TWI723548B - Edge detecting device - Google Patents

Edge detecting device Download PDF

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TWI723548B
TWI723548B TW108133877A TW108133877A TWI723548B TW I723548 B TWI723548 B TW I723548B TW 108133877 A TW108133877 A TW 108133877A TW 108133877 A TW108133877 A TW 108133877A TW I723548 B TWI723548 B TW I723548B
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light
measured
edge
image capturing
inspection device
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TW108133877A
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Chinese (zh)
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TW202113302A (en
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石建軒
江昆澤
陳景弘
陳佑保
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友達晶材股份有限公司
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  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

An edge detecting device includes a conveying device, a coaxial light source, a plurality of reflecting elements and an image capturing device. The conveying device includes a detecting portion, a first conveying portion and a second conveying portion. The first conveying portion is disposed at one side of the detecting portion. The second conveying portion is disposed at the other side of the detecting portion. The image capturing device is disposed at one side of the conveying device so as to scan an analyte. The coaxial light source is coaxially disposed with the image capturing device and provides a coaxial light source ray to irradiate the analyte and produces a plurality of an analyte reflecting rays. The reflecting elements transmit the coaxial light source ray or the analyte reflecting rays. Therefore, the edge detecting device can reduce a detecting time and avoids the analyte damage.

Description

邊緣檢查裝置 Edge inspection device

本發明關於一種邊緣檢查裝置,尤指一種具有複數反射元件以傳遞待測物之複數邊緣影像的邊緣檢查裝置。 The present invention relates to an edge inspection device, in particular to an edge inspection device having a plurality of reflection elements to transmit a plurality of edge images of an object to be tested.

待測物(如晶圓)於包裝前都會藉由邊緣檢查裝置進行各項檢查(如外觀缺陷),為了檢測待測物的複數邊緣,習知的邊緣檢查裝置都會利用旋轉站調整待測物於移載機構上的放置角度,以檢測待測物的複數邊緣,然而待測物常常因為旋轉站的外力而損壞甚至必須降低移載機構的速度,導致待測物的損壞率增加及邊緣檢查裝置的檢測時間。 The object to be tested (such as wafers) will be inspected by the edge inspection device before packaging (such as appearance defects). In order to detect the multiple edges of the object to be tested, the conventional edge inspection device will use the rotating station to adjust the object to be tested. The placement angle on the transfer mechanism is used to detect the multiple edges of the object to be tested. However, the object to be tested is often damaged due to the external force of the rotating station, and the speed of the transfer mechanism must be reduced, resulting in an increase in the damage rate of the object to be tested and edge inspection The detection time of the device.

有鑑於此,研發一種可以避免待測物於邊緣檢查時損壞且可提升檢測速度的邊緣檢查裝置是業界的一個發展趨勢。 In view of this, it is a development trend in the industry to develop an edge inspection device that can prevent the object to be tested from being damaged during edge inspection and can increase the inspection speed.

本發明提供之邊緣檢查裝置,透過感應系統、光源及反射元件的設置,讓邊緣檢查裝置可選擇性地不設置旋轉站即可檢測待測物之複數邊緣。 The edge inspection device provided by the present invention allows the edge inspection device to selectively detect multiple edges of the object to be tested without setting a rotating station through the arrangement of the sensing system, the light source and the reflective element.

依據本發明一實施方式提供一種邊緣檢查裝置,包含移載機構、影像擷取裝置、外同軸光源以及複數反射元件。移載機構包含檢測部、第一傳送部及第二傳送部。第一傳送部設置於檢測部之一側,以傳送待測物至檢測部。第二傳送部設置於檢測部之另一側,以接收並移載待測物。影像擷取裝置設置於移載機構之一側,以掃描待測物。外同軸光源與影像擷取裝置同軸地設置。外同軸光源介於影像擷取裝置與檢測部之間。外同軸光源提供外同軸光線照射待測物,以產生複數待測物反射光線。複數反射元件設置於檢測部。複數反射元件分別用以反射外同軸光線或待測物反射光線。藉此,邊緣檢查裝置可透過複數反射元件的設置而對待測物的複數邊緣進行檢測,並避免待測物受到外力而損壞且可提升邊緣檢查裝置的檢測速度。 According to an embodiment of the present invention, an edge inspection device is provided, which includes a transfer mechanism, an image capture device, an external coaxial light source, and a plurality of reflective elements. The transfer mechanism includes a detection part, a first conveying part and a second conveying part. The first transfer part is arranged on one side of the detection part to transfer the object to be tested to the detection part. The second transmission part is arranged on the other side of the detection part to receive and transfer the object to be tested. The image capturing device is arranged on one side of the transfer mechanism to scan the object to be tested. The external coaxial light source is coaxially arranged with the image capturing device. The external coaxial light source is between the image capturing device and the detecting part. The external coaxial light source provides external coaxial light to illuminate the object under test to generate a plurality of reflected light from the object under test. The complex reflection element is arranged in the detection part. The plurality of reflective elements are used to reflect external coaxial light or the object under test respectively. In this way, the edge inspection device can detect the multiple edges of the object under test through the arrangement of the plurality of reflection elements, avoid damage to the object under test due to external forces, and can increase the detection speed of the edge inspection device.

依據本發明另一實施方式提供一種邊緣檢查裝置,包含移載機構、複數線型光源、複數影像擷取裝置及複數反射元件組。移載機構包含檢測部、第一傳送部及第二傳送部。第一傳送部設置於檢測部之一側,以傳送待測物至檢測部。第二傳送部設置於檢測部之另一側,以接收並移載待測物。複數線型光源分別設置於移載機構之相對二側,以提供複數線型光線照射待測物,並產生複數待測物反射光線。複數影像擷取裝置分別設置於移載機構之相對二側,以掃描待測物。複數反射元件組分別與影像擷取裝置連接,用以傳遞待測物反射光線至影像擷取裝置。藉此,邊緣檢查裝置可避免待測物受到外力的碰撞而損壞,並可提升邊緣檢查裝置的檢測速度。 According to another embodiment of the present invention, an edge inspection device is provided, which includes a transfer mechanism, a plurality of linear light sources, a plurality of image capturing devices, and a plurality of reflection element groups. The transfer mechanism includes a detection part, a first conveying part and a second conveying part. The first transfer part is arranged on one side of the detection part to transfer the object to be tested to the detection part. The second transmission part is arranged on the other side of the detection part to receive and transfer the object to be tested. The plural linear light sources are respectively arranged on two opposite sides of the transfer mechanism to provide plural linear light to irradiate the object to be measured and generate a plurality of reflected light from the object to be measured. The plural image capturing devices are respectively arranged on two opposite sides of the transfer mechanism to scan the object to be tested. The plurality of reflective element groups are respectively connected with the image capturing device for transmitting the light reflected by the object to be measured to the image capturing device. In this way, the edge inspection device can prevent the object to be tested from being collided and damaged by external forces, and the detection speed of the edge inspection device can be increased.

依據本發明再一實施方式提供一種邊緣檢查裝置,包含移載機構、影像擷取裝置、複數照射點狀光源及複數反射元件。移載機構包含檢測部、第一傳送部及第二傳送部。 第一傳送部設置於檢測部之一側,以傳送待測物至檢測部。第二傳送部設置於檢測部之另一側,以接收並移載待測物。影像擷取裝置設置於移載機構之一側,以掃描待測物。照射點狀光源分別設置於影像擷取裝置之相對兩側,且各照射點狀光源提供照射光線照射待測物,以產生複數待測物反射光線。複數反射元件設置於檢測部分別用以反射照射光線或待測物反射光線。藉此,邊緣檢查裝置可透過複數反射元件的設置而對待測物的複數邊緣進行檢測,並避免待測物受到外力而損壞且可提升邊緣檢查裝置的檢測速度。 According to still another embodiment of the present invention, an edge inspection device is provided, which includes a transfer mechanism, an image capture device, a plurality of illuminating point light sources, and a plurality of reflective elements. The transfer mechanism includes a detection part, a first conveying part and a second conveying part. The first transfer part is arranged on one side of the detection part to transfer the object to be tested to the detection part. The second transmission part is arranged on the other side of the detection part to receive and transfer the object to be tested. The image capturing device is arranged on one side of the transfer mechanism to scan the object to be tested. The illuminating point-shaped light sources are respectively arranged on opposite sides of the image capturing device, and each illuminating point-shaped light source provides illuminating light to irradiate the object under test to generate a plurality of reflected light from the object under test. The plurality of reflection elements are arranged in the detection part to reflect the irradiated light or the object to be measured respectively. In this way, the edge inspection device can detect the multiple edges of the object under test through the arrangement of the plurality of reflection elements, avoid damage to the object under test due to external forces, and can increase the detection speed of the edge inspection device.

