TWI717467B - Suction table - Google Patents

Suction table Download PDF

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TWI717467B
TWI717467B TW106105331A TW106105331A TWI717467B TW I717467 B TWI717467 B TW I717467B TW 106105331 A TW106105331 A TW 106105331A TW 106105331 A TW106105331 A TW 106105331A TW I717467 B TWI717467 B TW I717467B
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suction
fixture
holding
base
jig
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TW106105331A
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Chinese (zh)
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TW201742186A (en
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石井茂
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日商迪思科股份有限公司
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B28WORKING CEMENT, CLAY, OR STONE
    • B28DWORKING STONE OR STONE-LIKE MATERIALS
    • B28D7/00Accessories specially adapted for use with machines or devices of the preceding groups
    • B28D7/04Accessories specially adapted for use with machines or devices of the preceding groups for supporting or holding work or conveying or discharging work
    • B28D7/046Accessories specially adapted for use with machines or devices of the preceding groups for supporting or holding work or conveying or discharging work the supporting or holding device being of the vacuum type
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/32Holders for supporting the complete device in operation, i.e. detachable fixtures
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B28WORKING CEMENT, CLAY, OR STONE
    • B28DWORKING STONE OR STONE-LIKE MATERIALS
    • B28D5/00Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
    • B28D5/0058Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material
    • B28D5/0082Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material for supporting, holding, feeding, conveying or discharging work
    • B28D5/0094Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material for supporting, holding, feeding, conveying or discharging work the supporting or holding device being of the vacuum type
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/6838Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping with gripping and holding devices using a vacuum; Bernoulli devices
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/687Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
    • H01L21/68714Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
    • H01L21/68778Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by supporting substrates others than wafers, e.g. chips
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/71Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/76Making of isolation regions between components
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/77Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
    • H01L21/78Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Mechanical Engineering (AREA)
  • Dicing (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)

Abstract

本發明的課題,係即使封裝基板變大,也可讓處理保持治具的作業容易進行。 The subject of the present invention is to make it easier to handle the holding jig even if the package substrate becomes larger.

本發明的解決手段,吸盤台(3)係具備以於表面(331a)保持封裝基板(P)之薄板形狀的金屬板(331)形成的保持治具(33),與將保持治具可自由裝卸地保持於上面(34a)的治具基座(34),可於上面吸引保持封裝基板。保持治具,係具備貫通金屬板的表背面所形成,吸引保持各個裝置(D)的複數保持治具吸引孔(333)。治具基座,係具備直徑比保持治具吸引孔小,且形成多數個的複數治具基座吸引口(341)。於該治具基座上面載置保持治具的話,各保持治具吸引孔,係連接於該治具基座吸引口。封裝基板,係透過治具基座吸引口而藉由從保持治具吸引孔作用的吸引力,被保持治具吸引保持。 The solution of the present invention is that the suction table (3) is provided with a holding fixture (33) formed of a thin-plate-shaped metal plate (331) holding the package substrate (P) on the surface (331a), and the holding fixture can be freely The jig base (34) detachably held on the upper surface (34a) can attract and hold the package substrate on the upper surface. The holding jig is formed with a plurality of holding jig suction holes (333) that penetrate the front and back of the metal plate to suck and hold each device (D). The jig base has a smaller diameter than the holding jig suction hole, and a plurality of jig base suction ports (341) are formed. If a holding fixture is placed on the fixture base, each holding fixture suction hole is connected to the fixture base suction port. The package substrate is sucked and held by the holding jig through the suction opening of the jig base by the attractive force acting from the holding jig suction hole.

Description

吸盤台 Suction table

本發明係關於吸引保持封裝基板的吸盤台。 The present invention relates to a suction table for sucking and holding a package substrate.

CSP(Chip Size Package)等的封裝裝置,係藉由利用切削刀切削封裝基板的預定分割線來形成。該切削係利用於外周具有切刃的切削刀,沿著預定分割線切入封裝基板的切削裝置來實施。於切削裝置的保持台上,在切削刀所致之封裝基板的切斷中,設置可個別保持封裝基板的複數裝置的保持治具(例如,參照專利文獻1)。 Packaging devices such as CSP (Chip Size Package) are formed by cutting predetermined dividing lines of the package substrate with a cutter. This cutting system is implemented by a cutting device that cuts into the package substrate along a predetermined dividing line with a cutting blade having a cutting edge on the outer periphery. On the holding table of the cutting device, during cutting of the package substrate by the cutting blade, holding jigs capable of individually holding a plurality of devices of the package substrate are provided (for example, refer to Patent Document 1).

於保持治具的表面,形成收容切削刀之切刃的退刀溝與吸引用的細孔。於保持治具的表面載置封裝基板的話,藉由作用於細孔的吸引力,吸引保持各裝置,藉由切削所分割之各個裝置不會散亂地被保持。 On the surface of the holding jig, a recess for accommodating the cutting edge of the cutter and a fine hole for suction are formed. When the package substrate is placed on the surface of the holding jig, the attractive force acting on the pores attracts and holds each device, and each device divided by cutting is not scattered and held.

