TWI812697B - 圖像識別裝置、及具有圖像識別裝置的物品製造裝置 - Google Patents

圖像識別裝置、及具有圖像識別裝置的物品製造裝置 Download PDF

Info

Publication number
TWI812697B
TWI812697B TW108112632A TW108112632A TWI812697B TW I812697 B TWI812697 B TW I812697B TW 108112632 A TW108112632 A TW 108112632A TW 108112632 A TW108112632 A TW 108112632A TW I812697 B TWI812697 B TW I812697B
Authority
TW
Taiwan
Prior art keywords
image
aforementioned
recognition
processing
images
Prior art date
Application number
TW108112632A
Other languages
English (en)
Chinese (zh)
Other versions
TW201944289A (zh
Inventor
小林憲令
Original Assignee
日商日東電工股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日商日東電工股份有限公司 filed Critical 日商日東電工股份有限公司
Publication of TW201944289A publication Critical patent/TW201944289A/zh
Application granted granted Critical
Publication of TWI812697B publication Critical patent/TWI812697B/zh

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/0008—Industrial image inspection checking presence/absence
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/10—Segmentation; Edge detection
    • G06T7/11—Region-based segmentation
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/20—Analysis of motion
    • G06T7/292—Multi-camera tracking
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/20—Image preprocessing
    • G06V10/22—Image preprocessing by selection of a specific region containing or referencing a pattern; Locating or processing of specific regions to guide the detection or recognition
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10016—Video; Image sequence
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30148—Semiconductor; IC; Wafer
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30204—Marker

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Quality & Reliability (AREA)
  • Multimedia (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Analysis (AREA)
  • Inspection Of Paper Currency And Valuable Securities (AREA)
  • Vending Machines For Individual Products (AREA)
  • Packaging For Recording Disks (AREA)
  • Image Processing (AREA)
TW108112632A 2018-04-13 2019-04-11 圖像識別裝置、及具有圖像識別裝置的物品製造裝置 TWI812697B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2018077653A JP6890101B2 (ja) 2018-04-13 2018-04-13 画像識別装置、及び画像識別装置を備える物品製造装置
JP2018-077653 2018-04-13

Publications (2)

Publication Number Publication Date
TW201944289A TW201944289A (zh) 2019-11-16
TWI812697B true TWI812697B (zh) 2023-08-21

Family

ID=68284351

Family Applications (1)

Application Number Title Priority Date Filing Date
TW108112632A TWI812697B (zh) 2018-04-13 2019-04-11 圖像識別裝置、及具有圖像識別裝置的物品製造裝置

Country Status (4)

Country Link
JP (1) JP6890101B2 (ko)
KR (1) KR102649500B1 (ko)
CN (1) CN110390662A (ko)
TW (1) TWI812697B (ko)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20230053838A1 (en) * 2020-02-18 2023-02-23 Nec Corporation Image recognition apparatus, image recognition method, and recording medium
JP7510975B2 (ja) 2022-07-22 2024-07-04 プライムアースＥｖエナジー株式会社 検査装置及び検査装置のキャリブレーション方法

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005158780A (ja) * 2003-11-20 2005-06-16 Hitachi Ltd パターン欠陥検査方法及びその装置
TWI256372B (en) * 2001-12-27 2006-06-11 Tokyo Electron Ltd Carrier system of polishing processing body and conveying method of polishing processing body
TWI465711B (zh) * 2006-12-14 2014-12-21 Nippon Electric Glass Co 板玻璃缺陷檢測裝置、板玻璃製造方法、板玻璃物品、板玻璃良否判斷裝置以及板玻璃檢查方法
TW201721567A (zh) * 2015-12-11 2017-06-16 澧達科技股份有限公司 儲藏物的位置追蹤方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5696591A (en) * 1996-01-05 1997-12-09 Eastman Kodak Company Apparatus and method for detecting longitudinally oriented flaws in a moving web
JP2001084364A (ja) * 1999-09-13 2001-03-30 Matsushita Electric Ind Co Ltd 画像撮像検査装置及びこれを用いた実装基板検査装置
JP2005010036A (ja) * 2003-06-19 2005-01-13 Koyo Seiko Co Ltd 外観検査装置
JP2007178144A (ja) * 2005-12-27 2007-07-12 Advanced Mask Inspection Technology Kk パターン検査装置、パターン検査方法、検査対象試料、及び検査対象試料の管理方法
JP5006551B2 (ja) * 2006-02-14 2012-08-22 住友化学株式会社 欠陥検査装置及び欠陥検査方法
JP2010127809A (ja) * 2008-11-28 2010-06-10 Nippon Paper Industries Co Ltd 外観検査装置及び外観検査システム並びにプログラム
JP5353566B2 (ja) * 2009-08-31 2013-11-27 オムロン株式会社 画像処理装置および画像処理プログラム
JP6075912B2 (ja) * 2013-03-14 2017-02-08 Juki株式会社 画像処理装置及び画像処理方法
JP6430228B2 (ja) 2014-12-15 2018-11-28 株式会社Ｓｃｒｅｅｎホールディングス 画像分類装置および画像分類方法

