TWI791110B - 用於非接觸式電參數測量之可撓性鉗口(jaw)探針 - Google Patents

用於非接觸式電參數測量之可撓性鉗口(jaw)探針 Download PDF

Info

Publication number
TWI791110B
TWI791110B TW108115560A TW108115560A TWI791110B TW I791110 B TWI791110 B TW I791110B TW 108115560 A TW108115560 A TW 108115560A TW 108115560 A TW108115560 A TW 108115560A TW I791110 B TWI791110 B TW I791110B
Authority
TW
Taiwan
Prior art keywords
sensor
electrical parameter
flexible arm
insulated conductor
contact
Prior art date
Application number
TW108115560A
Other languages
English (en)
Chinese (zh)
Other versions
TW201947228A (zh
Inventor
費迪南德 勞瑞諾
傑佛瑞 瓦容斯
Original Assignee
美商富克有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 美商富克有限公司 filed Critical 美商富克有限公司
Publication of TW201947228A publication Critical patent/TW201947228A/zh
Application granted granted Critical
Publication of TWI791110B publication Critical patent/TWI791110B/zh

Links

Images

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/18Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using inductive devices, e.g. transformers
    • G01R15/186Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using inductive devices, e.g. transformers using current transformers with a core consisting of two or more parts, e.g. clamp-on type
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/04Housings; Supporting members; Arrangements of terminals
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/04Housings; Supporting members; Arrangements of terminals
    • G01R1/0408Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0416Connectors, terminals
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/20Modifications of basic electric elements for use in electric measuring instruments; Structural combinations of such elements with such instruments
    • G01R1/22Tong testers acting as secondary windings of current transformers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/12Circuits for multi-testers, i.e. multimeters, e.g. for measuring voltage, current, or impedance at will
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/16Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using capacitive devices
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/18Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using inductive devices, e.g. transformers
    • G01R15/181Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using inductive devices, e.g. transformers using coils without a magnetic core, e.g. Rogowski coils
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/20Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using galvano-magnetic devices, e.g. Hall-effect devices, i.e. measuring a magnetic field via the interaction between a current and a magnetic field, e.g. magneto resistive or Hall effect devices
    • G01R15/202Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using galvano-magnetic devices, e.g. Hall-effect devices, i.e. measuring a magnetic field via the interaction between a current and a magnetic field, e.g. magneto resistive or Hall effect devices using Hall-effect devices
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/20Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using galvano-magnetic devices, e.g. Hall-effect devices, i.e. measuring a magnetic field via the interaction between a current and a magnetic field, e.g. magneto resistive or Hall effect devices
    • G01R15/205Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using galvano-magnetic devices, e.g. Hall-effect devices, i.e. measuring a magnetic field via the interaction between a current and a magnetic field, e.g. magneto resistive or Hall effect devices using magneto-resistance devices, e.g. field plates
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • GPHYSICS
    • G08SIGNALLING
    • G08CTRANSMISSION SYSTEMS FOR MEASURED VALUES, CONTROL OR SIMILAR SIGNALS
    • G08C17/00Arrangements for transmitting signals characterised by the use of a wireless electrical link
    • G08C17/02Arrangements for transmitting signals characterised by the use of a wireless electrical link using a radio link

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
  • Measuring Leads Or Probes (AREA)
TW108115560A 2018-05-11 2019-05-06 用於非接觸式電參數測量之可撓性鉗口(jaw)探針 TWI791110B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US15/977,148 US10908188B2 (en) 2018-05-11 2018-05-11 Flexible jaw probe for non-contact electrical parameter measurement
US15/977,148 2018-05-11

Publications (2)

Publication Number Publication Date
TW201947228A TW201947228A (zh) 2019-12-16
TWI791110B true TWI791110B (zh) 2023-02-01

Family

ID=66476568

Family Applications (1)

Application Number Title Priority Date Filing Date
TW108115560A TWI791110B (zh) 2018-05-11 2019-05-06 用於非接觸式電參數測量之可撓性鉗口(jaw)探針