100、200、300、500‧‧‧邊緣檢查裝置 100, 200, 300, 500‧‧‧Edge inspection device

110、210、310、510‧‧‧移載機構 110, 210, 310, 510‧‧‧Transfer mechanism

111、211、311、511‧‧‧檢測部 111, 211, 311, 511‧‧‧Detection Department

112、212、312、512‧‧‧第 一傳送部 112, 212, 312, 512‧‧‧th A transmission department

330a‧‧‧第一線型光源 330a‧‧‧First linear light source

330b‧‧‧第二線型光源 330b‧‧‧Second linear light source

351a、351b‧‧‧延伸環 351a, 351b‧‧‧Extension ring

352a、352b‧‧‧第一反射元件 352a, 352b‧‧‧first reflective element

353a、353b‧‧‧第二反射元件 353a, 353b‧‧‧Second reflective element

113、213、313、513‧‧‧第二傳送部 113, 213, 313, 513‧‧‧Second Transmission Unit

120‧‧‧感應系統 120‧‧‧Induction system

121‧‧‧感應器 121‧‧‧Sensor

122‧‧‧處理器 122‧‧‧Processor

130‧‧‧光源 130‧‧‧Light source

140、240、540‧‧‧反射元件 140、240、540‧‧‧Reflective element

150、250、350a、350b、 550‧‧‧影像擷取裝置 150, 250, 350a, 350b, 550‧‧‧Image capture device

160‧‧‧判斷單元 160‧‧‧Judgment unit

230‧‧‧外同軸光源 230‧‧‧External coaxial light source

231‧‧‧補光點狀光源 231‧‧‧fill light point light source

241、541‧‧‧旋轉反射元件 241, 541‧‧‧Rotating reflection element

242、542‧‧‧邊緣反射元件 242、542‧‧‧Edge reflection element

251、551‧‧‧鏡頭 251, 551‧‧‧Lens

260、560‧‧‧馬達 260、560‧‧‧Motor

270、360、570‧‧‧待測物 270, 360, 570‧‧‧Object to be tested

354a、354b‧‧‧第一檢測鏡頭 354a, 354b‧‧‧First inspection lens

355a、355b‧‧‧第二檢測鏡頭 355a, 355b‧‧‧Second inspection lens

356a、356b‧‧‧反射元件組 356a, 356b‧‧‧reflective element group

531‧‧‧補光點狀光源 531‧‧‧fill light point light source

532a‧‧‧第一照射點狀光源 532a‧‧‧First illuminating point light source

532b‧‧‧第二照射點狀光源 532b‧‧‧Second illuminating point light source

P1‧‧‧第一檢測區 P1‧‧‧First detection zone

P2‧‧‧第二檢測區 P2‧‧‧Second Inspection Area

第1圖繪示本發明一實施方式的邊緣檢查裝置之方塊圖;第2A圖繪示本發明另一實施方式的邊緣檢查裝置示意圖;第2B圖繪示第2A圖實施方式的邊緣檢查裝置前視圖;第2C圖繪示第2A圖實施方式的邊緣檢查裝置之另一狀態之示意圖;第2D圖繪示第2A圖實施方式的邊緣檢查裝置之上視圖;第3A圖繪示本發明又一實施方式的邊緣檢查裝置示意圖;第3B圖繪示第3A圖實施方式的邊緣檢查裝置之另一狀態之示意圖; 第3C圖繪示第3A圖實施方式的邊緣檢查裝置之另一狀態之示意圖;第3D圖繪示第3A圖實施方式的邊緣檢查裝置之另一狀態之示意圖;第3E圖繪示第3A圖實施方式的邊緣檢查裝置之另一狀態之示意圖;第3F圖繪示第3A圖實施方式的邊緣檢查裝置之另一狀態之示意圖;第4A圖繪示本發明再一實施方式的邊緣檢查裝置之示意圖;以及第4B圖繪示第4A圖實施方式的邊緣檢查裝置之另一狀態之示意圖。 Fig. 1 is a block diagram of an edge inspection device according to an embodiment of the present invention; Fig. 2A is a schematic diagram of an edge inspection device according to another embodiment of the present invention; Fig. 2B is a front view of the edge inspection device according to the embodiment of Fig. 2A View; Figure 2C shows a schematic diagram of another state of the edge inspection device of the embodiment of Figure 2A; Figure 2D shows a top view of the edge inspection device of the embodiment of Figure 2A; Figure 3A shows another of the present invention A schematic diagram of the edge inspection device of the embodiment; FIG. 3B is a schematic diagram of another state of the edge inspection device of the embodiment of FIG. 3A; Fig. 3C is a schematic diagram of another state of the edge inspection device of the embodiment in Fig. 3A; Fig. 3D is a schematic diagram of another state of the edge inspection device of the embodiment of Fig. 3A; Fig. 3E is a diagram of Fig. 3A A schematic diagram of another state of the edge inspection device of the embodiment; FIG. 3F shows a schematic diagram of another state of the edge inspection device of the embodiment in FIG. 3A; FIG. 4A shows another state of the edge inspection device of another embodiment of the present invention Schematic diagram; and FIG. 4B is a schematic diagram showing another state of the edge inspection device of the embodiment of FIG. 4A.

以下將參照圖式說明本發明各實施例。為明確起見,許多實務上的細節將在以下敘述中說明。然而,應瞭解到,這些實務上的細節不應用以限制本發明。換言之,在本發明部分實施例中,這些實務上的細節是非必要的。此外,為簡化圖式,一些習知慣用的結構與元件在圖式中將以示意的方式繪示;並且重複之元件將可能使用相同的編號表示。 Hereinafter, various embodiments of the present invention will be described with reference to the drawings. For clarity, many practical details will be explained in the following description. However, it should be understood that these practical details should not be used to limit the present invention. In other words, in some embodiments of the present invention, these practical details are unnecessary. In addition, in order to simplify the drawings, some conventionally used structures and elements will be shown schematically in the drawings; and repeated elements may be represented by the same numbers.

第1圖繪示本發明一實施方式的邊緣檢查裝置100之方塊圖。邊緣檢查裝置100包含移載機構110、感應系統120、至少一光源130、複數反射元件140及至少一影像擷取裝置150,其中感應系統120可設置於邊緣檢查裝置100之移載機 構110或邊緣檢查裝置100之影像擷取裝置150中,又或者設置於其他站別,本發明不以此為限,以下各實施例亦同,容不贅述。具體來說,在第1圖中,感應系統120與影像擷取裝置150及光源130電性連接,且感應系統120設置於移載機構110以感應待測物270(請配合參照第2A圖實施方式之標示)。 FIG. 1 is a block diagram of an edge inspection device 100 according to an embodiment of the present invention. The edge inspection device 100 includes a transfer mechanism 110, a sensing system 120, at least one light source 130, a plurality of reflective elements 140, and at least one image capturing device 150. The sensing system 120 can be installed in the transfer machine of the edge inspection device 100 The structure 110 or the image capturing device 150 of the edge inspection device 100 may be installed in other stations. The present invention is not limited to this, and the following embodiments are also the same, and will not be repeated. Specifically, in Figure 1, the sensing system 120 is electrically connected to the image capturing device 150 and the light source 130, and the sensing system 120 is disposed on the transfer mechanism 110 to sense the object to be measured 270 (please refer to Figure 2A for implementation) The mark of the method).

詳細來說,移載機構110包含檢測部111、第一傳送部112及第二傳送部113。第一傳送部112設置於檢測部111之一側以傳送待測物270至檢測部111。第二傳送部113設置於檢測部111之另一側以接收並移載待測物270。感應系統120設置於第一傳送部112以感應待測物270。至少一光源130與感應系統120電性連接,並受感應系統120致動。至少一光源130用以提供至少一光源光線照射待測物270,並產生複數待測物反射光線。複數反射元件140分別用以傳遞光源光線或待測物反射光線。至少一影像擷取裝置150與感應系統120電性連接並受感應系統120致動。影像擷取裝置150接收待測物反射光線以產生複數檢測影像。也就是說,移載機構110之第一傳送部112可傳送待測物270至檢測部111進行邊緣檢測。在第一傳送部112的傳送過程中,當設置於第一傳送部112之感應系統120感應到待測物270後,可根據移載機構110的傳送速度分別致動光源130及影像擷取裝置150,其中移載機構110的傳送速度可為500mm/s,但不以此為限。在待測物270通過檢測部111的過程中,光源130提供光源光線照射待測物270,進而產生複數待測物反射光線。反射元件140可用以傳遞光源光線以照射待測物270之複數邊緣或導角並產生待測物反射光線,或者 將待測物反射光線傳遞至影像擷取裝置150。換句話說,待測物反射光線可為光源光線直接照射待測物270而產生,或者透過反射元件140反射光源光線以照射待測物270後而產生。影像擷取裝置150接收待測物反射光線,並產生複數檢測影像,檢測影像可用以判斷待測物270是否有瑕疵。在待測物270通過檢測部111後,第二傳送部113會接收通過檢測部111之待測物270,並將待測物270移載至下一站別以進行後續處理。藉此,邊緣檢查裝置100不需降速及借助外力調整待測物270的方向即可對待測物270進行邊緣檢測,可避免待測物270在檢測過程中受到外力的碰撞而損壞,且可縮小體積。 In detail, the transfer mechanism 110 includes a detection unit 111, a first transfer unit 112 and a second transfer unit 113. The first conveying part 112 is disposed on one side of the detecting part 111 to convey the test object 270 to the detecting part 111. The second transmission part 113 is disposed on the other side of the detection part 111 to receive and transfer the object to be tested 270. The sensing system 120 is disposed at the first transmission part 112 to sense the object to be measured 270. At least one light source 130 is electrically connected to the sensing system 120 and is actuated by the sensing system 120. The at least one light source 130 is used to provide at least one light source to illuminate the object 270 and generate a plurality of reflected light from the object. The plurality of reflective elements 140 are respectively used to transmit light from the light source or reflected light from the object under test. At least one image capturing device 150 is electrically connected to the sensing system 120 and is actuated by the sensing system 120. The image capturing device 150 receives the reflected light from the object to be tested to generate a plurality of detection images. In other words, the first transfer unit 112 of the transfer mechanism 110 can transfer the object 270 to the detection unit 111 for edge detection. In the transmission process of the first transmission part 112, when the sensing system 120 provided in the first transmission part 112 senses the object 270, the light source 130 and the image capturing device can be actuated according to the transmission speed of the transfer mechanism 110. 150. The transfer speed of the transfer mechanism 110 may be 500 mm/s, but it is not limited to this. When the test object 270 passes through the detection unit 111, the light source 130 provides light from the light source to irradiate the test object 270, thereby generating a plurality of reflected light from the test object. The reflective element 140 can be used to transmit light from the light source to illuminate the multiple edges or corners of the object to be measured 270 and generate reflected light from the object to be measured, or The reflected light from the object to be measured is transmitted to the image capturing device 150. In other words, the reflected light from the object under test can be generated by the light from the light source directly irradiating the object 270, or by reflecting the light from the light source through the reflective element 140 to irradiate the object 270. The image capturing device 150 receives the reflected light from the object under test and generates a plurality of detection images, which can be used to determine whether the object under test 270 is flawed. After the test object 270 passes the detection unit 111, the second transmission unit 113 receives the test object 270 that has passed the detection unit 111, and transfers the test object 270 to the next station for subsequent processing. In this way, the edge inspection device 100 does not need to slow down and adjust the direction of the test object 270 with the help of external force to perform edge detection of the test object 270, which can prevent the test object 270 from being damaged by the collision of the external force during the detection process. Reduce the size.

