TWI676559B - 具有基於色彩的線性三維擷取系統之材料施用器 - Google Patents

具有基於色彩的線性三維擷取系統之材料施用器 Download PDF

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Publication number
TWI676559B
TWI676559B TW103105674A TW103105674A TWI676559B TW I676559 B TWI676559 B TW I676559B TW 103105674 A TW103105674 A TW 103105674A TW 103105674 A TW103105674 A TW 103105674A TW I676559 B TWI676559 B TW I676559B
Authority
TW
Taiwan
Prior art keywords
imaging system
electronic substrate
circuit board
screen
spectrum
Prior art date
Application number
TW103105674A
Other languages
English (en)
Chinese (zh)
Other versions
TW201437043A (zh
Inventor
普斯大衛P
David P. Prince
Original Assignee
伊利諾工具工程公司
Illinois Tool Works Inc.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 伊利諾工具工程公司, Illinois Tool Works Inc. filed Critical 伊利諾工具工程公司
Publication of TW201437043A publication Critical patent/TW201437043A/zh
Application granted granted Critical
Publication of TWI676559B publication Critical patent/TWI676559B/zh

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Classifications

    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/22Secondary treatment of printed circuits
    • H05K3/225Correcting or repairing of printed circuits
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2509Color coding
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956Inspecting patterns on the surface of objects
    • G01N21/95684Patterns showing highly reflecting parts, e.g. metallic elements
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/04Mounting of components, e.g. of leadless components
    • H05K13/046Surface mounting
    • H05K13/0469Surface mounting by applying a glue or viscous material
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/08Monitoring manufacture of assemblages
    • H05K13/081Integration of optical monitoring devices in assembly lines; Processes using optical monitoring devices specially adapted for controlling devices or machines in assembly lines
    • H05K13/0817Monitoring of soldering processes

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Manufacturing & Machinery (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Operations Research (AREA)
  • Analytical Chemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Electric Connection Of Electric Components To Printed Circuits (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Supply And Installment Of Electrical Components (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
TW103105674A 2013-03-12 2014-02-20 具有基於色彩的線性三維擷取系統之材料施用器 TWI676559B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US13/796,512 US8939074B2 (en) 2013-03-12 2013-03-12 Color-based linear three dimensional acquisition system and method
US13/796,512 2013-03-12

Publications (2)

Publication Number Publication Date
TW201437043A TW201437043A (zh) 2014-10-01
TWI676559B true TWI676559B (zh) 2019-11-11

Family

ID=50190847

Family Applications (1)

Application Number Title Priority Date Filing Date
TW103105674A TWI676559B (zh) 2013-03-12 2014-02-20 具有基於色彩的線性三維擷取系統之材料施用器

Country Status (8)

Country Link
US (1) US8939074B2 (https=)
EP (1) EP2972074A1 (https=)
JP (1) JP6431029B2 (https=)
KR (1) KR102090856B1 (https=)
CN (1) CN105026882A (https=)
PH (1) PH12015501652B1 (https=)
TW (1) TWI676559B (https=)
WO (1) WO2014158483A1 (https=)