Country Status (5)

Country Link
US (1) US10908188B2 (enExample)
EP (1) EP3567381B1 (enExample)
JP (1) JP7219669B2 (enExample)
CN (1) CN110470924B (enExample)
TW (1) TWI791110B (enExample)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105432064B (zh) * 2013-03-15 2019-05-10 弗兰克公司 使用单独无线移动设备的红外图像的可见视听注释
GB2595209A (en) * 2020-05-11 2021-11-24 Trend Networks Ltd A detachable test instrument remote controller
CN114019226A (zh) * 2021-10-27 2022-02-08 北京大学 一种无接触式电量测量与记录装置
US20250341562A1 (en) * 2023-01-25 2025-11-06 Power Probe Group, Inc. Diagnostic probe apparatus and related systems and methods
LU503820B1 (de) * 2023-03-31 2024-09-30 Phoenix Contact Gmbh & Co Messgerät zur kontaktlosen Strommessung und Verfahren zu dessen Kalibrierung
US12487259B2 (en) * 2023-07-28 2025-12-02 Senva Inc. Contactless power meter
WO2025222068A1 (en) * 2024-04-19 2025-10-23 The Research Foundation For The State University Of New York Tunneling magnetoresistance sensor system and method for high power density power electronics systems

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW201625965A (zh) * 2014-10-27 2016-07-16 富克有限公司 可撓曲的電流感測器

