TWI683112B - State analyser, displaying method thereof, and computer program product thereof - Google Patents

State analyser, displaying method thereof, and computer program product thereof Download PDF

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TWI683112B
TWI683112B TW107103969A TW107103969A TWI683112B TW I683112 B TWI683112 B TW I683112B TW 107103969 A TW107103969 A TW 107103969A TW 107103969 A TW107103969 A TW 107103969A TW I683112 B TWI683112 B TW I683112B
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state
parameter
value
display information
parameters
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TW201840990A (en
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園田
森下靖
熊野信太郎
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日商三菱日立電力系統股份有限公司
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M99/00Subject matter not provided for in other groups of this subclass
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/18Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using inductive devices, e.g. transformers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/25Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
    • G01R19/2506Arrangements for conditioning or analysing measured signals, e.g. for indicating peak values ; Details concerning sampling, digitizing or waveform capturing
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/25Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
    • G01R19/252Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques using analogue/digital converters of the type with conversion of voltage or current into frequency and measuring of this frequency
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/34Testing dynamo-electric machines
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00Testing or monitoring of control systems or parts thereof
    • G05B23/02Electric testing or monitoring

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  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Automation & Control Theory (AREA)
  • Testing And Monitoring For Control Systems (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Tests Of Circuit Breakers, Generators, And Electric Motors (AREA)
  • Testing Of Devices, Machine Parts, Or Other Structures Thereof (AREA)
  • Remote Monitoring And Control Of Power-Distribution Networks (AREA)
  • Testing Relating To Insulation (AREA)
  • Control Of Electric Motors In General (AREA)

Abstract

A state analyzer (10) includes: a current acquisition unit (11) configured to acquire a current signal flowing to a target device (30); a parameter calculation unit (12) configured to calculate values of a plurality of parameters that varies depending on the state of the target device based on the current signal and that have mutual correlation, at a timing related to a predetermined cycle; and a display information generating unit (17) configured to generate display information in a coordinate space with each of the plurality of parameters as an axis, the display information including a dividing line representing a predetermined threshold which is a criterion for judging the state of the target device, a first figure representing values of the plurality of parameters relating to one timing, and a second figure representing a variation amount of the plurality of parameter values calculated at a different timing from the one timing.

Description

狀態分析裝置、顯示方法、及電腦程式產品 State analysis device, display method, and computer program product

本發明係關於狀態分析裝置、顯示方法、及程式。 The invention relates to a state analysis device, a display method, and a program.

本案係針對2017年02月06日於日本申請之日本特願2017-019899號主張優先權,且在此沿用其內容。 This case claims priority against Japanese Patent Application No. 2017-019899 filed in Japan on February 06, 2017, and the contents are used here.

在發電廠等設備中,為了監視裝置的動作的狀態,在裝置的預定部位夾著電流鉗,測定電流訊號。此時,監視裝置係藉由將所被測定出的電流訊號進行快速傅立葉轉換,生成電流的頻率範圍圖表,且顯示在畫面(參照例如專利文獻1)。接著,檢查者係觀察所被顯示的頻率範圍圖表,進行裝置的異常檢測及識別。具體而言,檢查者係由頻率範圍圖表的觀察結果,特定表示裝置的預定動作的參數,特定與該參數相關連的動作的狀態。 In equipment such as power plants, in order to monitor the operating state of the device, a current clamp is sandwiched between predetermined parts of the device to measure the current signal. At this time, the monitoring device generates a graph of the frequency range of the current by performing a fast Fourier transform on the measured current signal, and displays it on the screen (see, for example, Patent Document 1). Next, the examiner observes the displayed frequency range graph to detect and recognize the abnormality of the device. Specifically, the examiner specifies the parameter indicating the predetermined operation of the device from the observation result of the frequency range graph, and specifies the state of the operation related to the parameter.

[先前技術文獻] [Prior Technical Literature] [專利文獻] [Patent Literature]

[專利文獻1]日本專利第5828948號公報 [Patent Document 1] Japanese Patent No. 5828948

但是,讀取頻率範圍圖表需要熟練,對非為熟練者而言,難以從頻率範圍圖表中識別裝置的狀態。此外,頻率範圍圖表雖然表示裝置的瞬時狀態,但是在頻率範圍圖表中並未呈現從過去的狀態如何改變。因此,單由頻率範圍圖表的觀察,難以預測裝置的狀態變化。此外,藉由由頻率範圍圖表所特定出的參數,可特定與該參數相關連的動作的狀態,但是難以特定與個別參數未建立關連的狀態。 However, reading the frequency range chart requires proficiency, and it is difficult for non-skilled persons to recognize the state of the device from the frequency range chart. In addition, although the frequency range graph shows the instantaneous state of the device, the frequency range graph does not show how the state from the past has changed. Therefore, it is difficult to predict the state change of the device only by observing the frequency range graph. In addition, with the parameters specified by the frequency range chart, the state of the operation associated with the parameter can be specified, but it is difficult to specify the state where no correlation is established with individual parameters.

本發明之目的在提供可輕易識別對象裝置的狀態及狀態的變化的狀態分析裝置、顯示方法、及程式。 An object of the present invention is to provide a state analysis device, a display method, and a program that can easily recognize the state and change of the target device.

藉由本發明之第1態樣,狀態分析裝置係具備有:電流取得部,其係取得流至對象裝置的電流訊號;參數算出部,其係以有關一定周期的時序,根據前述電流訊號,算出依前述對象裝置的狀態變動且彼此具有相關關係的複數參數的值;及顯示資訊生成部,其係在以前述複數參數的各個為軸的座標空間,生成顯示資訊,該顯示資訊配置有:表示成為前述對象裝置的狀態的判斷基準的預先設定的臨限值的區分線;表示有關一時序的前述複數參數的值的第1圖形;及表示在不同時序被算出的前述複數參數的值的變化量的第2圖形。According to the first aspect of the present invention, the state analysis device is provided with: a current acquisition part which acquires the current signal flowing to the target device; a parameter calculation part which calculates based on the aforementioned current signal at a timing related to a certain period The value of a complex parameter that changes according to the state of the aforementioned target device and has a correlation with each other; and a display information generation unit that generates display information in a coordinate space with each of the complex parameter as an axis, the display information is configured as: A division line of a preset threshold value that becomes a criterion for determining the state of the target device; a first graph showing the value of the complex parameter about a time sequence; and a change in the value of the complex parameter calculated at different times The second graph of the volume.

藉由本發明之第2態樣,第1態樣之狀態分析裝置亦可為前述顯示資訊生成部係若有關不同時序的前述複數參數的至少1個值跨越前述臨限值,生成包含預定訊息的前述顯示資訊者。According to the second aspect of the present invention, the state analysis device of the first aspect may also generate for the display information generation unit, if at least one value of the complex parameter related to different timings crosses the threshold value, a The above shows the informant.

藉由本發明之第3態樣,第1態樣之狀態分析裝置亦可為前述顯示資訊生成部係在有關不同時序的前述複數參數的至少1個值跨越前述臨限值時、與未跨越前述臨限值時,使前述第1圖形的顯示形態不同者。According to the third aspect of the present invention, the state analysis device of the first aspect may also provide the display information generation unit with at least one value of the complex parameter at different timings crossing the threshold value and not crossing the threshold In the case of the threshold, the display form of the first pattern described above is different.

藉由本發明之第4態樣,在第1至第3中任一態樣之狀態分析裝置中,亦可為前述對象裝置的狀態係包含:前述對象裝置為正常的正常狀態、前述對象裝置為異常的異常狀態、及前述對象裝置的狀態可能遷移至異常狀態的狀態亦即注意狀態,前述顯示資訊生成部係生成包含:區分前述正常狀態與前述注意狀態的第1區分線、及區分前述注意狀態與前述異常狀態的第2區分線,作為前述區分線的前述顯示資訊者。According to the fourth aspect of the present invention, in the state analysis device of any one of the first to third aspects, the state of the object device may include: the object device is in a normal normal state, and the object device is An abnormal abnormal state and a state where the state of the target device may transition to an abnormal state, that is, an attention state, the display information generation unit generates a first division line that includes the normal state and the attention state, and distinguishes the attention The second division line between the state and the abnormal state serves as the person who displays the information on the division line.

藉由本發明之第5態樣,在第1至第4中任一態樣之狀態分析裝置中,亦可為前述對象裝置係具有繞轉子旋轉的馬達、及連同前述轉子一起旋轉的輔機的裝置,前述複數參數係選自由表示前述對象裝置的全面狀態的參數、表示前述轉子的狀態的參數、表示前述轉子及前述輔機的失準狀態的參數、表示流至前述馬達的電流實效值的參數、表示有關前述電流的電源品質的參數、及表示前述輔機的狀態的參數所成群組的複數參數者。According to the fifth aspect of the present invention, in the state analysis device of any one of the first to fourth aspects, the target device may include a motor that rotates around the rotor and an auxiliary machine that rotates together with the rotor Device, the complex parameter is selected from the group consisting of a parameter indicating the overall state of the target device, a parameter indicating the state of the rotor, a parameter indicating the misalignment state of the rotor and the auxiliary machine, and a current effective value flowing to the motor A plurality of parameters, a group of parameters, a parameter indicating the power quality of the current, and a parameter indicating the state of the auxiliary machine.