然而,封裝基板的尺寸各式各樣,藉由封裝基板所形成之各個裝置的尺寸也依據封裝基板而有各式各樣。因此,在切削裝置中準備依每一封裝基板個別對應的保持治具,每於切削之封裝基板改換時,交換使用保持治具。 However, the size of the package substrate is various, and the size of each device formed by the package substrate also varies according to the package substrate. Therefore, in the cutting device, a holding jig corresponding to each package substrate is prepared, and the holding jig is exchanged every time the package substrate to be cut is changed.

[先前技術文獻] [Prior Technical Literature] [專利文獻] [Patent Literature]

[專利文獻1]日本特開2006-261525號公報 [Patent Document 1] Japanese Patent Application Publication No. 2006-261525

但是,在前述切削裝置中,封裝基板變大(例如1邊為300mm以上)的話,伴隨此狀況,有保持治具也大型化而變成高重量的問題。因此,有處置及維護的作業成為較大負擔,難以以一位作業者進行保持治具的交換作業之問題。 However, in the aforementioned cutting device, if the package substrate becomes larger (for example, one side is 300 mm or more), there is a problem in that the holding jig is also enlarged and heavy. Therefore, the work involving disposal and maintenance becomes a large burden, and it is difficult to exchange the holding jig with one operator.

本發明係有鑑於相關問題所發明者,目的為提供即使封裝基板變大,也可讓處理保持治具的作業容易進行。 The present invention was made in view of the related problems, and its purpose is to provide easy handling of holding fixtures even if the packaging substrate becomes larger.

本發明的吸盤台,係於上面吸引保持藉由預定分割線區劃而形成複數封裝裝置之封裝基板的吸盤台,其特徵為具備:保持治具,係以於表面保持封裝基板之薄板形狀的金屬板形成,構成為可自由裝卸;及治具基座,係於上面保持保持治具;保持治具,係具備:退刀溝,係形成於與金屬板的表面之封裝基板的預定分割線對應的位置;複數保持治具吸引孔,係貫通該金屬板的表背面,形 成於藉由退刀溝所區劃的區域,且吸引保持各個封裝裝置;及樹脂層,係被覆於金屬板的表面;治具基座,係具備:複數治具基座吸引口,係開口於平坦面的上面,直徑比該保持治具吸引孔小且形成多數個;及吸引路徑,係連通治具基座吸引口與吸引源;於治具基座上面載置保持治具的話,各保持治具吸引孔,係連接於複數治具基座吸引口;封裝基板,係藉由從治具基座吸引口連通的吸引力,被保持治具吸引保持。 The chuck table of the present invention is a chuck table which sucks and holds a package substrate of a plurality of package devices formed by dividing by a predetermined dividing line on the upper surface, and is characterized in that it is provided with a holding jig, which is a metal that holds a thin plate of the package substrate on the surface The plate is formed and is configured to be freely detachable; and the jig base is attached to the top to hold and hold the jig; the holding jig is equipped with: an undercut groove formed on the surface of the metal plate corresponding to the predetermined dividing line of the package substrate The position; plural holding fixture suction holes, which penetrate the front and back of the metal plate, shape It is formed in the area divided by the retreat groove, and attracts and maintains each package device; and the resin layer is coated on the surface of the metal plate; the fixture base is equipped with: a plurality of fixture base suction ports, which open at The upper surface of the flat surface has a smaller diameter than the suction hole of the holding jig and forms a large number of them; and the suction path connects the suction port of the jig base and the suction source; if the holding jig is placed on the jig base, each holder The jig suction hole is connected to the suction port of the plurality of jig bases; the package substrate is attracted and held by the holding jig by the attraction connected from the suction port of the jig base.

依據該構造,保持治具被載置於治具基座,藉由該載置,保持治具吸引孔與治具基座吸引口連通,可吸引保持封裝基板。所以,可實現保持治具的薄型化,即使是較大之封裝基板用的保持治具,也可謀求輕量化。藉此,可減輕保持治具的處置及維護的作業負擔,可容易進行交換保持治具的作業。 According to this structure, the holding jig is placed on the jig base, and the holding jig suction hole communicates with the jig base suction port by the placement, and the package substrate can be sucked and held. Therefore, the thickness of the holding jig can be reduced, and the weight of the holding jig for a larger package substrate can be reduced. Thereby, the work load of the handling and maintenance of the holding jig can be reduced, and the work of exchanging the holding jig can be easily performed.

