TWI705969B - A resist stripper composition, method for manufacturing a display device using the same and display device thereby - Google Patents
A resist stripper composition, method for manufacturing a display device using the same and display device thereby Download PDFInfo
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- TWI705969B TWI705969B TW106114964A TW106114964A TWI705969B TW I705969 B TWI705969 B TW I705969B TW 106114964 A TW106114964 A TW 106114964A TW 106114964 A TW106114964 A TW 106114964A TW I705969 B TWI705969 B TW I705969B
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- Prior art keywords
- acid
- methyl
- amide
- ether
- composition according
- Prior art date
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- 239000000203 mixture Substances 0.000 title claims abstract description 41
- 238000000034 method Methods 0.000 title claims abstract description 18
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 13
- 239000000758 substrate Substances 0.000 claims abstract description 33
- 239000007788 liquid Substances 0.000 claims abstract description 22
- 150000001875 compounds Chemical class 0.000 claims abstract description 18
- 125000000217 alkyl group Chemical group 0.000 claims abstract description 13
- 125000004432 carbon atom Chemical group C* 0.000 claims abstract description 13
- 239000003495 polar organic solvent Substances 0.000 claims abstract description 12
- 239000000126 substance Substances 0.000 claims abstract description 11
- 125000003545 alkoxy group Chemical group 0.000 claims abstract description 9
- 125000004435 hydrogen atom Chemical group [H]* 0.000 claims abstract description 9
- 125000002887 hydroxy group Chemical group [H]O* 0.000 claims abstract description 7
- 125000002947 alkylene group Chemical group 0.000 claims abstract description 3
- -1 aminoalkyl silane Chemical compound 0.000 claims description 29
- 238000005260 corrosion Methods 0.000 claims description 25
- 230000007797 corrosion Effects 0.000 claims description 20
- 125000001841 imino group Chemical group [H]N=* 0.000 claims description 14
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 claims description 14
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 10
- 239000003795 chemical substances by application Substances 0.000 claims description 9
- OFOBLEOULBTSOW-UHFFFAOYSA-N Malonic acid Chemical compound OC(=O)CC(O)=O OFOBLEOULBTSOW-UHFFFAOYSA-N 0.000 claims description 8
- 239000012964 benzotriazole Substances 0.000 claims description 8
- VZCYOOQTPOCHFL-UHFFFAOYSA-N trans-butenedioic acid Natural products OC(=O)C=CC(O)=O VZCYOOQTPOCHFL-UHFFFAOYSA-N 0.000 claims description 8
- ATHHXGZTWNVVOU-UHFFFAOYSA-N N-methylformamide Chemical compound CNC=O ATHHXGZTWNVVOU-UHFFFAOYSA-N 0.000 claims description 7
- 238000004140 cleaning Methods 0.000 claims description 7
- 239000002798 polar solvent Substances 0.000 claims description 7
- QTBSBXVTEAMEQO-UHFFFAOYSA-N Acetic acid Chemical compound CC(O)=O QTBSBXVTEAMEQO-UHFFFAOYSA-N 0.000 claims description 6
- QMMFVYPAHWMCMS-UHFFFAOYSA-N Dimethyl sulfide Chemical compound CSC QMMFVYPAHWMCMS-UHFFFAOYSA-N 0.000 claims description 6
- ZMXDDKWLCZADIW-UHFFFAOYSA-N N,N-Dimethylformamide Chemical compound CN(C)C=O ZMXDDKWLCZADIW-UHFFFAOYSA-N 0.000 claims description 6
- MUBZPKHOEPUJKR-UHFFFAOYSA-N Oxalic acid Chemical compound OC(=O)C(O)=O MUBZPKHOEPUJKR-UHFFFAOYSA-N 0.000 claims description 6
- KRKNYBCHXYNGOX-UHFFFAOYSA-N citric acid Chemical compound OC(=O)CC(O)(C(O)=O)CC(O)=O KRKNYBCHXYNGOX-UHFFFAOYSA-N 0.000 claims description 6
- POAOYUHQDCAZBD-UHFFFAOYSA-N 2-butoxyethanol Chemical compound CCCCOCCO POAOYUHQDCAZBD-UHFFFAOYSA-N 0.000 claims description 5
- CMGDVUCDZOBDNL-UHFFFAOYSA-N 4-methyl-2h-benzotriazole Chemical compound CC1=CC=CC2=NNN=C12 CMGDVUCDZOBDNL-UHFFFAOYSA-N 0.000 claims description 5
- NSQYXCMVSMXQRN-UHFFFAOYSA-N 5-methyl-4,5,6,7-tetrahydro-2h-benzotriazole Chemical compound C1C(C)CCC2=NNN=C21 NSQYXCMVSMXQRN-UHFFFAOYSA-N 0.000 claims description 5
- SECXISVLQFMRJM-UHFFFAOYSA-N N-Methylpyrrolidone Chemical group CN1CCCC1=O SECXISVLQFMRJM-UHFFFAOYSA-N 0.000 claims description 5
- 239000002202 Polyethylene glycol Substances 0.000 claims description 5
- 229920001223 polyethylene glycol Polymers 0.000 claims description 5
- 229910000077 silane Inorganic materials 0.000 claims description 5
- WYTZZXDRDKSJID-UHFFFAOYSA-N (3-aminopropyl)triethoxysilane Chemical compound CCO[Si](OCC)(OCC)CCCN WYTZZXDRDKSJID-UHFFFAOYSA-N 0.000 claims description 4
- NXXYKOUNUYWIHA-UHFFFAOYSA-N 2,6-Dimethylphenol Chemical compound CC1=CC=CC(C)=C1O NXXYKOUNUYWIHA-UHFFFAOYSA-N 0.000 claims description 4
- HZAXFHJVJLSVMW-UHFFFAOYSA-N 2-Aminoethan-1-ol Chemical group NCCO HZAXFHJVJLSVMW-UHFFFAOYSA-N 0.000 claims description 4
- YEJRWHAVMIAJKC-UHFFFAOYSA-N 4-Butyrolactone Chemical compound O=C1CCCO1 YEJRWHAVMIAJKC-UHFFFAOYSA-N 0.000 claims description 4
- DLFVBJFMPXGRIB-UHFFFAOYSA-N Acetamide Chemical compound CC(N)=O DLFVBJFMPXGRIB-UHFFFAOYSA-N 0.000 claims description 4
- RGHNJXZEOKUKBD-SQOUGZDYSA-N D-gluconic acid Chemical compound OC[C@@H](O)[C@@H](O)[C@H](O)[C@@H](O)C(O)=O RGHNJXZEOKUKBD-SQOUGZDYSA-N 0.000 claims description 4
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 claims description 4
- ZHNUHDYFZUAESO-UHFFFAOYSA-N Formamide Chemical compound NC=O ZHNUHDYFZUAESO-UHFFFAOYSA-N 0.000 claims description 4
- VZCYOOQTPOCHFL-OWOJBTEDSA-N Fumaric acid Chemical compound OC(=O)\C=C\C(O)=O VZCYOOQTPOCHFL-OWOJBTEDSA-N 0.000 claims description 4
- AEMRFAOFKBGASW-UHFFFAOYSA-N Glycolic acid Chemical compound OCC(O)=O AEMRFAOFKBGASW-UHFFFAOYSA-N 0.000 claims description 4
- WNLRTRBMVRJNCN-UHFFFAOYSA-N adipic acid Chemical compound OC(=O)CCCCC(O)=O WNLRTRBMVRJNCN-UHFFFAOYSA-N 0.000 claims description 4
- QRUDEWIWKLJBPS-UHFFFAOYSA-N benzotriazole Chemical compound C1=CC=C2N[N][N]C2=C1 QRUDEWIWKLJBPS-UHFFFAOYSA-N 0.000 claims description 4
- XBDQKXXYIPTUBI-UHFFFAOYSA-N dimethylselenoniopropionate Natural products CCC(O)=O XBDQKXXYIPTUBI-UHFFFAOYSA-N 0.000 claims description 4
- 239000003112 inhibitor Substances 0.000 claims description 4
- JVTAAEKCZFNVCJ-UHFFFAOYSA-N lactic acid Chemical compound CC(O)C(O)=O JVTAAEKCZFNVCJ-UHFFFAOYSA-N 0.000 claims description 4
- BDAGIHXWWSANSR-UHFFFAOYSA-N methanoic acid Natural products OC=O BDAGIHXWWSANSR-UHFFFAOYSA-N 0.000 claims description 4
- WLJVNTCWHIRURA-UHFFFAOYSA-N pimelic acid Chemical compound OC(=O)CCCCCC(O)=O WLJVNTCWHIRURA-UHFFFAOYSA-N 0.000 claims description 4
- 239000003586 protic polar solvent Substances 0.000 claims description 4
- YGSDEFSMJLZEOE-UHFFFAOYSA-N salicylic acid Chemical compound OC(=O)C1=CC=CC=C1O YGSDEFSMJLZEOE-UHFFFAOYSA-N 0.000 claims description 4