藉由本發明之第6態樣,顯示方法係包含:取得流至對象裝置的電流訊號;以有關一定周期的時序,根據前述電流訊號,算出依前述對象裝置的狀態變動且彼此具有相關關係的複數參數的值;算出在不同時序被算出的前述複數參數的值的變化量;及在以前述複數參數的各個為軸的座標空間,顯示顯示資訊,該顯示資訊配置有:表示成為前述對象裝置的狀態的判斷基準的臨限值的區分線;表示有關一時序的前述複數參數的值的第1圖形;及表示前述變化量的第2圖形。According to the sixth aspect of the present invention, the display method includes: obtaining a current signal flowing to the target device; at a timing related to a certain period, according to the current signal, calculating a complex number that varies according to the state of the target device and has a correlation with each other The value of the parameter; calculating the amount of change in the value of the complex parameter calculated at different timings; and displaying the display information in the coordinate space around each of the complex parameter as the axis, the display information is configured to indicate: the target device The division line of the threshold value of the criterion for judging the state; the first graph showing the value of the complex parameter for a time sequence; and the second graph showing the amount of change.

藉由本發明之第7態樣,程式係用以使電腦執行以下:取得流至對象裝置的電流訊號;以有關一定周期的時序,根據前述電流訊號,算出依前述對象裝置的狀態變動且彼此具有相關關係的複數參數的值;算出在不同時序被算出的前述複數參數的值的變化量;及在以前述複數參數的各個為軸的座標空間,生成顯示資訊,該顯示資訊配置有:表示成為前述對象裝置的狀態的判斷基準的臨限值的區分線;表示有關一時序的前述複數參數的值的第1圖形;及表示前述變化量的第2圖形。With the seventh aspect of the present invention, the program is used to cause the computer to perform the following: obtain the current signal flowing to the target device; at a timing related to a certain period, according to the current signal, calculate the state change of the target device and have each other The value of the complex parameter of the correlation; calculating the amount of change in the value of the complex parameter calculated at different timings; and generating the display information in the coordinate space around each of the complex parameter as the axis, the display information is configured as: The distinction line of the threshold value of the criterion for judging the state of the target device; the first graph showing the value of the complex parameter about a time sequence; and the second graph showing the amount of change.

藉由上述態樣之中至少1個態樣,狀態分析裝置係由電流訊號算出參數,且生成使該參數連同表示臨限值的區分線一起顯示的顯示資訊。藉此,根據所顯示的資訊,即使不需要熟練,亦可特定對象裝置的狀態。此外,狀態分析裝置係生成使表示參數的變化量的圖形顯示的顯示資訊。藉此,可根據所顯示的資訊,辨識對象裝置的狀態遷移。此外,狀態分析裝置係在以彼此具有相關關係的複數參數的各個為軸的座標空間,配置表示參數的圖形。藉此,藉由視認參數或參數的變化量的偏差,可特定與個別參數未建立關連的狀態。With at least one of the above-mentioned aspects, the state analysis device calculates the parameter from the current signal, and generates display information that causes the parameter to be displayed together with the distinction line indicating the threshold value. With this, the state of the target device can be specified even if no proficiency is required based on the displayed information. In addition, the state analysis device generates display information that graphically displays the amount of change in the parameter. In this way, the state transition of the target device can be recognized based on the displayed information. In addition, the state analysis device arranges graphs representing the parameters in the coordinate space around each of the complex parameters having a correlation with each other. In this way, by recognizing the deviation of the parameter or the amount of change of the parameter, it is possible to specify a state in which no correlation is established with the individual parameter.

以下一邊參照圖示,一邊詳加說明第1實施形態。   圖1係顯示第1實施形態之狀態分析系統的構成的概略圖。   第1實施形態之狀態分析系統1係具備有:狀態分析裝置10、顯示裝置20、對象裝置30、三相交流電源40、電力線50、箝位電流計60。   第1實施形態之狀態分析裝置10係使表示成為檢查對象的對象裝置30的狀態的資訊顯示在顯示裝置20。第1實施形態之對象裝置30係具備有:以三相交流電源驅動的馬達、連同馬達所具備的轉子一起旋轉的泵或風扇等輔機的旋轉機械系統。對象裝置30係透過電力線50而連接在三相交流電源40。電力線50係被夾入在箝位電流計60。狀態分析系統1係具備有3個箝位電流計60,各箝位電流計60係分別夾入不同的電力線。其中,在其他實施形態中,狀態分析系統1具備1個或2個箝位電流計60,亦可為3條電力線50之中未計測一部分電流者。箝位電流計60係計測在電力線50流通的電流的大小,且形成為數位訊號(電流訊號)而輸出至狀態分析裝置10。狀態分析裝置10係根據由箝位電流計60所接收到的電流訊號,使表示對象裝置30的狀態的資訊顯示在顯示裝置20。The first embodiment will be described in detail below with reference to the drawings. FIG. 1 is a schematic diagram showing the configuration of the state analysis system of the first embodiment. The state analysis system 1 of the first embodiment includes a state analysis device 10, a display device 20, a target device 30, a three-phase AC power supply 40, a power line 50, and a clamp ammeter 60. The state analysis device 10 of the first embodiment causes the display device 20 to display information indicating the state of the target device 30 to be inspected. The target device 30 of the first embodiment is a rotating machine system including an auxiliary machine such as a motor driven by a three-phase AC power source and a pump or fan that rotates together with a rotor included in the motor. The target device 30 is connected to the three-phase AC power supply 40 via the power line 50. The power line 50 is sandwiched between the clamp ammeter 60. The state analysis system 1 is equipped with three clamp galvanometers 60, and each clamp ampere 60 is sandwiched by a different power line. However, in other embodiments, the state analysis system 1 includes one or two clamp galvanometers 60, or a part of the three power lines 50 that does not measure a part of the current. The clamp ammeter 60 measures the magnitude of the current flowing through the power line 50 and forms a digital signal (current signal) and outputs it to the state analysis device 10. The state analysis device 10 displays information indicating the state of the target device 30 on the display device 20 based on the current signal received by the clamp ammeter 60.

圖2係顯示第1實施形態之狀態分析裝置的構成的概略區塊圖。   狀態分析裝置10係具備有:電流取得部11、參數算出部12、參數記憶部13、臨限值記憶部14、圖表生成部15、遷移偵測部16、顯示控制部17。FIG. 2 is a schematic block diagram showing the configuration of the state analyzer of the first embodiment. The state analysis device 10 includes a current acquisition unit 11, a parameter calculation unit 12, a parameter storage unit 13, a threshold storage unit 14, a graph generation unit 15, a migration detection unit 16, and a display control unit 17.

電流取得部11係取得由箝位電流計60透過電力線50而流至對象裝置30的電流訊號。The current acquisition unit 11 acquires the current signal flowing from the clamp ammeter 60 to the target device 30 through the power line 50.

參數算出部12係以有關一定周期的時序,根據電流取得部11所取得的電流訊號,算出依對象裝置30的狀態而變動的複數參數的值。以下將藉由參數算出部12所算出的參數稱為電流參數。關於具體的電流參數之例,容後敘述。參數算出部12所算出的複數電流參數之中至少2個係彼此具有相關關係的參數。The parameter calculation unit 12 calculates the value of a complex parameter that varies according to the state of the target device 30 based on the current signal acquired by the current acquisition unit 11 at a timing related to a certain period. Hereinafter, the parameter calculated by the parameter calculation unit 12 is referred to as a current parameter. The specific examples of current parameters will be described later. At least two of the complex current parameters calculated by the parameter calculation unit 12 are parameters having a correlation relationship with each other.

參數記憶部13係將參數算出部12所算出的電流參數的值與算出時刻建立關連來進行記憶。The parameter storage unit 13 stores the value of the current parameter calculated by the parameter calculation unit 12 in association with the calculation time.

臨限值記憶部14係針對各電流參數,記憶成為對象裝置30的狀態的判斷基準的臨限值。第1實施形態之對象裝置30的狀態的類別係:對象裝置30為正常的正常狀態;對象裝置30為異常的異常狀態;及對象裝置30的狀態可能遷移至異常狀態的狀態亦即注意狀態。亦即,臨限值記憶部14係針對各電流參數,記憶區分正常狀態與注意狀態的第1臨限值、及區分注意狀態與異常狀態的第2臨限值。The threshold value memory unit 14 stores the threshold value that becomes the criterion for determining the state of the target device 30 for each current parameter. The categories of states of the target device 30 in the first embodiment are: the target device 30 is in a normal normal state; the target device 30 is in an abnormal abnormal state; and the state in which the state of the target device 30 may transition to an abnormal state, that is, a caution state. That is, the threshold value memory unit 14 memorizes the first threshold value that distinguishes the normal state from the attention state and the second threshold value that distinguishes the attention state from the abnormal state for each current parameter.

圖表生成部15係生成:參數算出部12所算出的電流參數的值、及表示由前次的電流參數的值變化成本次的電流參數的值的變化量的圖表畫像。圖表畫像係在縱軸與橫軸取彼此具有相關關係的2個電流參數的圖表。在圖表畫像係配置有:表示有關各電流參數的臨限值的區分線、及表示2個電流參數的值的標繪(第1圖形)、及表示變化量的箭號(第2圖形)。The graph generation unit 15 generates a graph image showing the value of the current parameter calculated by the parameter calculation unit 12 and the amount of change in the value of the current parameter changed from the value of the previous current parameter to the value of the current parameter. The graph image is a graph of two current parameters that have a correlation between the vertical axis and the horizontal axis. In the graph image system, a division line indicating the threshold value of each current parameter, a plot indicating the values of the two current parameters (first graph), and an arrow indicating the amount of change (second graph) are arranged.