又,於本發明的吸盤台中,保持治具,係藉由固定構件或來自該治具基座吸引口的吸引力,可自由裝卸地保持於該治具基座上為佳。 In addition, in the suction table of the present invention, it is preferable that the holding fixture is freely detachably held on the fixture base by the fixing member or the attraction from the suction opening of the fixture base.

依據本發明,可謀求保持治具的薄型化、輕量化,即使封裝基板較大,也可讓處理保持治具的作業容易進行。 According to the present invention, the thickness and weight of the holding jig can be reduced, and even if the package substrate is large, the work of handling the holding jig can be easily performed.

3‧‧‧吸盤台 3‧‧‧Suction table

33‧‧‧保持治具 33‧‧‧Maintenance fixture

331‧‧‧金屬板 331‧‧‧Metal plate

331a‧‧‧表面(上面) 331a‧‧‧Surface (top)

331b‧‧‧背面 331b‧‧‧Back

332‧‧‧退刀溝 332‧‧‧Knife Retreat

333‧‧‧保持治具吸引孔 333‧‧‧Holding fixture suction hole

334‧‧‧樹脂層 334‧‧‧Resin layer

34‧‧‧治具基座 34‧‧‧Fixture base

34a‧‧‧上面 34a‧‧‧top

341‧‧‧治具基座吸引口 341‧‧‧Fixture base suction port

342‧‧‧吸引源 342‧‧‧Attraction source

343‧‧‧吸引路徑 343‧‧‧Attraction path

D‧‧‧裝置(封裝裝置) D‧‧‧device (packaged device)

L‧‧‧預定分割線 L‧‧‧predetermined dividing line

P‧‧‧封裝基板 P‧‧‧Packaging substrate

[圖1]本實施形態的切削裝置的立體圖。 [Fig. 1] A perspective view of the cutting device of this embodiment.

[圖2]本實施形態的切削裝置的立體圖。 [Fig. 2] A perspective view of the cutting device of this embodiment.

[圖3]圖2的分解立體圖。 [Fig. 3] An exploded perspective view of Fig. 2.

[圖4]圖4A係用以製作保持治具的蝕刻中的說明圖,圖4B係前述蝕刻後的說明圖,圖4C係吸盤台的說明用剖面圖。 [Fig. 4] Fig. 4A is an explanatory view during etching for producing a holding jig, Fig. 4B is an explanatory view after the aforementioned etching, and Fig. 4C is an explanatory cross-sectional view of the suction table.

以下,參照圖面,針對具備本實施形態的吸盤台的切削裝置進行說明。圖1係本實施形態的切削裝置的立體圖。再者,本實施形態的切削裝置,並不被限定於圖1所示構造,在此,例示具備一對切削刀的切削裝置。 Hereinafter, with reference to the drawings, the cutting device provided with the chuck table of the present embodiment will be described. Fig. 1 is a perspective view of the cutting device of this embodiment. In addition, the cutting device of this embodiment is not limited to the structure shown in FIG. 1, and here, the cutting device provided with a pair of cutting blades is illustrated.

如圖1所示,切削裝置1係具備基台2、吸盤台3、切削以吸盤台3保持之封裝基板P的一對切削手段5。 As shown in FIG. 1, the cutting device 1 includes a base 2, a suction table 3, and a pair of cutting means 5 for cutting a package substrate P held by the suction table 3.

在此,針對切削對象的封裝基板P進行說明的話,封裝基板P係形成為略長方形的板狀,藉由排列於表面之複數預定分割線L,區劃成格子狀。於被區劃成格子狀的各區域,形成有裝置(封裝裝置)D,各裝置D係從背面側藉由壓模樹脂封止。封裝基板P係利用沿著預定分割線L切斷,分割成各個晶片狀的裝置D。再者,封裝基板P只要是可分割成複數晶片的構造即可,並不限於CSP。又,作為封裝基板P的裝置D,配設半導體裝置亦 可,配設LED(Light Emitting Diode)裝置亦可。 Here, when describing the package substrate P to be cut, the package substrate P is formed in a substantially rectangular plate shape, and is divided into a grid by a plurality of predetermined dividing lines L arranged on the surface. A device (encapsulation device) D is formed in each area divided into a grid shape, and each device D is sealed by a stamper resin from the back side. The package substrate P is cut along a predetermined dividing line L and divided into individual wafer-like devices D. In addition, the packaging substrate P is not limited to CSP as long as it has a structure that can be divided into a plurality of wafers. Also, as the device D of the package substrate P, a semiconductor device is also provided Yes, it can be equipped with LED (Light Emitting Diode) device.

吸盤台3係具備固定於後述之X軸台42的上面,可繞Z軸周圍旋轉的θ台31,與設置於θ台31的上部之矩形狀的保持治具33及治具基座34,該等保持治具33及治具基座34的具體構造於後敘述。 The chuck table 3 is provided with a θ table 31 fixed on the upper surface of the X-axis table 42 described later and rotatable around the Z axis, and a rectangular holding jig 33 and jig base 34 provided on the upper portion of the θ table 31, The specific structures of the holding fixture 33 and the fixture base 34 will be described later.

