TWI801483B - Package structure of simple circuit board and chip - Google Patents

Package structure of simple circuit board and chip Download PDF

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TWI801483B
TWI801483B TW108100353A TW108100353A TWI801483B TW I801483 B TWI801483 B TW I801483B TW 108100353 A TW108100353 A TW 108100353A TW 108100353 A TW108100353 A TW 108100353A TW I801483 B TWI801483 B TW I801483B
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chip
circuit board
contact
contacts
acf
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TW108100353A
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TW202027566A (en
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陳石磯
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陳石磯
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Abstract

一種簡易型電路板與晶片之封裝結構,包含一第一晶片,該第一晶片下方有至少一第一晶片接點;一電路板位在該第一晶片之下方,其中該電路板上方有位置上對應到該第一晶片之第一晶片接點的電路板接點;封裝時該第一晶片接點結合到對應的該電路板之電路板接點上,使得該第一晶片結合該電路板;其中該第一晶片接點結合電路板接點的方式為ACF膠球結合或凸接點結合;其中該ACF膠球結合係為應用ACF膠球為焊接接點與另一方之墊片的結合方式,以將晶片與電路板結合;以及其中該凸接點結合係為應用同材料之凸接點與其他平接點或凸接點,這些接點分別置於電路板與晶片中,並應用物理或化學方法結合該凸接點與其他平接點或凸接點,而使得該電路板與晶片結合的方式。上述結合方式尚可用於結合具有多個晶片之晶圓以及電路板組。 A simple package structure of circuit board and chip, comprising a first chip, at least one first chip contact is arranged under the first chip; a circuit board is positioned under the first chip, wherein there is a position above the circuit board The circuit board contacts corresponding to the first chip contacts of the first chip; the first chip contacts are bonded to the corresponding circuit board contacts of the circuit board during packaging, so that the first chip is combined with the circuit board ; Wherein the first chip contact is combined with the circuit board contact by ACF rubber ball bonding or convex joint bonding; wherein the ACF rubber ball bonding system is the combination of using ACF rubber balls as solder joints and the pads of the other party way, to combine the chip with the circuit board; and wherein the bump joint is the application of bumps of the same material and other flat contacts or bumps, which are respectively placed in the circuit board and the chip, and applied Physical or chemical methods combine the bumps with other flat contacts or bumps, so that the circuit board is combined with the chip. The above bonding method can also be used to bond wafers with multiple chips and circuit board groups.

Description

簡易型電路板與晶片之封裝結構 Package structure of simple circuit board and chip

本發明係有關於,尤其是一種簡易型電路板與晶片之封裝結構。 The present invention relates to, in particular, a package structure of a simple circuit board and a chip.

習知的半導體多層晶片封裝結構,係在電路板及晶片上方製造焊墊,再由焊墊之間的連接達到信號的連通。最後再形成封裝層達到整體封裝的目的。習知技術的結構為了適應不同板材之間的焊點位置,連接導線必須繞線而且配置在整個電路結構的不同方位。繞線將會導致作業上的困難且增加工時,另外封裝時必須在不同的面上封裝環氧樹脂,所以整體結構的厚度增加,一方面增加成本及工時,再者也會降低散熱效果。 In the conventional semiconductor multi-layer chip packaging structure, pads are manufactured on the circuit board and the chip, and then the connection between the pads is used to achieve signal communication. Finally, an encapsulation layer is formed to achieve the purpose of overall encapsulation. In order to adapt to the positions of solder joints between different boards in the structure of the prior art, the connecting wires must be wound and arranged in different positions of the entire circuit structure. Winding will lead to difficulties in operation and increased man-hours. In addition, epoxy resin must be encapsulated on different surfaces during packaging, so the thickness of the overall structure increases. On the one hand, it increases costs and man-hours, and also reduces the heat dissipation effect .

發明人為改進習知封裝結構的缺點,因此構想出在上層電路板上形成開口,而使得信號連接線經由該開口而連接下層的晶片及上層的電路板,如美國第US9299626B2號專利案,係應用打線製程來形成晶圓級封裝架構,可適用於大型晶片的封裝結構,使得整體結構可以簡化,而可以節省封裝成本。經發明人從事此一行業,經過多方的思考,發現實際上很多電路架構比該專利所描述的電路結構複雜很多,所以發明人亟思應用此一電路結構以解決更複雜之晶片封裝架構的問題。 In order to improve the shortcomings of the conventional packaging structure, the inventor conceived of forming an opening on the upper circuit board, so that the signal connection line is connected to the lower chip and the upper circuit board through the opening, such as the U.S. Patent No. US9299626B2, which is applied The wafer-level packaging structure is formed by the wire bonding process, which is applicable to the packaging structure of large chips, so that the overall structure can be simplified and the packaging cost can be saved. The inventor is engaged in this industry, and after many considerations, he found that many circuit structures are actually much more complex than the circuit structure described in the patent, so the inventor wants to use this circuit structure to solve the problem of more complex chip packaging structures. .

故本案希望提出一種嶄新的簡易型電路板與晶片之封裝結構,以解決上述先前技術上的缺陷。 Therefore this case hopes to propose a kind of brand-new packaging structure of simple type circuit board and chip, to solve above-mentioned defective in prior art.

所以本發明的目的係為解決上述習知技術上的問題,本發明中提出一種簡易型電路板與晶片之封裝結構,係可以使得接點及導線均為內隱藏式者,而不外露,因此可減少封裝結構,所以封裝時整個工時及操作程序均可減少,所以整個製造成本也會跟著降低。 Therefore, the purpose of the present invention is to solve the above-mentioned problems in the prior art. In the present invention, a simple packaging structure of circuit board and chip is proposed, which can make the contacts and wires all be hidden inside and not exposed. Therefore The packaging structure can be reduced, so the entire man-hours and operating procedures during packaging can be reduced, so the entire manufacturing cost will also be reduced accordingly.

為達到上述目的本發明中提出一種簡易型電路板與晶片之封裝結構,包含一第一晶片,該第一晶片下方有至少一第一晶片接點;一電路板位在該第一晶片之下方,其中該電路板上方有位置上對應到該第一晶片之第一晶片接點的電路板接點;封裝時該第一晶片接點結合到對應的該電路板之電路板接點上,使得該第一晶片結合該電路板;其中該第一晶片接點結合電路板接點的方式為ACF膠球結合或凸接點結合;其中該ACF膠球結合係為應用ACF膠球為焊接接點與另一方之墊片的結合方式,以將晶片與電路板結合;以及其中該凸接點結合係為應用同材料之凸接點與其他平接點或凸接點,這些接點分別置於電路板與晶片中,並應用物理或化學方法結合該凸接點與其他平接點或凸接點,而使得該電路板與晶片結合的方式。 In order to achieve the above object, the present invention proposes a simple circuit board and chip packaging structure, including a first chip, at least one first chip contact is arranged below the first chip; a circuit board is positioned under the first chip , wherein there is a circuit board contact corresponding to the first chip contact of the first chip above the circuit board; the first chip contact is combined with the corresponding circuit board contact of the circuit board during packaging, so that The first chip is bonded to the circuit board; wherein the first chip contact is bonded to the circuit board contact by ACF rubber ball bonding or convex joint bonding; wherein the ACF rubber ball bonding system is the use of ACF rubber balls as solder joints The method of bonding with the gasket of the other party to bond the chip to the circuit board; and wherein the bump bonding is the application of bumps of the same material and other flat or bumps, which are respectively placed on the In the circuit board and the chip, and use physical or chemical methods to combine the bumps with other flat contacts or bumps, so that the circuit board and the chip are combined.