遷移偵測部16係偵測各電流參數的值跨過臨限值記憶部14所記憶的臨限值而改變的情形。The migration detection unit 16 detects a situation where the value of each current parameter crosses the threshold value memorized by the threshold value memory unit 14 and changes.

顯示控制部17係根據圖表生成部所生成的圖表畫面、與藉由遷移偵測部16所得之偵測結果,生成輸出至顯示裝置20的顯示資訊。顯示控制部17係顯示資訊生成部之一例。The display control unit 17 generates display information output to the display device 20 based on the graph screen generated by the graph generation unit and the detection result obtained by the migration detection unit 16. The display control unit 17 is an example of a display information generating unit.

在此,說明第1實施形態之參數算出部12所算出的電流參數。   第1實施形態之參數算出部12係算出KI參數、Lpole參數、Lshaft參數、Irms參數、THD參數、IHD參數、Lx參數、Iub參數。Here, the current parameter calculated by the parameter calculation unit 12 of the first embodiment will be described. The parameter calculation unit 12 of the first embodiment calculates KI parameters, Lpole parameters, Lshaft parameters, Irms parameters, THD parameters, IHD parameters, Lx parameters, and Iub parameters.

KI參數係表示對象裝置30的全面狀態的參數。KI參數係對於由電流訊號所求出的檢查時振幅機率密度關數ft(x)、與表示馬達的額定電流的基準正弦波訊號波形的參照振幅機率密度變數fr(x)的庫爾貝克-萊伯勒(Kullback-Leibler)資訊量。具體而言,KI參數係藉由以下式(1)求出。The KI parameter is a parameter indicating the overall state of the target device 30. The KI parameter is the Kulbeck-value of the reference amplitude probability density variable fr(x) for the inspection amplitude probability density off ft(x) obtained from the current signal and the reference amplitude probability density variable fr(x) representing the reference sine wave signal waveform of the motor The amount of information on Kullback-Leibler. Specifically, the KI parameter is obtained by the following formula (1).

[數式1]

Figure 02_image001
[Formula 1]
Figure 02_image001

Lpole參數係表示對象裝置30的轉子的狀態的參數。Lpole參數係在將電流訊號進行頻率範圍轉換所得的頻率頻譜之中,以電流頻譜峰值為中心,以預定頻率份分離的頻率位置中的電流頻譜的邊帶波的峰值的大小。有關Lpole參數的邊帶波係因馬達的極(pole)通過頻率而起而變動的邊帶波。The Lpole parameter is a parameter indicating the state of the rotor of the target device 30. The Lpole parameter is the magnitude of the peak value of the sideband wave of the current spectrum in a frequency position separated by a predetermined frequency portion among the frequency spectrum obtained by converting the current signal into a frequency range. The sideband wave related to the Lpole parameter is a sideband wave that varies depending on the passing frequency of the pole of the motor.

Lshaft參數係表示對象裝置30的轉子及輔機的失準的狀態的參數。Lshaft參數係在將電流訊號進行頻率範圍轉換所得的頻率頻譜之中,以電流頻譜峰值為中心,藉由以預定頻率份分離的頻率位置中的電流頻譜的邊帶波的峰值的大小來求出。有關Lshaft參數的邊帶波(sideband wave)係因馬達的實際旋轉頻率而起而變動的邊帶波。The Lshaft parameter is a parameter indicating the state of misalignment of the rotor and auxiliary machinery of the target device 30. The Lshaft parameter is obtained from the frequency spectrum obtained by converting the current signal into a frequency range, centered on the peak of the current spectrum, and obtained by the magnitude of the peak value of the sideband wave of the current spectrum in the frequency position separated by a predetermined frequency . The sideband wave related to the Lshaft parameter is a sideband wave that varies depending on the actual rotation frequency of the motor.

Irms參數係用以監視對象裝置30的旋轉機械負荷及狀態變動的參數。Irms參數係可藉由將各取樣時序中的電流值的平方和除以取樣時序數,求出其平方根而得的電流實效值。The Irms parameter is a parameter for monitoring the rotating machine load and state change of the target device 30. The Irms parameter is the current effective value obtained by dividing the square root of the current value in each sampling timing by the number of sampling timings.

IHD參數係電流訊號的最大高諧波成分與電源頻率成分的比率。IHD參數係可由電流訊號抽出高諧波成分,且將高諧波成分的預先設定的次數內的最大值除以電源頻率實效值而得。   THD參數係電流訊號的全高諧波成分與電源頻率成分的比率。THD參數係可由電流訊號抽出高諧波成分,將在預先設定的次數內的各高諧波成分的平方和的平方根除以電流訊號的電源頻率實效值而得。IHD參數及THD參數均為表示三相交流電源40的品質的參數。The IHD parameter is the ratio of the maximum harmonic component of the current signal to the frequency component of the power supply. The IHD parameter is obtained by extracting the high-harmonic component from the current signal, and dividing the maximum value within the preset number of times of the high-harmonic component by the effective value of the power frequency.  THD parameter is the ratio of the full harmonic component of the current signal to the power frequency component. The THD parameter can be obtained by extracting high harmonic components from the current signal, and dividing the square root of the sum of squares of each high harmonic component within a preset number by the effective value of the power frequency of the current signal. Both the IHD parameter and the THD parameter are parameters indicating the quality of the three-phase AC power supply 40.

Lx參數係表示對象裝置30的輔機的狀態的參數。Lx參數係在將電流訊號進行頻率範圍轉換所得之頻率頻譜之中以電流頻譜峰值為中心,以預定頻率份分離的頻率位置中的電流頻譜的邊帶波的峰值的大小。有關Lx參數的邊帶波係因泵或送風機的葉片通過頻率而起而變動的邊帶波、因齒輪裝置的咬合頻率而起而變動的邊帶波、因傳動皮帶的旋轉頻率而起而變動的邊帶波、或起因於因轉子導條的滑差頻率而起而變動的邊帶波而變動的邊帶波。   將因泵或送風機的葉片通過頻率而起而變動的邊帶波的峰值的大小所示之Lx參數,稱為Lbp參數。因齒輪裝置的咬合頻率而起而變動的邊帶波的峰值的大小所示之Lx參數,稱為Lgz參數。因傳動皮帶的旋轉頻率而起而變動的邊帶波的峰值的大小所示之Lx參數,稱為Lbr參數。及起因於因轉子導條的滑差頻率而起而變動的邊帶波的任1個而變動的邊帶波的峰值的大小所示之Lx參數,稱為Lrs參數。泵、送風機、齒輪裝置、傳動皮帶、轉子導條係對象裝置30的輔機之一例。The Lx parameter is a parameter indicating the state of the auxiliary device of the target device 30. The Lx parameter is the magnitude of the peak value of the sideband wave of the current spectrum in a frequency position separated by a predetermined frequency portion in the frequency spectrum obtained by converting the current signal into a frequency range. The sideband wave related to the Lx parameter is a sideband wave that varies depending on the passing frequency of the blades of the pump or blower, a sideband wave that varies depending on the bite frequency of the gear device, and a frequency that varies depending on the rotation frequency of the transmission belt Of sideband waves, or sideband waves that vary due to sideband waves that vary due to the slip frequency of the rotor bar.   The Lx parameter indicated by the magnitude of the peak value of the sideband wave fluctuating due to the passage frequency of the blade of the pump or blower is called the Lbp parameter. The Lx parameter indicated by the magnitude of the peak value of the sideband wave that varies depending on the bite frequency of the gear device is called the Lgz parameter. The Lx parameter indicated by the magnitude of the peak value of the sideband wave that varies depending on the rotation frequency of the transmission belt is called the Lbr parameter. And the Lx parameter shown by the magnitude of the peak value of the sideband wave fluctuating due to any one of the sideband waves fluctuating due to the slip frequency of the rotor bar is called the Lrs parameter. An example of an auxiliary machine of the pump, blower, gear device, transmission belt, and rotor bar system object device 30.

Iub參數係表示電源品質或馬達的定子及變流器的劣化狀況的參數。Iub參數係可藉由將3相的電流訊號的電流實效值之中的最大值與最小值的差,除以該最大值與最小值的和來求出。亦即,Iub參數係表示電流訊號的三相電流平衡的參數。The Iub parameter is a parameter indicating the power supply quality or the deterioration state of the motor stator and converter. The Iub parameter can be obtained by dividing the difference between the maximum value and the minimum value among the current effective values of the three-phase current signal by the sum of the maximum value and the minimum value. That is, the Iub parameter is a parameter indicating the three-phase current balance of the current signal.

