TWI639473B - Automatic component segregator enabled with a smart transistor testing kit(s) - Google Patents

Abstract

The present invention relates to a device for automatically classifying available and unusable portions of a waste printed circuit board or electronic waste, the device comprising a component separation portion and a functional inspection portion provided with at least one transistor test assembly for The stage separates functional and non-functional crystals according to their functions, properties, and reusability. The components of the waste product will undergo multiple stages, performing all necessary steps such as comminution, size sorting, metal sorting, sorting of reusable components (ie wafers, transistors, resistors, etc.). In the functional inspection department, the separated transistor first undergoes a physical integrity check, and then conducts a conductivity test. If the transistor passes the physical integrity and conductivity test, it is judged to be reusable; if not, it is sent to Mechanical recycling.

Description

Automatic component separator using smart transistor test assembly

The present invention relates to an apparatus and method for automatically classifying a recyclable portion of an electronic waste; and more particularly to an apparatus and method for automatically classifying a usable portion and an unusable portion of a waste printed circuit board.

In order to maintain ecological development, the disposal of e-waste is an important requirement in many countries. In today's society, how to effectively classify waste is a major issue, and for the e-waste processing industry, how to ensure effective waste disposal is a major problem that needs to be faced. The most economic value when waste is properly classified.

Automating manually controlled work is a trend today, and automation not only reduces the burden of manpower, but also significantly reduces costs compared to manual manufacturing.

The artificial waste treatment system mainly tests and classifies the components according to the availability of the recycled materials. The common manual method is to assign a person to check the location of the waste recycling between different places, or to identify and classify a team. Components, this method is somewhat complicated and time consuming. Therefore, considering the advancement of technology in recent years, the disposal system of conventional waste is not efficient enough. Therefore, there has not been a protective device that can effectively identify and classify electronic waste.

In addition, recyclers must identify potentially valuable or usable components in e-waste to plan an appropriate waste disposal strategy. Printed circuit boards (PCBs) are important components in electronic devices that have precious components such as metals, non-metals, diodes, semiconductors, inductors, removable connections, etc., so recycling becomes a more Complex tasks. The intricacies of the recycling process are not only because there are different precious components, but also because there are movable parts available in the entity, and it is necessary to determine whether it is recyclable based on its functional state.

Reuse of functional components such as diodes, semiconductors, inductors, etc., is an even better option or more cost effective in efficient waste disposal.

Chinese Patent Publication No. CN101444784A discloses a method and a device for efficiently recovering waste circuit boards under vacuum conditions. According to the disclosed method, the circuit board to be recycled is placed in a vacuum vessel for pyrolysis and pyrolysis to produce a macromolecular gaseous mixture. After being condensed into liquid organic contaminants, it is collected in a condensation tower, and the remaining gaseous mixture enters a gas collector. The pyrolysis-derived bottom solid mixture is subjected to metal and non-metal separation using a separator. The main disadvantage of this method is that even in a vacuum environment, the pyrolysis process may affect the functionality of the components that can be used.

U.S. Patent No. 6,234,317 discloses a device for sorting raw materials, pre-treating, or regenerating materials in which components must be additionally removed from the printed circuit board, so that the device is less efficient in recycling.

In order to overcome the limitations of the prior art, whether based on the nature, the basic energy, or the value of the raw materials (metal, non-metal, etc.), an efficient waste disposal method needs to be found. The method needs to have the characteristics of convenient operation and low labor cost to simultaneously execute at least one waste disposal technology, and is not interrupted during execution.

Therefore, there is a need for a waste disposal method that automatically classifies and determines the functional properties of the components to help the recycler determine the flow of the waste and determine whether it is reusable, recyclable, or recoverable.

In view of the above, an object of the present invention is to provide an automatic component separator including a component separating portion and a function testing portion having at least one transistor test kit, wherein the function detecting portion is connected to the component separating portion. The functional and non-functional crystals are separated at various stages according to their function, properties, and reusability.

In order to achieve the above object, an automatic component separator provided by the present invention is provided with a programmable logic controller (PLC) controlled device through a series of input/output modules, a detection module and a communication processor. The automatic mode operates the separation process.

