotate relative to the center of the ring. The sockets rotate evenly at angular intervals and in increments. The rotation increment is the angular interval between adjacent sockets. The ring seat is It is tilted at a certain angle, and when the ring seat rotates, the component flow path dumps the components toward the ring seat. The fixed grid adjacent to the side of the outer plate of the groove seat limits the unreturned components and randomly rolls down through the ring seat due to power. The empty slot in the arc section of the rotating path rolls randomly to return the component into the slot. In the path of the rotating ring seat, there is an electronic contactor used to connect the component and the testing machine. The tested component passes through an ejection manifold. Below the tube, the discharge manifold plate defines a plurality of discharge holes, and the discharge holes are aligned with a set of slots each time the ring seat is rotated by an increment. The discharge pipe is connected to the discharge port, and the element is selectively activated. The air blast from each pneumatic valve is ejected from the slot seat. Due to the air blast and gravity, the ejected components fall through the pipe and enter the classification storage box according to the guidance of the piping board. The component flow path can respond to the indication The grid is selectively directed to the grid by signals from component detectors that detect components in the slots that have not yet been ejected from the ejection manifold.

Due to the prior art of the patent application No. 411735, the component being rotated and transported in the holder is pressed against the terminal rolling on the surface of the ring holder for rolling contact inspection. It has been found that the collision between the rollers of the terminals and the components can easily cause damage to the corners of the components. In view of this, there is room for improvement.

Therefore, the purpose of this invention is to provide an electronic component inspection device that improves at least one of the shortcomings of the prior art.

The electronic component inspection equipment according to the purpose of this invention includes: a machine platform with a machine table; a load-bearing chassis located on the machine table; the load-bearing chassis is provided with a test plate that can be driven to rotate, and A feeding unit, an inspection unit, and a discharge unit are provided outside the periphery of the test board; the inspection unit is provided with a frame, and a plurality of upper terminal boxes located on the frame, and are arranged in parallel with each other at intervals. A plurality of lower terminal boxes are provided below each of the upper terminal boxes; the upper terminal box is provided with a plurality of upper terminals arranged side by side at intervals; the lower terminal box is provided with a plurality of probes arranged side by side at intervals; the test board is provided with There is a seat for carrying the component under test. The component under test is provided with an upper electrode at the upper end and a lower electrode at the lower end. The upper electrode is exposed at the upper end opening of the seat and is higher than the upper surface of the test board; an upper terminal , the component under test can be lifted up to avoid the component under test before it is transported by the test board adjacent to the upper terminal; the upper terminal can be moved downward when the component under test is transported below the upper terminal by the test board The upper electrode contacts the upper end of the component under test, and is out of contact with the component under test being transported by the test board after the inspection is completed.

In the electronic component inspection equipment of this creative embodiment, before the component under test is moved by the test board close to the upper terminal, the upper terminal is lifted up to avoid the component under test; after the inspection is completed, the component under test is moved by the upper terminal. The test board is transported out of contact with the upper terminal; therefore, when the component under test is transported by the test board close to the upper terminal, there will be no collision damage to the component under test, so that the yield of the inspection result can be improved.

A:Machine

A1:Machine table

A2:Machine desktop

B: Bearing chassis

C:Test board

C1: Seat slot

D: Feeding unit

E: Check unit

E1: First inspection unit

E2: Second inspection unit

E3: The third inspection unit

E4: Upper terminal box

E41: Upper terminal

E42: Box cover

E421: Pad

E422: Cable hole

E423:cable

E43:Box holder

E431: Connector

E432: Upper terminal block

E433: Place acupoints

E434: Upper terminal block

E435: elastic parts

E436: conductive sheet

E437:Transfer part

E438: Connector

E439:Shrapnel

E5: Lower terminal box

E51: Lower terminal

E6: mount

E61: Hole

F: Discharge unit

G: Feeding mechanism

H: guide frame

K: collection agency

K1: Collection box

M: component under test

M1: upper electrode

M2: lower electrode

Figure 1 is a three-dimensional schematic diagram of a component to be tested to illustrate the inspection target of the embodiment of the present invention; Figure 2 is a schematic diagram of an electronic component inspection equipment machine; Figure 3 is a schematic diagram of the configuration of various mechanisms on the machine table of the electronic component inspection equipment ; Figure 4 is a schematic diagram of the test board in the electronic component inspection equipment; Figure 5 is a partially enlarged schematic diagram of the test board in the electronic component inspection equipment; Figure 6 is a schematic diagram of the component under test in the electronic component inspection equipment during the test The schematic diagram of the upper surface of the test board protruding from the slot of the board holder; Figure 7 is the schematic diagram of the upper and lower terminals in the upper and lower terminal boxes of the electronic component inspection equipment; Figure 8 is the schematic diagram of the upper and lower terminals of the electronic component inspection equipment. A partial enlarged schematic diagram of the arrangement of the lower terminal in the upper and lower terminal boxes; Figure 9 is a schematic diagram of the upper terminal being lifted up when the upper terminal and the transported component under test are about to approach each other in the electronic component inspection equipment; Figure 10 is a schematic diagram of the upper terminal in the electronic component inspection equipment that has been lifted up corresponding to the component under test being moved below; Figure 11 is a schematic diagram of the upper terminal in the electronic component inspection equipment moving downward to the component under test below. A schematic diagram of inspection; Figure 12 is a schematic diagram of the test board moving the component under test and the upper terminal out of contact after the upper terminal is inspected in the electronic component inspection equipment.