KI參數係若轉子的狀態惡化,即增加,Lpole參數係若轉子的狀態惡化,則減少。亦即,KI參數與Lpole參數係針對對象裝置30的轉子的狀態,具有相關關係。   KI參數係若馬達的軸系的失衡狀態惡化,即增加,Lshaft參數及各種Lx參數係若馬達的軸系的失衡狀態惡化,則減少。亦即,KI參數與Lshaft參數與各種Lx參數係針對對象裝置30的馬達的軸系的失衡狀態,具有相關關係。此外,KI參數係若馬達的軸系的失準的狀態惡化,即增加,Lshaft參數係若馬達的軸系的失準的狀態惡化,則減少。亦即,KI參數與Lshaft參數係針對對象裝置30的馬達的軸系的失準的狀態,具有相關關係。   KI參數與Irms參數係若負荷變動的狀態均惡化,即增加。亦即,KI參數與Irms參數係針對對象裝置30的負荷變動的狀態,具有相關關係。   KI參數與THD參數與IHD參數與Iub參數係若馬達的定子的狀態、或電源品質均惡化,即增加。亦即,KI參數與THD參數與IHD參數與Iub參數係針對對象裝置30的定子的狀態或電源品質,具有相關關係。   Lpole參數及Lshaft參數係若馬達的狀態均惡化,即減少。亦即,Lpole參數與Lshaft參數係針對對象裝置30的轉子的狀態,具有相關關係。The KI parameter is increased if the state of the rotor deteriorates, and the Lpole parameter is decreased if the state of the rotor deteriorates. That is, the KI parameter and the Lpole parameter are related to the state of the rotor of the target device 30. The KI parameter is increased if the unbalanced state of the shaft system of the motor deteriorates, that is, the Lshaft parameter and various Lx parameters are decreased when the unbalanced state of the motor shaft system is deteriorated. That is, the KI parameter, the Lshaft parameter, and various Lx parameters are related to the unbalanced state of the shaft system of the motor of the target device 30. In addition, the KI parameter is increased if the misalignment state of the motor shaft system is deteriorated, that is, the Lshaft parameter is decreased when the misalignment state of the motor shaft system is deteriorated. That is, the KI parameter and the Lshaft parameter are related to the state of misalignment of the shaft system of the motor of the target device 30.   KI parameter and Irms parameter are increased if the state of load fluctuations deteriorates. In other words, the KI parameter and the Irms parameter are related to the state of the load fluctuation of the target device 30.   KI parameters and THD parameters and IHD parameters and Iub parameters are increased if the state of the motor stator or the power supply quality is deteriorated. That is, the KI parameter, THD parameter, IHD parameter, and Iub parameter are related to the state or power quality of the stator of the target device 30.  Lpole parameter and Lshaft parameter are reduced if the state of the motor is deteriorated. That is, the Lpole parameter and the Lshaft parameter are related to the state of the rotor of the target device 30.

圖3係顯示第1實施形態之參數記憶部所記憶的資訊之例的圖。參數記憶部13係如圖3所示,按每個有關一定周期(例如每半天或1天)的時序亦即測定時刻,將該測定時刻、KI參數、Lpole參數、Lshaft參數、Irms參數、THD參數、IHD參數、Lx參數、及Iub參數建立關連來進行記憶。FIG. 3 is a diagram showing an example of information stored in the parameter storage unit of the first embodiment. As shown in FIG. 3, the parameter memory unit 13 measures the measurement time, the KI parameter, the Lpole parameter, the Lshaft parameter, the Irms parameter, and the THD for each time period related to a certain period (for example, every half day or one day), that is, the measurement time. The parameters, IHD parameters, Lx parameters, and Iub parameters are related to memory.

圖4係顯示第1實施形態之臨限值記憶部所記憶的資訊之例的圖。   臨限值記憶部14係如圖4所示,針對KI參數、Lpole參數、Lshaft參數、Irms參數、THD參數、IHD參數、Lx參數、及Iub參數的各個,記憶成為正常狀態的值的範圍、成為注意狀態的值的範圍、及成為異常狀態的值的範圍。在此,將成為正常狀態的值的範圍與成為注意狀態的值的範圍作區隔的臨限值係第1臨限值,將成為注意狀態的值的範圍與成為異常狀態的值的範圍作區隔的臨限值係第2臨限值。亦即,記憶成為正常狀態的值的範圍、成為注意狀態的值的範圍、及成為異常狀態的值的範圍,係與記憶第1臨限值及第2臨限值為等效。FIG. 4 is a diagram showing an example of information stored in the threshold storage unit of the first embodiment. As shown in FIG. 4, the threshold memory unit 14 memorizes the range of values in the normal state for each of the KI parameter, Lpole parameter, Lshaft parameter, Irms parameter, THD parameter, IHD parameter, Lx parameter, and Iub parameter, The range of values in the attention state and the range of values in the abnormal state. Here, the threshold between the range of the value in the normal state and the range of the value in the attention state is the first threshold, and the range of the value in the attention state and the range of the value in the abnormal state are The threshold of the segmentation is the second threshold. That is, the range of the value in the normal state, the range of the value in the attention state, and the range of the value in the abnormal state are equivalent to the memory of the first threshold and the second threshold.

在第1實施形態中,關於各電流參數之成為正常狀態的值的範圍、成為注意狀態的值的範圍、及成為異常狀態的值的範圍係如以下所示。其中,以下所示範圍僅為一例,關於其他實施形態,並非侷限於此。In the first embodiment, the range of the value of each current parameter in the normal state, the range of the value in the attention state, and the range of the value in the abnormal state are as follows. However, the ranges shown below are only examples, and other embodiments are not limited thereto.

成為正常狀態的KI參數的值的範圍係未達1.0。成為注意狀態的KI參數的值的範圍係1.0以上且未達1.5。成為異常狀態的KI參數的值的範圍係1.5以上。亦即,有關KI參數的第1臨限值係1.0,有關KI參數的第2臨限值係1.5。The range of the value of the KI parameter in the normal state is less than 1.0. The value range of the KI parameter in the attention state is 1.0 or more and less than 1.5. The range of the value of the KI parameter in the abnormal state is 1.5 or more. That is, the first threshold value for the KI parameter is 1.0, and the second threshold value for the KI parameter is 1.5.

成為正常狀態的Lpole參數的值的範圍係超過50dB。成為注意狀態的Lpole參數的值的範圍係超過40dB且50dB以下。成為異常狀態的Lpole參數的值的範圍係40dB以下。亦即,有關Lpole參數的第1臨限值係50dB,有關Lpole參數的第2臨限值係40dB。The value range of the Lpole parameter in the normal state exceeds 50 dB. The range of the value of the Lpole parameter in the attention state exceeds 40 dB to 50 dB or less. The range of the value of the Lpole parameter in the abnormal state is 40 dB or less. That is, the first threshold value related to the Lpole parameter is 50 dB, and the second threshold value related to the Lpole parameter is 40 dB.

成為正常狀態的Lshaft參數的值的範圍係超過50dB。成為注意狀態的Lshaft參數的值的範圍係超過40dB且50dB以下。成為異常狀態的Lshaft參數的值的範圍係40dB以下。亦即,有關Lshaft參數的第1臨限值係50dB,有關Lshaft參數的第2臨限值係40dB。The range of the value of the Lshaft parameter in the normal state exceeds 50 dB. The range of the value of the Lshaft parameter in the attention state exceeds 40 dB and 50 dB or less. The range of the value of the Lshaft parameter in the abnormal state is 40 dB or less. That is, the first threshold value related to the Lshaft parameter is 50 dB, and the second threshold value related to the Lshaft parameter is 40 dB.

成為正常狀態的Irms參數的值的範圍係未達變動±10%。成為注意狀態的Irms參數的值的範圍係變動±10%以上且未達變動±20%。成為異常狀態的Irms參數的值的範圍係變動±20%以上。亦即,有關Irms參數的第1臨限值係變動±10%,有關Irms參數的第2臨限值係變動±20%。The range of the Irms parameter in the normal state does not vary by ±10%. The range of the value of the Irms parameter in the attention state varies by ±10% or more and does not reach ±20%. The range of the Irms parameter in the abnormal state varies by more than ±20%. That is, the first threshold related to Irms parameters varies by ±10%, and the second threshold related to Irms parameters varies by ±20%.

成為正常狀態的THD參數的值的範圍係未達5%。成為注意狀態的THD參數的值的範圍係5%以上且未達10%。成為異常狀態的THD參數的值的範圍係10%以上。亦即,有關THD參數的第1臨限值係5%,有關THD參數的第2臨限值係10%。The range of the value of the THD parameter in the normal state is less than 5%. The value range of the THD parameter in the attention state is 5% or more and less than 10%. The range of the value of the THD parameter in the abnormal state is 10% or more. That is, the first threshold for THD parameters is 5%, and the second threshold for THD parameters is 10%.

成為正常狀態的IHD參數的值的範圍係未達3%。成為注意狀態的IHD參數的值的範圍係3%以上且未達5%。成為異常狀態的IHD參數的值的範圍係5%以上。亦即,有關IHD參數的第1臨限值係3%,有關IHD參數的第2臨限值係5%。The range of the value of the IHD parameter in the normal state is less than 3%. The range of the value of the IHD parameter in the attention state is 3% or more and less than 5%. The range of the value of the IHD parameter in the abnormal state is 5% or more. That is, the first threshold for IHD parameters is 3%, and the second threshold for IHD parameters is 5%.

成為正常狀態的Lx參數的值的範圍係超過50dB。成為注意狀態的Lx參數的值的範圍係超過40dB且50dB以下。成為異常狀態的Lx參數的值的範圍係40dB以下。亦即,有關Lx參數的第1臨限值係50dB,有關Lx參數的第2臨限值係40dB。The range of the value of the Lx parameter in the normal state exceeds 50 dB. The range of the value of the Lx parameter in the attention state exceeds 40 dB to 50 dB or less. The range of the value of the Lx parameter in the abnormal state is 40 dB or less. That is, the first threshold value related to the Lx parameter is 50 dB, and the second threshold value related to the Lx parameter is 40 dB.

成為正常狀態的Iub參數的值的範圍係未達3%。成為注意狀態的Iub參數的值的範圍係3%以上且未達5%。成為異常狀態的Iub參數的值的範圍係5%以上。亦即,有關Iub參數的第1臨限值係3%,有關Iub參數的第2臨限值係5%。The range of the value of the Iub parameter in the normal state is less than 3%. The range of the value of the Iub parameter in the attention state is 3% or more and less than 5%. The range of the value of the Iub parameter in the abnormal state is 5% or more. That is, the first threshold value related to the Iub parameter is 3%, and the second threshold value related to the Iub parameter is 5%.