Family Cites Families (67)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR1478330A (fr) 1965-04-23 1967-04-28 Telemecanique Electrique Perfectionnement à la mesure des courants industriels jusqu' à des fréquences élevées
US5473244A (en) 1992-09-17 1995-12-05 Libove; Joel M. Apparatus for measuring voltages and currents using non-contacting sensors
JPH06222087A (ja) 1993-01-27 1994-08-12 Hamamatsu Photonics Kk 電圧検出装置
US5973501A (en) 1993-10-18 1999-10-26 Metropolitan Industries, Inc. Current and voltage probe for measuring harmonic distortion
JPH09184866A (ja) 1995-12-28 1997-07-15 Sumitomo Electric Ind Ltd ケーブルの活線下劣化診断方法
US6043640A (en) 1997-10-29 2000-03-28 Fluke Corporation Multimeter with current sensor
US6118270A (en) 1998-02-17 2000-09-12 Singer; Jerome R. Apparatus for fast measurements of current and power with scaleable wand-like sensor
IL127699A0 (en) 1998-12-23 1999-10-28 Bar Dov Aharon Method and device for non contact detection of external electric or magnetic fields
DE19962323A1 (de) 1999-12-23 2001-07-19 Metrawatt Gmbh Gossen Elektrische Meßvorrichtung
JP2002048834A (ja) * 2000-08-03 2002-02-15 Kanto Denki Hoan Kyokai 探査器クランプ補助操作棒
US6456060B1 (en) * 2000-08-29 2002-09-24 Actuant Corporation Multi-meter with locking clamp
US6812685B2 (en) 2001-03-22 2004-11-02 Actuant Corporation Auto-selecting, auto-ranging contact/noncontact voltage and continuity tester
JP3761470B2 (ja) 2001-04-04 2006-03-29 北斗電子工業株式会社 非接触電圧計測方法及び装置並びに検出プローブ
US6644636B1 (en) 2001-10-26 2003-11-11 M. Terry Ryan Clamp adapter
JP2003139801A (ja) 2001-11-05 2003-05-14 Hioki Ee Corp 計器用変流器
CN2639905Y (zh) 2003-07-25 2004-09-08 深圳市纳米电子有限公司 一种钳形表校验仪
BRPI0506472A (pt) 2004-01-07 2007-02-06 Suparules Ltd dispositivo para medição de voltagem
US7256588B2 (en) 2004-04-16 2007-08-14 General Electric Company Capacitive sensor and method for non-contacting gap and dielectric medium measurement
DE102004063249A1 (de) 2004-12-23 2006-07-13 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Sensorsystem und Verfahren zur kapazitiven Messung elektromagnetischer Signale biologischen Ursprungs
JP4611774B2 (ja) 2005-03-04 2011-01-12 東日本電信電話株式会社 非接触型電圧検出方法及び非接触型電圧検出装置
US7466145B2 (en) 2005-10-12 2008-12-16 Hioki Denki Kabushiki Kaisha Voltage measuring apparatus and power measuring apparatus
JP4607753B2 (ja) 2005-12-16 2011-01-05 日置電機株式会社 電圧測定装置および電力測定装置
JP4607752B2 (ja) 2005-12-16 2011-01-05 日置電機株式会社 可変容量回路、電圧測定装置および電力測定装置
JP4713358B2 (ja) 2006-02-08 2011-06-29 日置電機株式会社 電圧検出装置
JP4648228B2 (ja) 2006-03-24 2011-03-09 日置電機株式会社 電圧検出装置および初期化方法
JP5106798B2 (ja) 2006-06-22 2012-12-26 日置電機株式会社 電圧測定装置
JP4726722B2 (ja) 2006-07-03 2011-07-20 日置電機株式会社 電圧測定装置
JP4726721B2 (ja) 2006-07-03 2011-07-20 日置電機株式会社 電圧測定装置
JP4629625B2 (ja) 2006-07-12 2011-02-09 日置電機株式会社 電圧測定装置
GB0614261D0 (en) 2006-07-18 2006-08-30 Univ Sussex The Electric Potential Sensor
JP5106909B2 (ja) 2007-04-10 2012-12-26 日置電機株式会社 線間電圧測定装置
JP4927632B2 (ja) 2007-04-13 2012-05-09 日置電機株式会社 電圧測定装置
JP5144110B2 (ja) 2007-04-13 2013-02-13 日置電機株式会社 電圧測定装置
US7944197B2 (en) * 2007-05-18 2011-05-17 Rishabh Instruments Private Limited Clamp meter with rotary mechanism for clamp jaws
JP5069978B2 (ja) 2007-08-31 2012-11-07 株式会社ダイヘン 電流・電圧検出用プリント基板および電流・電圧検出器
JP5160248B2 (ja) 2008-01-18 2013-03-13 日置電機株式会社 電圧検出装置
US20100090682A1 (en) 2008-02-14 2010-04-15 Armstrong Eric A Multi-Meter Test Lead Probe For Hands-Free Electrical Measurement of Control Panel Industrial Terminal Blocks
US8222886B2 (en) 2008-06-18 2012-07-17 Hioki Denki Kabushiki Kaisha Voltage detecting apparatus and line voltage detecting apparatus having a detection electrode disposed facing a detected object
JP5389389B2 (ja) 2008-07-22 2014-01-15 日置電機株式会社 線間電圧測定装置およびプログラム
CN101881791B (zh) 2009-04-30 2015-08-05 日置电机株式会社 电压检测装置
JP5340817B2 (ja) 2009-06-11 2013-11-13 日置電機株式会社 電圧検出装置
US8856555B2 (en) 2009-07-17 2014-10-07 Fluke Corporation Power state coordination for portable test tools
JP5420387B2 (ja) 2009-12-09 2014-02-19 日置電機株式会社 電圧検出装置
JP5474707B2 (ja) 2010-08-30 2014-04-16 日置電機株式会社 電圧検出装置用の検出回路および電圧検出装置
US8680845B2 (en) 2011-02-09 2014-03-25 International Business Machines Corporation Non-contact current and voltage sensor
US9063184B2 (en) 2011-02-09 2015-06-23 International Business Machines Corporation Non-contact current-sensing and voltage-sensing clamp
JP5834663B2 (ja) 2011-04-06 2015-12-24 富士通株式会社 交流電力測定装置
JP5834292B2 (ja) 2011-05-09 2015-12-16 アルプス・グリーンデバイス株式会社 電流センサ
BR112014002634B1 (pt) 2011-08-03 2021-06-15 Fluke Corporation Método de obtenção e manutenção de registro de manutenção,sistema para obtenção e manutenção de registros de manutenção e meio de armazenamento legível por computador.
US8754636B2 (en) 2011-12-07 2014-06-17 Brymen Technology Corporation Clamp meter with multipoint measurement
CN204214925U (zh) 2012-03-16 2015-03-18 菲力尔系统公司 电传感器和电传感器标签
US20140035607A1 (en) 2012-08-03 2014-02-06 Fluke Corporation Handheld Devices, Systems, and Methods for Measuring Parameters
JP5981271B2 (ja) 2012-08-28 2016-08-31 日置電機株式会社 電圧測定用センサおよび電圧測定装置
US9007077B2 (en) 2012-08-28 2015-04-14 International Business Machines Corporation Flexible current and voltage sensor
JP5981270B2 (ja) 2012-08-28 2016-08-31 日置電機株式会社 電圧測定用センサおよび電圧測定装置
US9625535B2 (en) 2013-08-07 2017-04-18 Allegro Microsystems, Llc Systems and methods for computing a position of a magnetic target
JP2015114245A (ja) 2013-12-12 2015-06-22 日置電機株式会社 クランプセンサおよび測定装置
CN106133532B (zh) * 2014-03-20 2019-07-30 公立大学法人大阪市立大学 钳形电流表
JP6210938B2 (ja) 2014-06-18 2017-10-11 日置電機株式会社 非接触型電圧検出装置
US9689903B2 (en) 2014-08-12 2017-06-27 Analog Devices, Inc. Apparatus and methods for measuring current
US10602082B2 (en) 2014-09-17 2020-03-24 Fluke Corporation Triggered operation and/or recording of test and measurement or imaging tools
TWI649568B (zh) 2014-10-17 2019-02-01 日商日置電機股份有限公司 Voltage detecting device
US10271020B2 (en) 2014-10-24 2019-04-23 Fluke Corporation Imaging system employing fixed, modular mobile, and portable infrared cameras with ability to receive, communicate, and display data and images with proximity detection
US10168356B2 (en) * 2015-08-19 2019-01-01 Tektronix, Inc. Test and measurement probe with adjustable test point contact
JP2017146143A (ja) 2016-02-16 2017-08-24 中国電力株式会社 間接活線工具用電流計
ES1160858Y (es) 2016-06-20 2016-10-04 Smilics Tech S L Sensor de corriente de tipo flexible
US10502807B2 (en) 2017-09-05 2019-12-10 Fluke Corporation Calibration system for voltage measurement devices

