TWI796103B - Inspection device, resin molding device, cutting device, method of manufacturing resin molded product, and method of manufacturing cut product - Google Patents

Inspection device, resin molding device, cutting device, method of manufacturing resin molded product, and method of manufacturing cut product Download PDF

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TWI796103B
TWI796103B TW111102350A TW111102350A TWI796103B TW I796103 B TWI796103 B TW I796103B TW 111102350 A TW111102350 A TW 111102350A TW 111102350 A TW111102350 A TW 111102350A TW I796103 B TWI796103 B TW I796103B
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aforementioned
plate
half mirror
inspection device
inspection
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TW202231409A (en
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尾關貴俊
水田彩香
金山雄斗
陳沿佑
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日商Towa股份有限公司
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8806Specially adapted optical and illumination features
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N2021/8411Application to online plant, process monitoring
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8806Specially adapted optical and illumination features
    • G01N2021/8809Adjustment for highlighting flaws
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8806Specially adapted optical and illumination features
    • G01N2021/8812Diffuse illumination, e.g. "sky"
    • G01N2021/8816Diffuse illumination, e.g. "sky" by using multiple sources, e.g. LEDs
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/06Illumination; Optics
    • G01N2201/061Sources
    • G01N2201/06146Multisources for homogeneisation, as well sequential as simultaneous operation
    • G01N2201/06153Multisources for homogeneisation, as well sequential as simultaneous operation the sources being LED's
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/06Illumination; Optics
    • G01N2201/063Illuminating optical parts
    • G01N2201/0636Reflectors

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  • Analytical Chemistry (AREA)
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  • Chemical & Material Sciences (AREA)
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  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Signal Processing (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Processing And Handling Of Plastics And Other Materials For Molding In General (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Sampling And Sample Adjustment (AREA)

Abstract

本發明所欲解決的問題在於提供一種檢查裝置、樹脂成形裝置、切斷裝置、樹脂成形品的製造方法、及切斷品的製造方法,可抑制照射到檢查對象物的光的偏移。 為了解決此問題,本發明的檢查裝置,具備相機、及同軸照明。同軸照明,包含半反射鏡、光源部、板狀構件、及調整部。半反射鏡,配置在連結檢查對象物與相機的觀察軸上,且相對於觀察軸傾斜。光源部,構成為自與觀察軸不同的方向朝向半反射鏡發光。由光源部發出的光在半反射鏡反射並照射到檢查對象物。板狀構件,配置在光源部與半反射鏡之間。在板狀構件中形成有複數個狹縫,該些狹縫互相大致平行。調整部,構成為調整板狀構件的配置。 The problem to be solved by the present invention is to provide an inspection device, a resin molding device, a cutting device, a method of manufacturing a resin molded product, and a method of manufacturing a cut product, which can suppress deviation of light irradiated to an inspection object. In order to solve this problem, the inspection device of the present invention includes a camera and coaxial lighting. Coaxial lighting includes a half mirror, a light source unit, a plate member, and an adjustment unit. The half mirror is arranged on the observation axis connecting the inspection object and the camera, and is inclined with respect to the observation axis. The light source unit is configured to emit light toward the half mirror from a direction different from the observation axis. The light emitted from the light source unit is reflected by the half mirror to irradiate the inspection object. The plate-shaped member is disposed between the light source unit and the half mirror. A plurality of slits are formed in the plate member, and the slits are substantially parallel to each other. The adjustment unit is configured to adjust the arrangement of the plate-shaped member.

Description

檢查裝置、樹脂成形裝置、切斷裝置、樹脂成形品的製造方法、及切斷品的製造方法Inspection device, resin molding device, cutting device, manufacturing method of resin molded product, and manufacturing method of cut product

本發明關於一種檢查裝置、樹脂成形裝置、切斷裝置、樹脂成形品的製造方法、及切斷品的製造方法。The present invention relates to an inspection device, a resin molding device, a cutting device, a method for manufacturing a resin molded product, and a method for manufacturing a cut product.

日本特開2017-187296號公報(專利文獻1),揭露一種同軸照明裝置。此同軸照明裝置,具備半反射鏡、及將光照射到半反射鏡之光源部。半反射鏡,配置在連結觀察對象也就是工件與相機等觀察部的觀察軸上,且相對於該觀察軸傾斜。自光源部射出的光,在半反射鏡反射並照射到工件(參照專利文獻1)。Japanese Patent Application Publication No. 2017-187296 (Patent Document 1) discloses a coaxial lighting device. This coaxial lighting device includes a half mirror and a light source unit that irradiates light onto the half mirror. The half mirror is arranged on an observation axis connecting the object of observation, that is, the workpiece, and an observation unit such as a camera, and is inclined with respect to the observation axis. The light emitted from the light source unit is reflected by the half mirror to irradiate the workpiece (see Patent Document 1).

[先前技術文獻] (專利文獻) 專利文獻1:日本特開2017-187296號公報 [Prior Art Literature] (patent documents) Patent Document 1: Japanese Patent Laid-Open No. 2017-187296

[發明所欲解決的問題] 如上述專利文獻1揭露的同軸照明裝置中,為了使照射到觀察對象上的光盡量均勻,所以希望入射到半反射鏡的光的角度是規定角度。為了調整光對於半反射鏡的入射角度,考慮在光源部與半反射鏡之間配置板狀構件的方法,在該板狀構件中形成有複數個狹縫,該些狹縫互相平行。然而,即便採用這種方法,根據在該板狀構件中形成的狹縫的精度,也可能造成多數的光對於半反射鏡的入射角度不能夠成為規定角度。其結果,照射到觀察對象(檢查對象)的光的偏移變大。 [Problem to be solved by the invention] In the coaxial illuminating device disclosed in Patent Document 1, in order to make the light irradiated on the observation object as uniform as possible, it is desirable that the angle of the light incident on the half mirror is a predetermined angle. In order to adjust the incident angle of light on the half mirror, a method may be considered in which a plate-shaped member is formed with a plurality of slits parallel to each other between the light source unit and the half mirror. However, even with this method, depending on the precision of the slits formed in the plate-like member, the incident angle of most light to the half mirror may not be at a predetermined angle. As a result, the deviation of light irradiated to the observation object (inspection object) becomes large.

本發明為了解決這種問題而完成,其目的是提供一種檢查裝置、樹脂成形裝置、切斷裝置、樹脂成形品的製造方法、及切斷品的製造方法,可抑制照射到檢查對象的光的偏移。The present invention was made to solve such problems, and its object is to provide an inspection device, a resin molding device, a cutting device, a method of manufacturing a resin molded product, and a method of manufacturing a cut product, which can suppress the light irradiated to the inspection object. offset.