- ARCGXLSVLAOJQL-UHFFFAOYSA-N trimellitic acid Chemical compound OC(=O)C1=CC=C(C(O)=O)C(C(O)=O)=C1 ARCGXLSVLAOJQL-UHFFFAOYSA-N 0.000 claims description 4
- GIAFURWZWWWBQT-UHFFFAOYSA-N 2-(2-aminoethoxy)ethanol Chemical compound NCCOCCO GIAFURWZWWWBQT-UHFFFAOYSA-N 0.000 claims description 3
- XNWFRZJHXBZDAG-UHFFFAOYSA-N 2-METHOXYETHANOL Chemical group COCCO XNWFRZJHXBZDAG-UHFFFAOYSA-N 0.000 claims description 3
- OPKOKAMJFNKNAS-UHFFFAOYSA-N N-methylethanolamine Chemical compound CNCCO OPKOKAMJFNKNAS-UHFFFAOYSA-N 0.000 claims description 3
- JFCQEDHGNNZCLN-UHFFFAOYSA-N anhydrous glutaric acid Natural products OC(=O)CCCC(O)=O JFCQEDHGNNZCLN-UHFFFAOYSA-N 0.000 claims description 3
- XXJWXESWEXIICW-UHFFFAOYSA-N diethylene glycol monoethyl ether Chemical compound CCOCCOCCO XXJWXESWEXIICW-UHFFFAOYSA-N 0.000 claims description 3
- 229940075557 diethylene glycol monoethyl ether Drugs 0.000 claims description 3
- VZCYOOQTPOCHFL-UPHRSURJSA-N maleic acid Chemical compound OC(=O)\C=C/C(O)=O VZCYOOQTPOCHFL-UPHRSURJSA-N 0.000 claims description 3
- CRVGTESFCCXCTH-UHFFFAOYSA-N methyl diethanolamine Chemical compound OCCN(C)CCO CRVGTESFCCXCTH-UHFFFAOYSA-N 0.000 claims description 3
- 150000003628 tricarboxylic acids Chemical class 0.000 claims description 3
- JLGLQAWTXXGVEM-UHFFFAOYSA-N triethylene glycol monomethyl ether Chemical compound COCCOCCOCCO JLGLQAWTXXGVEM-UHFFFAOYSA-N 0.000 claims description 3
- BJEPYKJPYRNKOW-REOHCLBHSA-N (S)-malic acid Chemical compound OC(=O)[C@@H](O)CC(O)=O BJEPYKJPYRNKOW-REOHCLBHSA-N 0.000 claims description 2
- CYSGHNMQYZDMIA-UHFFFAOYSA-N 1,3-Dimethyl-2-imidazolidinon Chemical compound CN1CCN(C)C1=O CYSGHNMQYZDMIA-UHFFFAOYSA-N 0.000 claims description 2
- NFJSYLMJBNUDNG-UHFFFAOYSA-N 1,3-dipropylimidazolidin-2-one Chemical compound CCCN1CCN(CCC)C1=O NFJSYLMJBNUDNG-UHFFFAOYSA-N 0.000 claims description 2
- KQIXMZWXFFHRAQ-UHFFFAOYSA-N 1-(2-hydroxybutylamino)butan-2-ol Chemical compound CCC(O)CNCC(O)CC KQIXMZWXFFHRAQ-UHFFFAOYSA-N 0.000 claims description 2
- ZFPGARUNNKGOBB-UHFFFAOYSA-N 1-Ethyl-2-pyrrolidinone Chemical compound CCN1CCCC1=O ZFPGARUNNKGOBB-UHFFFAOYSA-N 0.000 claims description 2
- HXKKHQJGJAFBHI-UHFFFAOYSA-N 1-aminopropan-2-ol Chemical compound CC(O)CN HXKKHQJGJAFBHI-UHFFFAOYSA-N 0.000 claims description 2
- RTBFRGCFXZNCOE-UHFFFAOYSA-N 1-methylsulfonylpiperidin-4-one Chemical compound CS(=O)(=O)N1CCC(=O)CC1 RTBFRGCFXZNCOE-UHFFFAOYSA-N 0.000 claims description 2
- BPRYUXCVCCNUFE-UHFFFAOYSA-N 2,4,6-trimethylphenol Chemical compound CC1=CC(C)=C(O)C(C)=C1 BPRYUXCVCCNUFE-UHFFFAOYSA-N 0.000 claims description 2
- PFEFOYRSMXVNEL-UHFFFAOYSA-N 2,4,6-tritert-butylphenol Chemical compound CC(C)(C)C1=CC(C(C)(C)C)=C(O)C(C(C)(C)C)=C1 PFEFOYRSMXVNEL-UHFFFAOYSA-N 0.000 claims description 2
- HFVTUNMAGWBDGI-UHFFFAOYSA-N 2,6-diethyl-4-methylphenol Chemical compound CCC1=CC(C)=CC(CC)=C1O HFVTUNMAGWBDGI-UHFFFAOYSA-N 0.000 claims description 2
- METWAQRCMRWDAW-UHFFFAOYSA-N 2,6-diethylphenol Chemical compound CCC1=CC=CC(CC)=C1O METWAQRCMRWDAW-UHFFFAOYSA-N 0.000 claims description 2
- NAILKKRDWBJCNH-UHFFFAOYSA-N 2,6-dipropylphenol Chemical compound CCCC1=CC=CC(CCC)=C1O NAILKKRDWBJCNH-UHFFFAOYSA-N 0.000 claims description 2
- HRWADRITRNUCIY-UHFFFAOYSA-N 2-(2-propan-2-yloxyethoxy)ethanol Chemical compound CC(C)OCCOCCO HRWADRITRNUCIY-UHFFFAOYSA-N 0.000 claims description 2
- CNZUMKVTBZWHCT-UHFFFAOYSA-N 2-(butoxymethylamino)propan-2-ol Chemical compound CCCCOCNC(C)(C)O CNZUMKVTBZWHCT-UHFFFAOYSA-N 0.000 claims description 2
- YINZGXSSYYFXEY-UHFFFAOYSA-N 2-(diethylaminomethoxy)ethanol Chemical compound CCN(CC)COCCO YINZGXSSYYFXEY-UHFFFAOYSA-N 0.000 claims description 2
- MIJDSYMOBYNHOT-UHFFFAOYSA-N 2-(ethylamino)ethanol Chemical compound CCNCCO MIJDSYMOBYNHOT-UHFFFAOYSA-N 0.000 claims description 2
- DGNBSCFDMXMGAC-UHFFFAOYSA-N 2-(methoxymethylamino)propan-2-ol Chemical compound COCNC(C)(C)O DGNBSCFDMXMGAC-UHFFFAOYSA-N 0.000 claims description 2
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- COBPKKZHLDDMTB-UHFFFAOYSA-N 2-[2-(2-butoxyethoxy)ethoxy]ethanol Chemical compound CCCCOCCOCCOCCO COBPKKZHLDDMTB-UHFFFAOYSA-N 0.000 claims description 2
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- FETMDPWILVCFLL-UHFFFAOYSA-N 2-[2-(2-propan-2-yloxyethoxy)ethoxy]ethanol Chemical compound CC(C)OCCOCCOCCO FETMDPWILVCFLL-UHFFFAOYSA-N 0.000 claims description 2
- YENSVULFMBQEHJ-UHFFFAOYSA-N 2-[2-hydroxyethyl(methoxymethyl)amino]ethanol Chemical compound COCN(CCO)CCO YENSVULFMBQEHJ-UHFFFAOYSA-N 0.000 claims description 2
- BKMMTJMQCTUHRP-UHFFFAOYSA-N 2-aminopropan-1-ol Chemical compound CC(N)CO BKMMTJMQCTUHRP-UHFFFAOYSA-N 0.000 claims description 2
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- BHWUCEATHBXPOV-UHFFFAOYSA-N 2-triethoxysilylethanamine Chemical compound CCO[Si](CCN)(OCC)OCC BHWUCEATHBXPOV-UHFFFAOYSA-N 0.000 claims description 2
- YCGHZPCZCOSQKQ-UHFFFAOYSA-N 3-(2-ethylhexoxy)-n,n-dimethylpropanamide Chemical compound CCCCC(CC)COCCC(=O)N(C)C YCGHZPCZCOSQKQ-UHFFFAOYSA-N 0.000 claims description 2
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- LVYXPOCADCXMLP-UHFFFAOYSA-N 3-butoxy-n,n-dimethylpropanamide Chemical compound CCCCOCCC(=O)N(C)C LVYXPOCADCXMLP-UHFFFAOYSA-N 0.000 claims description 2
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- SJECZPVISLOESU-UHFFFAOYSA-N 3-trimethoxysilylpropan-1-amine Chemical compound CO[Si](OC)(OC)CCCN SJECZPVISLOESU-UHFFFAOYSA-N 0.000 claims description 2
- OSWFIVFLDKOXQC-UHFFFAOYSA-N 4-(3-methoxyphenyl)aniline Chemical group COC1=CC=CC(C=2C=CC(N)=CC=2)=C1 OSWFIVFLDKOXQC-UHFFFAOYSA-N 0.000 claims description 2
- BLFRQYKZFKYQLO-UHFFFAOYSA-N 4-aminobutan-1-ol Chemical compound NCCCCO BLFRQYKZFKYQLO-UHFFFAOYSA-N 0.000 claims description 2
- NLZUEZXRPGMBCV-UHFFFAOYSA-N Butylhydroxytoluene Chemical compound CC1=CC(C(C)(C)C)=C(O)C(C(C)(C)C)=C1 NLZUEZXRPGMBCV-UHFFFAOYSA-N 0.000 claims description 2
- HVHTXGMZXGWLFR-UHFFFAOYSA-N CC1CC2=C(NN=N2)CC1C Chemical compound CC1CC2=C(NN=N2)CC1C HVHTXGMZXGWLFR-UHFFFAOYSA-N 0.000 claims description 2
- PMPVIKIVABFJJI-UHFFFAOYSA-N Cyclobutane Chemical compound C1CCC1 PMPVIKIVABFJJI-UHFFFAOYSA-N 0.000 claims description 2
- RGHNJXZEOKUKBD-UHFFFAOYSA-N D-gluconic acid Natural products OCC(O)C(O)C(O)C(O)C(O)=O RGHNJXZEOKUKBD-UHFFFAOYSA-N 0.000 claims description 2
- FEWJPZIEWOKRBE-JCYAYHJZSA-N Dextrotartaric acid Chemical compound OC(=O)[C@H](O)[C@@H](O)C(O)=O FEWJPZIEWOKRBE-JCYAYHJZSA-N 0.000 claims description 2
- LCGLNKUTAGEVQW-UHFFFAOYSA-N Dimethyl ether Chemical compound COC LCGLNKUTAGEVQW-UHFFFAOYSA-N 0.000 claims description 2
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- FXHOOIRPVKKKFG-UHFFFAOYSA-N N,N-Dimethylacetamide Chemical compound CN(C)C(C)=O FXHOOIRPVKKKFG-UHFFFAOYSA-N 0.000 claims description 2