本案尚提出一種簡易型電路板與晶圓之封裝結構,包含一第一晶圓,該第一晶圓包含多個第一晶片,各該第一晶片下方有至少一第一晶片接點;一電路板組位在該第一晶圓之下方,該電路板組包含數量對應該多個第一晶片的多個電路板,其中各該電路板上方有位置上對應到該第一晶圓之各該第一晶片之第一晶片接點的電路板接點;封裝時該第一晶片接點結合到對應的該電路板組之電路板接點上,使得該第一晶圓結合該電路板組;其中該第一晶片接點結合電路板接點的方式為ACF膠球結合或凸接點 結合;其中該ACF膠球結合係為應用ACF膠球為焊接接點與另一方之墊片的結合方式,以將晶圓與電路板組結合;其中該凸接點結合係為應用同材料之凸接點與平接點分別置於電路板組與晶圓中,並應用物理或化學方法結合該凸接點與平接點,而使得該電路板組與晶圓結合的方式。 This case also proposes a simple circuit board and wafer packaging structure, including a first wafer, the first wafer includes a plurality of first chips, each of which has at least one first chip contact under the first chip; The circuit board group is located under the first wafer, and the circuit board group includes a plurality of circuit boards whose number corresponds to the plurality of first chips, wherein each circuit board has a position corresponding to the first wafer above each circuit board. The circuit board contact of the first chip contact of the first chip; the first chip contact is combined with the corresponding circuit board contact of the circuit board group during packaging, so that the first wafer is combined with the circuit board group ; Wherein the mode of combining the first chip contact with the circuit board contact is ACF rubber ball combination or convex contact Combination; wherein the ACF rubber ball combination is the combination of using ACF rubber balls as the welding joint and the pad of the other party, so as to combine the wafer and the circuit board group; wherein the convex joint combination is the application of the same material The convex contact and the flat contact are placed in the circuit board group and the wafer respectively, and the convex contact and the flat contact are combined by physical or chemical methods, so that the circuit board group is combined with the wafer.

由下文的說明可更進一步瞭解本發明的特徵及其優點,閱讀時並請參考附圖。 The features and advantages of the present invention can be further understood from the following description, please refer to the accompanying drawings when reading.

10’‧‧‧第一晶圓 10’‧‧‧first wafer

10‧‧‧第一晶片 10‧‧‧The first chip

11‧‧‧第一晶片接點 11‧‧‧The first chip contact

20’‧‧‧電路板組 20’‧‧‧circuit board set

20‧‧‧電路板 20‧‧‧circuit board

21‧‧‧電路板接點 21‧‧‧circuit board contacts

23‧‧‧第一凹槽 23‧‧‧The first groove

25‧‧‧導線 25‧‧‧wire

27‧‧‧第二凹槽 27‧‧‧The second groove

29‧‧‧接點 29‧‧‧Contact

30‧‧‧第二晶片 30‧‧‧Second chip

31‧‧‧第二晶片接點 31‧‧‧Second chip contacts

40‧‧‧第三晶片 40‧‧‧The third chip

41‧‧‧導線 41‧‧‧wire

42‧‧‧接點 42‧‧‧Contact

50‧‧‧第三凹槽 50‧‧‧The third groove

60‧‧‧第四凹槽 60‧‧‧The fourth groove

70‧‧‧膠膜 70‧‧‧film

111‧‧‧平接點 111‧‧‧flat contact

112’‧‧‧凸接點 112’‧‧‧Convex contact

112‧‧‧凸接點 112‧‧‧Convex contact

150’‧‧‧導線 150’‧‧‧lead wire

152’‧‧‧導線基板 152’‧‧‧lead substrate

201‧‧‧膠體 201‧‧‧colloid

202‧‧‧金屬導體 202‧‧‧Metal conductor

211‧‧‧ACF膠球 211‧‧‧ACF rubber ball

212’‧‧‧凸接點 212’‧‧‧Convex contact

212‧‧‧平接點 212‧‧‧flat contact

231‧‧‧凹槽接點 231‧‧‧groove contact

500‧‧‧電路元件 500‧‧‧circuit components

圖1顯示本案之第一實施例之第一應用例之截面示意圖。 FIG. 1 shows a schematic cross-sectional view of a first application example of the first embodiment of the present application.

圖2顯示本案之第一實施例之第一應用例之另一截面示意圖。 Fig. 2 shows another schematic cross-sectional view of the first application example of the first embodiment of the present application.

圖3顯示本案之第一實施例之ACF膠球之截面示意圖。 Fig. 3 shows a schematic cross-sectional view of the ACF rubber ball of the first embodiment of the present case.

圖4顯示圖3之第一實施例之ACF膠球經壓著後之截面示意圖。 FIG. 4 shows a schematic cross-sectional view of the ACF rubber ball of the first embodiment shown in FIG. 3 after pressing.

圖5顯示本案之第一實施例之第二應用例之截面示意圖。 FIG. 5 shows a schematic cross-sectional view of a second application example of the first embodiment of the present invention.

圖6顯示本案之第一實施例之第二應用例之另一截面示意圖。 FIG. 6 shows another schematic cross-sectional view of the second application example of the first embodiment of the present application.

圖7顯示本案之第一實施例之第三應用例之截面示意圖。 FIG. 7 shows a schematic cross-sectional view of a third application example of the first embodiment of the present invention.

圖8顯示本案之第一實施例之第三應用例之另一截面示意圖。 FIG. 8 shows another schematic cross-sectional view of the third application example of the first embodiment of the present application.

圖9顯示本案之第一實施例之第四應用例之截面示意圖。 FIG. 9 shows a schematic cross-sectional view of a fourth application example of the first embodiment of the present application.

圖10顯示本案之第一實施例之第四應用例之另一截面示意圖。 FIG. 10 shows another schematic cross-sectional view of the fourth application example of the first embodiment of the present application.

圖11顯示本案之電路板上配置第三凹槽之平面局部示意圖。 FIG. 11 shows a partial plan view of the third groove disposed on the circuit board of the present case.

圖12顯示本案之第二實施例之第一應用例之截面示意圖。 Fig. 12 shows a schematic cross-sectional view of the first application example of the second embodiment of the present application.

圖13顯示本案之第二實施例之第一應用例之另一截面示意圖。 Fig. 13 shows another schematic cross-sectional view of the first application example of the second embodiment of the present application.

圖14顯示本案之第二實施例之第二應用例之截面示意圖。 FIG. 14 shows a schematic cross-sectional view of a second application example of the second embodiment of the present application.

圖15顯示本案之第二實施例之第二應用例之另一截面示意圖。 FIG. 15 shows another schematic cross-sectional view of the second application example of the second embodiment of the present application.

圖16顯示本案之第二實施例之第三應用例之截面示意圖。 FIG. 16 shows a schematic cross-sectional view of a third application example of the second embodiment of the present application.

圖17顯示本案之第二實施例之第三應用例之另一截面示意圖。 Fig. 17 shows another schematic cross-sectional view of the third application example of the second embodiment of the present application.

圖18顯示本案之第二實施例之電路板組先行切割並黏貼於膠膜上之截面示意圖。 FIG. 18 shows a schematic cross-sectional view of the circuit board assembly cut first and pasted on the adhesive film in the second embodiment of the present case.

圖19顯示本案之第二實施例中將個別的第一晶片及其對應的電路板予以切割成單一單位之截面示意圖。 FIG. 19 shows a schematic cross-sectional view of cutting individual first chips and their corresponding circuit boards into single units in the second embodiment of the present application.

圖20顯示本案之第一實施例之第二應用例之另一實施方式之截面示意圖。 FIG. 20 shows a schematic cross-sectional view of another implementation of the second application example of the first embodiment of the present application.

圖21顯示圖20中之導線安裝在一導線基板上之示意圖。 FIG. 21 shows a schematic view of the wires in FIG. 20 installed on a wire substrate.

圖22顯示本案之第一實施例之第二應用例之又一實施方式之截面示意圖。 Fig. 22 shows a schematic cross-sectional view of yet another implementation of the second application example of the first embodiment of the present application.

圖23顯示圖22中之導線安裝在一導線基板上之示意圖。 FIG. 23 shows a schematic view of the wires in FIG. 22 installed on a wire substrate.

茲謹就本案的結構組成,及所能產生的功效與優點,配合圖式,舉本案之一較佳實施例詳細說明如下。 Hereby, with regard to the structural composition of this case, and the effects and advantages that can be produced, in conjunction with the drawings, one of the preferred embodiments of this case is described in detail as follows.

請參考圖1至圖11所示,顯示本發明之簡易型電路板與晶片之封裝結構之第一實施例,包含下列元件:一第一晶片10,該第一晶片10下方有至少一第一晶片接點11。 Please refer to Fig. 1 to shown in Fig. 11, show the first embodiment of the package structure of simple type circuit board and chip of the present invention, comprise following element: a first chip 10, there is at least one first chip 10 below Wafer contact 11.

一電路板20位在該第一晶片10之下方,其中該電路板20上方有位置上對應到該第一晶片10之第一晶片接點11的電路板接點21。 A circuit board 20 is located below the first chip 10 , wherein above the circuit board 20 there are circuit board contacts 21 corresponding in position to the first chip contacts 11 of the first chip 10 .

