JP2011222239A - Lighting system and inspection device - Google Patents

Lighting system and inspection device Download PDF

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JP2011222239A
JP2011222239A JP2010089091A JP2010089091A JP2011222239A JP 2011222239 A JP2011222239 A JP 2011222239A JP 2010089091 A JP2010089091 A JP 2010089091A JP 2010089091 A JP2010089091 A JP 2010089091A JP 2011222239 A JP2011222239 A JP 2011222239A
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light emitting
light
emitting diodes
inspection
optical element
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Daisuke Kishiwaki
大介 岸脇
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Dainippon Screen Manufacturing Co Ltd
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Dainippon Screen Manufacturing Co Ltd
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PROBLEM TO BE SOLVED: To provide a lighting system including light emitting diodes which can be easily installed at the same angle, while achieving easy manufacturing, high efficiency and excellent uniformity.SOLUTION: An optical element 34 constitutes a cylindrical lens which has characteristics to irradiate an inspection region with light of the light-emitting diode 33, including an outgoing face 36 of the light. A light incident face 37 opposed to the outgoing face 36 is planar and has a groove 38 having the same shape as the front cross-sectional shape of the light emitting part 35 of the plurality of light-emitting diodes 33. The plurality of light-emitting diodes 33 are installed by inserting and positioning the light emitting parts 35 in the groove 38 of the optical element 34.

Description

本発明は、照明装置および検査装置に関し、さらに詳しくは、電子工業用のプリント基板や液晶ディスプレイ製造用ガラス基板や印刷物などの検査対象物の表面を検査する装置においてその表面を照明する用途などに用いられる照明装置であって、光源として発光ダイオードを使用するもの、および、その照明装置を用いた検査装置に関する。   The present invention relates to an illuminating device and an inspection device, and more particularly, to an application for illuminating the surface of an inspection object such as a printed circuit board for electronic industry, a glass substrate for manufacturing a liquid crystal display, or a printed material. The present invention relates to an illumination device that uses a light-emitting diode as a light source, and an inspection device using the illumination device.

電子工業用のプリント基板や液晶ディスプレイ製造用ガラス基板などの表面を検査する外観検査装置として、例えば、検査対象物である基板を一方向に搬送しながら、その搬送方向と交差する方向に長い一次元の撮像素子を用いた撮像装置で基板の表面を撮影し、得られた画像を処理して不良箇所を検出するものがある。かかる検査装置においては、検査対象物の表面を撮影するために、その表面を照明する照明装置が用いられるが、撮像装置として一次元の撮影範囲を持つものを用いる場合、照明範囲も撮影範囲と同じ一次元の領域で均一に照明するものが用いられる。   As an appearance inspection device that inspects the surface of a printed circuit board for electronic industry or a glass substrate for manufacturing a liquid crystal display, for example, a primary that is long in a direction intersecting the conveyance direction while conveying a substrate that is an inspection object in one direction There is an apparatus in which a surface of a substrate is photographed by an imaging apparatus using the original imaging element, and the obtained image is processed to detect a defective portion. In such an inspection apparatus, an illuminating device that illuminates the surface of the object to be inspected is used. However, when an imaging device having a one-dimensional imaging range is used, the illumination range is also defined as the imaging range. Those that uniformly illuminate the same one-dimensional region are used.