感應系統120可包含感應器121及處理器122。感應器121用以感應待測物270並產生感應訊號,處理器122與感應器121及影像擷取裝置150電性連接,其接收感應訊號以啟閉影像擷取裝置150。處理器122可用以執行控制程式。詳細來說,感應器121可設置於第一傳送部112上。當感應器121感應到待測物270,感應器121可傳遞感應訊號至處理器122。處理器122可根據感應訊號以執行控制程式從而致動光源130及影像擷取裝置150。也就是說,當感應器121感應到待測物270後,邊緣檢查裝置100可根據控制程式致動光源130及影像擷取裝置150。藉此,可避免光源130及影像擷取裝置150長時間啟動而導致資源浪費,且可避免光源光線間相互干擾而影響檢測影像之品質。當然,在其他實施例中,光源130及影像擷取裝置150亦可維持在常開模式,或是隨著邊緣檢查裝置100開關而啟閉。 The sensing system 120 may include a sensor 121 and a processor 122. The sensor 121 is used to sense the object under test 270 and generate a sensing signal. The processor 122 is electrically connected to the sensor 121 and the image capturing device 150, and receives the sensing signal to turn on and off the image capturing device 150. The processor 122 can be used to execute a control program. In detail, the sensor 121 can be disposed on the first transmission part 112. When the sensor 121 senses the object 270, the sensor 121 can transmit the sensing signal to the processor 122. The processor 122 can execute a control program according to the sensing signal to activate the light source 130 and the image capturing device 150. In other words, after the sensor 121 detects the object 270, the edge inspection device 100 can activate the light source 130 and the image capturing device 150 according to the control program. In this way, the light source 130 and the image capturing device 150 can be prevented from being activated for a long time, which leads to waste of resources, and the interference between the light of the light source can be prevented from affecting the quality of the detected image. Of course, in other embodiments, the light source 130 and the image capturing device 150 can also be maintained in the normally-on mode, or be turned on and off as the edge inspection device 100 is turned on and off.

邊緣檢查裝置100可更包含判斷單元160。判斷單元160與影像擷取裝置150電性連接以接收檢測影像。判斷單元160可根據檢測影像進行瑕疵判斷以產生判斷結果。判斷結果可為有瑕疵待測物或無瑕疵待測物。判斷單元160更可根據檢測影像判斷瑕疵的種類及大小。 The edge inspection device 100 may further include a determining unit 160. The determining unit 160 is electrically connected to the image capturing device 150 to receive the detected image. The judging unit 160 can make a defect judgment based on the detected image to generate a judgment result. The judgment result can be a defective object to be tested or a non-defective object to be tested. The judging unit 160 can further judge the type and size of the defect based on the detected image.

由第2A~2C圖可知,邊緣檢查裝置200包含移載機構210、感應系統120、影像擷取裝置250、至少一光源及複數反射元件240。具體來說,至少一光源為外同軸光源230。感應系統120設置於移載機構210且與影像擷取裝置250及外同軸光源230電性連接。影像擷取裝置250設置於移載機構210之一側。外同軸光源230與影像擷取裝置250同軸地設置,且外同軸光源230介於影像擷取裝置250與移載機構210之間。反射元件240設置於移載機構210。影像擷取裝置250與感應系統120電性連接,並受感應系統120致動以掃描待測物270,其中所述掃描可為線掃描,但不以此為限。 As can be seen from FIGS. 2A to 2C, the edge inspection device 200 includes a transfer mechanism 210, a sensing system 120, an image capture device 250, at least one light source, and a plurality of reflective elements 240. Specifically, the at least one light source is an external coaxial light source 230. The sensing system 120 is disposed on the transfer mechanism 210 and is electrically connected to the image capturing device 250 and the external coaxial light source 230. The image capturing device 250 is disposed on one side of the transfer mechanism 210. The external coaxial light source 230 and the image capturing device 250 are coaxially arranged, and the external coaxial light source 230 is interposed between the image capturing device 250 and the transfer mechanism 210. The reflective element 240 is disposed on the transfer mechanism 210. The image capturing device 250 is electrically connected to the sensing system 120 and is activated by the sensing system 120 to scan the object 270. The scanning may be a line scan, but is not limited to this.

詳細來說,移載機構210包含檢測部211、第一傳送部212及第二傳送部213。第一傳送部212設置於檢測部211之一側以傳送待測物270至檢測部211。第二傳送部213設置於檢測部211之另一側以接收並移載待測物270。感應系統120設置於第一傳送部212以感應待測物270。外同軸光源230提供外同軸光線照射待測物270以產生待測物反射光線。複數反射元件240設置於檢測部211分別用以反射外同軸光線或待測物反射光線。感應系統120可根據移載機構210的傳送速度分別致動外同軸光源230及影像擷取裝置250,但不以此為限。影像 擷取裝置250受致動對待測物270掃描,以產生複數檢測影像,其中所述掃描可為線掃描,但不以此為限。具體來說,影像擷取裝置250可包含鏡頭251,其中鏡頭251係朝向移載機構210之檢測部211,以對待測物270進行掃描。外同軸光源230與影像擷取裝置250同軸地設置於移載機構210之同側,且外同軸光源230介於影像擷取裝置250與檢測部211之間。在第2A圖中,鏡頭251與外同軸光源230同軸地設置。外同軸光源230受感應系統120致動以提供外同軸光線照射通過檢測部211之待測物270,使待測物270受外同軸光線照射產生待測物反射光線。複數反射元件240使待測物反射光線可傳遞至影像擷取裝置250之鏡頭251中。影像擷取裝置250接收待測物反射光線並根據待測物反射光線產生複數檢測影像以判斷待測物270是否有瑕疵,其中複數檢測影像包含前端邊緣掃描影像、側邊緣掃描影像以及後端邊緣掃描影像。在待測物270通過檢測部211後,第二傳送部213會接收通過檢測部211之待測物270,並移載至下一站別進行後續處理。藉此,邊緣檢查裝置200可避免待測物270於邊緣檢測時受到外力碰撞而損壞及具有較短的檢測時間,進而提升檢測效率及產品良率。 In detail, the transfer mechanism 210 includes a detection unit 211, a first transfer unit 212 and a second transfer unit 213. The first conveying part 212 is disposed on one side of the detecting part 211 to convey the test object 270 to the detecting part 211. The second transmission part 213 is disposed on the other side of the detection part 211 to receive and transfer the object to be tested 270. The sensing system 120 is disposed at the first transmission part 212 to sense the object to be measured 270. The external coaxial light source 230 provides external coaxial light to illuminate the object 270 to generate reflected light from the object. The plurality of reflection elements 240 are disposed in the detection part 211 to reflect external coaxial light or the object to be measured, respectively. The sensing system 120 can respectively actuate the external coaxial light source 230 and the image capturing device 250 according to the transmission speed of the transfer mechanism 210, but is not limited to this. image The capture device 250 is actuated to scan the object 270 to generate a plurality of detection images, wherein the scan may be a line scan, but is not limited to this. Specifically, the image capturing device 250 may include a lens 251, wherein the lens 251 is directed toward the detection portion 211 of the transfer mechanism 210 to scan the object 270 to be measured. The external coaxial light source 230 and the image capturing device 250 are coaxially arranged on the same side of the transfer mechanism 210, and the external coaxial light source 230 is interposed between the image capturing device 250 and the detection part 211. In FIG. 2A, the lens 251 and the external coaxial light source 230 are arranged coaxially. The external coaxial light source 230 is actuated by the sensing system 120 to provide external coaxial light to illuminate the object 270 passing through the detection part 211, so that the object 270 is illuminated by the external coaxial light to generate reflected light of the object. The multiple reflection element 240 allows the light reflected by the object to be measured to be transmitted to the lens 251 of the image capturing device 250. The image capture device 250 receives the reflected light from the object to be measured and generates a plurality of detection images according to the reflected light of the object to determine whether the object 270 is flawed, wherein the plurality of detection images include a front edge scan image, a side edge scan image, and a rear edge Scan the image. After the test object 270 passes the detection unit 211, the second transmission unit 213 receives the test object 270 that has passed the detection unit 211, and transfers it to the next station for subsequent processing. Thereby, the edge inspection device 200 can prevent the object 270 from being damaged by external force during edge inspection and has a shorter inspection time, thereby improving inspection efficiency and product yield.

邊緣檢查裝置200之感應系統120的結構及其與外同軸光源230及影像擷取裝置250的作動關係與第1圖之感應系統120及其與光源130及影像擷取裝置150相同,在此不另贅述。 The structure of the sensing system 120 of the edge inspection device 200 and the operation relationship with the external coaxial light source 230 and the image capturing device 250 are the same as those of the sensing system 120 and the light source 130 and the image capturing device 150 in FIG. Another repeat.

邊緣檢查裝置200可更包含複數補光點狀光源231。補光點狀光源231設置於檢測部211之相對二側並與感應 系統120電性連接,並受感應系統120致動。補光點狀光源231可提供點狀光線以照射待測物270。具體來說,在第2D圖中,邊緣檢查裝置200之補光點狀光源231的數量為4,當待測物270為方形時,可對待測物270之四導角進行補光,使待測物270之導角受點狀光線照射而產生導角待測物反射光線,其中導角待測物反射光線包含前導角待測物反射光線及後導角待測物反射光線。 The edge inspection device 200 may further include a plurality of complementary light point light sources 231. The supplementary light point light source 231 is arranged on two opposite sides of the detection part 211 and is connected to the sensor The system 120 is electrically connected and activated by the induction system 120. The supplementary light point light source 231 can provide point light to illuminate the object 270 to be measured. Specifically, in Figure 2D, the number of light supplement point light sources 231 of the edge inspection device 200 is 4. When the test object 270 is square, the four corners of the test object 270 can be filled with light, so that the The lead angle of the measured object 270 is irradiated by the point-shaped light to generate the lead angle measured object reflected light, wherein the lead angle measured object reflected light includes the leading angle measured object reflected light and the rear lead angle measured object reflected light.