The invention provides an automatic component separator provided with a method of separating one of its components from the waste printed circuit board or electronic waste.

The present invention provides an automatic component separator that is provided with a device in which specific parameters such as temperature, speed, time, etc. are customized as needed for the visual separation process.

The invention provides an automatic component separator which is provided with a detecting mechanism starting device for sensing the presence of waste components on the conveyor belt and initiating the movement of the conveyor belt.

The invention provides an automatic component separator which is provided with an automatically operated separation method, such as size sorting, metal sorting and transistor division of a printed circuit board or any component having reusable, recoverable or recyclable properties. selected.

The invention provides an automatic component separator which is provided with a method for scrutinizing and separating a usable or reusable transistor from an electronic waste.

The invention provides an automatic component separator which is provided with a device having a safety mechanism for protecting a portion embedded in the electronic waste to avoid damage.

The present invention relates to a device that can automatically separate used and unusable portions of a waste printed circuit board or electronic waste. The device comprises a component separating portion and a function testing portion provided with at least one transistor test component for separating the functional and inorganic energy transistors at various stages according to their functions, types and recyclability.

The device automatically receives a large amount of fed waste product, and then detects and initiates the separation step by a sensor disposed on the conveyor belt. The components of the waste product will undergo multiple stages, performing all necessary steps such as comminution, size sorting, metal sorting, sorting of reusable components (ie wafers, transistors, resistors, etc.).

The removed components will pass through the test assembly and be tested for reusability, particularly the transistor. If the test is not passed, the untested components will be sent directly to the recycling step. The separated transistor is inspected for physical integrity by the functional inspection department, and further tested by various components. If the transistor passes the test, it is considered to be reusable; if it is not passed, it is sent to the mechanical recycling. .

The transistors are detected by the smart components to determine whether each of the transistors is mechanically recycled or reusable. The separated transistor is inspected for physical integrity by the functional inspection department, and then tested for conductivity. If the transistor passes the physical integrity and conductivity test, it is judged to be reusable; if it is not tested, it is sent to Mechanical recycling.

In order to explain the present invention more clearly, the following preferred embodiments are described in detail with reference to the drawings. The description does not present all of the embodiments. In fact, the invention may be implemented in many different forms, and is not limited only to the embodiments set forth below. Rather, these embodiments are provided to enable the disclosure of the present disclosure to meet applicable legal requirements.

Those skilled in the art can make modifications to the disclosure of the present invention and other embodiments, and it is understood that the invention is not limited to the specific embodiments disclosed, and other embodiments are included in the scope of the drawings. Modifications and embodiments are also included in the present invention. Although specific terms are employed herein, they are used in a generic and descriptive sense only and not for the purpose of limitation.

Figure 1 is an isometric view of a component separator used to perform the classification process. First, the electronic waste generated by the at least one component removing machine 400 is collected in the first screening unit 110 for separation. In addition to the bare board, the component removing machine 400 provides two types of classification, that is, fine material classification. And the coarse material classification), wherein the first screening unit 110 screens the portion containing the solder balls, the dust, the diode, the transistor, the pins, and the particles, and is further used for the classification system 300. Furthermore, the transistor is classified by any suitable method, such as roller separation. Then, the transistor is selectively sent to the function verification unit 200 to determine the function of the transistor, wherein the function verification unit 200 is provided with at least one transistor test component 215 to evaluate the function of the classified transistor. And for at least one side of the functional inspection unit 200, a detailed inspection area 210 is further provided for the foregoing functional evaluation. In another embodiment, the functional inspection unit 200 includes at least one conveyor system for transporting the transistors to the detailed inspection zone 210.

Referring to Figure 2a, which is a flow diagram illustrating the component removal steps herein, the waste material is sent to the component removal machine/device 400. The component removal machine (CRM) 400 performs preparatory steps such as initial classification of electronic waste, as well as components that remove electronic waste, particularly discarded printed circuit boards. After the components are to be removed, the bare boards are sent to the smash or even the recycling step. On the other hand, the removed component is sent to the separation step of the present invention. More specifically, the component removing machine 400 is pre-connected to the separating device, removes all available components and unusable components on the printed circuit boards, and transports the aforementioned components for various inspections. This ensures proper waste disposal based on the type and condition of each component. For example, if fed into a printed circuit board, the device removes all embedded components of the printed circuit board, and delivers the portions with the help of various detection modules and smart detection components disposed in the device. Perform a functional test. If the component is judged to be in good condition, it will be sent to another place for reuse purposes; similarly, if the component is judged to be defective, other wastes may be selected based on the potential of recovery and recycling of the defective portion. Material handling method. The bare boards after removing the components are sent to other places for metal recovery steps.