特開2003−132708号公報JP 2003-132708 A

上記のような照明装置において、光源として発光ダイオードを用いることが考えられる。一般照明分野においては、特許文献1に示されるように、基板上に多数の発光ダイオードを一列にライン状に並べて設け、発光部分をカバーで覆って散乱させて光量のムラを抑制することが考えられる。しかし、このようにカバーにより光を散乱させるとそれだけ光量に損失が生じて検査対象部分に照射される光量が少なくなり、効率が下がる。また、このようなカバーを用いず、多数の発光ダイオードを一列に並べたラインの前面にフレネルレンズなどの光学系を設けて検査対象部分に集光して照射することも考えられる。しかしこの場合、多数の発光ダイオードの向きをそろえて組み立てる必要があり組み立てが困難でコストが高くなり、発光ダイオードが傾いてしまうと、うまく集光できずに照明にムラが生じたり、フレネルレンズの段差による光の散乱などに起因する透過率の悪さにより効率が下がる問題点がある。
近年、検査対象物となる基板が大型化し、それに伴って撮影幅も大きくなる反面、撮像や検査に要求される分解能は小さくなるため、照明装置においてもライン方向には長く均一な明るい照度分布が必要であり、ラインと直交する方向には十分に集光して効率を上げることが求められる。それに伴い、例えば砲弾型の発光ダイオードの径が小さなものを多数実装する方法がとられるが、砲弾型発光ダイオードの径が小さいものは、指向性が高く、ライン上を均一に照明するためには、取付角度をより高精度に調整する必要があり、製造が難しくなっていた。
In the illumination device as described above, it is conceivable to use a light emitting diode as a light source. In the general illumination field, as shown in Patent Document 1, it is considered that a large number of light emitting diodes are arranged in a line on a substrate, and the light emitting portion is covered with a cover and scattered to suppress unevenness in the amount of light. It is done. However, if the light is scattered by the cover in this way, the amount of light is lost and the amount of light applied to the inspection target portion is reduced, and the efficiency is lowered. It is also conceivable that an optical system such as a Fresnel lens is provided on the front surface of a line in which a large number of light emitting diodes are arranged in a line without using such a cover, so that the portion to be inspected is condensed and irradiated. However, in this case, it is necessary to assemble many light-emitting diodes in the same direction, making the assembly difficult and costly.If the light-emitting diodes are tilted, they cannot be condensed well, causing uneven illumination, There is a problem in that the efficiency decreases due to poor transmittance due to light scattering due to a step.
In recent years, the substrate to be inspected has become larger, and the imaging width has been increased accordingly. On the other hand, the resolution required for imaging and inspection has been reduced. It is necessary to increase the efficiency by sufficiently condensing in the direction orthogonal to the line. Along with that, for example, a method of mounting a large number of cannonball type light emitting diodes with a small diameter is taken, but a small type of cannonball type light emitting diode has high directivity, and in order to illuminate the line uniformly Therefore, it is necessary to adjust the mounting angle with higher accuracy, which makes manufacturing difficult.

本発明は、上記課題に鑑みなされたものであり、発光ダイオードの取付角度を容易にそろえることができて容易に製造でき、高効率で均一性も良好な照明装置と、その照明装置を用いた検査装置を提供することを目的としている。   The present invention has been made in view of the above-described problems, and uses a lighting device that can easily arrange the mounting angles of light-emitting diodes, can be easily manufactured, has high efficiency and good uniformity, and the lighting device. The object is to provide an inspection device.

請求項1に記載の発明は、透光性素材で形成された発光部を有する複数の発光ダイオードと、一面に、前記複数の発光ダイオードの前記発光部の形状に対応した溝が形成され、他面に光を出射する出射面が形成された光学素子とを備え、前記溝に前記複数の発光ダイオードの前記発光部を挿入して前記発光ダイオードを位置決めしたことを特徴とする照明装置である。   According to the first aspect of the present invention, a plurality of light emitting diodes having a light emitting portion formed of a translucent material, and a groove corresponding to the shape of the light emitting portion of the plurality of light emitting diodes are formed on one surface. And an optical element having an emission surface for emitting light on the surface, wherein the light emitting diodes are positioned by inserting the light emitting portions of the plurality of light emitting diodes into the grooves.