邊緣檢查裝置200之反射元件240包含旋轉反射元件241及複數邊緣反射元件242。旋轉反射元件241可旋轉地設置於檢測部211。邊緣反射元件242分別設置於旋轉反射元件241之相對二側。具體來說,旋轉反射元件241及邊緣反射元件242可為全反射元件,但不以此為限。另外,邊緣檢查裝置200可更包含馬達260。馬達260與旋轉反射元件241及感應系統120電性連接並受感應系統120致動以調整旋轉反射元件241。具體來說,在第2A圖中,旋轉反射元件241之旋轉反射角度為第一反射角度以將外同軸光源230所提供之外同軸光線反射至待測物270之前端,待測物270之前端受外同軸光線照射後可產生前端待測物反射光線並傳遞至影像擷取裝置250之鏡頭251中,以形成前端邊緣掃描影像。在完成前端邊緣掃描後,馬達260受感應系統120之處理器122致動以調整旋轉反射元件241之旋轉反射角度,即將旋轉反射元件241自第一反射角度調整至第二反射角度。在第2B圖中,邊緣反射元件242的數量為二且分別設置於旋轉反射元件241之相對二側。外同軸光源230所提供之外同軸光線可照射待測物270之側邊緣並產 生側邊緣待測物反射光線,邊緣反射元件242用以將側邊緣待測物反射光線反射至影像擷取裝置250之鏡頭251中,以形成側邊緣掃描影像。在第2C圖中,旋轉反射元件241之旋轉反射角度為第二反射角度以將外同軸光線反射至待測物270之後端,待測物270之後端受外同軸光線後可產生後端待測物反射光線並傳遞至影像擷取裝置250之鏡頭251中,以形成後端邊緣掃描影像。值得一提的是,外同軸光源230包含光源部(圖未示)及外同軸反射鏡(圖未示),光源部用以提供外同軸光線,外同軸光線透過外同軸半反射鏡反射以將外同軸光線反射至檢測部211。前端待測物反射光線、側邊緣待測物反射光線及後端待測物反射光線可穿透外同軸半反射鏡而傳遞至鏡頭251中。 The reflection element 240 of the edge inspection device 200 includes a rotating reflection element 241 and a plurality of edge reflection elements 242. The rotating reflection element 241 is rotatably provided in the detection part 211. The edge reflection elements 242 are respectively disposed on two opposite sides of the rotating reflection element 241. Specifically, the rotating reflection element 241 and the edge reflection element 242 may be total reflection elements, but not limited thereto. In addition, the edge inspection device 200 may further include a motor 260. The motor 260 is electrically connected to the rotating reflective element 241 and the sensing system 120 and is actuated by the sensing system 120 to adjust the rotating reflective element 241. Specifically, in Figure 2A, the rotating reflection angle of the rotating reflection element 241 is the first reflection angle to reflect the external coaxial light provided by the external coaxial light source 230 to the front end of the object under test 270, and the front end of the object under test 270 After being irradiated by the external coaxial light, the reflected light from the front-end object to be measured can be generated and transmitted to the lens 251 of the image capturing device 250 to form a front-end edge scanning image. After the front edge scanning is completed, the motor 260 is actuated by the processor 122 of the sensing system 120 to adjust the rotation reflection angle of the rotating reflection element 241, that is, the rotation reflection element 241 is adjusted from the first reflection angle to the second reflection angle. In FIG. 2B, the number of edge reflection elements 242 is two and they are respectively disposed on two opposite sides of the rotating reflection element 241. The external coaxial light provided by the external coaxial light source 230 can illuminate the side edge of the test object 270 and produce The side edge of the object to be measured reflects light, and the edge reflection element 242 is used to reflect the light reflected from the side edge of the object to be measured to the lens 251 of the image capturing device 250 to form a side edge scanning image. In Figure 2C, the rotating reflection angle of the rotating reflection element 241 is the second reflection angle to reflect the external coaxial light to the rear end of the test object 270. The rear end of the test object 270 receives the external coaxial light to produce a back end test The object reflects light and transmits it to the lens 251 of the image capturing device 250 to form a rear edge scan image. It is worth mentioning that the external coaxial light source 230 includes a light source part (not shown) and an external coaxial reflector (not shown). The light source part is used to provide external coaxial light, and the external coaxial light passes through the external coaxial half mirror to reflect The external coaxial light is reflected to the detection part 211. The light reflected by the object to be measured at the front end, the light reflected from the object to be measured at the side edge and the light reflected from the object to be measured at the rear end can penetrate the outer coaxial half mirror and be transmitted to the lens 251.

另外,邊緣檢查裝置200可更包含判斷單元160(請配合第1圖)。影像擷取裝置250將前端邊緣掃描影像、側邊緣掃描影像以及後端邊緣掃描影像傳遞至判斷單元160以進行瑕疵判斷並產生判斷結果。 In addition, the edge inspection device 200 may further include a judging unit 160 (please cooperate with Fig. 1). The image capturing device 250 transmits the front edge scan image, the side edge scan image, and the rear edge scan image to the determining unit 160 to perform defect determination and generate a determination result.

當設置於第一傳送部212之感應系統120之感應器121感應到待測物270後,感應器121傳送感應訊號至處理器122以分別致動外同軸光源230、補光點狀光源231及影像擷取裝置250。當待測物270之前端進入檢測部211之檢測區域時,外同軸光源230、用以照射待測物270前端導角之補光點狀光源231及影像擷取裝置250受感應系統120致動,其中用以照射待測物270前端導角之補光點狀光源231為靠近第二傳送部213之二補光點狀光源231。外同軸光源230提供外同軸光線照 射反射元件240之旋轉反射元件241及邊緣反射元件242,其中旋轉反射元件241反射外同軸光線至待測物270前端邊緣以形成前端待測物反射光線並傳遞至影像擷取裝置250。照射待測物270前端導角之補光點狀光源231提供點狀光線以照射待測物270前端導角,並形成前導角待測物反射光線並傳遞至影像擷取裝置250。影像擷取裝置250接收前端待測物反射光線及前導角待測物反射光線以產生前端邊緣掃描影像。當前端邊緣掃描後,馬達260受感應系統120致動以將旋轉反射元件241之旋轉反射角度調整為第二反射角度。照射待測物270前端導角之補光點狀光源231於完成前端邊緣掃描後受感應系統120致動而關閉。 After the sensor 121 of the sensing system 120 arranged in the first transmitting part 212 senses the object 270, the sensor 121 transmits the sensing signal to the processor 122 to respectively actuate the external coaxial light source 230, the supplementary light point light source 231 and Image capture device 250. When the front end of the test object 270 enters the detection area of the detection section 211, the external coaxial light source 230, the supplementary light point light source 231 for illuminating the front end of the test object 270 and the image capturing device 250 are actuated by the sensing system 120 The supplementary light point light source 231 used to illuminate the leading angle of the front end of the test object 270 is the two supplementary light point light sources 231 close to the second transmission part 213. The external coaxial light source 230 provides external coaxial light illumination The rotating reflecting element 241 and the edge reflecting element 242 of the reflective element 240, wherein the rotating reflecting element 241 reflects the external coaxial light to the front edge of the test object 270 to form the front end of the test object to reflect the light and transmit it to the image capturing device 250. The supplementary light point light source 231 illuminating the front lead angle of the test object 270 provides spot light to illuminate the front lead angle of the test object 270 and forms a lead angle to reflect the light from the test object and transmit it to the image capturing device 250. The image capturing device 250 receives the light reflected from the front end object to be measured and the leading angle reflected light from the object to be measured to generate a front edge scan image. After the front edge is scanned, the motor 260 is actuated by the sensing system 120 to adjust the rotating reflection angle of the rotating reflection element 241 to the second reflection angle. The complementary light point light source 231 that illuminates the leading angle of the test object 270 is actuated by the sensing system 120 and turned off after the scanning of the front edge of the object 270 is completed.

前端邊緣掃描完成後,外同軸光源230持續提供之外同軸光線照射待測物270之側邊緣以形成側邊緣待測物反射光線,邊緣反射元件242用以將側邊緣待測物反射光線反射至影像擷取裝置250以形成側邊緣掃描影像。 After the front edge scanning is completed, the external coaxial light source 230 continuously provides external coaxial light to illuminate the side edge of the object to be measured 270 to form the side edge of the object to be measured to reflect the light. The edge reflection element 242 is used to reflect the light reflected from the side edge of the object to be measured to The image capturing device 250 forms a side edge scan image.