- PVCJKHHOXFKFRP-UHFFFAOYSA-N N-acetylethanolamine Chemical compound CC(=O)NCCO PVCJKHHOXFKFRP-UHFFFAOYSA-N 0.000 claims description 2
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- 229910052799 carbon Inorganic materials 0.000 claims description 2
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- WDGIOFVKXHIBHX-UHFFFAOYSA-N 4,6-dimethyl-4,5,6,7-tetrahydro-2H-benzotriazole Chemical compound CC1CC(CC=2NN=NC21)C WDGIOFVKXHIBHX-UHFFFAOYSA-N 0.000 claims 1
- ORGIXTZQPMWKGZ-UHFFFAOYSA-N 4-methyl-2,6-dipropylphenol Chemical compound CCCC1=CC(C)=CC(CCC)=C1O ORGIXTZQPMWKGZ-UHFFFAOYSA-N 0.000 claims 1
- LYQBBEFEQFFWLR-UHFFFAOYSA-N CC1CCCC=2NN=NC=21 Chemical compound CC1CCCC=2NN=NC=21 LYQBBEFEQFFWLR-UHFFFAOYSA-N 0.000 claims 1
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims 1
- JUJWROOIHBZHMG-UHFFFAOYSA-N Pyridine Chemical compound C1=CC=NC=C1 JUJWROOIHBZHMG-UHFFFAOYSA-N 0.000 claims 1
- 239000002253 acid Substances 0.000 claims 1
- 150000001408 amides Chemical class 0.000 claims 1
- 125000004429 atom Chemical group 0.000 claims 1
- SXQFCVDSOLSHOQ-UHFFFAOYSA-N lactamide Chemical compound CC(O)C(N)=O SXQFCVDSOLSHOQ-UHFFFAOYSA-N 0.000 claims 1
- WGYKZJWCGVVSQN-UHFFFAOYSA-N propylamine Chemical group CCCN WGYKZJWCGVVSQN-UHFFFAOYSA-N 0.000 claims 1
- JDVPQXZIJDEHAN-UHFFFAOYSA-N succinamic acid Chemical compound NC(=O)CCC(O)=O JDVPQXZIJDEHAN-UHFFFAOYSA-N 0.000 claims 1
- STCOOQWBFONSKY-UHFFFAOYSA-N tributyl phosphate Chemical compound CCCCOP(=O)(OCCCC)OCCCC STCOOQWBFONSKY-UHFFFAOYSA-N 0.000 claims 1
- 229910052751 metal Inorganic materials 0.000 description 17
- 239000002184 metal Substances 0.000 description 17
- 229910021641 deionized water Inorganic materials 0.000 description 11
- 239000010408 film Substances 0.000 description 11
- 229910052750 molybdenum Inorganic materials 0.000 description 10
- 230000000694 effects Effects 0.000 description 9
- 229910052802 copper Inorganic materials 0.000 description 8
- 239000010949 copper Substances 0.000 description 8
- WGTYBPLFGIVFAS-UHFFFAOYSA-M tetramethylammonium hydroxide Chemical compound [OH-].C[N+](C)(C)C WGTYBPLFGIVFAS-UHFFFAOYSA-M 0.000 description 8
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 7
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 7
- 229910052782 aluminium Inorganic materials 0.000 description 7
- 239000008367 deionised water Substances 0.000 description 7
- 239000011733 molybdenum Substances 0.000 description 7
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 6
- VHUUQVKOLVNVRT-UHFFFAOYSA-N Ammonium hydroxide Chemical compound [NH4+].[OH-] VHUUQVKOLVNVRT-UHFFFAOYSA-N 0.000 description 5
- 239000000908 ammonium hydroxide Substances 0.000 description 5
- 239000010936 titanium Substances 0.000 description 4
- 229910052719 titanium Inorganic materials 0.000 description 4
- RTZKZFJDLAIYFH-UHFFFAOYSA-N Diethyl ether Chemical compound CCOCC RTZKZFJDLAIYFH-UHFFFAOYSA-N 0.000 description 3
- IAZDPXIOMUYVGZ-UHFFFAOYSA-N Dimethylsulphoxide Chemical compound CS(C)=O IAZDPXIOMUYVGZ-UHFFFAOYSA-N 0.000 description 3
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 3
- 125000004103 aminoalkyl group Chemical group 0.000 description 3
- 230000000052 comparative effect Effects 0.000 description 3
- 238000011156 evaluation Methods 0.000 description 3
- 150000002739 metals Chemical class 0.000 description 3
- 229920002120 photoresistant polymer Polymers 0.000 description 3
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 3
- 239000010937 tungsten Substances 0.000 description 3
- 229910052721 tungsten Inorganic materials 0.000 description 3
- JTXUAHIMULPXKY-UHFFFAOYSA-N 3-trihydroxysilylpropan-1-amine Chemical compound NCCC[Si](O)(O)O JTXUAHIMULPXKY-UHFFFAOYSA-N 0.000 description 2
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- 229910001182 Mo alloy Inorganic materials 0.000 description 2
- 238000005536 corrosion prevention Methods 0.000 description 2
- 229940028356 diethylene glycol monobutyl ether Drugs 0.000 description 2
- 238000001312 dry etching Methods 0.000 description 2
- 238000001035 drying Methods 0.000 description 2
- 150000002148 esters Chemical class 0.000 description 2
- 125000004356 hydroxy functional group Chemical group O* 0.000 description 2
- KERBAAIBDHEFDD-UHFFFAOYSA-N n-ethylformamide Chemical compound CCNC=O KERBAAIBDHEFDD-UHFFFAOYSA-N 0.000 description 2
- JCGNDDUYTRNOFT-UHFFFAOYSA-N oxolane-2,4-dione Chemical compound O=C1COC(=O)C1 JCGNDDUYTRNOFT-UHFFFAOYSA-N 0.000 description 2
- 229920000642 polymer Polymers 0.000 description 2
- 239000007921 spray Substances 0.000 description 2
- 238000001039 wet etching Methods 0.000 description 2
- XVOUMQNXTGKGMA-OWOJBTEDSA-N (E)-glutaconic acid Chemical compound OC(=O)C\C=C\C(O)=O XVOUMQNXTGKGMA-OWOJBTEDSA-N 0.000 description 1
- LZDKZFUFMNSQCJ-UHFFFAOYSA-N 1,2-diethoxyethane Chemical compound CCOCCOCC LZDKZFUFMNSQCJ-UHFFFAOYSA-N 0.000 description 1
- PVXVWWANJIWJOO-UHFFFAOYSA-N 1-(1,3-benzodioxol-5-yl)-N-ethylpropan-2-amine Chemical compound CCNC(C)CC1=CC=C2OCOC2=C1 PVXVWWANJIWJOO-UHFFFAOYSA-N 0.000 description 1
- DKCPKDPYUFEZCP-UHFFFAOYSA-N 2,6-di-tert-butylphenol Chemical compound CC(C)(C)C1=CC=CC(C(C)(C)C)=C1O DKCPKDPYUFEZCP-UHFFFAOYSA-N 0.000 description 1
- UTBVIMLZIRIFFR-UHFFFAOYSA-N 2-methylthio-1,3-benzothiazole Chemical compound C1=CC=C2SC(SC)=NC2=C1 UTBVIMLZIRIFFR-UHFFFAOYSA-N 0.000 description 1
- WFCSWCVEJLETKA-UHFFFAOYSA-N 2-piperazin-1-ylethanol Chemical compound OCCN1CCNCC1 WFCSWCVEJLETKA-UHFFFAOYSA-N 0.000 description 1
- LWEOFVINMVZGAS-UHFFFAOYSA-N 3-piperazin-1-ylpropan-1-ol Chemical compound OCCCN1CCNCC1 LWEOFVINMVZGAS-UHFFFAOYSA-N 0.000 description 1
- NNPMYBBCIDUAJD-UHFFFAOYSA-N 4-methyl-2-propylphenol Chemical compound CCCC1=CC(C)=CC=C1O NNPMYBBCIDUAJD-UHFFFAOYSA-N 0.000 description 1
- KRKNYBCHXYNGOX-UHFFFAOYSA-K Citrate Chemical compound [O-]C(=O)CC(O)(CC([O-])=O)C([O-])=O KRKNYBCHXYNGOX-UHFFFAOYSA-K 0.000 description 1
- QMMZSJPSPRTHGB-UHFFFAOYSA-N MDEA Natural products CC(C)CCCCC=CCC=CC(O)=O QMMZSJPSPRTHGB-UHFFFAOYSA-N 0.000 description 1
- OFOBLEOULBTSOW-UHFFFAOYSA-L Malonate Chemical compound [O-]C(=O)CC([O-])=O OFOBLEOULBTSOW-UHFFFAOYSA-L 0.000 description 1
- 229910016027 MoTi Inorganic materials 0.000 description 1
- 229910016048 MoW Inorganic materials 0.000 description 1
- SUAKHGWARZSWIH-UHFFFAOYSA-N N,N‐diethylformamide Chemical compound CCN(CC)C=O SUAKHGWARZSWIH-UHFFFAOYSA-N 0.000 description 1
- YIKSCQDJHCMVMK-UHFFFAOYSA-N Oxamide Chemical compound NC(=O)C(N)=O YIKSCQDJHCMVMK-UHFFFAOYSA-N 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 229920006125 amorphous polymer Polymers 0.000 description 1
- 238000004380 ashing Methods 0.000 description 1
- 150000003851 azoles Chemical class 0.000 description 1
