JP2015102364A - Visual inspection device - Google Patents

Visual inspection device Download PDF

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JP2015102364A
JP2015102364A JP2013241669A JP2013241669A JP2015102364A JP 2015102364 A JP2015102364 A JP 2015102364A JP 2013241669 A JP2013241669 A JP 2013241669A JP 2013241669 A JP2013241669 A JP 2013241669A JP 2015102364 A JP2015102364 A JP 2015102364A
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中村 篤
Atsushi Nakamura
篤 中村
実 安川
Minoru Yasukawa
実 安川
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Sharp Corp
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Abstract

PROBLEM TO BE SOLVED: To provide a visual inspection device, of a simple structure though, capable of inspecting the appearance of an object to be inspected by using both a bright-field optical system and a dark-field optical system, and capable of downsizing a device size and reducing a device cost.SOLUTION: A light irradiation unit (11) of a visual inspection device (1) is configured so that light including a bright-field light component and a dark-field light component is emitted from a light emission unit (11a). A light-shading body control unit (17) moves a light-shading body (13) over a bright-field light component shading position and a dark-field light component shading position. When the light-shading body (13) is moved to the dark-field light component shading position by the light-shading body control unit (17) and the dark-field light component is shaded, a line sensor camera (12) acquires a bright-field image based on the bright-field light component. When the light-shading body (13) is moved to the bright-field light component shading position by the light-shading body control unit (17) and the bright-field light component is shaded, the line sensor camera (12) acquires a dark-field image based on the dark-field light component.

Description

本発明は、ガラス板や液晶パネルなどの板状体に存在する欠陥を検出して外観を検査するための外観検査装置に関する。   The present invention relates to an appearance inspection apparatus for inspecting an appearance by detecting defects present in a plate-like body such as a glass plate or a liquid crystal panel.

精密機器に用いられる電子デバイスや、レンズ、撮像素子といった光学デバイス、液晶パネルなどの透明板状体は、「傷」や「汚れ」などの欠陥が少しでも存在すると、その性能に甚大な影響を与えてしまうことが多い。こうした欠陥は、製造時の様々な要因から、製造工程において完全に発生を防ぐことは一般的に困難である。そこで、製品における欠陥の有無などの外観や性能を製品出荷前に入念に検査し、一定の基準を満たすものだけが商品として出荷される。   Electronic devices used in precision instruments, optical devices such as lenses and image sensors, and transparent plates such as liquid crystal panels can have a significant impact on the performance of defects such as “scratches” and “dirt”. Often give. It is generally difficult to prevent such defects from occurring completely in the manufacturing process due to various factors during manufacturing. Therefore, the appearance and performance of the product, such as the presence or absence of defects, are carefully inspected before product shipment, and only products that satisfy certain standards are shipped as products.

上述の外観検査の方法としては、作業者が目視で欠陥の有無の判定を行う目視検査がある。しかしながら、目視検査は、検査の熟練度合いや判定基準の個人差などに大きく左右され、必ずしも安定した精度の検査であるとは言えない。   As the above-described appearance inspection method, there is a visual inspection in which an operator visually determines whether there is a defect. However, visual inspection is greatly influenced by the degree of skill of inspection and individual differences in judgment criteria, and is not necessarily a stable inspection.

近年では、こうした目視検査の問題点に鑑みて、目視検査する分量を低減し、外観検査を正確、かつ、効率的に行う外観検査装置が提案されている。従来の外観検査装置は、明視野光学系と暗視野光学系とに大別される。明視野光学系の外観検査装置では、レーザ光やLED照明などの光源から被検査体に光を照射し、被検査体に照射された光の正反射光や透過光などの、被検査体で散乱を受けない光を検出して、検査が行われる。また、暗視野光学系の外観検査装置では、レーザ光やLED照明などの光源から被検査体に光を照射し、被検査体に照射された光の正反射光や透過光など以外の、被検査体で散乱を受けた光を検出して、検査が行われる。   In recent years, in view of the problems of such visual inspection, an appearance inspection apparatus that reduces the amount of visual inspection and performs an appearance inspection accurately and efficiently has been proposed. Conventional visual inspection apparatuses are roughly classified into a bright field optical system and a dark field optical system. In the visual field inspection system for bright field optical systems, the object to be inspected is irradiated with light from a light source such as laser light or LED illumination, and the object to be inspected, such as regular reflection light or transmitted light of the light irradiated to the object to be inspected. Inspection is performed by detecting light that is not scattered. Further, in the visual field inspection apparatus of the dark field optical system, light is irradiated to the object to be inspected from a light source such as laser light or LED illumination, and the object to be inspected other than the regular reflection light or transmitted light of the light irradiated to the object to be inspected Inspection is performed by detecting light scattered by the inspection object.

特許文献1に記載される、第1の従来技術の外観検査装置について、図8を用いて説明する。図8は、第1の従来技術の外観検査装置の構成を概略的に示す図である。第1の従来技術の外観検査装置は、所定の搬送方向Aに搬送されるシート状の透明シート体Wに対して、下方向から投光部93によって角度θで透明シート体Wの位置Pの幅方向全域を斜めからスリット状に照明する。透明シート体Wに対する上方側において投光部93の光軸上に配置された第1受光部91は、透明シート体Wの位置Pを透過した透過光の幅方向の輝度分布を検出する。そして、透明シート体Wに対する上方側において搬送方向Aに垂直な方向に配置された第2受光部92は、透明シート体Wの位置Pに表面付着異物Tが存在していた場合に、透明シート体Wを透過し、表面付着異物Tによって拡散または散乱した透過光の幅方向の輝度分布を検出する。   A first prior art appearance inspection apparatus described in Patent Document 1 will be described with reference to FIG. FIG. 8 is a diagram schematically showing the configuration of the first conventional visual inspection apparatus. The visual inspection apparatus according to the first prior art is configured so that a light projecting unit 93 from the lower side at a position P of the transparent sheet W at a position P with respect to a sheet-like transparent sheet W conveyed in a predetermined conveyance direction A. Illuminate the entire width direction diagonally in a slit shape. The first light receiving unit 91 disposed on the optical axis of the light projecting unit 93 on the upper side with respect to the transparent sheet body W detects the luminance distribution in the width direction of the transmitted light that has passed through the position P of the transparent sheet body W. The second light receiving unit 92 disposed in the direction perpendicular to the conveyance direction A on the upper side with respect to the transparent sheet body W has a transparent sheet when the surface adhering foreign matter T exists at the position P of the transparent sheet body W. A luminance distribution in the width direction of transmitted light that has passed through the body W and has been diffused or scattered by the surface-attached foreign matter T is detected.

上記のように、第1の従来技術における外観検査装置では、照明装置から照射された光が被検査体を透過して、受光器で直接受光する第1の受光部と、照明装置からの光が被検査体で散乱し、その散乱光を受光する第2の受光部から構成されている。第1の従来技術における外観検査装置は、照明装置と第1の受光部で明視野光学系を構築し、照明装置と第2の受光部で暗視野光学系を構築している。   As described above, in the appearance inspection apparatus according to the first conventional technique, the light received from the illumination device passes through the object to be inspected and is directly received by the light receiver, and the light from the illumination device. Is scattered by the object to be inspected, and is composed of a second light receiving portion that receives the scattered light. In the appearance inspection apparatus according to the first prior art, a bright field optical system is constructed by the illumination device and the first light receiving unit, and a dark field optical system is constructed by the illumination device and the second light receiving unit.

一方、特許文献2に記載される、第2の従来技術の外観検査装置は、被検査体である光学レンズに対して、該光学レンズの真上に設けられるCCDエリアセンサと、CCDエリアセンサに対して明視野光学系および暗視野光学系をそれぞれ構築する複数の照明装置とから構成されている。第2の従来技術の外観検査装置は、明視野光学系を構築する照明装置として、レンズ透過用の明視野照明とレンズ反射用の明視野照明とを備え、暗視野光学系を構築する照明装置として、レンズ透過用の暗視野照明とレンズ反射用の暗視野照明とを備え、これら4つの照明を切り替えて外観検査を行うように構成されている。   On the other hand, the second prior art visual inspection apparatus described in Patent Document 2 is provided with a CCD area sensor provided directly above the optical lens, and a CCD area sensor. On the other hand, it is composed of a plurality of illumination devices that respectively construct a bright field optical system and a dark field optical system. The visual inspection apparatus of the second prior art includes a bright field illumination for transmitting a lens and a bright field illumination for reflecting a lens as an illumination device for constructing a bright field optical system, and constructs a dark field optical system. As described above, a dark field illumination for transmitting a lens and a dark field illumination for reflecting a lens are provided, and an appearance inspection is performed by switching these four illuminations.

特開2010−223598号公報JP 2010-223598 A 特開2008−249568号公報JP 2008-249568 A

上述した第1および第2の従来技術の外観検査装置では、明視野光学系によって取得される明視野像を画像解析し、また、暗視野光学系によって取得される暗視野像を画像解析することによって、種類の異なる複数種の欠陥を検出することができる。   In the first and second conventional visual inspection apparatuses described above, the bright field image acquired by the bright field optical system is subjected to image analysis, and the dark field image acquired by the dark field optical system is subjected to image analysis. Thus, it is possible to detect a plurality of types of defects of different types.