在此,說明第1實施形態之狀態分析裝置10的動作。   圖5係顯示藉由第1實施形態之狀態分析裝置所為之電流參數算出處理的流程圖。   狀態分析裝置10係按每個有關一定周期的時序,執行電流參數算出處理。狀態分析裝置10的電流取得部11係由箝位電流計60取得電流訊號(步驟S1)。其中電流取得部11係按每個取樣時序取得電流訊號,因此電流取得部11所取得的電流訊號係表示一定期間中的電流大小的變化。接著,參數算出部12係將電流訊號進行頻率範圍轉換,且生成頻率範圍波形(步驟S2)。以頻率範圍轉換的手法而言,列舉FFT。   參數算出部12係根據在步驟S1中所取得的電流訊號、與在步驟S2中所生成的頻率範圍波形,算出電流參數(步驟S3)。參數算出部12係將所算出的電流參數,與現在時刻建立關連而記錄在參數記憶部13(步驟S4)。   狀態分析裝置10係按每個有關一定周期的時序,執行上述電流參數算出處理,藉此可在參數記憶部13記錄電流參數的時間序列。Here, the operation of the state analysis device 10 of the first embodiment will be described. FIG. 5 is a flowchart showing the current parameter calculation process by the state analysis device of the first embodiment. The state analysis device 10 executes the current parameter calculation process at every timing of a certain period. The current acquisition unit 11 of the state analysis device 10 acquires the current signal from the clamp ammeter 60 (step S1). The current acquisition unit 11 acquires the current signal at each sampling timing. Therefore, the current signal acquired by the current acquisition unit 11 represents a change in the magnitude of the current in a certain period. Next, the parameter calculation unit 12 converts the frequency range of the current signal and generates a frequency range waveform (step S2). In terms of frequency range conversion techniques, FFT is listed. The parameter calculation unit 12 calculates the current parameter based on the current signal acquired in step S1 and the frequency range waveform generated in step S2 (step S3). The parameter calculation unit 12 correlates the calculated current parameter with the current time and records it in the parameter storage unit 13 (step S4). The state analysis device 10 executes the above-mentioned current parameter calculation process at every timing of a certain period, whereby the time series of the current parameter can be recorded in the parameter storage unit 13.

圖6係顯示藉由第1實施形態之狀態分析裝置所為之電流參數顯示處理的流程圖。   狀態分析裝置10係若藉由利用者的操作,進行電流參數的顯示指示時,受理顯示對象的電流參數的組的輸入(步驟S11)。電流參數的組的輸入係藉由從在狀態分析裝置10預先設定的彼此具有相關關係的參數對(例如,Lshaft參數與Lpole參數的成對、THD參數與IHD參數的成對、KI參數與Lx參數的成對等)的清單之中,受理藉由利用者所為之選擇來進行。在其他實施形態中,電流參數的組的輸入亦可藉由利用利用者所為之任意2個參數的輸入來進行。6 is a flowchart showing the current parameter display processing by the state analysis device of the first embodiment. The state analysis device 10 accepts the input of the set of current parameters of the display target when the user displays the current parameter by the user's operation (step S11). The input of the group of current parameters is obtained from the parameter pairs that are related to each other in advance and set in the state analysis device 10 (for example, the pair of the Lshaft parameter and the Lpole parameter, the pair of the THD parameter and the IHD parameter, the KI parameter and the Lx In the list of parameter pairs, etc., the acceptance is performed by the user's choice. In other embodiments, the input of the set of current parameters can also be performed by using any two parameters input by the user.

接著,狀態分析裝置10的圖表生成部15係描繪以有關所被選擇出的成對的各電流參數為軸G1的座標空間(步驟S12)。亦即,圖表生成部15係描繪表示形成成對的電流參數之呈正交的軸G1。在本實施形態中「描繪」係指在假想空間(假想平面)上配置圖形。接著,圖表生成部15係讀出與有關由臨限值記憶部14被選擇出的成對的各電流參數建立關連的第1臨限值及第2臨限值,描繪表示第1臨限值的區分線G2(第1區分線)及表示第2臨限值的區分線G2(第2區分線)(步驟S13)。表示有關一電流參數的臨限值的區分線G2係與表示該一電流參數的軸G1呈平行的線。接著,圖表生成部15係將表示由參數記憶部13所被選擇出之有關成對的各電流參數的值且為最後記錄者(變化後的值)的標繪G3描繪在座標空間上(步驟S14)。Next, the graph generation unit 15 of the state analysis device 10 draws a coordinate space with the selected pair of current parameters as the axis G1 (step S12). That is, the graph generating unit 15 plots the orthogonal axis G1 indicating the current parameters forming the pair. In the present embodiment, "drawing" means arranging graphics on a virtual space (virtual plane). Next, the graph generation unit 15 reads out the first threshold value and the second threshold value associated with each pair of current parameters selected by the threshold value memory unit 14, and depicts the first threshold value G2 (first division line) and G2 (second division line) indicating the second threshold value (step S13). The division line G2 indicating the threshold value related to a current parameter is a line parallel to the axis G1 indicating the current parameter. Next, the graph generation unit 15 draws a plot G3 representing the value of each pair of current parameters selected by the parameter storage unit 13 and being the last recorded person (the changed value) on the coordinate space (step S14).

接著,圖表生成部15係在座標空間上描繪:由表示由參數記憶部13所選擇出之有關成對的各電流參數的值且為倒數第2個被記錄者(變化前的值)的座標,朝表示變化後的值的座標延伸的箭號G4(步驟S15)。此時,和變化前的值建立關連的測定時刻、與和變化後的值建立關連的測定時刻的差係與有關一定周期的時間相等。此外,箭號G4係變化前的值與變化後的值的差愈大則愈長。亦即,箭號G4係電流參數的變化量愈大則愈長。Next, the graph generating unit 15 draws on the coordinate space: the coordinates indicating the value of each pair of current parameters selected by the parameter memory unit 13 and being the penultimate recordee (value before change) , An arrow G4 extending toward the coordinate indicating the changed value (step S15). At this time, the difference between the measurement time related to the value before the change and the measurement time related to the value after the change is equal to the time for a certain period. In addition, the greater the difference between the value before the arrow G4 and the value after the change, the longer it is. That is, the greater the variation of the current parameters of the arrow G4 series, the longer it will be.

接著,遷移偵測部16係根據臨限值記憶部14所記憶的第1臨限值及第2臨限值,判定有關所被選擇出的成對的電流參數的至少1個值是否跨越第1臨限值或第2臨限值而變化(步驟S16)。若電流參數的值跨越第1臨限值或第2臨限值而變化(步驟S16:YES),圖表生成部15係描繪預定的訊息(例如「對象裝置30的狀態已變化成注意狀態」等)(步驟S17)。其中該訊息係持續顯示至由電流參數的值跨越臨限值的時序經過預定時間為止。其中,在其他實施形態中,亦可僅在電流參數的值跨越第1臨限值或第2臨限值而以狀態惡化的方向變化時,描繪預定的訊息。此外,在其他實施形態中,亦可使標繪G3的顯示形態不同,來取代預定訊息的描繪。以標繪G3的顯示形態之例而言,列舉:標繪G3的顏色、標繪G3的大小、標繪G3的亮滅的有無等。   其中,若電流參數的值未跨越第1臨限值及第2臨限值(步驟S16:NO),圖表生成部15並不進行預定訊息的描繪。Next, the migration detection unit 16 determines whether at least one value of the selected pair of current parameters exceeds the first threshold value according to the first threshold value and the second threshold value stored in the threshold value memory unit 14 The first threshold or the second threshold changes (step S16). If the value of the current parameter changes across the first threshold or the second threshold (step S16: YES), the graph generation unit 15 draws a predetermined message (for example, "the state of the target device 30 has changed to the attention state", etc. ) (Step S17). The message is continuously displayed until the predetermined time elapses when the current parameter value crosses the threshold. However, in other embodiments, a predetermined message may be drawn only when the value of the current parameter crosses the first threshold or the second threshold and changes in the direction of deterioration of the state. In addition, in other embodiments, the display form of the plot G3 may be different, instead of drawing the predetermined message. Taking the display form of plotting G3 as an example, the color of plotting G3, the size of plotting G3, and the presence or absence of plotting G3 are listed. If the value of the current parameter does not exceed the first threshold and the second threshold (step S16: NO), the graph generating unit 15 does not draw the predetermined message.

接著,顯示控制部17係根據圖表生成部15所描繪的圖形,生成顯示資訊,且將該顯示資訊輸出至顯示裝置20(步驟S18)。藉此,顯示裝置20係顯示配置有:表示電流參數的臨限值的區分線G2、表示一對電流參數的值的標繪G3、及表示在不同時序被算出的電流參數的值的變化量的箭號G4的圖表。Next, the display control unit 17 generates display information based on the graph drawn by the graph generation unit 15 and outputs the display information to the display device 20 (step S18). Thereby, the display device 20 displays the division line G2 indicating the threshold value of the current parameter, the plot G3 indicating the value of the pair of current parameters, and the amount of change indicating the value of the current parameter calculated at different timings Of the arrow G4.