- 238000009835 boiling Methods 0.000 description 1
- 150000004649 carbonic acid derivatives Chemical class 0.000 description 1
- 150000001991 dicarboxylic acids Chemical class 0.000 description 1
- CAEMOCUMMOVWCN-UHFFFAOYSA-N diphosphono hydrogen phosphate phosphoric acid Chemical class OP(O)(O)=O.OP(O)(=O)OP(O)(=O)OP(O)(O)=O CAEMOCUMMOVWCN-UHFFFAOYSA-N 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- STVYXAGSSXIADA-UHFFFAOYSA-N ethanol imidazolidine Chemical compound CCO.C1CNCN1 STVYXAGSSXIADA-UHFFFAOYSA-N 0.000 description 1
- LYCAIKOWRPUZTN-UHFFFAOYSA-N ethylene glycol Natural products OCCO LYCAIKOWRPUZTN-UHFFFAOYSA-N 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- WGCNASOHLSPBMP-UHFFFAOYSA-N hydroxyacetaldehyde Natural products OCC=O WGCNASOHLSPBMP-UHFFFAOYSA-N 0.000 description 1
- 150000008624 imidazolidinones Chemical class 0.000 description 1
- 239000007943 implant Substances 0.000 description 1
- 230000002401 inhibitory effect Effects 0.000 description 1
- 230000005764 inhibitory process Effects 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 229910001338 liquidmetal Inorganic materials 0.000 description 1
- JTIAYWZZZOZUTK-UHFFFAOYSA-N m-tert-butyltoluene Natural products CC1=CC=CC(C(C)(C)C)=C1 JTIAYWZZZOZUTK-UHFFFAOYSA-N 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 150000002763 monocarboxylic acids Chemical class 0.000 description 1
- MBHINSULENHCMF-UHFFFAOYSA-N n,n-dimethylpropanamide Chemical compound CCC(=O)N(C)C MBHINSULENHCMF-UHFFFAOYSA-N 0.000 description 1
- 229910052758 niobium Inorganic materials 0.000 description 1
- 239000010955 niobium Substances 0.000 description 1
- GUCVJGMIXFAOAE-UHFFFAOYSA-N niobium atom Chemical compound [Nb] GUCVJGMIXFAOAE-UHFFFAOYSA-N 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 150000007524 organic acids Chemical class 0.000 description 1
- 239000003960 organic solvent Substances 0.000 description 1
- 150000002989 phenols Chemical class 0.000 description 1
- 229920001451 polypropylene glycol Polymers 0.000 description 1
- 150000004040 pyrrolidinones Chemical class 0.000 description 1
- DCKVNWZUADLDEH-UHFFFAOYSA-N sec-butyl acetate Chemical compound CCC(C)OC(C)=O DCKVNWZUADLDEH-UHFFFAOYSA-N 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- 150000003568 thioethers Chemical class 0.000 description 1
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
- G03F7/42—Stripping or agents therefor
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K15/00—Anti-oxidant compositions; Compositions inhibiting chemical change
- C09K15/04—Anti-oxidant compositions; Compositions inhibiting chemical change containing organic compounds
- C09K15/06—Anti-oxidant compositions; Compositions inhibiting chemical change containing organic compounds containing oxygen
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K15/00—Anti-oxidant compositions; Compositions inhibiting chemical change
- C09K15/04—Anti-oxidant compositions; Compositions inhibiting chemical change containing organic compounds
- C09K15/06—Anti-oxidant compositions; Compositions inhibiting chemical change containing organic compounds containing oxygen
- C09K15/08—Anti-oxidant compositions; Compositions inhibiting chemical change containing organic compounds containing oxygen containing a phenol or quinone moiety
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K15/00—Anti-oxidant compositions; Compositions inhibiting chemical change
- C09K15/04—Anti-oxidant compositions; Compositions inhibiting chemical change containing organic compounds
- C09K15/20—Anti-oxidant compositions; Compositions inhibiting chemical change containing organic compounds containing nitrogen and oxygen
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D7/00—Compositions of detergents based essentially on non-surface-active compounds
- C11D7/22—Organic compounds
- C11D7/32—Organic compounds containing nitrogen
- C11D7/3218—Alkanolamines or alkanolimines
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D7/00—Compositions of detergents based essentially on non-surface-active compounds
- C11D7/50—Solvents
- C11D7/5004—Organic solvents
- C11D7/5022—Organic solvents containing oxygen
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/60—Substrates
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/68—Preparation processes not covered by groups G03F1/20 - G03F1/50
- G03F1/82—Auxiliary processes, e.g. cleaning or inspecting
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D2111/00—Cleaning compositions characterised by the objects to be cleaned; Cleaning compositions characterised by non-standard cleaning or washing processes
- C11D2111/10—Objects to be cleaned
- C11D2111/14—Hard surfaces
- C11D2111/22—Electronic devices, e.g. PCBs or semiconductors
Landscapes
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Materials Engineering (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Oil, Petroleum & Natural Gas (AREA)
- Wood Science & Technology (AREA)
- Health & Medical Sciences (AREA)
- Emergency Medicine (AREA)
- Photosensitive Polymer And Photoresist Processing (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Cleaning Or Drying Semiconductors (AREA)
Abstract
本發明提供抗蝕劑剝離液組合物、顯示器基板及其製造方法,所述抗蝕劑剝離液組合物的特徵在於,包含(a)具有下述化學式1的結構的胺基烷基矽烷系化合物、(b)烷醇胺、和(c)極性有機溶劑。下述化學式1中,R1 、R2 和R3 各自獨立地為碳原子數1~4的烷基,R4 為碳原子數1~5的伸烷基,及R5 和R6 各自獨立地為氫原子、碳原子數1~5的烷基、羥基或碳原子數1~4的烷氧基,在R5 為羥基或烷氧基的情況下,R6 為氫原子或烷基,在R6 為羥基或烷氧基的情況下,R5 為氫原子或烷基。 [化學式1] The present invention provides a resist stripping liquid composition, a display substrate and a method for manufacturing the same, the resist stripping liquid composition being characterized by comprising (a) an aminoalkylsilane-based compound having a structure of the following chemical formula 1 , (B) Alkanolamine, and (c) Polar organic solvent. In the following chemical formula 1, R 1 , R 2 and R 3 are each independently an alkyl group having 1 to 4 carbon atoms, R 4 is an alkylene group having 1 to 5 carbon atoms, and R 5 and R 6 are each independently The ground is a hydrogen atom, an alkyl group having 1 to 5 carbon atoms, a hydroxyl group or an alkoxy group having 1 to 4 carbon atoms, and when R 5 is a hydroxyl group or an alkoxy group, R 6 is a hydrogen atom or an alkyl group, When R 6 is a hydroxyl group or an alkoxy group, R 5 is a hydrogen atom or an alkyl group. [Chemical formula 1]
Description
發明領域 Invention field
本發明涉及應用防電偶及縫隙腐蝕能力優異的胺基烷基矽烷系化合物的抗蝕劑剝離液組合物,使用其製造的顯示器基板的製造方法及由其製造的顯示器基板。 The present invention relates to a resist stripper composition using an aminoalkylsilane-based compound having excellent galvanic resistance and crevice corrosion resistance, a method for manufacturing a display substrate manufactured using the same, and a display substrate manufactured therefrom.