請求項2に記載の発明は、透光性素材で形成された発光部を有する複数の発光ダイオードと、一面に、前記複数の発光ダイオードの前記発光部の形状に対応した複数の挿入穴が並べて形成され、他面に光を出射する出射面が形成された光学素子とを備え、前記複数の挿入穴に前記複数の発光ダイオードの前記発光部を挿入して前記発光ダイオードを位置決めしたことを特徴とする照明装置である。   According to the second aspect of the present invention, a plurality of light emitting diodes having a light emitting portion formed of a light transmissive material, and a plurality of insertion holes corresponding to the shape of the light emitting portion of the plurality of light emitting diodes are arranged side by side. And an optical element formed with an emission surface for emitting light on the other surface, and positioning the light emitting diode by inserting the light emitting portions of the plurality of light emitting diodes into the plurality of insertion holes. It is an illuminating device.

請求項3に記載の発明は、請求項1または2に記載の照明装置において、前記光学素子の前記出射面を、被照明位置にほぼ集光するシリンドリカルレンズとしたことを特徴とする。   According to a third aspect of the present invention, in the illuminating device according to the first or second aspect of the present invention, the exit surface of the optical element is a cylindrical lens that substantially condenses light at an illuminated position.

請求項4に記載の発明は、請求項3に記載の照明装置において、前記シリンドリカルレンズの前記出射面を、被照明位置にほぼ集光する球面としたことを特徴とする。   According to a fourth aspect of the present invention, in the illuminating device according to the third aspect, the exit surface of the cylindrical lens is a spherical surface that is substantially condensed at an illuminated position.

請求項5に記載の発明は、請求項3に記載の照明装置において、前記シリンドリカルレンズの前記出射面を、被照明位置にほぼ集光する非球面としたことを特徴とする。   According to a fifth aspect of the present invention, in the illumination device according to the third aspect of the present invention, the exit surface of the cylindrical lens is an aspherical surface that is substantially condensed at an illuminated position.

請求項6に記載の発明は、検査対象物を支持する支持装置と、前記支持装置により支持される検査対象物において、一方向に長い検査領域を撮像する撮像装置と、前記支持装置に支持される検査対象物と前記撮像装置とを、前記検査領域の長手方向と直交する方向に相対移動させる移動機構と、前記検査対象物の表面の前記一方向に長い前記検査領域を照明すべく配置された請求項1乃至5のいずれかに記載の照明装置と、を備えたことを特徴とする検査装置である。   The invention according to claim 6 is supported by the support device that supports the inspection object, the imaging device that images a long inspection region in one direction in the inspection object supported by the support device, and the support device. A moving mechanism for relatively moving the inspection object and the imaging device in a direction perpendicular to the longitudinal direction of the inspection area, and a lighting mechanism that is arranged to illuminate the inspection area that is long in the one direction on the surface of the inspection object. An inspection device comprising: the illumination device according to any one of claims 1 to 5.

本発明によれば、LEDの取付角度を容易にそろえることができて製造が容易で、高効率で均一性も良好な照明装置と検査装置が得られる。   According to the present invention, it is possible to obtain an illumination device and an inspection device that can easily align the mounting angles of LEDs, are easily manufactured, have high efficiency, and have good uniformity.

本発明の第1の実施の形態に係る検査装置を示す模式図である。1 is a schematic diagram showing an inspection apparatus according to a first embodiment of the present invention. 光源の第1の実施形態を示す光路図である。It is an optical path diagram which shows 1st Embodiment of a light source. 光源の第1の実施形態の変形例を示す光路図である。It is an optical path figure which shows the modification of 1st Embodiment of a light source. 光源の第2の実施形態を示す図である。It is a figure which shows 2nd Embodiment of a light source. 光源の第2の実施形態を示す光路図である。It is an optical path diagram which shows 2nd Embodiment of a light source. 各実施形態による被照明位置における照度分布を示す図である。It is a figure which shows the illumination intensity distribution in the to-be-illuminated position by each embodiment.