吸盤台3係藉由設置於基台2的上面的加工進給手段4,往X軸方向加工進給。加工進給手段4具有配置於基台2的上面之與X軸方向平行的一對導引軌道41,與可滑動於一對導引軌道41地設置之馬達驅動的X軸台42。於X軸台42的上部,設置有吸盤台3。又,於X軸台42的下面側,形成未圖示的螺帽部,於該螺帽部,螺合滾珠螺桿43。然後,於滾珠螺桿43的一端部,連結驅動馬達44。藉由驅動馬達44旋轉驅動滾珠螺桿43,吸盤台3沿著導引軌道41移動於X軸方向。 The suction table 3 is processed and fed in the X-axis direction by the processing and feeding means 4 provided on the upper surface of the base 2. The machining feeding means 4 has a pair of guide rails 41 parallel to the X-axis direction arranged on the upper surface of the base 2, and an X-axis table 42 driven by a motor provided slidably on the pair of guide rails 41. On the upper part of the X-axis table 42, a suction table 3 is provided. In addition, a nut portion (not shown) is formed on the lower surface side of the X-axis base 42, and the ball screw 43 is screwed to the nut portion. Then, the drive motor 44 is connected to one end of the ball screw 43. The ball screw 43 is rotationally driven by the drive motor 44, and the suction table 3 moves in the X-axis direction along the guide rail 41.

又,於基台2的上面,設置有以跨過延伸於X軸方向的開口之方式直立設置之門型的柱部21。於門型的柱部21,設置有使一對切削手段5移動於Y軸方向的指數標定(indexing)手段7,與使一對切削手段5移動於Z軸方向的進刀手段8。指數標定手段7具有配置於支柱21的前面之與Y軸方向平行的一對導引軌道71,與可滑動於一對導引軌道71地設置之馬達驅動的一對Y軸台72。進刀手段8具有配置於各Y軸台72的前面之與Z軸方向平行的一對導引軌道81,與可滑動於一對導引軌道81地設置之馬達驅動的Z軸台82。 In addition, on the upper surface of the base 2, there is provided a gate-shaped column 21 that is erected so as to straddle the opening extending in the X-axis direction. The gate-shaped column portion 21 is provided with an indexing means 7 for moving the pair of cutting means 5 in the Y-axis direction, and a cutting means 8 for moving the pair of cutting means 5 in the Z-axis direction. The index calibration means 7 has a pair of guide rails 71 parallel to the Y-axis direction arranged on the front face of the pillar 21, and a pair of Y-axis tables 72 driven by a motor provided slidably on the pair of guide rails 71. The feeding means 8 has a pair of guide rails 81 parallel to the Z-axis direction arranged on the front of each Y-axis table 72, and a motor-driven Z-axis table 82 that is provided slidably on the pair of guide rails 81.

於各Z軸台82的下部,設置有切削封裝基板P的切削手段5。又,於各Y軸台72的背面側形成未圖示的螺帽部,於該等螺帽部,螺合滾珠螺桿73。又,於各Z軸台82的背面側形成未圖示的螺帽部,於該等螺帽部,螺合滾珠螺桿83。於Y軸台72用的滾珠螺桿73、Z軸台82用的滾珠螺桿83的一端部,分別連結驅動馬達74、84。利用藉由該等驅動馬達74、84旋轉驅動滾珠螺桿73、83,一對切削手段5沿著導引軌道71、81移動於Y軸方向及Z軸方向。 A cutting means 5 for cutting the package substrate P is provided at the lower part of each Z-axis table 82. Moreover, a nut part not shown in the figure is formed on the back side of each Y-axis base 72, and the ball screw 73 is screwed in these nut parts. In addition, a nut part (not shown) is formed on the back side of each Z-axis base 82, and a ball screw 83 is screwed to these nut parts. The ball screw 73 for the Y-axis base 72 and the ball screw 83 for the Z-axis base 82 are connected to one end of the drive motors 74 and 84, respectively. By rotating and driving the ball screws 73 and 83 by the drive motors 74 and 84, the pair of cutting means 5 move along the guide rails 71 and 81 in the Y-axis direction and the Z-axis direction.

一對切削手段5係於從殼體51突出的主軸(未圖示)的前端,可旋轉地安裝切削刀52所構成。切削刀52係例如以樹脂結合固定鑽石研磨粒而成形為圓板狀。 A pair of cutting means 5 are attached to the front end of a main shaft (not shown) protruding from the housing 51, and a cutting blade 52 is rotatably mounted. The cutting blade 52 is formed into a disc shape by fixing diamond abrasive grains by resin bonding, for example.