Please refer to FIG. 2b, which is a schematic flow chart illustrating the steps of obtaining the remaining material. The removed components are sent for size sorting, screening, metal sorting, and wafer sorting, wherein the removed components are dimensioned by rolling separation, and the removed components are removed. The metals in the components are sorted by a magnetic sorter.

Referring to the flow chart shown in FIG. 3, various stages in an embodiment of the invention, such as size classification, metal classification, and wafer classification, are illustrated. By dimensioning the components through the rollers, separate connectors/ports, and the processor, the transistors are sent to a functional inspection to assess whether mechanical recycling or reuse is required.

4 is a perspective view of a main component separator and a functional inspection portion for separating a transistor in an embodiment of the present invention. In this embodiment, the separator includes a frame 145 for supporting the conveyor system 120 and other subassemblies. In addition to bare boards, printed circuit board materials are divided into two categories in the CRM process, fine and coarse. The first screening unit 110 performs screening of fine materials including solder balls, dust, diodes, pins, and particles, and can be further used in a classification system. The first screening unit 110 is provided with a screen and a cam mechanism for vibrating back and forth, just like a vibrating feeder. The first screening unit 110 receives components from the component removal machine (CRM), wherein the components are divided into fines and coarse materials. The rough component is an element including a heat sink, a socket, a connector, a copper coil, a diode, a coil, a connector base, a transistor, a pole, a wafer, etc., wherein the coarse components are then transferred to the feedstock Machine 115, feeder 115 receives all of the size/coarse mixing elements and acts on the cam mechanism to reciprocate, just like a vibrating feeder. The feeder 115 abuts the conveyor system 120. The conveyor system 120 includes a motor-driven conveyor belt, wherein the motor-driven conveyor belt extends along the long axis of the main frame 145 and conveys the coarse portions of the mixing elements through the various stages of separation. The conveyor system further includes a camera and an access sensor for sensing components on the conveyor belt and triggering the motor whereby the conveyor belt moves in a predetermined direction. A plurality of roller separators 125, 130, 135 are disposed at a suitable position above the conveyor belt for height adjustment such that the conveyor belt operates below the roller separators 125, 130, 135. Each of the roller separator units is provided with at least one funnel 155 for receiving and collecting elements from each of the roller separator units. Each of the roller separator units sorts the components according to the size of the components, and transfers the remaining components to another roller separator unit, and the remaining components are classified based on the same principle (by size) . As described above, the classified components are collected in respective funnels 155, wherein the funnel 155 is used to guide the separated material and to facilitate the transfer of the separated material to the functional inspection portion 200. A magnetic separator/splitter 140 is provided to separate the magnetic elements. The magnetic separator/separator 140 is attached next to the roller separator for magnetic separation of the remaining components after the roller separation step and directing the separated iron material to the collection bin. In another embodiment, the functional inspection unit 200 includes a conveyor system, a detailed inspection area 210, and at least one transistor test assembly 215, wherein the conveyor system transports the separated transistors to the detailed inspection area. 210 for functional assessment.

Referring to FIG. 5, a layout of a PLC control system controls various component removal machines disposed in the device, wherein the PLC control system controls all machines, rollers, and screening motors in an automatic mode, and The status of the operation is displayed on the set LCD/TFT screen to monitor that the device is functioning properly.

Referring to the flow chart shown in FIG. 6, the transistor re-use mechanism is illustrated. Each type of transistor will undergo an initial physical test. If the transistor passes the initial physical test, a function called a function test is performed. Further testing, if the transistor does not pass the initial physical test, the transistor is sent to mechanical recovery.