當待測物270之後端進入檢測部211之檢測區域時,照射待測物270後端導角之補光點狀光源231受感應系統120致動而提供點狀光線照射待測物270後端導角,以產生後導角待測物反射光線並傳遞至影像擷取裝置250。照射待測物270後端導角之補光點狀光源231為靠近第一傳送部212之二補光點狀光源231。外同軸光源230之外同軸光線照射呈第二反射角度之旋轉反射元件241,旋轉反射元件241反射外同軸光線至待測物270後端邊緣,以形成後端待測物反射光線並傳遞至影像擷取裝置250。當完成後端邊緣掃描後,外同軸光源 230、照射待測物270後端導角之補光點狀光源231及影像擷取裝置250受感應系統120致動而關閉。第二傳送部213則可將待測物270傳送至下一站別以進行後續處理。在其他實施例中,外同軸光源230、補光點狀光源231及影像擷取裝置250亦可維持在常開模式,或是隨著邊緣檢查裝置200開關而啟閉。 When the back end of the test object 270 enters the detection area of the detection part 211, the supplementary light point light source 231 that illuminates the back end of the test object 270 is actuated by the sensing system 120 to provide a point light to illuminate the back end of the test object 270 The lead angle is used to generate the trailing angle to reflect the light from the object to be measured and transmit it to the image capturing device 250. The supplementary light point light source 231 irradiating the trailing angle of the test object 270 is the second supplementary light point light source 231 close to the first conveying part 212. The coaxial light outside the external coaxial light source 230 irradiates the rotating reflecting element 241 with the second reflection angle. The rotating reflecting element 241 reflects the external coaxial light to the rear edge of the test object 270 to form the rear end of the test object to reflect the light and transmit it to the image Extraction device 250. When the rear edge scan is completed, the external coaxial light source 230. The complementary light point light source 231 and the image capturing device 250 that illuminate the trailing angle of the test object 270 are actuated by the sensing system 120 to turn off. The second transfer unit 213 can transfer the object 270 to the next station for subsequent processing. In other embodiments, the external coaxial light source 230, the supplementary light point light source 231, and the image capturing device 250 can also be maintained in the normally-on mode, or opened and closed as the edge inspection device 200 is switched on and off.

由第3A~3F圖可知,邊緣檢查裝置300包含移載機構310、感應系統120、複數影像擷取裝置350a、350b及複數反射元件組356a、356b,其中感應系統120可設置於邊緣檢查裝置300之移載機構310、邊緣檢查裝置300之影像擷取裝置350a、350b或其他站別以感測待測物360。第3A~3F圖之實施方式中,至少一光源為複數線型光源(未另標號),其分別為第一線型光源330a及第二線型光源330b,但本發明不以此為限。感應系統120與影像擷取裝置350a、350b及線型光源電性連接。第一與第二線型光源330a、330b分別設置於移載機構310之相對二側且與感應系統120電性連接,並受感應系統120致動以照射待測物360,並產生複數待測物反射光線。複數影像擷取裝置350a、350b分別設置於移載機構310之相對二側,以掃描待測物360。複數反射元件組356a、356b分別設置於影像擷取裝置350a、350b中。 It can be seen from FIGS. 3A to 3F that the edge inspection device 300 includes a transfer mechanism 310, a sensing system 120, a plurality of image capturing devices 350a, 350b, and a plurality of reflective element groups 356a, 356b, wherein the sensing system 120 can be installed in the edge inspection device 300 The transfer mechanism 310 of the edge inspection device 300, the image capturing devices 350a, 350b of the edge inspection device 300, or other stations are used to sense the object 360. In the embodiment of FIGS. 3A to 3F, at least one light source is a plurality of linear light sources (not marked separately), which are respectively the first linear light source 330a and the second linear light source 330b, but the invention is not limited thereto. The sensing system 120 is electrically connected to the image capturing devices 350a, 350b and the linear light source. The first and second linear light sources 330a, 330b are respectively disposed on two opposite sides of the transfer mechanism 310 and are electrically connected to the sensing system 120, and are actuated by the sensing system 120 to illuminate the test object 360, and generate a plurality of test objects Reflect light. The plural image capturing devices 350a and 350b are respectively disposed on two opposite sides of the transfer mechanism 310 to scan the object 360 to be tested. The plurality of reflective element groups 356a and 356b are respectively arranged in the image capturing devices 350a and 350b.

詳細來說,移載機構310包含檢測部311、第一傳送部312及第二傳送部313。第一傳送部312設置於檢測部311之一側以傳送待測物360至檢測部311。第二傳送部313設置於檢測部311之另一側以接收並移載待測物360。感應系統120包含感應器121及處理器122。具體來說,在第3A圖中,感應器 121設置於影像擷取裝置350a以感應待測物360,並產生感測訊號予處理器122。值得一提的是,感應器121亦可設置於影像擷取裝置350a內,並透過影像擷取裝置350a感測待測物360。處理器122可根據感應訊號執行控制程式。複數反射元件組356a、356b分別與影像擷取裝置350a、350b連接,用以傳遞待測物反射光線至影像擷取裝置350a、350b。也就是說,移載機構310之第一傳送部312可傳送待測物360至檢測部311進行邊緣檢測。在第一傳送部312的傳送過程中,當設置於影像擷取裝置350a之感應系統120的感應器121感應到待測物360後,處理器122可根據移載機構310的傳送速度分別致動第一與第二線型光源330a、330b及影像擷取裝置350a、350b。也就是說,處理器122根據感應訊號以執行控制程式從而致動第一與第二線型光源330a、330b及影像擷取裝置350a、350b。在待測物360通過檢測部311的過程中,第一與第二線型光源330a、330b受感應系統120致動以提供線型光線照射待測物360,進而產生複數待測物反射光線。影像擷取裝置350a、350b受感應系統120致動以掃描待測物360並接收待測物反射光線。影像擷取裝置350a、350b根據待測物反射光線形成檢測影像以判斷待測物360是否有瑕疵,其中檢測影像可包含前段上表面檢測影像、前緣檢測影像、前段下表面檢測影像、後段上表面檢測影像、後緣檢測影像以及後段下表面檢測影像。反射元件組356a、356b設置於影像擷取裝置350a、350b中以傳遞待測物反射光線至影像擷取裝置350a、350b,使影像擷取裝置350a、350b可根據待測物反射光線形成檢測影 像。具體來說,在第3A圖中,線型光源(即指第一線型光源330a與第二線型光源330b)、影像擷取裝置350a、350b及反射元件組356a、356b的數量皆是二。第一線型光源330a是位於移載機構310之第一傳送部312之上側,用以提供第一線型光線照射檢測部311之第一檢測區P1。第二線型光源330b是位於移載機構310之第二傳送部313之下側,用以提供第二線型光線照射檢測部311之第二檢測區P2(如第3B圖所示)。影像擷取裝置350a設置於移載機構310之第二傳送部313之上側。影像擷取裝置350b設置於移載機構310之第一傳送部312之下側。藉此,邊緣檢查裝置300不需借助外力調整待測物360的方向即可針對待測物360垂直於傳動方向的邊緣進行邊緣檢測,可避免待測物360受到外力的碰撞而損壞,並可提升邊緣檢查裝置300的檢測速度。因此可提升產品良率及檢測效率。 In detail, the transfer mechanism 310 includes a detection part 311, a first transfer part 312 and a second transfer part 313. The first transfer part 312 is arranged on one side of the detection part 311 to transfer the object 360 to the detection part 311. The second transmission part 313 is disposed on the other side of the detection part 311 to receive and transfer the object 360 to be tested. The sensing system 120 includes a sensor 121 and a processor 122. Specifically, in Figure 3A, the sensor 121 is disposed in the image capturing device 350a to sense the object 360 to be measured and generate a sensing signal to the processor 122. It is worth mentioning that the sensor 121 can also be arranged in the image capturing device 350a, and sense the object 360 through the image capturing device 350a. The processor 122 can execute a control program according to the sensing signal. The plurality of reflective element groups 356a and 356b are connected to the image capturing devices 350a and 350b, respectively, for transmitting the reflected light from the object to be measured to the image capturing devices 350a and 350b. In other words, the first transfer part 312 of the transfer mechanism 310 can transfer the test object 360 to the detection part 311 for edge detection. In the transmission process of the first transmission part 312, when the sensor 121 of the sensing system 120 provided in the image capturing device 350a senses the object to be measured 360, the processor 122 can be actuated separately according to the transmission speed of the transfer mechanism 310 The first and second linear light sources 330a, 330b and the image capturing devices 350a, 350b. In other words, the processor 122 executes a control program according to the sensing signal to activate the first and second linear light sources 330a, 330b and the image capturing devices 350a, 350b. When the test object 360 passes through the detection part 311, the first and second linear light sources 330a, 330b are actuated by the sensing system 120 to provide linear light to irradiate the test object 360, thereby generating a plurality of reflected light from the test object. The image capturing devices 350a and 350b are actuated by the sensing system 120 to scan the object 360 and receive light reflected by the object. The image capturing devices 350a and 350b form a detection image according to the reflected light of the object to be tested to determine whether the object 360 is flawed. The detection image may include the front upper surface detection image, the front edge detection image, the front lower surface detection image, and the back upper surface. Surface inspection image, trailing edge inspection image, and posterior lower surface inspection image. The reflective element groups 356a, 356b are arranged in the image capturing devices 350a, 350b to transmit the reflected light from the object to be measured to the image capturing devices 350a, 350b, so that the image capturing devices 350a, 350b can form a detection shadow based on the reflected light from the object to be measured. Like. Specifically, in Figure 3A, the number of linear light sources (that is, the first linear light source 330a and the second linear light source 330b), the image capturing devices 350a, 350b, and the reflective element groups 356a, 356b are all two. The first linear light source 330a is located above the first conveying portion 312 of the transfer mechanism 310 and is used to provide the first detection area P1 of the first linear light irradiating the detection portion 311. The second linear light source 330b is located under the second conveying portion 313 of the transfer mechanism 310, and is used to provide the second linear light irradiating the second detection area P2 of the detection portion 311 (as shown in FIG. 3B). The image capturing device 350 a is disposed on the upper side of the second transfer portion 313 of the transfer mechanism 310. The image capturing device 350b is disposed under the first transfer portion 312 of the transfer mechanism 310. In this way, the edge inspection device 300 does not need to adjust the direction of the object 360 to be tested with the help of external force to perform edge detection on the edge of the object 360 to be tested perpendicular to the transmission direction, which can prevent the object to be tested 360 from being damaged by the collision of the external force. The detection speed of the edge inspection device 300 is improved. Therefore, product yield and detection efficiency can be improved.