Please refer to Figures 1 and 2. The embodiment of this invention is illustrated with an electronic component inspection equipment used for testing a capacitive component M under test, but it is not limited to the implementation of capacitive electronic components. The component M under test There is an upper electrode M1 located at the upper end and a lower electrode M2 located at the lower end; the electronic component inspection equipment is equipped with a disc-shaped metal material on a machine table A1 which is inclined at about 60 degrees. The load-bearing chassis B is set on the load-bearing chassis B and can be driven according to the A test plate C that rotates intermittently in a clockwise direction, and is provided outside the periphery of the test plate C with a feeding unit D for loading the component under test M, and a device for testing the characteristics of the component under test M. The inspection unit E and a discharge unit F for discharging and collecting the tested component M after completion of the test are provided with a feed material for providing the tested component M on a machine desktop A2 at the level of the machine A. Mechanism G and a guide frame H used to guide the discharge unit F to a collection mechanism K. The collection mechanism K that accommodates a plurality of material boxes K1 is provided on the front side of the machine A.

Please refer to Figure 3. The inspection unit E is provided with a first inspection unit E1 for inspecting the insulation resistance of the capacitor (commonly known as IR), and for inspecting the capacitance, loss or quality factor (commonly known as CD) of the capacitor. There are two second inspection units E2 and a third inspection unit E3 respectively located in front and behind the first inspection unit E1 in the direction in which the test board C rotates intermittently; wherein, the first inspection unit E1 is located in the direction intermittently rotates. The third inspection unit E3 can be omitted as needed.

Please refer to Figures 4 to 6. The upper surface of the test plate C is provided with a plurality of radially spaced rows (8 rows in this embodiment) of concentrically arranged rectangular grooves C1. Each column of C1 is provided with a plurality of rings at intervals, and the slots C1 corresponding to the radial direction of each column are linearly spaced and arranged in a plurality of rows; the component under test M has the upper electrode M1 located at the upper end facing upward, and the lower electrode M2 located at the lower end. The upper electrode M1 is placed downwardly in the seat groove C1 and is intermittently transported by the test board C. The upper surface of the upper electrode M1 is exposed at the upper end opening of the seat groove C1 and is slightly higher than the upper surface of the test board C.

Please refer to Figures 7 and 8. The inspection unit E uses a rolling wheel body located in the middle and lower part of the box-shaped upper terminal box E4 above the test board C as the upper terminal E41, which is electrically connected to the corresponding lower part of the test board C. The probe extending above the box-shaped lower terminal box E5 provided below each upper terminal box E4 is used as a lower terminal E51 to extend through the load-bearing chassis B for inspection; in this embodiment, the first inspection unit is used E1 is taken as an example. In Figure 3, the second inspection unit E2 and the third inspection unit Only the structure of the base frame of unit E3 is different from that of the base frame E6 of the first inspection unit E1. It is also provided with the above-mentioned upper terminal E41 and lower terminal E51; taking the first inspection unit E1 as an example, the upper terminal box E4 There is a box cover E42 located above and a box base E43 located below. The upper terminal box E4 is located in a hole E61 of a frame E6 that can be driven to move up and down, and the box cover E42 is located in the hole E61. Above the hole E61, the box seat E43 is located in the hole E61 and extends below it. When the seat frame E6 is driven to move up and down, the upper terminal E41 is moved up and down in conjunction; the box cover E42 is located in the hole E61. On a pad E421 on the upper surface of the seat frame E6; the box seat E43 is located below the box cover E42, and includes a connecting seat E431 located above and an upper terminal seat E432 located below; the box seat E43 is provided with a plurality of There are 8 upper terminals E41 spaced apart and juxtaposed (eight in this embodiment). Above each upper terminal E41, there is a hole E433 recessed in the box seat E43 from bottom to top for installation. An upper terminal seat E434 of the upper terminal E41 is located above the upper terminal seat E434 in the hole E433, and an elastic member E435 composed of a spring that provides the upper and lower elastic driving force of the upper terminal E41 has one end connected to the upper terminal E41 and electrically connected to the upper terminal E41. A slender sheet-shaped conductive piece E436 that is electrically conductive, an adapter portion E437 fixed at the other end of the conductive piece E436, and the other end of the conductive piece E436 is electrically connected between one end of the connection base E431 and the adapter portion E437. A connector E438 with the other end protruding from the box cover E42 is in electrical conduction and is welded to the connector E438 in the box cover E42 and extends to the upper terminal through a cable hole E422 on the box cover E42. A cable E423 outside the box E4.