しかしながら、第1および第2の従来技術の外観検査装置は、以下に示すような課題を有する。すなわち、明視野光学系および暗視野光学系の両方の光学系を用いて被検査体の外観検査を行う場合、第1の従来技術の外観検査装置では、1つの照明装置に対して複数の受光部(明視野像および暗視野像をそれぞれ取得する複数の撮像部)が必要となり、また、第2の従来技術の外観検査装置では、1つのCCDエリアセンサ(受光部)に対して複数の照明装置が必要となる。したがって、第1および第2の従来技術の外観検査装置は、装置の構成部品点数が多く、装置構成の複雑化、装置サイズの大型化、装置コストの高コスト化が発生するという課題がある。   However, the first and second prior art visual inspection apparatuses have the following problems. That is, when the appearance inspection of the object to be inspected is performed using both the bright field optical system and the dark field optical system, the first prior art appearance inspection apparatus receives a plurality of light receptions for one illumination device. Part (a plurality of image pickup parts for acquiring bright field images and dark field images respectively) is required, and in the second prior art appearance inspection apparatus, a plurality of illuminations are applied to one CCD area sensor (light receiving part). A device is required. Therefore, the first and second prior art visual inspection apparatuses have a problem that the number of component parts of the apparatus is large, the apparatus configuration is complicated, the apparatus size is increased, and the apparatus cost is increased.

本発明の目的は、簡単な構成で、明視野光学系および暗視野光学系の両方の光学系を用いて被検査体の外観検査を行うことができ、装置サイズの小型化および装置コストの低コスト化が達成可能な外観検査装置を提供することである。   It is an object of the present invention to perform an appearance inspection of an object to be inspected with a simple configuration and using both an optical system of a bright field optical system and a dark field optical system. An object of the present invention is to provide an appearance inspection apparatus that can achieve cost reduction.

本発明は、被検査体を載置する載置部と、
前記載置部に載置された被検査体に対向して配設され、明視野光成分および暗視野光成分を含む光を出射する光出射部を有し、該光出射部から出射された光を、前記載置部に載置された被検査体に照射する光照射部と、
前記載置部と前記光照射部との間の位置に、移動可能に設けられ、移動することによって前記光出射部から出射された光の一部を遮光して、被検査体に照射される光の光量を調整する光量調整部材と、
前記光量調整部材の移動動作を制御する光量調整部材移動制御部であって、前記光出射部から出射された光の前記明視野光成分を遮光可能な明視野光成分遮光位置と、前記光出射部から出射された光の前記暗視野光成分を遮光可能な暗視野光成分遮光位置とにわたって、前記光量調整部材を移動させる光量調整部材移動制御部と、
前記光照射部によって光が照射された被検査体からの反射光または透過光を受光する受光部と、を備えることを特徴とする外観検査装置である。
The present invention provides a placement unit for placing an object to be inspected,
The light emitting unit is disposed opposite to the object to be inspected placed on the placing unit and emits light including a bright field light component and a dark field light component, and is emitted from the light emitting unit. A light irradiating unit that irradiates the object to be inspected placed on the mounting unit;
A movable part is provided at a position between the placement unit and the light irradiation unit, and a part of the light emitted from the light emission unit is shielded by moving to be irradiated on the object to be inspected. A light amount adjusting member for adjusting the amount of light;
A light quantity adjusting member movement control unit for controlling the movement operation of the light quantity adjusting member, wherein the bright field light component shielding position capable of shielding the bright field light component of the light emitted from the light emitting part; and the light emission A light amount adjustment member movement control unit that moves the light amount adjustment member over a dark field light component light shielding position capable of shielding the dark field light component of the light emitted from the unit;
A visual inspection apparatus comprising: a light receiving unit configured to receive reflected light or transmitted light from an inspection object irradiated with light by the light irradiation unit.

また本発明の外観検査装置において、前記光量調整部材は、該光量調整部材を構成する基材が前記光照射部の前記光出射部から出射された光を遮光する遮光領域と、該光量調整部材を構成する基材の一部に設けられた開口部または切り欠き部であって、前記光出射部から出射された光を透過する透過領域とを有することを特徴とする。   Further, in the appearance inspection apparatus according to the present invention, the light amount adjusting member includes a light shielding region in which a base material constituting the light amount adjusting member blocks light emitted from the light emitting unit of the light irradiation unit, and the light amount adjusting member. An opening or a notch provided in a part of the base material constituting the light-transmitting part, and a transmission region that transmits the light emitted from the light emitting part.

また本発明の外観検査装置において、前記光量調整部材は、前記光照射部の前記光出射部よりも大きい平板状の部材であることを特徴とする。   In the appearance inspection apparatus of the present invention, the light amount adjusting member is a flat plate-shaped member that is larger than the light emitting portion of the light emitting portion.

また本発明の外観検査装置において、前記光照射部は、第1の方向に沿って線状に延びる線状光源であり、
前記受光部は、複数の受光素子が前記第1の方向と平行に配列されるラインセンサカメラであり、
前記光量調整部材移動制御部は、前記第1の方向に垂直な第2の方向に沿って、前記光量調整部材を移動させることを特徴とする。
Moreover, in the appearance inspection apparatus of the present invention, the light irradiation unit is a linear light source extending linearly along the first direction,
The light receiving unit is a line sensor camera in which a plurality of light receiving elements are arranged in parallel with the first direction,
The light quantity adjustment member movement control unit moves the light quantity adjustment member along a second direction perpendicular to the first direction.

また本発明の外観検査装置は、前記載置部を一方向に沿って往復運動させる載置部移動制御部をさらに備え、
前記光量調整部材移動制御部は、前記載置部移動制御部による前記載置部の往復運動に連動して、前記光量調整部材を移動させることを特徴とする。
The appearance inspection apparatus of the present invention further includes a placement unit movement control unit that reciprocates the placement unit along one direction,
The light amount adjustment member movement control unit moves the light amount adjustment member in conjunction with the reciprocation of the placement unit by the placement unit movement control unit.

本発明によれば、外観検査装置は、被検査体を載置する載置部と、光照射部と、光量調整部材と、光量調整部材移動制御部と、受光部とを備える。光照射部は、載置部に載置された被検査体に対向して配設され、明視野光成分および暗視野光成分を含む光を出射する光出射部を有し、該光出射部から出射された光を、載置部に載置された被検査体に照射する。光量調整部材は、載置部と光照射部との間の位置に、移動可能に設けられ、移動することによって光出射部から出射された光の一部を遮光して、被検査体に照射される光の光量を調整する。光量調整部材移動制御部は、光量調整部材の移動動作を制御する部分であり、光出射部から出射された光の明視野光成分を遮光可能な明視野光成分遮光位置と、光出射部から出射された光の暗視野光成分を遮光可能な暗視野光成分遮光位置とにわたって、光量調整部材を移動させる。   According to the present invention, the appearance inspection apparatus includes a placement unit on which an object to be inspected is placed, a light irradiation unit, a light amount adjustment member, a light amount adjustment member movement control unit, and a light receiving unit. The light irradiating unit is disposed to face the object to be inspected mounted on the mounting unit, and has a light emitting unit that emits light including a bright field light component and a dark field light component. The object to be inspected placed on the placement portion is irradiated with the light emitted from the placement portion. The light amount adjusting member is movably provided at a position between the placement unit and the light irradiation unit, and blocks a part of the light emitted from the light emission unit by moving to irradiate the object to be inspected. Adjust the amount of light emitted. The light amount adjustment member movement control unit is a part that controls the movement operation of the light amount adjustment member. The bright field light component light shielding position that can block the bright field light component of the light emitted from the light emission unit, and the light emission unit The light amount adjusting member is moved over the dark field light component light shielding position where the dark field light component of the emitted light can be shielded.

受光部は、光照射部によって光が照射された被検査体からの反射光または透過光を受光する。受光部は、光量調整部材移動制御部によって光量調整部材が暗視野光成分遮光位置に移動されて、暗視野光成分が遮光されると、光照射部の光出射部から出射された光の明視野光成分に基づく明視野像を取得し、光量調整部材移動制御部によって光量調整部材が明視野光成分遮光位置に移動されて、明視野光成分が遮光されると、光照射部の光出射部から出射された光の暗視野光成分に基づく暗視野像を取得する。   The light receiving unit receives reflected light or transmitted light from the inspection object irradiated with light by the light irradiation unit. When the light quantity adjusting member is moved to the dark field light component light shielding position by the light quantity adjusting member movement control unit and the dark field light component is shielded, the light receiving unit is configured to brighten the light emitted from the light emitting unit of the light emitting unit. A bright field image based on the field light component is acquired, and when the light intensity adjusting member is moved to the bright field light component shielding position by the light intensity adjusting member movement control unit and the bright field light component is shielded, the light emitting unit emits light. A dark field image based on the dark field light component of the light emitted from the unit is acquired.