Please refer to Figure 7 for a perspective view of the set of transistor test components. In this embodiment, the transistor test assembly includes at least one connection socket 220, a device 225 for switching the transistor test assembly switch, at least one indicating device 230, a housing 235, and at least one mounting bolt 240.

8 is a side elevational view of a transistor test assembly in accordance with an embodiment of the present invention. In this embodiment, the transistor test assembly includes a housing 235 and at least one test printed circuit board (PCB) 245.

Figure 9 shows the layout of the connection socket disposed in the transistor test assembly. The transistor test assembly is provided with a connection socket for connecting two types of transistors, namely NPN or PNP type transistors, wherein each of the connection sockets has an EBC/CBE and ECB/BCE socket. Insert the transistor into the E with the emitter pin, insert the base pin into the B, and place the collector pin into C to place it in one of the connection sockets and press the button. Then pay attention to the status LED. If the status LED is illuminated, it means that the transistor is working. If the status LED is not illuminated, connect the transistor pin to another direction or connect to other ECB/BCE sockets to detect electricity. The type of crystal and its function. If the transistor is operated on the NPN side, the transistor is an NPN transistor, whereas if the transistor is operated on the PNP side, the transistor is a PNP transistor. If the transistor is unable to act on any of the outlets, the transistor is considered faulty.

In summary, in a preferred embodiment of the invention, the automatic component separator for separating the electronic waste components comprises: a) a frame; b) at least one feeder for receiving the components to be separated; At least one conveyor system for moving components away from the feeder, the conveyor system comprising a motor-driven conveyor belt and at least one incoming sensor; d) a plurality of roller separator units for each The transistor is sized to separate the transistors, each of the roller separator units including at least one roller separator and at least one funnel; e) at least one magnetic sorter abutting the roller separator units to separate the magnetic And wherein: at least one functional inspection unit is coupled to at least one funnel of the roller separator unit, the functional inspection portion includes at least one detailed inspection region, at least one transistor test assembly, and at least one component Moving the funnel to the device of the detailed inspection area; wherein the conveyor belt system senses the load and starts to transport the components to the roller separator unit; the roller separator unit divides the transistors to be inspected And move at least one of a respective funnel, and the machine can test unit from the at least one hopper for receiving the transistors, to pass through said at least one function of at least a functional test performed the test component transistors.

The above is only a preferred embodiment of the present invention, and equivalent changes to the scope of the present invention and the scope of the patent application are intended to be included in the scope of the present invention.

[this invention]

400‧‧‧Component removal machine

110‧‧‧First screening unit

115‧‧‧ Feeder

120‧‧‧Conveyor belt system

125‧‧‧Roller separator

130‧‧‧Roller separator

135‧‧‧Roller separator

140‧‧‧Magnetic sorter

145‧‧‧Frame

200‧‧‧ Functional Testing Department

210‧‧‧Detailed area

215‧‧‧Crystal test assembly

220‧‧‧Connecting socket

225‧‧‧ device

230‧‧‧ indicating device

235‧‧‧ Shell

240‧‧‧Mounting bolts

245‧‧‧Test printed circuit board (PCB)

300‧‧‧Classification system

1 is an isometric view of a component classifier in accordance with a preferred embodiment of the present invention, revealing attachment to a functional inspection unit. Figure 2a is a flow chart showing the steps of the component classifier of the above preferred embodiment, showing the steps of component removal. Figure 2b is a schematic flow diagram of the component classifier of the above preferred embodiment, illustrating the processing steps of the remaining material obtained. 3 is a flow chart showing the steps of a component classifier according to a preferred embodiment of the present invention, revealing various stages such as size classification, metal classification, and wafer classification. 4 is a perspective view of a component classifier in accordance with a preferred embodiment of the present invention, revealing a main component separator and a functional inspection portion for separating the transistors. FIG. 5 is a schematic diagram of a component classifier according to a preferred embodiment of the present invention, revealing a layout of a PLC control system, and controlling various component removal devices disposed in the device. 6 is a flow chart of a component classifier according to a preferred embodiment of the present invention, revealing a reusable mechanism of the transistor. Figure 7 is a perspective view of a component classifier in accordance with a preferred embodiment of the present invention, showing the transistor test assembly disposed. Figure 8 is a side elevational view of a component classifier in accordance with a preferred embodiment of the present invention, revealing a transistor test assembly. Figure 9 is a schematic illustration of a component classifier in accordance with a preferred embodiment of the present invention, showing the layout of the connector socket disposed in the transistor test assembly.