Please refer to Figures 8 and 9. The upper terminal E41 composed of a rolling wheel body has its wheel axis supported by an elastic piece E439 and can be maintained at a high position despite the downward elastic force of the elastic piece E435; during electrical inspection When the device under test M is moved by the test board C and adjacent to the upper terminal E41, the upper terminal E41 is lifted to a height positioning of a predetermined distance higher than the upper electrode M1 on the upper surface of the device under test M to avoid the upper terminal E41. The component under test M is tested without any contact with the component under test M that is transported. A collision occurs; when the upper terminal E41 is advanced, the upper terminal E41 can maintain contact with the surface of the test board C or maintain a distance without contact; if contact is maintained, the upper terminal E41 is removed from the test board when the upper terminal E41 is advanced. The C surface is lifted up; if a distance is maintained without contact, the upper terminal E41 can be located at the same height as the upper surface of the component under test M, and the upper terminal E41 is lifted from the component under test M Lifting is performed at the same height as the surface.

Referring to FIGS. 10 and 11 , when the device under test M is transported below the upper terminal E41 by the test board C, the upper terminal E41 moves down the upper electrode M1 that contacts the upper end of the device under test C for inspection.

Please refer to Figure 12. After the inspection is completed, the component under test M is moved by the test board C and disengages from the upper terminal E41. The "disconnection" can be achieved by maintaining the lower edge of the upper terminal E41 on the component under test. When M performs the inspection, the height of the upper surface is positioned high, and only the test board C transports the component under test M to disengage from the upper terminal E41 and out of contact with the component under test M; or after the inspection is completed, Before the component under test M is moved out of contact with the upper terminal E41 by the test board C, the upper terminal E41 is lifted to a height and maintains a distance from the upper surface of the component under test M without contact. The test board C The component under test M is moved away from the upper terminal E41 and out of contact.

In the electronic component inspection equipment of this embodiment of the invention, before the component under test M is moved by the test board C close to the upper terminal E41, the upper terminal E41 is lifted up to avoid the component under test M; after the inspection is completed, the upper terminal E41 The component under test M is transported by the test board C and is out of contact with the upper terminal E41; therefore, when the component under test M is transported by the test board C and adjacent to the upper terminal E41, there will be no collision damage to the component under test M, making inspection As a result, yield can be improved.

However, the above are only examples of the invention, and should not be used to limit the scope of the implementation of the invention. All simple equivalent changes and modifications made based on the patent scope of the invention and the contents of the patent specification are still within the scope of the invention. Within the scope covered by this creative patent.

C:Test board

E41: Upper terminal

M: component under test

M1: upper electrode

Claims (5)

An electronic component inspection equipment, including: A machine platform with a machine table; A load-bearing chassis is provided on the machine table. A test plate that can be driven to rotate is provided on the load-bearing chassis, and a feeding unit, an inspection unit, and a discharge unit are provided outside the periphery of the test plate; The inspection unit is provided with a frame, a plurality of upper terminal boxes arranged on the frame, and a plurality of lower terminal boxes arranged correspondingly under each upper terminal box at intervals. The upper terminal box is provided with A plurality of upper terminals arranged side by side at intervals; the lower terminal box is provided with a plurality of probes arranged side by side at intervals; The test board is provided with a seat for carrying the component under test. The component under test is provided with an upper electrode at the upper end and a lower electrode at the lower end. The upper electrode is exposed at the upper end opening of the seat and is higher than the test board. surface; An upper terminal can be lifted up to avoid the component under test before the component under test is transported by the test board adjacent to the upper terminal; the upper terminal can be moved below the upper terminal when the component under test is transported by the test board. , move down the upper electrode that contacts the upper end of the component under test, and disengage from the component under test being transported by the test board after completing the inspection. The electronic component inspection equipment as claimed in claim 1, wherein the upper terminal is advanced to maintain a distance from the surface of the test board before the component to be tested is moved adjacent to the upper terminal by the test board. get in touch with. The electronic component inspection equipment of claim 1, wherein the upper terminal is in contact with the surface of the test board before the component under test is moved adjacent to the upper terminal by the test board. The electronic component inspection equipment of claim 1, wherein the upper terminal can be lifted to a height and connected to the component under test before the component under test is transported by the test board and out of contact with the upper terminal after the inspection is completed. The upper surfaces remain at a distance without touching. The electronic component inspection equipment of claim 1, wherein the upper terminal can maintain the lower edge on the upper surface of the component under test when the component under test is transported by the test board and out of contact with the upper terminal after the inspection is completed. height and disengage from the component under test.

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