封裝時該第一晶片接點11結合到對應的該電路板20之電路板接點21上,如圖2所示,因此使得該第一晶片10結合該電路板20。其中該第一晶片 接點11結合電路板接點21的方式可以是ACF膠球結合或凸接點結合。 During packaging, the first chip contact 11 is bonded to the corresponding circuit board contact 21 of the circuit board 20 , as shown in FIG. 2 , so that the first chip 10 is bonded to the circuit board 20 . where the first wafer The contact 11 can be combined with the contact 21 of the circuit board by ACF rubber ball bonding or convex contact bonding.

在本實施例的第一應用例中係為ACF膠球結合,係應用ACF膠球為焊接接點與另一方之墊片的結合方式,以將晶片與電路板結合。 In the first application example of this embodiment, it is ACF rubber ball bonding, which uses ACF rubber balls as the bonding method of the welding joint and the pad of the other party, so as to bond the chip and the circuit board.

在此ACF膠球結合中,如圖1所示,該第一晶片接點11為一平接點(墊片,pad)111,該電路板接點21為一ACF膠球211,如圖3所示,其中該ACF膠球211係為在膠體201內部散佈眾多金屬(如金)導體202所形成的軟性膠體。封裝時該ACF膠球211經壓著後產生形變而貼附在對應的該第一晶片10之第一晶片接點11上,如圖2所示,因此使得該第一晶片10黏合該電路板20。請參考圖3及圖4,其中圖3顯示該ACF膠球211係為在膠體201內部散佈眾多金屬(如金)導體202所形成之軟性膠體,而經壓著之後該金屬導體202會互相接觸而使得整個ACF膠球211為導體可以導通電流(如圖4所示)。 In this ACF rubber ball combination, as shown in FIG. 1, the first chip contact 11 is a flat contact (gasket, pad) 111, and the circuit board contact 21 is an ACF rubber ball 211, as shown in FIG. 3 As shown, the ACF rubber ball 211 is a soft colloid formed by distributing many metal (such as gold) conductors 202 inside the colloid 201 . During packaging, the ACF rubber ball 211 is deformed after being pressed and attached to the first chip contact 11 of the corresponding first chip 10, as shown in FIG. 2, so that the first chip 10 is bonded to the circuit board 20. Please refer to Figure 3 and Figure 4, where Figure 3 shows that the ACF rubber ball 211 is a soft colloid formed by spreading many metal (such as gold) conductors 202 inside the colloid 201, and the metal conductors 202 will contact each other after pressing And making the whole ACF rubber ball 211 a conductor can conduct current (as shown in FIG. 4 ).

其他的電路元件500可以安裝在該電路板20的下方,而經由穿過該電路板20的導線25連接該ACF膠球211。 Other circuit components 500 can be installed under the circuit board 20 and connected to the ACF rubber ball 211 via the wire 25 passing through the circuit board 20 .

在本實施例的第二應用例中為凸接點結合,係應用同材料之凸接點與其他平接點或凸接點,這些接點分別置於電路板與晶片中,並應用物理或化學方法結合該凸接點與其他平接點或凸接點,而使得該電路板與晶片結合的方式。 In the second application example of this embodiment, it is the combination of bumps, which is the use of bumps of the same material and other flat contacts or bumps. These contacts are respectively placed in the circuit board and the chip, and applied physical or Chemically combine the bumps with other flat contacts or bumps to make the circuit board bonded to the chip.

在此凸接點結合中,該第一晶片接點11為一凸出於該第一晶片10下表面的凸接點112(如金屬接點或錫球),該電路板接點21為一平接點212(墊片,pad),該平接點212的材料同於該凸接點112的材料。封裝時該第一晶片10的該凸接點112結合在對應的該平接點212上,如圖5所示。因此使得該第一晶片10結合該電路板20,如圖6所示。該凸接點112的材料為金屬時,可 應用超音波方式進行結合。該凸接點112的材料為錫球時,可應用焊接方式結合。 In this bump connection, the first chip contact 11 is a bump 112 (such as a metal contact or a solder ball) protruding from the lower surface of the first chip 10, and the circuit board contact 21 is a flat The contact 212 (pad), the material of the flat contact 212 is the same as the material of the convex contact 112 . During packaging, the protruding joints 112 of the first chip 10 are bonded to the corresponding flat joints 212 , as shown in FIG. 5 . The first wafer 10 is thus bonded to the circuit board 20 , as shown in FIG. 6 . When the material of the bump 112 is metal, it can Combined with ultrasonic method. When the bumps 112 are made of solder balls, they can be combined by soldering.

圖20顯示本例之另一實施方式,該第一晶片接點11為一凸出於該第一晶片10下方之側端的凸接點112’(如金屬接點或錫球),該電路板接點21為一凸接點212’(墊片,pad)。封裝時該第一晶片10的該凸接點112’透過一導線150’結合在對應的該電路板接點21上。當有數個第一晶片接點11及電路板接點21時,連接之導線150’係安裝在一導線基板152’上(如圖21所示),而將該導線基板152’跨接在該數個第一晶片接點11及電路板接點21,而一次完成封裝作業。 Figure 20 shows another embodiment of this example, the first chip contact 11 is a protruding contact 112' (such as a metal contact or a solder ball) protruding from the side end below the first chip 10, the circuit board The contact 21 is a protruding contact 212' (pad). During packaging, the bump 112' of the first chip 10 is bonded to the corresponding circuit board contact 21 through a wire 150'. When there are several first chip contacts 11 and circuit board contacts 21, the wire 150' connected is installed on a lead substrate 152' (as shown in Figure 21), and the lead substrate 152' is connected across the lead substrate 152'. Several first chip contacts 11 and circuit board contacts 21, and the packaging operation is completed at one time.

如圖22所示,其同於圖20所示之導線連結方式,惟在圖22中該第一晶片10具有該第一晶片接點11的下表面翻轉向上而位在整個組裝結構的上方,然後再以相同的方式進行封裝。其中該第一晶片接點11為一凸出於該第一晶片下表面之凸接點212’,然後該第一晶片具有該第一晶片接點11的下表面翻轉向上而位在整個組裝結構的上方;該電路板接點21為一凸接點212’;封裝時該第一晶片10的該凸接點212’透過一導線150’結合在對應的該電路板接點21上;當有數個第一晶片接點11及電路板接點21時,連接之導線150’係安裝在一導線基板152’上(如圖23所示),而將該導線基板152’跨接在該數個第一晶片接點11及電路板接點21。在本實施例的第三應用例中,在該第一晶片10下表面連接一第二晶片30。該第二晶片30下方有至少一第二晶片接點31。 As shown in FIG. 22, it is the same as the wire connection method shown in FIG. 20, but in FIG. 22 the first chip 10 has the lower surface of the first chip contact 11 turned upwards and positioned above the entire assembly structure, Then package again in the same way. Wherein the first chip contact 11 is a protruding contact 212' protruding from the lower surface of the first chip, and then the first chip has the lower surface of the first chip contact 11 turned upwards and positioned in the entire assembly structure The top of the circuit board contact 21 is a protruding contact 212'; the protruding contact 212' of the first chip 10 is combined on the corresponding circuit board contact 21 through a wire 150' during packaging; when there are several During a first chip contact 11 and a circuit board contact 21, the wire 150' connected is installed on a wire substrate 152' (as shown in Figure 23), and the wire substrate 152' is connected across the several wire substrates. The first chip contact 11 and the circuit board contact 21 . In the third application example of this embodiment, a second chip 30 is connected to the lower surface of the first chip 10 . There is at least one second chip contact 31 under the second chip 30 .

該電路板20的上表面形成一第一凹槽23,其中該第一凹槽23槽底的上表面有位置上對應到該第二晶片30之第二晶片接點31的凹槽接點231。 The upper surface of the circuit board 20 forms a first groove 23, wherein the upper surface of the groove bottom of the first groove 23 has a groove contact 231 corresponding to the second chip contact 31 of the second chip 30. .