以上のように構成される本発明の外観検査装置は、明視野光成分と暗視野光成分とを含む光を出射可能に構成される1つの光照射部と、光量調整部材によって遮光される成分以外の光成分に基づいて明視野像および暗視野像を取得可能に構成される1つの受光部とによる、簡単な構成で、明視野光学系および暗視野光学系の両方の光学系を用いて被検査体の外観検査を行うことができ、装置サイズの小型化および装置コストの低コスト化が達成可能である。   The appearance inspection apparatus of the present invention configured as described above includes a light irradiation unit configured to emit light including a bright field light component and a dark field light component, and a component shielded by a light amount adjusting member. Using a single light receiving unit configured to be able to acquire a bright-field image and a dark-field image based on light components other than the above, using both the bright-field optical system and the dark-field optical system The appearance inspection of the object to be inspected can be performed, and the apparatus size can be reduced and the apparatus cost can be reduced.

また本発明によれば、光量調整部材は、該光量調整部材を構成する基材が前記光照射部の前記光出射部から出射された光を遮光する遮光領域と、該光量調整部材を構成する基材の一部に設けられた開口部または切り欠き部であって、前記光出射部から出射された光を透過する透過領域とを有する。このような光量調整部材では、たとえば、遮光領域で暗視野光成分を遮光する場合には開口部または切り欠き部から成る透過領域で明視野光成分を透過させることができ、遮光領域で明視野光成分を遮光する場合には開口部または切り欠き部から成る透過領域で暗視野光成分を透過させることができる。   According to the invention, the light amount adjusting member constitutes the light amount adjusting member, and a light shielding region in which a base material constituting the light amount adjusting member blocks light emitted from the light emitting portion of the light irradiating portion. An opening or a notch provided in a part of the base material, and having a transmission region that transmits light emitted from the light emitting unit. With such a light amount adjusting member, for example, when the dark field light component is shielded in the light shielding region, the bright field light component can be transmitted through the transmission region including the opening or the notch, and the bright field light component is transmitted in the light shielding region. When the light component is shielded, the dark field light component can be transmitted through the transmission region including the opening or the notch.

また本発明によれば、遮光領域および透過領域を有する光量調整部材は、光照射部の光出射部よりも大きい平板状の部材である。これによって、光出射部から出射される光において、透過領域から透過する光以外の光を全て、遮光領域によって遮光することができる。   Moreover, according to this invention, the light quantity adjustment member which has a light-shielding area | region and a permeation | transmission area | region is a flat member larger than the light-projection part of a light irradiation part. Thereby, in the light emitted from the light emitting part, all the light other than the light transmitted from the transmission region can be shielded by the light shielding region.

また本発明によれば、光照射部は、第1の方向に沿って線状に延びる線状光源であり、受光部は、複数の受光素子が前記第1の方向と平行に配列されるラインセンサカメラである。そして、光量調整部材移動制御部は、前記第1の方向に垂直な第2の方向に沿って、光量調整部材を移動させるように構成される。このような構成においては、受光部によって明視野光成分に基づく明視野像を取得する場合と、暗視野光成分に基づく暗視野像を取得する場合との切り替えを、線状光源およびラインセンサカメラの延在方向となる前記第1の方向に垂直な第2の方向に、光量調整部材を移動させることによって、実施することになる。光量調整部材が移動する第2の方向は、線状光源およびラインセンサカメラの延在方向に垂直な方向であるので、比較的短い距離を光量調整部材が移動することによって、受光部によって明視野像を取得する場合と、暗視野像を取得する場合との切り替えを実施することができる。   According to the invention, the light irradiation unit is a linear light source extending linearly along the first direction, and the light receiving unit is a line in which a plurality of light receiving elements are arranged in parallel with the first direction. It is a sensor camera. The light amount adjustment member movement control unit is configured to move the light amount adjustment member along a second direction perpendicular to the first direction. In such a configuration, the linear light source and the line sensor camera are switched between the case where the light receiving unit acquires a bright field image based on the bright field light component and the case where the dark field image based on the dark field light component is acquired. This is implemented by moving the light amount adjusting member in a second direction perpendicular to the first direction, which is the extending direction of the light. Since the second direction in which the light amount adjusting member moves is a direction perpendicular to the extending direction of the linear light source and the line sensor camera, the light amount adjusting member moves over a relatively short distance, so that the light receiving unit moves the bright field. Switching between the case of acquiring an image and the case of acquiring a dark field image can be performed.

また本発明によれば、外観検査装置は、載置部を一方向に沿って往復運動させる載置部移動制御部をさらに備える。そして、光量調整部材移動制御部は、載置部移動制御部による載置部の往復運動に連動して、光量調整部材を移動させる。たとえば、載置部移動制御部が載置部を往運動させる場合に、光量調整部材移動制御部が光量調整部材を暗視野光成分遮光位置に移動させることによって、載置部の往運動に応じて移動する被検査体に対して、受光部で明視野光成分に基づく明視野像を取得することができ、これによって明視野光学系を用いた外観検査を行うことができる。また、載置部移動制御部が載置部を復運動させる場合に、光量調整部材移動制御部が光量調整部材を明視野光成分遮光位置に移動させることによって、載置部の復運動に応じて移動する被検査体に対して、受光部で暗視野光成分に基づく暗視野像を取得することができ、これによって暗視野光学系を用いた外観検査を行うことができる。   According to the invention, the appearance inspection apparatus further includes a placement unit movement control unit that reciprocates the placement unit along one direction. The light amount adjustment member movement control unit moves the light amount adjustment member in conjunction with the reciprocating motion of the placement unit by the placement unit movement control unit. For example, when the placement unit movement control unit moves the placement unit forward, the light amount adjustment member movement control unit moves the light amount adjustment member to the dark field light component light-shielding position, thereby responding to the movement of the placement unit. Thus, a bright field image based on a bright field light component can be acquired by the light receiving unit, and an appearance inspection using a bright field optical system can be performed. In addition, when the placement unit movement control unit moves the placement unit back, the light amount adjustment member movement control unit moves the light amount adjustment member to the bright-field light component light-shielding position to respond to the backward movement of the placement unit. Thus, a dark field image based on a dark field light component can be acquired by the light receiving unit, and an appearance inspection using a dark field optical system can be performed.

本発明の第1実施形態に係る外観検査装置1の構成を概略的に示す図である。It is a figure showing roughly the composition of appearance inspection device 1 concerning a 1st embodiment of the present invention. 外観検査装置1における遮光体13の動作を説明するための図である。It is a figure for demonstrating operation | movement of the light-shielding body 13 in the external appearance inspection apparatus 1. FIG. 外観検査装置1における遮光体13の動作を説明するための図である。It is a figure for demonstrating operation | movement of the light-shielding body 13 in the external appearance inspection apparatus 1. FIG. 本発明の第2実施形態に係る外観検査装置1Aの構成を概略的に示す図である。It is a figure which shows roughly the structure of the external appearance inspection apparatus 1A which concerns on 2nd Embodiment of this invention. 本発明の第3実施形態に係る外観検査装置において用いられる遮光体13Bの構成を示す図である。It is a figure which shows the structure of the light-shielding body 13B used in the external appearance inspection apparatus which concerns on 3rd Embodiment of this invention. 本発明の第3実施形態に係る外観検査装置1Bの構成を概略的に示す図である。It is a figure which shows roughly the structure of the external appearance inspection apparatus 1B which concerns on 3rd Embodiment of this invention. 本発明の第4実施形態に係る外観検査装置1Cの構成を概略的に示す図である。It is a figure which shows roughly the structure of the visual inspection apparatus 1C which concerns on 4th Embodiment of this invention. 第1の従来技術の外観検査装置の構成を概略的に示す図である。It is a figure which shows roughly the structure of the external appearance inspection apparatus of a 1st prior art.

以下に、本発明の欠陥検査装置の実施の形態について図面を参照しながら説明する。なお、各図における構成部材のそれぞれの厚みや長さなどは図面作成上の観点から、図示する構成に限定されるものではない。   Embodiments of a defect inspection apparatus according to the present invention will be described below with reference to the drawings. In addition, each thickness, length, etc. of the structural member in each figure are not limited to the structure to illustrate from a viewpoint on drawing preparation.

(第1実施形態)
図1は、本発明の第1実施形態に係る外観検査装置1の構成を概略的に示す図である。図2および図3は、外観検査装置1における遮光体13の動作を説明するための図である。本実施形態の外観検査装置1は、被検査体10に存在する欠陥を検出して外観を検査するための装置である。被検査体10としては、ガラス板や液晶パネルなどの平板状の板状体または、緩やかな曲率を有する曲面体が挙げられる。
(First embodiment)
FIG. 1 is a diagram schematically showing a configuration of an appearance inspection apparatus 1 according to the first embodiment of the present invention. 2 and 3 are diagrams for explaining the operation of the light shield 13 in the appearance inspection apparatus 1. FIG. The appearance inspection apparatus 1 according to the present embodiment is an apparatus for detecting the defects present in the inspection object 10 and inspecting the appearance. Examples of the object to be inspected 10 include a flat plate-like body such as a glass plate or a liquid crystal panel, or a curved body having a gentle curvature.