發明背景 Background of the invention
近年來,隨著顯示器基板的高解析度呈現要求增加,持續進行著使每單位面積的像素數增加的努力。根據這樣的趨勢,要求配線寬度的減小。為了應對於此,導入乾式蝕刻工序等工序條件也變得越來越苛刻。此外,由於平板顯示裝置的大型化,也要求配線中的信號速度加快,因此電阻率比鋁低的銅被用作配線材料。受此影響,對於作為抗蝕劑去除工序的剝離工序中所使用的剝離液的需求性能也變高。具體而言,對於針對金屬配線的腐蝕抑制力等,要求相當高水準的剝離特性。特別是,除了鋁以外,也要求對於銅的腐蝕抑制能力,為了確保價格競爭力,也要求基板的處理張數增加之類的經濟性。應對如上所述的業界的需求,公開了新技術。In recent years, as the demand for high-resolution presentation of display substrates has increased, efforts have continued to increase the number of pixels per unit area. According to such trends, a reduction in wiring width is required. To cope with this, process conditions such as the introduction of a dry etching process have also become more and more severe. In addition, due to the increase in the size of the flat panel display device, the signal speed in the wiring is also required to be accelerated. Therefore, copper, which has a lower resistivity than aluminum, is used as the wiring material. Affected by this, the required performance for the stripping liquid used in the stripping step as the resist removal step also increases. Specifically, a relatively high level of peeling characteristics is required for corrosion inhibiting power against metal wiring. In particular, in addition to aluminum, corrosion inhibition capability against copper is also required. In order to ensure price competitiveness, economic efficiency such as an increase in the number of processed substrates is also required. In response to the needs of the industry as described above, new technologies have been disclosed.
比如,韓國註冊專利10-1557778中公開了包含烷醇胺、有機溶劑等的抗蝕劑剝離液組合物,但沒有改善針對包含鉬等金屬的下部金屬膜或金屬配線等的防腐蝕力。 現有技術文獻 專利文獻For example, Korean Registered Patent No. 10-1557778 discloses a resist stripper composition containing an alkanolamine, an organic solvent, etc., but it does not improve the corrosion resistance against the lower metal film or metal wiring containing metals such as molybdenum. Prior art literature Patent literature
專利文獻1:韓國註冊專利第10-1557778號Patent Document 1: Korean Registered Patent No. 10-1557778
發明概要 所要解決的課題 本發明是用於解決如上問題的發明,其目的在於,提供對於包含鉬的下部金屬膜或金屬配線的防腐蝕力優異,且表現出高剝離力的抗蝕劑剝離液組合物,使用其製造的顯示器基板的製造方法及由其製造的顯示器基板。 解決課題的方法SUMMARY OF THE INVENTION PROBLEMS TO BE SOLVED The present invention is an invention for solving the above-mentioned problems, and its object is to provide a resist stripping solution that has excellent corrosion resistance against a lower metal film or metal wiring containing molybdenum and exhibits a high peeling force The composition uses a method for manufacturing a display substrate manufactured therefrom, and a display substrate manufactured therefrom. The way to solve the problem
為了達成上述目的,本發明提供一種抗蝕劑剝離液組合物,其特徵在於,包含:(a)具有下述化學式1的結構的胺基烷基矽烷系化合物、(b)烷醇胺、和(c)極性有機溶劑,但不包含氫氧化銨。In order to achieve the above-mentioned object, the present invention provides a resist stripping liquid composition characterized by comprising: (a) an aminoalkylsilane-based compound having a structure of the following chemical formula 1, (b) an alkanolamine, and (c) Polar organic solvent, but does not contain ammonium hydroxide.
本發明提供一種顯示器基板的製造方法,其包括使用上述抗蝕劑剝離液組合物來清洗顯示器基板的工序。The present invention provides a method of manufacturing a display substrate, which includes a step of cleaning the display substrate using the above-mentioned resist stripping liquid composition.
此外,本發明提供由上述製造方法製造的顯示器基板。 發明效果In addition, the present invention provides a display substrate manufactured by the above manufacturing method. Invention effect
本發明的抗蝕劑剝離液組合物使用在去離子水及極性溶劑中溶解力優異的胺基烷基矽烷系化合物,因而不會使包含鋁、銅、鎢、鉬、鈦和鈮的下部金屬膜或金屬配線發生腐蝕,且具有表現高剝離力的效果。The resist stripping liquid composition of the present invention uses an amino alkyl silane-based compound having excellent solubility in deionized water and polar solvents, and therefore does not cause lower metals containing aluminum, copper, tungsten, molybdenum, titanium, and niobium The film or metal wiring corrodes and has the effect of expressing high peeling force.
具體實施方式 本發明涉及抗蝕劑剝離液組合物、使用其製造的顯示器基板的製造方法及由該方法製造的顯示器基板。BEST MODE FOR CARRYING OUT THE INVENTION The present invention relates to a resist stripper composition, a method for manufacturing a display substrate manufactured using the composition, and a display substrate manufactured by the method.
本發明的抗蝕劑剝離液組合物的特徵在於,包含(a)胺基烷基矽烷系化合物、(b)烷醇胺和(c)極性有機溶劑,且不包含氫氧化銨,特別是由於使用在去離子水及極性溶劑中溶解力優異的胺基烷基矽烷系化合物,因而不會使鋁、銅、鎢、鉬、鈦及包含它們的下部金屬膜或金屬配線發生腐蝕,具有表現高剝離力的效果。本發明的抗蝕劑剝離液組合物可以進一步包含(d)防腐蝕劑。The resist stripping liquid composition of the present invention is characterized in that it contains (a) an aminoalkyl silane-based compound, (b) an alkanolamine, and (c) a polar organic solvent, and does not contain ammonium hydroxide, especially because The use of amino alkyl silane compounds with excellent solubility in deionized water and polar solvents will not corrode aluminum, copper, tungsten, molybdenum, titanium and the underlying metal film or metal wiring containing them, and has high performance The effect of peeling force. The resist stripper composition of the present invention may further contain (d) an anticorrosive agent.
以下,按構成詳細說明本發明的內容。 (a) 胺基烷基矽烷系化合物Hereinafter, the content of the present invention will be explained in detail according to the structure. (a) Amino alkyl silane compounds
本發明中使用的(a)胺基烷基矽烷系化合物具有下述化學式1的結構。 [化學式1]
上述化學式1中,R1、R2和R3各自獨立地為碳原子數1~4的烷基,R4為碳原子數1~5的伸烷基,R5和R6各自獨立地為氫原子、碳原子數1~5的烷基、羥基或碳原子數1~4的烷氧基,在R5為羥基或烷氧基的情況下,R6為氫原子或烷基,在R6為羥基或烷氧基的情況下,R5為氫原子或烷基。 In the above chemical formula 1, R1, R2 and R3 are each independently an alkyl group having 1 to 4 carbon atoms, R4 is an alkylene group having 1 to 5 carbon atoms, and R5 and R6 are each independently a hydrogen atom and a carbon atom number. An alkyl group of 1 to 5, a hydroxyl group or an alkoxy group of 1 to 4 carbon atoms. When R5 is a hydroxy or alkoxy group, R6 is a hydrogen atom or an alkyl group, and when R6 is a hydroxy or alkoxy group Below, R5 is a hydrogen atom or an alkyl group.
上述碳原子數1~4的烷基在具有3個以上碳原子的情況下,可以為直鏈或支鏈狀。 The alkyl group having 1 to 4 carbon atoms may be linear or branched when it has 3 or more carbon atoms.
作為化學式1所表示的(a)胺基烷基矽烷系化合物的種類,優選可以舉出(2-胺基乙基)三乙氧基矽烷、(3-胺基丙基)三甲氧基矽烷、(3-胺基丙基)三乙氧基矽烷等,它們可以單獨或將兩種以上混合使用。 As the type of (a) aminoalkylsilane-based compound represented by Chemical Formula 1, preferably (2-aminoethyl)triethoxysilane, (3-aminopropyl)trimethoxysilane, (3-Aminopropyl)triethoxysilane, etc., can be used alone or in combination of two or more.
