CN110390662A - 图像识别装置和具备图像识别装置的物品制造装置 - Google Patents

图像识别装置和具备图像识别装置的物品制造装置 Download PDF

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Publication number
CN110390662A
CN110390662A CN201910294158.7A CN201910294158A CN110390662A CN 110390662 A CN110390662 A CN 110390662A CN 201910294158 A CN201910294158 A CN 201910294158A CN 110390662 A CN110390662 A CN 110390662A
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CN
China
Prior art keywords
processing
image
article
unit
pattern recognition
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201910294158.7A
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English (en)
Chinese (zh)
Inventor
小林宪令
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nittosan Engineering Co Ltd
Nitto Denko Corp
Original Assignee
Nittosan Engineering Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nittosan Engineering Co Ltd filed Critical Nittosan Engineering Co Ltd
Publication of CN110390662A publication Critical patent/CN110390662A/zh
Pending legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/0008—Industrial image inspection checking presence/absence
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/10—Segmentation; Edge detection
    • G06T7/11—Region-based segmentation
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/20—Analysis of motion
    • G06T7/292—Multi-camera tracking
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/20—Image preprocessing
    • G06V10/22—Image preprocessing by selection of a specific region containing or referencing a pattern; Locating or processing of specific regions to guide the detection or recognition
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10016—Video; Image sequence
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30148—Semiconductor; IC; Wafer
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30204—Marker

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Quality & Reliability (AREA)
  • Multimedia (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Analysis (AREA)
  • Inspection Of Paper Currency And Valuable Securities (AREA)
  • Vending Machines For Individual Products (AREA)
  • Packaging For Recording Disks (AREA)
  • Image Processing (AREA)
CN201910294158.7A 2018-04-13 2019-04-12 图像识别装置和具备图像识别装置的物品制造装置 Pending CN110390662A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2018077653A JP6890101B2 (ja) 2018-04-13 2018-04-13 画像識別装置、及び画像識別装置を備える物品製造装置
JP2018-077653 2018-04-13

Publications (1)

Publication Number Publication Date
CN110390662A true CN110390662A (zh) 2019-10-29

Family

ID=68284351

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201910294158.7A Pending CN110390662A (zh) 2018-04-13 2019-04-12 图像识别装置和具备图像识别装置的物品制造装置

Country Status (4)

Country Link
JP (1) JP6890101B2 (ko)
KR (1) KR102649500B1 (ko)
CN (1) CN110390662A (ko)
TW (1) TWI812697B (ko)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20230053838A1 (en) * 2020-02-18 2023-02-23 Nec Corporation Image recognition apparatus, image recognition method, and recording medium
JP7510975B2 (ja) 2022-07-22 2024-07-04 プライムアースＥｖエナジー株式会社 検査装置及び検査装置のキャリブレーション方法

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005158780A (ja) * 2003-11-20 2005-06-16 Hitachi Ltd パターン欠陥検査方法及びその装置
JP2007218629A (ja) * 2006-02-14 2007-08-30 Sumitomo Chemical Co Ltd 欠陥検査装置及び欠陥検査方法
JP2010127809A (ja) * 2008-11-28 2010-06-10 Nippon Paper Industries Co Ltd 外観検査装置及び外観検査システム並びにプログラム
JP2011053787A (ja) * 2009-08-31 2011-03-17 Omron Corp 画像処理装置および画像処理プログラム
CN104052926A (zh) * 2013-03-14 2014-09-17 Juki株式会社 图像处理装置以及图像处理方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5696591A (en) * 1996-01-05 1997-12-09 Eastman Kodak Company Apparatus and method for detecting longitudinally oriented flaws in a moving web
JP2001084364A (ja) * 1999-09-13 2001-03-30 Matsushita Electric Ind Co Ltd 画像撮像検査装置及びこれを用いた実装基板検査装置
TWI256372B (en) * 2001-12-27 2006-06-11 Tokyo Electron Ltd Carrier system of polishing processing body and conveying method of polishing processing body
JP2005010036A (ja) * 2003-06-19 2005-01-13 Koyo Seiko Co Ltd 外観検査装置
JP2007178144A (ja) * 2005-12-27 2007-07-12 Advanced Mask Inspection Technology Kk パターン検査装置、パターン検査方法、検査対象試料、及び検査対象試料の管理方法
JP5169194B2 (ja) * 2006-12-14 2013-03-27 日本電気硝子株式会社 板ガラス欠陥検出装置、板ガラスの製造方法
JP6430228B2 (ja) 2014-12-15 2018-11-28 株式会社Ｓｃｒｅｅｎホールディングス 画像分類装置および画像分類方法
US20170169294A1 (en) * 2015-12-11 2017-06-15 Leadot Innovation, Inc. Method of Tracking Locations of Stored Items

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005158780A (ja) * 2003-11-20 2005-06-16 Hitachi Ltd パターン欠陥検査方法及びその装置
JP2007218629A (ja) * 2006-02-14 2007-08-30 Sumitomo Chemical Co Ltd 欠陥検査装置及び欠陥検査方法
JP2010127809A (ja) * 2008-11-28 2010-06-10 Nippon Paper Industries Co Ltd 外観検査装置及び外観検査システム並びにプログラム
JP2011053787A (ja) * 2009-08-31 2011-03-17 Omron Corp 画像処理装置および画像処理プログラム
CN104052926A (zh) * 2013-03-14 2014-09-17 Juki株式会社 图像处理装置以及图像处理方法

Also Published As

Publication number Publication date
JP6890101B2 (ja) 2021-06-18
TWI812697B (zh) 2023-08-21
JP2019184489A (ja) 2019-10-24
TW201944289A (zh) 2019-11-16
KR20190120076A (ko) 2019-10-23
KR102649500B1 (ko) 2024-03-21

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