因此在封裝時,該第二晶片30係位於該第一凹槽23內側,封裝時該凹槽接點231結合到對應的該第二晶片30之第二晶片接點31上,如圖7所示,因此使得該第二晶片30結合該電路板20,如圖8所示。其中該凹槽接點231結合第二晶片接點31的方式可以是上述之ACF膠球結合或上述之凸接點結合。圖7及圖8係顯示該凹槽接點231與第二晶片接點31的結合方式為ACF膠球結合。 Therefore, when packaging, the second chip 30 is located inside the first groove 23, and the groove contacts 231 are bonded to the corresponding second chip contacts 31 of the second chip 30 during packaging, as shown in Figure 7 As shown, thus making the second wafer 30 combined with the circuit board 20, as shown in FIG. 8 . The method of combining the groove contacts 231 with the second chip contacts 31 may be the above-mentioned ACF rubber ball bonding or the above-mentioned convex contact bonding. FIG. 7 and FIG. 8 show that the bonding method of the groove contact 231 and the second chip contact 31 is ACF rubber ball bonding.

在本實施例的第四應用例中,其包含如上所述之第一晶片10。 In the fourth application example of this embodiment, it includes the first wafer 10 as described above.

該電路板20的下表面形成一第二凹槽27,其中該第二凹槽27槽底的表面安裝有一第三晶片40。 A second groove 27 is formed on the lower surface of the circuit board 20 , wherein a third chip 40 is installed on the bottom surface of the second groove 27 .

其中該第一晶片10與該電路板20的結合方式可同於該第一應用例之ACF膠球結合或第二應用例之凸接點結合,如圖9或圖10所示,所以其細節不再贅述。圖9及圖10係顯示該第一晶片10與該電路板20的結合方式為ACF膠球結合。 Wherein the combination method of the first chip 10 and the circuit board 20 can be combined with the ACF rubber ball combination of the first application example or the bump joint combination of the second application example, as shown in Figure 9 or Figure 10, so the details No longer. 9 and 10 show that the bonding method of the first chip 10 and the circuit board 20 is ACF glue ball bonding.

而該第三晶片40與該電路板20的結合方式同於習知技術中的方式。如圖9或圖10所示,在該第三晶片40的下表面及該電路板20的下表面應用導線41及接點29、42連接。 The combination of the third chip 40 and the circuit board 20 is the same as that in the prior art. As shown in FIG. 9 or FIG. 10 , the lower surface of the third chip 40 and the lower surface of the circuit board 20 are connected by wires 41 and contacts 29 , 42 .

在上列的實施例中,由於在加工時,該電路板20與該第一晶片10、該第二晶片30的膨脹係數不同,其中該電路板20的膨脹係數會大於該第一晶片10、該第二晶片30的膨脹係數,在上述結合的過程均有高溫處理的情況,而使得該電路板20與該第一晶片10、該第二晶片30脫離,而導致結合失效,因此本案中可對於上述各應用例,對於該電路板20上的接點(包含ACF膠球211、平接點212(墊片))較接近該電路板20邊緣的一側形成第三凹槽50(如圖 11所示),該第三凹槽50可以是單邊弧形或ㄇ形凹槽,以對於加熱膨脹時,對於該接點提供膨脹餘裕,因此避免該電路板20與該第一晶片10、該第二晶片30脫離。 In the above-listed embodiment, since the expansion coefficient of the circuit board 20 is different from that of the first wafer 10 and the second wafer 30 during processing, the expansion coefficient of the circuit board 20 will be greater than that of the first wafer 10, The coefficient of expansion of the second wafer 30 has high temperature treatment in the above-mentioned bonding process, so that the circuit board 20 is separated from the first wafer 10 and the second wafer 30, resulting in bonding failure. Therefore, in this case, For each of the above application examples, a third groove 50 is formed on the side of the circuit board 20 (comprising ACF glue ball 211, flat contact 212 (gasket)) closer to the edge of the circuit board 20 (as shown in FIG. 11), the third groove 50 can be a single-sided arc or ㄇ-shaped groove, so as to provide expansion margin for the joint during thermal expansion, so as to avoid contact between the circuit board 20 and the first wafer 10, The second wafer 30 is detached.

下文說明本案的第二實施例,其中與上述第一實施例相同的元件應用相同的符號表示,其細節將不另外說明。 The second embodiment of the present case is described below, wherein the same elements as those of the above-mentioned first embodiment are denoted by the same symbols, and the details thereof will not be further described.

一第一晶圓10’,該第一晶圓10’包含多個第一晶片10(圖中以兩晶片做為說明例),各該第一晶片10下方有至少一第一晶片接點11。 A first wafer 10', the first wafer 10' comprises a plurality of first wafers 10 (two wafers are used as an illustration example in the figure), each of which has at least one first wafer contact 11 below the first wafer 10 .

一電路板組20’位在該第一晶圓10’之下方,該電路板組20’包含數量對應該多個第一晶片10的多個電路板20,其中各該電路板20上方有位置上對應到該第一晶圓10’之各該第一晶片10之第一晶片接點11的電路板接點21。 A circuit board group 20' is located below the first wafer 10', and the circuit board group 20' includes a plurality of circuit boards 20 corresponding to the number of the plurality of first chips 10, wherein each of the circuit boards 20 has a position above The circuit board contact 21 corresponding to the first chip contact 11 of each of the first chips 10 of the first wafer 10 ′.

封裝時該第一晶片接點11結合到對應的該電路板組20’之電路板接點21上,如圖13所示,因此使得該第一晶圓10’結合該電路板組20’。其中該第一晶片接點11結合電路板接點21的方式可以是ACF膠球結合或凸接點結合。 During packaging, the first chip contact 11 is bonded to the corresponding circuit board contact 21 of the circuit board group 20', as shown in Figure 13, so that the first wafer 10' is bonded to the circuit board group 20'. The first wafer contact 11 can be bonded to the circuit board contact 21 by ACF rubber ball bonding or bump bonding.

在本實施例的第一應用例中係為ACF膠球結合,係應用ACF膠球為焊接接點與另一方之墊片的結合方式,以將晶圓與電路板組結合。 In the first application example of this embodiment, it is the combination of ACF rubber balls, which uses ACF rubber balls as the bonding method of the solder joints and the pads of the other party to combine the wafer and the circuit board assembly.

在此ACF膠球結合中,如圖12所示,該第一晶片接點11為一平接點(墊片,pad)111,該電路板接點21為一ACF膠球211。封裝時該ACF膠球211經壓著後產生形變而貼附在對應的該第一晶圓10’之第一晶片接點11上,如圖13所示,因此使得該第一晶圓10’黏合該電路板組20’。 In this ACF rubber ball combination, as shown in FIG. 12 , the first chip contact 11 is a flat contact (gasket, pad) 111 , and the circuit board contact 21 is an ACF rubber ball 211 . During packaging, the ACF rubber ball 211 is deformed after being pressed and attached to the first chip contact 11 of the corresponding first wafer 10', as shown in FIG. 13, so that the first wafer 10' Glue the circuit board assembly 20'.

其他的電路元件500可以安裝在該電路板組20’的下方,而經由穿過該電路板組20’的導線25連接該ACF膠球211。 Other circuit components 500 can be installed under the circuit board assembly 20', and are connected to the ACF rubber ball 211 via the wire 25 passing through the circuit board assembly 20'.

在本實施例的第二應用例中為凸接點結合,係應用同材料之凸接點與 平接點分別置於電路板組與晶圓中,並應用物理或化學方法結合該凸接點與平接點,而使得該電路板組與晶圓結合的方式。 In the second application example of this embodiment, it is the combination of convex contacts, which is the application of convex contacts of the same material and The flat contacts are respectively placed in the circuit board group and the wafer, and the convex contacts and the flat contacts are combined by physical or chemical methods, so that the circuit board group and the wafer are combined.

在此凸接點結合中,該第一晶片接點11為一凸出於該第一晶圓10’下表面的凸接點112(如金屬接點或錫球),該電路板接點21為一平接點212(墊片,pad),該平接點212的材料同於該凸接點112的材料。封裝時該第一晶圓10’的該凸接點112結合在對應的該平接點212上,如圖14所示。因此使得該第一晶圓10’結合該電路板組20’,如圖15所示。該凸接點112的材料為金屬時,可應用超音波方式進行結合。該凸接點112的材料為錫球時,可應用焊接方式結合。 In this bump connection, the first chip contact 11 is a bump 112 (such as a metal contact or a solder ball) protruding from the lower surface of the first wafer 10 ′, and the circuit board contact 21 It is a flat contact 212 (pad), and the material of the flat contact 212 is the same as that of the convex contact 112 . During packaging, the bumps 112 of the first wafer 10' are bonded to the corresponding flat contacts 212, as shown in FIG. 14 . Therefore, the first wafer 10' is combined with the circuit board group 20', as shown in FIG. 15 . When the material of the bumps 112 is metal, ultrasonic bonding can be used. When the bumps 112 are made of solder balls, they can be combined by soldering.