圖7係顯示表示KI參數與Lpole參數的關係的圖表之例的圖。   若在步驟S11中利用者選擇KI參數與Lpole參數的成對,在顯示裝置20係顯示如圖7所示之圖表。藉由圖7所示之圖表,可根據KI參數與Lpole參數,判斷對象裝置30的狀態。KI參數與Lpole參數係針對對象裝置30的轉子的狀態,具有相關關係。因此,利用者係可藉由圖7所示之圖表,輕易確認對象裝置30的轉子的狀態。具體而言,KI參數係若轉子的狀態惡化,即增加,Lpole參數係若轉子的狀態惡化,則減少。亦即,若轉子的狀態惡化,通常標繪G3的位置朝向右下方向移動。另一方面,若標繪G3的移動方向非為右下方向,可判斷出發生與平常的轉子的劣化不同的事象。若利用者選擇KI參數與Lshaft參數的成對,在利用者選擇出KI參數與Lx參數的成對的情形下,亦在顯示裝置20顯示與圖7類似的圖表。7 is a diagram showing an example of a graph showing the relationship between KI parameters and Lpole parameters.  If the user selects a pair of the KI parameter and the Lpole parameter in step S11, the graph shown in FIG. 7 is displayed on the display device 20. With the graph shown in FIG. 7, the state of the target device 30 can be determined based on the KI parameter and the Lpole parameter. The KI parameter and the Lpole parameter are related to the state of the rotor of the target device 30. Therefore, the user can easily confirm the state of the rotor of the target device 30 using the graph shown in FIG. 7. Specifically, the KI parameter is increased if the state of the rotor is deteriorated, and the Lpole parameter is decreased when the state of the rotor is deteriorated. That is, if the state of the rotor deteriorates, the position of the plotted G3 usually moves toward the lower right direction. On the other hand, if the moving direction of the plotted G3 is not the lower right direction, it can be judged that a phenomenon different from the deterioration of the normal rotor occurs. If the user selects the pair of the KI parameter and the Lshaft parameter, in the case where the user selects the pair of the KI parameter and the Lx parameter, a graph similar to FIG. 7 is also displayed on the display device 20.

圖8係顯示表示IHD參數與THD參數的關係的圖表之例的圖。   若在步驟S11中利用者選擇IHD參數與THD參數的成對,在顯示裝置20係顯示如圖8所示之圖表。藉由圖8所示之圖表,可根據IHD參數與THD參數,判斷對象裝置30的狀態。IHD參數與THD參數係針對對象裝置30的馬達的定子的狀態或電源品質,具有相關關係。因此,利用者係可藉由圖8所示之圖表,輕易確認對象裝置30的馬達的定子的狀態或電源品質。具體而言,IHD參數及THD參數係若馬達的定子的狀態或電源品質惡化即增加。亦即,若馬達的定子的狀態或電源品質惡化,通常標繪G3的位置朝右上方向移動。另一方面,若標繪G3的移動方向非為右上方向,可判斷出發生與平常的馬達的定子的狀態或電源品質的劣化不同的事象。8 is a diagram showing an example of a graph showing the relationship between IHD parameters and THD parameters.  If the user selects the pair of the IHD parameter and the THD parameter in step S11, the graph shown in FIG. 8 is displayed on the display device 20. With the graph shown in FIG. 8, the state of the target device 30 can be determined based on the IHD parameter and the THD parameter. The IHD parameter and the THD parameter are related to the state or power quality of the motor stator of the target device 30. Therefore, the user can easily confirm the state of the stator of the motor of the target device 30 or the power supply quality by the graph shown in FIG. 8. Specifically, the IHD parameter and the THD parameter increase if the state of the motor stator or the power supply quality deteriorates. That is, if the state of the stator of the motor or the quality of the power supply deteriorates, the position of the plotted G3 is usually moved to the upper right direction. On the other hand, if the moving direction of the plot G3 is not the upper right direction, it can be judged that a phenomenon different from the deterioration of the state of the stator of the motor or the deterioration of the power supply quality occurs.

圖9係顯示表示Lpole參數與Lshaft參數的關係的圖表之例的圖。   若在步驟S11中利用者選擇Lpole參數與Lshaft參數的成對,在顯示裝置20係顯示如圖9所示之圖表。藉由圖9所示之圖表,可根據Lpole參數與Lshaft,判斷對象裝置30的狀態。Lpole參數與Lshaft參數係針對對象裝置30的轉子的狀態,具有相關關係。因此,利用者係可藉由圖9所示之圖表,輕易確認對象裝置30的轉子的狀態。具體而言,Lpole參數及Lshaft參數係若馬達的狀態惡化,即減少。在此,Lpole參數及Lshaft參數係分別依馬達不同部位的劣化而變化的參數。因此,利用者係可藉由觀察標繪G3的移動方向的傾斜,來推測在馬達中發生異常的部位。9 is a diagram showing an example of a graph showing the relationship between the Lpole parameter and the Lshaft parameter.  If the user selects the pair of the Lpole parameter and the Lshaft parameter in step S11, the graph shown in FIG. 9 is displayed on the display device 20. With the graph shown in FIG. 9, the state of the target device 30 can be determined based on the Lpole parameter and Lshaft. The Lpole parameter and the Lshaft parameter are related to the state of the rotor of the target device 30 and have a correlation. Therefore, the user can easily confirm the state of the rotor of the target device 30 using the graph shown in FIG. 9. Specifically, the Lpole parameter and Lshaft parameter decrease if the state of the motor deteriorates. Here, the Lpole parameter and the Lshaft parameter are parameters that vary according to the deterioration of different parts of the motor. Therefore, the user can estimate the location of the abnormality in the motor by observing the tilt of the movement direction of the plotted G3.

其中,若欲確認各電流參數所示之對象裝置30的狀態,利用者若確認有關KI參數與Lpole參數的成對的圖表、有關KI參數與Lshaft參數的成對的圖表、有關KI參數與Lx參數的成對的圖表、及有關IHD參數與THD參數的成對的圖表即可。或者,利用者係若確認有關Lpole參數與Lshaft參數的成對的圖表、有關KI參數與Lx參數的成對的圖表、及有關IHD參數與THD參數的成對的圖表即可。Among them, if you want to confirm the state of the target device 30 shown by each current parameter, if the user confirms the paired graph about the KI parameter and the Lpole parameter, the paired graph about the KI parameter and the Lshaft parameter, and the KI parameter and Lx The paired graphs of parameters and the paired graphs of IHD parameters and THD parameters are sufficient. Alternatively, the user may confirm the paired graph related to the Lpole parameter and Lshaft parameter, the paired graph related to the KI parameter and Lx parameter, and the paired graph related to the IHD parameter and THD parameter.

如上所示,藉由第1實施形態,狀態分析裝置10係生成在以彼此具有相關關係的複數電流參數的各個為軸的座標空間,配置有:表示臨限值的區分線G2、表示電流參數的值的標繪G3、及表示電流參數的值的變化量的箭號G4的顯示資訊。藉此,利用者即使不熟練頻率範圍圖表的讀取,亦可辨識對象裝置30的狀態是如何變化。此外,如上所述,藉由第1實施形態,利用者亦可辨識與個別的電流參數建立關連的狀態以外的狀態。其中,以其他實施形態而言,亦可以標繪G3以外的圖形來表示電流參數的值。例如,第1實施形態的箭號G4係表示電流參數的變化量的圖形,但是該箭頭係表示有關一時序的電流參數的值,因此該箭號G4亦可謂為表示電流參數的值的圖形。此外,以其他實施形態而言,亦可以箭號G4以外的圖形來表示電流參數的變化量。例如,亦可將電流參數的變化量的大小進行圖表顯示,亦可藉由標繪G3的顏色來表示。As described above, according to the first embodiment, the state analysis device 10 generates a coordinate space around each of the complex current parameters having a correlation with each other, and is provided with: a division line G2 indicating the threshold value and indicating the current parameter The display information of the plot G3 of the value and the arrow G4 indicating the amount of change in the value of the current parameter. This allows the user to recognize how the state of the target device 30 has changed even if he is not skilled in reading the frequency range chart. In addition, as described above, according to the first embodiment, the user can recognize a state other than the state associated with the individual current parameter. In other embodiments, a graph other than G3 may be plotted to represent the value of the current parameter. For example, the arrow G4 in the first embodiment shows a graph of the amount of change in the current parameter. However, the arrow shows the value of the current parameter in a time series. Therefore, the arrow G4 can also be said to be a graph showing the value of the current parameter. In addition, in other embodiments, the amount of change in the current parameter may be represented by a graph other than the arrow G4. For example, the magnitude of the change in the current parameter can also be displayed graphically, or it can be represented by plotting the color of G3.

此外,藉由第1實施形態,狀態分析裝置10係若有關不同時序的複數參數的至少1個值跨越臨限值,生成包含預定訊息的顯示資訊。藉此,利用者係可迅速辨識對象裝置30的狀態已變化。其中,在其他實施形態中,狀態分析裝置10亦可在有關不同時序的複數參數的至少1個值跨越臨限值時、與未跨越臨限值時,使標繪G3的顯示形態不同。藉此亦與第1實施形態同樣地,利用者係可迅速辨識對象裝置30的狀態已變化。In addition, according to the first embodiment, the state analysis device 10 generates display information including a predetermined message if at least one value of the complex parameter at different timings crosses the threshold. In this way, the user can quickly recognize that the state of the target device 30 has changed. In other embodiments, the state analysis device 10 may make the display form of the plot G3 different when at least one value of the complex parameter at different timings crosses the threshold and when it does not cross the threshold. As a result, the user can quickly recognize that the state of the target device 30 has changed as in the first embodiment.