外観検査装置1は、明視野光成分および暗視野光成分を含む光を出射する光出射部11aを有する光照射部11と、受光部であるラインセンサカメラ12と、光量調整部材である遮光体13と、載置部14と、照明制御部15と、画像解析部として機能する画像処理部16と、光量調整部材移動制御部として機能する遮光体制御部17と、載置部移動制御部として機能する搬送系制御部18とを備える。外観検査装置1は、詳細については後述するが、ラインセンサカメラ12で取得される明視野像および暗視野像に基づいて、被検査体10に存在する欠陥を検出して外観検査を行う。   The appearance inspection apparatus 1 includes a light irradiation unit 11 having a light emitting unit 11a that emits light including a bright field light component and a dark field light component, a line sensor camera 12 that is a light receiving unit, and a light shielding body that is a light amount adjusting member. 13, a placement unit 14, an illumination control unit 15, an image processing unit 16 that functions as an image analysis unit, a light-blocking body control unit 17 that functions as a light amount adjustment member movement control unit, and a placement unit movement control unit And a functioning transport system controller 18. Although the details will be described later, the appearance inspection apparatus 1 performs appearance inspection by detecting defects present in the inspection object 10 based on the bright field image and the dark field image acquired by the line sensor camera 12.

ここで、「明視野」とは、光照射部11により照射された光が、被検査体10において、正反射(散乱を伴わない反射)または透過して、直接的にラインセンサカメラ12に入射する照明条件として定義される。また、「暗視野」とは、光照射部11により照射された光が、被検査体10において、正反射(散乱を伴わない反射)または透過して、直接的にラインセンサカメラ12に入射することがない照明条件として定義される。「暗視野」は、強すぎる直射光を検出しないようにして(ハレーションを抑制して)直射光よりも微弱な散乱光などを検出する目的に使用される。   Here, “bright field” means that the light irradiated by the light irradiation unit 11 is directly reflected (reflected without scattering) or transmitted through the inspected object 10 and directly enters the line sensor camera 12. Defined as lighting conditions. In addition, the “dark field” means that the light irradiated by the light irradiation unit 11 is directly reflected (reflected without scattering) or transmitted through the inspected object 10 and directly enters the line sensor camera 12. It is defined as a lighting condition that never happens. The “dark field” is used for the purpose of detecting scattered light or the like that is weaker than direct light without detecting too strong direct light (suppressing halation).

ラインセンサカメラ12で取得される明視野像は、明視野の照明条件に応じた、光照射部11の光出射部11aから出射された光の明視野光成分に基づく画像であり、ラインセンサカメラ12で取得される暗視野像は、暗視野の照明条件に応じた、光照射部11の光出射部11aから出射された光の暗視野光成分に基づく画像である。   The bright field image acquired by the line sensor camera 12 is an image based on the bright field light component of the light emitted from the light emitting unit 11a of the light irradiation unit 11 according to the bright field illumination condition. The dark field image acquired at 12 is an image based on the dark field light component of the light emitted from the light emitting unit 11a of the light irradiation unit 11 according to the dark field illumination conditions.

載置部14は、被検査体10を載置するものである。この載置部14は、ホストコンピュータによって実現される制御部19によって制御された搬送系制御部18によって、被検査体10が載置された状態で往復運動されて、矢符A1および矢符A2の方向に移動される。本実施形態では、搬送系制御部18によって往復運動されて載置部14が移動する移動方向A1,A2は水平方向に一致し、載置部14に載置された被検査体10は、水平状態に保持されて、移動方向A1,A2に移動して往復運動する。   The placement unit 14 places the object 10 to be inspected. The placement unit 14 is reciprocated in a state where the object 10 is placed by the transport system control unit 18 controlled by the control unit 19 realized by the host computer, and the arrows A1 and A2 are moved. Moved in the direction of. In this embodiment, the moving directions A1 and A2 in which the placement unit 14 is moved by the reciprocating motion by the transport system control unit 18 coincide with the horizontal direction, and the object 10 placed on the placement unit 14 is horizontal. The state is held and moves in the moving directions A1 and A2 to reciprocate.

光照射部11は、載置部14に載置された被検査体10の一方主面に対向して配設され、明視野光成分および暗視野光成分を含む光を出射する光出射部11aを有し、該光出射部11aから出射された光を、載置部14に載置された被検査体10に照射する。光照射部11は、制御部19によって制御された照明制御部15によって、被検査体10に光を照射する光照射動作が制御される。   The light irradiation unit 11 is disposed to face one main surface of the inspection object 10 placed on the placement unit 14 and emits light including a bright field light component and a dark field light component. The object 10 to be inspected placed on the placing portion 14 is irradiated with the light emitted from the light emitting portion 11a. In the light irradiation unit 11, the light irradiation operation of irradiating the object 10 with light is controlled by the illumination control unit 15 controlled by the control unit 19.

光照射部11は、載置部14の移動方向A1,A2を含む水平面上で移動方向A1,A2に垂直な方向(第1の方向;被検査体10の幅方向に平行な方向)に線状に延びる線状光源であることが好ましい。このような光照射部11としては、LEDがアレイ状に配置された線状光源、ハロゲンランプとライン状光ファイバライトガイドとが組合された線状光源、ハロゲンランプと長尺のロッドとが組合された線状光源などが挙げられる。本実施形態では、光照射部11は、白色LEDがアレイ状に配置された線状光源を採用し、400mm×25mm(移動方向A1,A2に垂直な方向に対応する長さが400mmで、移動方向A1,A2に対応する長さが25mmである)の発光面を有する光出射部11aを備えた線状光源を採用した。また、光照射部11は、光出射部11aの発光面から出射される照明光の拡散性や、被検査体10に対する光の成分を調整するための、拡散板や、プリズムシートなどを備える構造としてもよい。なお、光出射部11aは、光照射部11において光が出射される開口部分であり、この開口部分に透明なガラス板や光拡散板が配置されている場合には、この部分が光出射部11aとなる。   The light irradiation unit 11 is a line in a direction perpendicular to the movement directions A1 and A2 (first direction; a direction parallel to the width direction of the object 10) on the horizontal plane including the movement directions A1 and A2 of the placement unit 14. It is preferable that the light source extends linearly. As such a light irradiation unit 11, a linear light source in which LEDs are arranged in an array, a linear light source in which a halogen lamp and a linear optical fiber light guide are combined, a halogen lamp and a long rod are combined. The linear light source etc. which were made are mentioned. In this embodiment, the light irradiation unit 11 employs a linear light source in which white LEDs are arranged in an array, and has a length of 400 mm × 25 mm (the length corresponding to the direction perpendicular to the moving directions A1 and A2 is 400 mm, and moves). The linear light source provided with the light emission part 11a which has the light emission surface of the length corresponding to direction A1, A2 is 25 mm was employ | adopted. The light irradiation unit 11 includes a diffusing plate, a prism sheet, and the like for adjusting the diffusibility of the illumination light emitted from the light emitting surface of the light emitting unit 11a and the light component with respect to the device under test 10. It is good. In addition, the light emission part 11a is an opening part from which light is emitted in the light irradiation part 11, and when a transparent glass plate or a light diffusion plate is disposed in this opening part, this part is the light emission part. 11a.

ラインセンサカメラ12は、載置部14に載置された被検査体10に対して、光照射部11と同じ側に配設され、載置部14の移動方向A1,A2を含む水平面上で移動方向A1,A2に垂直な方向(第1の方向;被検査体10の幅方向に平行な方向)に複数の受光素子が配列される受光部である。ラインセンサカメラ12は、光照射部11によって明視野光成分および暗視野光成分を含む光が照射された被検査体10からの反射光を受光し、その受光した反射光の光強度(照度:ルクス)を測定するとともに、受光した反射光に基づいて明視野像および暗視野像を取得する。   The line sensor camera 12 is disposed on the same side as the light irradiation unit 11 with respect to the inspection object 10 placed on the placement unit 14, and on a horizontal plane including the movement directions A1 and A2 of the placement unit 14. A light receiving section in which a plurality of light receiving elements are arranged in a direction perpendicular to the moving directions A1 and A2 (first direction; a direction parallel to the width direction of the inspection object 10). The line sensor camera 12 receives the reflected light from the inspection object 10 irradiated with the light including the bright field light component and the dark field light component by the light irradiation unit 11, and the light intensity (illuminance: Lux) and a bright-field image and a dark-field image are acquired based on the received reflected light.

ラインセンサカメラ12は、載置部14の移動方向A1,A2に移動される被検査体10上に焦点位置Pが存在するように合焦されて撮像位置が固定されている。すなわち、ラインセンサカメラ12が撮像しているのは、被検査体10上の焦点位置Pを含む1ラインであり、被検査体10が移動方向A1,A2に移動されることによって被検査体10の全体画像を撮像する。逆に、被検査体10上の焦点位置Pを含む1ライン以外からの光は検出されない。   The line sensor camera 12 is focused so that the focal position P exists on the inspection object 10 moved in the movement directions A1 and A2 of the mounting portion 14, and the imaging position is fixed. That is, the line sensor camera 12 captures one line including the focal position P on the inspection object 10, and the inspection object 10 is moved by moving the inspection object 10 in the movement directions A1 and A2. The whole image of is taken. Conversely, light from other than one line including the focal position P on the object to be inspected 10 is not detected.

このようなラインセンサカメラ12としては、ラインCCD(Charge Coupled Device)カメラが代表的であるが、他には、MOS(Metal-Oxide Semiconductor)型カメラや、フォトダイオードをライン状に並べたカメラなどを用いることができる。ラインセンサカメラ12には、撮像対象である被検査体10の光像を受光素子に結像させるためのレンズなどが付属されている。   As such a line sensor camera 12, a line CCD (Charge Coupled Device) camera is typical, but other than that, a MOS (Metal-Oxide Semiconductor) type camera, a camera in which photodiodes are arranged in a line, or the like. Can be used. The line sensor camera 12 is attached with a lens or the like for forming an optical image of the object 10 to be inspected on the light receiving element.