[解決問題的技術手段] 依照本發明的一局面的檢查裝置,具備相機、及同軸照明。相機,構成為對於檢查對象物進行攝像。同軸照明,構成為將光照射到檢查對象物。同軸照明,包含半反射鏡、光源部、板狀構件、及調整部。半反射鏡,配置在連結檢查對象物與相機的觀察軸上,且相對於觀察軸傾斜。光源部,構成為自與觀察軸不同的方向朝向半反射鏡發光。由光源部發出的光在半反射鏡反射並照射到檢查對象物。板狀構件,配置在光源部與半反射鏡之間。在板狀構件中形成有複數個狹縫,該些狹縫互相大致平行。調整部,構成為調整板狀構件的配置。 [Technical means to solve the problem] An inspection device according to an aspect of the present invention includes a camera and coaxial lighting. The camera is configured to take an image of the inspection object. The coaxial illumination is configured to irradiate light onto the object to be inspected. Coaxial lighting includes a half mirror, a light source unit, a plate member, and an adjustment unit. The half mirror is arranged on the observation axis connecting the inspection object and the camera, and is inclined with respect to the observation axis. The light source unit is configured to emit light toward the half mirror from a direction different from the observation axis. The light emitted from the light source unit is reflected by the half mirror to irradiate the inspection object. The plate-shaped member is disposed between the light source unit and the half mirror. A plurality of slits are formed in the plate member, and the slits are substantially parallel to each other. The adjustment unit is configured to adjust the arrangement of the plate-shaped member.

依照本發明的其他局面的樹脂成形裝置,具備:樹脂成形機構,構成為製造樹脂成形品;及,上述檢查裝置。A resin molding device according to another aspect of the present invention includes: a resin molding mechanism configured to manufacture a resin molded product; and the above-mentioned inspection device.

依照本發明的其他局面的切斷裝置,具備:切斷機構,構成為藉由將切斷對象物加以切斷來製造切斷品;及,檢查裝置。A cutting device according to another aspect of the present invention includes: a cutting mechanism configured to manufacture a cut product by cutting an object to be cut; and an inspection device.

依照本發明的其他局面的樹脂成形品的製造方法,具備下述步驟:製造樹脂成形品;及,使用上述檢查裝置來對檢查對象物進行檢查。檢查對象物,包含樹脂成形品。A method of manufacturing a resin molded article according to another aspect of the present invention includes the steps of: manufacturing a resin molded article; and inspecting an inspection object using the inspection device described above. Objects to be inspected include resin molded products.

依照本發明的其他局面的切斷品的製造方法,具備下述步驟:藉由將切斷對象物加以切斷來製造切斷品;及,使用上述檢查裝置來對檢查對象物進行檢查。檢查對象物,包含切斷對象物或前述切斷品。A method of manufacturing a cut product according to another aspect of the present invention includes the steps of: manufacturing a cut product by cutting an object to be cut; and inspecting the object to be inspected using the inspection device described above. The object to be inspected includes the object to be cut or the aforementioned cut-off product.

[發明的效果] 依據本發明,能夠提供一種檢查裝置、樹脂成形裝置、切斷裝置、樹脂成形品的製造方法、及切斷品的製造方法,可抑制照射到檢查對象的光的偏移。 [Effect of the invention] According to the present invention, it is possible to provide an inspection device, a resin molding device, a cutting device, a method of manufacturing a resin molded product, and a method of manufacturing a cut product in which deviation of light irradiated to an inspection object can be suppressed.

以下,參照圖式,並且詳細地說明本發明的實施形態。另外,對於圖中相同或相當部分賦予相同符號並且不重複其說明。Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings. In addition, the same code|symbol is attached|subjected to the same or a corresponding part in a figure, and the description is not repeated.

[1.概要] 第1圖是示意地表示依照本實施形態的檢查裝置10的圖。關於檢查裝置10中包含的同軸照明100,在第1圖中表示其剖面。箭頭UDFBLR的各者表示的方向,在各圖示中是共通的。 [1. Summary] Fig. 1 is a diagram schematically showing an inspection device 10 according to the present embodiment. A cross section of the coaxial illuminator 100 included in the inspection device 10 is shown in FIG. 1 . The directions indicated by each of the arrows UDFBLR are common to all drawings.

如第1圖所示,檢查裝置10,包含同軸照明100、及相機200。同軸照明100,是配置在相機200與檢查對象物300之間。同軸照明100,構成為自檢查對象物300的上方將光往檢查對象物300照射。相機200,構成為自檢查對象物300的上方對於照射到光的狀態的檢查對象物300進行攝像。在檢查裝置10中,基於相機200所攝像的畫像來檢查檢查對象物300的表面的狀態。As shown in FIG. 1 , the inspection device 10 includes a coaxial illuminator 100 and a camera 200 . The coaxial illuminator 100 is disposed between the camera 200 and the inspection object 300 . The coaxial illuminator 100 is configured to irradiate the inspection object 300 with light from above the inspection object 300 . The camera 200 is configured to take an image of the inspection object 300 irradiated with light from above the inspection object 300 . In the inspection device 10 , the state of the surface of the inspection target object 300 is inspected based on the image captured by the camera 200 .

檢查對象物300,例如是連接了電子元件之樹脂成形前的基板、或將連接了電子元件之基板加以樹脂成形後的封裝基板等。作為封裝基板的一例,舉例有BGA(Ball Grid Array,球柵陣列)封裝基板、LGA(Land Grid Array,接點柵格陣列)封裝基板、CSP(Chip Size Package,晶片尺寸封裝)封裝基板、LED(Light Emitting Diode,發光二極體)封裝基板、QFN(Quad Flat No-leaded,方形扁平無引腳)封裝基板。The inspection object 300 is, for example, a substrate before resin molding to which electronic components are connected, or a package substrate after resin molding of a substrate to which electronic components are connected, or the like. As an example of the package substrate, there are BGA (Ball Grid Array, ball grid array) package substrate, LGA (Land Grid Array, land grid array) package substrate, CSP (Chip Size Package, chip size package) package substrate, LED (Light Emitting Diode, light-emitting diode) package substrate, QFN (Quad Flat No-leaded, square flat no lead) package substrate.