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI256372B (en) * 2001-12-27 2006-06-11 Tokyo Electron Ltd Carrier system of polishing processing body and conveying method of polishing processing body
JP2005158780A (ja) * 2003-11-20 2005-06-16 Hitachi Ltd パターン欠陥検査方法及びその装置
TWI465711B (zh) * 2006-12-14 2014-12-21 Nippon Electric Glass Co 板玻璃缺陷檢測裝置、板玻璃製造方法、板玻璃物品、板玻璃良否判斷裝置以及板玻璃檢查方法
TW201721567A (zh) * 2015-12-11 2017-06-16 澧達科技股份有限公司 儲藏物的位置追蹤方法

Also Published As

Publication number Publication date
CN110390662A (zh) 2019-10-29
JP6890101B2 (ja) 2021-06-18
JP2019184489A (ja) 2019-10-24
TW201944289A (zh) 2019-11-16
KR20190120076A (ko) 2019-10-23
KR102649500B1 (ko) 2024-03-21

Similar Documents

Publication Publication Date Title
US10885626B2 (en) Identifying apparatus, identifying method, and program
TWI812697B (zh) 圖像識別裝置、及具有圖像識別裝置的物品製造裝置
JP7316731B2 (ja) ビジョンシステムで画像内のパターンを検出及び分類するためのシステム及び方法
EP2660787A1 (en) Defect categorisation in a digital image
Chen et al. Edge-glued wooden panel defect detection using deep learning
Usami et al. Defect detection and classification of electronic circuit boards using keypoint extraction and CNN features
CN111310826B (zh) 样本集的标注异常检测方法、装置及电子设备
JP2013545979A (ja) ウェブベース材料における不均一性の高速処理と検出
Kulkarni et al. An automated computer vision based system for bottle cap fitting inspection
Mahmud et al. Fabric defect detection system
WO2019151177A1 (ja) 情報処理装置、衣服分別システム、情報処理方法、及び制御プログラム
TW202035975A (zh) 表面缺陷偵測系統及其方法
JP2013145171A (ja) 外観検査装置
JP6748168B2 (ja) 略円形の側面を有する物品の検査装置、及び物品反転装置
JP2006234422A (ja) Ｘ線検査装置および蓄積情報抽出システム
JP2021152489A (ja) 教師データ生成装置、検査装置及びプログラム
TWI823159B (zh) 具人機互動功能的瑕疵檢測系統
CN111460198A (zh) 一种图片时间戳的审核方法及装置
JP5976477B2 (ja) 文字読取装置、及び紙葉類処理装置
JP2020190485A (ja) 識別モデル生成装置、識別モデル生成方法及び識別モデル生成プログラム、並びに鋼材疵判定装置、鋼材疵判定方法及び鋼材疵判定プログラム
JP2020024111A (ja) 検査装置および検査方法
US11335007B2 (en) Method to generate neural network training image annotations
TW202129590A (zh) 片狀材料快速檢測瑕疵整合系統及其使用方法
KR20220087360A (ko) 다중 카메라 기반 순차적 머신 비전을 통한 공병 분류 및 물량 산출 방법 및 장치
Shiraishi et al. Development of a Portable Automatic Inspection System for Printed Labels Using a Web Camera