図1は、本発明の第1の実施の形態に係る検査装置1を示す模式図であり、図1(A)は検査装置1全体を示し、図1(B)は照明装置32の構成を示す。検査装置1は、電子工業用のプリント基板や液晶ディスプレイ製造用ガラス基板や印刷物など検査対象物の表面を撮像してその表面の配線パターンや欠陥等を検査する外観検査装置であって、検査対象物である基板Wを支持するステージ2と、ステージ2によって支持されている基板Wの表面を撮像するための検査ヘッド3と、ステージ2を検査ヘッド3に対して移動させる移動機構4とからなっている。   FIG. 1 is a schematic diagram showing an inspection apparatus 1 according to the first embodiment of the present invention. FIG. 1 (A) shows the entire inspection apparatus 1, and FIG. Show. The inspection apparatus 1 is an appearance inspection apparatus that images the surface of an inspection object such as a printed circuit board for electronic industry, a glass substrate for manufacturing a liquid crystal display, or a printed material, and inspects a wiring pattern or a defect on the surface. It comprises a stage 2 that supports a substrate W that is an object, an inspection head 3 for imaging the surface of the substrate W supported by the stage 2, and a moving mechanism 4 that moves the stage 2 relative to the inspection head 3. ing.

ステージ2は基板Wを図示しない吸着機構によって吸着して基板Wの平坦性を保った状態で支持する。検査ヘッド3は移動機構4をまたぐ門型の支持体(図示せず)によって移動機構4によるステージ2の移動経路上に設置される。検査ヘッド3には、基板Wの表面を撮影する撮像装置31と、その撮像装置31による撮像領域を照明するための照明装置32とが設けられる。撮像装置31はステージ2上に支持される基板Wの表面において、移動機構4によるステージ2の移動方向に直交する方向に長い検査領域を撮影するための一次元の撮像素子とそのための光学系(いずれも図示せず)が含まれる。移動機構4はボールネジ又はリニアモータよりなる。   The stage 2 supports the substrate W in a state where the substrate W is sucked by a suction mechanism (not shown) and the flatness of the substrate W is maintained. The inspection head 3 is installed on the moving path of the stage 2 by the moving mechanism 4 by a gate-type support (not shown) straddling the moving mechanism 4. The inspection head 3 is provided with an imaging device 31 that captures an image of the surface of the substrate W and an illumination device 32 that illuminates an imaging region by the imaging device 31. The imaging device 31 is a one-dimensional imaging device for imaging a long inspection region in a direction orthogonal to the moving direction of the stage 2 by the moving mechanism 4 on the surface of the substrate W supported on the stage 2 and an optical system for the same ( Neither is shown). The moving mechanism 4 is composed of a ball screw or a linear motor.

照明装置32は基板Wの表面における撮像装置31による撮像領域すなわち検査領域を照明すべくその検査領域に向けて配置される。図1(B)を参照して照明装置32の詳細を説明すると、光源としての複数の発光ダイオード33と、その複数の発光ダイオード33の光を検査領域に照射するための光学素子34とからなる。発光ダイオード33のそれぞれは、いわゆる砲弾型のものであって透光性の樹脂素材でモールドされて形成された発光部35を有している。発光部の前面は球面である。光学素子34は、照明すべき検査領域の長手方向に対応した長さを有し、光の出射面36を含んで発光ダイオード33の光を検査領域に照射するための特性を持つシリンドリカルレンズを構成する。また出射面36と対向する光の入射面37は平面であって、複数の発光ダイオード33の発光部35の前面の断面形状に等しくなるような溝38が形成されている。そして、複数の発光ダイオード33は、それぞれの発光部35を光学素子34の溝38に嵌め込んで位置決めしつつ取り付けられ、図示しない接着材等で固定される。なお、図1においては発光ダイオード33を5個使用した場合を示しているが、これに限らず、必要な検査領域に対応した任意の個数にすることができる。出射面36は球面の曲率を持つ。   The illuminating device 32 is arranged toward the inspection region in order to illuminate the imaging region by the imaging device 31 on the surface of the substrate W, that is, the inspection region. The details of the illumination device 32 will be described with reference to FIG. 1B. The illumination device 32 includes a plurality of light emitting diodes 33 as light sources and an optical element 34 for irradiating the inspection region with light from the plurality of light emitting diodes 33. . Each of the light emitting diodes 33 is of a so-called bullet type, and has a light emitting part 35 formed by molding with a translucent resin material. The front surface of the light emitting unit is a spherical surface. The optical element 34 has a length corresponding to the longitudinal direction of the inspection region to be illuminated, and constitutes a cylindrical lens having a characteristic for irradiating the inspection region with the light of the light emitting diode 33 including the light emission surface 36. To do. In addition, the light incident surface 37 facing the emission surface 36 is a flat surface, and a groove 38 is formed so as to be equal to the cross-sectional shape of the front surface of the light emitting portion 35 of the plurality of light emitting diodes 33. The plurality of light emitting diodes 33 are attached while positioning each light emitting portion 35 by fitting into the groove 38 of the optical element 34, and are fixed by an adhesive or the like (not shown). Although FIG. 1 shows the case where five light emitting diodes 33 are used, the number of light emitting diodes 33 is not limited to this, and an arbitrary number corresponding to a necessary inspection region can be used. The exit surface 36 has a spherical curvature.