在本實施例的第三應用例中,在該第一晶片10下表面連接一第二晶片30。該第二晶片30下方有至少一第二晶片接點31。 In the third application example of this embodiment, a second chip 30 is connected to the lower surface of the first chip 10 . There is at least one second chip contact 31 under the second chip 30 .

各該電路板20的上表面形成一第一凹槽23,其中該第一凹槽23槽底的上表面有位置上對應到各該第二晶片30之第二晶片接點31的凹槽接點231。 The upper surface of each of the circuit boards 20 forms a first groove 23, wherein the upper surface of the groove bottom of the first groove 23 has a groove contact corresponding to the second chip contact 31 of each of the second chip 30 in position. Point 231.

因此在封裝時,該第二晶片30係位於該第一凹槽23內側,封裝時該凹槽接點231結合到對應的該第二晶片30之第二晶片接點31上,如圖16所示,因此使得該第二晶片30結合該電路板20,如圖17所示。其中該凹槽接點231結合第二晶片接點31的方式可以是上述之ACF膠球結合或上述之凸接點結合。圖16及圖17係顯示該凹槽接點231與第二晶片接點31的結合方式為ACF膠球結合。 Therefore, when packaging, the second chip 30 is located inside the first groove 23, and the groove contacts 231 are bonded to the corresponding second chip contacts 31 of the second chip 30 during packaging, as shown in Figure 16 As shown, thus making the second wafer 30 combined with the circuit board 20, as shown in FIG. 17 . The method of combining the groove contacts 231 with the second chip contacts 31 may be the above-mentioned ACF rubber ball bonding or the above-mentioned convex contact bonding. FIG. 16 and FIG. 17 show that the bonding method of the groove contact 231 and the second chip contact 31 is ACF rubber ball bonding.

在上列的實施例中,由於在加工時,該電路板組20’與該第一晶片10、該第二晶片30的膨脹係數不同,其中該電路板組20’的膨脹係數會大於該第一晶片10、該第二晶片30的膨脹係數,在上述結合的過程均有高溫處理的 情況,而使得該電路板組20’與該第一晶圓10’脫離,而導致結合失效。 In the above-listed embodiment, since the expansion coefficient of the circuit board assembly 20' is different from that of the first wafer 10 and the second wafer 30 during processing, the expansion coefficient of the circuit board assembly 20' will be greater than that of the first wafer 30. The expansion coefficients of a wafer 10 and the second wafer 30 all have high-temperature treatment in the above-mentioned bonding process. The situation causes the circuit board assembly 20' to separate from the first wafer 10', resulting in bonding failure.

因此本案中可對於上述各應用例,對於該電路板組20’上的某些接點(包含ACF膠球211、平接點212(墊片))較接近該電路板組20’邊緣的一側形成第四凹槽60(如圖12至圖17所示),該第四凹槽60可以是單邊弧形或ㄇ形凹槽,以對於加熱膨脹時,對於該些接點提供膨脹餘裕,因此避免該電路板組20’與該第一晶圓10’脫離。 Therefore, in this case, for each of the above-mentioned application examples, some contacts (including ACF rubber ball 211, flat contact 212 (pad)) on the circuit board set 20' are closer to the edge of the circuit board set 20'. The fourth groove 60 (as shown in Figure 12 to Figure 17) is formed on the side, and the fourth groove 60 can be a single-sided arc or ㄇ-shaped groove, so as to provide expansion margin for these joints during thermal expansion , thus preventing the circuit board assembly 20' from detaching from the first wafer 10'.

另一種吸收膨脹的方式為將該電路板組20’先行切割,再黏貼於一位在下方之膠膜70上進行封裝(如圖18所示),該膠膜70為具有彈性者,可提供膨脹餘裕,以吸收加熱時該電路板組20’的膨脹。 Another way to absorb expansion is to cut the circuit board group 20' first, and then paste it on a lower adhesive film 70 for packaging (as shown in Figure 18). The adhesive film 70 is elastic and can provide The expansion margin is to absorb the expansion of the circuit board set 20' when heated.

如圖19所示,本實施例中在完成該第一晶圓10’與該電路板組20’的結合之後,可以將個別的第一晶片10及其對應的電路板20予以切割成單一單位。 As shown in FIG. 19, in this embodiment, after the combination of the first wafer 10' and the circuit board group 20' is completed, individual first wafers 10 and their corresponding circuit boards 20 can be cut into single units. .

本案的優點為可以使得接點及導線均為內隱藏式者,而不外露,因此可減少封裝結構,所以封裝時整個工時及操作程序均可減少,所以整個製造成本也會跟著降低。 The advantage of this case is that the contacts and wires are all hidden inside without being exposed, so the packaging structure can be reduced, so the entire man-hours and operating procedures during packaging can be reduced, so the entire manufacturing cost will also be reduced.

綜上所述,本案人性化之體貼設計,相當符合實際需求。其具體改進現有缺失,相較於習知技術明顯具有突破性之進步優點,確實具有功效之增進,且非易於達成。本案未曾公開或揭露於國內與國外之文獻與市場上,已符合專利法規定。 To sum up, the humanized and thoughtful design of this case is quite in line with actual needs. Its specific improvement has existing deficiencies, and compared with the prior art, it has the advantage of breakthrough progress, and indeed has the enhancement of efficacy, and it is not easy to achieve. This case has not been published or disclosed in domestic and foreign literature and market, which is in compliance with the provisions of the patent law.

上列詳細說明係針對本發明之一可行實施例之具體說明,惟該實施例並非用以限制本發明之專利範圍,凡未脫離本發明技藝精神所為之等效實施或變更,均應包含於本案之專利範圍中。 The above detailed description is a specific description of a feasible embodiment of the present invention, but this embodiment is not used to limit the patent scope of the present invention, and any equivalent implementation or change that does not depart from the technical spirit of the present invention shall be included in In the patent scope of this case.

10‧‧‧第一晶片 10‧‧‧The first chip

11‧‧‧第一晶片接點 11‧‧‧The first chip contact

20‧‧‧電路板 20‧‧‧circuit board

21‧‧‧電路板接點 21‧‧‧circuit board contacts

25‧‧‧導線 25‧‧‧wire

111‧‧‧平接點 111‧‧‧flat contact

211‧‧‧ACF膠球 211‧‧‧ACF rubber ball

Claims (15)