同軸照明100,包含光源部125、板狀構件140、半反射鏡150、及框體110。光源部125,包含基板121、LED120、及擴散板130。基板121的形狀大致是矩形狀,在基板121上構裝有複數個LED120。基板121,配置為與相機200的觀察軸C1大致平行。複數個LED120,構成為各自朝向半反射鏡150發光。The coaxial lighting 100 includes a light source unit 125 , a plate member 140 , a half mirror 150 , and a frame 110 . The light source unit 125 includes a substrate 121 , LEDs 120 , and a diffusion plate 130 . The shape of the substrate 121 is substantially rectangular, and a plurality of LEDs 120 are mounted on the substrate 121 . The substrate 121 is arranged substantially parallel to the observation axis C1 of the camera 200 . The plurality of LEDs 120 are each configured to emit light toward the half mirror 150 .

擴散板130,是毛玻璃狀的薄板,且配置在LED120與板狀構件140之間。擴散板130的形狀大致是矩形狀。擴散板130,配置為與相機200的觀察軸C1大致平行。由LED120發出的光在擴散板130擴散。亦即,光源部125,使由LED120發出的光在擴散板130擴散,藉此進行面發光。The diffuser plate 130 is a thin plate of frosted glass, and is disposed between the LEDs 120 and the plate-shaped member 140 . The shape of the diffusion plate 130 is substantially rectangular. The diffusion plate 130 is arranged substantially parallel to the observation axis C1 of the camera 200 . Light emitted from LED 120 is diffused by diffusion plate 130 . That is, the light source unit 125 diffuses the light emitted by the LED 120 through the diffuser plate 130 to perform surface emission.

板狀構件140,是配置在光源部125與半反射鏡150之間。板狀構件140的形狀大致是矩形狀。板狀構件140,配置為與相機200的觀察軸C1大致平行。在板狀構件140中形成有複數個狹縫(louver,遮光格柵)142,該些狹縫142互相大致平行。板狀構件140,構成為抑制由光源部125發出的光的擴散並提升光的平行度。作為板狀構件140,例如能夠適用光控制薄膜(Light Control Film)。The plate member 140 is disposed between the light source unit 125 and the half mirror 150 . The shape of the plate member 140 is substantially rectangular. The plate-shaped member 140 is arranged substantially parallel to the observation axis C1 of the camera 200 . A plurality of slits (louver, light-shielding grille) 142 are formed in the plate member 140, and the slits 142 are substantially parallel to each other. The plate-shaped member 140 is configured to suppress the diffusion of the light emitted from the light source unit 125 and to increase the parallelism of the light. As the plate-shaped member 140, for example, a light control film (Light Control Film) can be applied.

半反射鏡150是配置在相機200的觀察軸C1上。半反射鏡150的反射面,在框體110的內部,相對於觀察軸C1傾斜。半反射鏡150的反射面,例如相對於觀察軸C1大致是傾斜45度。半反射鏡150,例如是以表面塗覆有介電質多層膜或金屬薄膜等的玻璃板來構成。半反射鏡150,例如構成為對於入射角為45度的光,反射率大致成為50%且透過率大致成為50%。The half mirror 150 is arranged on the observation axis C1 of the camera 200 . The reflection surface of the half mirror 150 is inclined with respect to the observation axis C1 inside the housing 110 . The reflection surface of the half mirror 150 is, for example, inclined approximately 45 degrees with respect to the observation axis C1. The half mirror 150 is made of, for example, a glass plate whose surface is coated with a dielectric multilayer film, a metal thin film, or the like. The half mirror 150 is configured to have a reflectance of approximately 50% and a transmittance of approximately 50% for light having an incident angle of 45 degrees, for example.

框體110,在內部收容有光源部125、板狀構件140及半反射鏡150等。框體110,例如是以鋁合金等來構成。框體110的形狀,例如是長方體狀。框體110的內壁面之中,例如在半反射鏡150與板狀構件140之間的區域構成為鏡面。在框體110中,為了以相機200來觀察檢查對象物300,所以例如在相機200側的一面上形成有以玻璃來構成的窗(未圖示)。又,在框體110中,在檢查對象物300側的一面上形成有用以供光射出的光射出口(未圖示)。The housing 110 accommodates the light source unit 125, the plate member 140, the half mirror 150, and the like inside. The frame body 110 is made of, for example, an aluminum alloy or the like. The shape of the housing 110 is, for example, a rectangular parallelepiped. Among the inner wall surfaces of the housing 110 , for example, a region between the half mirror 150 and the plate member 140 is configured as a mirror surface. In the housing 110 , in order to observe the inspection object 300 with the camera 200 , for example, a window (not shown) made of glass is formed on one surface on the side of the camera 200 . In addition, in the housing 110, a light emitting port (not shown) for emitting light is formed on one surface on the inspection object 300 side.

通過了板狀構件140的光,大多朝向相對於板狀構件140大致垂直的方向,藉此將在半反射鏡150反射的光大致均勻地照射到檢查對象物300的整體上。亦即,當通過了板狀構件140的光,大多相對於板狀構件140成為大致垂直時,不易產生照射到檢查對象物300的每個區域中的光的強度差異大的事態。Most of the light passing through the plate-like member 140 is directed in a direction substantially perpendicular to the plate-like member 140 , whereby the light reflected by the half mirror 150 is irradiated substantially uniformly on the entire object 300 to be inspected. That is, when the light passing through the plate-shaped member 140 is mostly perpendicular to the plate-shaped member 140 , it is unlikely that the intensity of the light irradiated to each region of the inspection object 300 varies greatly.

[2.板狀構件導致的可能產生的問題點] 在箭頭FB方向中,當各狹縫142相對於板狀構件140的一面往大致垂直的方向延伸,且該面為板狀構件140的各面之中的與擴散板130對向的一面時,通過了板狀構件140的光,大多朝向相對於板狀構件140大致垂直的方向。然而,在板狀構件140的生產時,不易控制板狀構件140內的各狹縫142的延伸方向。 [2. Possible problems caused by plate-shaped members] In the direction of arrow FB, when each slit 142 extends in a direction substantially perpendicular to one side of the plate-like member 140, and this side is the side facing the diffusion plate 130 among the sides of the plate-like member 140, Most of the light passing through the plate-like member 140 is directed in a direction substantially perpendicular to the plate-like member 140 . However, it is not easy to control the extending direction of each slit 142 in the plate-shaped member 140 at the time of production of the plate-shaped member 140 .