ラインセンサカメラ12は、被検査体10上の焦点位置Pを含む1ラインを検出することから、図1〜図3に示される、レンズの光軸Lを中心とする視野範囲R1の領域が、載置部14の移動方向A1,A2に平行な方向の視野範囲になる。すなわち、被検査体10上の焦点位置Pを含む1ラインで反射または散乱された光の成分のうち、視野範囲R1に含まれる成分がラインセンサカメラ12にて検出される。視野範囲R1の広がり角度は、ラインセンサカメラ12のレンズ性能に依存する。本実施形態では、ラインセンサカメラ12としては、画素サイズ5μm×5μm、約12300画素のラインセンサが用いられる。   Since the line sensor camera 12 detects one line including the focal position P on the object 10 to be inspected, the region of the visual field range R1 centered on the optical axis L of the lens shown in FIGS. The viewing field range is parallel to the moving directions A1 and A2 of the mounting portion 14. That is, among the components of light reflected or scattered by one line including the focal position P on the object 10 to be inspected, the line sensor camera 12 detects a component included in the visual field range R1. The spread angle of the visual field range R1 depends on the lens performance of the line sensor camera 12. In the present embodiment, a line sensor having a pixel size of 5 μm × 5 μm and about 12300 pixels is used as the line sensor camera 12.

また、本実施形態の外観検査装置1では、被検査体10上の焦点位置Pを含む1ラインをラインセンサカメラ12にて検出するため、光照射部11の光出射部11aから出射された光の成分の中で、ラインセンサカメラ12での撮像に寄与する成分は、図1〜図3に示される、照射領域R2である。本実施形態では、照射領域R2に視野範囲R1が含まれる光学条件や位置関係で、光照射部11とラインセンサカメラ12とが配置されている。   Further, in the appearance inspection apparatus 1 according to the present embodiment, the line sensor camera 12 detects one line including the focal position P on the inspected object 10, so that the light emitted from the light emitting unit 11 a of the light emitting unit 11 is used. Among these components, a component that contributes to imaging with the line sensor camera 12 is an irradiation region R2 shown in FIGS. In this embodiment, the light irradiation part 11 and the line sensor camera 12 are arrange | positioned by the optical conditions and positional relationship in which the visual field range R1 is contained in irradiation region R2.

制御部19によって制御された画像処理部16は、ラインセンサカメラ12によって取得された明視野像および暗視野像について予め定める画像解析を行い、被検査体10の欠陥を検出する。   The image processing unit 16 controlled by the control unit 19 performs predetermined image analysis on the bright field image and the dark field image acquired by the line sensor camera 12, and detects a defect of the inspection object 10.

遮光体13は、載置部14と光照射部11との間の位置において、光出射部11aの発光面に平行(光照射部11およびラインセンサカメラ12の延在方向である第1の方向に垂直な第2の方向)に直線的に移動可能に設けられ、移動することによって光照射部11の光出射部11aから出射された光の一部を遮光して、被検査体10に照射される光の光量を調整する。遮光体13を移動させる移動手段としては、駆動モータと移動案内ガイドとが組合された構造体が挙げられるが、この構造体に限定されるものではない。   The light shield 13 is parallel to the light emitting surface of the light emitting unit 11a at a position between the mounting unit 14 and the light emitting unit 11 (a first direction that is an extending direction of the light emitting unit 11 and the line sensor camera 12). In a second direction perpendicular to the light beam), and by moving, a part of the light emitted from the light emitting part 11a of the light irradiating part 11 is shielded to irradiate the inspected object 10 Adjust the amount of light emitted. Examples of the moving means for moving the light blocking body 13 include a structure in which a drive motor and a movement guide are combined. However, the moving means is not limited to this structure.

遮光体13は、光照射部11の光出射部11aの発光面よりも大きい平板状の部材である。図2(b)に示すように、光出射部11aにおいて、遮光体13によって遮光されていない領域から出射された光の成分がラインセンサカメラ12にて検出される。本実施形態では、遮光体13としては、450mm×30mm(載置部14の移動方向A1,A2に垂直な方向に対応する長さが450mmで、移動方向A1,A2に対応する長さが30mmである)のアルミニウム部材に黒アルマイト処理が施された部材が用いられる。また、遮光体13のエッジ部分は、必要に応じてナイフエッジ状の形状であっても良い。   The light shielding body 13 is a flat plate-shaped member that is larger than the light emitting surface of the light emitting section 11 a of the light irradiation section 11. As shown in FIG. 2B, in the light emitting unit 11 a, the line sensor camera 12 detects a component of light emitted from a region that is not shielded by the light shield 13. In the present embodiment, the light shield 13 is 450 mm × 30 mm (the length corresponding to the direction perpendicular to the moving directions A1 and A2 of the mounting portion 14 is 450 mm, and the length corresponding to the moving directions A1 and A2 is 30 mm. A member obtained by performing black alumite treatment on the aluminum member. Moreover, the edge part of the light-shielding body 13 may have a knife-edge shape as necessary.

遮光体13は、制御部19により制御される遮光体制御部17によって、載置部14と光照射部11との間における移動動作が制御される。遮光体制御部17は、光照射部11の光出射部11aから出射された光の明視野光成分を遮光可能な明視野光成分遮光位置と、光出射部11aから出射された光の暗視野光成分を遮光可能な暗視野光成分遮光位置とにわたって、遮光体13を直線的に移動させる。   The movement of the light shield 13 between the placement unit 14 and the light irradiation unit 11 is controlled by the light shield control unit 17 controlled by the control unit 19. The light-shielding body control unit 17 includes a bright-field light component shielding position capable of shielding a bright-field light component of light emitted from the light emitting unit 11a of the light emitting unit 11, and a dark field of light emitted from the light emitting unit 11a. The light shield 13 is linearly moved over the dark field light component light shielding position where the light component can be shielded.

ここで、ラインセンサカメラ12は、図2(a)に示すように、遮光体制御部17によって遮光体13が暗視野光成分遮光位置に移動されて、光出射部11aから出射された光の暗視野光成分が遮光されると、明視野光成分に基づく明視野像を取得する。また、ラインセンサカメラ12は、図3に示すように、遮光体制御部17によって遮光体13が明視野光成分遮光位置に移動されて、光出射部11aから出射された光の明視野光成分が遮光されると、暗視野光成分に基づく暗視野像を取得する。   Here, in the line sensor camera 12, as shown in FIG. 2A, the light shielding unit 13 is moved to the dark field light component light shielding position by the light shielding unit control unit 17, and the light emitted from the light emitting unit 11a is transmitted. When the dark field light component is blocked, a bright field image based on the bright field light component is acquired. Further, in the line sensor camera 12, as shown in FIG. 3, the light shielding unit 13 is moved to the bright field light component shielding position by the light shielding unit control unit 17, and the bright field light component of the light emitted from the light emitting unit 11a. Is shielded, a dark field image based on the dark field light component is acquired.

具体的には、前述したように、ラインセンサカメラ12は、視野範囲R1の領域に含まれる反射光または散乱光を検出する。また、光照射部11の光出射部11aから出射された光の成分のうち、ラインセンサカメラ12にて検出される成分は、照射領域R2に含まれる成分である。すなわち、図2(a)および図3において、光出射部11aから出射される照射領域R2の成分のうち、視野範囲R1と重なっている成分は、ラインセンサカメラ12に対する明視野光成分となり、照射領域R2の成分のうち、視野範囲R1と重なっていない成分は、ラインセンサカメラ12に対する暗視野光成分となる。   Specifically, as described above, the line sensor camera 12 detects reflected light or scattered light included in the region of the visual field range R1. Of the light components emitted from the light emitting unit 11a of the light emitting unit 11, the components detected by the line sensor camera 12 are components included in the irradiation region R2. That is, in FIG. 2A and FIG. 3, among the components of the irradiation region R2 emitted from the light emitting unit 11a, the component overlapping the visual field range R1 becomes a bright field light component for the line sensor camera 12, and the irradiation is performed. Of the components in the region R2, the component that does not overlap the visual field range R1 is a dark field light component for the line sensor camera 12.

図2(a)に示すように、遮光体制御部17によって遮光体13が暗視野光成分遮光位置に移動されて、光出射部11aから出射される照射領域R2の成分のうち、ラインセンサカメラ12に対する暗視野光成分が遮光されると、ラインセンサカメラ12は明視野光学系にて被検査体10を撮像して明視野像を取得することになる。光照射部11、ラインセンサカメラ12、および遮光体13の相対位置を維持した状態で、搬送系制御部18が載置部14を移動方向A1に移動させると、載置部14の移動に応じて移動方向A1に移動する被検査体10に対して、ラインセンサカメラ12で明視野像を取得することができる。このようにして取得された明視野像について、画像処理部16が画像解析を行うことによって、被検査体10に存在する欠陥が検出され、良品、不良品、再検査品などの判定が行われて、明視野光学系を用いた外観検査を行うことができる。   As shown in FIG. 2A, the light shield 13 is moved to the dark field light component light shielding position by the light shield controller 17, and the line sensor camera among the components of the irradiation region R2 emitted from the light emitter 11a. When the dark field light component 12 is shielded, the line sensor camera 12 captures the inspected object 10 with a bright field optical system and acquires a bright field image. When the transport system control unit 18 moves the placement unit 14 in the movement direction A1 while maintaining the relative positions of the light irradiation unit 11, the line sensor camera 12, and the light shielding body 13, the movement of the placement unit 14 is changed. Thus, a bright-field image can be acquired by the line sensor camera 12 for the inspection object 10 moving in the movement direction A1. The image processing unit 16 performs image analysis on the bright field image acquired in this manner, thereby detecting defects existing in the inspected object 10 and determining non-defective products, defective products, re-inspected products, and the like. Thus, an appearance inspection using a bright field optical system can be performed.