此外,本發明中,上述(a)胺基烷基矽烷系化合物中可以進一步添加(3-胺基丙基)矽烷三醇等化合物而使用。 Furthermore, in the present invention, a compound such as (3-aminopropyl)silanetriol may be further added to the above-mentioned (a) aminoalkylsilane-based compound for use.
本發明的(a)胺基烷基矽烷系化合物防止抗蝕劑剝離中可能發生的金屬的腐蝕的能力優異,尤其通過 實驗確認到在包含鋁、鉬、以及銅和鉬的合金中所發生的電偶腐蝕及縫隙腐蝕的防腐蝕力優異。 The (a) aminoalkylsilane-based compound of the present invention is excellent in preventing the corrosion of metals that may occur during resist stripping, especially by Experiments confirmed that galvanic corrosion and crevice corrosion that occur in alloys containing aluminum, molybdenum, and copper and molybdenum have excellent corrosion resistance.
相對於組合物總重量,上述化學式1所表示的(a)胺基烷基矽烷系化合物的含量優選為0.001重量%~3.0重量%,更優選為0.005重量%~1.0重量%。如果低於0.001重量%,則在剝離或利用去離子水的沖洗工序中金屬配線可能發生腐蝕,在超過3.0重量%的情況下,無法獲得防腐蝕劑含量增加所帶來的腐蝕防止效果的提高,因而在經濟方面不佳。 Relative to the total weight of the composition, the content of the (a) aminoalkylsilane-based compound represented by the above chemical formula 1 is preferably 0.001% by weight to 3.0% by weight, more preferably 0.005% by weight to 1.0% by weight. If it is less than 0.001% by weight, metal wiring may be corroded during the peeling or rinsing process with deionized water, and if it exceeds 3.0% by weight, the increase in the corrosion prevention effect due to the increase in the corrosion inhibitor content cannot be obtained. Therefore, the economy is not good.
(b)烷醇胺 (b) Alkanolamine
本發明的烷醇胺發揮如下作用:在乾式或濕式蝕刻、灰化(ashing)或離子注入工序(ion implant processing)等各種工序條件下,有效地滲透至被改性或被交聯的抗蝕劑(resist)的高分子基體中,破壞存在於分子內或分子間的結合。此外,在殘留於基板上的抗蝕劑內的結構上脆弱的部分形成空隙,使抗蝕劑改性為無定形的高分子凝膠(gel)塊狀態,從而能夠使附著於基板上部的抗蝕劑被容易地去除。 The alkanolamine of the present invention plays the following role: Under various process conditions such as dry or wet etching, ashing or ion implant processing, it effectively penetrates the modified or crosslinked resistance In the polymer matrix of the resist, it breaks the bonds existing in or between molecules. In addition, voids are formed in the structurally fragile parts of the resist remaining on the substrate, and the resist is modified into an amorphous polymer gel (gel) mass state, so that the resist attached to the upper part of the substrate can be modified. The etching agent is easily removed.
上述烷醇胺可以舉出單乙醇胺、二乙醇胺、三乙醇胺、單丙醇胺、2-胺基乙醇、2-(乙基胺基)乙醇、2-(甲基胺基)乙醇、N-甲基二乙醇胺、N,N-二甲基乙醇胺、N,N-二乙基胺基乙醇、2-(2-胺基乙基胺基)-1-乙醇、1-胺基-2-丙醇、2-胺基-1-丙醇、3-胺基-1-丙醇、4-胺基-1-丁醇、二丁醇胺、(甲氧基甲基)二乙醇胺、(羥基乙基氧基甲基)二乙基胺、甲基(甲氧基甲基)胺基乙醇、甲基(丁氧基甲基)胺基乙醇、2-(2-胺基乙氧基)乙醇、1-(2-羥基乙基)哌嗪、1-(2-羥基乙基)甲基哌嗪、N-(2-羥基乙基)嗎啉、N-(3-羥基丙基)嗎啉等,它們可以單獨或將兩種以上混合使用。但是,本發明可以不包含氫氧化銨。在包含氫氧化銨的情況下,可能會對Mo或Mo合金膜質產生侵蝕(Attack),尤其優選不包含四甲基氫氧化銨。The alkanolamines can include monoethanolamine, diethanolamine, triethanolamine, monopropanolamine, 2-aminoethanol, 2-(ethylamino)ethanol, 2-(methylamino)ethanol, N-methyl Diethanolamine, N,N-dimethylethanolamine, N,N-diethylaminoethanol, 2-(2-aminoethylamino)-1-ethanol, 1-amino-2-propanol , 2-amino-1-propanol, 3-amino-1-propanol, 4-amino-1-butanol, dibutanolamine, (methoxymethyl)diethanolamine, (hydroxyethyl (Oxymethyl)diethylamine, methyl(methoxymethyl)aminoethanol, methyl(butoxymethyl)aminoethanol, 2-(2-aminoethoxy)ethanol, 1 -(2-hydroxyethyl)piperazine, 1-(2-hydroxyethyl)methylpiperazine, N-(2-hydroxyethyl)morpholine, N-(3-hydroxypropyl)morpholine, etc., These can be used alone or in combination of two or more. However, the present invention may not contain ammonium hydroxide. In the case of containing ammonium hydroxide, the film quality of Mo or Mo alloy may be attacked, and it is particularly preferable not to contain tetramethylammonium hydroxide.
相對於整體組合物總重量,本發明的(b)烷醇胺的含量優選為0.1~20.0 重量%,更優選為0.5~10.0重量%。如果低於0.1 重量%,則可能發生抗蝕劑去除力降低,如果超過20.0重量%,則無法獲得烷醇胺含量增加所來的抗蝕劑去除力提高的效果而不經濟,而且可能發生使針對金屬膜質的腐蝕水準提高的問題。 (c) 極性有機溶劑The content of the (b) alkanolamine of the present invention is preferably 0.1 to 20.0% by weight, and more preferably 0.5 to 10.0% by weight relative to the total weight of the entire composition. If it is less than 0.1% by weight, the resist removal force may decrease, and if it exceeds 20.0% by weight, the effect of improving the resist removal force due to the increase in the alkanolamine content may not be obtained, which is uneconomical, and may cause Aiming at the problem of increased corrosion level of metal film quality. (c) Polar organic solvent
本發明中使用的(c)極性有機溶劑可以舉出質子性極性溶劑和非質子性極性溶劑,它們可以單獨或將兩種以上混合使用。作為上述質子性極性溶劑的優選的例子,可以舉出乙二醇單甲基醚、乙二醇單乙基醚、乙二醇單異丙基醚、乙二醇單丁基醚、二乙二醇單甲基醚、二乙二醇單乙基醚、二乙二醇單異丙基醚、二乙二醇單丁基醚、三乙二醇單甲基醚、三乙二醇單乙基醚、三乙二醇單異丙基醚、三乙二醇單丁基醚、聚乙二醇、聚丙二醇、聚乙二醇單甲基醚、聚乙二醇單丁基醚、丙二醇單甲基醚、二丙二醇單甲基醚、三丙二醇單甲基醚等伸烷基二醇單烷基醚、丙二醇單甲基醚乙酸酯和四氫糠醇等,它們可以單獨或將兩種以上混合使用。The (c) polar organic solvent used in the present invention includes a protic polar solvent and an aprotic polar solvent, and these can be used alone or in combination of two or more. As preferred examples of the above-mentioned protic polar solvents, ethylene glycol monomethyl ether, ethylene glycol monoethyl ether, ethylene glycol monoisopropyl ether, ethylene glycol monobutyl ether, diethylene two Alcohol monomethyl ether, diethylene glycol monoethyl ether, diethylene glycol monoisopropyl ether, diethylene glycol monobutyl ether, triethylene glycol monomethyl ether, triethylene glycol monoethyl ether Ether, triethylene glycol monoisopropyl ether, triethylene glycol monobutyl ether, polyethylene glycol, polypropylene glycol, polyethylene glycol monomethyl ether, polyethylene glycol monobutyl ether, propylene glycol monomethyl ether Alkylene glycol monoalkyl ether such as dipropylene glycol monomethyl ether, tripropylene glycol monomethyl ether, propylene glycol monomethyl ether acetate and tetrahydrofurfuryl alcohol, etc., they can be singly or in combination use.