かかる構成によれば、複数の発光ダイオード33は、光学素子34の溝38に嵌め込むだけで所定の取付角度で位置決めができる。また、発光ダイオード33を正確な角度で取り付けできるので、取付角度のばらつきに起因する無駄な照射光がなくなり、高効率で均一性も良好な照明装置32を容易に組み立て製造することができる。またシリンドリカルレンズを用いているので、フレネルレンズのようなレンズの段差がなく、散乱光が生じないので効率低下がない。   According to such a configuration, the plurality of light emitting diodes 33 can be positioned at a predetermined mounting angle simply by being fitted into the groove 38 of the optical element 34. In addition, since the light emitting diode 33 can be mounted at an accurate angle, useless irradiation light due to variations in the mounting angle is eliminated, and the lighting device 32 with high efficiency and good uniformity can be easily assembled and manufactured. In addition, since a cylindrical lens is used, there is no lens step like a Fresnel lens, and no scattered light is generated, so that there is no reduction in efficiency.

図2はこの第1の実施の形態に係る照明装置32の光路を示す。YZ面において、光学素子34の溝38により正確な取付角度で整列されている。ただし、この第1の実施形態では、出射面36による球面収差が発生し、集光効率が若干低下している。   FIG. 2 shows an optical path of the illumination device 32 according to the first embodiment. In the YZ plane, the optical elements 34 are aligned at an accurate mounting angle by the grooves 38. However, in the first embodiment, spherical aberration is generated by the exit surface 36, and the light collection efficiency is slightly reduced.

次にこの第1の実施の形態の変形例を説明する。変形例においては、光学素子34の出射面36を、被照明位置すなわち検査領域に集光させる非球面とする事で球面収差を改善した。それ以外の構成は上述した第1の実施形態と同一である。この変形例に係る照明装置32の光路を図3に示す。YZ面において、Y方向の光の拡散が図2と比べて少なくなっており、照明の集光効率がより向上している。   Next, a modification of the first embodiment will be described. In the modification, the spherical aberration is improved by making the exit surface 36 of the optical element 34 an aspherical surface that focuses light on the illuminated position, that is, the inspection region. Other configurations are the same as those of the first embodiment described above. The optical path of the illuminating device 32 which concerns on this modification is shown in FIG. On the YZ plane, the diffusion of light in the Y direction is less than that in FIG. 2, and the light collection efficiency is improved.