また、図3に示すように、遮光体制御部17によって遮光体13が明視野光成分遮光位置に移動されて、光出射部11aから出射される照射領域R2の成分のうち、ラインセンサカメラ12に対する明視野光成分が遮光されると、ラインセンサカメラ12は暗視野光学系にて被検査体10を撮像して暗視野像を取得することになる。光照射部11、ラインセンサカメラ12、および遮光体13の相対位置を維持した状態で、搬送系制御部18が載置部14を移動方向A2に移動させると、載置部14の移動に応じて移動方向A2に移動する被検査体10に対して、ラインセンサカメラ12で暗視野像を取得することができる。このようにして取得された暗視野像について、画像処理部16が画像解析を行うことによって、被検査体10に存在する欠陥が検出され、良品、不良品、再検査品などの判定が行われて、暗視野光学系を用いた外観検査を行うことができる。   As shown in FIG. 3, the line sensor camera 12 among the components of the irradiation region R <b> 2 emitted from the light emitting unit 11 a when the light shielding unit 13 is moved to the bright field light component shielding position by the light shielding unit control unit 17. When the bright field light component is blocked, the line sensor camera 12 captures the inspected object 10 by the dark field optical system and acquires a dark field image. When the transport system control unit 18 moves the mounting unit 14 in the movement direction A2 while maintaining the relative positions of the light irradiation unit 11, the line sensor camera 12, and the light shielding body 13, the movement of the mounting unit 14 is changed. Thus, a dark field image can be acquired by the line sensor camera 12 with respect to the inspection object 10 moving in the movement direction A2. The image processing unit 16 performs image analysis on the dark field image acquired in this manner, thereby detecting defects present in the inspected object 10 and determining non-defective products, defective products, re-inspected products, and the like. Thus, an appearance inspection using a dark field optical system can be performed.

また、暗視野光学系の状態から、一部の明視野光成分をラインセンサカメラ12で受光できるような明暗視野状態が複合した光学系も構成可能である。たとえば、被検査体10が液晶パネルのように、ガラス表面や金属端子などが含まれるような検査対象物の場合、明視野光学系では端子部分の反射率が高く、端子部がハレーションするため、撮像画像で解析および検査ができない状態が生じてしまう。暗視野光学系の状態から、一部の明視野光成分が加わった状態で、ラインセンサカメラ12で撮像することにより、端子部分がハレーションしていない画像を取得することができる。また、凸形状や凹形状などの曲面を有する欠陥検出の場合、正常な領域が中間階調で検出され、異常箇所が低階調または高階調で検出される。   Further, it is possible to configure an optical system in which a bright field state and a dark field state in which a part of the bright field light component can be received by the line sensor camera 12 from the state of the dark field optical system. For example, when the object to be inspected 10 is an inspection object including a glass surface or a metal terminal such as a liquid crystal panel, the bright field optical system has a high reflectance of the terminal portion, and the terminal portion is halated. A state in which analysis and inspection cannot be performed on the captured image occurs. By capturing an image with the line sensor camera 12 in a state where a part of the bright field light component is added from the state of the dark field optical system, an image in which the terminal portion is not halated can be acquired. In the case of detecting a defect having a curved surface such as a convex shape or a concave shape, a normal region is detected with an intermediate gradation, and an abnormal portion is detected with a low gradation or a high gradation.

また、遮光体制御部17は、搬送系制御部18による載置部14の、移動方向A1,A2への往復運動に連動して、移動方向A1,A2に沿って直線的に、遮光体13を移動させる。さらに、載置部14の往復運動に連動して、照明制御部15によって光照射部11を発光させるための制御値を往路復路で変更するように制御してもよい。具体的な例としては、光照射部11の光出射部11aから出射される光の光量である光照射輝度値を制御値とし、載置部14の往動作と復動作とで光照射輝度値が異なるように制御してもよい。   The light shield control unit 17 is linearly moved along the movement directions A1 and A2 in conjunction with the reciprocation of the placement unit 14 in the movement directions A1 and A2 by the transport system control unit 18. Move. Further, in conjunction with the reciprocating motion of the mounting unit 14, the control value for causing the light irradiation unit 11 to emit light may be controlled by the illumination control unit 15 so as to be changed in the forward path. As a specific example, the light irradiation luminance value that is the amount of light emitted from the light emitting unit 11a of the light irradiation unit 11 is used as a control value, and the light irradiation luminance value is determined by the forward operation and the backward operation of the mounting unit 14. May be controlled to be different.

このような構成においては、ラインセンサカメラ12によって明視野像を取得する場合と、暗視野像を取得する場合との切り替えを、直線状に延びる光照射部11およびラインセンサカメラ12の延在方向に垂直な方向である移動方向A1,A2に、遮光体13を移動させることによって、実施することになる。遮光体13が移動する方向は、光照射部11およびラインセンサカメラ12の延在方向に垂直な方向であるので、比較的短い距離を遮光体13が移動することによって、ラインセンサカメラ12によって明視野像を取得する場合と、暗視野像を取得する場合との切り替えを実施することができる。   In such a configuration, when the bright field image is acquired by the line sensor camera 12 and when the dark field image is acquired, the linearly extending light irradiation unit 11 and the extending direction of the line sensor camera 12 are switched. This is implemented by moving the light shield 13 in the movement directions A1 and A2 that are perpendicular to each other. Since the direction in which the light shield 13 moves is a direction perpendicular to the extending direction of the light irradiation unit 11 and the line sensor camera 12, the light sensor 13 moves by a relatively short distance, so Switching between the case of acquiring a field image and the case of acquiring a dark field image can be performed.

また、遮光体制御部17が載置部14の往復運動に連動して遮光体13を移動させる形態において、たとえば、搬送系制御部18が載置部14を、図2(a)に示すように、移動方向A1に往運動させる場合に、遮光体制御部17が遮光体13を暗視野光成分遮光位置に移動させることによって、載置部14の往運動に応じて移動方向A1に移動する被検査体10に対して、ラインセンサカメラ12で明視野像を取得することができ、これによって明視野光学系を用いた外観検査を行うことができる。また、搬送系制御部18が載置部14を、図3に示すように、移動方向A2に復運動させる場合に、遮光体制御部17が遮光体13を明視野光成分遮光位置に移動させることによって、載置部14の復運動に応じて移動方向A2に移動する被検査体10に対して、ラインセンサカメラ12で暗視野像を取得することができ、これによって暗視野光学系を用いた外観検査を行うことができる。   Further, in a mode in which the light shielding body control unit 17 moves the light shielding body 13 in conjunction with the reciprocating motion of the placement unit 14, for example, the transport system control unit 18 shows the placement unit 14 as shown in FIG. In addition, when the forward movement is performed in the movement direction A1, the light-shielding body control unit 17 moves the light-shielding body 13 to the dark field light component light-shielding position, thereby moving in the movement direction A1 according to the forward movement of the placement unit 14. A bright field image can be acquired with respect to the inspected object 10 by the line sensor camera 12, whereby an appearance inspection using a bright field optical system can be performed. Further, when the transport system control unit 18 moves the mounting unit 14 back in the movement direction A2 as shown in FIG. 3, the light shielding unit control unit 17 moves the light shielding unit 13 to the bright field light component light shielding position. Thus, a dark field image can be acquired by the line sensor camera 12 with respect to the inspected object 10 that moves in the movement direction A2 in accordance with the backward movement of the placement unit 14, and thus the dark field optical system is used. Visual inspection can be performed.

以上のように構成される本実施形態の外観検査装置1は、明視野光成分と暗視野光成分とを含む光を出射可能に構成される1つの光照射部11と、遮光体13によって遮光される成分以外の光成分に基づいて明視野像および暗視野像を取得可能に構成される1つのラインセンサカメラ12とによる、簡単な構成で、明視野光学系および暗視野光学系の両方の光学系を用いて被検査体10の外観検査を行うことができ、装置サイズの小型化および装置コストの低コスト化が達成可能である。   The appearance inspection apparatus 1 of the present embodiment configured as described above is shielded by one light irradiation unit 11 configured to be able to emit light including a bright field light component and a dark field light component, and a light shielding body 13. Both the bright-field optical system and the dark-field optical system with a simple configuration with a single line sensor camera 12 configured to be able to acquire a bright-field image and a dark-field image based on a light component other than the component to be The appearance inspection of the inspected object 10 can be performed using the optical system, and the apparatus size can be reduced and the apparatus cost can be reduced.