接下來,針對吸盤台3的具體構造,參照圖2乃至圖4進行說明。圖2係本實施形態的吸盤台的立體圖,圖3係圖2的分解圖。如圖2及圖3所示,在吸盤台3中,保持治具33被載置且保持於治具基座34的上面。 Next, the specific structure of the suction table 3 will be described with reference to FIGS. 2 and 4. Fig. 2 is a perspective view of the suction table of this embodiment, and Fig. 3 is an exploded view of Fig. 2. As shown in FIGS. 2 and 3, in the suction table 3, the holding jig 33 is placed and held on the upper surface of the jig base 34.

保持治具33係以由不鏽鋼等所成之薄板形狀的金屬板331所形成,金屬板331係例如藉由厚度0.5~1mm的SUS板所構成。保持治具33係於金屬板331的表面(上面)331a,形成呈格子狀的複數退刀溝332。退刀溝332係形成於與封裝基板P的預定分割線L(參照圖1)對應的位置,以收容切削加工中的切削刀52(參照圖1)的刀刃之方式設置。所以,在封裝基板P的切削加工時,可不讓 切削刀52損傷到保持治具33。 The holding jig 33 is formed of a thin plate-shaped metal plate 331 made of stainless steel or the like, and the metal plate 331 is formed of, for example, an SUS plate with a thickness of 0.5 to 1 mm. The holding jig 33 is attached to the surface (upper surface) 331a of the metal plate 331 to form a plurality of relief grooves 332 in a lattice shape. The relief groove 332 is formed at a position corresponding to the predetermined dividing line L (refer to FIG. 1) of the package substrate P, and is provided to accommodate the cutting edge of the cutting blade 52 (refer to FIG. 1) during cutting. Therefore, when the package substrate P is cut, it is not necessary to The cutter 52 is damaged to the holding jig 33.

又,在保持治具33中,於與被預定分割線L區劃之複數裝置D(參照圖1)對應的區域,亦即藉由退刀溝332所區劃的區域,開口有吸引保持各個裝置D的複數保持治具吸引孔333。各保持治具吸引孔333係將其直徑尺寸設為例如Φ5mm,從金屬板331的表面331a貫通至背面(下面)331b所形成。 In addition, in the holding jig 33, in the area corresponding to the plurality of devices D (refer to FIG. 1) divided by the predetermined dividing line L, that is, the area divided by the relief groove 332, there is an opening to attract and hold each device D The plural holding fixture suction holes 333. Each holding jig suction hole 333 is formed by having a diameter of Φ5 mm, for example, and penetrating from the surface 331a of the metal plate 331 to the back surface (lower surface) 331b.

在此,針對保持治具的製作方法,參照圖4來說明。圖4A係用以製作保持治具的蝕刻中的說明圖,圖4B係前述蝕刻後的說明圖。圖4C係吸盤台的說明用剖面圖。如圖4A所示,在保持治具33的製作中,準備表面331a及背面331b為平坦的不鏽鋼所成之金屬板331,於各面形成被覆光阻R1、R2。在表面331a的光阻R1中,在退刀溝332及保持治具吸引孔333的形成位置,露出表面331a。在背面331b的光阻R2中,在保持治具吸引孔333的形成位置,露出背面331b。在該狀態下,對於金屬板331的表面331a及背面331b,從噴嘴N噴吹硫酸、硝酸等之蝕刻液E來進行蝕刻。藉此,如圖4B所示,從金屬板331的表面331a到達厚度方向中間部的退刀溝332,與貫通表面331a及背面331b的保持治具吸引孔333形成於所定位置。光阻R1、R2在蝕刻的結束後,藉由藥液等剝離。 Here, the manufacturing method of the holding jig will be described with reference to FIG. 4. FIG. 4A is an explanatory diagram during etching for making a holding jig, and FIG. 4B is an explanatory diagram after the aforementioned etching. Fig. 4C is a cross-sectional view for explaining the suction table. As shown in FIG. 4A, in the production of the holding jig 33, a metal plate 331 made of stainless steel whose surface 331a and back surface 331b are flat is prepared, and coated photoresistors R1 and R2 are formed on each surface. In the photoresist R1 on the surface 331a, the surface 331a is exposed at the positions where the relief groove 332 and the holding fixture suction hole 333 are formed. In the photoresist R2 of the back surface 331b, the back surface 331b is exposed at the position where the holding jig suction hole 333 is formed. In this state, the front surface 331a and the back surface 331b of the metal plate 331 are etched by spraying an etching solution E such as sulfuric acid and nitric acid from the nozzle N. As a result, as shown in FIG. 4B, the relief groove 332 reaching the middle portion in the thickness direction from the surface 331 a of the metal plate 331 and the holding jig suction hole 333 penetrating the surface 331 a and the back surface 331 b are formed at predetermined positions. The photoresists R1 and R2 are peeled off by a chemical solution or the like after the etching is completed.