第2圖是用以說明因為在板狀構件140內的各狹縫142比預想更傾斜而產生的問題點的圖。第2圖中,為了容易理解而誇張地表示狹縫142的傾斜。如第2圖所示,此板狀構件140中,各狹縫142相對於板狀構件140的一面沒有往大致垂直的方向延伸,且該面為板狀構件140的各面之中的與擴散板130對向的一面。因此,通過了板狀構件140的光,大多沒有相對於板狀構件140成為大致垂直。其結果,在半反射鏡150反射的光沒有大致均勻地照射到檢查對象物300的整體上。此例中,檢查對象物300的上面之中,相較於靠近箭頭B方向的區域,靠近箭頭F方向的區域的一方照射到更強的光。這樣一來,照射到檢查對象物300的光偏移,而造成在檢查裝置10中,檢查對象物300的表面狀態的檢查精度降低。FIG. 2 is a diagram for explaining problems caused by the slits 142 in the plate-shaped member 140 being inclined more than expected. In FIG. 2, the inclination of the slit 142 is exaggerated for easy understanding. As shown in FIG. 2, in this plate-shaped member 140, each slit 142 does not extend in a substantially perpendicular direction with respect to one side of the plate-shaped member 140, and this surface is one of the surfaces of the plate-shaped member 140 that is compatible with the diffuser. The opposite side of the plate 130. Therefore, the light passing through the plate-shaped member 140 is often not substantially perpendicular to the plate-shaped member 140 . As a result, the light reflected by the half mirror 150 does not irradiate the entire object 300 to be inspected substantially uniformly. In this example, among the upper surfaces of the inspection target object 300 , the area closer to the arrow F direction is irradiated with stronger light than the area closer to the arrow B direction. In this way, the light irradiated on the inspection target object 300 deviates, and the inspection accuracy of the surface state of the inspection target object 300 decreases in the inspection device 10 .

為了抑制這種問題,在檢查裝置10中的構成上實施巧思。以下,詳細說明檢查裝置10的構成。In order to suppress such a problem, ingenuity has been devised in the configuration of the inspection device 10 . Hereinafter, the configuration of the inspection device 10 will be described in detail.

[3.檢查裝置的構成] 第3圖是示意地表示同軸照明100的上面的圖。第4圖是示意地表示同軸照明100的正面的圖。第5圖是示意地表示沿第3圖的V-V線的剖面圖。另外,為了容易說明,在各圖中,以透過了內部的狀態來表示同軸照明100的一部分。 [3. Configuration of inspection device] FIG. 3 is a diagram schematically showing the upper surface of the coaxial lighting 100 . FIG. 4 is a diagram schematically showing the front of the coaxial lighting 100 . Fig. 5 is a schematic cross-sectional view taken along line V-V in Fig. 3 . In addition, for ease of description, in each figure, a part of the coaxial illuminator 100 is shown in a state of seeing through the inside.

參照第3圖、第4圖及第5圖,在同軸照明100中,在箭頭LR方向的各個端部設置有調整部160。調整部160,構成為調整板狀構件140的配置。具體來說,調整部160,可調整板狀構件140在箭頭FB方向上的位置,並且以在箭頭LR方向上延伸的軸(後述的軸構件166)作為旋轉中心而可調整板狀構件140的旋轉角度。亦即,調整部160,包含「位置調整部」來調整板狀構件140的位置、及「角度調整機構」來調整板狀構件140的旋轉角度。Referring to FIG. 3 , FIG. 4 , and FIG. 5 , in the coaxial lighting 100 , an adjustment unit 160 is provided at each end in the arrow LR direction. The adjustment unit 160 is configured to adjust the arrangement of the plate-shaped member 140 . Specifically, the adjustment unit 160 can adjust the position of the plate-shaped member 140 in the direction of the arrow FB, and can adjust the position of the plate-shaped member 140 with an axis (shaft member 166 described later) that extends in the direction of the arrow LR as the center of rotation. Rotation angle. That is, the adjustment unit 160 includes a “position adjustment unit” for adjusting the position of the plate-shaped member 140 and an “angle adjustment mechanism” for adjusting the rotation angle of the plate-shaped member 140 .

調整部160,包含夾持器163、支持構件170(第5圖)、移動構件161、操作構件162、軸構件166、止動件169(第5圖)、及遮光蓋167。在調整部160中包含的各構件,是金屬製或樹脂製。又,在調整部160中包含的各構件的顏色,較佳為黑色。這是為了減低進入了調整部160內的光進行漫射而對於照射到檢查對象物300的光帶來不良影響的可能性。The adjustment unit 160 includes a holder 163 , a supporting member 170 ( FIG. 5 ), a moving member 161 , an operating member 162 , a shaft member 166 , a stopper 169 ( FIG. 5 ), and a light shielding cover 167 . Each member included in the adjustment unit 160 is made of metal or resin. Also, the color of each member included in the adjustment unit 160 is preferably black. This is to reduce the possibility that the light entering the adjustment unit 160 will diffuse and adversely affect the light irradiated on the inspection object 300 .

上述位置調整部包含移動構件161,該移動構件構成為使板狀構件140在光源部125與半反射鏡150之間進行直線移動。又,上述角度調整機構,主要包含夾持器163、軸構件166、及止動件169,該夾持器構成為保持板狀構件140,該軸構件166成為夾持器163的旋轉軸,該止動件169構成為使軸構件166的旋轉停止。又,角度調整機構,包含支持構件170,其支持軸構件166並且一起安裝於在移動構件161上。支持構件170,包含支持構件本體部165和連結部164,該支持構件本體部165是安裝在移動構件161上,該連結部164連結支持構件本體部165中的移動構件161的附近與夾持器163。在支持構件本體部165和連結部164,分別地形成有貫穿孔,以供軸構件166貫穿。The position adjustment unit includes a moving member 161 configured to linearly move the plate-like member 140 between the light source unit 125 and the half mirror 150 . Also, the above-mentioned angle adjustment mechanism mainly includes a clamper 163, a shaft member 166, and a stopper 169. The clamper is configured to hold the plate-shaped member 140, and the shaft member 166 becomes a rotating shaft of the clamper 163. The stopper 169 is configured to stop the rotation of the shaft member 166 . In addition, the angle adjustment mechanism includes a supporting member 170 that supports the shaft member 166 and is mounted on the moving member 161 together. The supporting member 170 includes a supporting member body portion 165 and a connecting portion 164, the supporting member body portion 165 is installed on the moving member 161, and the connecting portion 164 connects the vicinity of the moving member 161 in the supporting member body portion 165 and the holder 163. Through holes through which the shaft member 166 penetrates are respectively formed in the support member main body portion 165 and the connection portion 164 .