一種簡易型電路板與晶片之封裝結構,包含:一第一晶片,該第一晶片下方有至少一第一晶片接點;一電路板位在該第一晶片之下方,其中該電路板上方有位置上對應到該第一晶片之第一晶片接點的電路板接點;封裝時該第一晶片接點結合到對應的該電路板之電路板接點上,使得該第一晶片結合該電路板;其中該第一晶片接點結合電路板接點的方式為ACF膠球結合或凸接點結合;其中該ACF膠球結合係為應用ACF膠球為焊接接點與另一方之墊片的結合方式,以將晶片與電路板結合;以及其中該凸接點結合係為應用同材料之凸接點與其他平接點或凸接點,這些接點分別置於電路板與晶片中,並應用物理或化學方法結合該凸接點與其他平接點或凸接點,而使得該電路板與晶片結合的方式;其中該ACF膠球結合中,該第一晶片接點為一平接點,該電路板接點為一ACF膠球,其中該ACF膠球係為在膠體內部散佈眾多金屬導體所形成的軟性膠體,而經壓著之後該金屬導體會互相接觸而使得整個ACF膠球為導體可導通電流;封裝時該ACF膠球經壓著後產生形變而貼附在對應的該第一晶片之第一晶片接點上,使得該第一晶片黏合該電路板;其中該第一晶片下表面連接一第二晶片;該第二晶片下方有至少一第二晶片接點;該電路板的上表面形成一第一凹槽,其中該第一凹槽槽底的上表面有位置上對應到該第二晶片之第二晶片接點的凹槽接點; 在封裝時,該第二晶片係位於該第一凹槽內側,封裝時該凹槽接點結合到對應的該第二晶片之第二晶片接點上,使得該第二晶片結合該電路板;其中該凹槽接點結合第二晶片接點的方式為上述之ACF膠球結合。 A simple circuit board and chip packaging structure, comprising: a first chip, at least one first chip contact is located below the first chip; a circuit board is located below the first chip, wherein the circuit board is above the The position corresponds to the circuit board contact of the first chip contact of the first chip; the first chip contact is bonded to the corresponding circuit board contact of the circuit board during packaging, so that the first chip is combined with the circuit board; wherein the first chip contact is combined with the contact of the circuit board by ACF rubber ball bonding or convex joint bonding; wherein the ACF rubber ball bonding is the use of ACF rubber balls as solder joints and pads of the other party Combining means to combine the chip with the circuit board; and wherein the bump joint is the application of bumps of the same material and other flat contacts or bumps, these contacts are respectively placed in the circuit board and the chip, and Combining the convex contact with other flat contacts or convex contacts by physical or chemical methods, so that the circuit board is combined with the chip; wherein in the ACF glue ball bonding, the first chip contact is a flat contact, The circuit board contact is an ACF rubber ball, wherein the ACF rubber ball is a soft colloid formed by spreading many metal conductors inside the colloid, and after pressing, the metal conductors will contact each other so that the entire ACF rubber ball is a conductor. Current can be conducted; during packaging, the ACF rubber ball is deformed after being pressed and attached to the first chip contact of the corresponding first chip, so that the first chip is bonded to the circuit board; wherein the first chip is under the The surface is connected to a second chip; there is at least one second chip contact under the second chip; a first groove is formed on the upper surface of the circuit board, wherein the upper surface of the bottom of the first groove has positions corresponding to groove contacts of the second chip contacts of the second chip; During packaging, the second chip is located inside the first groove, and the groove contacts are combined with the corresponding second chip contacts of the second chip during packaging, so that the second chip is combined with the circuit board; Wherein the groove contact is combined with the second chip contact by the above-mentioned ACF rubber ball combination. 一種簡易型電路板與晶片之封裝結構,包含:一第一晶片,該第一晶片下方有至少一第一晶片接點;一電路板位在該第一晶片之下方,其中該電路板上方有位置上對應到該第一晶片之第一晶片接點的電路板接點;封裝時該第一晶片接點結合到對應的該電路板之電路板接點上,使得該第一晶片結合該電路板;其中該第一晶片接點結合電路板接點的方式為ACF膠球結合或凸接點結合;其中該ACF膠球結合係為應用ACF膠球為焊接接點與另一方之墊片的結合方式,以將晶片與電路板結合;以及其中該凸接點結合係為應用同材料之凸接點與其他平接點或凸接點,這些接點分別置於電路板與晶片中,並應用物理或化學方法結合該凸接點與其他平接點或凸接點,而使得該電路板與晶片結合的方式;其中該凸接點結合中,該第一晶片接點為一凸出於該第一晶片下表面的凸接點,該電路板接點為一平接點,該平接點的材料同於該凸接點的材料;封裝時該第一晶片的該凸接點結合在對應的該平接點上;使得該第一晶片結合該電路板;其中該第一晶片下表面連接一第二晶片;該第二晶片下方有至少一第二晶片接點;該電路板的上表面形成一第一凹槽,其中該第一凹槽槽底的上表面有 位置上對應到該第二晶片之第二晶片接點的凹槽接點;在封裝時,該第二晶片係位於該第一凹槽內側,封裝時該凹槽接點結合到對應的該第二晶片之第二晶片接點上,使得該第二晶片結合該電路板;其中該凹槽接點結合第二晶片接點的方式為上述之凸接點結合。 A simple circuit board and chip packaging structure, comprising: a first chip, at least one first chip contact is located below the first chip; a circuit board is located below the first chip, wherein the circuit board is above the The position corresponds to the circuit board contact of the first chip contact of the first chip; the first chip contact is bonded to the corresponding circuit board contact of the circuit board during packaging, so that the first chip is combined with the circuit board; wherein the first chip contact is combined with the contact of the circuit board by ACF rubber ball bonding or convex joint bonding; wherein the ACF rubber ball bonding is the use of ACF rubber balls as solder joints and pads of the other party Combining means to combine the chip with the circuit board; and wherein the bump joint is the application of bumps of the same material and other flat contacts or bumps, these contacts are respectively placed in the circuit board and the chip, and Combining the bumps with other flat contacts or bumps by physical or chemical methods to combine the circuit board with the chip; wherein in the bump combination, the first chip contact is a protruding The convex contact on the lower surface of the first chip, the circuit board contact is a flat contact, the material of the flat contact is the same as the material of the convex contact; the convex contact of the first chip is combined in the corresponding on the flat contact; make the first chip combined with the circuit board; wherein the lower surface of the first chip is connected to a second chip; there is at least one second chip contact under the second chip; the upper surface of the circuit board forming a first groove, wherein the upper surface of the bottom of the first groove has The position corresponds to the groove contact of the second chip contact of the second chip; when packaging, the second chip is located inside the first groove, and the groove contact is bonded to the corresponding first groove during packaging. The contacts of the second chip of the two chips are connected so that the second chip is bonded to the circuit board; wherein the way of bonding the groove contacts to the contacts of the second chip is the above-mentioned convex contact bonding. 如申請專利範圍第2項所述之簡易型電路板與晶片之封裝結構,其中當該凸接點的材料為金屬時,係應用超音波方式進行結合。 The packaging structure of simple circuit board and chip as described in item 2 of the scope of the patent application, wherein when the material of the bumps is metal, it is bonded by means of ultrasonic waves. 如申請專利範圍第2項所述之簡易型電路板與晶片之封裝結構,其中當該凸接點的材料為錫球時,係應用焊接方式結合。 The package structure of simple circuit board and chip as described in item 2 of the scope of the patent application, wherein when the material of the bumps is solder balls, it is combined by soldering. 一種簡易型電路板與晶片之封裝結構,包含:一第一晶片,該第一晶片下方有至少一第一晶片接點;一電路板位在該第一晶片之下方,其中該電路板上方有位置上對應到該第一晶片之第一晶片接點的電路板接點;封裝時該第一晶片接點結合到對應的該電路板之電路板接點上,使得該第一晶片結合該電路板;其中該第一晶片接點結合電路板接點的方式為ACF膠球結合或凸接點結合;其中該ACF膠球結合係為應用ACF膠球為焊接接點與另一方之墊片的結合方式,以將晶片與電路板結合;以及其中該凸接點結合係為應用同材料之凸接點與其他平接點或凸接點,這些接點分別置於電路板與晶片中,並應用物理或化學方法結合該凸接點與其他平接點或凸接點,而使得該電路板與晶片結合的方式;其中該ACF膠球結合中,該第一晶片接點為一平接點,該電路板接點為一ACF膠球,其中該ACF膠球係為在膠體內部散佈眾多金屬導體所形成的 軟性膠體,而經壓著之後該金屬導體會互相接觸而使得整個ACF膠球為導體可導通電流;封裝時該ACF膠球經壓著後產生形變而貼附在對應的該第一晶片之第一晶片接點上,使得該第一晶片黏合該電路板;其中該電路板的下表面形成一第二凹槽,其中該第二凹槽槽底的表面安裝有一第三晶片。 