(第2実施形態)
図4は、本発明の第2実施形態に係る外観検査装置1Aの構成を概略的に示す図である。本実施形態の外観検査装置1Aは、前述の外観検査装置1に類似し、対応する部分については同一の参照符号を付して説明を省略する。
(Second Embodiment)
FIG. 4 is a diagram schematically showing the configuration of an appearance inspection apparatus 1A according to the second embodiment of the present invention. The appearance inspection apparatus 1A of the present embodiment is similar to the above-described appearance inspection apparatus 1, and corresponding portions are denoted by the same reference numerals and description thereof is omitted.

前述の外観検査装置1では、遮光体13は、載置部14と光照射部11との間において、光照射部11の光出射部11aから出射された光の明視野光成分を遮光可能な明視野光成分遮光位置と、光出射部11aから出射された光の暗視野光成分を遮光可能な暗視野光成分遮光位置とにわたって、遮光体制御部17によって直線的に移動されるように構成されていた。これに対して、外観検査装置1Aでは、遮光体13Aは、載置部14と光照射部11との間において、予め定める回動軸まわりに回動することによって、光照射部11の光出射部11aから出射された光の明視野光成分を遮光可能な明視野光成分遮光位置と、光出射部11aから出射された光の暗視野光成分を遮光可能な暗視野光成分遮光位置とにわたって、移動するように構成されている。   In the above-described appearance inspection apparatus 1, the light blocking body 13 can block the bright field light component of the light emitted from the light emitting unit 11 a of the light emitting unit 11 between the mounting unit 14 and the light emitting unit 11. The light-shielding body controller 17 is configured to move linearly across the bright-field light component shielding position and the dark-field light component shielding position capable of shielding the dark-field light component of the light emitted from the light emitting unit 11a. It had been. On the other hand, in the appearance inspection apparatus 1A, the light shielding unit 13A rotates around a predetermined rotation axis between the mounting unit 14 and the light irradiation unit 11, thereby emitting light from the light irradiation unit 11. The bright field light component shielding position capable of shielding the bright field light component of the light emitted from the portion 11a and the dark field light component shielding position capable of shielding the dark field light component of the light emitted from the light emitting portion 11a. Configured to move.

このように、遮光体13Aが回動移動するように構成されることによって、遮光体13Aが、ラインセンサカメラ12における視野範囲R1を遮ることを抑制することができる。これによって、ラインセンサカメラ12のレンズの光軸Lと光照射部11の中心軸との成す角度を小さくすることができ、光学系の配置自由度を高めることができる。また、遮光体13Aのサイズを大きくすることができることから、光照射部11の選定自由度も高めることができる。   In this way, by configuring the light shield 13A to rotate, it is possible to prevent the light shield 13A from blocking the visual field range R1 in the line sensor camera 12. As a result, the angle formed by the optical axis L of the lens of the line sensor camera 12 and the central axis of the light irradiation unit 11 can be reduced, and the degree of freedom of arrangement of the optical system can be increased. In addition, since the size of the light shield 13A can be increased, the degree of freedom in selecting the light irradiation unit 11 can also be increased.

また、本実施形態の外観検査装置1Aにおいても、明視野光成分と暗視野光成分とを含む光を出射可能に構成される1つの光照射部11と、遮光体13によって遮光される成分以外の光成分に基づいて明視野像および暗視野像を取得可能に構成される1つのラインセンサカメラ12とによる、簡単な構成で、反射型の明視野光学系および暗視野光学系の両方の光学系を用いて被検査体10の外観検査を行うことができ、装置サイズの小型化および装置コストの低コスト化が達成可能である。   Also in the appearance inspection apparatus 1A of the present embodiment, a light irradiation unit 11 configured to be able to emit light including a bright-field light component and a dark-field light component, and components other than the components shielded by the light-shielding body 13 Both the reflection-type bright-field optical system and the dark-field optical system with a simple configuration with the single line sensor camera 12 configured to be able to acquire a bright-field image and a dark-field image based on the light components of The appearance inspection of the inspected object 10 can be performed using the system, and the apparatus size can be reduced and the apparatus cost can be reduced.

(第3実施形態)
図5は、本発明の第3実施形態に係る外観検査装置において用いられる遮光体13Bの構成を示す図である。図6は、本発明の第3実施形態に係る外観検査装置1Bの構成を概略的に示す図である。本実施形態の外観検査装置1Bは、前述の外観検査装置1に類似し、対応する部分については同一の参照符号を付して説明を省略する。
(Third embodiment)
FIG. 5 is a diagram showing a configuration of a light shield 13B used in the appearance inspection apparatus according to the third embodiment of the present invention. FIG. 6 is a diagram schematically showing a configuration of an appearance inspection apparatus 1B according to the third embodiment of the present invention. The appearance inspection apparatus 1B of the present embodiment is similar to the appearance inspection apparatus 1 described above, and corresponding portions are denoted by the same reference numerals and description thereof is omitted.

本実施形態の外観検査装置1Bでは、遮光体13Bの構成が、前述の外観検査装置1に備えられる遮光体13の構成とは異なる。外観検査装置1Bに備えられる遮光体13Bは、光照射部11の光出射部11aから出射された光を遮光する遮光領域と、光出射部11aから出射された光を透過する透過領域とを有する。より具体的には、図5に示すように、遮光体13Bは、光出射部11aの発光面よりも大きい平板状の部材であり、中央部に開口部131が形成されて構成されている。この開口部131が、光出射部11aから出射された光を透過する透過領域となる。なお、図5では、透過領域として開口部131が形成された遮光体13Bを示したが、遮光体13Bは、透過領域として切り欠き部が形成された部材であってもよい。   In the appearance inspection apparatus 1B of the present embodiment, the configuration of the light shielding body 13B is different from the configuration of the light shielding body 13 provided in the above-described appearance inspection apparatus 1. The light shielding body 13B provided in the appearance inspection apparatus 1B includes a light shielding region that blocks light emitted from the light emitting unit 11a of the light irradiation unit 11, and a transmission region that transmits light emitted from the light emitting unit 11a. . More specifically, as shown in FIG. 5, the light shield 13B is a flat plate-like member that is larger than the light emitting surface of the light emitting portion 11a, and has an opening 131 formed at the center. The opening 131 becomes a transmission region that transmits the light emitted from the light emitting portion 11a. In FIG. 5, the light shielding body 13 </ b> B in which the opening 131 is formed as the transmissive region is shown, but the light shielding body 13 </ b> B may be a member in which a cutout portion is formed as the transmissive region.

本実施形態では、図6(a)に示すように、光出射部11aから出射される照射領域R2の成分のうち、視野範囲R1と重なる明視野光成分が開口部131を透過するような位置である、暗視野光成分遮光位置に遮光体13Bが移動されると、ラインセンサカメラ12に対する暗視野光成分が遮光され、ラインセンサカメラ12は明視野光学系にて被検査体10を撮像して明視野像を取得することになる。   In the present embodiment, as shown in FIG. 6A, among the components of the irradiation region R2 emitted from the light emitting portion 11a, the bright field light component that overlaps the visual field range R1 is transmitted through the opening 131. When the light shield 13B is moved to the dark field light component light shielding position, the dark field light component with respect to the line sensor camera 12 is shielded, and the line sensor camera 12 images the object to be inspected 10 with the bright field optical system. Thus, a bright field image is acquired.

また、図6(b)に示すように、光出射部11aから出射される照射領域R2の成分のうち、視野範囲R1と重なっていない暗視野光成分が開口部131を透過するような位置である、明視野光成分遮光位置に遮光体13Bが移動されると、ラインセンサカメラ12に対する明視野光成分が遮光され、ラインセンサカメラ12は暗視野光学系にて被検査体10を撮像して暗視野像を取得することになる。   In addition, as shown in FIG. 6B, among the components of the irradiation region R2 emitted from the light emitting portion 11a, the dark field light component that does not overlap with the visual field range R1 passes through the opening 131. When the light-shielding body 13B is moved to a certain bright-field light component light-shielding position, the bright-field light component for the line sensor camera 12 is shielded, and the line sensor camera 12 images the object to be inspected 10 with the dark-field optical system. A dark field image is acquired.

本実施形態では、透過領域となる開口部131が形成された遮光体13Bは、光出射部11aの発光面よりも大きい平板状の部材であるので、光出射部11aから出射される光において、開口部131から透過する光以外の光を全て、遮光体13Bによって遮光することができる。   In the present embodiment, the light shielding body 13B in which the opening 131 serving as a transmission region is formed is a flat plate-shaped member that is larger than the light emitting surface of the light emitting portion 11a. Therefore, in the light emitted from the light emitting portion 11a, All light other than the light transmitted from the opening 131 can be shielded by the light shield 13B.

また、本実施形態の外観検査装置1Bにおいても、明視野光成分と暗視野光成分とを含む光を出射可能に構成される1つの光照射部11と、遮光体13Bによって遮光される成分以外の光成分に基づいて明視野像および暗視野像を取得可能に構成される1つのラインセンサカメラ12とによる、簡単な構成で、反射型の明視野光学系および暗視野光学系の両方の光学系を用いて被検査体10の外観検査を行うことができ、装置サイズの小型化および装置コストの低コスト化が達成可能である。   Also in the appearance inspection apparatus 1B of the present embodiment, a light irradiation unit 11 configured to be able to emit light including a bright-field light component and a dark-field light component, and components other than those light-shielded by the light-shielding body 13B Both the reflection-type bright-field optical system and the dark-field optical system with a simple configuration with the single line sensor camera 12 configured to be able to acquire a bright-field image and a dark-field image based on the light components of The appearance inspection of the inspected object 10 can be performed using the system, and the apparatus size can be reduced and the apparatus cost can be reduced.