夾持器163,構成為夾住板狀構件140,藉此保持板狀構件140。夾持器163是連接於支持構件170。支持構件170,包含大致是S字狀的連結部164、方塊狀的支持構件本體部165、及軸構件保持部168。連結部164、支持構件本體部165、及軸構件保持部168,可以是一體成形,也可以是形成為不同個體。當連結部164、支持構件本體部165、及軸構件保持部168是各別地形成為不同個體時,對於連結部164與支持構件本體部165之間進行固定,並且對於支持構件本體部165與軸構件保持部168之間進行固定。The clamper 163 is configured to clamp the plate-shaped member 140 , thereby holding the plate-shaped member 140 . The holder 163 is connected to the supporting member 170 . The support member 170 includes a substantially S-shaped connection portion 164 , a square support member body portion 165 , and a shaft member holding portion 168 . The connection part 164, the support member main body part 165, and the shaft member holding part 168 may be formed integrally, or may be formed as separate bodies. When the connection part 164, the support member body part 165, and the shaft member holding part 168 are separately formed as different entities, the connection part 164 and the support member body part 165 are fixed, and the support member body part 165 and the shaft The member holding parts 168 are fixed together.

在支持構件本體部165的靠近上端的位置形成有孔,在該孔上實施,例如螺紋切削加工。移動構件161貫穿在該孔中。移動構件161,例如是以在箭頭FB方向延伸的滾珠螺桿來構成。在支持構件本體部165中形成有孔的位置,是在箭頭UD方向(高度方向)上的比軸構件166的位置更往上方偏離。換句話說,移動構件161與前述軸構件在高度方向上偏離。因此,即便假設移動構件161的顏色是黑色以外的顏色,自軸構件166與夾持器163的連接部附近進入了調整部160內的光,在移動構件161漫射的可能性也不高。連結部164,連結支持構件本體部165中的移動構件161的附近與夾持器163的端面。A hole is formed at a position close to the upper end of the supporting member main body portion 165 , and thread cutting, for example, is performed on the hole. The moving member 161 passes through the hole. The moving member 161 is constituted by, for example, a ball screw extending in the arrow FB direction. The position where the hole is formed in the supporting member main body portion 165 is deviated upward from the position of the shaft member 166 in the arrow UD direction (height direction). In other words, the moving member 161 deviates in the height direction from the aforementioned shaft member. Therefore, even if the color of the moving member 161 is other than black, the light entering the adjusting portion 160 from the vicinity of the connecting portion of the shaft member 166 and the holder 163 is less likely to be diffused by the moving member 161 . The connecting portion 164 connects the vicinity of the moving member 161 in the supporting member main body portion 165 and the end surface of the holder 163 .

在移動構件161安裝有操作構件162。藉由對於操作構件162進行旋轉操作,以使移動構件161旋轉。伴隨著移動構件161的旋轉,使得支持構件170在箭頭FB方向上移動。其結果,使板狀構件140在箭頭FB方向上移動。亦即,伴隨著移動構件161的旋轉,使得板狀構件140在擴散板130與半反射鏡150之間直線移動。這樣一來,在檢查裝置10中,調整部160的位置調整部,能夠藉由操作構件162的旋轉操作,以調整板狀構件140在擴散板130與半反射鏡150之間的位置。An operating member 162 is attached to the moving member 161 . The moving member 161 is rotated by rotating the operation member 162 . Accompanying the rotation of the moving member 161, the supporting member 170 is moved in the direction of arrow FB. As a result, the plate-shaped member 140 is moved in the arrow FB direction. That is, along with the rotation of the moving member 161 , the plate member 140 is linearly moved between the diffusion plate 130 and the half mirror 150 . In this way, in the inspection device 10 , the position adjustment unit of the adjustment unit 160 can adjust the position of the plate member 140 between the diffuser plate 130 and the half mirror 150 by rotating the operation member 162 .

在夾持器163的端面形成有孔部H1,以收容軸構件166的一部分。在孔部H1上實施螺紋切削加工。在軸構件166的一方的端部形成有螺絲部S1。螺絲部S1收容在孔部H1中。藉此,而固定軸構件166與夾持器163。A hole H1 is formed in an end surface of the holder 163 to accommodate a part of the shaft member 166 . Thread cutting is performed on the hole H1. A screw portion S1 is formed at one end portion of the shaft member 166 . The screw portion S1 is accommodated in the hole portion H1. Thereby, the shaft member 166 and the holder 163 are fixed.

在支持構件170中,在連結部164、支持構件本體部165及軸構件保持部168中分別形成有孔,以供軸構件166貫穿。藉由使軸構件166貫穿在這些孔中,以使支持構件170支持軸構件166。在連結部164、支持構件本體部165及軸構件保持部168中分別形成的孔上沒有實施螺紋切削加工,使軸構件166可分別地相對於連結部164、支持構件本體部165及軸構件保持部168旋轉。In the support member 170 , holes are formed in the coupling portion 164 , the support member body portion 165 , and the shaft member holding portion 168 , through which the shaft member 166 penetrates. The support member 170 supports the shaft member 166 by passing the shaft member 166 through these holes. Thread cutting is not carried out on the holes respectively formed in the connecting portion 164, the supporting member body portion 165, and the shaft member holding portion 168, so that the shaft member 166 can be held relative to the connecting portion 164, the supporting member body portion 165, and the shaft member, respectively. Section 168 rotates.

藉由使軸構件166旋轉,夾持器163以軸構件166為中心旋轉。伴隨著夾持器163的旋轉,使已保持在夾持器163上的板狀構件140也旋轉。這樣一來,在檢查裝置10中,調整部160的角度調整機構,能夠藉由軸構件166的旋轉操作,以調整板狀構件140相對於半反射鏡150的角度。By rotating the shaft member 166 , the holder 163 rotates around the shaft member 166 . Along with the rotation of the holder 163, the plate-shaped member 140 held by the holder 163 is also rotated. In this way, in the inspection device 10 , the angle adjustment mechanism of the adjustment unit 160 can adjust the angle of the plate member 140 relative to the half mirror 150 by rotating the shaft member 166 .

在軸構件保持部168形成有孔,以收容止動件169。該孔,在與由軸構件166所貫穿的孔大致垂直的方向上延伸。例如,在該孔上實施螺紋切削加工,且止動件169是以螺絲來構成。此時,將止動件169螺旋固定在軸構件保持部168的孔中,藉此在止動件169與軸構件166之間產生摩擦。藉由此摩擦來限制軸構件166的旋轉。亦即,止動件169使軸構件166的旋轉停止。能夠藉由止動件169來固定軸構件166的旋轉角度,並且固定板狀構件140相對於半反射鏡150的角度。A hole is formed in the shaft member holding portion 168 to accommodate the stopper 169 . The hole extends in a direction substantially perpendicular to the hole through which the shaft member 166 penetrates. For example, screw cutting is performed on this hole, and the stopper 169 is formed by a screw. At this time, the stopper 169 is screwed into the hole of the shaft member holding portion 168 , whereby friction is generated between the stopper 169 and the shaft member 166 . The rotation of the shaft member 166 is restricted by this friction. That is, the stopper 169 stops the rotation of the shaft member 166 . The rotation angle of the shaft member 166 can be fixed by the stopper 169 and the angle of the plate member 140 with respect to the half mirror 150 can be fixed.