如圖4C所示,於保持治具33之金屬板331的表面,被覆樹脂層334。作為樹脂層334,例如可使用 胺甲酸乙酯,可藉由胺甲酸乙酯樹脂材的噴吹來被覆。樹脂層334係至少被覆與封裝基板P接觸的部分,防止封裝基板P的保持時發生位置偏離。 As shown in FIG. 4C, the surface of the metal plate 331 holding the jig 33 is covered with a resin layer 334. As the resin layer 334, for example, Urethane can be coated by spraying urethane resin material. The resin layer 334 covers at least the part in contact with the package substrate P, and prevents positional deviation when the package substrate P is held.

回到圖3,治具基座34具備以開口於平坦面的上面34a之方式形成多數個的複數治具基座吸引口341。治具基座吸引口341係將其直徑尺寸設為例如Φ1~Φ2mm,直徑小於保持治具吸引孔333,且形成為數量比保持治具吸引孔333還多。所以,治具基座吸引口341的形成間隔,係形成為比保持治具吸引孔333的形成間隔還小。於治具基座34的上面34a載置保持治具33時,各保持治具吸引孔333連結於複數治具基座吸引口341,或者,於所有保持治具吸引孔333中至少一個治具基座吸引口341連通。再者,在圖3及圖4C中,圖示的便利上,也有存在未連通的治具基座吸引口341及保持治具吸引孔333之狀況,但是,實際上,該等如上所述般連通。 Returning to FIG. 3, the jig base 34 is provided with a plurality of jig base suction ports 341 formed in a plurality of openings on the upper surface 34a of the flat surface. The suction port 341 of the jig base is set to have a diameter size of, for example, Φ1~Φ2 mm, the diameter is smaller than the holding jig suction hole 333, and the number is formed to be larger than the holding jig suction hole 333. Therefore, the formation interval of the suction openings 341 of the jig base is formed to be smaller than the formation interval of the holding jig suction holes 333. When the holding jig 33 is placed on the upper surface 34a of the jig base 34, each holding jig suction hole 333 is connected to a plurality of jig base suction openings 341, or at least one of all holding jig suction holes 333 The base suction port 341 communicates. Furthermore, in FIGS. 3 and 4C, for the convenience of the illustration, there are also cases where the fixture base suction port 341 and the holding fixture suction hole 333 are not connected, but in fact, these are as described above. Connected.

如圖4C所示,於治具基座34的內部,形成連接於吸引源342的吸引路徑343,藉由吸引路徑343,連通治具基座吸引口341與吸引源342。藉此,從治具基座吸引口341連通的吸引力,透過保持治具33的保持治具吸引孔333,作用於封裝基板P的背面,封裝基板P被保持治具33吸引保持。又,多數治具基座吸引口341中,未連通保持治具吸引孔333而以保持治具33封堵的治具基座吸引口341中,來自治具基座吸引口341的吸引力作用於保持治具33的背面。來自該治具基座吸引口 341的吸引力,保持治具33被安裝於治具基座34上。 As shown in FIG. 4C, a suction path 343 connected to the suction source 342 is formed inside the fixture base 34, and the suction path 343 communicates with the suction port 341 of the fixture base and the suction source 342. Thereby, the suction force communicating from the fixture base suction port 341 acts on the back surface of the package substrate P through the retention fixture suction hole 333 of the retention fixture 33, and the package substrate P is attracted and held by the retention fixture 33. In addition, in most of the fixture base suction ports 341, the fixture base suction ports 341 are not connected to the holding jig suction hole 333 and are blocked by the holding jig 33, and the attraction of the fixture base suction port 341 On the back of the holding fixture 33. Suction port from the base of the fixture With the attraction of 341, the holding fixture 33 is installed on the fixture base 34.

在切削封裝基板P時,於吸盤台3的保持治具33上透過未圖示的搬送裝置,載置封裝基板P。此時,封裝基板P的預定分割線L與保持治具33的退刀溝332進行對位。然後,切削刀52(參照圖1)被對位於預定分割線L之後,切削刀52下降至可切削封裝基板P的高度,對於該切削刀52進行切削進刀吸盤台3。此時,切削刀52的周緣部被收容於退刀溝332的內部。 When cutting the package substrate P, the package substrate P is placed on the holding jig 33 of the chuck table 3 through a conveying device not shown. At this time, the predetermined dividing line L of the package substrate P and the relief groove 332 of the holding jig 33 are aligned. Then, after the cutting blade 52 (see FIG. 1) is positioned at the predetermined dividing line L, the cutting blade 52 is lowered to a height capable of cutting the package substrate P, and the cutting blade 52 is cut into the chuck table 3. At this time, the peripheral edge portion of the cutting blade 52 is housed in the recess 332.