A simple circuit board and chip packaging structure, comprising: a first chip, at least one first chip contact is located below the first chip; a circuit board is located below the first chip, wherein the circuit board is above the The position corresponds to the circuit board contact of the first chip contact of the first chip; the first chip contact is bonded to the corresponding circuit board contact of the circuit board during packaging, so that the first chip is combined with the circuit board; wherein the first chip contact is combined with the contact of the circuit board by ACF rubber ball bonding or convex joint bonding; wherein the ACF rubber ball bonding is the use of ACF rubber balls as solder joints and pads of the other party Combining means to combine the chip with the circuit board; and wherein the bump joint is the application of bumps of the same material and other flat contacts or bumps, these contacts are respectively placed in the circuit board and the chip, and Combining the convex contact with other flat contacts or convex contacts by physical or chemical methods, so that the circuit board is combined with the chip; wherein in the ACF glue ball bonding, the first chip contact is a flat contact, The circuit board contact is an ACF rubber ball, wherein the ACF rubber ball is formed by spreading many metal conductors inside the colloid Soft colloid, and after pressing, the metal conductors will contact each other so that the entire ACF rubber ball is a conductor and can conduct current; when packaging, the ACF rubber ball is deformed after being pressed and attached to the corresponding first chip of the first chip A chip contact point, so that the first chip is bonded to the circuit board; wherein a second groove is formed on the lower surface of the circuit board, and a third chip is installed on the bottom surface of the second groove. 如申請專利範圍第5項所述之簡易型電路板與晶片之封裝結構,其中該第三晶片的下表面及該電路板的下表面應用導線及接點連接。 The package structure of a simple circuit board and a chip as described in item 5 of the scope of the patent application, wherein the lower surface of the third chip and the lower surface of the circuit board are connected by wires and contacts. 如申請專利範圍第1項所述之簡易型電路板與晶片之封裝結構,其中該電路板上的接點較接近該電路板邊緣的一側形成第三凹槽,該第三凹槽為單邊弧形或ㄇ形凹槽,以對於加熱膨脹時,對於該接點提供膨脹餘裕,以避免該電路板與該第一晶片、該第二晶片脫離。 The packaging structure of a simple circuit board and a chip as described in item 1 of the patent scope of the application, wherein the contact on the circuit board forms a third groove on the side closer to the edge of the circuit board, and the third groove is a single The arc-shaped or ㄇ-shaped groove is used to provide an expansion margin for the joint during thermal expansion, so as to prevent the circuit board from detaching from the first wafer and the second wafer. 一種簡易型電路板與晶片之封裝結構,包含:一第一晶片,該第一晶片下方有至少一第一晶片接點;一電路板位在該第一晶片之下方,其中該電路板上方有位置上對應到該第一晶片之第一晶片接點的電路板接點;封裝時該第一晶片接點結合到對應的該電路板之電路板接點上,使得該第一晶片結合該電路板;其中該第一晶片接點結合電路板接點的方式為ACF膠球結合或凸接點結合;其中該ACF膠球結合係為應用ACF膠球為焊接接點與另一方之墊片的結合方式,以將晶片與電路板結合;以及其中該凸接點結合係為應用同材料之凸接點與其他平接點或凸接點,這些接點分別置於電路板與晶片中,並應用物理或化學方法結合該凸接點 與其他平接點或凸接點,而使得該電路板與晶片結合的方式;其中該第一晶片接點為一凸出於該第一晶片下方之側端的凸接點,該電路板接點為一凸接點;封裝時該第一晶片的該凸接點透過一導線結合在對應的該電路板接點上;當有數個第一晶片接點及電路板接點時,連接之導線係安裝在一導線基板上,而將該導線基板跨接在該數個第一晶片接點及電路板接點。 A simple circuit board and chip packaging structure, comprising: a first chip, at least one first chip contact is located below the first chip; a circuit board is located below the first chip, wherein the circuit board is above the The position corresponds to the circuit board contact of the first chip contact of the first chip; the first chip contact is bonded to the corresponding circuit board contact of the circuit board during packaging, so that the first chip is combined with the circuit board; wherein the first chip contact is combined with the contact of the circuit board by ACF rubber ball bonding or convex joint bonding; wherein the ACF rubber ball bonding is the use of ACF rubber balls as solder joints and pads of the other party Combining means to combine the chip with the circuit board; and wherein the bump joint is the application of bumps of the same material and other flat contacts or bumps, these contacts are respectively placed in the circuit board and the chip, and Apply physical or chemical methods to bond the bump and other flat contacts or convex contacts, so that the circuit board and the chip are combined; wherein the first chip contact is a convex contact protruding from the side end below the first chip, and the circuit board contact It is a protruding joint; when packaging, the protruding joint of the first chip is combined on the corresponding circuit board contact through a wire; when there are several first chip contacts and circuit board contacts, the connecting wire is It is installed on a lead substrate, and the lead substrate is bridged between the first chip contacts and the circuit board contacts. 一種簡易型電路板與晶片之封裝結構,包含:一第一晶片,該第一晶片下方有至少一第一晶片接點;一電路板位在該第一晶片之下方,其中該電路板上方有位置上對應到該第一晶片之第一晶片接點的電路板接點;封裝時該第一晶片接點結合到對應的該電路板之電路板接點上,使得該第一晶片結合該電路板;其中該第一晶片接點結合電路板接點的方式為ACF膠球結合或凸接點結合;其中該ACF膠球結合係為應用ACF膠球為焊接接點與另一方之墊片的結合方式,以將晶片與電路板結合;以及其中該凸接點結合係為應用同材料之凸接點與其他平接點或凸接點,這些接點分別置於電路板與晶片中,並應用物理或化學方法結合該凸接點與其他平接點或凸接點,而使得該電路板與晶片結合的方式;其中該第一晶片接點為一凸出於該第一晶片下表面之凸接點,然後該第一晶片具有該第一晶片接點的下表面翻轉向上而位在整個組裝結構的上方;該電路板接點為一凸接點;封裝時該第一晶片的該凸接點透過一導線結合在對應的該電路板接點上;當有數個第一晶片接點及電路板接點時, 連接之導線係安裝在一導線基板上,而將該導線基板跨接在該數個第一晶片接點及電路板接點。 A simple circuit board and chip packaging structure, comprising: a first chip, at least one first chip contact is located below the first chip; a circuit board is located below the first chip, wherein the circuit board is above the The position corresponds to the circuit board contact of the first chip contact of the first chip; the first chip contact is bonded to the corresponding circuit board contact of the circuit board during packaging, so that the first chip is combined with the circuit board; wherein the first chip contact is combined with the contact of the circuit board by ACF rubber ball bonding or convex joint bonding; wherein the ACF rubber ball bonding is the use of ACF rubber balls as solder joints and pads of the other party Combining means to combine the chip with the circuit board; and wherein the bump joint is the application of bumps of the same material and other flat contacts or bumps, these contacts are respectively placed in the circuit board and the chip, and Combining the raised contact with other flat contacts or raised contacts by physical or chemical methods, so that the circuit board is combined with the chip; wherein the first chip contact is a protrusion protruding from the lower surface of the first chip Protruding joint, then the lower surface of the first chip with the first chip contact is turned upwards and positioned above the entire assembly structure; the circuit board contact is a protruding joint; the protruding joint of the first chip is packaged The contact is combined on the corresponding circuit board contact through a wire; when there are several first chip contacts and circuit board contacts, The connected wires are installed on a wire substrate, and the wire substrate is bridged between the first chip contacts and the circuit board contacts. 一種簡易型電路板與晶片之封裝結構,包含:一第一晶圓,該第一晶圓包含多個第一晶片,各該第一晶片下方有至少一第一晶片接點;一電路板組位在該第一晶圓之下方,該電路板組包含數量對應該多個第一晶片的多個電路板,其中各該電路板上方有位置上對應到該第一晶圓之各該第一晶片之第一晶片接點的電路板接點;封裝時該第一晶片接點結合到對應的該電路板組之電路板接點上,使得該第一晶圓結合該電路板組;其中該第一晶片接點結合電路板接點的方式為ACF膠球結合或凸接點結合;其中該ACF膠球結合係為應用ACF膠球為焊接接點與另一方之墊片的結合方式,以將晶圓與電路板組結合;其中該凸接點結合係為應用同材料之凸接點與平接點分別置於電路板組與晶圓中,並應用物理或化學方法結合該凸接點與平接點,而使得該電路板組與晶圓結合的方式;其中該ACF膠球結合中,該第一晶片接點為一平接點,該電路板接點為一ACF膠球;封裝時該ACF膠球經壓著後產生形變而貼附在對應的該第一晶圓之第一晶片接點上,使得該第一晶圓黏合該電路板組;其中該第一晶片下表面連接一第二晶片;該第二晶片下方有至少一第二晶片接點;各該電路板的上表面形成一第一凹槽,其中該第一凹槽槽底的上表面 有位置上對應到各該第二晶片之第二晶片接點的凹槽接點;在封裝時,該第二晶片係位於該第一凹槽內側,封裝時該凹槽接點結合到對應的該第二晶片之第二晶片接點上,使得該第二晶片結合該電路板;其中該凹槽接點結合第二晶片接點的方式為上述之ACF膠球結合。 