影像擷取裝置350a、350b包含延伸環351a、351b、第一檢測鏡頭354a、354b及第二檢測鏡頭355a、355b。延伸環351a、351b包含反射側及半反射側。第一檢測鏡頭354a、354b與延伸環351a、351b之半反射側連接。第二檢測鏡頭355a、355b與延伸環351a、351b之反射側連接。反射元件組356a、356b包含第一反射元件352a、352b及第二反射元件353a、353b。第一反射元件352a、352b設置於延伸環351a、351b之半反射側。第二反射元件353a、353b設置於延伸環351a、351b之反射側。具體而言,第一反射元件352a、352b為半反射元件,第二反射元件353a、353b為全反射元件,但不以此為限。詳細來說,第一檢測鏡頭354a、354b及第二檢 測鏡頭355a、355b是朝向移載機構310之檢測部311進行設置,以對待測物360進行掃描。線型光線照射待測物360所產生之部分待測物反射光線可經由第一檢測鏡頭354a、354b進入延伸環351a、351b之半反射側,並穿透位於延伸環351a、351b之半反射側之第一反射元件352a、352b以傳遞至影像擷取裝置350a、350b。線型光線照射待測物360所產生之另一部分之待測物反射光線可經由第二檢測鏡頭355a、355b進入延伸環351a、351b之反射側,並藉由位於延伸環351a、351b之反射側之第二反射元件353a、353b反射至第一反射元件352a、352b,第一反射元件352a、352b接收待測物反射光線後再將待測物反射光線反射至影像擷取裝置350a、350b。 The image capturing devices 350a, 350b include extension rings 351a, 351b, first detection lenses 354a, 354b, and second detection lenses 355a, 355b. The extension rings 351a and 351b include a reflective side and a semi-reflective side. The first detection lens 354a, 354b is connected to the semi-reflective side of the extension ring 351a, 351b. The second detecting lens 355a, 355b is connected to the reflection side of the extension ring 351a, 351b. The reflective element groups 356a and 356b include first reflective elements 352a and 352b and second reflective elements 353a and 353b. The first reflective elements 352a and 352b are arranged on the semi-reflective side of the extension rings 351a and 351b. The second reflective elements 353a and 353b are arranged on the reflective side of the extension rings 351a and 351b. Specifically, the first reflective elements 352a and 352b are semi-reflective elements, and the second reflective elements 353a and 353b are total reflective elements, but it is not limited thereto. In detail, the first inspection lens 354a, 354b and the second inspection lens The measuring lenses 355a and 355b are set toward the detection part 311 of the transfer mechanism 310 to scan the object 360 to be measured. Part of the reflected light of the test object generated by the linear light irradiating the test object 360 can enter the semi-reflective side of the extension ring 351a, 351b through the first detection lens 354a, 354b, and penetrate the semi-reflective side of the extension ring 351a, 351b The first reflective elements 352a and 352b are transferred to the image capturing devices 350a and 350b. The reflected light of another part of the test object generated by the linear light irradiating the test object 360 can enter the reflection side of the extension ring 351a, 351b through the second detection lens 355a, 355b, and pass through the reflection side of the extension ring 351a, 351b. The second reflective elements 353a and 353b are reflected to the first reflective elements 352a and 352b. The first reflective elements 352a and 352b receive the reflected light from the object to be measured and then reflect the reflected light from the measured object to the image capturing devices 350a and 350b.

另外,邊緣檢查裝置300可更包含判斷單元160(請配合參照第1圖)。判斷單元160與影像擷取裝置350a、350b電性連接。影像擷取裝置350a、350b將前段上表面檢測影像、前緣檢測影像、前段下表面檢測影像、後段上表面檢測影像、後緣檢測影像以及後段下表面檢測影像傳遞至判斷單元160以進行瑕疵判斷並產生判斷結果。 In addition, the edge inspection device 300 may further include a judgment unit 160 (please refer to FIG. 1 for cooperation). The determining unit 160 is electrically connected to the image capturing devices 350a and 350b. The image capturing devices 350a and 350b transfer the front upper surface detection image, the front edge detection image, the front lower surface detection image, the rear upper surface detection image, the rear edge detection image, and the rear lower surface detection image to the judgment unit 160 for defect judgment. And produce the judgment result.

請配合照第3A圖,當感應系統120之感應器121感測到待測物360後,感應器121傳送感應訊號至處理器122,處理器122根據感應訊號執行控制程式以致動第一與第二線型光源330a、330b及影像擷取裝置350a。當待測物360之前段上表面到達第一檢測區P1時,第一線型光源330a提供第一線型光線照射待測物360之前段上表面以形成前段上表面待測物反射光線並經由第一檢測鏡頭354a進入延伸環351a之半反射 側,位於延伸環351a之半反射側之第一反射元件352a接收前段上表面待測物反射光線,並供前段上表面待測物反射光線穿透,以將前段上表面待測物反射光線傳遞至影像擷取裝置350a,影像擷取裝置350a接收前段上表面待測物反射光線,並根據前段上表面待測物反射光線產生前段上表面檢測影像。當待測物360之前段上表面通過第一檢測區P1時,第一線型光源330a停止提供第一線型光線。 Please follow Fig. 3A. After the sensor 121 of the sensing system 120 senses the object 360, the sensor 121 transmits a sensing signal to the processor 122, and the processor 122 executes a control program according to the sensing signal to activate the first and second Two-line light sources 330a, 330b and image capturing device 350a. When the upper surface of the front section of the test object 360 reaches the first detection zone P1, the first linear light source 330a provides first line light to illuminate the upper surface of the front section of the test object 360 to form the front upper surface of the test object reflecting light and pass through The first detection lens 354a enters the half reflection of the extension ring 351a On the side, the first reflective element 352a located on the semi-reflective side of the extension ring 351a receives the reflected light from the upper surface of the front section and transmits the reflected light from the upper surface of the front section to transmit the reflected light from the upper surface of the front section. To the image capturing device 350a, the image capturing device 350a receives the light reflected from the object to be tested on the upper surface of the front section, and generates a detection image of the upper surface of the front section according to the light reflected from the object to be measured on the upper surface of the front section. When the upper surface of the front section of the test object 360 passes through the first detection area P1, the first linear light source 330a stops providing the first linear light.

請配合照第3B圖,當待測物360之前緣及導角到達檢測部311之第二檢測區P2時,第二線型光源330b用以提供第二線型光線照射待測物360之前緣及導角以形成前緣待測物反射光線。前緣待測物反射光線經由第二檢測鏡頭355a進入延伸環351a之反射側,設置於延伸環351a之反射側之第二反射元件353a接收前緣待測物反射光線,並將前緣待測物反射光線反射至第一反射元件352a,第一反射元件352a接收前緣待測物反射光線後,再將前緣待測物反射光線反射至影像擷取裝置350a,影像擷取裝置350a接收前緣待測物反射光線,並根據前緣待測物反射光線產生前緣檢測影像。當待測物360之前緣通過第二檢測區P2後,第二線型光源330b持續提供第二線型光線。 Please follow Figure 3B. When the front edge and lead angle of the test object 360 reach the second detection area P2 of the detection part 311, the second linear light source 330b is used to provide second linear light to illuminate the front edge and guide angle of the test object 360. Angle to form the front edge of the object to be measured to reflect light. The light reflected from the front edge of the object to be measured enters the reflection side of the extension ring 351a through the second detection lens 355a. The second reflective element 353a disposed on the reflection side of the extension ring 351a receives the light reflected by the front edge of the object to be measured, and sets the front edge to be measured. The reflected light from the object is reflected to the first reflective element 352a. After the first reflective element 352a receives the light reflected from the front edge of the object to be measured, it reflects the light reflected from the front edge of the object to be measured to the image capturing device 350a, and the image capturing device 350a receives the front The edge of the object to be measured reflects light, and a front edge detection image is generated based on the light reflected from the front edge of the object to be measured. After the front edge of the test object 360 passes through the second detection area P2, the second linear light source 330b continuously provides the second linear light.

請配合照第3B圖及第3C圖,當待測物360之前緣及導角到達檢測部311之第二檢測區P2時,第二線型光源330b用以提供第二線型光線照射待測物360之前段下表面以形成前段下表面待測物反射光線。前段下表面待測物反射光線經由第一檢測鏡頭354b進入延伸環351b之半反射側,設置於延伸環 351b半反射側之第一反射元件352b接收前段下表面待測物反射光線,並供前段下表面待測物反射光線穿透至影像擷取裝置350b,影像擷取裝置350b接收前段下表面待測物反射光線,並根據前段下表面待測物反射光線產生前段下表面檢測影像。當待測物360之前段下表面通過第二檢測區P2後,第二線型光源330b停止提供第二線型光線。 Please follow Fig. 3B and Fig. 3C together. When the front edge and lead angle of the test object 360 reach the second detection area P2 of the detection part 311, the second linear light source 330b is used to provide a second line of light to illuminate the test object 360 The lower surface of the front section is formed to reflect light from the object under test on the lower surface of the front section. The light reflected from the lower surface of the front section enters the semi-reflective side of the extension ring 351b through the first detection lens 354b, and is arranged in the extension ring The first reflective element 352b on the semi-reflective side of 351b receives the reflected light from the lower surface of the front section to be measured, and allows the reflected light from the lower surface of the front section to be measured to penetrate to the image capturing device 350b, and the image capturing device 350b receives the lower surface of the front section to be measured The object reflects light, and the front lower surface detection image is generated according to the reflected light from the lower surface of the object to be tested. After the lower surface of the front section of the test object 360 passes through the second detection area P2, the second linear light source 330b stops providing the second linear light.