遮光蓋167,構成為覆蓋軸構件保持部168和止動件169。藉此,能夠抑制光自軸構件166與軸構件保持部168的連接部附近往調整部160內部的進入。The shade cover 167 is configured to cover the shaft member holding portion 168 and the stopper 169 . Thereby, it is possible to suppress the entry of light from the vicinity of the connecting portion between the shaft member 166 and the shaft member holding portion 168 into the inside of the adjustment portion 160 .

這樣一來,在檢查裝置10中,可調整板狀構件140在擴散板130與半反射鏡150之間的位置。In this way, in the inspection device 10 , the position of the plate member 140 between the diffusion plate 130 and the half mirror 150 can be adjusted.

第6圖是示意地表示擴散板130與板狀構件140之間的距離變短的狀態的檢查裝置10的圖。如第6圖所示,在此檢查裝置10中,例如與第2圖所示的例子比較,擴散板130與板狀構件140之間的距離變短。FIG. 6 is a diagram schematically showing the inspection device 10 in a state where the distance between the diffuser plate 130 and the plate-shaped member 140 is shortened. As shown in FIG. 6 , in this inspection device 10 , the distance between the diffusion plate 130 and the plate-shaped member 140 is shortened, for example, compared with the example shown in FIG. 2 .

即使當各狹縫142相對於板狀構件140的一面沒有往大致垂直的方向延伸,且該面為板狀構件140的各面之中的與擴散板130對向的一面時,若擴散板130與板狀構件140之間的距離變短,則相較於擴散板130與板狀構件140之間的距離長的情況,相對於板狀構件140大致垂直的光容易通過狹縫142。其結果,不易產生照射到檢查對象物300的每個區域中的光的強度差異大的事態。Even when each slit 142 does not extend in a direction substantially perpendicular to one side of the plate-like member 140, and this side is the side facing the diffuser plate 130 among the faces of the plate-like member 140, if the diffuser plate 130 As the distance to the plate-shaped member 140 becomes shorter, light substantially perpendicular to the plate-shaped member 140 passes through the slit 142 more easily than when the distance between the diffuser plate 130 and the plate-shaped member 140 is long. As a result, a situation in which the intensity of light irradiated to each area of the inspection target object 300 differs greatly is less likely to occur.

第7圖是示意地表示板狀構件140相對於半反射鏡150的角度傾斜後的狀態的檢查裝置10的圖。另外,第7圖中,為了容易理解而誇張地表示狹縫142的傾斜。FIG. 7 is a diagram schematically showing the inspection device 10 in a state where the angle of the plate-shaped member 140 is inclined with respect to the half mirror 150 . In addition, in Fig. 7, the inclination of the slit 142 is exaggerated for easy understanding.

如第7圖所示,在此檢查裝置10中,板狀構件140傾斜,以使各狹縫142相對於板狀構件140的一面的延伸方向趨近大致垂直,且該面為板狀構件140的各面之中的與擴散板130對向的一面。因為各狹縫142相對於板狀構件140的一面的延伸方向趨近大致垂直,且該面為板狀構件140的各面之中的與擴散板130對向的一面,所以通過了板狀構件140的光,大多相對於板狀構件140成為大致垂直。其結果,在半反射鏡150反射的光大致均勻地照射到檢查對象物300的整體上。As shown in FIG. 7, in this inspection device 10, the plate-shaped member 140 is inclined so that the extension direction of each slit 142 is approximately perpendicular to one side of the plate-shaped member 140, and this surface is the plate-shaped member 140. The side facing the diffuser plate 130 among the sides. Since the extension direction of each slit 142 is approximately perpendicular to one side of the plate-shaped member 140, and this surface is the one facing the diffuser plate 130 among the surfaces of the plate-shaped member 140, the The light at 140 is mostly perpendicular to the plate member 140 . As a result, the light reflected by the half mirror 150 is substantially uniformly irradiated on the entire object 300 to be inspected.

[4.特徵] 如以上,在依照本實施形態的檢查裝置10中,可調整板狀構件140的配置。因此,依據檢查裝置10,可藉由調整板狀構件140的配置,以調整通過了板狀構件140的光的行進方向,所以能夠抑制在半反射鏡150反射而照射到檢查對象物300的光的偏移。 [4. Features] As described above, in the inspection device 10 according to the present embodiment, the arrangement of the plate-shaped member 140 can be adjusted. Therefore, according to the inspection device 10, the traveling direction of the light passing through the plate-shaped member 140 can be adjusted by adjusting the arrangement of the plate-shaped member 140, so the light reflected by the half mirror 150 and irradiated to the inspection object 300 can be suppressed. offset.

[5.其他實施形態] 上述實施形態的思想,不受限於以上說明的實施形態。以下,說明能夠適用上述實施形態的思想之其他實施形態的一例。 [5. Other embodiments] The concept of the above-mentioned embodiments is not limited to the above-described embodiments. Hereinafter, an example of other embodiments to which the idea of the above-mentioned embodiments can be applied will be described.

上述實施形態中,說明本發明適用於檢查裝置的例子,但是本發明除了檢查裝置以外,也能夠適用於例如樹脂成形裝置或切斷裝置。In the above-mentioned embodiment, an example in which the present invention is applied to an inspection device has been described, but the present invention can also be applied to, for example, a resin molding device or a cutting device other than an inspection device.

第8圖是示意地表示樹脂成形裝置400的構成的方塊圖。如第8圖所示,樹脂成形裝置400,包含樹脂成形機構410和檢查裝置10。樹脂成形機構410,主要包含合模機構(未圖示),其對於將成形模具(未圖示)與成形模具加以合模。樹脂成形機構410,構成為將成形模具加以合模並進行成形對象物的樹脂成形,以製造樹脂成形品。檢查裝置10,例如檢查樹脂成形前的基板、或樹脂成形後的封裝基板也就是樹脂成形品。此時,樹脂成形前的基板、或樹脂成形後的封裝基板成為檢查對象物300。作為檢查的例子,列舉有已連接到樹脂成形前的基板之電子元件的位置偏移檢查和計數檢查、以及封裝基板的外觀檢查等。FIG. 8 is a block diagram schematically showing the configuration of the resin molding apparatus 400 . As shown in FIG. 8 , the resin molding device 400 includes a resin molding mechanism 410 and an inspection device 10 . The resin molding mechanism 410 mainly includes a mold clamping mechanism (not shown) for clamping a molding mold (not shown) and a molding mold. The resin molding mechanism 410 is configured to clamp a molding die to perform resin molding of a molding object to manufacture a resin molded product. The inspection device 10 inspects, for example, a substrate before resin molding or a package substrate after resin molding, that is, a resin molded product. At this time, the substrate before resin molding or the package substrate after resin molding becomes the inspection object 300 . Examples of inspections include positional displacement inspections and count inspections of electronic components connected to substrates before resin molding, appearance inspections of package substrates, and the like.