作為上述非質子性極性溶劑的優選的例子,可以舉出N-甲基吡咯烷酮(NMP)、N-乙基吡咯烷酮等吡咯烷酮化合物;1,3-二甲基-2-咪唑烷酮、1,3-二丙基-2-咪唑烷酮等咪唑烷酮化合物;γ-丁內酯等內酯化合物;二甲基亞碸(DMSO)、環丁碸等亞碸化合物;磷酸三乙酯、磷酸三丁酯等磷酸酯化合物;碳酸二甲酯、碳酸亞乙酯等碳酸酯化合物;甲醯胺、N-甲基甲醯胺、N-乙基甲醯胺、N,N-二甲基甲醯胺、N,N-二乙基甲醯胺、乙醯胺、N-甲基乙醯胺、N,N-二甲基乙醯胺、N-(2-羥基乙基)乙醯胺、N,N-二甲基丙醯胺、3-甲氧基-N,N-二甲基丙醯胺、3-(2-乙基己基氧基)-N,N-二甲基丙醯胺、3-丁氧基-N,N-二甲基丙醯胺等醯胺化合物,它們可以單獨或將兩種以上混合使用。Preferable examples of the aforementioned aprotic polar solvents include pyrrolidone compounds such as N-methylpyrrolidone (NMP) and N-ethylpyrrolidone; 1,3-dimethyl-2-imidazolidinone, 1,3 -Dipropyl-2-imidazolidinone and other imidazolidinone compounds; γ-butyrolactone and other lactone compounds; dimethyl sulfide (DMSO), cyclobutane and other sulfide compounds; triethyl phosphate, triphosphate Phosphate compounds such as butyl ester; Carbonate compounds such as dimethyl carbonate and ethylene carbonate; Formamide, N-methylformamide, N-ethylformamide, N,N-dimethylformamide Amine, N,N-diethylformamide, acetamide, N-methylacetamide, N,N-dimethylacetamide, N-(2-hydroxyethyl)acetamide, N , N-dimethylpropanamide, 3-methoxy-N,N-dimethylpropanamide, 3-(2-ethylhexyloxy)-N,N-dimethylpropanamide, Amine compounds such as 3-butoxy-N,N-dimethylpropanamide can be used alone or in combination of two or more.
上述(c)極性有機溶劑發揮使凝膠化的抗蝕劑高分子溶解的作用,此外在抗蝕劑剝離之後去離子水的沖洗過程中使利用水的剝離液的去除順利進行,從而使剝離液以及所溶解的抗蝕劑的再吸附/再附著最小化。為了適當的剝離力,優選上述(c)極性有機溶劑的沸點既不過高也不過低,且可以混合使用。上述極性有機溶劑可以根據剝離工序中所追加要求的性能而追加。The above (c) polar organic solvent plays the role of dissolving the gelled resist polymer, and in addition, in the process of rinsing with deionized water after the resist is stripped, the stripping solution with water is removed smoothly, thereby making the stripping Resorption/reattachment of liquid and dissolved resist is minimized. In order to have an appropriate peeling force, it is preferable that the boiling point of the polar organic solvent (c) is neither too high nor too low, and can be used in combination. The above-mentioned polar organic solvent can be added according to the additional required performance in the peeling process.
相對於整體組合物總重量,上述(c)極性有機溶劑的含量為75.0~99.8重量%是適當的。如果低於75.0重量%,則可能發生溶解力降低,在利用去離子水的沖洗工序中可能發生抗蝕劑的再吸附/再附著。此外,如果超過99.8重量%,則(b)烷醇胺的含量相對減少而剝離力可能降低。 (d) 防腐蝕劑Relative to the total weight of the entire composition, the content of the aforementioned (c) polar organic solvent is appropriately 75.0 to 99.8% by weight. If it is less than 75.0% by weight, the dissolving power may decrease, and the resist may be re-adsorbed/re-adhered during the rinsing process with deionized water. In addition, if it exceeds 99.8% by weight, the content of (b) alkanolamine is relatively reduced and the peeling force may be reduced. (d) Anti-corrosion agent
本發明的組合物可以進一步包含(d)防腐蝕劑,具體而言,本發明的防腐蝕劑可以舉出:甲酸、乙酸、丙酸之類的單羧酸;草酸、丙二酸、琥珀酸、戊二酸、己二酸、庚二酸、馬來酸、富馬酸、戊烯二酸之類的二羧酸;偏苯三酸、丙三羧酸之類的三羧酸;羥基乙酸、乳酸、水楊酸、蘋果酸、酒石酸、檸檬酸、葡糖酸和羥基羧酸等有機酸類;琥珀酸醯胺酯、蘋果酸醯胺酯、馬來酸醯胺酯、富馬酸醯胺酯、草酸醯胺酯、丙二酸醯胺酯、戊二酸醯胺酯、乙酸醯胺酯、乳酸醯胺酯、檸檬酸醯胺酯、酒石酸醯胺酯、葡糖酸醯胺酯、甲酸醯胺酯和尿酸醯胺酯等有機酸醯胺酯類;苯并三唑、甲苯基三唑、甲基甲苯基三唑、2,2'-[[[苯并三唑]甲基]亞胺基]雙乙醇、2,2'-[[[甲基-1氫-苯并三唑-1-基]甲基]亞胺基]雙甲醇、2,2'-[[[乙基-1氫-苯并三唑-1-基]甲基]亞胺基]雙乙醇、2,2'-[[[甲基-1氫-苯并三唑-1-基]甲基]亞胺基]雙乙醇、2,2'-[[[甲基-1氫-苯并三唑-1-基]甲基]亞胺基]雙羧酸、2,2'-[[[甲基-1氫-苯并三唑-1-基]甲基]亞胺基]雙甲胺和2,2'-[[[胺-1氫-苯并三唑-1-基]甲基]亞胺基]雙乙醇、4-甲基-1-氫-苯并三唑、6-甲基-4,5,6,7-四氫-1H-苯并[1,2,3]三唑、4-甲基-4,5,6,7-四氫-1H-苯并[1,2,3]三唑、5-甲基-4,5,6,7-四氫-1H-苯并[1,2,3]三唑、5,6-二甲基-4,5,6,7-四氫-1H-苯并[1,2,3]三唑、4,6-二甲基-4,5,6,7-四氫-1H-苯并[1,2,3]三唑和5-甲基-1-氫-苯并三唑之類的唑系化合物;2,6-二甲基苯酚、2,4,6-三甲基苯酚、2,6-二乙基苯酚、2,6-二乙基-4-甲基苯酚、2,6-二丙基苯酚、2,6-二丙基-4-甲基苯酚、2,6-二叔丁基苯酚、2,4,6-三叔丁基苯酚和2,6-二-叔丁基-4-甲基苯酚之類的對稱型酚系化合物;等,但不限定於此。它們可以單獨或將兩種以上混合使用。The composition of the present invention may further include (d) an anticorrosion agent. Specifically, the anticorrosion agent of the present invention may include monocarboxylic acids such as formic acid, acetic acid, and propionic acid; oxalic acid, malonic acid, succinic acid, and glutaric acid. Dicarboxylic acids such as diacid, adipic acid, pimelic acid, maleic acid, fumaric acid, and glutaconic acid; tricarboxylic acids such as trimellitic acid and tricarboxylic acid; glycolic acid, lactic acid , Salicylic acid, malic acid, tartaric acid, citric acid, gluconic acid and hydroxy carboxylic acid; amide succinate, amide malate, amide maleate, amide fumarate, Oxalamide, malonate, glutarate, amide acetate, amide lactate, citrate, amide tartrate, amide gluconate, amide formate Esters and uric acid amide esters and other organic acid amide esters; benzotriazole, tolyltriazole, tolyltriazole, 2,2'-[[[benzotriazole]methyl]imino ]Diethanol, 2,2'-[[[Methyl-1hydro-benzotriazol-1-yl]methyl]imino]bismethanol, 2,2'-[[[ethyl-1hydro -Benzotriazol-1-yl]methyl]imino]diethanol, 2,2'-[[[Methyl-1hydro-benzotriazol-1-yl]methyl]imino] Diethanol, 2,2'-[[[methyl-1hydro-benzotriazol-1-yl]methyl]imino] dicarboxylic acid, 2,2'-[[[methyl-1hydro -Benzotriazol-1-yl]methyl]imino]bismethylamine and 2,2'-[[[amine-1hydro-benzotriazol-1-yl]methyl]imino] Diethanol, 4-methyl-1-hydro-benzotriazole, 6-methyl-4,5,6,7-tetrahydro-1H-benzo[1,2,3]triazole, 4-methyl Group-4,5,6,7-tetrahydro-1H-benzo[1,2,3]triazole, 5-methyl-4,5,6,7-tetrahydro-1H-benzo[1, 2,3]triazole, 5,6-dimethyl-4,5,6,7-tetrahydro-1H-benzo[1,2,3]triazole, 4,6-dimethyl-4, Azole compounds such as 5,6,7-tetrahydro-1H-benzo[1,2,3]triazole and 5-methyl-1-hydro-benzotriazole; 2,6-dimethyl Phenol, 2,4,6-trimethylphenol, 2,6-diethylphenol, 2,6-diethyl-4-methylphenol, 2,6-dipropylphenol, 2,6-di Symmetry such as propyl-4-methylphenol, 2,6-di-tert-butylphenol, 2,4,6-tri-tert-butylphenol and 2,6-di-tert-butyl-4-methylphenol Type phenolic compound; etc., but not limited to this. These can be used alone or in combination of two or more.
