TWI684858B - 徵兆偵測系統及徵兆偵測方法 - Google Patents

徵兆偵測系統及徵兆偵測方法 Download PDF

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TWI684858B
TWI684858B TW107110432A TW107110432A TWI684858B TW I684858 B TWI684858 B TW I684858B TW 107110432 A TW107110432 A TW 107110432A TW 107110432 A TW107110432 A TW 107110432A TW I684858 B TWI684858 B TW I684858B
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machine
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TW107110432A
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TW201901428A (zh
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岸真人
熊野信太郎
安部克彦
山本圭介
井上由彦
新妻瞬
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日商三菱日立電力系統股份有限公司
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    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0243—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults model based detection method, e.g. first-principles knowledge model
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N20/00—Machine learning
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N3/00—Computing arrangements based on biological models
    • G06N3/02—Neural networks
    • G06N3/04—Architecture, e.g. interconnection topology
    • G06N3/044—Recurrent networks, e.g. Hopfield networks
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N3/00—Computing arrangements based on biological models
    • G06N3/02—Neural networks
    • G06N3/04—Architecture, e.g. interconnection topology
    • G06N3/044—Recurrent networks, e.g. Hopfield networks
    • G06N3/0442—Recurrent networks, e.g. Hopfield networks characterised by memory or gating, e.g. long short-term memory [LSTM] or gated recurrent units [GRU]
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N3/00—Computing arrangements based on biological models
    • G06N3/02—Neural networks
    • G06N3/04—Architecture, e.g. interconnection topology
    • G06N3/045—Combinations of networks
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N3/00—Computing arrangements based on biological models
    • G06N3/02—Neural networks
    • G06N3/08—Learning methods
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N3/00—Computing arrangements based on biological models
    • G06N3/02—Neural networks
    • G06N3/08—Learning methods
    • G06N3/09—Supervised learning
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
    • G06F11/0751—Error or fault detection not based on redundancy
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/30—Monitoring
    • G06F11/34—Recording or statistical evaluation of computer activity, e.g. of down time, of input/output operation ; Recording or statistical evaluation of user activity, e.g. usability assessment
    • G06F11/3447—Performance evaluation by modeling

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  • Theoretical Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Software Systems (AREA)
  • Computing Systems (AREA)
  • Artificial Intelligence (AREA)
  • Mathematical Physics (AREA)
  • Data Mining & Analysis (AREA)
  • Evolutionary Computation (AREA)
  • General Engineering & Computer Science (AREA)
  • Biomedical Technology (AREA)
  • Molecular Biology (AREA)
  • General Health & Medical Sciences (AREA)
  • Computational Linguistics (AREA)
  • Biophysics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Automation & Control Theory (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Medical Informatics (AREA)
  • Testing And Monitoring For Control Systems (AREA)
TW107110432A 2017-03-29 2018-03-27 徵兆偵測系統及徵兆偵測方法 TWI684858B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2017-066125 2017-03-29
JP2017066125A JP7179444B2 (ja) 2017-03-29 2017-03-29 予兆検知システム及び予兆検知方法

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TW201901428A TW201901428A (zh) 2019-01-01
TWI684858B true TWI684858B (zh) 2020-02-11

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US (1) US11048245B2 (enExample)
JP (1) JP7179444B2 (enExample)
CN (1) CN110431502B (enExample)
DE (1) DE112018001684T5 (enExample)
TW (1) TWI684858B (enExample)
WO (1) WO2018181020A1 (enExample)

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US12093001B2 (en) 2019-05-22 2024-09-17 Nec Corporation Operation rule determination device, method, and recording medium using frequency of a cumulative reward calculated for series of operations
JP2021005261A (ja) * 2019-06-27 2021-01-14 東洋エンジニアリング株式会社 処理システム監視装置、処理システム監視方法、及びプログラム
JP7483341B2 (ja) * 2019-09-26 2024-05-15 キヤノン株式会社 情報処理方法、情報処理装置、機械設備、物品の製造方法、プログラム、記録媒体
DE102019217055A1 (de) * 2019-11-06 2021-05-06 Robert Bosch Gmbh Verfahren zum Ermitteln einer unzulässigen Abweichung des Systemverhaltens einer technischen Einrichtung von einem Normwertebereich
JP7519836B2 (ja) * 2020-07-31 2024-07-22 三菱重工サーマルシステムズ株式会社 推定装置、推定方法、及びプログラム
KR20230087454A (ko) * 2020-10-14 2023-06-16 스미도모쥬기가이고교 가부시키가이샤 표시장치, 표시방법, 제어장치 및 컴퓨터프로그램
WO2022091399A1 (ja) * 2020-11-02 2022-05-05 三菱電機株式会社 保険料率算出装置および保険料率算出方法
JP7414704B2 (ja) * 2020-12-14 2024-01-16 株式会社東芝 異常検出装置、異常検出方法、およびプログラム
JP7689437B2 (ja) * 2021-03-31 2025-06-06 三菱重工業株式会社 装置、遠隔監視システム、装置の制御方法、及び、遠隔監視システムの制御方法
TWI805041B (zh) * 2021-10-22 2023-06-11 智影顧問股份有限公司 機台異常標註與異常預測系統
JP7646520B2 (ja) * 2021-11-01 2025-03-17 株式会社東芝 データ処理装置、方法およびプログラム
CN114186738A (zh) * 2021-12-10 2022-03-15 北京百度网讯科技有限公司 一种故障预警方法、装置、电子设备和存储介质

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Also Published As

Publication number Publication date
JP2018169769A (ja) 2018-11-01
CN110431502A (zh) 2019-11-08
US20200103883A1 (en) 2020-04-02
CN110431502B (zh) 2023-06-27
JP7179444B2 (ja) 2022-11-29
US11048245B2 (en) 2021-06-29
TW201901428A (zh) 2019-01-01
DE112018001684T5 (de) 2019-12-19
WO2018181020A1 (ja) 2018-10-04

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