第9圖是示意地表示切斷裝置500的構成的方塊圖。如第9圖所示,切斷裝置500,包含切斷機構510和檢查裝置10。切斷機構510,構成為主要包含具有刀刃之轉軸部(未圖示),並藉由高速旋轉的刀刃來將切斷對象物切斷,以製造切斷品。檢查裝置10,例如檢查切斷對象物、或切斷品。此時,切斷對象物、或切斷品成為檢查對象物300。作為檢查的例子,列舉有切斷對象物也就是封裝基板的樹脂成形了的一面的外觀檢查、以及切斷對象物也就是封裝基板的沒有進行樹脂成形的一面的檢查等。FIG. 9 is a block diagram schematically showing the configuration of the cutting device 500 . As shown in FIG. 9 , the cutting device 500 includes a cutting mechanism 510 and an inspection device 10 . The cutting mechanism 510 is mainly composed of a rotating shaft portion (not shown) having a blade, and the cutting object is cut by the high-speed rotating blade to produce a cut product. The inspection device 10 inspects, for example, an object to be cut or a cut product. At this time, the object to be cut or the cut product becomes the object to be inspected 300 . Examples of the inspection include visual inspection of the resin-molded side of the object to be cut, that is, the package substrate, and inspection of the surface of the object to be cut, that is, the resin-molded surface of the package substrate.

又,上述實施形態中,檢查裝置10,構成為可調整板狀構件140在箭頭方向FB上的位置、及可調整以軸構件166作為旋轉中心之板狀構件140的旋轉角度。然而,不必一定要可進行兩方的調整。亦即,也可以是僅可進行板狀構件140在箭頭方向FB上的位置的調整、及以軸構件166作為旋轉中心之板狀構件140的旋轉角度的調整的任一方。In addition, in the above-mentioned embodiment, the inspection apparatus 10 is configured to be able to adjust the position of the plate-shaped member 140 in the arrow direction FB, and to be able to adjust the rotation angle of the plate-shaped member 140 with the shaft member 166 as the rotation center. However, it is not necessary that two-way adjustments be possible. That is, only one of the adjustment of the position of the plate-shaped member 140 in the arrow direction FB and the adjustment of the rotation angle of the plate-shaped member 140 around the shaft member 166 as the rotation center may be performed.

以上,對於本發明的實施形態進行例示的說明。亦即,為了進行例示的說明而揭露了詳細的說明和附圖。因此,詳細的說明和附圖中記載的構成要素之中,會包含當為了解決問題時的不是必要的構成要素。因此,即便這些不是必要的構成要素是記載於詳細的說明和附圖中,也不應該立刻將這些不是必要的構成要素認定為是必要的。As mentioned above, the embodiment of this invention was demonstrated as an example. That is, the detailed description and drawings are disclosed for illustrative purposes. Therefore, among the constituent elements described in the detailed description and the drawings, constituent elements that are not necessary for solving problems may be included. Therefore, even if these unnecessary constituent elements are described in the detailed description and drawings, these unnecessary constituent elements should not be recognized as essential immediately.

又,上述實施形態,在本發明的範圍中可進行各種改良和變化。亦即,對於本發明的實施,能夠對應於實施形態來採用適當的具體構成。In addition, various modifications and changes can be made to the above-mentioned embodiments within the scope of the present invention. That is, for implementation of the present invention, appropriate specific configurations can be adopted in accordance with the embodiments.

10:檢查裝置 100:同軸照明 110:框體 120:LED 121:基板 125:光源部 130:擴散板 140:板狀構件 142:狹縫 150:半反射鏡 160:調整部 161:移動構件 162:操作構件 163:夾持器 164:連結部 165:支持構件本體部 166:軸構件 167:遮光蓋 168:軸構件保持部 169:止動件 170:支持構件 200:相機 300:檢查對象物 400:樹脂成形裝置 410:樹脂成形機構 500:切斷裝置 510:切斷機構 C1:觀察軸 H1:孔部 S1:螺絲部 10: Check device 100: coaxial lighting 110: frame 120:LED 121: Substrate 125: Light source department 130: Diffusion plate 140: Plate member 142: Slit 150: half mirror 160: Adjustment department 161: Mobile components 162: Operating components 163: Holder 164: linking part 165: Support member body part 166: Shaft component 167: shade cover 168: shaft member holding part 169: stopper 170: Support components 200: camera 300: Check object 400: resin molding device 410: Resin forming mechanism 500: cutting device 510: cutting mechanism C1: Observation axis H1: Hole S1: screw part

第1圖是示意地表示檢查裝置的圖。 第2圖是用以說明因為在板狀構件內的各狹縫比預想更傾斜而產生的問題點的圖。 第3圖是示意地表示同軸照明的上面的圖。 第4圖是示意地表示同軸照明的正面的圖。 第5圖是示意地表示沿第3圖的V-V線的剖面圖。 第6圖是示意地表示擴散板與板狀構件之間的距離變短的狀態的檢查裝置的圖。 第7圖是示意地表示板狀構件相對於半反射鏡的角度傾斜後的狀態的檢查裝置的圖。 第8圖是示意地表示樹脂成形裝置的構成的方塊圖。 第9圖是示意地表示切斷裝置的構成的方塊圖。 Fig. 1 is a diagram schematically showing an inspection device. Fig. 2 is a diagram for explaining problems caused by the inclination of each slit in the plate-shaped member more than expected. Fig. 3 is a top view schematically showing the coaxial illumination. Fig. 4 is a front view schematically showing coaxial lighting. Fig. 5 is a schematic cross-sectional view taken along line V-V in Fig. 3 . Fig. 6 is a diagram schematically showing an inspection device in a state where the distance between the diffuser plate and the plate-shaped member is shortened. Fig. 7 is a diagram schematically showing an inspection device in a state where a plate-shaped member is inclined at an angle with respect to a half mirror. Fig. 8 is a block diagram schematically showing the configuration of a resin molding device. Fig. 9 is a block diagram schematically showing the configuration of the cutting device.