利用重複切削進刀,吸盤台3上的封裝基板P沿著各預定分割線L切削,分割成各個裝置D。此時,於保持治具33對應各個裝置D形成有保持治具吸引孔333,故切削中從封裝基板P分離的裝置D被保持治具吸引孔333個別吸引保持,裝置D不會從保持治具33離開。 With repeated cutting and feeding, the package substrate P on the chuck table 3 is cut along each predetermined dividing line L and divided into each device D. At this time, the holding jig 33 is formed with holding jig suction holes 333 corresponding to the respective devices D. Therefore, the device D separated from the package substrate P during cutting is individually sucked and held by the holding jig suction holes 333, and the device D is not removed from the holding jig. Gu 33 left.

在切削之封裝基板P的尺寸、及裝置D的尺寸改變時,於吸盤台3中交換保持治具33。該交換係透過未圖示的閥等,遮斷來自吸引源342的吸引力,在治具基座34上解除從治具基座吸引口341作用於保持治具33的吸引力。藉此,可藉由作業者處置保持治具33,使保持治具33從治具基座34脫離來去除。然後,利用作業者搬運其他準備的保持治具33來載置於治具基座34上,從吸引源342供給吸引力,保持治具33被治具基座34吸引安裝,完成保持治具33的交換。如此,保持治具33係可自由裝卸地被治具基座34保持,可藉由保持治具33的交 換,對應封裝基板P及裝置D的尺寸變更。 When the size of the package substrate P to be cut and the size of the device D are changed, the holding jig 33 is exchanged in the suction table 3. This exchange system blocks the suction force from the suction source 342 through a valve etc. not shown, and releases the suction force acting on the holding jig 33 from the jig base suction port 341 on the jig base 34. Thereby, the holding jig 33 can be detached from the jig base 34 and removed by the operator handling the holding jig 33. Then, the operator carries the other prepared holding jig 33 and places it on the jig base 34, and supplies suction from the suction source 342, and the holding jig 33 is sucked and installed by the jig base 34 to complete the holding jig 33 Exchange. In this way, the holding fixture 33 is detachably held by the fixture base 34, and the holding fixture 33 can be The change corresponds to the size change of the package substrate P and the device D.

依據前述實施形態,於治具基座34形成治具基座吸引口341,讓相關之治具基座吸引口341與保持治具33的保持治具吸引孔333連通,所以,可讓治具基座34的上面34a側具有剛性,可薄化保持治具33的厚度程度。藉此,封裝基板P的1邊成為300mm以上而變較大尺寸,即使對應此狀況,保持治具33的尺寸也變大,也可由一位作業者進行處置。結果,可藉由作業者容易進行保持治具33的交換及維護,可謀求作業負擔的減輕。又,在前述實施形態中,治具基座吸引口341係直徑比保持治具吸引孔333小,且形成比保持治具吸引孔333多數。藉此,變更(同種類、不同種類一起)保持治具33時,不需要讓治具基座吸引口341及保持治具吸引孔333連通的定位,可容易交換保持治具33。 According to the foregoing embodiment, the fixture base suction port 341 is formed on the fixture base 34, so that the related fixture base suction port 341 communicates with the holding fixture suction hole 333 of the holding fixture 33, so that the fixture can be The upper surface 34a of the base 34 has rigidity, and the thickness of the holding jig 33 can be reduced. As a result, one side of the package substrate P becomes 300 mm or more and becomes larger in size. Even in response to this situation, the size of the holding jig 33 becomes larger, and it can be handled by one operator. As a result, the exchange and maintenance of the holding jig 33 can be easily performed by the operator, and the work load can be reduced. In addition, in the foregoing embodiment, the jig base suction opening 341 has a smaller diameter than the holding jig suction hole 333, and is formed more than the holding jig suction hole 333. Thereby, when the holding jig 33 is changed (same type and different types together), the positioning that connects the jig base suction port 341 and the holding jig suction hole 333 is not required, and the holding jig 33 can be easily exchanged.

再者,本發明並不限定於前述實施形態,可進行各種變更來實施。於前述實施形態中,關於添附圖面所圖示之大小及形狀、方向等,並不限定於此,在可發揮本發明的效果的範圍內,可適切變更。此外,只要不脫離本發明的目的範圍,可適當變更來實施。 In addition, the present invention is not limited to the aforementioned embodiment, and can be implemented with various modifications. In the foregoing embodiment, the size, shape, direction, etc. shown on the attached drawing surface are not limited to these, and can be appropriately changed within the range where the effects of the present invention can be exhibited. Moreover, as long as it does not deviate from the objective range of this invention, it can change suitably and implement.