A simple circuit board and chip packaging structure, comprising: a first wafer, the first wafer includes a plurality of first chips, each of the first chips has at least one first chip contact; a circuit board group Positioned below the first wafer, the circuit board group includes a plurality of circuit boards corresponding in number to the plurality of first chips, wherein each of the circuit boards has a position corresponding to each of the first wafers above the first wafer. The circuit board contact of the first chip contact of the chip; during packaging, the first chip contact is combined with the corresponding circuit board contact of the circuit board group, so that the first wafer is combined with the circuit board group; wherein the The way that the first chip contact is combined with the circuit board contact is ACF rubber ball bonding or convex contact bonding; wherein the ACF rubber ball bonding system is the combination of using ACF rubber balls as the welding joint and the gasket of the other party, with Combining the wafer with the circuit board group; wherein the bump joint is used to place the bump contact and the flat contact of the same material in the circuit board group and the wafer respectively, and use physical or chemical methods to combine the bump contact and the flat contact, so that the circuit board group is combined with the wafer; wherein in the combination of the ACF rubber ball, the first wafer contact is a flat contact, and the circuit board contact is an ACF rubber ball; when packaging The ACF rubber ball is deformed after being pressed and attached to the corresponding first wafer contact of the first wafer, so that the first wafer is bonded to the circuit board group; wherein the lower surface of the first wafer is connected to a The second chip; there is at least one second chip contact under the second chip; a first groove is formed on the upper surface of each circuit board, wherein the upper surface of the groove bottom of the first groove There are groove contacts corresponding to the second chip contacts of each of the second chips in position; when packaging, the second chip is located inside the first groove, and the groove contacts are bonded to the corresponding On the second chip contacts of the second chip, the second chip is bonded to the circuit board; wherein the groove contacts are bonded to the second chip contacts by the above-mentioned ACF rubber ball bonding. 一種簡易型電路板與晶片之封裝結構,包含:一第一晶圓,該第一晶圓包含多個第一晶片,各該第一晶片下方有至少一第一晶片接點;一電路板組位在該第一晶圓之下方,該電路板組包含數量對應該多個第一晶片的多個電路板,其中各該電路板上方有位置上對應到該第一晶圓之各該第一晶片之第一晶片接點的電路板接點;封裝時該第一晶片接點結合到對應的該電路板組之電路板接點上,使得該第一晶圓結合該電路板組;其中該第一晶片接點結合電路板接點的方式為ACF膠球結合或凸接點結合;其中該ACF膠球結合係為應用ACF膠球為焊接接點與另一方之墊片的結合方式,以將晶圓與電路板組結合;其中該凸接點結合係為應用同材料之凸接點與平接點分別置於電路板組與晶圓中,並應用物理或化學方法結合該凸接點與平接點,而使得該電路板組與晶圓結合的方式;其中該凸接點結合中,該第一晶片接點為一凸出於該第一晶圓下表面的凸接點,該電路板接點為一平接點,該平接點的材料同於該凸接點的材料;封裝時該第一晶圓的該凸接點結合在對應的該平接點上,使得該第一晶圓結合該電路板組; 其中該第一晶片下表面連接一第二晶片;該第二晶片下方有至少一第二晶片接點;各該電路板的上表面形成一第一凹槽,其中該第一凹槽槽底的上表面有位置上對應到各該第二晶片之第二晶片接點的凹槽接點;在封裝時,該第二晶片係位於該第一凹槽內側,封裝時該凹槽接點結合到對應的該第二晶片之第二晶片接點上,使得該第二晶片結合該電路板;其中該凹槽接點結合第二晶片接點的方式為上述之凸接點結合。 A simple circuit board and chip packaging structure, comprising: a first wafer, the first wafer includes a plurality of first chips, each of the first chips has at least one first chip contact; a circuit board group Positioned below the first wafer, the circuit board group includes a plurality of circuit boards corresponding in number to the plurality of first chips, wherein each of the circuit boards has a position corresponding to each of the first wafers above the first wafer. The circuit board contact of the first chip contact of the chip; during packaging, the first chip contact is combined with the corresponding circuit board contact of the circuit board group, so that the first wafer is combined with the circuit board group; wherein the The way that the first chip contact is combined with the circuit board contact is ACF rubber ball bonding or convex contact bonding; wherein the ACF rubber ball bonding system is the combination of using ACF rubber balls as the welding joint and the gasket of the other party, with Combining the wafer with the circuit board group; wherein the bump joint is used to place the bump contact and the flat contact of the same material in the circuit board group and the wafer respectively, and use physical or chemical methods to combine the bump contact and flat contacts, so that the circuit board group is combined with the wafer; wherein in the combination of the bumps, the first wafer contact is a bump protruding from the lower surface of the first wafer, the The circuit board contact is a flat contact, and the material of the flat contact is the same as that of the convex contact; the convex contact of the first wafer is combined on the corresponding flat contact during packaging, so that the first The wafer is bonded to the circuit board set; Wherein the lower surface of the first chip is connected to a second chip; there is at least one second chip contact under the second chip; a first groove is formed on the upper surface of each of the circuit boards, wherein the groove bottom of the first groove The upper surface has groove contacts corresponding to the second chip contacts of each of the second chips in position; when packaging, the second chip is located inside the first groove, and the groove contacts are bonded to the first groove during packaging. Corresponding to the second chip contact of the second chip, the second chip is combined with the circuit board; wherein the groove contact is combined with the second chip contact by the above-mentioned convex contact combination. 如申請專利範圍第11項所述之簡易型電路板與晶片之封裝結構,其中當該凸接點的材料為金屬時,係應用超音波方式進行結合。 The package structure of the simple circuit board and the chip as described in item 11 of the scope of the patent application, wherein when the material of the bumps is metal, it is bonded by means of ultrasonic waves. 如申請專利範圍第11項所述之簡易型電路板與晶片之封裝結構,其中當該凸接點的材料為錫球時,係應用焊接方式結合。 The package structure of a simple circuit board and a chip as described in item 11 of the scope of the patent application, wherein when the material of the bump is a solder ball, it is combined by soldering. 如申請專利範圍第10項所述之簡易型電路板與晶片之封裝結構,其中該電路板組上的接點較接近該電路板組邊緣的一側形成第四凹槽,該第四凹槽為單邊弧形或ㄇ形凹槽,以對於加熱膨脹時,對於該接點提供膨脹餘裕,以避免該電路板組與該第一晶圓脫離。 The packaging structure of a simple circuit board and chip as described in item 10 of the scope of the patent application, wherein the contacts on the circuit board group form a fourth groove on the side closer to the edge of the circuit board group, and the fourth groove The single-side arc-shaped or ㄇ-shaped groove is used to provide expansion margin for the joint during thermal expansion, so as to prevent the circuit board group from detaching from the first wafer. 如申請專利範圍第10項所述之簡易型電路板與晶片之封裝結構,其中該電路板組係先行切割,再黏貼於一位在下方之膠膜上進行封裝,該膠膜為具有彈性者,用以提供膨脹餘裕,以吸收加熱時該電路板組的膨脹。 The simple circuit board and chip packaging structure described in item 10 of the scope of the patent application, wherein the circuit board assembly is cut first, and then pasted on a lower adhesive film for packaging, and the adhesive film is elastic , to provide expansion margin to absorb the expansion of the circuit board group when heated.
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Citations (4)

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Publication number Priority date Publication date Assignee Title
TW200849527A (en) * 2007-04-12 2008-12-16 Megica Corp Chip package
TWI550825B (en) * 2014-12-05 2016-09-21 財團法人工業技術研究院 Package structure for light emitting devices
TWI606565B (en) * 2016-08-31 2017-11-21 金寶電子工業股份有限公司 Package structure and manufacturing method thereof
US20180211934A1 (en) * 2015-10-13 2018-07-26 Murata Manufacturing Co., Ltd. Resin substrate, component-mounted resin substrate, method of manufacturing resin substrate, and method of manufacturing component-mounted resin substrate

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW200849527A (en) * 2007-04-12 2008-12-16 Megica Corp Chip package
TWI550825B (en) * 2014-12-05 2016-09-21 財團法人工業技術研究院 Package structure for light emitting devices
US20180211934A1 (en) * 2015-10-13 2018-07-26 Murata Manufacturing Co., Ltd. Resin substrate, component-mounted resin substrate, method of manufacturing resin substrate, and method of manufacturing component-mounted resin substrate
TWI606565B (en) * 2016-08-31 2017-11-21 金寶電子工業股份有限公司 Package structure and manufacturing method thereof

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