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW201625965A (zh) * 2014-10-27 2016-07-16 富克有限公司 可撓曲的電流感測器

Also Published As

Publication number Publication date
CN110470924A (zh) 2019-11-19
TW201947228A (zh) 2019-12-16
JP2020008567A (ja) 2020-01-16
EP3567381A1 (en) 2019-11-13
US10908188B2 (en) 2021-02-02
CN110470924B (zh) 2022-04-08
JP7219669B2 (ja) 2023-02-08
US20190346487A1 (en) 2019-11-14
EP3567381B1 (en) 2022-02-23

Similar Documents

Publication Publication Date Title
TWI791110B (zh) 用於非接觸式電參數測量之可撓性鉗口(jaw)探針
CN110470868B (zh) 用于非接触式电参数测量的夹钳探头
JP7657858B2 (ja) 電気的パラメータセンサプローブ及び絶縁導体内の電気的パラメータを検出する方法
US11112433B2 (en) Non-contact electrical parameter measurement device with clamp jaw assembly
JP2020008567A5 (enExample)
EP4145141B1 (en) Sensor probe with combined non-contact sensor and a rogowski coil
CN113219231A (zh) 具有可调尺寸罗戈夫斯基线圈的非接触式电压测量
US11513140B2 (en) Sensor probe with clamp having adjustable interior region for non-contact electrical measurement
CN115754414B (en) Sensor probe with combined non-contact sensor and Rogowski coil