以上參照圖示,詳加說明一實施形態,惟具體構成並非侷限於上述者,可進行各種設計變更等。   例如,上述實施形態之狀態分析裝置10係使有關電流參數的成對的圖表顯示在顯示裝置20,但是並非侷限於此。例如,其他實施形態之狀態分析裝置10亦可使有關3個以上的電流參數的組的高次元圖表顯示在顯示裝置20。   此外,上述之實施形態之狀態分析裝置10係生成在以彼此具有相關關係的複數電流參數的各個為軸的座標空間,配置有表示臨限值的區分線G2、與表示電流參數的值的標繪G3的顯示資訊,但是並非侷限於此。例如,其他實施形態之狀態分析裝置10亦可生成表示有關一時刻的一電流參數的值、及其變化量的顯示資訊。即使為如上所示之實施形態,利用者亦可辨識對象裝置30的狀態如何變化。The above describes an embodiment in detail with reference to the drawings, but the specific configuration is not limited to the above, and various design changes and the like can be made.   For example, the state analysis device 10 of the above embodiment displays a pair of graphs related to current parameters on the display device 20, but it is not limited thereto. For example, the state analysis device 10 of another embodiment may display a high-dimensional graph of groups of three or more current parameters on the display device 20. In addition, the state analysis device 10 of the above-described embodiment generates a coordinate space around each of the complex current parameters having a correlation with each other, and a division line G2 indicating the threshold value and a standard indicating the value of the current parameter are arranged. Draw G3 display information, but not limited to this. For example, the state analysis device 10 of other embodiments may also generate display information indicating the value of a current parameter at a time and its variation. Even in the embodiment shown above, the user can recognize how the state of the target device 30 changes.

此外,上述之實施形態之狀態分析裝置10係藉由對與自身直接連接的顯示裝置20輸出顯示資訊來進行顯示控制,但是並非侷限於此。例如,其他實施形態之狀態分析裝置10亦可對不進行顯示控制而將顯示資訊記錄在記憶媒體者、或透過網路而相連接的其他顯示裝置20傳送顯示資訊。In addition, the state analysis device 10 of the above embodiment performs display control by outputting display information to the display device 20 directly connected to itself, but it is not limited to this. For example, the state analysis device 10 of other embodiments may record display information on a storage medium without performing display control, or transmit display information to other display devices 20 connected via a network.

此外,上述之實施形態之對象裝置30係馬達與輔機以同軸旋轉的旋轉機械系統,但是並非侷限於此。例如,其他實施形態之對象裝置30亦可為馬達與輔機透過齒輪裝置等機械系而相連接者。In addition, the target device 30 of the above-mentioned embodiment is a rotating machine system in which the motor and the auxiliary machine rotate coaxially, but it is not limited to this. For example, the target device 30 in other embodiments may be a motor and an auxiliary machine connected by a mechanical system such as a gear device.

此外,上述之實施形態之狀態分析裝置10係將對象裝置30的狀態分類成:正常狀態、異常狀態、注意狀態等3個區分,但是並非侷限於此。例如,其他實施形態之狀態分析裝置10亦可分類成正常狀態與異常狀態等2個區分,亦可分類成4個以上的區分。In addition, the state analysis device 10 of the above-mentioned embodiment classifies the state of the target device 30 into three divisions: normal state, abnormal state, and caution state, but it is not limited to this. For example, the state analysis device 10 of other embodiments may be classified into two divisions such as a normal state and an abnormal state, or may be classified into four or more divisions.

圖10係顯示至少1個實施形態之電腦的構成的概略區塊圖。   電腦90係具備有:CPU91、主記憶裝置92、輔助記憶裝置93、介面94。   上述之狀態分析裝置10係被構裝在電腦90。接著,上述之各處理部的動作係以程式的形式被記憶在輔助記憶裝置93。CPU91係由輔助記憶裝置93讀出程式而在主記憶裝置92展開,按照該程式,執行上述處理。此外,CPU91係按照程式,在主記憶裝置92確保對應上述之各記憶部的記憶區域。FIG. 10 is a schematic block diagram showing the configuration of a computer of at least one embodiment.   Computer 90 is equipped with: CPU91, main memory device 92, auxiliary memory device 93, interface 94.   The above-mentioned state analysis device 10 is built in the computer 90. Next, the operation of each processing unit described above is stored in the auxiliary memory device 93 in the form of a program. The CPU 91 reads the program from the auxiliary memory device 93 and develops it in the main memory device 92, and executes the above-mentioned processing according to the program. In addition, the CPU 91 secures the memory area corresponding to the above-mentioned memory sections in the main memory device 92 according to the program.

以輔助記憶裝置93之例而言,係列舉:HDD(Hard Disk Drive,硬碟驅動機)、SSD(Solid State Drive,固體狀態驅動機)、磁碟、光磁碟、CD-ROM (Compact Disc Read Only Memory,光碟唯讀記憶體)、DVD-ROM(Digital Versatile Disc Read Only Memory,數位影音光碟唯讀記憶體)、半導體記憶體等。輔助記憶裝置93亦可為與電腦90的匯流排直接連接的內部媒體,亦可為透過介面94或通訊線路而與電腦90相連接的外部媒體。此外,該程式藉由通訊線路而被配訊至電腦90時,亦可接收到配訊的電腦90將該程式在主記憶裝置92展開,來執行上述處理。在至少1個實施形態中,輔助記憶裝置93係非為暫時性之有形的記憶媒體。Taking the auxiliary memory device 93 as an example, the series includes: HDD (Hard Disk Drive), SSD (Solid State Drive), magnetic disk, optical disk, CD-ROM (Compact Disc Read Only Memory, CD-ROM (Digital Versatile Disc Read Only Memory), semiconductor memory, etc. The auxiliary memory device 93 may also be an internal medium directly connected to the bus of the computer 90, or an external medium connected to the computer 90 through the interface 94 or a communication line. In addition, when the program is dispatched to the computer 90 via the communication line, the computer 90 that can also receive the dispatch deploys the program in the main memory device 92 to perform the above-mentioned processing. In at least one embodiment, the auxiliary memory device 93 is a non-transitory tangible memory medium.

此外,該程式亦可為用以實現前述功能的一部分者。此外,該程式亦可為以與已被記憶在輔助記憶裝置93的其他程式的組合來實現前述功能者,所謂差分檔案(差分程式)。 [產業上可利用性]In addition, the program can also be used to realize the aforementioned functions. In addition, the program may be a so-called differential file (differential program) that realizes the aforementioned function in combination with other programs that have been stored in the auxiliary memory device 93. [Industry availability]

藉由本案之狀態分析裝置、顯示方法、及程式,可輕易識別對象裝置的狀態及狀態的變化。The state analysis device, display method, and program of the present case can easily identify the state and change of the state of the target device.

1‧‧‧狀態分析系統10‧‧‧狀態分析裝置11‧‧‧電流取得部12‧‧‧參數算出部13‧‧‧參數記憶部14‧‧‧臨限值記憶部15‧‧‧圖表生成部16‧‧‧遷移偵測部17‧‧‧顯示控制部20‧‧‧顯示裝置30‧‧‧對象裝置40‧‧‧三相交流電源50‧‧‧電力線60‧‧‧箝位電流計90‧‧‧電腦91‧‧‧CPU92‧‧‧主記憶裝置93‧‧‧輔助記憶裝置94‧‧‧介面G1‧‧‧軸G2‧‧‧區分線G3‧‧‧標繪G4‧‧‧箭號1‧‧‧ State analysis system 10‧‧‧ State analysis device 11‧‧‧ current acquisition unit 12‧‧‧parameter calculation unit 13‧‧‧parameter memory unit 14‧‧‧threshold limit memory unit 15‧‧‧Graph generation Part 16‧‧‧ Migration detection part 17‧‧‧ Display control part 20‧‧‧ Display device 30‧‧‧Object device 40‧‧‧ Three-phase AC power supply 50‧‧‧Power line 60‧‧‧Clamp ammeter 90 ‧‧‧Computer 91‧‧‧CPU92‧‧‧Main memory device 93‧‧‧Auxiliary memory device 94‧‧‧‧Interface G1‧‧‧Axis G2‧‧‧Division line G3‧‧‧Drawing G4‧‧‧Arrow

圖1係顯示第1實施形態之狀態分析系統的構成的概略圖。   圖2係顯示第1實施形態之狀態分析裝置的構成的概略區塊圖。   圖3係顯示第1實施形態之參數記憶部所記憶的資訊之例的圖。   圖4係顯示第1實施形態之臨限值記憶部所記憶的資訊之例的圖。   圖5係顯示藉由第1實施形態之狀態分析裝置所為之電流參數算出處理的流程圖。   圖6係顯示藉由第1實施形態之狀態分析裝置所為之電流參數顯示處理的流程圖。   圖7係顯示表示KI參數與Lpole參數的關係的圖表之例的圖。   圖8係顯示表示IHD參數與THD參數的關係的圖表之例的圖。   圖9係顯示表示Lpole參數與Lshaft參數的關係的圖表之例的圖。   圖10係顯示至少1個實施形態之電腦的構成的概略區塊圖。FIG. 1 is a schematic diagram showing the configuration of a state analysis system according to the first embodiment. FIG. 2 is a schematic block diagram showing the configuration of the state analyzer of the first embodiment. FIG. 3 is a diagram showing an example of information stored in the parameter storage unit of the first embodiment. FIG. 4 is a diagram showing an example of information stored in the threshold storage unit of the first embodiment. FIG. 5 is a flowchart showing the current parameter calculation process by the state analysis device of the first embodiment. FIG. 6 is a flowchart showing the current parameter display processing by the state analysis device of the first embodiment. FIG. 7 is a diagram showing an example of a graph showing the relationship between KI parameters and Lpole parameters. FIG. 8 is a diagram showing an example of a graph showing the relationship between IHD parameters and THD parameters. FIG. 9 is a diagram showing an example of a graph showing the relationship between the Lpole parameter and the Lshaft parameter. FIG. 10 is a schematic block diagram showing the configuration of a computer of at least one embodiment.