図4は、本発明の第2の実施の形態に係る検査装置1の照明装置32を示す模式図であり、光学素子34において、出射面36は被照明位置すなわち検査領域に集光させる非球面とした。この点は上述した第1の実施形態の変形例同一である。さらに、出射面36と対向する光の入射面37は平面であって、その入射面37に複数の発光ダイオード33の発光部35の前面形状に等しくなるような複数の孔39が形成されている。そして、複数の発光ダイオード33は、それぞれの発光部35を光学素子34の孔39に嵌め込んで位置決めしつつ取り付けられ、図示しない接着材等で固定される。この点以外の構成は上述した第1の実施形態と同一である。   FIG. 4 is a schematic diagram showing the illumination device 32 of the inspection apparatus 1 according to the second embodiment of the present invention. In the optical element 34, the exit surface 36 is an aspherical surface focused on the illuminated position, that is, the inspection region. It was. This is the same as the modification of the first embodiment described above. Further, the light incident surface 37 facing the emission surface 36 is a flat surface, and a plurality of holes 39 are formed in the incident surface 37 so as to be equal to the front shape of the light emitting portions 35 of the light emitting diodes 33. . The plurality of light emitting diodes 33 are attached while positioning the respective light emitting portions 35 by fitting into the holes 39 of the optical element 34, and are fixed by an adhesive or the like (not shown). The configuration other than this point is the same as that of the first embodiment described above.

この第2の実施形態によれば、発光ダイオード33の位置決めを個々の発光ダイオード33に対応した孔39にはめ込んで行っているので、発光ダイオード33の列設方向すなわち光学素子34の長手方向にもずれることがなくなるため、発光ダイオード33をよりいっそう正確な取付角度で位置決めして取り付けることができ、取付角度のばらつきに起因する無駄な照射光がなくなり、高効率で均一性も良好な照明装置32を容易に組み立て製造することができる。図5はこの第2の実施の形態に係る照明装置32の光路を示す。X方向に広い範囲で均一に照明ができている。   According to the second embodiment, the positioning of the light-emitting diodes 33 is carried out by being inserted into the holes 39 corresponding to the individual light-emitting diodes 33, so that the light-emitting diodes 33 are arranged in the row direction, that is, in the longitudinal direction of the optical element 34. Since there is no deviation, the light emitting diode 33 can be positioned and mounted at a more accurate mounting angle, there is no useless irradiation light due to variations in the mounting angle, and the illumination device 32 has high efficiency and good uniformity. Can be easily assembled and manufactured. FIG. 5 shows an optical path of the illumination device 32 according to the second embodiment. Illumination is uniform over a wide range in the X direction.

図6はこれらの実施形態の照明装置の照度分布を示す図であって、図6(A)は第1実施形態の、図6(B)は第1実施形態の変形例、図6(C)は第2実施形態の、それぞれの照度分布である。第2の実施形態の照度分布が、図6(C)では中央部が高い山形になっていて不均一であるが、実際には発光ダイオード33を多数用いるので、この山は長手方向(X方向)に平坦化され、実用上良好な均一照明として利用できる。   FIG. 6 is a diagram showing the illuminance distribution of the lighting devices of these embodiments. FIG. 6 (A) is a first embodiment, FIG. 6 (B) is a modification of the first embodiment, and FIG. ) Is the respective illuminance distribution of the second embodiment. In FIG. 6C, the illuminance distribution of the second embodiment is not uniform because the central portion has a high mountain shape, but actually, since many light emitting diodes 33 are used, this mountain has a longitudinal direction (X direction). ) And can be used as practically good uniform illumination.

なお、上記第2の実施形態では、光学素子34の出射面36は被照明位置に集光させる非球面としたが、この出射面36を球面とすることもできる。また、検査対象物が長尺物、例えばフレキシブルプリント基板や長尺紙への印刷物などの場合には、かかる検査対象物をローラ等により支持しながら、巻き出し、巻き取り装置によって移動させる構成をとることもできる。   In the second embodiment, the exit surface 36 of the optical element 34 is an aspherical surface that focuses light to the illuminated position. However, the exit surface 36 may be a spherical surface. In addition, when the inspection object is a long object, for example, a printed material on a flexible printed circuit board or a long paper, a structure in which the inspection object is unwound and moved by a winding device while being supported by a roller or the like. It can also be taken.