相對於組合物總重量,本發明的(d)防腐蝕劑的含量可以為0.001~1.0重量%。在防腐蝕劑的含量低於0.001重量%的情況下,存在銅表面發生微腐蝕的問題,在含量超過1.0重量%的情況下,無法獲得含量增加所帶來的防腐蝕效果而不經濟。The content of the (d) anticorrosive agent of the present invention may be 0.001 to 1.0% by weight relative to the total weight of the composition. When the content of the anti-corrosion agent is less than 0.001% by weight, there is a problem of micro-corrosion on the copper surface, and when the content exceeds 1.0% by weight, the anti-corrosion effect due to the increase in the content cannot be obtained, which is uneconomical.
本發明的抗蝕劑剝離液組合物可以在半導體或電子產品、尤其顯示器用抗蝕劑的去除工序中有效地使用。The resist stripper composition of the present invention can be effectively used in the removal process of semiconductors or electronic products, particularly resists for displays.
即,本發明包含顯示器基板的製造方法及由上述製造方法製造的顯示器基板,該顯示器基板的製造方法包括利用本發明的抗蝕劑剝離液組合物來清洗顯示器基板的工序。That is, the present invention includes a method of manufacturing a display substrate and a display substrate manufactured by the above-mentioned manufacturing method. The method of manufacturing the display substrate includes a step of cleaning the display substrate with the resist stripping liquid composition of the present invention.
以下,通過實施例更詳細說明本發明。然而,下述實施例僅用於更具體地說明本發明,本發明的範圍不受下述實施例的限定。下述實施例可以在本發明的範圍內被本領域的技術人員合理地修改、變更。 <實施例及比較例> 抗蝕劑剝離液組合物的製造Hereinafter, the present invention will be explained in more detail through examples. However, the following examples are only for explaining the present invention more specifically, and the scope of the present invention is not limited by the following examples. The following embodiments can be reasonably modified and changed by those skilled in the art within the scope of the present invention. <Examples and Comparative Examples> Production of resist stripper composition
將下述表1中記載的成分以相應的混合比進行混合而製造實施例及比較例的抗蝕劑剝離液組合物。 [表1]
註) APTES:(3-胺基丙基)三乙氧基矽烷 APSTO:(3-胺基丙基)矽烷三醇 AEE:2-(2-胺基乙氧基)-1-乙醇 MAE:2-(甲基胺基)乙醇 MDEA:N-甲基二乙醇胺 IME:咪唑烷乙醇 NMF:N-甲基甲醯胺 NEF:N-乙基甲醯胺 NMP:N-甲基吡咯烷酮 MDG:二乙二醇單甲基醚 EDG:二乙二醇單乙基醚 BDG:二乙二醇單丁基醚 MTG:三乙二醇單甲基醚 TTA:甲苯基三唑 MTBT:6-甲基-4,5,6,7-四氫-1H-苯并[1,2,3]三唑 TMAH(25):四甲基氫氧化銨溶液(H2 O中25 wt.%) <實驗例1> 剝離液的光致抗蝕劑剝離力評價Note) APTES: (3-aminopropyl)triethoxysilane APSTO: (3-aminopropyl)silanetriol AEE: 2-(2-aminoethoxy)-1-ethanol MAE: 2 -(Methylamino)ethanol MDEA: N-methyldiethanolamine IME: Imidazolidine ethanol NMF: N-methylformamide NEF: N-ethylformamide NMP: N-methylpyrrolidone MDG: diethyl Glycol monomethyl ether EDG: Diethylene glycol monoethyl ether BDG: Diethylene glycol monobutyl ether MTG: Triethylene glycol monomethyl ether TTA: Tolyltriazole MTBT: 6-methyl-4 ,5,6,7-Tetrahydro-1H-benzo[1,2,3]triazole TMAH(25): Tetramethylammonium hydroxide solution (25 wt.% in H 2 O) <Experimental example 1> Evaluation of photoresist stripping force of stripping solution
為了確認抗蝕劑剝離液組合物的剝離效果,在玻璃基板上塗布1.7μm的正型光致抗蝕劑(DWG-520:本公司PR)後,在170℃在加熱板(Hot plate)上實施10分鐘後烘(Hard bake)而準備基板。將抗蝕劑剝離液組合物以50℃恒定維持溫度後,將上述基板以30秒的間隔浸漬而評價剝離力。之後,為了去除殘留在基板上的剝離液,利用去離子水(DIW;Deilonized water)實施1分鐘清洗,為了去除清洗後殘留在基板上的DIW,利用氮氣將基板完全乾燥。用肉眼確認完成評價的基板,測定抗蝕劑被完全去除的時間,並將該結果示於下述表2中。可以認為時間越短,剝離效果越優異。 <實驗例2> 剝離液金屬配線防腐蝕力評價In order to confirm the peeling effect of the resist stripper composition, a 1.7μm positive photoresist (DWG-520: our company’s PR) was coated on a glass substrate, and then placed on a hot plate at 170°C The substrate was prepared by performing hard bake for 10 minutes. After keeping the temperature of the resist stripping liquid composition constant at 50°C, the substrate was immersed at an interval of 30 seconds to evaluate the peeling force. After that, in order to remove the peeling liquid remaining on the substrate, cleaning was performed with deionized water (DIW; Deilonized water) for 1 minute. In order to remove the DIW remaining on the substrate after cleaning, the substrate was completely dried with nitrogen. The evaluated substrate was visually confirmed, and the time until the resist was completely removed was measured, and the results are shown in Table 2 below. It can be considered that the shorter the time, the better the peeling effect. <Experimental example 2> Evaluation of anti-corrosion power of stripping liquid metal
為了進行抗蝕劑剝離液組合物對於金屬配線的腐蝕防止能力評價,根據通常的方法,使用薄膜濺射法在玻璃基板上形成Mo/Al、Cu/X層(X:Ti、Mo、MoTi、MoW、MoNb)。之後,形成光致抗蝕劑圖案,通過濕式蝕刻方式分別準備將金屬膜蝕刻的基板。使用簡易剝離噴灑(Strip Spray)評價設備,使剝離液組合物以60℃恒定維持溫度,對於上述基板以2kgf/cm2 壓力進行2分鐘噴灑剝離,然後使用簡易DIW清洗噴灑設備將上述完成剝離的基板在常溫下以2kgf/cm2 壓力實施3分鐘噴灑清洗。關於完成清洗的基板,使用N2 實施乾燥,將上述剝離工序中實現DIW 清洗和乾燥的工序反覆實施3次,利用電子顯微鏡(SEM,Hitachi S-4700)評價該基板。將該結果示於下述表2中,根據各金屬腐蝕程度,在未觀察到腐蝕時表示為◎,在觀察到少許腐蝕但應用於膜質應用時沒有問題時表示為○,在觀察到腐蝕且應用於膜質時很可能出現問題時表示為△,在觀察到嚴重腐蝕且無法應用於膜質時表示為×。In order to evaluate the corrosion prevention ability of the resist stripping solution composition for metal wiring, according to a common method, a thin film sputtering method was used to form Mo/Al and Cu/X layers (X: Ti, Mo, MoTi, MoW, MoNb). After that, a photoresist pattern is formed, and a substrate on which the metal film is etched is prepared separately by a wet etching method. Using a simple strip spray evaluation equipment, the stripping liquid composition was maintained at a constant temperature of 60°C, and the above-mentioned substrate was sprayed and peeled at a pressure of 2kgf/cm 2 for 2 minutes, and then a simple DIW cleaning spray equipment was used to remove the above-mentioned completed The substrate was spray-cleaned for 3 minutes at a pressure of 2 kgf/cm 2 at room temperature. Regarding the cleaned substrate, drying was performed using N 2 and the steps of realizing DIW cleaning and drying in the above-mentioned peeling step were repeated three times, and the substrate was evaluated with an electron microscope (SEM, Hitachi S-4700). The results are shown in Table 2 below. According to the degree of corrosion of each metal, when no corrosion is observed, it is expressed as ◎, when a little corrosion is observed but there is no problem when applied to film quality applications, it is expressed as ○, when corrosion is observed and When it is applied to the film quality, it is indicated as △, when serious corrosion is observed and cannot be applied to the film quality, it is indicated as ×.
[表2]
參照上述實驗結果可以確認到,由於本發明的抗蝕劑剝離液組合物使用在去離子水及極性溶劑中溶解力優異的胺基烷基矽烷系化合物, 因而不會使鋁、銅、鎢、鉬、鈦及包含它們的金屬配線發生腐蝕,且具有高剝離力效果。此外,可以確認到,在包含氫氧化銨、即四甲基氫氧化銨的比較例7和8的情況下,侵蝕(attack)Mo或Mo合金膜質而發生了嚴重的腐蝕。With reference to the above experimental results, it can be confirmed that since the resist stripping liquid composition of the present invention uses an aminoalkylsilane-based compound having excellent solubility in deionized water and polar solvents, it does not cause aluminum, copper, tungsten, Molybdenum, titanium, and metal wiring containing them corrode, and have a high peeling force effect. In addition, it was confirmed that in the cases of Comparative Examples 7 and 8 containing ammonium hydroxide, that is, tetramethylammonium hydroxide, the film quality of Mo or Mo alloy was attacked and severe corrosion occurred.
(無)(no)
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