例如,對於治具基座34之保持治具33的固定,係使用螺絲構件等的固定構件,或將治具基座34及保持治具33設為磁性體而藉由磁力固定亦可,只要保持治具33可自由裝卸地被治具基座34保持,可進行各種變更。又,與前述實施形態的吸引及其解除所致之裝卸一併 設置用於該等固定的構造亦可。 For example, for fixing the holding jig 33 of the jig base 34, a fixing member such as a screw member or the like may be used, or the jig base 34 and the holding jig 33 may be made of magnetic bodies and fixed by magnetic force. The holding jig 33 is detachably held by the jig base 34, and various changes can be made. Also, it is combined with the loading and unloading caused by the attraction and release of the foregoing embodiment It is also possible to provide a structure for such fixing.

又,退刀溝332係藉由使切削刀切入來形成,保持治具吸引孔333係藉由鑽孔器或模切等來形成亦可,如上所述,利用設為蝕刻,有利於可容易對應細微的形狀。 In addition, the relief groove 332 is formed by cutting in with a cutter, and the holding jig suction hole 333 may be formed by a drill or die-cutting. As mentioned above, it can be easily etched. Corresponds to subtle shapes.

[產業上之利用可能性] [Possibility of industrial use]

如以上所說明般,本發明係具有即使吸引保持的封裝基板變大,也可容易交換保持治具的效果,尤其,有助於吸引保持各個封裝裝置的吸盤台。 As described above, the present invention has the effect that the holding jig can be easily exchanged even if the packaging substrate to be sucked and held becomes larger, and it is particularly useful for sucking and holding the suction table of each packaging device.

3‧‧‧吸盤台 3‧‧‧Suction table

33‧‧‧保持治具 33‧‧‧Maintenance fixture

34‧‧‧治具基座 34‧‧‧Fixture base

34a‧‧‧上面 34a‧‧‧top

331‧‧‧金屬板 331‧‧‧Metal plate

331a‧‧‧表面(上面) 331a‧‧‧Surface (top)

331b‧‧‧背面 331b‧‧‧Back

332‧‧‧退刀溝 332‧‧‧Knife Retreat

333‧‧‧保持治具吸引孔 333‧‧‧Holding fixture suction hole

341‧‧‧治具基座吸引口 341‧‧‧Fixture base suction port

Claims (2)

一種吸盤台,係於上面吸引保持藉由預定分割線區劃而形成複數封裝裝置之封裝基板的吸盤台,其中,具備:保持治具,係以於表面保持封裝基板之薄板形狀的金屬板形成,構成為可自由裝卸;及治具基座,係於上面保持該保持治具;該保持治具,係具備:退刀溝,係形成於與該金屬板的表面之封裝基板的預定分割線對應的位置;複數保持治具吸引孔,係貫通該金屬板的表背面,形成於藉由該退刀溝所區劃的區域,且吸引保持各個封裝裝置;及樹脂層,係被覆於該金屬板的表面;該治具基座,係具備:複數治具基座吸引口,係開口於平坦面的上面,直徑比該保持治具吸引孔小且形成多數個;及吸引路徑,係連通該治具基座吸引口與吸引源;於該治具基座上面載置該保持治具的話,各保持治具吸引孔,係連接於複數該治具基座吸引口;封裝基板,係藉由從該治具吸引口連通的吸引力,被該保持治具吸引保持;所有複數的該治具基座吸引口,係個別貫通該治具基座的上面與下面; 該樹脂層也被覆複數該保持治具吸引孔。 A chuck table is a chuck table that sucks and holds a package substrate of a plurality of package devices formed by dividing by a predetermined dividing line on the suction table. The chuck table is provided with a holding fixture formed by a metal plate that holds a thin plate shape of the package substrate on the surface, It is configured to be freely attachable and detachable; and a jig base, which holds the holding jig; the holding jig is provided with: an undercut groove formed on the surface of the metal plate corresponding to the predetermined dividing line of the package substrate A plurality of holding fixture suction holes, which penetrate through the front and back of the metal plate, are formed in the area divided by the relief groove, and attract and hold each package device; and the resin layer is coated on the metal plate Surface; the fixture base is provided with: a plurality of fixture base suction ports, which are open on the flat surface, have a diameter smaller than the holding fixture suction hole and form a plurality; and the suction path connects the fixture The base suction port and the suction source; if the holding fixture is placed on the fixture base, each holding fixture suction hole is connected to a plurality of the fixture base suction openings; the packaging substrate is obtained from the The attractive force connected with the suction port of the fixture is attracted and maintained by the holding fixture; all plural suction ports of the fixture base are individually penetrated through the upper and lower sides of the fixture base; The resin layer also covers a plurality of suction holes of the holding fixture. 如申請專利範圍第1項所記載之吸盤台,其中,該保持治具,係藉由固定構件或來自該治具基座吸引口的吸引力,可自由裝卸地保持於該治具基座上。 Such as the suction cup table described in item 1 of the scope of patent application, wherein the holding fixture is detachably held on the fixture base by means of a fixing member or an attraction from the suction port of the fixture base .
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