國內寄存資訊 (請依寄存機構、日期、號碼順序註記) 無 Domestic deposit information (please note in order of depositor, date, and number) none

國外寄存資訊 (請依寄存國家、機構、日期、號碼順序註記) 無 Overseas storage information (please note in order of storage country, organization, date, and number) none

10:檢查裝置 10: Check device

100:同軸照明 100: coaxial lighting

110:框體 110: frame

120:LED 120:LED

121:基板 121: Substrate

125:光源部 125: Light source department

130:擴散板 130: Diffusion plate

140:板狀構件 140: Plate member

142:狹縫 142: Slit

150:半反射鏡 150: half mirror

200:相機 200: camera

300:檢查對象物 300: Check object

C1:觀察軸 C1: Observation axis

Claims (9)

一種檢查裝置,具備:相機,構成為對於檢查對象物進行攝像;及,同軸照明,構成為將光照射到前述檢查對象物;前述同軸照明,包含:半反射鏡,配置在連結前述檢查對象物與前述相機的觀察軸上,且相對於前述觀察軸傾斜;光源部,構成為自與前述觀察軸不同的方向朝向前述半反射鏡發光;板狀構件,配置在前述光源部與前述半反射鏡之間,該板狀構件中形成有複數個狹縫,且該些狹縫互相大致平行;及,調整部,構成為調整前述板狀構件的配置;由前述光源部發出的光在前述半反射鏡反射並照射到前述檢查對象物;其中,前述調整部,包含:位置調整部,構成為調整前述板狀構件與前述光源部之間的距離;及,角度調整機構,構成為調整前述板狀構件相對於前述半反射鏡的角度;前述位置調整部,包含移動構件,該移動構件構成為使前述板狀構件在前述光源部與前述半反射鏡之間進行直線移動;前述角度調整機構,包含:夾持器,構成為保持前述 板狀構件;及,軸構件,成為前述夾持器的旋轉軸;前述移動構件與前述軸構件在高度方向上偏離。 An inspection device comprising: a camera configured to take an image of an inspection object; and a coaxial illumination configured to irradiate light onto the inspection object; the coaxial illumination includes: a half mirror disposed on a On the observation axis of the aforementioned camera, and inclined relative to the aforementioned observation axis; the light source part is configured to emit light toward the aforementioned half mirror from a direction different from the aforementioned observation axis; a plate-shaped member is disposed between the aforementioned light source part and the aforementioned half mirror Between, a plurality of slits are formed in the plate-shaped member, and these slits are substantially parallel to each other; and, the adjustment part is configured to adjust the configuration of the aforementioned plate-shaped member; The mirror reflects and irradiates the aforementioned inspection object; wherein, the aforementioned adjustment part includes: a position adjustment part configured to adjust the distance between the aforementioned plate-shaped member and the aforementioned light source part; and an angle adjustment mechanism configured to adjust the distance between the aforementioned plate-shaped member The angle of the member relative to the half mirror; the position adjustment unit includes a moving member configured to linearly move the plate-shaped member between the light source unit and the half mirror; the angle adjustment mechanism includes : Holder, configured to hold the aforementioned A plate-shaped member; and, a shaft member serving as a rotation shaft of the holder; and the moving member deviated in a height direction from the shaft member. 如請求項1所述之檢查裝置,其中,前述角度調整機構,進一步包含止動件,構成為使前述軸構件的旋轉停止。 The inspection device according to claim 1, wherein the angle adjustment mechanism further includes a stopper configured to stop the rotation of the shaft member. 如請求項1或2所述之檢查裝置,其中,前述夾持器,包含孔部,以收容前述軸構件的一部分。 The inspection device according to claim 1 or 2, wherein the holder includes a hole for receiving a part of the shaft member. 如請求項1或2所述之檢查裝置,其中,前述角度調整機構,包含支持構件,該支持構件支持前述軸構件並且一起安裝於在前述移動構件上;前述支持構件,包含:支持構件本體部,其安裝在前述移動構件上;及,連結部,其連結前述支持構件本體部中的前述移動構件的附近與前述夾持器;在前述支持構件本體部和前述連結部,分別地形成有貫穿孔,以供前述軸構件貫穿。 The inspection device according to claim 1 or 2, wherein the angle adjustment mechanism includes a supporting member that supports the shaft member and is mounted on the moving member together; the supporting member includes: a main body of the supporting member , which is installed on the aforementioned moving member; and, a connecting portion, which connects the vicinity of the aforementioned moving member in the aforementioned supporting member body portion and the aforementioned clamper; the aforementioned supporting member body portion and the aforementioned connecting portion are respectively formed with penetrating A hole is provided for the penetration of the aforementioned shaft member. 如請求項1或2所述之檢查裝置,其中,前述同軸照明,包含遮光蓋,該遮光蓋構成為覆蓋前述調整部。 The inspection device according to claim 1 or 2, wherein the coaxial illumination includes a light-shielding cover configured to cover the adjustment part. 一種樹脂成形裝置,具備:樹脂成形機構,構成為製造樹脂成形品;及,如請求項1至5中任一項所述之檢查裝置。 A resin molding device comprising: a resin molding mechanism configured to manufacture a resin molded product; and the inspection device according to any one of claims 1 to 5. 一種切斷裝置,具備:切斷機構,構成為藉由將切斷對象物加以切斷來製造 切斷品;及,如請求項1至5中任一項所述之檢查裝置。 A cutting device comprising: a cutting mechanism configured to cut an object to be cut to produce A cut-off product; and, the inspection device as described in any one of Claims 1 to 5. 一種樹脂成形品的製造方法,具備:製造樹脂成形品;及,使用如請求項1至5中任一項所述之檢查裝置來對前述檢查對象物進行檢查;前述檢查對象物,包含前述樹脂成形品。 A method of manufacturing a resin molded product, comprising: manufacturing a resin molded product; and inspecting the inspection object using the inspection device according to any one of claims 1 to 5; the inspection object includes the resin Formed products. 一種切斷品的製造方法,具備下述步驟:藉由將切斷對象物加以切斷來製造切斷品;及,使用如請求項1至5中任一項所述之檢查裝置來對前述檢查對象物進行檢查;前述檢查對象物,包含前述切斷對象物或前述切斷品。 A method of manufacturing a cut product, comprising the steps of: manufacturing a cut product by cutting an object to be cut; and using the inspection device as described in any one of claims 1 to 5 to inspect The inspection object is inspected; the inspection object includes the cutting object or the cutting product.
TW111102350A 2021-02-10 2022-01-20 Inspection device, resin molding device, cutting device, method of manufacturing resin molded product, and method of manufacturing cut product TWI796103B (en)

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