G1‧‧‧軸 G1‧‧‧axis

G2‧‧‧區分線 G2‧‧‧Division Line

G3‧‧‧標繪 G3‧‧‧Plotting

G4‧‧‧箭號 G4‧‧‧Arrow

Claims (11)

一種狀態分析裝置,其係具備有:電流取得部,其係取得流至對象裝置的電流訊號;參數算出部,其係以有關一定周期的時序,根據前述電流訊號,算出依前述對象裝置的狀態變動且彼此具有相關關係的複數參數的值;及顯示資訊生成部,其係在以前述複數參數的各個為軸的座標空間,生成顯示資訊,該顯示資訊配置有:表示成為前述對象裝置的狀態的判斷基準的預先設定的臨限值的區分線;表示有關一時序的前述複數參數的值的第1圖形;及表示在不同時序被算出的前述複數參數的值的變化量的第2圖形。 A state analysis device includes: a current acquisition unit that acquires a current signal flowing to a target device; a parameter calculation unit that calculates the state of the target device based on the current signal at a timing related to a certain period The value of a complex parameter that varies and has a correlation with each other; and a display information generating unit that generates display information in a coordinate space with each of the complex parameter as an axis, and the display information is configured to indicate the state of the target device The division line of the predetermined threshold value of the judgment criterion of; the first graph showing the value of the complex parameter of a time series; and the second graph showing the change amount of the value of the complex parameter calculated at different times. 如申請專利範圍第1項之狀態分析裝置,其中,前述顯示資訊生成部係若有關不同時序的前述複數參數的至少1個值跨越前述臨限值,生成包含預定訊息的前述顯示資訊。 For example, in the state analysis device of claim 1, the display information generating unit generates the display information including a predetermined message if at least one value of the complex parameter at different timings crosses the threshold value. 如申請專利範圍第1項之狀態分析裝置,其中,前述顯示資訊生成部係在有關不同時序的前述複數參數的至少1個值跨越前述臨限值時、與未跨越前述臨限值時,使前述第1圖形的顯示形態不同。 For example, in the state analysis device according to item 1 of the patent application scope, the display information generating unit causes the at least one value of the complex parameter with different timings to cross the threshold and not to cross the threshold. The display form of the aforementioned first pattern is different. 如申請專利範圍第2項之狀態分析裝置,其中,前述顯示資訊生成部係在有關不同時序的前述複數參數的至少1個值跨越前述臨限值時、與未跨越前述臨限值時,使前述第1圖形的顯示形態不同。 As in the state analysis device of claim 2 of the patent application scope, the display information generating unit causes the at least one value of the complex parameter with different timing to cross the threshold and not to cross the threshold. The display form of the aforementioned first pattern is different. 如申請專利範圍第1項之狀態分析裝置,其中,前述對象裝置的狀態係包含:前述對象裝置為正常的正常狀態、前述對象裝置為異常的異常狀態、及前述對象裝置的狀態可能遷移至異常狀態的狀態亦即注意狀態,前述顯示資訊生成部係生成包含:區分前述正常狀態與前述注意狀態的第1區分線、及區分前述注意狀態與前述異常狀態的第2區分線,作為前述區分線的前述顯示資訊。 For example, in the state analysis device of claim 1, the state of the object device includes: the object device is in a normal normal state, the object device is in an abnormal abnormal state, and the state of the object device may transition to an abnormal state The state of the state is the attention state, and the display information generation unit generates a first division line that includes the normal state and the attention state, and a second division line that distinguishes the attention state and the abnormal state as the division line Of the aforementioned display information. 如申請專利範圍第2項之狀態分析裝置,其中,前述對象裝置的狀態係包含:前述對象裝置為正常的正常狀態、前述對象裝置為異常的異常狀態、及前述對象裝置的狀態可能遷移至異常狀態的狀態亦即注意狀態,前述顯示資訊生成部係生成包含:區分前述正常狀態與前述注意狀態的第1區分線、及區分前述注意狀態與前述異常狀態的第2區分線,作為前述區分線的前述顯示資訊。 A state analysis device as described in item 2 of the patent application scope, wherein the state of the object device includes: the object device is in a normal normal state, the object device is in an abnormal abnormal state, and the state of the object device may transition to an abnormal state The state of the state is the attention state. The display information generation unit generates a first division line that includes the normal state and the attention state, and a second division line that distinguishes the attention state and the abnormal state as the division line Of the aforementioned display information. 如申請專利範圍第3項之狀態分析裝置,其中,前述 對象裝置的狀態係包含:前述對象裝置為正常的正常狀態、前述對象裝置為異常的異常狀態、及前述對象裝置的狀態可能遷移至異常狀態的狀態亦即注意狀態,前述顯示資訊生成部係生成包含:區分前述正常狀態與前述注意狀態的第1區分線、及區分前述注意狀態與前述異常狀態的第2區分線,作為前述區分線的前述顯示資訊。 For example, the status analysis device of the third item of the patent application scope, in which the aforementioned The state of the object device includes: the object device is in a normal normal state, the object device is in an abnormal abnormal state, and the state in which the state of the object device may transition to an abnormal state, that is, an attention state, the display information generation unit generates It includes: a first division line that distinguishes the normal state from the attention state, and a second division line that distinguishes the attention state from the abnormal state, as the display information of the division line. 如申請專利範圍第4項之狀態分析裝置,其中,前述對象裝置的狀態係包含:前述對象裝置為正常的正常狀態、前述對象裝置為異常的異常狀態、及前述對象裝置的狀態可能遷移至異常狀態的狀態亦即注意狀態,前述顯示資訊生成部係生成包含:區分前述正常狀態與前述注意狀態的第1區分線、及區分前述注意狀態與前述異常狀態的第2區分線,作為前述區分線的前述顯示資訊。 For example, in the state analysis device of claim 4, the state of the object device includes: the object device is in a normal normal state, the object device is in an abnormal abnormal state, and the state of the object device may transition to an abnormal state The state of the state is the attention state. The display information generation unit generates a first division line that includes the normal state and the attention state, and a second division line that distinguishes the attention state and the abnormal state as the division line Of the aforementioned display information. 如申請專利範圍第1項至第8項中任一項之狀態分析裝置,其中,前述對象裝置係具有繞轉子旋轉的馬達、及連同前述轉子一起旋轉的輔機的裝置,前述複數參數係選自由表示前述對象裝置的全面狀態的參數、表示前述轉子的狀態的參數、表示前述轉子及前述輔機的失準狀態的參數、表示流至前述馬達的電流實效值的參數、表示有關前述電流的電源品質的參數、及表示 前述輔機的狀態的參數所成群組的複數參數。 A state analysis device according to any one of claims 1 to 8, wherein the target device is a device having a motor that rotates around a rotor and an auxiliary machine that rotates together with the rotor, and the complex parameter is selected Parameters that freely represent the overall state of the target device, parameters that represent the state of the rotor, parameters that represent the misalignment state of the rotor and the auxiliary machine, parameters that represent the actual value of the current flowing to the motor, and parameters that represent the current Power quality parameters and representation The aforementioned parameters of the state of the auxiliary machine are grouped into plural parameters. 一種顯示方法,其係包含:取得流至對象裝置的電流訊號;以有關一定周期的時序,根據前述電流訊號,算出依前述對象裝置的狀態變動且彼此具有相關關係的複數參數的值;算出在不同時序被算出的前述複數參數的值的變化量;及在以前述複數參數的各個為軸的座標空間,顯示顯示資訊,該顯示資訊配置有:表示成為前述對象裝置的狀態的判斷基準的臨限值的區分線;表示有關一時序的前述複數參數的值的第1圖形;及表示前述變化量的第2圖形。 A display method includes: obtaining a current signal flowing to a target device; calculating a value of a complex parameter that varies according to the state of the target device and has a correlation with each other based on the current signal at a timing related to a certain period; The amount of change in the value of the complex parameter calculated at different timings; and in the coordinate space around each of the complex parameter as an axis, display information is displayed, and the display information is arranged to indicate the presence of a criterion for determining the state of the target device The dividing line of the limit value; the first graph showing the value of the complex parameter of a time series; and the second graph showing the amount of change. 一種電腦程式產品,其係用以使電腦執行以下:取得流至對象裝置的電流訊號;以有關一定周期的時序,根據前述電流訊號,算出依前述對象裝置的狀態變動且彼此具有相關關係的複數參數的值;算出在不同時序被算出的前述複數參數的值的變化量;及在以前述複數參數的各個為軸的座標空間,生成顯示資訊,該顯示資訊配置有:表示成為前述對象裝置的狀態的判斷基準的臨限值的區分線;表示有關一時序的前述複 數參數的值的第1圖形;及表示前述變化量的第2圖形。 A computer program product, which is used to make a computer perform the following: obtain a current signal flowing to an object device; calculate a complex number that varies according to the state of the object device and has a correlation with each other according to the timing of a certain period according to the current signal The value of the parameter; calculating the amount of change in the value of the complex parameter calculated at different timings; and generating the display information in the coordinate space around each of the complex parameter as the axis, the display information is configured to indicate: The distinction line of the threshold value of the judgment criterion of the state; The first graph of the value of the numerical parameter; and the second graph showing the aforementioned variation.
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