Claims (10)

An automatic component separator for separating a plurality of electronic waste components, comprising: a frame; at least one feeder for receiving the electronic waste components to be separated; at least one conveyor system comprising a motor drive a conveyor belt and at least one incoming sensor, the conveyor belt system for moving the electronic waste components away from the feeder; a plurality of roller separator units including at least one roller separator and at least one a funnel, the roller separator unit is configured to separate the electronic waste components according to the size of the electronic waste components; at least one magnetic separator is adjacent to the roller separator units, and the at least one magnetic separator is used Separating the magnetic waste components; and at least one functional inspection portion comprising at least one detailed inspection area, at least one transistor test assembly, and at least one means for self-containing the electronic waste components Moving at least one funnel to the detailed inspection area, the at least one functional inspection unit is coupled to the at least one funnel of the plurality of roller separator units; wherein, when the conveyor belt When the at least one feeder receives the electronic waste components, the electronic waste components are transferred to the roller separator units; the roller separator units are disposed at an adjustable height above the conveyor belt, The conveyor belt is actuated below the roller separators; each of the roller separator units separates the electronic waste components according to the size, and moves the separated crystals of the electronic waste components to corresponding The at least one funnel; the functional inspection unit receives the transistors from the at least one funnel to The at least one transistor test component performs at least one function check on the transistors; the operation of the splitter is controlled by a programmable logic controller (PLC). The automatic component separator of claim 1, wherein the conveyor system further comprises an imaging module for detecting the presence of the electronic waste components on the conveyor belt. The automatic component separator of claim 1 wherein the means for moving the electronic waste components from the funnel to the detailed inspection zone comprises a motorized conveyor belt. The automatic component separator of claim 1, wherein the at least one function check is performed in a manual mode, an automatic mode, or both in the manual mode and the automatic mode. The automatic component separator according to claim 1, wherein the electronic waste components transferred in the functional inspection unit comprise an NPN-type transistor, a PNP-type transistor, or both an NPN-type transistor and a PNP-type transistor. . An automatic component separator for separating a plurality of electronic waste components, comprising: a frame; at least one feeder for receiving the electronic waste components to be separated; at least one conveyor system comprising a motor driven a conveyor belt and at least one incoming sensor, the conveyor belt system for moving the electronic waste components away from the feeder; at least one roller separator unit for driving the transistors from the electronic waste components Separating, each of the roller separator units includes at least one roller separator and at least one funnel; At least one magnetic sorter adjacent to the plurality of roller separator units, wherein the at least one magnetic sorter is configured to separate the magnetic components of the electronic waste components; and the at least one functional inspection unit includes at least one detailed inspection area At least one transistor test assembly, and at least one means for moving the electronic waste components from the at least one funnel to the detailed inspection area, the at least one functional inspection portion abutting the plurality of roller separator units At least one funnel; wherein, when the conveyor belt receives the electronic waste components from the at least one feeder, the electronic waste components are to be transported to the roller separator units; the roller separator units Provided at an adjustable height above the conveyor belt, the conveyor belt is actuated below the roller separators; each of the roller separator units separates the electronic waste components according to size, and the separated The transistors are moved to the corresponding at least one funnel; the functional inspection unit receives the transistors from the at least one funnel to perform the transistor through the at least one transistor test component to A function test; controlled by a programmable logic controller (PLC) of the separator operation. The automatic component separator of claim 6, wherein the conveyor system further comprises an imaging module for detecting the presence of the electronic waste components on the conveyor belt. The automatic component separator of claim 6 wherein the means for moving the electronic waste components from the funnel to the detailed inspection zone comprises a motorized conveyor belt. The automatic component separator of claim 6, wherein the at least one function check is performed in a manual mode, an automatic mode, or both in the manual mode and the automatic mode. The automatic component separator according to claim 6, wherein the electronic waste components transferred in the functional inspection unit comprise an NPN type transistor, a PNP type transistor, or both an NPN type transistor and a PNP type transistor. .