(第4実施形態)
図7は、本発明の第4実施形態に係る外観検査装置1Cの構成を概略的に示す図である。本実施形態の外観検査装置1Cは、前述の外観検査装置1に類似し、対応する部分については同一の参照符号を付して説明を省略する。
(Fourth embodiment)
FIG. 7 is a diagram schematically showing the configuration of an appearance inspection apparatus 1C according to the fourth embodiment of the present invention. The appearance inspection apparatus 1C of the present embodiment is similar to the appearance inspection apparatus 1 described above, and corresponding portions are denoted by the same reference numerals and description thereof is omitted.

前述の外観検査装置1では、ラインセンサカメラ12は、載置部14に載置された被検査体10に対して、光照射部11と同じ側に配設され、光照射部11によって明視野光成分および暗視野光成分を含む光が照射された被検査体10からの反射光を受光し、その受光した反射光の光強度(照度:ルクス)を測定するとともに、受光した反射光に基づいて明視野像および暗視野像を取得するように構成されていた。これに対して、外観検査装置1Cでは、ラインセンサカメラ12は、載置部14に載置された被検査体10に対して、光照射部11とは反対側に配設され、光照射部11によって明視野光成分および暗視野光成分を含む光が照射された被検査体10からの透過光を受光し、その受光した透過光に基づいて明視野像および暗視野像を取得する。   In the above-described appearance inspection apparatus 1, the line sensor camera 12 is disposed on the same side as the light irradiation unit 11 with respect to the inspected object 10 placed on the placement unit 14. Based on the received reflected light, the reflected light from the inspected object 10 irradiated with the light including the light component and the dark field light component is received, and the light intensity (illuminance: lux) of the received reflected light is measured. Thus, a bright field image and a dark field image are acquired. On the other hand, in the appearance inspection apparatus 1C, the line sensor camera 12 is disposed on the opposite side of the light irradiation unit 11 with respect to the inspection object 10 placed on the placement unit 14, and the light irradiation unit 11 receives the transmitted light from the object to be inspected 10 irradiated with the light including the bright field light component and the dark field light component, and acquires a bright field image and a dark field image based on the received transmitted light.

以上のように構成される本実施形態の外観検査装置1Cにおいても、明視野光成分と暗視野光成分とを含む光を出射可能に構成される1つの光照射部11と、遮光体13によって遮光される成分以外の光成分に基づいて明視野像および暗視野像を取得可能に構成される1つのラインセンサカメラ12とによる、簡単な構成で、透過型の明視野光学系および暗視野光学系の両方の光学系を用いて被検査体10の外観検査を行うことができ、装置サイズの小型化および装置コストの低コスト化が達成可能である。   Also in the appearance inspection apparatus 1 </ b> C of the present embodiment configured as described above, one light irradiation unit 11 configured to be able to emit light including a bright field light component and a dark field light component, and the light shielding body 13. A transmission-type bright-field optical system and dark-field optics with a simple configuration using one line sensor camera 12 configured to be able to acquire a bright-field image and a dark-field image based on a light component other than the light-shielded component. The appearance inspection of the object to be inspected 10 can be performed using both of the optical systems, and the apparatus size can be reduced and the apparatus cost can be reduced.

1,1A,1B,1C 外観検査装置
10 被検査体
11 光照射部
11a 光出射部
12 ラインセンサカメラ
13 遮光体
14 載置部
15 照明制御部
16 画像処理部
17 遮光体制御部
18 搬送系制御部
19 制御部
1, 1A, 1B, 1C Appearance inspection apparatus 10 Inspected object 11 Light irradiation part 11a Light emitting part 12 Line sensor camera 13 Light shielding body 14 Mounting part 15 Illumination control part 16 Image processing part 17 Light shielding body control part 18 Conveyance system control Unit 19 Control unit

Claims (5)

被検査体を載置する載置部と、
前記載置部に載置された被検査体に対向して配設され、明視野光成分および暗視野光成分を含む光を出射する光出射部を有し、該光出射部から出射された光を、前記載置部に載置された被検査体に照射する光照射部と、
前記載置部と前記光照射部との間の位置に、移動可能に設けられ、移動することによって前記光出射部から出射された光の一部を遮光して、被検査体に照射される光の光量を調整する光量調整部材と、
前記光量調整部材の移動動作を制御する光量調整部材移動制御部であって、前記光出射部から出射された光の前記明視野光成分を遮光可能な明視野光成分遮光位置と、前記光出射部から出射された光の前記暗視野光成分を遮光可能な暗視野光成分遮光位置とにわたって、前記光量調整部材を移動させる光量調整部材移動制御部と、
前記光照射部によって光が照射された被検査体からの反射光または透過光を受光する受光部と、を備えることを特徴とする外観検査装置。
A placement unit for placing the object to be inspected;
The light emitting unit is disposed opposite to the object to be inspected placed on the placing unit and emits light including a bright field light component and a dark field light component, and is emitted from the light emitting unit. A light irradiating unit that irradiates the object to be inspected placed on the mounting unit;
A movable part is provided at a position between the placement unit and the light irradiation unit, and a part of the light emitted from the light emission unit is shielded by moving to be irradiated on the object to be inspected. A light amount adjusting member for adjusting the amount of light;
A light quantity adjusting member movement control unit for controlling the movement operation of the light quantity adjusting member, wherein the bright field light component shielding position capable of shielding the bright field light component of the light emitted from the light emitting part; and the light emission A light amount adjustment member movement control unit that moves the light amount adjustment member over a dark field light component light shielding position capable of shielding the dark field light component of the light emitted from the unit;
An appearance inspection apparatus comprising: a light receiving unit that receives reflected light or transmitted light from an object to be inspected irradiated with light by the light irradiation unit.
前記光量調整部材は、該光量調整部材を構成する基材が前記光照射部の前記光出射部から出射された光を遮光する遮光領域と、該光量調整部材を構成する基材の一部に設けられた開口部または切り欠き部であって、前記光出射部から出射された光を透過する透過領域とを有することを特徴とする請求項1に記載の外観検査装置。   The light amount adjusting member includes a light shielding region in which a base material constituting the light amount adjusting member shields light emitted from the light emitting portion of the light irradiation unit, and a part of the base material constituting the light amount adjusting member. The appearance inspection apparatus according to claim 1, further comprising: an opening or a notch provided, and a transmission region that transmits light emitted from the light emitting unit. 前記光量調整部材は、前記光照射部の前記光出射部よりも大きい平板状の部材であることを特徴とする請求項2に記載の外観検査装置。   The appearance inspection apparatus according to claim 2, wherein the light amount adjustment member is a flat plate-shaped member that is larger than the light emitting portion of the light irradiation unit. 前記光照射部は、第1の方向に沿って線状に延びる線状光源であり、
前記受光部は、複数の受光素子が前記第1の方向と平行に配列されるラインセンサカメラであり、
前記光量調整部材移動制御部は、前記第1の方向に垂直な第2の方向に沿って、前記光量調整部材を移動させることを特徴とする請求項1〜3のいずれか1つに記載の外観検査装置。
The light irradiation unit is a linear light source extending linearly along the first direction,
The light receiving unit is a line sensor camera in which a plurality of light receiving elements are arranged in parallel with the first direction,
The said light quantity adjustment member movement control part moves the said light quantity adjustment member along the 2nd direction perpendicular | vertical to the said 1st direction, The Claim 1 characterized by the above-mentioned. Appearance inspection device.
前記載置部を一方向に沿って往復運動させる載置部移動制御部をさらに備え、
前記光量調整部材移動制御部は、前記載置部移動制御部による前記載置部の往復運動に連動して、前記光量調整部材を移動させることを特徴とする請求項1〜4のいずれか1つに記載の外観検査装置。
It further includes a placement unit movement control unit that reciprocates the placement unit along one direction,
The light quantity adjustment member movement control unit moves the light quantity adjustment member in conjunction with the reciprocation of the placement unit by the placement unit movement control unit. Appearance inspection device described in 1.
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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2019142662A1 (en) * 2018-01-18 2019-07-25 株式会社Sumco Evaluation method for semiconductor wafer and method for manufacturing semiconductor wafer
JP2020016506A (en) * 2018-07-24 2020-01-30 Ckd株式会社 Inspection device, ptp packaging machine, and ptp sheet manufacturing method

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2019142662A1 (en) * 2018-01-18 2019-07-25 株式会社Sumco Evaluation method for semiconductor wafer and method for manufacturing semiconductor wafer
JP2019125729A (en) * 2018-01-18 2019-07-25 株式会社Sumco Method for evaluating semiconductor wafer and method for manufacturing semiconductor wafer
US11955390B2 (en) 2018-01-18 2024-04-09 Sumco Corporation Semiconductor wafer evaluation method and semiconductor wafer manufacturing method
JP2020016506A (en) * 2018-07-24 2020-01-30 Ckd株式会社 Inspection device, ptp packaging machine, and ptp sheet manufacturing method

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