TWI768011B - 研磨方法及研磨裝置 - Google Patents
研磨方法及研磨裝置 Download PDFInfo
- Publication number
- TWI768011B TWI768011B TW107109584A TW107109584A TWI768011B TW I768011 B TWI768011 B TW I768011B TW 107109584 A TW107109584 A TW 107109584A TW 107109584 A TW107109584 A TW 107109584A TW I768011 B TWI768011 B TW I768011B
- Authority
- TW
- Taiwan
- Prior art keywords
- substrate
- pressing
- inclination
- substrate holding
- polishing
- Prior art date
Links
- 238000000034 method Methods 0.000 title claims abstract description 21
- 239000000758 substrate Substances 0.000 claims abstract description 520
- 238000005498 polishing Methods 0.000 claims abstract description 285
- 239000013598 vector Substances 0.000 claims description 89
- 238000012545 processing Methods 0.000 claims description 85
- 230000007246 mechanism Effects 0.000 claims description 70
- 230000002093 peripheral effect Effects 0.000 claims description 52
- 238000006073 displacement reaction Methods 0.000 claims description 4
- 238000010586 diagram Methods 0.000 description 39
- 239000012530 fluid Substances 0.000 description 35
- 239000007788 liquid Substances 0.000 description 27
- 230000033001 locomotion Effects 0.000 description 26
- 238000004140 cleaning Methods 0.000 description 17
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 14
- 230000003068 static effect Effects 0.000 description 13
- 230000002706 hydrostatic effect Effects 0.000 description 12
- 239000013256 coordination polymer Substances 0.000 description 9
- 238000005259 measurement Methods 0.000 description 7
- 230000008569 process Effects 0.000 description 7
- 239000003082 abrasive agent Substances 0.000 description 6
- 238000004804 winding Methods 0.000 description 6
- 230000036544 posture Effects 0.000 description 5
- 238000009434 installation Methods 0.000 description 4
- 230000008859 change Effects 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- 229910052751 metal Inorganic materials 0.000 description 3
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 2
- 230000003028 elevating effect Effects 0.000 description 2
- 239000000696 magnetic material Substances 0.000 description 2
- 239000002245 particle Substances 0.000 description 2
- 239000011347 resin Substances 0.000 description 2
- 229920005989 resin Polymers 0.000 description 2
- 239000007787 solid Substances 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 239000006061 abrasive grain Substances 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 229910017052 cobalt Inorganic materials 0.000 description 1
- 239000010941 cobalt Substances 0.000 description 1
- GUTLYIVDDKVIGB-UHFFFAOYSA-N cobalt atom Chemical compound [Co] GUTLYIVDDKVIGB-UHFFFAOYSA-N 0.000 description 1
- 238000012937 correction Methods 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 239000004745 nonwoven fabric Substances 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 229920002635 polyurethane Polymers 0.000 description 1
- 239000004814 polyurethane Substances 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 239000000523 sample Substances 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
Images
Landscapes
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Constituent Portions Of Griding Lathes, Driving, Sensing And Control (AREA)
- Grinding And Polishing Of Tertiary Curved Surfaces And Surfaces With Complex Shapes (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Disintegrating Or Milling (AREA)
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2017-068444 | 2017-03-30 | ||
JP2017068444 | 2017-03-30 | ||
JP2018-009755 | 2018-01-24 | ||
JP2018009755A JP7107688B2 (ja) | 2017-03-30 | 2018-01-24 | 研磨方法および研磨装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW201838017A TW201838017A (zh) | 2018-10-16 |
TWI768011B true TWI768011B (zh) | 2022-06-21 |
Family
ID=64108095
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW107109584A TWI768011B (zh) | 2017-03-30 | 2018-03-21 | 研磨方法及研磨裝置 |
Country Status (2)
Country | Link |
---|---|
JP (1) | JP7107688B2 (enrdf_load_stackoverflow) |
TW (1) | TWI768011B (enrdf_load_stackoverflow) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP7235587B2 (ja) * | 2019-05-14 | 2023-03-08 | 株式会社ディスコ | 荷重センサの電圧調整方法 |
JP7278153B2 (ja) * | 2019-06-04 | 2023-05-19 | 東京エレクトロン株式会社 | 基板加工装置、および基板加工方法 |
CN111922880A (zh) * | 2020-09-09 | 2020-11-13 | 昆山欣建群精密工业有限公司 | 一种零件加工用抛光装置 |
CN112720246A (zh) * | 2020-12-29 | 2021-04-30 | 安徽省旌德旌峰机械制造有限公司 | 一种基于气动控制机械加工用研磨设备 |
CN113488428A (zh) * | 2021-06-04 | 2021-10-08 | 拓荆科技股份有限公司 | 一种晶圆载台垂直和水平位置的调节装置及其调节方法 |
JP2023127044A (ja) * | 2022-03-01 | 2023-09-13 | 株式会社荏原製作所 | 研磨ヘッドおよび研磨装置 |
CN115502854A (zh) * | 2022-09-14 | 2022-12-23 | 舟山中远海运重工有限公司 | 一种高压弥雾船舶除锈设备 |
CN120303085A (zh) * | 2022-12-02 | 2025-07-11 | 株式会社荏原制作所 | 基板处理方法、处理头及基板处理装置 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0985619A (ja) * | 1995-05-26 | 1997-03-31 | Tokyo Seimitsu Co Ltd | 表面研削方法及びその装置 |
JP2005022059A (ja) * | 2003-07-02 | 2005-01-27 | Ebara Corp | 研削盤及び研削方法 |
US20090124174A1 (en) * | 2007-11-12 | 2009-05-14 | Dai Fukushima | Substrate treating method and substrate treating apparatus |
US20140370794A1 (en) * | 2012-05-31 | 2014-12-18 | Ebara Corporation | Polishing apparatus |
TW201624555A (zh) * | 2014-08-21 | 2016-07-01 | 荏原製作所股份有限公司 | 研磨方法 |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5268599B2 (ja) | 2008-12-03 | 2013-08-21 | 株式会社ディスコ | 研削装置および研削方法 |
JP6344950B2 (ja) | 2014-03-31 | 2018-06-20 | 株式会社荏原製作所 | 研磨装置及び研磨方法 |
-
2018
- 2018-01-24 JP JP2018009755A patent/JP7107688B2/ja active Active
- 2018-03-21 TW TW107109584A patent/TWI768011B/zh active
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0985619A (ja) * | 1995-05-26 | 1997-03-31 | Tokyo Seimitsu Co Ltd | 表面研削方法及びその装置 |
JP2005022059A (ja) * | 2003-07-02 | 2005-01-27 | Ebara Corp | 研削盤及び研削方法 |
US20090124174A1 (en) * | 2007-11-12 | 2009-05-14 | Dai Fukushima | Substrate treating method and substrate treating apparatus |
US20140370794A1 (en) * | 2012-05-31 | 2014-12-18 | Ebara Corporation | Polishing apparatus |
TW201624555A (zh) * | 2014-08-21 | 2016-07-01 | 荏原製作所股份有限公司 | 研磨方法 |
Also Published As
Publication number | Publication date |
---|---|
TW201838017A (zh) | 2018-10-16 |
JP7107688B2 (ja) | 2022-07-27 |
JP2018171698A (ja) | 2018-11-08 |
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