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US11176635B2 (en) 2013-01-25 2021-11-16 Cyberoptics Corporation Automatic programming of solder paste inspection system
US9743527B2 (en) * 2013-08-09 2017-08-22 CyberOptics Corporaiton Stencil programming and inspection using solder paste inspection system
US9370925B1 (en) 2015-03-25 2016-06-21 Illinois Tool Works Inc. Stencil printer having stencil shuttle assembly
US9370924B1 (en) 2015-03-25 2016-06-21 Illinois Tool Works Inc. Dual action stencil wiper assembly for stencil printer
US9370923B1 (en) 2015-04-07 2016-06-21 Illinois Tool Works Inc. Lift tool assembly for stencil printer
US10703089B2 (en) 2015-04-07 2020-07-07 Illinois Tool Works Inc. Edge lock assembly for a stencil printer
US10723117B2 (en) 2015-04-07 2020-07-28 Illinois Tool Works Inc. Lift tool assembly for stencil printer
TWI571714B (zh) * 2015-06-15 2017-02-21 Printing Tech Res Inst Method of making multi - angle color guide table
US11557048B2 (en) 2015-11-16 2023-01-17 Applied Materials, Inc. Thickness measurement of substrate using color metrology
US10565701B2 (en) 2015-11-16 2020-02-18 Applied Materials, Inc. Color imaging for CMP monitoring
KR102508426B1 (ko) * 2016-01-29 2023-03-09 삼성전자주식회사 경도 검출이 가능한 센싱장치, 이를 구비한 모바일 기기, 및 이를 이용한 3차원 인쇄장치
JP6718502B2 (ja) * 2016-03-29 2020-07-08 株式会社Fuji 電子部品装着機の動作確認装置
CN106879249A (zh) * 2017-04-26 2017-06-20 航天科技控股集团股份有限公司 印制板组件自动检测设备
CN114777682A (zh) * 2017-10-06 2022-07-22 先进扫描仪公司 生成一个或多个亮度边缘以形成物体的三维模型
EP3480585A1 (en) * 2017-11-07 2019-05-08 ASM Assembly Systems GmbH & Co. KG Stencil inspection by means of a solder paste inspection device
KR102091935B1 (ko) * 2018-08-29 2020-03-20 주식회사 프로텍 3차원 스캐너를 이용한 점성 용액 디스펜싱 방법
US11100628B2 (en) 2019-02-07 2021-08-24 Applied Materials, Inc. Thickness measurement of substrate using color metrology
CN110399878B (zh) * 2019-06-14 2023-05-26 南京火眼锐视信息科技有限公司 表格版式恢复方法,计算机可读介质以及计算机
US12135353B2 (en) * 2019-11-15 2024-11-05 Tektronix, Inc. Indirect acquisition of a signal from a device under test
EP4064813A1 (de) * 2021-03-26 2022-09-28 Siemens Aktiengesellschaft Verfahren zur überwachung einer smd-fertigung und smd-fertigungsstrasse
CN113183608B (zh) * 2021-04-23 2022-04-22 广州诚鼎机器人有限公司 一种浆料补充设备和椭圆印花机
DE102022132162A1 (de) * 2022-12-05 2024-06-06 Witrins S.R.O. Verfahren zur Fehleranalyse und Inspektionssystem

Citations (2)

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US20040145753A1 (en) * 2001-04-06 2004-07-29 Ssang-Gun Lim Method and apparatus for measuring the three-dimensional surface shape of an object using color informations of light reflected by the object
CN101606448A (zh) * 2007-02-16 2009-12-16 伊利诺斯工具制品有限公司 单一和多光谱照明系统和方法

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JPH09201558A (ja) * 1996-01-29 1997-08-05 Techno Kapura:Kk 塗布装置
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US20080156207A1 (en) 2006-12-28 2008-07-03 Dan Ellenbogen Stencil printers and the like, optical systems therefor, and methods of printing and inspection
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Publication number Priority date Publication date Assignee Title
US20040145753A1 (en) * 2001-04-06 2004-07-29 Ssang-Gun Lim Method and apparatus for measuring the three-dimensional surface shape of an object using color informations of light reflected by the object
CN101606448A (zh) * 2007-02-16 2009-12-16 伊利诺斯工具制品有限公司 单一和多光谱照明系统和方法

Also Published As

Publication number Publication date
JP2016512330A (ja) 2016-04-25
US20140272103A1 (en) 2014-09-18
WO2014158483A1 (en) 2014-10-02
KR20150123817A (ko) 2015-11-04
JP6431029B2 (ja) 2018-11-28
CN105026882A (zh) 2015-11-04
PH12015501652A1 (en) 2015-10-19
TW201437043A (zh) 2014-10-01
EP2972074A1 (en) 2016-01-20
US8939074B2 (en) 2015-01-27
PH12015501652B1 (en) 2015-10-19
KR102090856B1 (ko) 2020-05-27

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