1 検査装置
2 ステージ
3 検査ヘッド
4 移動機構
31 撮像装置
32 照明装置
33 発光ダイオード
34 光学素子
35 発光部
36 出射面
37 入射面
38 溝
39 孔
DESCRIPTION OF SYMBOLS 1 Inspection apparatus 2 Stage 3 Inspection head 4 Moving mechanism 31 Imaging apparatus 32 Illumination apparatus 33 Light emitting diode 34 Optical element 35 Light emission part 36 Outgoing surface 37 Incident surface 38 Groove 39 Hole

Claims (6)

透光性素材で形成された発光部を有する複数の発光ダイオードと、
一面に、前記複数の発光ダイオードの前記発光部の形状に対応した溝が形成され、他面に光を出射する出射面が形成された光学素子とを備え、
前記長溝に前記複数の発光ダイオードの前記発光部を挿入して前記発光ダイオードを位置決めしたことを特徴とする照明装置。
A plurality of light emitting diodes having a light emitting portion formed of a light transmissive material;
An optical element in which a groove corresponding to the shape of the light emitting portion of the plurality of light emitting diodes is formed on one surface, and an emission surface for emitting light is formed on the other surface;
An illumination device, wherein the light emitting diodes are positioned by inserting the light emitting portions of the plurality of light emitting diodes into the long groove.
透光性素材で形成された発光部を有する複数の発光ダイオードと、
一面に、前記複数の発光ダイオードの前記発光部の形状に対応した複数の挿入穴が並べて形成され、他面に光を出射する出射面が形成された光学素子とを備え、
前記複数の挿入穴に前記複数の発光ダイオードの前記発光部を挿入して前記発光ダイオードを位置決めしたことを特徴とする照明装置。
A plurality of light emitting diodes having a light emitting portion formed of a light transmissive material;
An optical element in which a plurality of insertion holes corresponding to the shape of the light emitting portion of the plurality of light emitting diodes are formed side by side and an emission surface that emits light is formed on the other surface;
An illumination device, wherein the light emitting diodes are positioned by inserting the light emitting portions of the plurality of light emitting diodes into the plurality of insertion holes.
請求項1または2に記載の照明装置において、
前記光学素子の前記出射面を、被照明位置にほぼ集光するシリンドリカルレンズとしたことを特徴とする照明装置。
The lighting device according to claim 1 or 2,
An illumination device characterized in that the exit surface of the optical element is a cylindrical lens that substantially condenses light at an illuminated position.
請求項3に記載の照明装置において、
前記シリンドリカルレンズの前記出射面を、被照明位置にほぼ集光する球面としたことを特徴とする照明装置。
The lighting device according to claim 3.
An illumination apparatus, wherein the exit surface of the cylindrical lens is a spherical surface that is substantially condensed at an illuminated position.
請求項3に記載の照明装置において、
前記シリンドリカルレンズの前記出射面を、被照明位置にほぼ集光する非球面としたことを特徴とする照明装置。
The lighting device according to claim 3.
An illumination device, wherein the exit surface of the cylindrical lens is an aspherical surface that substantially condenses light at an illuminated position.
検査対象物を支持する支持装置と、
前記支持装置により支持される検査対象物において、一方向に長い検査領域を撮像する撮像装置と、
前記支持装置に支持される検査対象物と前記撮像装置とを、前記検査領域の長手方向と直交する方向に相対移動させる移動機構と、
前記検査対象物の表面の前記一方向に長い前記検査領域を照明すべく配置された請求項1乃至4のいずれかに記載の照明装置と、
を備えたことを特徴とする検査装置。
A support device for supporting the inspection object;
In the inspection object supported by the support device, an imaging device that images a long inspection region in one direction;
A moving mechanism for relatively moving the inspection object supported by the support device and the imaging device in a direction orthogonal to the longitudinal direction of the inspection region;
The illumination device according to any one of claims 1 to 4, arranged to illuminate the inspection region that is long in the one direction on the surface of the inspection object,
An inspection apparatus comprising:
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