請配合照第3D圖,當待測物360之後段上表面到達第一檢測區P1時,第一線型光源330a提供第一線型光線照射待測物360之後段上表面以形成後段上表面待測物反射光線,後段上表面待測物反射光線經由第一檢測鏡頭354a進入延伸環351a之半反射側,位於延伸環351a半反射側之第一反射元件352a接收後段上表面待測物反射光線,並供後段上表面待測物反射光線穿透,以將後段上表面待測物反射光線傳遞至影像擷取裝置350a,影像擷取裝置350a接收後段上表面待測物反射光線,並根據後段上表面待測物反射光線產生後段上表面檢測影像。當待測物360之後段上表面通過第一檢測區P1時,第一線型光源330a持續提供第一線型光線。 Please follow the 3D picture. When the upper surface of the back section of the test object 360 reaches the first detection area P1, the first linear light source 330a provides the first linear light to irradiate the upper surface of the back section of the test object 360 to form the upper surface of the back section. The object under test reflects light, and the light reflected from the upper surface of the back section enters the semi-reflective side of the extension ring 351a through the first detection lens 354a. The first reflective element 352a located on the semi-reflective side of the extension ring 351a receives the reflection from the upper surface of the back end object to be tested The light reflected from the upper surface of the rear section of the object to be measured penetrates, so as to transmit the reflected light from the upper surface of the rear section of the object to be measured to the image capturing device 350a. The image capturing device 350a receives the reflected light from the upper surface of the rear section of the object to be measured. The light reflected from the object to be tested on the upper surface of the rear section produces a detection image on the upper surface of the rear section. When the upper surface of the back section of the test object 360 passes through the first detection area P1, the first linear light source 330a continuously provides the first linear light.

請配合照第3E圖,當待測物360之後緣及其導角到達檢測部311之第一檢測區P1時,第一線型光源330a用以提供第一線型光線照射待測物360之後緣及其導角以形成後緣待測物反射光線。後緣待測物反射光線經由第二檢測鏡頭355b進入延伸環351b之反射側,設置於延伸環351b之反射側之第二反射元件353b接收後緣待測物反射光線,並將後緣待測物反射光線反射至位於延伸環351b之反射側之第一反射元件 352b,第一反射元件352b接收後緣待測物反射光線,並將後緣待測物反射光線反射至影像擷取裝置350b,影像擷取裝置350b接收後緣待測物反射光線,並根據後緣待測物反射光線產生後緣檢測影像。當待測物360之後緣通過第一檢測區P1後,第一線型光源330a停止提供第一線型光線。 Please follow Figure 3E. When the trailing edge of the test object 360 and its lead angle reach the first detection area P1 of the detection part 311, the first linear light source 330a is used to provide the first linear light to irradiate the test object 360. The edge and its leading angle form the trailing edge to reflect light from the object under test. The light reflected from the trailing edge of the object to be measured enters the reflective side of the extension ring 351b through the second detection lens 355b. The second reflective element 353b disposed on the reflective side of the extension ring 351b receives the light reflected from the trailing edge of the object to be measured, and sets the trailing edge to be measured. The object reflected light is reflected to the first reflective element located on the reflective side of the extension ring 351b 352b. The first reflective element 352b receives the light reflected from the trailing edge of the object to be measured, and reflects the trailing edge of the object to be measured to the image capturing device 350b. The image capturing device 350b receives the trailing edge of the object to be measured and reflects the light according to the trailing edge of the object to be measured. The edge of the object to be measured reflects light to produce a trailing edge detection image. After the trailing edge of the test object 360 passes through the first detection area P1, the first linear light source 330a stops providing the first linear light.

請配合照第3F圖,當待測物360之後段下表面到達第二檢測區P2時,第二線型光源330b提供第二線型光線照射待測物360之後段下表面以形成後段下表面待測物反射光線,後段下表面待測物反射光線經由第一檢測鏡頭354b進入延伸環351b之半反射側,位於延伸環351b半反射側之第一反射元件352b接收後段下表面待測物反射光線,並供後段下表面待測物反射光線穿透,以使後段下表面待測物反射光線可傳遞至影像擷取裝置350b,影像擷取裝置350b接收後段下表面待測物反射光線,並根據後段下表面待測物反射光線產生後段下表面檢測影像。當待測物360之後段下表面通過第二檢測區P2後,第二線型光源330b停止提供第二線型光線。 Please take the picture 3F together. When the lower surface of the test object 360 reaches the second detection area P2, the second linear light source 330b provides a second linear light to illuminate the lower surface of the test object 360 to form the lower surface of the test object 360. The object reflects light, and the reflected light from the lower surface of the back-end object enters the semi-reflective side of the extension ring 351b through the first detection lens 354b. The first reflective element 352b located on the semi-reflective side of the extension ring 351b receives the light reflected from the lower surface of the back-end object. And for the reflected light from the lower surface of the back section to pass through, so that the reflected light from the lower surface of the back section can be transmitted to the image capturing device 350b. The image capturing device 350b receives the reflected light from the lower surface of the back section to be measured according to the back section. The light reflected by the object to be tested on the lower surface produces a detection image on the lower surface of the rear section. When the lower surface of the back section of the test object 360 passes through the second detection area P2, the second linear light source 330b stops providing the second linear light.

藉此,邊緣檢查裝置300不需藉由外力調整待測物360之方向即可對待測物360進行前段邊緣檢測、後段邊緣檢測、前段上表面檢測、後段上表面檢測、前段下表面檢測及後段下表面檢測,並可避免待測物360於檢測過程中受到外力的碰撞而損壞,更可提升邊緣檢查裝置300的檢測速度。 Thereby, the edge inspection device 300 can perform front edge detection, back edge detection, front upper surface detection, back upper surface detection, back upper surface detection, front lower surface detection, and back end of the test object 360 without adjusting the direction of the test object 360 by external force. The lower surface detection can prevent the object 360 to be tested from being damaged by the impact of external force during the detection process, and can also increase the detection speed of the edge inspection device 300.

由第4A圖及第4B圖可知,邊緣檢查裝置500與邊緣檢查裝置200大致相同,同樣包含移載機構510、感應系統120、影像擷取裝置550、至少一光源及複數反射元件540,故 相似處不再贅述。移載機構510可包含檢測部511、第一傳送部512及第二傳送部513。差異在於,至少一光源為複數照射點狀光源(未另標號),並分別設置於影像擷取裝置550之相對兩側,且各照射點狀光源提供照射光線照射待測物570,以產生複數待測物反射光線。複數照射點狀光源包含第一照射點狀光源532a及第二照射點狀光源532b。第一與第二照射點狀光源532a、532b分別受感應系統120的處理器122致動以提供照射光線照射通過檢測部511之待測物570,使待測物570受照射光線照射產生待測物反射光線。藉此,邊緣檢查裝置500可藉由第一與第二照射點狀光源532a、532b的設置以對待測物570進行邊緣檢測,可達到相似或相同於邊緣檢查裝置200的功效。 It can be seen from FIGS. 4A and 4B that the edge inspection device 500 is substantially the same as the edge inspection device 200, and also includes a transfer mechanism 510, a sensing system 120, an image capture device 550, at least one light source, and a plurality of reflective elements 540. The similarities are not repeated here. The transfer mechanism 510 may include a detection part 511, a first transfer part 512 and a second transfer part 513. The difference is that at least one light source is a plurality of illuminating point-shaped light sources (not marked separately), which are respectively arranged on opposite sides of the image capturing device 550, and each illuminating point-shaped light source provides illuminating light to illuminate the object 570 to generate a plurality of The object under test reflects light. The plural irradiation point light sources include a first irradiation point light source 532a and a second irradiation point light source 532b. The first and second illuminating point-shaped light sources 532a, 532b are respectively actuated by the processor 122 of the sensing system 120 to provide irradiated light to irradiate the test object 570 passing through the detection part 511, so that the test object 570 is irradiated by the irradiated light to produce the test object 570 Object reflects light. In this way, the edge inspection device 500 can perform edge detection on the object 570 by the arrangement of the first and second illuminating point light sources 532a and 532b, which can achieve the effect similar to or the same as that of the edge inspection device 200.

同樣地,邊緣檢查裝置500也可更包含複數補光點狀光源531,在此不另贅述。另外,邊緣檢查裝置500可更包含馬達560。馬達560與旋轉反射元件541及感應系統120電性連接並受感應系統120之處理器122致動以調整旋轉反射元件541。具體來說,在第4A圖中,旋轉反射元件541之旋轉反射角度為第一反射角度以將第一照射點狀光源532a所提供之照射光線反射至待測物570之前端,待測物570之前端受照射光線照射後可產生前端待測物反射光線並傳遞至影像擷取裝置550之鏡頭551中,以形成前端邊緣掃描影像。在完成前端邊緣掃描後,馬達560受感應系統120之處理器122致動以調整旋轉反射元件541之旋轉反射角度,即將旋轉反射元件541自第一反射角度調整至第二反射角度。第一照射點狀光源532a及第二照射點狀光源532b所提供照射光線可照射待測物570 之側邊緣並產生側邊緣待測物反射光線,邊緣反射元件542用以將側邊緣待測物反射光線反射至影像擷取裝置550之鏡頭551中,以形成側邊緣掃描影像。在第4B圖中,旋轉反射元件541之旋轉反射角度為第二反射角度,以將第二照射點狀光源532b所提供之照射光線反射至待測物570之後端,待測物570之後端受第二照射點狀光源532b所提供之照射光線照射後可產生後端待測物反射光線並傳遞至影像擷取裝置550之鏡頭551中,以形成後端邊緣掃描影像。另外,邊緣檢查裝置500與判斷單元160之作動關係與第1圖及第2A圖的邊緣檢查裝置200及判斷單元160相同,在此不另贅述。 Similarly, the edge inspection device 500 may further include a plurality of light-filling point light sources 531, which will not be described here. In addition, the edge inspection device 500 may further include a motor 560. The motor 560 is electrically connected to the rotating reflection element 541 and the sensing system 120 and is actuated by the processor 122 of the sensing system 120 to adjust the rotating reflection element 541. Specifically, in Figure 4A, the rotating reflection angle of the rotating reflection element 541 is the first reflection angle to reflect the irradiated light provided by the first illuminating point-shaped light source 532a to the front end of the test object 570, the test object 570 After the front end is irradiated by the irradiated light, the reflected light from the front end object to be measured can be generated and transmitted to the lens 551 of the image capturing device 550 to form the front edge scanning image. After the front edge scanning is completed, the motor 560 is actuated by the processor 122 of the sensing system 120 to adjust the rotation reflection angle of the rotating reflection element 541, that is, the rotation reflection element 541 is adjusted from the first reflection angle to the second reflection angle. The illuminating light provided by the first illuminating point light source 532a and the second illuminating point light source 532b can illuminate the object 570 The side edge of the side edge generates the side edge object to be measured to reflect the light, and the edge reflection element 542 is used to reflect the side edge of the object to be measured to the lens 551 of the image capturing device 550 to form the side edge scanning image. In Figure 4B, the rotating reflection angle of the rotating reflection element 541 is the second reflection angle to reflect the illumination light provided by the second illuminating point-shaped light source 532b to the back end of the object under test 570, and the back end of the object under test 570 is The illumination light provided by the second illumination point light source 532b can generate the back-end object to be measured reflected light and transmit it to the lens 551 of the image capture device 550 to form a back-end edge scan image. In addition, the operation relationship between the edge inspection device 500 and the judgment unit 160 is the same as that of the edge inspection device 200 and the judgment unit 160 in FIG. 1 and FIG. 2A, and will not be repeated here.

雖然本發明已以實施方式揭露如上,然其並非用以限定本發明,任何熟習此技藝者,在不脫離本發明的精神和範圍內,當可作各種的更動與潤飾,因此本發明的保護範圍當視後附的申請專利範圍所界定者為準。 Although the present invention has been disclosed in the above embodiments, it is not intended to limit the present invention. Anyone who is familiar with the art can make various changes and modifications without departing from the spirit and scope of the present invention. Therefore, the protection of the present invention The scope shall be subject to the scope of the attached patent application.

100‧‧‧邊緣檢查裝置 100‧‧‧Edge inspection device

110‧‧‧移載機構 110‧‧‧Transfer agency

111‧‧‧檢測部 111‧‧‧Testing Department

112‧‧‧第一傳送部 112‧‧‧First Transmission Department

113‧‧‧第二傳送部 113‧‧‧Second Transmission Department

120‧‧‧感應系統 120‧‧‧Induction system

121‧‧‧感應器 121‧‧‧Sensor

122‧‧‧處理器 122‧‧‧Processor

130‧‧‧光源 130‧‧‧Light source

140‧‧‧反射元件 140‧‧‧Reflective element

150‧‧‧影像擷取裝置 150‧‧‧Image capture device

160‧‧‧判斷單元 160‧‧‧Judgment unit

Claims (10)

一種邊緣檢查裝置,包含:一移載機構,包含:一檢測部;一第一傳送部,設置於該檢測部之一側,以傳送一待測物至該檢測部;及一第二傳送部,設置於該檢測部之另一側,以接收並移載該待測物;一影像擷取裝置,設置於該移載機構之一側,以掃描該待測物;一外同軸光源,與該影像擷取裝置同軸地設置,並介於該影像擷取裝置與該檢測部之間,該外同軸光源提供一外同軸光線照射該待測物,以產生複數待測物反射光線;以及複數反射元件,設置於該檢測部,分別用以反射該外同軸光線或該些待測物反射光線。 An edge inspection device includes: a transfer mechanism, including: a detection part; a first transfer part arranged on one side of the detection part to transfer an object to be tested to the detection part; and a second transfer part , Arranged on the other side of the detection part to receive and transfer the object to be measured; an image capture device arranged on one side of the transfer mechanism to scan the object to be measured; an external coaxial light source, and The image capturing device is arranged coaxially and between the image capturing device and the detection part, the external coaxial light source provides an external coaxial light to irradiate the object under test to generate a plurality of reflected light rays of the object under test; and The reflecting element is arranged in the detecting part and is used to reflect the external coaxial light or the reflected light of the objects to be measured respectively. 如申請專利範圍第1項所述之邊緣檢查裝置,更包含:複數補光點狀光源,分別設置於該檢測部之相對二側,各該補光點狀光源提供一點狀光線以照射該待測物。 For example, the edge inspection device described in item 1 of the scope of patent application further includes: a plurality of complementary light point-shaped light sources, respectively disposed on two opposite sides of the detection part, each of the complementary light point-shaped light sources provides a point-shaped light to illuminate the waiting Measured object. 如申請專利範圍第1項所述之邊緣檢查裝置,其中該些反射元件包含:一旋轉反射元件,可旋轉地設置於該檢測部;以及複數邊緣反射元件,分別設置於該旋轉反射元件之相對二側;及該邊緣檢查裝置更包含:一馬達,與該旋轉反射元件電性連接以調整該旋轉反射元件。 As for the edge inspection device described in claim 1, wherein the reflection elements include: a rotating reflection element, which is rotatably disposed on the detecting part; and a plurality of edge reflection elements are respectively disposed opposite to the rotating reflection element Two sides; and the edge inspection device further includes: a motor electrically connected to the rotating reflecting element to adjust the rotating reflecting element. 一種邊緣檢查裝置,包含:一移載機構,包含:一檢測部;一第一傳送部,設置於該檢測部之一側,以傳送一待測物至該檢測部;及一第二傳送部,設置於該檢測部之另一側,以接收並移載該待測物;複數線型光源,分別設置於該移載機構之相對二側,以提供複數線型光線照射該待測物,並產生複數待測物反射光線;複數影像擷取裝置,分別設置於該移載機構之相對二側,以掃描該待測物;以及 複數反射元件組,分別與各該影像擷取裝置連接,用以傳遞該些待測物反射光線至各該影像擷取裝置。 An edge inspection device includes: a transfer mechanism, including: a detection part; a first transfer part arranged on one side of the detection part to transfer an object to be tested to the detection part; and a second transfer part , Arranged on the other side of the detection part to receive and transfer the object to be measured; plural linear light sources are respectively arranged on two opposite sides of the transfer mechanism to provide plural linear light to irradiate the object to be measured and generate A plurality of objects under test reflect light; a plurality of image capturing devices are respectively arranged on two opposite sides of the transfer mechanism to scan the object under test; and The plurality of reflective element groups are respectively connected with each of the image capturing devices, and used for transmitting the light reflected by the objects to be tested to each of the image capturing devices. 如申請專利範圍第4項所述之邊緣檢查裝置,其中各該影像擷取裝置包含:一延伸環,包含一反射側及一半反射側;一第一檢測鏡頭,與該延伸環之該半反射側連接;及一第二檢測鏡頭,與該延伸環之該反射側連接。 According to the edge inspection device described in claim 4, each of the image capturing devices includes: an extension ring including a reflective side and a half-reflection side; a first detection lens and the half-reflection of the extension ring Side connection; and a second detection lens connected to the reflection side of the extension ring. 如申請專利範圍第5項所述之邊緣檢查裝置,其中各該反射元件組包含:一第一反射元件,設置於該延伸環之該半反射側;以及一第二反射元件,設置於該延伸環之該反射側。 According to the edge inspection device described in claim 5, each of the reflective element groups includes: a first reflective element provided on the semi-reflective side of the extension ring; and a second reflective element provided on the extension The reflective side of the ring. 如申請專利範圍第6項所述之邊緣檢查裝置,其中該第一反射元件為半反射元件,該第二反射元件為全反射元件。 In the edge inspection device described in item 6 of the scope of patent application, the first reflective element is a semi-reflective element, and the second reflective element is a total-reflective element. 一種邊緣檢查裝置,包含:一移載機構,包含:一檢測部; 一第一傳送部,設置於該檢測部之一側,以傳送一待測物至該檢測部;及一第二傳送部,設置於該檢測部之另一側,以接收並移載該待測物;一影像擷取裝置,設置於該移載機構之一側,以掃描該待測物;複數照射點狀光源,分別設置於該影像擷取裝置之相對兩側,且各該照射點狀光源提供一照射光線照射該待測物,以產生複數待測物反射光線;以及複數反射元件,設置於該檢測部,分別用以反射該照射光線或該些待測物反射光線。 An edge inspection device, including: a transfer mechanism, including: a detection part; A first conveying part is arranged on one side of the detecting part to convey an object to be tested to the detecting part; and a second conveying part is arranged on the other side of the detecting part to receive and transfer the to-be-tested object. Measured object; an image capture device arranged on one side of the transfer mechanism to scan the object to be measured; a plurality of irradiating point-shaped light sources are respectively arranged on opposite sides of the image capture device, and each of the irradiation points The shaped light source provides an illuminating light to irradiate the object to be measured to generate a plurality of reflected light of the object to be measured; and a plurality of reflective elements are arranged in the detection part to reflect the irradiated light or the reflected light of the objects to be measured, respectively. 如申請專利範圍第8項所述之邊緣檢查裝置,更包含:複數補光點狀光源,分別設置於該檢測部之相對二側,使各該補光點狀光源提供一點狀光線以照射該待測物。 For example, the edge inspection device described in item 8 of the scope of patent application further includes: a plurality of supplementary light point light sources, respectively arranged on two opposite sides of the detection part, so that each supplementary light point light source provides a point light to illuminate the Analyte. 如申請專利範圍第8項所述之邊緣檢查裝置,其中,該些反射元件包含:一旋轉反射元件,可旋轉地設置於該檢測部;及 複數邊緣反射元件,分別設置於該旋轉反射元件之相對二側;及該邊緣檢查裝置更包含:一馬達,與該旋轉反射元件電性連接以調整該旋轉反射元件。 The edge inspection device described in item 8 of the scope of patent application, wherein the reflection elements include: a rotating reflection element, which is rotatably disposed on the detection part; and A plurality of edge reflection elements are respectively arranged on two opposite sides of the rotating reflection element; and the edge inspection device further includes: a motor electrically connected to the rotation reflection element to adjust the rotation reflection element.
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